Storage card test system and test method

Abstract

The invention relates to the technical field of memory cards, in particular to a memory card testing system and a testing method.The memory card testing system comprises a server, a switch, a display screen, a testing board card and a testing machine, the server is in communication connection with the switch, and the switch is in communication connection with the testing machine and the display screen; a plurality of test board cards are arranged on the test machine table, the test board cards are used for installing to-be-tested memory cards, test software is arranged in the server, the server controls the test machine table to test the memory cards through the test software and displays test results on a display screen, and the test system further comprises a base. The testing machine table is installed on the surface of the base, a transportation assembly is installed on the base, a connecting block is installed on the transportation assembly, and the purpose of the invention is to solve the problems that a memory card testing system is needed, multiple memory card tests can be processed in parallel, and the testing period is shortened.

Description

Technical Field

[0001] The present invention relates to the technical field of storage cards, and in particular to a storage card testing system and a testing method. Background Art

[0002] Memory cards are widely used in consumer electronics, automotive electronics, security monitoring and industrial control fields, and can be used to store data and programs. In order to ensure that the memory cards can maintain high performance and stability in various usage scenarios, the memory cards need to be tested for read and write speed, capacity verification, durability, error rate detection, etc. The existing memory card testing system needs to meet the testing needs of large-scale and rapid production of memory cards to meet market demand.

[0003] For example, publication number: CN101604272B discloses a memory card testing device for performing automated operations to test a memory card. The memory card testing device includes a host, a database, a processing unit, and an interface. The host is used to access a memory card. The database maintains a plurality of test script files. The processing unit is coupled to the database, and according to a device identification value corresponding to a device to be tested and a communication protocol associated with the memory card, the processing unit selects a test item from a test script file. The interface is connected to the processing unit and the host, and is used to enable the host to execute at least one memory card command on the memory card according to the test item.

[0004] In today's technological development environment, the production scale of memory cards is becoming increasingly large. Manufacturers have to produce a large number of memory cards every day. The traditional single-card testing method is extremely inefficient and can no longer adapt to the rhythm of large-scale production. In order to ensure that every memory card put on the market can meet the quality standards, every memory card must be tested. The traditional single-card testing method often takes a lot of time. Therefore, a memory card testing system is needed that can process multiple memory card tests in parallel to shorten the test cycle. Summary of the invention

[0005] The object of the present invention is to provide a memory card testing system and a testing method to solve the problem of needing a memory card testing system that can process multiple memory card tests in parallel and shorten the testing cycle.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A storage card testing system comprises a server, a switch, a display screen, a test board and a test machine, wherein the server is communicatively connected to the switch, and the switch is communicatively connected to the test machine and the display screen respectively, and a plurality of test boards are arranged on the test machine, and the test boards are used to install storage cards to be tested, and the server has test software, and the server controls the test machine to test the storage card through the test software, and displays the test result on the display screen.

[0008] Preferably, it further comprises a base, the test machine is installed on the surface of the base, a transport component is installed on the base, a connecting block is installed on the transport component, and an electric clamp for clamping the storage card is installed at the bottom end of the connecting block.

[0009] Preferably, a collection frame is installed on the left side of each of the test boards, and a sensor is installed on the surface of the connection block, and the sensor is communicatively connected with the electric clamp.

[0010] Preferably, a T-shaped slider is fixedly connected to the top of the electric clamp, and a T-shaped slot is provided at the bottom of the connecting block for the T-shaped slider to slide leftward, and a first spring is fixedly connected between the T-shaped slider and the slot wall of the T-shaped slot.

[0011] Preferably, a lifting column is movably inserted at the top of the test machine, and a lifting slot for vertically inserting the lifting column is provided on the top surface of the test machine. The lifting column is located on the right side of the test board, and the number of the lifting columns corresponds one-to-one to the slots on the test board, and a third electric push rod is installed on the surface of each lifting column.

[0012] Preferably, the right end of each electric clamp is fixedly connected to a docking rod, the top of each lifting column is provided with a docking slot for the docking rod to move left and right, each docking slot is connected to a docking block that can slide left and right, and the docking block and the docking rod are detachably connected.

[0013] Preferably, a control module is provided in each lifting column, and the control module is used to control the installation and removal between the docking block and the docking rod. The control module is communicatively connected to the server, and the control module is communicatively connected to the sensor.

[0014] A memory card testing method is performed using the memory card testing system, and the specific steps are as follows:

[0015] A. The transport assembly drives the connection block to move, and the movement of the connection block drives the electric gripper holding the storage card to move and transport. During the transportation process, the storage card passes through the test machine until it moves to the position of the slot on the test board and stops moving. Then, the transport assembly drives the connection block and the electric gripper to move downward, and the storage card is inserted into the test board to prepare for testing.

[0016] B. The server sends the configuration parameters required for the test through the test software, and the control signal is sent to the test machine through the switch. The test machine sends the acquired test configuration parameter information control signal to the test board, and the test board performs the corresponding configuration test item operation according to the test configuration parameters;

[0017] C. When the test system completes the test on the storage card, the feedback data signal is transmitted back to the test board, then to the test machine, and finally transmitted to the server through the switch for storage, analysis and processing. The test results generated by the server are displayed to the user through the display;

[0018] D. The server analyzes and processes the information of the problematic storage card and sends it to the control module in the lifting column at the corresponding position, and the control module connects the docking rod with the docking block;

[0019] E. After the test is finished, the transport assembly drives the connection block and the electric clamp to move upward, and the electric clamp holding the bad card drives the lifting column to move upward through the docking rod. When the storage card is pulled out from the test board, the third electric push rod on the movable lifting column is extended to push the bad card to the side. The bad card moves, causing the corresponding electric clamp to move. When the sensor on the connection block senses that the bad card moves to the top of the collection frame, the information is transmitted to the electric clamp, causing the electric clamp to release the bad card and the bad card falls into the collection frame for collection;

[0020] F. After the electric clamp releases the bad card, the electric clamp is reset. At the same time, the control module separates the docking rod and the docking block. At this time, the lifting column is no longer restricted and will automatically fall and reset.

[0021] G. Use the transport assembly to move the remaining good storage cards for transportation.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] 1. The test system can have multiple test boards built in, each with its own independent circuit design and sensor, and can test multiple storage cards independently and simultaneously. This parallel processing capability is particularly important when processing a large number of samples, which can significantly improve test efficiency and test capabilities, and shorten the test cycle;

[0024] 2. The independent modular design adopted by the test board makes maintenance and upgrading easier, greatly enhancing the flexibility of the test system. It can not only quickly adjust or replace according to market dynamics and customer customization needs, but also change the test board for testing according to different types of storage cards. This independently designed test board can make the test part relatively independent, which is convenient for the later maintenance process and reduces maintenance costs. When a test board fails, it can be quickly replaced without affecting the normal operation of other test boards;

[0025] 3. The test system has automated testing capabilities. It can be set up according to the configuration parameters sent by the server, execute the test software script, collect test result-related data, and automatically feed it back to the server through the switch, allowing the server to analyze the test results and generate a test report. This automated testing function not only reduces the workload of testers, but also improves the efficiency and accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0027] Figure 2 For the present invention Figure 1 The enlarged view of point A in the middle;

[0028] Figure 3 This is a schematic diagram of the vertical section structure of the connecting block of the present invention;

[0029] Figure 4 It is a schematic diagram of the structure of a partial vertical section of the lifting column of the present invention;

[0030] Figure 5 It is a schematic structural diagram of a partial cross section of the lifting column of the present invention;

[0031] Figure 6 It is a structural schematic diagram of the docking block of the present invention;

[0032] Figure 7 It is a structural schematic diagram of the connection between the docking rod and the docking block of the present invention;

[0033] Figure 8 It is a structural schematic diagram of the test board of the present invention.

[0034] In the figure: 1. base; 2. support frame; 3. limit track; 4. suspension plate; 5. connecting rod; 6. electric conveyor; 7. guide rail; 8. limit support rod; 9. first electric push rod; 10. connecting block; 11. T-shaped slide groove; 12. first spring; 13. T-shaped slide block; 14. electric clamp; 15. docking rod; 16. embedding groove; 17. embedding block; 18. docking block; 19. limit slide plate; 20. limit slide groove; 21. second spring; 22. lifting column; 23. second electric push rod; 24. limit baffle; 25. sliding groove; 26. third electric push rod; 27. lifting groove; 28. collection frame; 29. ​​test board; 30. test machine; 31. docking slide groove. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] See also Figures 1 to 8 , the present invention provides a technical solution.

[0037] A storage card testing system includes a server, a switch, a display screen, a test board 29 and a test machine 30. The server is communicatively connected to the switch, and the switch is communicatively connected to the test machine 30 and the display screen respectively. A plurality of test boards 29 are arranged on the test machine 30, and the test machine 30 is communicatively connected to the test boards 29. The test boards 29 are used to install storage cards to be tested. Each test board 29 has an independent power supply to avoid power supply interference between different test boards 29. The input and output signals of each test board 29 communicate with the test machine 30 through an independent interface to avoid signal crosstalk. The server has test software for controlling the test machine 30 to test the storage card and display the test results on the display screen. For example, the test software can use a graphical interface to display the status and test progress of each test board 29 on the display, and the user can operate by clicking the corresponding icon or menu on the display.

[0038] The test system can be built with multiple test boards 29, each of which has its own independent circuit design and sensor, and can test multiple storage cards independently and simultaneously. This parallel processing capability is particularly important when processing a large number of samples, and can significantly improve test efficiency and test capabilities, as well as shorten the test cycle. The independent modular design adopted by the test board 29 makes maintenance and upgrading easier, greatly enhancing the flexibility of the test system. It can not only be quickly adjusted or replaced according to market dynamics and customer customization needs, but also can be tested by changing the test board 29 according to different types of storage cards. This independently designed test board 29 can make the test part relatively independent, facilitate the subsequent maintenance process, and reduce maintenance costs. When a test board 29 fails, it can be quickly replaced without affecting the normal operation of other test boards 29;

[0039] The test system has automated testing capabilities. It can be set up according to the configuration parameters sent by the server, execute the test software script, collect data related to the test results, and automatically feed it back to the server through the switch, allowing the server to analyze the test results and generate a test report. This automated testing function not only reduces the workload of testers, but also improves the efficiency and accuracy of the test.

[0040] Furthermore, the server has a data management and analysis function module, which can obtain the test result data from the test machine 30 and store it centrally in the server's log database. The data is deeply analyzed and mined through the data management and analysis function module inside the server, which helps to discover potential problems and trends and provide strong support for the optimization and improvement of the storage card.

[0041] The server serves as the control center of the test system, and is used to remotely configure the test items of the test machine 30, as well as to receive, process and analyze the test result data. The server transmits the information to the switch, and the test machine 30 obtains the configuration parameter information from the switch, etc., to realize the server's control over the test process.

[0042] The test software mainly uses program card opening, H2 test, H5 test and other test software to detect the capacity, reading speed, number of bad blocks and other related test parameter information of the storage card to ensure the quality assurance of the storage card production.

[0043] It also includes a base 1, a test machine 30 is installed on the surface of the base 1, a transport component is installed on the base 1, a connecting block 10 is installed on the transport component, and an electric clamp 14 for clamping a storage card is installed on the bottom end of the connecting block 10. The storage card is clamped by the electric clamp 14 and then transported by the transport component. The storage card can be moved to the test machine 30 for testing, and then the storage card can be moved away after the test.

[0044] Furthermore, the transport assembly includes a limit rail 3, a suspension plate 4, a connecting rod 5, an electric conveyor 6 and a guide rail 7. The top of the base 1 is fixedly installed with a support frame 2. The limit rail 3 and the guide rail 7 are fixedly connected to the support frame 2. The guide rail 7 is located above the limit rail 3. The inner surface of the limit rail 3 is provided with a limit rail for the suspension plate 4 to slide. The connecting rod 5 is fixedly installed at the center position of the top of the suspension plate 4. The top of the connecting rod 5 is rotatably connected to the center position of the bottom end of the electric conveyor 6. The guide rail 7 is used to power the electric conveyor 6 to move along its surface. By starting the electric The conveyor 6 moves along the track of the guide track 7, driving the connecting rod 5 to move. The movement of the connecting rod 5 drives the suspension plate 4 to move along the track of the limiting track 3. The connecting block 10 is connected to the suspension plate 4, so that the transport component can move the connecting block 10. A limiting strut 8 is fixedly installed at the inner corner of the turning part of the guide track 7. The limiting strut 8 is used to support the electric conveyor 6 when the electric conveyor 6 turns. By setting the limiting strut 8 on the inner side of the corner on the guide track 7, the electric conveyor 6 can be supported when the electric conveyor 6 turns to prevent the electric conveyor 6 from tilting when turning.

[0045] Furthermore, a plurality of vertically arranged first electric push rods 9 are fixedly installed at the bottom end of the suspension plate 4, and a connecting block 10 is fixedly connected to the telescopic end of each first electric push rod 9. By setting the first electric push rod 9 and starting the telescopic extension of the first electric push rod 9, the connecting block 10 is driven to move up and down, and the up and down movement of the connecting block 10 drives the electric clamp 14 to move up and down, thereby driving the storage card to move up and down, which is conducive to realizing the automatic plugging and unplugging of the storage card against the test board 29.

[0046] A collection frame 28 is installed on the left side of each test board card 29. The collection frame 28 is used to catch the storage card dropped from the electric clamp 14. A sensor is installed on the surface of the connecting block 10. The sensor is connected to the electric clamp 14 for communication. When the sensor detects that the electric clamp 14 moves a certain distance to the left, which is the distance the storage card moves to the top of the collection frame 28, the sensor sends a signal to the electric clamp 14. After receiving the signal, the electric clamp 14 releases the clamp on the storage card, so that the storage card falls into the collection frame 28. Through such a setting, when the test result of the storage card clamped under the electric clamp 14 is a bad card, the interface moves to the left through the electric clamp 14 to put the bad card into the collection frame 28, which helps to save the step of screening out the bad cards.

[0047] Furthermore, a T-shaped slider 13 is fixedly connected to the top of the electric clamp 14, and a T-shaped slot 11 is provided at the bottom of the connecting block 10 for the T-shaped slider 13 to slide to the left. The sensor is an infrared sensor. When the T-shaped slider 13 moves to the bottom of the infrared sensor, the infrared rays emitted by the infrared sensor produce specific changes when reflected back, and it can be judged that the T-shaped slider 13 moves to the bottom of the sensor. At this time, the distance moved by the electric clamp 14 is the distance moved by the storage card above the collection frame 28. A first spring 12 is fixedly connected between the T-shaped slider 13 and the slot wall of the T-shaped slot 11. By setting the first spring 12, when the surface of the electric clamp 14 loses external force, it can automatically move to the right and reset under the elastic force of the first spring 12.

[0048] A lifting column 22 is movably inserted at the top of the test platform 30, and a lifting slot 27 for vertically inserting the lifting column 22 is provided on the top surface of the test platform 30. The lifting column 22 is located on the right side of the test board 29, and the number of the lifting columns 22 corresponds to the slots on the test board 29. A third electric push rod 26 is installed on the surface of each lifting column 22. When the storage card moves upward and is pulled out, the lifting column 22 is also moved upward. After the storage card is completely pulled out, the third electric push rod 26 is started to extend, thereby pushing the storage card and the electric clamp 14 to move to the left.

[0049] The right end of each electric clamp 14 is fixedly connected to a docking rod 15, and the top of each lifting column 22 is provided with a docking slot 31 for the docking rod 15 to move left and right. A docking block 18 that can slide left and right is connected to each docking slot 31, and the docking block 18 and the docking rod 15 are detachably connected. By setting the docking rod 15 and the docking block 18, when the docking block 18 slides and connects with the docking rod 15, when the electric clamp 14 moves upward, the lifting column 22 is also moved upward through the connection between the docking rod 15 and the docking block 18, which is conducive to maintaining the consistency of the movement of the lifting column 22 and the electric clamp 14, eliminating the need to set up a complex control program.

[0050] Furthermore, a control module is provided in each lifting column 22, and the control module is used to control the installation and disassembly between the docking block 18 and the docking rod 15. The control module is communicatively connected to the server, and the control module is communicatively connected to the sensor. The control module is used to receive the bad card result signal in the test result sent by the server. When the control module receives the bad card result signal, it will issue a control instruction to control the connection between the docking rod 15 and the docking block 18. The control module is used to receive the signal sent by the sensor, that is, after the sensor detects that the electric clamp 14 moves a certain distance to the left, it sends a signal to the electric clamp 14 and also sends a signal to the control module. When the control module receives the signal, it will issue a control instruction to control the docking rod 15 to separate from the docking block 18.

[0051] Furthermore, an embedding block 17 is fixedly connected to the right side of the docking block 18, and an embedding groove 16 for horizontal embedding of the embedding block 17 is formed on the left side of the docking rod 15;

[0052] The front and rear ends of the docking block 18 are fixedly connected to the limit slide plate 19, and the surface of the lifting column 22 is provided with a limit slide groove 20 for the limit slide plate 19 to move left and right. A second spring 21 is fixedly connected between the groove wall of the limit slide groove 20 and the limit slide plate 19;

[0053] A second electric push rod 23 is installed vertically in the lifting column 22. The telescopic end of the second electric push rod 23 is fixedly connected to the limit baffle 24. A sliding groove 25 is provided in the lifting column 22 for the limit baffle 24 to move up and down. The sliding groove 25 is connected to the limit slide 20. The limit baffle 24 can block the limit slide 19. At this time, the docking rod 15 can continue to move rightward along the track of the docking slide 31, so that the embedded block 17 is moved out of the embedded groove 16, ensuring that the docking block 18 is separated from the docking rod 15.

[0054] The control module is used to send a control instruction to the second electric push rod 23. When the control module receives the server signal, it sends a control instruction to start the contraction to the second electric push rod 23, driving the limit baffle 24 to move downward. When the control module receives the sensor signal, it sends a control instruction to start the extension to the second electric push rod 23, driving the limit baffle 24 to move upward. By moving the limit baffle 24 downward, away from the limit slide 19, please refer to Figure 5 and Figure 7 , the limit slide plate 19 is no longer restricted, and under the elastic force of the second spring 21, it moves in the direction of the docking rod 15, so that the embedding block 17 can be embedded in the embedding groove 16, so that the docking block 18 is connected to the docking rod 15. When the docking rod 15 moves to the left, it will drive the docking block 18 to move together, and then when the sensor transmits information to the electric clamp 14, it also transmits information to the control module, and the control module controls the second electric push rod 23 to start extending, so that the limit baffle 24 moves upward and resets. At this time, when the docking rod 15 and the docking block 18 are reset to the right, they will stop moving first because they are blocked by the limit baffle 24. At this time, the docking rod 15 will continue to reset with the electric clamp 14, and then the embedding block 17 will move out of the embedding groove 16, so that the docking block 18 is separated from the docking rod 15. At this time, the lifting column 22 is no longer restricted and will automatically fall and reset.

[0055] The present scheme is specifically as follows: by controlling the electric conveyor 6 to move along the track of the guide track 7, the connecting rod 5 is driven to move, and the movement of the connecting rod 5 drives the hanging plate 4 to move along the track of the limit track 3. When the electric conveyor 6 moves and turns, the hanging plate 4 is restricted by the limit track 3 and will not rotate, so that the connecting rod 5 and the electric conveyor 6 rotate. The movement of the hanging plate 4 drives the first electric push rod 9 to move. The movement of the first electric push rod 9 drives the electric clamping claw 14 holding the storage card to move until the storage card moves to the position of the slot on the test board 29 and stops moving. Then, by starting the first electric push rod 9 to extend, the electric clamping claw 14 holding the storage card is driven to move downward until the storage card is inserted into the test board 29. The pins in the test board 29 are in close contact with the gold fingers of the storage card to establish an electrical connection. These pins are responsible for transmitting various test signals generated by the test board 29 to the storage card, and transmitting the data signals fed back by the storage card back to the test board 29.

[0056] When the electric clamp 14 moves downward, the docking rod 15 is also driven to move downward. When the storage card is inserted into the test board 29 , the docking rod 15 is also inserted into the docking slot 31 on the lifting column 22 .

[0057] Test parameters, such as storage capacity, read / write speed, number of bad blocks, etc., are set on the display screen. The test parameters input by the user on the display are transmitted to the server through the switch. Then, the server sends a control signal through the test software to the configuration parameters required for the test. The signal is sent to the test machine 30 through the switch. The test machine 30 obtains the control signal of the test configuration parameter information from the switch, and then sends a control signal to the test board 29 to start the corresponding test function. The test board 29 performs the corresponding configuration test item operation according to the test configuration parameters. When the test system completes the test of the storage card, the feedback data signal is transmitted back to the test board 29, then to the test machine 30, and finally transmitted to the server through the switch for storage, analysis and processing. The server will use various data analysis methods to analyze the data. For example, by calculating the average value, standard deviation, maximum value and minimum value of the read / write speed and other statistical indicators, the stability of the read / write performance of the storage card is evaluated; by analyzing the distribution and type of error data, it is determined whether the storage card has quality problems such as bad blocks. The test results generated by the server will also be displayed to the user through the display. The user can intuitively see the running status of the test system and the test results of the storage card through the display interface.

[0058] When there is a memory card with a problem in the test result, the server sends the information of the memory card with a problem to the control module in the lifting column 22 at the corresponding position. The control module receives the information and controls the second electric push rod 23 to start the retraction of the second electric push rod 23 and pull the limit baffle 24 to move downward until the limit baffle 24 is away from the limit slide 19. Please refer to Figure 5 and Figure 7 When the limiting baffle 24 moves away from the limiting slide 19, the limiting slide 19 is no longer restricted and moves toward the docking rod 15 under the elastic force of the second spring 21 until the embedding block 17 is embedded in the embedding groove 16, so that the docking block 18 is connected to the docking rod 15.

[0059] After the test is completed, the first electric push rod 9 is started to drive the electric clamp 14 and the docking rod 15 to move, so that the good and bad storage cards are pulled out from the test board 29. However, since the docking rod 15 corresponding to the bad storage card is already connected to its corresponding docking block 18, when the docking rod 15 moves upward, it will pull the corresponding lifting column 22 to move upward, that is, when the bad card is pulled out, its corresponding lifting column 22 will also move upward, and the good card is pulled out normally.

[0060] The upward movement of the lifting column 22 will drive the third electric push rod 26 to move upward. After the bad card is pulled out, the third electric push rod 26 is started to extend. The extended third electric push rod 26 contacts the bad card and pushes the bad card to move sideways. The bad card moves, causing its corresponding electric clamp 14 to move, so that the T-shaped slider 13 moves along the track of the T-shaped slide groove 11 and compresses the first spring 12. When the bad card moves to the top of the collection frame 28, the T-shaped slider 13 also moves to the position sensed by the sensor on the connecting block 10, and then the sensor transmits information to the electric clamp 14, so that the electric clamp 14 releases the grip on the bad card, and the bad card falls into the collection frame 28 for collection.

[0061] When the third electric push rod 26 pushes the bad card to move so that the electric clamp 14 also moves, it will drive the docking rod 15 to move sideways, and the docking rod 15 to move sideways will drive the docking block 18 to move sideways, and the docking block 18 to move sideways will drive the limit slide 19 to move sideways and stretch the second spring 21 to store elastic potential energy. When the sensor transmits information to the electric clamp 14, it also transmits information to the control module. The control module controls the second electric push rod 23 to start extending and push the limit baffle 24 to move upward and reset. Then, after the electric clamp 14 releases its grip on the bad card, at the same time Start the third electric push rod 26 to retract. At this time, the electric clamp 14 is no longer restricted and will automatically reset under the elastic force of the first spring 12. The reset movement of the electric clamp 14 will drive the docking rod 15 to reset and move. At this time, the docking block 18 will also reset and move under the elastic force of the second spring 21. The movement of the docking block 18 will drive the limiting slide 19 to move. When the limiting slide 19 moves to be blocked by the limiting baffle 24, it stops moving. At this time, the docking rod 15 will continue to reset and move, so that the embedding block 17 moves out of the embedding groove 16. At this time, the lifting column 22 is no longer restricted and will automatically fall and reset.

[0062] Finally, the electric conveyor 6 drives the electric gripper 14 holding the card to move to the next process.

[0063] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A memory card testing system, comprising a server, a switch, a display screen, a testing board (29) and a testing machine (30), characterized in that: The server is communicatively connected to the switch, and the switch is communicatively connected to the test machine (30) and the display screen respectively. The test machine (30) is provided with a plurality of test boards (29), and the test boards (29) are used to install the storage card to be tested. The server has test software, and the server controls the test machine (30) to test the storage card through the test software, and displays the test result on the display screen.

2. A memory card testing system according to claim 1, characterized in that: It also comprises a base (1), the test machine (30) being mounted on the surface of the base (1), a transport component being mounted on the base (1), a connecting block (10) being mounted on the transport component, and an electric clamp (14) for clamping a storage card being mounted at the bottom end of the connecting block (10).

3. A memory card testing system according to claim 2, characterized in that: A collection frame (28) is installed on the left side of each test board (29), and a sensor is installed on the surface of the connection block (10), and the sensor is in communication connection with the electric clamp (14).

4. A memory card testing system according to claim 3, characterized in that: The top end of the electric clamp (14) is fixedly connected to a T-shaped slider (13), and the bottom end of the connecting block (10) is provided with a T-shaped slide groove (11) for the T-shaped slider (13) to slide leftward, and a first spring (12) is fixedly connected between the T-shaped slider (13) and the groove wall of the T-shaped slide groove (11).

5. A memory card testing system according to claim 4, characterized in that: A lifting column (22) is movably inserted at the top of the test platform (30), and a lifting slot (27) is provided on the top surface of the test platform (30) for vertical insertion of the lifting column (22). The lifting column (22) is located on the right side of the test board (29), and the number of the lifting columns (22) corresponds to the slots on the test board (29). A third electric push rod (26) is installed on the surface of each lifting column (22).

6. A memory card testing system according to claim 5, characterized in that: The right end of each electric clamp (14) is fixedly connected to a docking rod (15), and the top of each lifting column (22) is provided with a docking slide groove (31) for the docking rod (15) to move left and right. Each docking slide groove (31) is connected to a docking block (18) that can slide left and right, and the docking block (18) and the docking rod (15) are detachably connected.

7. A memory card testing system according to claim 6, characterized in that: A control module is provided in each lifting column (22), and the control module is used to control the installation and removal between the docking block (18) and the docking rod (15). The control module is in communication connection with the server, and the control module is in communication connection with the sensor.

8. A memory card testing method, characterized in that: The memory card testing system according to claim 7 is used, and the specific steps are as follows: A. The connection block (10) is driven to move by the transport component, and the movement of the connection block (10) drives the electric clamp (14) holding the storage card to move and transport. During the transportation process, the storage card passes through the test machine (30) until the storage card moves to the position of the slot on the test board (29) and aligns, and then stops moving. Then, the storage card is inserted into the test board (29) when the connection block (10) and the electric clamp (14) are driven downward by the transport component to prepare for testing; B. The server sends a control signal through the test software to the configuration parameters required for the test. The signal is sent to the test machine (30) through the switch. The test machine (30) sends the acquired test configuration parameter information control signal to the test board (29). The test board (29) performs the corresponding configuration test item operation according to the test configuration parameters; C. When the test system completes the test on the storage card, the feedback data signal is transmitted back to the test board (29), then to the test machine (30), and finally transmitted to the server through the switch for storage, analysis and processing. The test results generated by the server are displayed to the user through the display; D. The server analyzes and processes the information of the storage card with the problem and sends it to the control module in the lifting column (22) at the corresponding position, and the control module connects the docking rod (15) with the docking block (18); E. After the test is completed, the connection block (10) and the electric clamp (14) are driven to move upward by the transport component, wherein the electric clamp (14) holding the bad card drives the lifting column (22) to move upward through the docking rod (15). When the storage card is pulled out from the test board (29), the third electric push rod (26) on the movable lifting column (22) is started to extend, pushing the bad card to move sideways. The bad card moves, causing the corresponding electric clamp (14) to move. When the sensor on the connection block (10) senses that the bad card moves to the top of the collection frame (28), the information is transmitted to the electric clamp (14), so that the electric clamp (14) releases the bad card and the bad card falls into the collection frame (28) for collection; F. After the electric clamp (14) releases the grip on the bad card, the electric clamp (14) is reset. At the same time, the control module separates the docking rod (15) and the docking block (18). At this time, the lifting column (22) is no longer restricted and will automatically fall and reset. G. Use the transport assembly to move the remaining good storage cards for transportation.

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