This invention relates to the field of optoelectronic device testing technology, and more particularly to a testing device for
magneto-optical switches. The technical solution includes a worktable, a
light source connection mechanism, an optical
frequency conversion mechanism, an optical domain
processing and detection mechanism, and a control console. The
light source connection mechanism drives a tunable test
laser to connect to the
magneto-
optical switch; the optical
frequency conversion mechanism combines the output light of the
magneto-
optical switch with the pump light through an
optical fiber combiner, and then performs frequency up-conversion via a PPLN
waveguide to convert the
infrared light into visible light; the optical domain
processing and detection mechanism uses an
optical beam splitter to
branch the
signal to an
optical modulator group, a polarization decoding mechanism, etc., for
parallel processing and detection. This invention overcomes the speed limitation of
infrared detection through optical
frequency conversion, achieving high-speed, high-precision synchronous comprehensive testing of multiple parameters such as the opening and closing time,
insertion loss, isolation, and polarization-related loss of the magneto-
optical switch. It features a high degree of
automation and stable and reliable test results.