ATE test method and system

Abstract

The invention provides an ATE test method and device, and the method comprises the steps: collecting a specified parameter of a tested device, carrying out the analysis of the specified parameter through a preset algorithm, determining a test mode used for the tested device, and testing the tested device based on the test mode. In the testing process, the state of the tested device is continuously obtained and analyzed in real time, when the real-time analysis result meets the preset condition, the testing mode is correspondingly adjusted, and finally the preset algorithm is corrected based on the testing result. The scheme provided by the invention can be applied to various different types of tested equipment, the used test strategy can be determined according to the tested equipment, the state change of the equipment can be timely responded in the test process to dynamically adjust the test mode, and finally the algorithm for determining the test strategy is optimized through the test result, so that the test efficiency is improved. The method has the advantages of real-time performance, high efficiency, self-adaption and the like, the test quality and efficiency are remarkably improved, and meanwhile good expandability is achieved.

Description

Technical Field

[0001] The invention belongs to the technical field of automatic test equipment, and in particular relates to an ATE test method and system. Background Art

[0002] Automatic Test Equipment (ATE) is an automated tool used to test the performance of electronic equipment and systems. It can automatically execute test procedures and test multiple parameters and functions at the same time. It is suitable for various electronic products to detect problems in a timely manner and optimize product design.

[0003] Nowadays, automatic test equipment is widely used in the fields of electronic manufacturing and engineering, especially for testing the performance and quality of products. As electronic equipment becomes increasingly complex, automatic test equipment plays an increasingly important role in the production and quality control of electronic products.

[0004] However, traditional ATE systems usually rely on predefined test strategies that are set based on the static parameters of the device and require fixed test processes and parameters. They lack flexibility when faced with complex and changeable devices under test (DUTs), which may lead to low test efficiency and even inability to accurately identify potential faults, thus affecting the accuracy and reliability of test results. Summary of the invention

[0005] In order to overcome the defects of the prior art, the present invention proposes an ATE testing method, which comprises:

[0006] Collect the specified parameters of the device under test;

[0007] Analyze the specified parameters by a preset algorithm to determine a test method to be used for the device under test;

[0008] Testing the device under test based on the test mode, continuously acquiring the state of the device under test and performing real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset condition;

[0009] The preset algorithm is modified based on the test results.

[0010] Specifically, the “collecting specified parameters of the device under test” includes:

[0011] Determining a device type of the device under test;

[0012] A number of designated parameters corresponding to the device under test are determined based on the device type, so as to collect the designated parameters of the device under test.

[0013] Optionally, the specified parameters include one or more of voltage, current, power, frequency, temperature, impedance, signal amplitude, duty cycle, input delay, output delay, and failure rate.

[0014] Preferably, the “analyzing the specified parameters by a preset algorithm to determine the test method to be used for the device under test” includes:

[0015] Analyzing the specified parameters by a preset algorithm to generate a first test mode for the device under test, so as to display the first test mode to the user;

[0016] In response to an intervention instruction of the user, generating a second test mode based on the intervention instruction and the first test mode, so as to determine the second test mode as a test mode used for the device under test;

[0017] If no intervention instruction from the user is received within a preset time, the first test mode is determined as the test mode used for the device under test.

[0018] Optionally, the "adjustment of the test method being executed and / or not executed" includes adding specific test steps, deleting specific test steps, adjusting the order of test steps, modifying the duration of specific test steps and / or modifying the number of single-round tests.

[0019] Furthermore, the “correcting the preset algorithm based on the test results” includes:

[0020] Show the test process to the user to prompt the user to confirm;

[0021] In response to a confirmation instruction from the user, the test result is added to the test data corresponding to the device type, so as to modify the preset algorithm based on the test data.

[0022] The present invention also provides an ATE test system, the system comprising:

[0023] An acquisition module, used to acquire specified parameters of the device under test;

[0024] A determination module, configured to analyze the specified parameters by a preset algorithm to determine a test method to be used for the device under test;

[0025] A test module, used to test the device under test based on the test mode, continuously obtain the state of the device under test and perform real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset conditions;

[0026] The correction module is used to correct the preset algorithm based on the test results.

[0027] Specifically, the acquisition module includes:

[0028] An identification unit, used to determine the device type of the device under test;

[0029] A configuration unit is used to determine a number of designated parameters corresponding to the device under test based on the device type, so as to collect the designated parameters of the device under test.

[0030] Preferably, the determining module includes:

[0031] A generating unit, configured to analyze the specified parameters by a preset algorithm, generate a first test mode for the device under test, and display the first test mode to the user;

[0032] an adjusting unit, configured to generate, in response to an intervention instruction of the user, a second test mode based on the intervention instruction and the first test mode, so as to determine the second test mode as a test mode used for the device under test;

[0033] The execution unit is configured to determine the first test mode as the test mode used for the device under test if no intervention instruction from the user is received within a preset time.

[0034] Furthermore, the correction module includes:

[0035] A display unit is used to display the test process to the user to prompt the user to confirm;

[0036] A storage unit is used to add the test result to the test data corresponding to the device type in response to the user's confirmation instruction, so as to modify the preset algorithm based on the test data.

[0037] The present invention has at least the following beneficial effects:

[0038] The solution proposed in the present invention analyzes the specified parameters of the device under test through a preset algorithm, and can dynamically select the most appropriate test method. The instant feedback and adjustment mechanism in the solution makes the test process more flexible and can cope with various unforeseen situations that occur during the test. The preset algorithm is corrected through the test results, and the continuous optimization of the test method is achieved, the reliability and stability of the test are improved, and new test methods and algorithms are easily expanded to maintain the flexibility and adaptability of the test system.

[0039] Furthermore, the scheme proposed in the present invention, by determining the device type of the device under test, can more accurately select specified parameters related to the device for collection, thereby avoiding unnecessary parameter collection, reducing the complexity and errors of data processing, ensuring that the test plan is more in line with the actual needs of the device under test, and allowing the user to intervene in the test method according to actual conditions, which not only ensures the degree of automation of the test, but also takes into account the user's professional judgment and experience. By recording the test results recorded by the user, a rich test knowledge base can be constructed and the preset algorithm can be continuously optimized, thereby effectively improving the accuracy and reliability of the test method.

[0040] Therefore, the present invention provides an ATE testing method and device. The scheme proposed in the present invention can be applied to a variety of different types of devices under test, can determine the test strategy to be used according to the device under test, and can respond to the state change of the device in a timely manner during the test process to dynamically adjust the test method, and finally optimize the algorithm for determining the test strategy through the test results. It has the advantages of real-time, high efficiency, and self-adaptation, significantly improves the quality and efficiency of the test, and has good scalability. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0042] Figure 1 A schematic diagram of the overall method flow of the ATE testing method provided in Example 1;

[0043] Figure 2 A flow chart of the method for collecting parameters;

[0044] Figure 3 A flowchart of the method for modifying the algorithm;

[0045] Figure 4 A schematic diagram of the method flow for determining the test method;

[0046] Figure 5 This is a schematic diagram of the module structure of the ATE test system provided in Example 2.

[0047] Reference numerals

[0048] 10-acquisition module; 11-identification unit; 12-configuration unit; 20-determination module; 21-generation unit; 22-adjustment unit; 23-execution unit; 30-test module; 40-correction module; 41-display unit; 42-storage unit. DETAILED DESCRIPTION

[0049] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0050] Hereinafter, various embodiments of the present invention will be described more fully. The present invention may have various embodiments, and adjustments and changes may be made therein. However, it should be understood that there is no intention to limit the various embodiments of the present invention to the specific embodiments disclosed herein, but the present invention should be understood to cover all adjustments, equivalents and / or alternatives falling within the spirit and scope of the various embodiments of the present invention.

[0051] Hereinafter, the term "include" or "may include" used in various embodiments of the present invention indicates the presence of disclosed functions, operations or elements, and does not limit the addition of one or more functions, operations or elements. In addition, as used in various embodiments of the present invention, the terms "include", "have" and their cognates are intended only to indicate specific features, numbers, steps, operations, elements, components or combinations of the foregoing items, and should not be understood as first excluding the presence of one or more other features, numbers, steps, operations, elements, components or combinations of the foregoing items or the possibility of adding one or more features, numbers, steps, operations, elements, components or combinations of the foregoing items.

[0052] In various embodiments of the present invention, the expression "or" or "at least one of A or / and B" includes any combination or all combinations of the words listed at the same time. For example, the expression "A or B" or "at least one of A or / and B" may include A, may include B, or may include both A and B.

[0053] The expressions (such as "first", "second", etc.) used in various embodiments of the present invention may modify the various constituent elements in various embodiments, but may not limit the corresponding constituent elements. For example, the above expressions do not limit the order and / or importance of the elements. The above expressions are only used for the purpose of distinguishing an element from other elements. For example, the first user device and the second user device indicate different user devices, although both are user devices. For example, without departing from the scope of various embodiments of the present invention, the first element may be referred to as the second element, and similarly, the second element may also be referred to as the first element.

[0054] It should be noted that in the present invention, unless otherwise clearly specified and defined, the terms such as "installation", "connection", "fixation" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0055] In the present invention, those skilled in the art need to understand that the terms indicating orientation or positional relationship herein are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0056] The terms used in various embodiments of the present invention are only used for the purpose of describing specific embodiments and are not intended to limit various embodiments of the present invention. As used herein, the singular form is intended to also include the plural form, unless the context clearly indicates otherwise. Unless otherwise limited, all terms used here (including technical terms and scientific terms) have the same meaning as the meaning generally understood by those of ordinary skill in the art to which the various embodiments of the present invention belong. The terms (such as the terms defined in the dictionary generally used) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning, unless clearly defined in various embodiments of the present invention.

[0057] Example 1

[0058] This embodiment proposes an ATE test method, see Figure 1 , the method comprising:

[0059] S100: Collecting specified parameters of the device under test.

[0060] Specifically, the acquisition of the specified parameters of the device under test in step S100 is achieved through multiple sensors and a real-time data acquisition system, and the sensors are arranged in an automatic test equipment (ATE) system to monitor the key parameters of the device under test (DUT);

[0061] Furthermore, in this embodiment, the data acquisition system transmits these parameters to the central processing unit (CPU) in real time for pre-analysis, and transmits them to the adaptive test algorithm module after the pre-analysis is completed.

[0062] Exemplarily, step S100 can use a high-precision voltage sensor to monitor the voltage of each node on the circuit board in real time to ensure that all components operate within the specified range through preliminary analysis; detect the temperature of electronic components through a temperature sensor to detect overheating in time through preliminary analysis to prevent equipment damage; and use a power meter to measure and record the power consumption changes of the device under test to evaluate its energy efficiency through preliminary analysis.

[0063] In this embodiment, the specified parameters may include, but are not limited to, one or more of voltage, current, power, frequency, temperature, impedance, signal amplitude, duty cycle, input delay, output delay, and failure rate.

[0064] S200: Analyze the specified parameters by using a preset algorithm to determine a test method to be used for the device under test.

[0065] Specifically, step S200 is completed in the adaptive test algorithm module of the ATE system. The adaptive test algorithm module can use a preset algorithm to analyze the real-time state of the device under test, predict the test requirements of the device under test, and dynamically adjust the test parameters and processes; illustratively, the adaptive test algorithm module analyzes the real-time state of the device under test, which can specifically include analyzing whether the device under test is in a high temperature state, whether there is a current abnormality, etc., so as to dynamically adjust the test parameters such as input voltage and input current through the analysis results and determine the various steps and the order of the various steps required for the test;

[0066] In this embodiment, the preset algorithm includes an adaptive testing algorithm based on machine learning. The core of the algorithm is a training model. The training model can be trained through historical test data to adjust the test strategy based on the actual state of the device under test, thereby improving test efficiency, reducing the false positive rate, and optimizing the overall test process to improve prediction accuracy.

[0067] S300: Testing the device under test based on the test mode, continuously acquiring the state of the device under test and performing real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset condition.

[0068] Through step S300, the method proposed in this embodiment enables the test system to select an appropriate test process according to the current state of the device under test, such as simplifying the test, repeating the test, or skipping unnecessary steps, thereby improving the test efficiency;

[0069] In this embodiment, the "adjustment of the test methods being executed and / or not executed" described in step S300 includes but is not limited to adding specific test steps, deleting specific test steps, adjusting the order of test steps, modifying the duration of specific test steps and / or modifying the number of single-round tests.

[0070] S400: Modify the preset algorithm based on the test result.

[0071] Therefore, the test system analyzes the results of each test and updates the model of the adaptive test algorithm, thereby further improving the accuracy and reliability of subsequent tests.

[0072] Specifically, see Figure 2 The “collecting specified parameters of the device under test” in step S100 includes:

[0073] S110: Determine the device type of the device under test.

[0074] S120: Determine a number of designated parameters corresponding to the device under test based on the device type, so as to collect the designated parameters of the device under test.

[0075] Exemplarily, when the device type of the device under test includes a resistor, the specified parameters corresponding to the device under test may include resistance value and operating temperature; when the device type of the device under test includes a switching power supply, the specified parameters corresponding to the device under test may include input voltage, output voltage, and output current; when the device type of the device under test includes a wireless transmitter, the specified parameters corresponding to the device under test may include frequency, transmission power, and signal amplitude.

[0076] Further, see Figure 3 , step S400 specifically includes:

[0077] S410: Display the test process and test results to the user to prompt the user to confirm.

[0078] S420: In response to a confirmation instruction from the user, the test result is added to the test data corresponding to the device type, so as to modify the preset algorithm based on the test data.

[0079] Therefore, the test system can analyze the test results, update the model of the adaptive test algorithm, and further improve the reliability of subsequent tests. The test results used in the analysis are the confirmed test results of this time and the previously confirmed historical test results, which have good accuracy.

[0080] Preferably, see Figure 4 , step S200 includes:

[0081] S210: Analyze the specified parameters by using a preset algorithm to generate a first test mode for the device under test, and display the first test mode to the user.

[0082] S220: In response to an intervention instruction from the user, generate a second test mode based on the intervention instruction and the first test mode, so as to determine the second test mode as a test mode used for the device under test.

[0083] S230: If no user intervention instruction is received within a preset time, the first test mode is determined as the test mode used for the device under test.

[0084] Through steps S210-S230, the method proposed in this embodiment allows the user to intervene in the test process, which can ensure that the test is more in line with the specific needs of the user, improve the flexibility and adaptability of the test, and make the test process more comprehensive and reliable;

[0085] If no user intervention instruction is received within the preset time, step S230 directly determines the first test mode as the test mode, maintaining the automation of the process, effectively avoiding time delays caused by waiting for user feedback, and improving overall test efficiency; in a specific embodiment, the preset time is 1 minute.

[0086] In this embodiment, the test system also includes a user interaction interface, which provides real-time visualization of test data for users. Its functions may include but are not limited to real-time display of test processes, prompting users, and responding to user intervention instructions, confirming instructions and causing the test system to perform corresponding operations.

[0087] Example 2

[0088] This embodiment proposes an ATE test system for implementing the ATE test method proposed in Embodiment 1. Figure 5 , the system comprising:

[0089] The acquisition module 10 is used to acquire the specified parameters of the device under test;

[0090] A determination module 20, configured to analyze the specified parameters by a preset algorithm to determine a test method to be used for the device under test;

[0091] The test module 30 is used to test the device under test based on the test mode, continuously obtain the state of the device under test and perform real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset conditions;

[0092] The correction module 40 is used to correct the preset algorithm based on the test results.

[0093] Specifically, the acquisition of the specified parameters of the device under test in the acquisition module 10 is achieved through multiple sensors and a real-time data acquisition system. The sensors are arranged in the automatic test equipment system to monitor the key parameters of the device under test;

[0094] Furthermore, in this embodiment, the acquisition module 10 transmits these parameters to the central processing unit in real time through the data acquisition system for pre-analysis, and transmits them to the adaptive test algorithm module after the pre-analysis is completed.

[0095] In this embodiment, the specified parameters may include, but are not limited to, one or more of voltage, current, power, frequency, temperature, impedance, signal amplitude, duty cycle, input delay, output delay, and failure rate.

[0096] Specifically, the determination module 20 can use a preset algorithm to analyze the real-time status of the device under test, predict the test requirements of the device under test, and dynamically adjust the test parameters and processes; illustratively, the determination module 20 can analyze the real-time status of the device under test, including analyzing whether the device under test is in a high temperature state, whether there is a current abnormality, etc., thereby dynamically adjusting the input voltage, input current and other test parameters through the analysis results and determining the various steps and the order of the steps required for the test; in this embodiment, the preset algorithm includes an adaptive test algorithm based on machine learning.

[0097] In this embodiment, the test module 30 may adjust the test methods being executed and / or not executed, including but not limited to adding specific test steps, deleting specific test steps, adjusting the order of test steps, modifying the duration of specific test steps and / or modifying the number of single-round tests.

[0098] Specifically, the acquisition module 10 includes:

[0099] An identification unit 11, used to determine the device type of the device under test;

[0100] The configuration unit 12 is used to determine a number of designated parameters corresponding to the device under test based on the device type, so as to collect the designated parameters of the device under test.

[0101] Preferably, the determination module 20 includes:

[0102] A generating unit 21, configured to analyze the specified parameters by using a preset algorithm, generate a first test mode for the device under test, and display the first test mode to a user;

[0103] an adjusting unit 22, configured to generate a second test mode based on the intervention instruction and the first test mode in response to the user's intervention instruction, so as to determine the second test mode as the test mode used for the device under test;

[0104] The execution unit 23 is configured to determine the first test mode as the test mode used for the device under test if no intervention instruction from the user is received within a preset time.

[0105] Furthermore, the correction module 40 includes:

[0106] The display unit 41 is used to display the test process and test results to the user to prompt the user to confirm;

[0107] The storage unit 42 is used to add the test result to the test data corresponding to the device type in response to the user's confirmation instruction, so as to modify the preset algorithm based on the test data.

[0108] In a specific embodiment, the preset time is 1 minute.

[0109] In this embodiment, the test system also includes a user interaction interface, which provides real-time visualization of test data for users. Its functions may include but are not limited to real-time display of test processes, prompting users, and responding to user intervention instructions, confirming instructions and causing the test system to perform corresponding operations.

[0110] Example 3

[0111] This embodiment also provides a computer-readable storage medium on which computer instructions are stored. When the instructions are executed by a processor, the steps of the method proposed in the above embodiment 1 are implemented.

[0112] Computer-readable media include permanent and non-permanent, removable and non-removable media and can implement information storage by any method or technology. The information can be computer-readable instructions, data structures, program modules or other data.

[0113] Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk-read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic disk storage, quantum memory, graphene-based storage media or other magnetic storage devices, or any other non-transmission media that can be used to store information that can be accessed by a computing device.

[0114] According to the definition in this article, computer-readable media does not include transitory media such as modulated data signals and carrier waves.

[0115] In summary, the present invention provides an ATE testing method and device. The scheme proposed in the present invention can be applied to a variety of different types of devices under test, can determine the test strategy used according to the device under test, and can respond to the state changes of the device in a timely manner during the test process to dynamically adjust the test method, and finally optimize the algorithm for determining the test strategy through the test results. It has the advantages of real-time, high efficiency, and self-adaptation, significantly improves the quality and efficiency of the test, and has good scalability.

[0116] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An ATE testing method, characterized in that: The method comprises: Collect the specified parameters of the device under test; Analyze the specified parameters by a preset algorithm to determine a test method to be used for the device under test; Testing the device under test based on the test mode, continuously acquiring the state of the device under test and performing real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset condition; The preset algorithm is modified based on the test results.

2. The method according to claim 1, characterized in that The "collection of specified parameters of the device under test" includes: Determining a device type of the device under test; A number of designated parameters corresponding to the device under test are determined based on the device type, so as to collect the designated parameters of the device under test.

3. The method according to claim 1 or 2, characterized in that: The specified parameters include one or more of voltage, current, power, frequency, temperature, impedance, signal amplitude, duty cycle, input delay, output delay, and failure rate.

4. The method according to claim 1, characterized in that: The "analyzing the specified parameters by a preset algorithm to determine the test method to be used for the device under test" includes: Analyzing the specified parameters by a preset algorithm to generate a first test mode for the device under test, so as to display the first test mode to the user; In response to an intervention instruction of the user, generating a second test mode based on the intervention instruction and the first test mode, so as to determine the second test mode as a test mode used for the device under test; If no intervention instruction from the user is received within a preset time, the first test mode is determined as the test mode used for the device under test.

5. The method according to claim 1, characterized in that The "adjustment of the test method being executed and / or not executed" includes adding specific test steps, deleting specific test steps, adjusting the order of test steps, modifying the duration of specific test steps and / or modifying the number of single-round tests.

6. The method according to claim 2, characterized in that The “modifying the preset algorithm based on the test results” includes: The test process and the test result are displayed to the user to prompt the user to confirm; In response to a confirmation instruction from the user, the test result is added to the test data corresponding to the device type, so as to modify the preset algorithm based on the test data.

7. An ATE test system, characterized in that: The system comprises: An acquisition module, used to acquire specified parameters of the device under test; A determination module, configured to analyze the specified parameters by a preset algorithm to determine a test method to be used for the device under test; A test module, used to test the device under test based on the test mode, continuously obtain the state of the device under test and perform real-time analysis during the test process, so as to adjust the test mode being executed and / or not executed when the real-time analysis result meets the preset conditions; The correction module is used to correct the preset algorithm based on the test results.

8. The system according to claim 7, characterized in that The acquisition module comprises: An identification unit, used to determine the device type of the device under test; A configuration unit is used to determine a number of designated parameters corresponding to the device under test based on the device type, so as to collect the designated parameters of the device under test.

9. The system according to claim 7, characterized in that The determination module comprises: A generating unit, configured to analyze the specified parameters by a preset algorithm, generate a first test mode for the device under test, and display the first test mode to the user; an adjusting unit, configured to generate, in response to an intervention instruction of the user, a second test mode based on the intervention instruction and the first test mode, so as to determine the second test mode as a test mode used for the device under test; The execution unit is configured to determine the first test mode as the test mode used for the device under test if no intervention instruction from the user is received within a preset time.

10. The system according to claim 8, characterized in that The correction module comprises: A display unit, used to display the test process and the test result to the user, so as to prompt the user to confirm; A storage unit is used to add the test result to the test data corresponding to the device type in response to the user's confirmation instruction, so as to modify the preset algorithm based on the test data.

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