43results about How to "Remove outliers" patented technology

The present invention relates generally to gathering, verifying, and providing information in an easy-to-understand format. Representations are obtained and evaluated to extract selected content or content information from which certain synthesized information can be gathered, collected, estimated, calculated, or determined. In addition, supplemental synthesized information may be be gathered, collected, estimated, calculated, or determined.

A semiconductor device manufacture method has the steps of: (a) forming a semiconductor device structure in a chip and alignment marks, respectively in a semiconductor wafer; (b) forming a workpiece layer above the semiconductor wafer; (c) exposing the alignment marks; (d) coating an electron beam resist film on the workpiece layer; (e) scanning the alignment marks with an electron beam to obtain plural position information on the alignment marks and obtaining differences between the plural position information; (f) removing abnormal values of position information in accordance with the difference between the plural position information; and (g) performing an electron beam exposure in accordance with plural position information of the alignment marks with the abnormal value being removed. An alignment mark detection precision can be improved in electron beam exposure.

2-D projection images show the temporal profile of the distribution of a contrast medium in an examination object, which contains a vascular system and its surroundings. Each projection image comprises pixels with pixel values. The pixel values of pixels corresponding to one another in the projection images are defined by at least essentially locationally identical areas of the examination object. A computer assigns a uniform 2-D evaluation core that is uniform for all corresponding pixels at least in a sub-area of pixels corresponding to one another in the projection images that is uniform for the projection images. The computer defines at least one characteristic value for each pixel within each projection image based on the evaluation core assigned to the pixel and assigns it to the relevant pixel. Based on the temporal profile of the characteristic values, the computer defines parameters of at least one function of time, so that any deviation between the function parameterized with the parameters and the temporal profile of the characteristic values is minimized. Based on the parameters the computer defines a type and / or an extent and assigns them to a pixel of a 2-D evaluation image corresponding to the pixels of the projection images. The type indicates whether the respective pixel of the evaluation image corresponds to a vessel of the vascular system, a perfused part or a non-perfused part of the surroundings of a vessel of the vascular system. The extent is characteristic of perfusion. The computer outputs at least the sub-area of the evaluation image to a user via a display device.

The invention discloses a measurement method for improving the distributed spatial resolution of an OFDR system. First, the traditional one-dimensional cross-correlation processing result signal is converted into a two-dimensional image signal, and the Gaussian filter denoising algorithm is used on the basis of the two-dimensional image. The image is denoised, and then the processed image is subjected to the next operation, and finally the result with high spatial resolution is obtained. The OFDR sensing system with Gaussian filter denoising algorithm proposed by the present invention can improve the spatial resolution of the measurement system, so that it has greater advantages and wider applications in high-precision monitoring fields such as aerospace, machinery and equipment.

The present invention relates generally to gathering, verifying, and providing information in an easy-to-understand format. Representations are obtained and evaluated to extract selected content or content information from which certain synthesized information can be gathered, collected, estimated, calculated, or determined. In addition, supplemental synthesized information may be gathered, collected, estimated, calculated, or determined.