Intelligent current probe system

Abstract

The invention relates to the technical field of current detection, and discloses an intelligent current probe system current probe, which comprises an adjusting cylinder, the adjusting cylinder comprises a push block II fixedly connected with a pressing piece, the bottom end of the push block II is fixedly connected with a guide block, the outer side of the push block II is sleeved with a partition plate, and the outer side of the partition plate is provided with a rotating ring. A plurality of current probes are installed on the surface of an instrument rack, a rotating ring is rotated, the current probes are transferred from the inner side edge of a temporary storage barrel to the inner center position of the temporary storage barrel, the probe heads of the current probes are aligned with limiting grooves of the temporary storage barrel, then the current probes are driven to move to the position above a detected object on the instrument rack, then a second push block is pressed, and the current probes are detected. The probe head penetrates through the limiting groove to be in contact with the surface of a detected object for current detection, the probe head penetrates through the limiting groove only during detection, and the current probe is located at the center or the side edge position in the adjusting cylinder and is far away from the detection environment when detection is not carried out, so that the influence of the detection environment on the current probe is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of current detection, and in particular to an intelligent current probe system. Background Art

[0002] A current probe is a sensor used to measure the current in a circuit. It senses and measures the current through electromagnetic induction, Hall effect or other principles, thereby monitoring and analyzing the circuit status. It is an important electrical testing equipment and is widely used in electronic testing and measurement fields such as power systems, electronic equipment testing, industrial automation, household appliances, and scientific research experiments.

[0003] During probe testing, multiple probes are first placed on an instrument stand in an equidistant state, and then the instrument stand moves the probes to the top of the test object, and then the probes are pressed so that the needles contact the surface of the test object for current testing. However, when the probes move up and down above the test object, regardless of whether the probes are in a testing state, they are exposed to the air. When the test environment temperature is high or the air humidity is high, the use of probes may cause the material to soften and oxidize or the structure to change, or the spring may not be able to return to its original shape and lose its elasticity, thereby damaging the structural integrity of the probe and causing a decrease in elasticity. The spring force or clamping force of the probe is improperly set and is insufficient to maintain the position of the probe. The surface of the test object is tilted, uneven or irregularly shaped, making it difficult for the probe to make stable contact, resulting in needle slippage during the test. In view of this, an intelligent current probe system is provided. Summary of the invention

[0004] Technical issues solved

[0005] In view of the above-mentioned shortcomings of the prior art, the present invention provides an intelligent current probe system, which can effectively solve the problem that the prior art probe is easily damaged when exposed to the working environment when not in use.

[0006] Technical Solution

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions:

[0008] The present invention provides an intelligent current probe system, comprising

[0009] A current probe, wherein an adjustment tube is sleeved on the outer side of the current probe;

[0010] An instrument frame, wherein the surface of the instrument frame is fixedly connected to the top of the adjusting cylinder, the adjusting cylinder comprises a push block 2 fixedly connected to the pressing member, a guide block is fixedly connected to the bottom end of the push block 2, a partition plate is sleeved on the outer side of the push block 2, a rotating ring is arranged on the outer side of the partition plate, a push block 1 which is in contact with the side of the current probe is arranged on the inner side of the rotating ring, a temporary storage barrel for guiding the current probe is clamped and connected at the bottom end of the rotating ring, a limiting block is arranged between the temporary storage barrel and the rotating ring, a movable groove for limiting the current probe is opened on the inner side of the limiting block, and the guide block passes through the movable groove;

[0011] Wherein, a pointer pointing to the partition plate is fixedly connected to the top of the rotating ring, and the pointer is located above the partition plate.

[0012] Furthermore, a limiting groove is provided at the bottom end of the inner side of the temporary storage bucket, a slot hole is provided above the limiting groove, the slot hole is located in the middle of the temporary storage bucket, a plurality of guide grooves are provided on the side of the slot hole, a current probe is placed inside the guide groove, the current probe includes a needle head suspended inside the guide groove, and the outer side of the needle head is elastically connected to a sleeve through an elastic piece sleeved on its circumferential outer surface.

[0013] Furthermore, a ball groove is provided in the middle of both sides of the top end of the guide groove, a compression spring is elastically connected to the inner side of the ball groove, and a ball is elastically connected to the other end of the compression spring.

[0014] Furthermore, a threaded area is provided below the push block 1 and is dampedly connected to the outer surface of the temporary storage barrel. A clamping plate area is provided above the push block 1 and is rotatably connected to the inner wall of the swivel. The clamping plate area, push block 1 and threaded area are arranged from top to bottom.

[0015] Furthermore, the guide block is composed of an upper cylinder and a lower frustum, the cylindrical portion of the guide block passes through the movable groove, the frustum of the guide block fits with the side of the sleeve, and a slot is provided at the bottom end of the guide block.

[0016] Furthermore, the movable groove comprises small circular grooves for placing current probes, the small circular grooves are placed equidistantly, and one end of the small circular groove close to the middle of the rotating ring is connected to a large circular groove for placing a guide block.

[0017] Furthermore, the size of the slot hole is smaller than the size of the bottom end of the elastic member.

[0018] Furthermore, a groove is provided on the inner wall of the card plate area, and a card strip fixedly connected to the outside of the partition plate is engaged in the groove.

[0019] Beneficial Effects

[0020] Compared with the prior art, the technical solution provided by the present invention has the following beneficial effects:

[0021] The present invention installs a plurality of current probes on the surface of the instrument frame, rotates the rotating ring, and transfers the current probes from the side of the temporary storage barrel to the center of the temporary storage barrel, so that the needle of the current probe is aligned with the limiting groove of the temporary storage barrel, and then the instrument frame is moved to the top of the detection object with the current probe, and then the push block 2 is pressed to make the needle penetrate the limiting groove and contact the surface of the object to be detected to perform current detection. Only when detecting, the needle penetrates from the limiting groove. When not detecting, the current probe is located at the center or side of the adjustment cylinder away from the detection environment, reducing the influence of the detection environment on the current probe and improving the service life of the current probe. At the same time, when the needle after detection is recovered into the adjustment cylinder, the surface of the needle will be wiped by the cleaning strip inside the limiting groove, further reducing the influence of the chemical substances on the surface of the object to be detected or the humidity in the detection environment on the needle, ensuring the integrity of the probe structure, avoiding the influence of environmental factors (such as temperature, humidity, chemicals) on the current probe, and the current probe in the non-detection state is hidden inside the adjustment cylinder;

[0022] In the present invention, multiple current probes are placed in an adjustment cylinder. When facing different production needs, there is no need to stop the machine. The corresponding current probe can be selected from the multiple current probes by rotating the rotating ring to complete the operation of replacing the needle to adapt to different measurement environments. There is no need to reconnect the circuit power supply, and the replacement steps are relatively simple, avoiding downtime that directly leads to interruption of the production process and affects production efficiency and production plan, thereby improving the service life of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0024] Figure 1 It is a schematic diagram of the overall structure installation state of an embodiment of the present invention;

[0025] Figure 2 It is a schematic diagram of the overall structure of the adjustment cylinder according to an embodiment of the present invention;

[0026] Figure 3 This is a schematic diagram of the structure of the adjustment cylinder after the rotating ring is removed according to an embodiment of the present invention;

[0027] Figure 4 This is a schematic diagram of the cross-sectional structure of a temporary storage bucket according to an embodiment of the present invention;

[0028] Figure 5 Schematic diagram of separation of a rotating ring and a partition plate according to an embodiment of the present invention;

[0029] Figure 6 This is a schematic diagram of the separation of the partition plate, the push block and the guide block according to an embodiment of the present invention;

[0030] Figure 7 A schematic diagram of the guide block structure of an embodiment of the present invention;

[0031] Figure 8 Schematic diagram of the internal structure of the temporary storage bucket according to an embodiment of the present invention.

[0032] The numbers in the figure represent respectively: 1. current probe; 11. needle; 12. elastic member; 13. sleeve; 2. adjusting cylinder; 21. swivel; 211. pointer; 212. clamping plate area; 213. threaded area; 214. push block one; 22. partition plate; 221. clamping strip; 23. temporary storage barrel; 231. guide groove; 232. sphere; 233. limit groove; 234. ball groove; 24. limit block; 241. movable groove; 25. push block two; 26. guide block; 261. clamping slot; 3. instrument rack. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] The present invention will be further described below in conjunction with the embodiments.

[0035] Example:

[0036] See also Figure 1-Figure 8 The present invention provides a technical solution for an intelligent current probe system: Figure 1 As shown, when it is necessary to detect and measure the current in the circuit, multiple current probes 1 need to be installed on the surface of the instrument rack 3. In order to avoid the influence of environmental factors such as temperature, humidity, and chemicals on the current probes 1, the current probes 1 when not detecting are hidden inside the adjustment tube 2.

[0037] like Figure 2 , Figure 3 and Figure 4As shown, the adjustment cylinder 2 includes a temporary storage barrel 23, which is composed of an upper cylinder and a lower cone. A guide groove 231 is provided inside the upper cylinder of the temporary storage barrel 23, and a ball groove 234 is provided in the middle of the upper surface of the guide groove 231. A compression spring is elastically connected to the inner side of the ball groove 234, and the other end of the compression spring is elastically connected to the ball 232. In the initial state, the compression spring undergoes a certain elastic deformation under the gravity of the ball 232, and about two-thirds of the ball 232 is embedded in the ball groove 234. When a large external force is applied to the upper side of the ball 232, the ball 232 can be completely embedded in the ball groove 234. When a large external force is applied to the upper side of the ball 232, the top of the ball 232 is flush with the highest point of the guide groove 231. Figure 4 As shown, the current probe 1 includes a needle 11 for detecting the circuit current, and the outer side of the needle 11 is elastically connected to the sleeve 13 through an elastic member 12 sleeved on its outer surface. The elastic member 12 includes a high-durability spring and a fixing plate, and the two fixing plates are respectively arranged at both ends of the high-durability spring. When the current probe 1 is placed in the temporary storage barrel 23, the needle 11 is inside the guide groove 231, and the bottom fixing plate ensures the horizontal fixed state of the elastic member 12 under the joint restriction of the highest point of the guide groove 231 and the two spheres 232. The inner size of the guide groove 231 is slightly larger than the size of the needle 11 exposed at the bottom of the elastic member 12. The needle 11 is in a suspended state inside the guide groove 231. When the current probe 1 moves along the guide groove 231, the needle 11 suspended in the guide groove 231 will not accidentally collide with the inner wall of the guide groove 231, causing damage to the needle 11.

[0038] like Figure 3 and Figure 4As shown, the upper part of the outer surface of the temporary storage barrel 23 is provided with irregular patterns that fit with the inner side of the rotating ring 21, which serves to increase the friction between the two. The upper part of the outer surface of the temporary storage barrel 23 is engaged with the rotating ring 21, and the upper part of the temporary storage barrel 23 is fixedly connected with a limiting block 24. The inner side of the limiting block 24 is provided with a movable groove 241. The movable groove 241 can be divided into a plurality of small circular grooves for placing the current probe 1 and a large circular groove connected with the plurality of small circular grooves. The small circular grooves and the large circular grooves are linked to form a channel for conveniently placing the current probe 1. In the present invention, four small circular grooves are symmetrically arranged, and the movable groove 241 is a cross groove, which improves the positioning accuracy and stability of the current probe 1. The size of the small circular groove is equal to the maximum diameter of the top of the sleeve 13 of the maximum size of the current probe 1. The staff can directly put the current probe 1 from the top of the movable groove 241 into the guide groove 2 In 31, under the combined effect of the shock absorption and buffering of the elastic member 12 and the large height dimension of the guide groove 231, the gravitational potential energy of the falling current probe 1 will not cause it to collide with the bottom end of the guide groove 231. After placement, the top position of the sleeve 13 is higher than the top position of the movable groove 241. At the same time, a guide block 26 is arranged at the position of the large circular groove. The guide block 26 consists of an upper cylinder and a lower cone. The size of the cylinder is equal to the size of the large circular groove, and the cone part of the guide block 26 is located below the large circular groove. When the current probe 1 is placed, the side edge of its circular axis falls smoothly under the restriction of the outer surface of the cylindrical circumference of the guide block 26 and the side edge of the movable groove 241 when moving from top to bottom, so as to avoid the position of the current probe 1 deviating from the small circular groove when being lowered, so that the bottom end of the elastic member 12 cannot be correctly engaged in the position above the guide groove 231, thereby ensuring the accuracy of the installation position.

[0039] like Figure 5 As shown, the inner side of the rotating ring 21 is respectively provided with a clamping plate area 212 rotatably connected to the inner wall of the rotating ring 21, a push block 214 fixedly installed in the middle, and a threaded area 213 tightly fitted to the outer surface of the temporary storage barrel 23, as shown in FIG. Figure 2 As shown, the swivel 21 is sleeved on the top of the outer side of the temporary storage barrel 23.

[0040] like Figure 6 As shown, a groove is provided on the inner wall of the card plate area 212 , and the groove is engaged with the card strip 221 . The card strip 221 is fixedly arranged on the outer side of the partition plate 22 , and the card plate area 212 is rotatably connected with the rotating ring 21 .

[0041] refer to Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6When the current probe 1 is needed to detect the circuit current, the staff rotates the rotating ring 21. The rotation of the rotating ring 21 can drive the push block 214 fixed on the inner side to rotate. In the initial state, the side of the sleeve 13 contacts the push block 214 at the position with the smallest diameter. As the rotating ring 21 rotates, the diameter of the push block 214 and the side of the sleeve 13 gradually increases. The push block 214 applies a force to the side of the sleeve 13, so that the sleeve 13 moves to the center line position of the temporary storage barrel 23 under the restriction of the movable groove 241. At this time, the side edge of the sleeve 13 contacts the conical part of the guide block 26, and the side edge of the top end of the sleeve 13 is set to an inclined state. Under the joint action of the thrust of the push block 214 and the lateral force between the sleeve 13 and the inclined surface of the guide block 26, the sleeve 13 moves horizontally toward the center line position of the temporary storage bucket 23 and moves vertically at the same time. The current probe 1 gradually moves from the state where the top is exposed in the movable groove 241 to the state where it is completely embedded in the inner side of the temporary storage bucket 23. During this process, the fixed plate of the elastic member 12 squeezes the ball 232, so that the ball 232 squeezes the compression spring and is completely embedded in the ball groove 234. The vertical thrust of the compression spring on the bottom end of the elastic member 12 is equal to the longitudinal force between the sleeve 13 and the inclined surface of the guide block 26, further ensuring that the current probe 1 always remains in a vertical state as a whole when moving under the joint action of the upper side guide block 26 and the lower side guide groove 231, and no tilting collision occurs.

[0042] like Figure 7 As shown, a slot 261 is provided at the bottom of the guide block 26, and the push block 214 squeezes the sleeve 13, so that the current probe 1 moves as a whole along the top of the guide slot 231 and the inclined side of the guide block 26, and the side of the sleeve 13 moves from the top of the side of the guide block 26 to the bottom of the side of the guide block 26, and as the push block 214 fits the outer surface of the sleeve 13, it gradually moves to the maximum diameter of the push block 214, as shown in FIG. Figure 4 As shown, the top of the sleeve 13 is set as an inclined surface. When the push block 214 squeezes the top of the sleeve 13 to the bottom of the side of the guide block 26, the sleeve 13 continues to be stressed and its top inclined surface will be subject to pressure from the bottom of the push block 214. In addition to being squeezed by the push block 214 to move toward the bottom of the guide block 26, the sleeve 13 is also subject to pressure from the bottom of the guide block 26 on the inclined surface of the sleeve 13, so that the sleeve 13 moves along the lower surface of the guide block 26 until the top of the sleeve 13 is embedded in the slot 261. During this process, the elastic member 12 moves on the upper surface of the guide slot 231 and undergoes slight elastic deformation when the top of the sleeve 13 is pressed by the lower surface of the guide block 26, so that the sleeve 13 can be smoothly inserted into the slot 261 under the push of the push block 214. Figure 7 and Figure 4As shown, four guide grooves 231 are provided with slots near the center of the temporary storage barrel 23, and a limiting groove 233 is provided at the bottom of the slot. The size of the slot is smaller than the size of the bottom of the elastic member 12. When the sleeve 13 moves to the lower surface of the guide block 26, the bottom of the elastic member 12 can smoothly move from the top of the guide groove 231 to the top of the slot. At this time, the needle 11 of the current probe 1 is aligned with the limiting groove 233. Figure 4 and Figure 5 As shown, the top end of the guide block 26 is fixedly connected to the bottom end of the push block 25, and the top end of the push block 25 is fixedly connected to a pressing member such as an electric telescopic rod installed at the instrument frame 3.

[0043] Before conducting current detection, rotate the rotating ring 21 to transfer the current probe 1 from the side of the temporary storage barrel 23 to the center of the temporary storage barrel 23, so that the needle 11 of the current probe 1 is aligned with the limiting groove 233 of the temporary storage barrel 23, and then move the current probe 1 on the instrument frame 3 to the top of the detection object, and then press the push block 25 to make the needle 11 pass through the limiting groove 233 and contact the surface of the object to be detected for current detection. Only when detecting, the needle 11 passes through the limiting groove 233. When not detecting, the current probe 1 is located in the center or side of the adjusting cylinder 2 away from the detection environment, reducing the impact of the detection environment on the current probe 1 and increasing the service life of the current probe 1. At the same time, when the needle 11 after detection is recovered into the adjusting cylinder 2, the surface of the needle 11 will be wiped by the cleaning strip inside the limiting groove 233, further reducing the impact of the chemical substances on the surface of the object to be detected or the humidity in the detection environment on the needle 11, thereby ensuring the integrity of the probe structure.

[0044] Due to the variety of current probes 1, the designs of their needles 11 are also different and suitable for different detection environments. Different measurement tasks may require needles 11 of different types or sizes. Therefore, the needle 11 needs to be replaced to adapt to different measurement environments. In actual production, before replacing the needle 11, the device needs to be powered off first, then disassembled using special tools or according to specific operating steps, and then the new needle 11 that has been checked to be in good condition is correctly connected to the probe body. Finally, after confirming that the needle 11 has been replaced correctly, the circuit power supply can be reconnected. While the replacement steps are relatively cumbersome, downtime will directly lead to interruption of the production process, affecting production efficiency and production plans, and frequent shutdowns to replace equipment may shorten the service life of the equipment.

[0045] In the present invention, multiple current probes 1 are placed in an adjustment cylinder 2. When facing different production needs, the corresponding current probe 1 can be selected from the multiple current probes 1 by rotating the rotating ring 21 without stopping the machine to complete the operation of replacing the needle 11 to adapt to different measurement environments.

[0046] like Figure 2 , Figure 5 and Figure 6 As shown, a partition plate 22 is engaged with the inner side of the card plate area 212 rotatably connected to the inner wall of the rotating ring 21. The surface of the partition plate 22 is divided into zones according to the types of the current probe 1. In the present invention, four partition plates are provided. A push block 25 fixedly connected to a driving member such as a telescopic rod installed at the instrument frame 3 is inserted in the middle of the partition plate 22. Figure 4 , Figure 3 and Figure 8 As shown, the four different current probes 1 of the present invention are evenly placed, the four sleeves 13 are placed at the four ends of the movable groove 241, the four elastic members 12 are all placed on the upper surface of the guide groove 231, and the four needles 11 are all embedded in the guide groove 231. Figure 4 , Figure 6 and Figure 7 As shown, the height of the inclined surface at the top end of the sleeve 13 is greater than the height of the slot 261 , and the top end portion of the sleeve 13 can be embedded in the slot 261 .

[0047] When different types or sizes of current probes 1 need to be replaced for different measurement tasks, there is no need to shut down the machine during the interval of completing the previous detection task. The staff can rotate the rotating ring 21 as needed, and the rotation of the rotating ring 21 drives the pointer 211 to rotate. The pointer 211 points to different partitions of the partition plate 22. While rotating to the required partition, the push block 1 214 can squeeze the required current probe 1. When the new current probe 1 moves to the lower surface of the guide block 26, the side of the original current probe 1 is squeezed first, and the new sleeve 13 squeezes the original sleeve 13. The sleeve 13 presses the elastic member 12 to elastically The deformation causes the original sleeve 13 to move out of the restriction of the slot 261. When the new current probe 1 is engaged in the slot 261, one side of the bottom end of the original current probe 1 contacts the top of the ball 232. Since there is no push block 214 to restrict the side of the ball 232 close to the rotating ring 21, the elastic deformation of the compression spring on the inner side of the ball slot 234 provides an upward force to the original current probe 1. The current probe 1 moves upward along the oblique edge of the guide block 26, so that the current probe 1 moves from the middle of the temporary storage bucket 23 to the side of the movable slot 241. When the new current probe 1 performs the detection task, the original current probe 1 has moved to its original position.

[0048] When the current probe 1 is damaged or the types of current probes 1 required for the detection task are increased, the swivel 21 is first removed from the top of the temporary storage bucket 23 to expose the movable groove 241, and then the current probe 1 moved to the original position, that is, the leaked top portion is exposed, is removed from the temporary storage bucket 23.

[0049] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the protection scope of the technical solutions of the embodiments of the present invention.

Claims

1. An intelligent current probe system, characterized in that: include: A current probe (1), wherein an adjustment tube (2) is sleeved on the outer side of the current probe (1); An instrument frame (3), wherein the surface of the instrument frame (3) is fixedly connected to the top of the adjustment tube (2), the adjustment tube (2) comprises a push block (25) fixedly connected to the pressing member, the bottom end of the push block (25) is fixedly connected to a guide block (26), the outer side of the push block (25) is sleeved with a partition plate (22), the outer side of the partition plate (22) is provided with a rotating ring (21), the inner side of the rotating ring (21) is provided with a push block (214) that is in contact with the side of the current probe (1), the bottom end of the rotating ring (21) is snap-connected with a temporary storage bucket (23) for guiding the current probe (1), a limiting block (24) is provided between the temporary storage bucket (23) and the rotating ring (21), the inner side of the limiting block (24) is provided with a movable groove (241) for limiting the current probe (1), and the bottom end of the guide block (26) passes through the movable groove (241) and extends to the outside; A pointer (211) for pointing to the partition plate (22) is fixedly connected to the top of the rotating ring (21), and the pointer (211) is located above the partition plate (22).

2. The intelligent current probe system according to claim 1, characterized in that: A limiting groove (233) is provided at the bottom inner end of the temporary storage barrel (23), a slot hole is provided above the limiting groove (233), the slot hole is located in the middle of the temporary storage barrel (23), a plurality of guide grooves (231) are provided on the side of the slot hole, a current probe (1) is placed inside the guide groove (231), the current probe (1) comprises a needle head (11) suspended inside the guide groove (231), and the outer side of the needle head (11) is elastically connected to a sleeve (13) via an elastic member (12) sleeved on the outer surface of the needle head (11).

3. The intelligent current probe system according to claim 2, characterized in that: A ball groove (234) is provided in the middle of both sides of the top end of the guide groove (231), a compression spring is elastically connected to the inside of the ball groove (234), and a ball (232) is elastically connected to the other end of the compression spring.

4. The intelligent current probe system according to claim 1, characterized in that: A threaded area (213) is provided below the push block (214) and is damping-connected to the outer surface of the temporary storage barrel (23). A clamping plate area (212) is provided above the push block (214). The clamping plate area (212) is rotatably connected to the inner wall of the rotating ring (21). The clamping plate area (212), the push block (214) and the threaded area (213) are arranged from top to bottom.

5. The intelligent current probe system according to claim 2, characterized in that: The guide block (26) is composed of an upper cylinder and a lower truncated cone. The cylindrical portion of the guide block (26) passes through the movable groove (241), the truncated cone portion of the guide block (26) fits against the side of the sleeve (13), and a slot (261) is provided at the bottom end of the guide block (26).

6. The intelligent current probe system according to claim 1, characterized in that: The movable groove (241) comprises a small circular groove for placing the current probe (1), the small circular grooves are placed at equal intervals, and one end of the small circular groove close to the middle of the rotating ring (21) is connected to a large circular groove for placing the guide block (26).

7. The intelligent current probe system according to claim 2, characterized in that: The size of the slot hole is smaller than the size of the bottom end of the elastic member (12).

8. The intelligent current probe system according to claim 4, characterized in that: A groove is provided on the inner wall of the clamping plate area (212), and a clamping strip (221) fixedly connected to the outside of the partition plate (22) is clamped inside the groove.

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