Calibration device for high-pressure paint film continuity tester

Abstract

The invention discloses a high-voltage paint film continuity tester calibration device which comprises a shell, and an MCU processing unit, a voltage measurement unit, a current measurement unit, a standard current source unit, a square wave generation unit, a control display unit, a timing unit and a resistance load unit are arranged in the shell. The voltage measuring unit comprises a voltage connector, a voltage divider, an amplifying circuit, an AD acquisition unit and an isolation unit; the current measuring unit comprises a current connector and a current sampling unit. The high-voltage paint film continuity tester calibration device is provided with functional modules such as an MCU processing unit, a voltage measurement unit, a current measurement unit, a standard current source unit, a square wave generation unit, a control display unit, a timing unit and a resistance load unit. Verification of parameter items such as test voltage, voltage drop, voltage ripple coefficient, steady-state short-circuit current, sensitivity, response time, counting frequency and the like of the high-voltage paint film continuity tester can be realized.

Description

Technical Field

[0001] The invention relates to the technical field of high-voltage paint film tester calibration, in particular to a high-voltage paint film continuity tester calibration device. Background Art

[0002] High-pressure paint film is a paint film with specific properties. High-pressure paint film is formed under high-pressure conditions during the coating process. The use of high-pressure technology can improve the density, flatness and consistency of the coating. High-pressure spraying can make the coating cover the surface of the substrate more evenly and quickly, reduce the sagging and defects formed by the coating on the surface, so as to obtain a more beautiful and higher-quality coating. At the same time, high-pressure coating technology can greatly improve the production efficiency of the coating operation. Through high-pressure spraying, the coating can reach the surface of the workpiece more quickly, reduce the coating time, and improve the operating efficiency of the production line. High-pressure coating technology can make the coating denser and can form a more complete film structure through high pressure, thereby enhancing the waterproof, rust-proof, and corrosion-resistant properties of the coating and extending the service life of the workpiece. The high-voltage paint film continuity tester is mainly composed of a test circuit, a display device, a high-voltage wheel and other parts. The high-voltage paint film continuity tester is a device used to detect the continuity of high-voltage paint films. It can detect the damage of the paint film layer in time, and can record and display the number of damage defects of the paint film line, so as to realize the quality inspection of the high-voltage paint film line, thereby judging whether the quality of the high-voltage paint film line meets the relevant standards and quality technical performance requirements. Therefore, it is necessary to calibrate the high-voltage paint film continuity tester regularly to ensure the normal operation of the high-voltage paint film continuity tester and the technical indicators meet the inspection requirements, so as to provide reliable data for the continuous detection of high-voltage paint films. However, at present, when calibrating the high-voltage paint film continuity tester, domestic metrology technical institutions need to use different standard instruments according to different calibration items, including digital high-voltage meters, digital ammeters, square wave generators, current sources, stopwatches, resistors and other instruments and equipment. The measurement process is complicated to operate, the measurement time is long, and the measurement data is greatly affected by human operation, which in turn affects the accuracy and reliability of the measurement data. Summary of the invention

[0003] The purpose of the present invention is to provide a high-voltage paint film continuity tester calibration device to solve the problems raised in the above background technology that during the calibration of the high-voltage paint film continuity tester, the measurement process is complicated, the measurement time is long, the measurement data is greatly affected by human operation, and the accuracy and reliability of the measurement data are not high.

[0004] To achieve the above object, the present invention provides the following technical solution: a high-voltage paint film continuity tester calibration device, comprising a housing, the internal structure of which comprises an MCU processing unit, a voltage measuring unit, a current measuring unit, a standard current source unit, a square wave generating unit, a control display unit, a timing unit and a resistance load unit; The voltage measurement unit includes: a voltage connector, a voltage divider, an amplifier circuit, an AD acquisition unit and an isolation unit; The current measurement unit includes: a current connector, a current sampling unit, an AD acquisition unit and an isolation unit; The standard current source unit includes: a current source connector, an isolation unit, a D / A conversion unit, and a power amplification unit; The square wave generating unit comprises: a square wave connector, an isolation unit, an amplification unit and a function chip; The control and display unit comprises a display screen; The resistance load unit includes a resistance joint; The voltage signal enters the voltage divider through the voltage connector, and the voltage signal is divided by the resistance load unit inside the voltage divider, so that the voltage enters the AD acquisition unit after passing through the relevant amplification circuit, and the signal is converted into a digital signal by the AD acquisition unit, and the digital signal is transmitted to the isolation unit, and then transmitted to the MCU processing unit through the isolation unit, and the MCU processing unit transmits the analyzed data to the control display unit, and the data is displayed by the control display unit; The current signal enters the current sampling unit through the current source connector. The current sampling unit transforms the circuit and transmits the transformed circuit to the AD acquisition unit. The AD acquisition unit converts the analog signal into a digital signal, transmits the digital signal to the isolation unit through the AD acquisition unit, and transmits it to the inside of the MCU processing unit through the isolation unit. The MCU calculates the corresponding voltage signal through the relevant algorithm, converts it into the corresponding current value, and sends it to the control display unit for display; The data generated by the MCU processing unit is transmitted to the isolation unit, and the data is transmitted to the D / A conversion unit through the isolation unit. The D / A conversion unit converts the data into a reference voltage, and the D / A conversion unit transmits the data to the power amplifier unit, and the output current is controlled by the power amplifier unit.

[0005] Preferably, the AD acquisition unit comprises: an ADC conversion chip, a power supply module and a sample-and-hold circuit, and the analog signal is converted into a digital signal through the ADC conversion chip.

[0006] Preferably, the power amplification unit comprises: an adjustment transistor, a standard resistor and a feedback circuit, and the current output is stabilized by feedback electricity.

[0007] Preferably, the isolation unit includes: an isolation chip and a DC / DC isolation power supply, and the D / A conversion unit includes: a D / A conversion chip, a power supply unit and a voltage reference module, and a reference voltage can be obtained through the D / A conversion unit.

[0008] Preferably, the current sampling unit includes: a sampling resistor and a sampling circuit. When the current enters the current sampling unit, the sampling resistor can convert the current into a voltage, and at the same time, the current is converted into 0.2V~2V through the sampling circuit and the related power amplification unit.

[0009] Preferably, the control display unit can control the current output size through the output of the D / A chip, and the control display unit is an integrated LCD touch screen. The control display unit communicates with the MCU processing unit through the serial port, and data transmission and interaction are required between the control display unit and the MCU processing unit.

[0010] Preferably, the MCU processing unit is connected to each functional circuit, and the MCU processing unit processes the control and related circuit signals and outputs them for display on the control display unit. The timing unit is connected in series with the MCU processing unit, and the time information can be read and the stopwatch function can be controlled through the timing unit.

[0011] Compared with the prior art, the invention has the following beneficial effects: the high-voltage paint film continuity tester calibration device: 1. It is equipped with functional modules such as MCU processing unit, voltage measurement unit, current measurement unit, standard current source unit, square wave generation unit, control display unit, timing unit and resistance load unit, which can realize the calibration of test voltage, voltage drop, voltage ripple factor, steady-state short-circuit current, sensitivity, response time, counting frequency and other parameter items of the high-voltage paint film continuity tester.

[0012] 2. The wiring is convenient and direct during the calibration process, and the measurement process is simple and easy to understand, which saves measurement time, reduces human operation interference, and thus improves the accuracy and reliability of measurement data. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic diagram of the composition structure of the present invention; Figure 2 It is a schematic diagram of the overall functional implementation principle structure of the present invention; Figure 3 It is a schematic diagram of the structure of the AD acquisition unit of the present invention; Figure 4 This is a schematic diagram of the structure of the isolation unit of the present invention; Figure 5 This is a schematic diagram of the structure of the D / A conversion unit of the present invention; Figure 6 It is a schematic diagram of the structure of the power amplification unit of the present invention; Figure 7 This is a schematic diagram of the structure of the amplification unit of the present invention; Figure 8 It is a schematic diagram of the three-dimensional structure of the present invention; Fig. 9 Schematic diagram of the overall installation of the housing of the present invention In the figure: 1. Shell; 2. Display screen; 3. Voltage connector; 4. Current connector; 5. Current source connector; 6. Resistance connector; 7. Square wave connector. DETAILED DESCRIPTION

[0014] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0015] See also Figure 1-9 , the present invention provides a technical solution: a high-voltage paint film continuity tester calibration device, comprising a housing 1, the internal structure of the housing 1 comprises an MCU processing unit, a voltage measuring unit, a current measuring unit, a standard current source unit, a square wave generating unit, a control display unit, a timing unit and a resistance load unit; The voltage measurement unit includes: a voltage connector 3, a voltage divider, an amplifier circuit, an AD acquisition unit and an isolation unit; The current measurement unit includes: a current connector 4, a current sampling unit, an AD acquisition unit and an isolation unit; The standard current source unit includes: a current source connector 5, an isolation unit, a D / A conversion unit, and a power amplification unit; The square wave generating unit comprises: a square wave connector 7, an isolation unit, an amplification unit and a function chip; The control display unit includes a display screen 2; The resistance load unit includes a resistance joint 6; The voltage signal enters the voltage divider, and the voltage signal is divided by the resistance load unit inside the voltage divider, so that the voltage enters the AD acquisition unit after passing through the relevant amplification circuit, and the signal is converted into a digital signal by the AD acquisition unit, and the digital signal is transmitted to the isolation unit, and then transmitted to the MCU processing unit through the isolation unit. The MCU processing unit transmits the analyzed data to the control display unit, and the data is displayed on the display screen 2; The current signal enters the current sampling unit, and the circuit is transformed by the current sampling unit, so that the transformed circuit is transmitted to the AD acquisition unit, and the AD acquisition unit converts the analog signal into a digital signal, and transmits the digital signal to the isolation unit through the AD acquisition unit, and transmits it to the inside of the MCU processing unit through the isolation unit. The MCU calculates the corresponding voltage signal through the relevant algorithm, converts it into the corresponding current value, and sends it to the control display unit, and displays the data through the display screen 2; The data generated by the MCU processing unit is transmitted to the isolation unit, and the data is transmitted to the D / A conversion unit through the isolation unit, and the D / A conversion unit converts it into a reference voltage. At the same time, the D / A conversion unit transmits it to the power amplifier unit, and the output current is controlled by the power amplifier unit; The data generated by the MCU processing unit is transmitted to the isolation unit, and the data is transmitted to the function chip and the amplification unit through the isolation unit, which can output a square wave with adjustable frequency and driving capability; The high-voltage line is connected to the voltage connector 3, and the high voltage can be transmitted to the inside of the voltage divider through the voltage connector 3. The high voltage is converted by the voltage divider to a DC voltage of 0.15V~1.5V. At the same time, the amplifier circuit can transmit the voltage to the inside of the AD acquisition unit. At this time, the ADC conversion chip can convert the analog signal into a digital signal. The ADC conversion chip quantizes and encodes the data. This step is to disperse the signal into several quantization levels. At the same time, the quantization level corresponds to a digital code. The encoding process will be arranged in a certain format, and then the ADC conversion chip transmits the data to the display screen 2. Through the display Screen 2 displays the voltage value, and then the ADC conversion chip transmits the signal to the isolation unit. The isolation unit processes the data through the isolation chip. The isolation chip can avoid mutual interference between the analog circuit and the digital circuit. The processed data is transmitted to the MCU processing unit, and the signal is processed by the STMicroelectronics and the internal chip inside the MCU processing unit. At this time, the MCU processing unit calculates the effective value of the corresponding voltage signal and the ripple component in the voltage signal through the relevant algorithm. At this time, the MCU processing unit transmits the data to the control display unit, and the control display unit transmits the data to the display screen 2, and the data is displayed on the display screen 2; The current line is connected to the current connector 4. At this time, the current enters the interior of the standard current source unit through the current connector 4, and at the same time, it is converted into a voltage through the sampling resistor inside the current sampling unit. The voltage of the sampling resistor transmits the voltage to the sampling circuit and converts it into 0.2V~2V. At this time, the voltage can be transmitted to the AD acquisition unit. The AD acquisition unit can convert it from an analog signal to a digital signal, transmit the converted signal to the isolation unit, and transmit the signal to the MCU processing unit through the isolation unit. The MCU processing unit calculates the corresponding voltage signal through the relevant algorithm and converts it into the corresponding current value. The MCU processing unit transmits the data to the control display unit, and the control display unit transmits the data to the display screen 2, and the data is displayed on the display screen 2; By setting different current values ​​through the display screen 2, the MCU processing unit can convert the current value into a digital signal according to a certain algorithm. The digital quantity given by the MCU processing unit after processing is transmitted to the inside of the standard current source unit. The MCU processing unit will calculate the corresponding digital signal code, and transmit the data to the D / A conversion unit, so that the isolation chip inside the isolation unit processes the data, and a controllable reference voltage can be obtained. After the data processing is completed, it is transmitted to the D / A conversion unit. The D / A conversion unit converts the digital signal into an analog voltage. The D / A conversion unit transmits the current to the power amplifier unit. The power amplifier unit converts the input analog voltage into current. The power amplifier unit adjusts the base of the transistor inside, changes the conduction degree of the transistor to control the size of the output current, and generates a feedback voltage after passing through the standard resistor of the power amplifier unit. The feedback voltage stabilizes the current output through the feedback circuit, and the power supply is output through the current source connector 5. The MCU processing unit adjusts the parameters of the digital signal or the voltage-current conversion unit according to the calibration procedure to correct the deviation of the output current and ensure the high accuracy and stability of the output current; The model of the square wave generating unit function chip is AD9833. The MCU processing unit writes the corresponding control word to the AD9833 control register to set the working mode of the chip. The function chip can know the generated waveform through the control register. The function chip sets the frequency of the output waveform through the frequency register. By writing a specific frequency control word to the frequency register, the period of the output waveform is set. The function chip continuously outputs a digital signal that meets the square wave characteristics according to the setting, and the square wave is output through the square wave connector 7.

[0016] The AD acquisition unit includes: an ADC conversion chip, a power supply module and a sample-and-hold circuit, and the analog signal is converted into a digital signal through the ADC conversion chip; The ADC conversion chip converts the analog signal into a digital signal. At the same time, the power supply module can supply power to the ADC conversion chip to prevent the ADC conversion chip from being disconnected. At the same time, the sample and hold circuit transmits the signal and voltage.

[0017] The power amplifier unit includes: an adjustment transistor, a standard resistor and a feedback circuit, which stabilizes the current output by feedback electricity; The MCU processing unit can control the reference voltage of the overall D / A conversion unit and the current output size. At this time, the brightness of the transistor can be adjusted and the current output can be stabilized through the feedback circuit.

[0018] The isolation unit includes: an isolation chip and a DC / DC isolation power supply, and the D / A conversion unit includes: a D / A conversion chip, a power supply unit and a voltage reference module. The D / A conversion unit can obtain a reference voltage, which can adjust the transistor to change the conduction degree of the transistor, thereby controlling the magnitude of the output current; The voltage is processed by the isolation chip, and the MCU processing unit controls the current output size of the D / A chip.

[0019] The current sampling unit includes: a sampling resistor and a sampling circuit. When the current enters the current sampling unit, the sampling resistor can convert the current into a voltage, and at the same time, the current is converted into 0.2V~2V through the sampling circuit and the related power amplifier unit; The sampling resistor can convert current into voltage, while the sampling circuit and related amplification circuit can convert power.

[0020] The control display unit can control the current output size through the D / A chip, and the control display unit communicates with the MCU processing unit through the serial port. At the same time, data transmission and interaction are required between the control display unit and the MCU processing unit; The control display unit can display the data transmitted from the MCU processing unit through the display screen 2.

[0021] The MCU processing unit is connected to each functional circuit. At the same time, the MCU processing unit processes the control and related circuit signals and outputs them to the control display unit. At the same time, the timing unit is connected in series with the MCU processing unit. The timing unit can read the time information and control the stopwatch function. The MCU processing unit can analyze and process different data through the internal chip, and transmit the analyzed data to the surface of the control display unit.

[0022] Working principle: When using the high-voltage paint film continuity tester calibration device, an MCU processing unit, a voltage measurement unit, a current measurement unit, and a standard current source unit are set to facilitate the conversion of current and voltage, improve the calibration efficiency, and increase the overall practicality.

[0023] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. High-voltage paint film continuity tester calibration device, characterized by: It comprises a housing (1), wherein the internal structure of the housing (1) comprises an MCU processing unit, a voltage measuring unit, a current measuring unit, a standard current source unit, a square wave generating unit, a control display unit, a timing unit and a resistance load unit; The voltage measurement unit comprises: a voltage connector (3), a voltage divider, an amplifier circuit, an AD acquisition unit and an isolation unit; The current measurement unit comprises: a current connector (4), a current sampling unit, an AD acquisition unit and an isolation unit; The standard current source unit comprises: a current source connector (5), an isolation unit, a D / A conversion unit, and a power amplification unit; The square wave generating unit comprises: a square wave connector (7), an isolation unit, an amplification unit and a function chip; The control display unit comprises a display screen (2); The resistance load unit comprises a resistance joint (6); The voltage signal enters the voltage divider through the voltage connector (3), and the voltage signal is divided by the resistor load unit inside the voltage divider, so that the voltage enters the AD acquisition unit after passing through the relevant amplification circuit, and the signal is converted into a digital signal by the AD acquisition unit, and the digital signal is transmitted to the isolation unit, and then transmitted to the MCU processing unit through the isolation unit, and the MCU processing unit transmits the analyzed data to the control display unit, and the control display unit displays the data; The current signal enters the current sampling unit through the current source connector (5), the current sampling unit transforms the circuit, and transmits the transformed circuit to the AD acquisition unit, the AD acquisition unit transforms the analog signal into a digital signal, transmits the digital signal to the isolation unit through the AD acquisition unit, and transmits it to the inside of the MCU processing unit through the isolation unit. The MCU calculates the corresponding voltage signal through a relevant algorithm, converts it into a corresponding current value, and sends it to the control display unit for display; The data generated by the MCU processing unit is transmitted to the isolation unit, and the data is transmitted to the D / A conversion unit through the isolation unit. The D / A conversion unit converts the data into a reference voltage, and the D / A conversion unit transmits the data to the power amplification unit, and the output current is controlled by the power amplification unit; The data generated by the MCU processing unit is transmitted to the isolation unit, and the data is transmitted to the function chip and the amplification unit through the isolation unit, and a square wave with adjustable frequency and driving capability can be output.

2. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The AD acquisition unit includes: a power management circuit, an input buffer circuit, a sample-and-hold circuit, an analog-to-digital conversion circuit, and a logic control circuit.

3. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The power amplification unit includes: an adjustment transistor, a standard resistor and a feedback circuit, and monitors and calibrates the current output through the feedback current.

4. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The isolation unit includes: an isolation chip and a DC / DC isolation power supply, and the D / A conversion unit includes: a D / A conversion chip, a power supply unit and a voltage reference module, and a reference voltage can be obtained through the D / A conversion unit.

5. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The current sampling unit includes: a sampling resistor and a sampling circuit. When the current enters the current sampling unit, the sampling resistor can convert the current into a voltage, and at the same time, the current is converted into 0.2V~2V through the sampling circuit and the related power amplification unit.

6. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The control display unit can control the current output size through the output of the D / A chip, and the control display unit is an integrated LCD touch screen. The control display unit communicates with the MCU processing unit through the serial port, and data transmission and interaction are required between the control display unit and the MCU processing unit.

7. The high-voltage paint film continuity tester calibration device according to claim 1, characterized in that: The MCU processing unit is connected to each functional circuit. At the same time, the MCU processing unit processes the control and related circuit signals and outputs them for display on the control display unit. The timing unit exchanges information with the MCU through the communication chip. The MCU reads the time information and controls the start and stop of the stopwatch. The timing unit realizes the display and the start and stop of the stopwatch through the display control unit.

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