Transistor high-temperature testing device and method

Abstract

The invention belongs to the technical field of semiconductor packaging testing, and particularly relates to a transistor high-temperature testing device and method. The surrounding type heat conduction mechanism is arranged in the high-temperature forced air drying box and is used for uniformly conducting heat on the transistor; the temperature sensing mechanism is arranged in the high-temperature forced air drying box and is used for sensing temperatures at different heights; the box door is hinged to the high-temperature blast drying box, a rotating column is rotationally connected to the box door, a rotating handle is fixedly connected to one end of the rotating column, an arc-shaped clamping and locking plate is fixedly connected to the other end of the rotating column, a reserved hole is formed in one side of the box door, and a wire inlet hole is formed in the bottom of the box door. The device is simple in structure, the transistor can be subjected to heat conduction in a rotary surrounding mode, the transistor is heated uniformly, the heat conduction efficiency is improved, meanwhile, the temperatures of different heights in the box body can be monitored in real time, the situation that the test accuracy is affected due to different temperatures is avoided, and people can use the device conveniently.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor packaging testing, and in particular to a transistor high-temperature testing device and method. Background Art

[0002] A transistor is a solid semiconductor device that has multiple functions such as detection, rectification, amplification, switching and voltage regulation. It is the basic building block for the normal operation of computers, mobile phones and other electronic circuits. After the transistor is produced, it needs to be tested for various aspects of its performance before it can be sold and used. One of them is to test its high temperature resistance. Since the transistor is installed in the circuit, it will generate a certain amount of heat during operation, so it is necessary to perform high temperature testing on the transistor to ensure that the transistor has a certain degree of high temperature resistance.

[0003] A highly sealed transistor high temperature resistance testing device is disclosed in a Chinese patent document (Announcement No.: CN221993579U), comprising: an outer box body, which is placed on a horizontal operating platform with a base below; an upper cover, which is detachably arranged above the outer box body, and the upper cover can prevent the heat inside the outer box body from being lost; a control panel, which is fixedly mounted on the left outer surface of the outer box body, and the control panel is connected to the internal components through wires; a heating device, which is movably mounted on the lower surface of the inner part of the outer box body, and the heating device is generally circular in structure, and a driven gear is arranged below the heating device to drive it to rotate; a groove is provided on the upper end surface of the outer box body for accommodating a sealing ring, and the sealing ring is higher than the upper end surface of the outer box body in a static state, and expansion grooves for accommodating the deformed part of the sealing ring are extended on both sides of the bottom of the groove.

[0004] However, in the above patent, when the transistor is subjected to high temperature heat conduction, only the bottom of the transistor is subjected to heat conduction, which easily leads to uneven heat conduction and affects the high temperature test. At the same time, as the test time becomes longer, the temperature set in the box becomes unstable, thereby affecting the accuracy of the high temperature test. Therefore, we propose a transistor high temperature test device and method to solve the above problems. Summary of the invention

[0005] The purpose of the present invention is to overcome the defects of the prior art and provide a transistor high-temperature testing device and method, which can use a rotating surround to conduct heat to the transistor so that it is heated evenly, thereby improving the efficiency of heat conduction. At the same time, the temperature at different heights in the box can be monitored in real time, avoiding the situation where the temperature is different and affects the test accuracy, making it convenient for people to use.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions: A transistor high temperature testing device, comprising: High temperature blast drying oven; The wrap-around heat conduction mechanism is installed in the high-temperature blast drying oven to evenly conduct heat to the transistor; The temperature sensing mechanism is installed in the high-temperature blast drying oven to sense the temperature at different heights; The box door is hinged on the high-temperature blast drying box. A rotating column is rotatably connected to the box door. A rotating handle is fixedly connected to one end of the rotating column. An arc-shaped locking plate is fixedly connected to the other end of the rotating column. A reserved hole is provided on one side of the box door, and a wire entry hole is provided at the bottom of the box door. The arc-shaped locking plate is located in the reserved hole. The arc-shaped locking plate can move and work in the reserved hole. A locking groove is provided on the high-temperature blast drying box corresponding to the reserved hole. An observation window is provided on the box door. The observation window is convenient for staff to observe the test situation in the high-temperature blast drying box. The converging and sealing mechanism is provided on the box door and is used to converging and seal the wire inlet hole and the wire harness to improve the sealing performance; The wiping mechanism is arranged on the box door and is used to wipe the mist on the observation window.

[0007] Furthermore, the arc-shaped locking plate and one side wall of the box door are fixedly connected with connecting heads, and a tension spring is hung between the two connecting heads. The tension spring can use the connecting head to limit and reset the arc-shaped locking plate.

[0008] Furthermore, the convergence and sealing mechanism includes a separation rotating rod rotatably connected to the inner wall of the box door, a No. 1 transmission wheel is fixedly connected to the rotating column and the separation rotating rod, a No. 1 transmission belt is transmission-connected between the two No. 1 transmission wheels, one end of the separation rotating rod is fixedly connected to a driving gear, two separation racks are meshingly connected to the driving gear, one end of the two separation racks are fixedly connected to a first L-shaped plate, and when the driving gear rotates, the two separation racks can be driven away from each other, and the two first L-shaped plates can be dragged away from each other.

[0009] Furthermore, the bottom ends of the two first L-shaped plates are fixedly connected to the second L-shaped plates, the two second L-shaped plates are slidably connected to the bottom wall of the box door, and one end of the two second L-shaped plates is fixedly connected to a tightening rubber, the two tightening rubbers are both arc-shaped rings, and the two arc-shaped ring-shaped tightening rubbers can form a sealing ring when fitted, and the diameter of the sealing ring is larger than the diameter of the wire inlet hole, and it fits tightly with the wire inlet hole, thereby improving the sealing effect.

[0010] Furthermore, the wiping mechanism includes a fixed plate fixedly mounted on the box door, an extension plate fixedly connected to one side of the fixed plate, a rotating rod rotatably connected to the extension plate, a No. 2 transmission wheel fixedly connected to the separation rotating rod and the rotating rod, a No. 2 transmission belt transmission-connected between the two No. 2 transmission wheels, a wiping plate fixedly connected to one end of the rotating rod, the wiping plate contacts the observation window, and when the wiping plate rotates, the mist on the observation window can be wiped and removed.

[0011] Furthermore, the surround-type heat conduction mechanism includes a driving motor fixedly installed on the rear side of the high-temperature blast drying box, a driving rod is rotatably connected inside the high-temperature blast drying box, the driving rod is fixedly connected to the output shaft of the driving motor, one end of the driving rod is fixedly connected to a disc, and an arc-shaped heat conduction plate is fixedly connected to one side surface of the disc. When the arc-shaped heat conduction plate rotates, it can quickly and evenly conduct heat to the transistor.

[0012] Furthermore, the temperature sensing mechanism includes a supporting rotating rod rotatably connected to the high-temperature blast drying box, a No. 3 transmission wheel is fixedly connected to the supporting rotating rod and the driving rod, a No. 3 transmission belt is transmission-connected between the two No. 3 transmission wheels, and one end of the supporting rotating rod is fixedly connected to a fan gear.

[0013] Furthermore, a limit groove is provided on the inner wall of one side of the high-temperature blast drying box, a limit block is slidably connected in the limit groove, a limit spring is fixedly connected to the bottom of the limit block, the bottom end of the limit spring is fixedly connected to the bottom wall of the limit groove, one end of the limit block is fixedly connected to a frame, when the limit block slides vertically in the limit groove, it can limit and support the frame, teeth are fixedly connected to the inner walls on both sides of the frame, the two teeth are meshed with the fan gear, and a temperature sensor is provided on one side of the frame.

[0014] Furthermore, a plurality of air blast openings are provided on the bottom wall of the high-temperature blast drying box, two third L-shaped plates are symmetrically fixedly installed on the bottom wall of the high-temperature blast drying box, electric push rods are fixedly provided on the two third L-shaped plates, one end of the two electric push rods are fixedly connected with a clamping plate, a transistor characteristic diagram instrument is provided on the top of the high-temperature blast drying box, a display screen is provided on the front side of the high-temperature blast drying box, and a plurality of base feet are symmetrically fixedly installed on the bottom of the high-temperature blast drying box, and the plurality of base feet are used to stably support the high-temperature blast drying box, thereby improving the stability of the high-temperature blast drying box during operation.

[0015] A transistor high temperature testing method, using the transistor high temperature testing device described above, comprises the following steps: S1: First, open the box door, pass multiple transistors through the wire entry hole and place them between the two clamping plates, use two electric push rods to drive the two clamping plates to approach each other to clamp and fix the multiple transistors, then the staff holds the rotating handle and rotates it, the rotating handle drives the rotating column to rotate, the rotating column drives the arc-shaped locking plate to perform arc-shaped contraction movement in the reserved hole, and pulls the tension spring to push the box door to fit with the high-temperature blast drying box, and at the same time releases the rotating handle, and uses the contraction force of the tension spring to drive the arc-shaped locking plate to reset and snap into the lock slot in the high-temperature blast drying box, so as to ensure that the box door will not automatically pop open during the test; S2: When the rotating column rotates at the same time, it can drive one of the No. 1 transmission wheels to rotate. Since the No. 1 transmission belt is connected between the two No. 1 transmission wheels, the separation rotating rod rotates synchronously with the rotating column. The separation rotating rod drives the active gear to rotate. The active gear drives the two separation racks to approach each other. The two separation racks drive the two second L-shaped plates to approach each other through the two first L-shaped plates. The two second L-shaped plates drive the two contracting rubbers to approach each other and tighten the wire harness in the wire entry hole. The two contracting rubbers can cover the wire entry hole, thereby improving the sealing performance and reducing the hot air leakage in the high-temperature blast drying box. When the separation rotating rod rotates at the same time, it can drive one of the No. 2 transmission wheels to rotate. Since the No. 2 transmission belt is transmitted between the No. 2 transmission wheels, the rotating rod rotates with the separation rotating rod. The rotating rod drives the wiping plate to rotate to wipe the fog generated on the observation window due to the large temperature difference between the high-temperature blast drying box and the outside world in the previous test, so as to observe the situation inside the high-temperature blast drying box during this test; S3: Then, connect multiple transistor pins with connecting wires and connect them to the transistor characteristic diagram instrument, set the temperature in the high-temperature blast drying oven to 175°C, turn on the transistor characteristic diagram instrument, and after the high-temperature blast drying oven reaches the set temperature, use the transistor characteristic diagram instrument to test, and start the drive motor at the same time. The output shaft of the drive motor drives the drive rod to rotate, and the drive rod drives the disk to rotate, and the arc-shaped heat conduction plate rotates, and rotates around multiple transistors to conduct heat evenly and comprehensively, thereby improving the accuracy of the test; S4: When the driving rod rotates at the same time, it can drive one of the No. 3 transmission wheels to rotate. Since there is a No. 3 transmission belt between the two No. 3 transmission wheels, the supporting rotating rod rotates, and the supporting rotating rod drives the fan gear to rotate and reciprocately meshes with one of the teeth, driving the frame to move up and down, and the frame drives the limit block to slide in the limit groove. At the same time, the frame drives the temperature sensor to move up and down, thereby realizing real-time detection of whether the temperatures at different heights in the high-temperature blast drying oven are consistent, thereby ensuring the accuracy of the test.

[0016] Compared with the prior art, the advantages of the present invention are: 1. In this solution, the driving rod drives the disc to rotate, and the arc-shaped heat-conducting plate rotates, and rotates around multiple transistors to conduct heat evenly and comprehensively, thereby improving the accuracy of the test; 2. This solution utilizes the support rotating rod to drive the sector gear to rotate, and reciprocately mesh with one of the teeth, driving the frame to move up and down. The frame drives the limit block to slide in the limit groove. At the same time, the frame drives the temperature sensor to move up and down, thereby realizing real-time detection of whether the temperature at different heights in the high-temperature blast drying oven is consistent, thereby ensuring the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0018] Figure 1 A schematic diagram of the three-dimensional structure of a transistor high temperature testing device proposed by the present invention; Figure 2 A schematic diagram of the three-dimensional structure of a box door portion of a transistor high temperature testing device proposed by the present invention; Figure 3 A schematic diagram of the three-dimensional structure of the inner part of the box door of a transistor high-temperature testing device proposed by the present invention; Figure 4 A transistor high temperature testing device proposed by the present invention Figure 3 Schematic diagram of the structure of part A in FIG. Figure 5 A transistor high temperature testing device proposed by the present invention Figure 3 Schematic diagram of the structure of part B; Figure 6 A schematic diagram of the rear perspective structure of a transistor high temperature testing device proposed by the present invention; Figure 7 A schematic diagram of the internal cross-section of a high-temperature blast drying box of a transistor high-temperature testing device proposed by the present invention; Figure 8 A transistor high temperature testing device proposed by the present invention Figure 7 Schematic diagram of the structure of part C in; Fig. 9 This is a schematic diagram of the three-dimensional structure of a driving rod, a disc, an arc-shaped heat conducting plate, etc. of a transistor high temperature test device proposed by the present invention; Fig.10 The present invention is a schematic diagram of the three-dimensional structure of a clamping state of a transistor high temperature testing device proposed by the present invention.

[0019] The corresponding relationship of the numbers in the accompanying drawings is as follows: 1. High-temperature blast drying oven; 2. Oven door; 201. Rotating column; 202. Rotating handle; 203. Arc-shaped locking plate; 204. Reserved hole; 205. Connector; 206. Tension spring; 3. Observation window; 4. Separation rotating rod; 401. No. 1 transmission wheel; 402. No. 1 transmission belt; 403. Driving gear; 404. Separation rack; 405. First L-shaped plate; 406. Second L-shaped plate; 407. Bending rubber; 5. Fixed plate; 501. Extension plate; 502. Rotating rod; 503. No. 2 transmission wheel; 504. No. 2 transmission belt Belt; 505, wiping plate; 6, driving motor; 601, driving rod; 602, disc; 603, arc-shaped heat-conducting plate; 604, supporting rotating rod; 605, No. 3 transmission wheel; 606, No. 3 transmission belt; 607, sector gear; 608, frame; 609, teeth; 610, temperature sensor; 611, limit groove; 612, limit block; 613, limit spring; 7, air blast; 701, third L-shaped plate; 702, electric push rod; 703, clamping plate; 8, transistor characteristic diagram instrument; 9, display screen; 10, base. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] Embodiment 1, refer to Figure 1-Figure 10 , a transistor high temperature testing device, comprising: High temperature blast drying oven 1; Model 101-00B of high temperature blast drying oven 1: The box door 2 is hinged on the high-temperature blast drying box 1, and a rotating column 201 is rotatably connected to the box door 2. One end of the rotating column 201 is fixedly connected to a rotating handle 202, and the other end of the rotating column 201 is fixedly connected to an arc-shaped locking plate 203. A reserved hole 204 is provided on one side of the box door 2, and an inlet hole is provided at the bottom of the box door 2. The arc-shaped locking plate 203 is located in the reserved hole 204, and the arc-shaped locking plate 203 can move and work in the reserved hole 204. A locking groove is provided on the high-temperature blast drying box 1 corresponding to the reserved hole 204, and an observation window 3 is provided on the box door 2. The observation window 3 is convenient for the staff to observe the test situation in the high-temperature blast drying box 1. A connector 205 is fixedly connected to the arc-shaped locking plate 203 and one side wall of the box door 2, and a tension spring 206 is hung between the two connectors 205. The tension spring 206 can use the connector 205 to limit and reset the arc-shaped locking plate 203.

[0022] In this embodiment, a convergence and sealing mechanism is provided on the box door 2, and is used to converge and seal the wire inlet hole and the wire harness to improve the sealing performance. The convergence and sealing mechanism includes a separation rotating rod 4 rotatably connected to the inner wall of the box door 2, a No. 1 transmission wheel 401 is fixedly connected to the rotating column 201 and the separation rotating rod 4, and a No. 1 transmission belt 402 is transmission-connected between the two No. 1 transmission wheels 401, and one end of the separation rotating rod 4 is fixedly connected to a driving gear 403, and two separation racks 404 are meshedly connected to the driving gear 403, and one end of the two separation racks 404 is fixedly connected to a first L-shaped plate 405, and the driving gear When 403 rotates, it can drive the two separation racks 404 to move away from each other, and can drag the two first L-shaped plates 405 away from each other. The bottom ends of the two first L-shaped plates 405 are fixedly connected with the second L-shaped plates 406. The two second L-shaped plates 406 are slidingly connected to the bottom wall of the box door 2. One end of the two second L-shaped plates 406 is fixedly connected with a gathering rubber 407. The two gathering rubbers 407 are both arc-shaped. When the two arc-shaped gathering rubbers 407 are fitted together, a sealing ring can be formed. The diameter of the sealing ring is larger than the diameter of the wire inlet hole, and it fits tightly with the wire inlet hole to improve the sealing effect.

[0023] In this embodiment, a wiping mechanism is provided on the box door 2 and is used for wiping the mist on the observation window 3. The wiping mechanism includes a fixed plate 5 fixedly mounted on the box door 2, one side of the fixed plate 5 is fixedly connected to an extension plate 501, and a rotating rod 502 is rotatably connected to the extension plate 501. A No. 2 transmission wheel 503 is fixedly connected to the separation rotating rod 4 and the rotating rod 502, and a No. 2 transmission belt 504 is transmission-connected between the two No. 2 transmission wheels 503. A wiping plate 505 is fixedly connected to one end of the rotating rod 502, and the wiping plate 505 is in contact with the observation window 3. When the wiping plate 505 rotates, the mist on the observation window 3 can be wiped and removed.

[0024] In this embodiment, a surround-type heat-conducting mechanism is arranged in the high-temperature blast drying box 1, and is used for uniformly conducting heat to the transistor. The surround-type heat-conducting mechanism includes a driving motor 6 fixedly installed on the rear side of the high-temperature blast drying box 1. A driving rod 601 is rotatably connected in the high-temperature blast drying box 1. The driving rod 601 is fixedly connected to the output shaft of the driving motor 6. A disc 602 is fixedly connected to one end of the driving rod 601. An arc-shaped heat-conducting plate 603 is fixedly connected to one side surface of the disc 602. When the arc-shaped heat-conducting plate 603 rotates, it can quickly and uniformly conduct heat to the transistor.

[0025] In this embodiment, the temperature sensing mechanism is arranged in the high-temperature blast drying box 1 and is used to sense temperatures at different heights. The temperature sensing mechanism includes a supporting rotating rod 604 rotatably connected to the high-temperature blast drying box 1. The supporting rotating rod 604 and the driving rod 601 are fixedly connected with a No. 3 transmission wheel 605. A No. 3 transmission belt 606 is transmission-connected between the two No. 3 transmission wheels 605. One end of the supporting rotating rod 604 is fixedly connected with a fan-shaped gear 607. A limiting groove 611 is provided on the inner wall of one side of the high-temperature blast drying box 1. A limiting block 612 is slidably connected in the limiting groove 611. The bottom of the limiting block 612 is fixedly connected to a limiting spring 613. The bottom end of the limiting spring 613 is connected to the bottom of the limiting groove 611. The frame 608 is fixedly connected to the wall, one end of the limit block 612 is fixedly connected to the frame 608, when the limit block 612 slides vertically in the limit groove 611, it can limit and support the frame 608, and the inner walls on both sides of the frame 608 are fixedly connected with teeth 609, and the two teeth 609 are engaged with the fan gear 607. A temperature sensor 610 is provided on one side of the frame 608, and the support rotating rod 604 can drive the fan gear 607 to rotate, and reciprocately engage with one of the teeth 609, drive the frame 608 to move up and down, and at the same time drive the temperature sensor 610 to move up and down, so as to realize real-time detection of whether the temperatures at different heights in the high-temperature blast drying oven 1 are consistent, thereby ensuring the accuracy of the test.

[0026] In this embodiment, a plurality of air blast openings 7 are provided on the bottom wall of the high-temperature blast drying oven 1, and two third L-shaped plates 701 are symmetrically fixedly installed on the bottom wall of the high-temperature blast drying oven 1. Electric push rods 702 are fixedly installed on the two third L-shaped plates 701, and one end of the two electric push rods 702 is fixedly connected to a clamping plate 703. The two electric push rods 702 are used to drive the two clamping plates 703 to approach each other to clamp and fix a plurality of transistors. A transistor characteristic diagram instrument 8 is provided on the top of the high-temperature blast drying oven 1, and the model of the transistor characteristic diagram instrument 8 is: WQ4832B. A display screen 9 is provided on the front side of the high-temperature blast drying oven 1. A plurality of base feet 10 are symmetrically fixedly installed on the bottom of the high-temperature blast drying oven 1. The plurality of base feet 10 are used to stably support the high-temperature blast drying oven 1 and improve the stability of the high-temperature blast drying oven 1 during operation.

[0027] A transistor high temperature testing method, using the above transistor high temperature testing device, comprises the following steps: S1: First, open the box door 2, pass multiple transistors through the wire entry hole and place them between the two clamping plates 703, use two electric push rods 702 to drive the two clamping plates 703 to approach each other to clamp and fix the multiple transistors, then the staff holds the rotating handle 202 to rotate and twist, the rotating handle 202 drives the rotating column 201 to rotate, the rotating column 201 drives the arc-shaped locking plate 203 to perform an arc-shaped contraction movement in the reserved hole 204, and pulls the tension spring 206 to push the box door 2 to fit with the high-temperature blast drying box 1, and at the same time release the rotating handle 202, use the contraction force of the tension spring 206 to drive the arc-shaped locking plate 203 to reset and snap into the lock groove in the high-temperature blast drying box 1, so as to ensure that the box door 2 will not automatically pop open during the test; S2: When the rotating column 201 rotates, it can drive one of the No. 1 transmission wheels 401 to rotate. Since the two No. 1 transmission wheels 401 are connected to the No. 1 transmission belt 402, the separation rotating rod 4 rotates synchronously with the rotating column 201. The separation rotating rod 4 drives the driving gear 403 to rotate. The driving gear 403 drives the two separation racks 404 to move closer to each other. The two separation racks 404 drive the two second L-shaped plates 406 to move closer to each other through the two first L-shaped plates 405. The two second L-shaped plates 406 drive the two collection rubbers 407 to move closer to each other, and collect the wire harness in the wire entry hole. The two rubber bands 407 can cover the wire inlet holes, thereby improving the sealing performance and reducing the leakage of hot air in the high-temperature blast drying box 1. At the same time, when the separation rotating rod 4 rotates, it can drive one of the No. 2 transmission wheels 503 to rotate. Since the No. 2 transmission belt 504 is transmitted between the No. 2 transmission wheels 503, the rotating rod 502 rotates along with the separation rotating rod 4. The rotating rod 502 drives the wiping plate 505 to rotate to wipe the mist generated on the observation window 3 due to the large temperature difference between the high-temperature blast drying box 1 and the outside world in the previous test, so as to observe the situation inside the high-temperature blast drying box 1 during this test; S3: Then, connect multiple transistor pins with connecting wires and connect them to the transistor characteristic diagram instrument 8, continuously increase the temperature in the high-temperature blast drying oven 1 to 125°C, 150°C and 175°C, turn on the transistor characteristic diagram instrument 8, and after the high-temperature blast drying oven 1 reaches the set temperature, use the transistor characteristic diagram instrument 8 to test, and start the drive motor 6 at the same time, the output shaft of the drive motor 6 drives the drive rod 601 to rotate, the drive rod 601 drives the disk 602 to rotate, and the arc-shaped heat conduction plate 603 rotates, and rotates around multiple transistors to evenly and comprehensively conduct heat, thereby improving the accuracy of the test; S4: When the driving rod 601 rotates at the same time, one of the No. 3 transmission wheels 605 can be driven to rotate. Since the No. 3 transmission belt 606 is transmitted between the two No. 3 transmission wheels 605, the supporting rotating rod 604 rotates, and the supporting rotating rod 604 drives the fan gear 607 to rotate and reciprocately meshes with one of the teeth 609, driving the frame 608 to move up and down, and the frame 608 drives the limit block 612 to slide in the limit groove 611. At the same time, the frame 608 drives the temperature sensor 610 to move up and down, thereby realizing real-time detection of whether the temperatures at different heights in the high-temperature blast drying box 1 are consistent, thereby ensuring the accuracy of the test.

[0028] All structures in this application can be selected in terms of material and length according to actual usage. The accompanying drawings are all schematic structural diagrams, and the specific actual dimensions can be appropriately adjusted.

[0029] Parts not involved in the present invention are the same as the prior art or can be implemented by the prior art. Although the embodiments of the present invention have been shown and described, it is understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A transistor high temperature test device, characterized in that: include: High temperature blast drying oven (1); A surrounding heat conduction mechanism is arranged in the high-temperature blast drying oven (1) and is used to evenly conduct heat to the transistor; A temperature sensing mechanism is disposed in the high-temperature blast drying oven (1) and is used to sense temperatures at different heights; A box door (2) is hinged on the high-temperature blast drying box (1), a rotating column (201) is rotatably connected to the box door (2), one end of the rotating column (201) is fixedly connected to a rotating handle (202), and the other end of the rotating column (201) is fixedly connected to an arc-shaped locking plate (203), a reserved hole (204) is provided on one side of the box door (2), and a wire inlet hole is provided at the bottom of the box door (2), the arc-shaped locking plate (203) is located in the reserved hole (204), a locking groove is provided on the high-temperature blast drying box (1) corresponding to the reserved hole (204), and an observation window (3) is provided on the box door (2); A converging and sealing mechanism is provided on the box door (2) and is used to converging and seal the wire inlet hole and the wire harness to improve the sealing performance; The wiping mechanism is arranged on the box door (2) and is used to wipe the mist on the observation window (3).

2. A transistor high temperature testing device according to claim 1, characterized in that: The arc-shaped locking plate (203) and a side wall of the box door (2) are both fixedly connected with a connector (205), and a tension spring (206) is hung between the two connectors (205).

3. A transistor high temperature testing device according to claim 1, characterized in that: The converging and sealing mechanism comprises a separation rotating rod (4) rotatably connected to the inner wall of the box door (2); a No. 1 transmission wheel (401) is fixedly connected to the rotating column (201) and the separation rotating rod (4); a No. 1 transmission belt (402) is transmission-connected between the two No. 1 transmission wheels (401); one end of the separation rotating rod (4) is fixedly connected to a driving gear (403); the driving gear (403) is meshingly connected to two separation racks (404); and one end of each of the two separation racks (404) is fixedly connected to a first L-shaped plate (405).

4. A transistor high temperature testing device according to claim 3, characterized in that: The bottom ends of the two first L-shaped plates (405) are fixedly connected to a second L-shaped plate (406), the two second L-shaped plates (406) are slidably connected to the bottom wall of the door (2), and one end of the two second L-shaped plates (406) is fixedly connected to a contracting rubber (407), and the two contracting rubbers (407) are both in the shape of arc rings.

5. A transistor high temperature testing device according to claim 3, characterized in that: The wiping mechanism comprises a fixed plate (5) fixedly mounted on the box door (2); an extension plate (501) is fixedly connected to one side of the fixed plate (5); a rotating rod (502) is rotatably connected to the extension plate (501); a second transmission wheel (503) is fixedly connected to the separation rotating rod (4) and the rotating rod (502); a second transmission belt (504) is transmission-connected between the two second transmission wheels (503); a wiping plate (505) is fixedly connected to one end of the rotating rod (502); and the wiping plate (505) is in contact with the observation window (3).

6. A transistor high temperature testing device according to claim 1, characterized in that: The wraparound heat conduction mechanism comprises a drive motor (6) fixedly mounted on the rear side of the high-temperature blast drying box (1); a drive rod (601) is rotatably connected inside the high-temperature blast drying box (1); the drive rod (601) is fixedly connected to an output shaft of the drive motor (6); a disk (602) is fixedly connected to one end of the drive rod (601); and an arc-shaped heat conduction plate (603) is fixedly connected to one side surface of the disk (602).

7. A transistor high temperature testing device according to claim 6, characterized in that: The temperature sensing mechanism comprises a supporting rotating rod (604) rotatably connected to the high-temperature blast drying box (1); a No. 3 transmission wheel (605) is fixedly connected to the supporting rotating rod (604) and the driving rod (601); a No. 3 transmission belt (606) is transmission-connected between the two No. 3 transmission wheels (605); and a sector gear (607) is fixedly connected to one end of the supporting rotating rod (604).

8. A transistor high temperature testing device according to claim 7, characterized in that: A limiting groove (611) is provided on an inner wall of one side of the high-temperature blast drying box (1); a limiting block (612) is slidably connected in the limiting groove (611); a limiting spring (613) is fixedly connected to the bottom of the limiting block (612); the bottom end of the limiting spring (613) is fixedly connected to the bottom wall of the limiting groove (611); one end of the limiting block (612) is fixedly connected to a frame (608); teeth (609) are fixedly connected to the inner walls of both sides of the frame (608); the two teeth (609) are meshed with the fan gear (607); and a temperature sensor (610) is provided on one side of the frame (608).

9. A transistor high temperature testing device according to claim 1, characterized in that: The bottom wall of the high-temperature blast drying box (1) is provided with a plurality of blast openings (7); two third L-shaped plates (701) are symmetrically fixedly mounted on the bottom wall of the high-temperature blast drying box (1); electric push rods (702) are fixedly mounted on the two third L-shaped plates (701); one end of the two electric push rods (702) is fixedly connected to a clamping plate (703); a transistor characteristic diagram instrument (8) is provided on the top of the high-temperature blast drying box (1); a display screen (9) is provided on the front side of the high-temperature blast drying box (1); and a plurality of base feet (10) are symmetrically fixedly mounted on the bottom of the high-temperature blast drying box (1).

10. A transistor high temperature testing method, characterized in that: The transistor high temperature testing device according to any one of claims 1 to 9 comprises the following steps: S1: First, open the box door (2), pass a plurality of transistors through the wire entry hole and place them between the two clamping plates (703), use two electric push rods (702) to drive the two clamping plates (703) to approach each other to clamp and fix the plurality of transistors, then the staff member holds the rotating handle (202) and rotates and twists it, the rotating handle (202) drives the rotating column (201) to rotate, the rotating column (201) drives the arc-shaped locking plate (203) to perform an arc-shaped contraction movement in the reserved hole (204), and pulls the tension spring (206) to push the box door (2) to fit with the high-temperature blast drying box (1), and at the same time release the rotating handle (202), use the contraction force of the tension spring (206) to drive the arc-shaped locking plate (203) to reset and lock into the lock groove in the high-temperature blast drying box (1), so as to ensure that the box door (2) will not automatically pop open during the test; S2: When the rotating column (201) rotates, it can drive one of the No. 1 transmission wheels (401) to rotate. Since the two No. 1 transmission wheels (401) are connected to each other by a No. 1 transmission belt (402), the separation rotating rod (4) rotates synchronously with the rotating column (201). The separation rotating rod (4) drives the driving gear (403) to rotate. The driving gear (403) drives the two separation racks (404) to move closer to each other. The two separation racks (404) drive the two second L-shaped plates (406) to move closer to each other through the two first L-shaped plates (405). The two second L-shaped plates (406) drive the two bunching rubbers (407) to move closer to each other, and the wire harness in the wire entry hole is moved closer. The separation rod (4) is tightened, and the two contracting rubbers (407) can cover the wire inlet hole, thereby improving the sealing performance and reducing the leakage of hot air in the high-temperature blast drying box (1). At the same time, when the separation rotating rod (4) rotates, it can drive one of the second transmission wheels (503) to rotate. Since the second transmission belt (504) is transmitted between the second transmission wheels (503), the rotating rod (502) rotates along with the separation rotating rod (4). The rotating rod (502) drives the wiping plate (505) to rotate to wipe the mist generated on the observation window (3) due to the large temperature difference between the high-temperature blast drying box (1) and the outside world in the previous test, so as to facilitate the observation of the internal situation of the high-temperature blast drying box (1) during this test; S3: Then, multiple transistor pins are connected with connecting wires and connected to the transistor characteristic diagram instrument (8), the temperature in the high-temperature blast drying oven (1) is set to 175°C, the transistor characteristic diagram instrument (8) is turned on, and after the high-temperature blast drying oven (1) reaches the set temperature, the transistor characteristic diagram instrument (8) is used to perform a test, and at the same time, the drive motor (6) is started, the output shaft of the drive motor (6) drives the drive rod (601) to rotate, the drive rod (601) drives the disk (602) to rotate, and the arc-shaped heat conduction plate (603) rotates, and rotates around the multiple transistors to evenly and comprehensively conduct heat, thereby improving the accuracy of the test; S4: When the driving rod (601) rotates, one of the No. 3 transmission wheels (605) can be driven to rotate. Since a No. 3 transmission belt (606) is transmitted between the two No. 3 transmission wheels (605), the supporting rotating rod (604) rotates, and the supporting rotating rod (604) drives the fan-shaped gear (607) to rotate and reciprocately meshes with one of the teeth (609), driving the frame (608) to move up and down, and the frame (608) drives the limit block (612) to slide in the limit groove (611). At the same time, the frame (608) drives the temperature sensor (610) to move up and down, thereby realizing real-time detection of whether the temperatures at different heights in the high-temperature blast drying box (1) are consistent, thereby ensuring the accuracy of the test.

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