Infrared optical coupler performance test system based on data analysis

Abstract

The invention relates to the technical field of performance testing, in particular to an infrared light coupler performance testing system based on data analysis, which comprises a testing management platform, a testing information unit, an interval testing division unit, a high peak value testing unit, a low peak value testing unit and a testing display unit, according to the invention, voltage and response performance tests are carried out from the highest temperature point and the lowest temperature point, when the test is carried out at the high temperature test point, whether the response capability and saturation voltage of the to-be-tested infrared optical coupler are standard or not can be intuitively known, and meanwhile, the actual final input voltage is further compared and analyzed when the output end is normal; and low-temperature transmission test evaluation analysis is carried out when the infrared coupler is tested at the low-temperature test point, so that whether the transmission capability of the infrared coupler to be tested is normal or not can be intuitively known, and the test accuracy can be improved. And meanwhile, the accuracy of high and low point temperature test results corresponding to the to-be-tested infrared optical coupler is effectively improved.

Description

Technical Field

[0001] The invention relates to the technical field of performance testing, and in particular to an infrared optical coupler performance testing system based on data analysis. Background Art

[0002] The application scenarios of photoelectric couplers cover multiple fields such as power systems and industrial automation. Its actual function is to realize the mutual conversion and isolation between optical signals and electrical signals, improve the safety, reliability and stability of the system, reduce interference and damage, and protect the safety of equipment and personnel. However, the operating effects of photoelectric couplers are different in different temperature scenarios. In order to ensure the operating effect of photoelectric couplers, it is of great significance to conduct multi-point temperature tests on photoelectric couplers.

[0003] However, in the existing infrared optical coupler performance testing process, it is impossible to test from the two extreme high and low temperature points, and thus it is impossible to accurately detect whether the voltage, response and transmission capacity of the infrared optical coupler are qualified, which reduces the efficiency of infrared optical coupler performance testing. At the same time, it is impossible to accurately distinguish whether the infrared optical coupler performance is qualified, which is not conducive to the rational management of infrared optical couplers;

[0004] In view of the above technical defects, a solution is now proposed. Summary of the invention

[0005] The purpose of the present invention is to provide an infrared optical coupler performance test system based on data analysis to solve the above-mentioned technical defects. The present invention performs voltage and response performance tests from two points, namely, the highest temperature and the lowest temperature, and performs interval temperature division feedback analysis on the reference operating temperature interval, so as to perform extreme temperature test on the infrared optical coupler to be tested through temperature division to determine whether the performance of the infrared optical coupler to be tested is qualified. When the test is conducted at a high temperature test point, it is possible to intuitively understand whether the response capability and saturation voltage of the infrared optical coupler to be tested are standard. At the same time, when the output end is normal, the actual final input voltage is further compared and analyzed to determine whether the working voltage is qualified, thereby helping to improve the accuracy of the test. When the test is conducted at a low temperature test point, a low temperature transmission test evaluation analysis is performed to intuitively understand whether the transmission capability of the infrared optical coupler to be tested is normal at the extreme low temperature. At the same time, the accuracy and comprehensiveness of the high and low temperature test results corresponding to the infrared optical coupler to be tested are effectively improved, and at the same time, it is convenient for the rational differentiation and management of the infrared optical coupler to be tested.

[0006] The object of the present invention can be achieved by the following technical solutions: an infrared optical coupler performance test system based on data analysis, comprising a test management platform, a test information unit, an interval test division unit, a high peak value test unit, a low peak value test unit and a test display unit;

[0007] The test information unit is used to collect the reference operating temperature interval of the infrared optical coupler to be tested, and send the reference operating temperature interval to the interval test division unit;

[0008] After receiving the reference operating temperature interval, the interval test division unit immediately performs interval temperature division feedback analysis on the reference operating temperature interval to obtain a high temperature test point and a low temperature test point;

[0009] The high peak value test unit is used to call the high temperature test point, collect the input voltage and input time of the input end of the infrared optical coupler to be tested, and perform high temperature peak response supervision evaluation analysis at the same time, and send a voltage qualified signal or a voltage unqualified signal, a response qualified signal or a response unqualified signal to the test display unit;

[0010] The low peak test unit is used to call the low temperature test point and collect the current transfer ratio of the infrared optical coupler to be tested, and at the same time perform low temperature transmission test evaluation analysis, compare and analyze the obtained low temperature offset index, and send the obtained low temperature qualified signal or low temperature unqualified signal to the test display unit.

[0011] Preferably, the interval temperature division feedback analysis process of the interval test division unit is as follows:

[0012] Obtain a reference operating temperature interval of the infrared optical coupler to be tested, obtain a maximum temperature value and a minimum temperature value in the reference operating temperature interval of the infrared optical coupler to be tested, and set the maximum temperature value and the minimum temperature value in the reference operating temperature interval as a high temperature test point and a low temperature test point, respectively;

[0013] At the same time, basic information corresponding to the high temperature test point and the low temperature test point of the normal infrared optical coupler in the reference operating temperature range is obtained, and the basic information includes the standard output saturation voltage threshold, the standard output saturation time threshold, and the comparison current transfer ratio curve.

[0014] Preferably, the high temperature peak response supervision evaluation analysis process of the high peak test unit is as follows:

[0015] S1: Collect the test period of the infrared optical coupler to be tested, and obtain the input voltage and input time of the input end of the infrared optical coupler to be tested during the test period;

[0016] S2: applying a gradually increasing input voltage to the input end of the infrared optical coupler to be tested, obtaining the output response voltage of the output end of the infrared optical coupler to be tested, obtaining the output saturation voltage and the output saturation voltage moment of the output end of the infrared optical coupler to be tested, and then obtaining the duration between the input moment and the output saturation voltage moment, and setting it as the output saturation duration.

[0017] Preferably, S3: comparing and analyzing the output saturation voltage and output saturation duration of the infrared optical coupler to be tested with the standard output saturation voltage threshold and the standard output saturation duration threshold:

[0018] If the output saturation voltage is equal to the standard output saturation voltage threshold, a voltage qualified signal is generated; if the output saturation voltage is not equal to the standard output saturation voltage threshold, a voltage unqualified signal is generated;

[0019] If the output saturation duration is equal to the standard output saturation duration threshold, a response qualified signal is generated; if the output saturation duration is not equal to the standard output saturation duration threshold, a response unqualified signal is generated.

[0020] Preferably, based on the voltage qualified signal and the response qualified signal:

[0021] The actual final input voltage of the input terminal when the output terminal of the infrared optical coupler to be tested is the output saturation voltage is obtained, and the actual final input voltage is compared and analyzed with the calibrated working voltage of the infrared optical coupler to be tested when it leaves the factory, and a risk signal or a normal signal is generated.

[0022] Preferably, the low temperature transmission test evaluation and analysis process of the low peak test unit is as follows:

[0023] T1: obtaining that the infrared optical coupler to be tested is in a test period at a low temperature test point, and setting it as a low temperature period, continuously increasing the input current at the input end of the infrared optical coupler to be tested, collecting that the output response current is maintained at a saturation current value, and setting the saturation current value speed as the output saturation current value;

[0024] T2: Obtain the period during which the input current of the input end of the infrared optical coupler to be tested is continuously increased to the output saturation current value, and set it as the input period, divide the input period into i sub-time nodes, i is a natural number greater than zero, and obtain the current transfer ratio corresponding to each sub-time node;

[0025] Preferably, T3: after the sub-time node is taken as X, a rectangular coordinate system is established with the current transfer ratio as the Y axis, a current transfer ratio curve is drawn by plotting points, and a preset current transfer ratio curve is drawn in the coordinate system at the same time, and a difference value between the corresponding plotting points of the drawn current transfer ratio curve and the drawn comparison current transfer ratio curve is obtained, and the difference value is set as the low temperature deviation value;

[0026] T4: Compare and analyze the low temperature deviation value with the preset low temperature deviation value threshold value recorded and stored internally, set the number of low temperature deviation values ​​greater than or equal to the preset low temperature deviation value threshold value as the low temperature offset index, and compare and analyze the low temperature offset index: generate a low temperature qualified signal or generate a low temperature unqualified signal.

[0027] The beneficial effects of the present invention are as follows:

[0028] (1) The present invention performs voltage and response performance tests at two points, the highest temperature and the lowest temperature, i.e., performs interval temperature division feedback analysis on the reference operating temperature interval, so as to perform an extreme temperature test on the infrared optical coupler to be tested through temperature division, so as to determine whether the performance of the infrared optical coupler to be tested is qualified. When the test is conducted at a high temperature test point, a high temperature peak response supervision evaluation analysis is performed on the input voltage and input time of the input end, so as to determine whether the output saturation voltage and output saturation time of the infrared optical coupler to be tested at the high temperature point are consistent with the output saturation time infrared optical coupler, so as to intuitively understand whether the response capability and saturation voltage of the infrared optical coupler to be tested are standard;

[0029] (2) The present invention further compares and analyzes the actual final input voltage when the output end is normal to determine whether the working voltage is qualified, thereby helping to improve the accuracy of the test. When the test is performed at a low temperature test point, a low-temperature transmission test evaluation and analysis is performed to intuitively understand whether the transmission capacity of the infrared optical coupler to be tested is normal under extreme low temperatures. At the same time, the accuracy and comprehensiveness of the high and low point temperature test results of the infrared optical coupler to be tested are effectively improved, and the rational differentiation and management of the infrared optical coupler to be tested are facilitated. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The present invention will be further described below in conjunction with the accompanying drawings;

[0031] Figure 1 It is a flowchart of the system of the present invention;

[0032] Figure 2 It is a local analysis reference diagram of the present invention. DETAILED DESCRIPTION

[0033] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] Embodiment 1:

[0035] See also Figure 1 to Figure 2As shown, the present invention is an infrared optical coupler performance test system based on data analysis, including a test management platform, a test information unit, an interval test division unit, a high peak value test unit, a low peak value test unit and a test display unit, the test management platform is connected to the test information unit in a one-way communication, the test information unit is connected to the interval test division unit in a one-way communication, the interval test division unit is connected to the test management platform in a one-way communication, the test management platform is connected to both the high peak value test unit and the low peak value test unit in a one-way communication, and both the high peak value test unit and the low peak value test unit are connected to the test display unit in a one-way communication;

[0036] When the test management platform generates a test instruction, the test instruction is sent to the test information unit. After receiving the test instruction, the test information unit immediately collects the reference operating temperature interval of the infrared optical coupler to be tested, and sends the reference operating temperature interval to the interval test division unit. After receiving the reference operating temperature interval, the interval test division unit immediately performs interval temperature division feedback analysis on the reference operating temperature interval, so as to perform an extreme temperature test on the infrared optical coupler to be tested through temperature division, so as to ensure the qualified performance of the infrared optical coupler to be tested. The specific interval temperature division feedback analysis process is as follows:

[0037] Obtain a reference operating temperature interval of the infrared optical coupler to be tested, obtain a maximum temperature value and a minimum temperature value in the reference operating temperature interval of the infrared optical coupler to be tested, and set the maximum temperature value and the minimum temperature value in the reference operating temperature interval as a high temperature test point and a low temperature test point, respectively;

[0038] At the same time, the basic information corresponding to the high temperature test point and the low temperature test point of the normal infrared optical coupler in the reference operating temperature range is obtained, including the standard output saturation voltage threshold, the standard output saturation time threshold, the comparison current transfer ratio curve, etc. The high temperature test point, the low temperature test point and the basic information are sent to the test management platform;

[0039] The high peak test unit is used to call the high temperature test point, collect the input voltage and input time of the input end of the infrared optical coupler to be tested, and perform high temperature peak response supervision evaluation analysis to determine whether the infrared optical coupler to be tested operates normally at the high temperature point, so as to intuitively understand whether the response capability and saturation voltage of the infrared optical coupler to be tested are standard. The specific high temperature peak response supervision evaluation analysis process is as follows:

[0040] When the infrared optical coupler to be tested is tested at a high temperature test point:

[0041] S1: Collect the test period of the infrared optical coupler to be tested, and obtain the input voltage and input time of the input end of the infrared optical coupler to be tested during the test period;

[0042] S2: applying a gradually increasing input voltage to the input end of the infrared optical coupler to be tested, obtaining an output response voltage of the output end of the infrared optical coupler to be tested, and as the input voltage increases, the output response voltage of the output end of the infrared optical coupler to be tested also gradually increases, and the increasing speed of the output response voltage becomes slower and slower, and finally reaches a saturation voltage value and maintains at the saturation voltage value, obtaining the output saturation voltage and the output saturation voltage moment of the output end of the infrared optical coupler to be tested, and then obtaining the time length between the input moment and the output saturation voltage moment, and setting it as the output saturation time length;

[0043] S3: Compare and analyze the output saturation voltage and output saturation duration of the infrared optical coupler to be tested with the standard output saturation voltage threshold and the standard output saturation duration threshold:

[0044] If the output saturation voltage is equal to the standard output saturation voltage threshold, a voltage qualified signal is generated; if the output saturation voltage is not equal to the standard output saturation voltage threshold, a voltage unqualified signal is generated;

[0045] If the output saturation time is equal to the standard output saturation time threshold, a qualified response signal is generated; if the output saturation time is not equal to the standard output saturation time threshold, a failed response signal is generated, and the voltage qualified signal or the voltage failed signal, the response qualified signal or the response failed signal is sent to the test display unit. After receiving the voltage qualified signal or the voltage failed signal, the response qualified signal or the response failed signal, the test display unit immediately displays the preset warning text corresponding to the voltage qualified signal or the voltage failed signal, the response qualified signal or the response failed signal, so as to intuitively understand whether the output saturation voltage and the output saturation time of the infrared optical coupler to be tested under the extreme temperature are normal;

[0046] Based on the voltage qualified signal and the response qualified signal:

[0047] The actual final input voltage of the input terminal when the output terminal of the infrared optical coupler to be tested is the output saturation voltage is obtained, and the actual final input voltage is compared and analyzed with the calibrated working voltage of the infrared optical coupler to be tested when it leaves the factory:

[0048] If the actual final input voltage is not equal to the calibrated working voltage, a risk signal is generated;

[0049] If the actual final input voltage is equal to the calibrated working voltage, a normal signal is generated, and the risk signal or the normal signal is sent to the test display unit. After receiving the risk signal or the normal signal, the test display unit immediately displays the preset warning text corresponding to the risk signal or the normal signal, so as to intuitively understand whether the working voltage of the infrared optical coupler to be tested is qualified under the high temperature peak test, thereby helping to improve the accuracy of the test;

[0050] Among them, if the actual working voltage of the infrared optical coupler to be tested is inconsistent with the working voltage calibrated at the factory, for example, the actual working voltage is lower than the working voltage calibrated at the factory, if the working voltage calibrated at the factory is used to power the infrared optical coupler to be tested, it will cause the output voltage of the infrared optical coupler to be tested to be saturated, and the light source will be damaged if it tends to be in the saturated voltage state for a long time.

[0051] Embodiment 2:

[0052] The low peak test unit is used to call the low temperature test point and collect the current transfer ratio of the infrared optical coupler to be tested. At the same time, it performs low temperature transmission test evaluation and analysis to understand whether the low temperature transmission capability of the infrared optical coupler to be tested is qualified. The specific low temperature transmission test evaluation and analysis process is as follows:

[0053] When the infrared optical coupler to be tested is under test at the low temperature test point: T1: the infrared optical coupler to be tested is under test at the low temperature test point test period, and it is set as the low temperature period, the input current is continuously increased at the input end of the infrared optical coupler to be tested, and the output response current increases more and more slowly, and finally reaches the saturation current value and maintains at the saturation current value, and the saturation current value speed is set as the output saturation current value;

[0054] T2: Obtain the period during which the input current of the input end of the infrared optical coupler to be tested is continuously increased to the output saturation current value, and set it as the input period, divide the input period into i sub-time nodes, i is a natural number greater than zero, and obtain the current transfer ratio corresponding to each sub-time node;

[0055] T3: With the child time node as X and the current transfer ratio as the Y axis, a rectangular coordinate system is established, and a current transfer ratio curve is drawn by plotting points. At the same time, a preset current transfer ratio curve is drawn in the coordinate system, and the difference between the corresponding plotting points of the drawn current transfer ratio curve and the drawn comparison current transfer ratio curve is obtained, and set as the low temperature deviation value;

[0056] T4: Compare and analyze the low temperature deviation value with the preset low temperature deviation value threshold value recorded and stored internally, set the number of low temperature deviation values ​​greater than or equal to the preset low temperature deviation value threshold value as the low temperature deviation index, and compare and analyze the low temperature deviation index:

[0057] If the low temperature excursion index is less than or equal to the standard low temperature excursion index threshold, a low temperature qualified signal is generated;

[0058] If the low temperature offset index is greater than the standard low temperature offset index threshold, a low temperature unqualified signal is generated, and the low temperature qualified signal or the low temperature unqualified signal is sent to the test display unit. After receiving the low temperature qualified signal or the low temperature unqualified signal, the test display unit immediately displays the preset warning text corresponding to the low temperature qualified signal or the low temperature unqualified signal, so as to intuitively understand whether the transmission capacity of the infrared optical coupler to be tested is normal under the extreme low temperature, and at the same time effectively improve the accuracy and comprehensiveness of the high and low point temperature test results of the infrared optical coupler to be tested;

[0059] In summary, the present invention performs voltage and response performance tests from two points, namely, the highest temperature and the lowest temperature, and performs interval temperature division feedback analysis on the reference operating temperature interval, so as to perform extreme temperature test on the infrared optical coupler to be tested through temperature division, so as to determine whether the performance of the infrared optical coupler to be tested is qualified. When the test is conducted at the high temperature test point, the input voltage and input time of the input end are subjected to high temperature peak response supervision evaluation analysis, so as to determine whether the output saturation voltage and output saturation time of the infrared optical coupler to be tested at the high temperature point are consistent with the output saturation time infrared optical coupler, so as to intuitively understand whether the response capability and saturation voltage of the infrared optical coupler to be tested are standard. At the same time, the actual final input voltage is further compared and analyzed under the condition that the output end is normal, so as to determine whether the working voltage is qualified, thereby helping to improve the accuracy of the test. When the test is conducted at the low temperature test point, a low temperature transmission test evaluation analysis is performed, so as to intuitively understand whether the transmission capability of the infrared optical coupler to be tested is normal at the extreme low temperature, and at the same time, the accuracy and comprehensiveness of the high and low temperature test results corresponding to the infrared optical coupler to be tested are effectively improved, and at the same time, it is convenient for the rational differentiation and management of the infrared optical coupler to be tested.

[0060] The threshold is set to facilitate comparison. The size of the threshold depends on the amount of sample data and the number of bases set by technicians in this field for each group of sample data; as long as it does not affect the proportional relationship between the parameter and the quantized value.

[0061] The above formulas are obtained by collecting a large amount of data for software simulation and selecting a formula that is close to the actual value. The coefficients in the formula are set by technical personnel in this field according to actual conditions. The above is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited to this. Any technical personnel familiar with the technical field within the technical scope disclosed by the present invention, according to the technical solution and the inventive concept of the present invention, make equivalent replacement or change, which should be covered within the protection scope of the present invention.

Claims

1. The infrared optical coupler performance test system based on data analysis is characterized by: It includes a test management platform, a test information unit, an interval test division unit, a high peak test unit, a low peak test unit and a test display unit; The test information unit is used to collect the reference operating temperature interval of the infrared optical coupler to be tested, and send the reference operating temperature interval to the interval test division unit; After receiving the reference operating temperature interval, the interval test division unit immediately performs interval temperature division feedback analysis on the reference operating temperature interval to obtain a high temperature test point and a low temperature test point; The high peak value test unit is used to call the high temperature test point, collect the input voltage and input time of the input end of the infrared optical coupler to be tested, and perform high temperature peak response supervision evaluation analysis at the same time, and send a voltage qualified signal or a voltage unqualified signal, a response qualified signal or a response unqualified signal to the test display unit; The low peak test unit is used to call the low temperature test point and collect the current transfer ratio of the infrared optical coupler to be tested, and at the same time perform low temperature transmission test evaluation analysis, compare and analyze the obtained low temperature offset index, and send the obtained low temperature qualified signal or low temperature unqualified signal to the test display unit.

2. The infrared optical coupler performance test system based on data analysis according to claim 1, characterized in that: The interval temperature division feedback analysis process of the interval test division unit is as follows: Obtain a reference operating temperature interval of the infrared optical coupler to be tested, obtain a maximum temperature value and a minimum temperature value in the reference operating temperature interval of the infrared optical coupler to be tested, and set the maximum temperature value and the minimum temperature value in the reference operating temperature interval as a high temperature test point and a low temperature test point, respectively; At the same time, basic information corresponding to the high temperature test point and the low temperature test point of the normal infrared optical coupler in the reference operating temperature range is obtained, and the basic information includes the standard output saturation voltage threshold, the standard output saturation time threshold, and the comparison current transfer ratio curve.

3. The infrared optical coupler performance test system based on data analysis according to claim 1, characterized in that: The high temperature peak response regulatory assessment analysis process of the high peak test unit is as follows: S1: Collect the test period of the infrared optical coupler to be tested, and obtain the input voltage and input time of the input end of the infrared optical coupler to be tested during the test period; S2: applying a gradually increasing input voltage to the input end of the infrared optical coupler to be tested, obtaining the output response voltage of the output end of the infrared optical coupler to be tested, obtaining the output saturation voltage and the output saturation voltage moment of the output end of the infrared optical coupler to be tested, and then obtaining the duration between the input moment and the output saturation voltage moment, and setting it as the output saturation duration.

4. The infrared optical coupler performance test system based on data analysis according to claim 2, characterized in that: S3: Compare and analyze the output saturation voltage and output saturation duration of the infrared optical coupler to be tested with the standard output saturation voltage threshold and the standard output saturation duration threshold: If the output saturation voltage is equal to the standard output saturation voltage threshold, a voltage qualified signal is generated; if the output saturation voltage is not equal to the standard output saturation voltage threshold, a voltage unqualified signal is generated; If the output saturation duration is equal to the standard output saturation duration threshold, a response qualified signal is generated; if the output saturation duration is not equal to the standard output saturation duration threshold, a response unqualified signal is generated.

5. The infrared optical coupler performance test system based on data analysis according to claim 3 is characterized in that: Based on the voltage qualified signal and the response qualified signal: The actual final input voltage of the input terminal when the output terminal of the infrared optical coupler to be tested is the output saturation voltage is obtained, and the actual final input voltage is compared and analyzed with the calibrated working voltage of the infrared optical coupler to be tested when it leaves the factory, and a risk signal or a normal signal is generated.

6. The infrared optical coupler performance test system based on data analysis according to claim 1, characterized in that: The low temperature transmission test evaluation and analysis process of the low peak test unit is as follows: T1: obtaining that the infrared optical coupler to be tested is in a test period at a low temperature test point, and setting it as a low temperature period, continuously increasing the input current at the input end of the infrared optical coupler to be tested, collecting that the output response current is maintained at a saturation current value, and setting the saturation current value speed as the output saturation current value; T2: Obtain the time period during which the input current of the input end of the infrared optical coupler to be tested is continuously increased to the output saturation current value, and set it as the input time period, divide the input time period into i sub-time nodes, i is a natural number greater than zero, and obtain the current transfer ratio corresponding to each sub-time node.

7. The infrared optical coupler performance test system based on data analysis according to claim 6, characterized in that: T3: With the child time node as X and the current transfer ratio as the Y axis, a rectangular coordinate system is established, and a current transfer ratio curve is drawn by plotting points. At the same time, a preset current transfer ratio curve is drawn in the coordinate system, and the difference between the corresponding plotting points of the drawn current transfer ratio curve and the drawn comparison current transfer ratio curve is obtained, and set as the low temperature deviation value; T4: Compare and analyze the low temperature deviation value with the preset low temperature deviation value threshold value recorded and stored internally, set the number of low temperature deviation values ​​greater than or equal to the preset low temperature deviation value threshold value as the low temperature offset index, and compare and analyze the low temperature offset index: generate a low temperature qualified signal or generate a low temperature unqualified signal.

Images