ADC self-checking system and electronic equipment

Abstract

The embodiment of the invention relates to the technical field of ADC calibration and test, and discloses an ADC self-checking system and electronic equipment, and the system comprises a power module, a voltage dividing module and an ADC self-checking module. The power supply module is connected with the voltage dividing module and is used for inputting multiple paths of high-precision reference voltage to the voltage dividing module; the voltage dividing module is connected with the ADC self-checking module and is used for dividing the multiple paths of high-precision reference voltages to obtain multiple groups of voltages and inputting the multiple groups of voltages into the ADC self-checking module; and the self-checking module performs self-checking based on the plurality of groups of voltages. The self-checking cost is reduced, and the self-checking precision is greatly improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of ADC self-test and testing technology, and in particular to an ADC self-test system and an electronic device. Background Art

[0002] At present, ADC self-test is performed directly on the ADC production line using a DC power supply. In this way, each test station is equipped with a DC power supply when the production line performs ADC self-test, and each test station controls a voltage reference source. When the project is mass-produced, multiple test lines will be tested in parallel, resulting in an exponential increase in the number of DC power supplies required. However, the cost of purchasing or renting a DC power supply is high, which increases the production and testing costs of the module.

[0003] At the same time, since most of the DC power supplies purchased by the production line have poor accuracy and unstable output, the ADC self-test module still has poor accuracy after calibration and testing, and the pass rate is low when doing ADC self-test, affecting production capacity; after the self-test threshold is relaxed, the accuracy will deteriorate when customers use the ADC function, and the ADC detection will be inaccurate, affecting customer use. In addition, the DC power supply on the production line is directly operated by the production line workers, which is easy to cause misoperation or damage to the ADC self-test module due to the unstable high voltage output of the DC power supply itself. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide an ADC self-test system and an electronic device to solve the technical problems that the prior art ADC self-test has high cost, poor accuracy, low production line test pass rate, and output high voltage that damages the ADC self-test module due to misoperation or unstable DC power supply output.

[0005] According to some embodiments of the present application, a first aspect of the embodiments of the present application provides an ADC self-test system, including a power supply module, a voltage divider module and an ADC self-test module; the power supply module is connected to the voltage divider module, for inputting multiple high-precision reference voltages to the voltage divider module; the voltage divider module is connected to the ADC self-test module, for dividing the multiple high-precision reference voltages to obtain multiple groups of voltages, and inputting the multiple groups of voltages into the ADC self-test module; the self-test module performs self-test based on the multiple groups of voltages.

[0006] In some embodiments, the power supply module includes a DC power supply and multiple high-precision voltage reference sources; the multiple high-precision voltage reference sources are connected in parallel between the DC power supply and the voltage divider module; the multiple high-precision voltage reference sources include at least a first voltage reference source and a second voltage reference source, the first voltage reference source outputs a first high-precision voltage, and the second voltage reference source outputs a second high-precision voltage.

[0007] In some embodiments, the voltage divider module includes a first analog switch, a high-precision voltage divider resistor module, and a second analog switch, the first analog switch is connected to the high-precision voltage divider resistor module, the high-precision voltage divider resistor module is connected to the second analog switch, and the second analog switch is connected to the ADC self-test module; the first analog switch is used to switch the connection channel between the high-precision voltage divider resistor module and the multiple high-precision reference voltages; the high-precision voltage divider resistor module is used to have multiple output channels; the second analog switch is used to switch the connection channel between each input channel of the high-precision voltage divider resistor module and the ADC self-test module.

[0008] In some embodiments, the ADC self-test module is used to receive a first voltage group and a second voltage group, and save the first voltage group and the second voltage group, the first voltage group is a plurality of voltage values ​​obtained by dividing the first voltage reference source by the high-precision voltage divider resistor module, and the second voltage group is a plurality of voltage values ​​obtained by dividing the second voltage reference source by the high-precision voltage divider resistor module.

[0009] In some embodiments, the ADC self-test module is also used to read the first voltage group, calculate the difference between the corresponding voltage points of the first voltage group and the second voltage group, and record the result of the self-test passing when the difference corresponding to each voltage point is less than a preset calibration parameter.

[0010] In some embodiments, the ADC self-test module is also used to read the first voltage group, generate a calibration curve based on the first voltage group, draw a self-test curve based on the voltage points in the second voltage group in the coordinate system where the calibration curve is located, and record the result of the self-test passing when the distance between the calibration curve and the self-test curve is less than a preset calibration parameter.

[0011] In some embodiments, the preset calibration parameters are parameters set according to the voltage range output by the multiple high-precision voltage reference sources.

[0012] In some embodiments, the power module also includes a low voltage dropout linear regulator, which is connected between the DC power supply and multiple high-precision voltage reference sources to convert the DC voltage into a low voltage preset by each high-precision voltage source.

[0013] In some embodiments, the ADC self-test module is connected to the voltage divider module through a test fixture.

[0014] According to some embodiments of the present application, a third aspect of the embodiments of the present application further provides an electronic device, comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can perform the functions of the ADC self-test system in the above-mentioned embodiments.

[0015] The technical solution provided in the embodiment of the present application has at least the following advantages:

[0016] The ADC self-test system of the present application includes a power supply module, which is used to input multiple high-precision reference voltages to the voltage divider module, and is used to provide a self-test voltage source for multiple ADC production lines. There is no need to provide a DC voltage source for each voltage reference source, which reduces costs, and avoids the accuracy difference between multiple DC voltage sources causing inaccurate self-test, and also avoids the DC voltage source from being misoperated or causing damage to the module due to its own unstable high voltage output. The voltage divider module is connected to the ADC self-test module, divides the multiple high-precision reference voltages, obtains multiple groups of voltages, and performs self-test based on the multiple groups of voltages, which greatly simplifies the self-test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0018] Figure 1 is a schematic diagram of an ADC self-test system according to an embodiment of the present application;

[0019] Figure 2 is a schematic diagram of a power supply module of an ADC self-test system according to an embodiment of the present application;

[0020] Figure 3 is a schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0021] In the related technology, the ADC production line uses a DC power supply to perform ADC self-test, and each test station is equipped with a DC power supply. When the project is mass-produced, multiple test lines will be tested in parallel, resulting in an exponential increase in the number of DC power supplies required. However, the purchase or rental costs of DC power supplies are high, which increases the production and testing costs of the modules. At the same time, each station is equipped with a DC power supply, which is prone to misoperation or damage to the ADC self-test module due to the unstable high voltage output of the DC power supply itself.

[0022] In related technologies, most DC power supplies purchased for production lines have poor accuracy, resulting in unstable output DC power supply, poor accuracy after ADC self-test module testing, and low pass rate during ADC self-test, affecting production capacity. Relaxing the self-test threshold will cause accuracy to deteriorate when customers use the ADC function, causing inaccurate ADC detection, affecting customer use.

[0023] Based on this, the embodiment of the present application provides an ADC self-test system, including a power module, a voltage divider module and an ADC self-test module; the power module is connected to the voltage divider module, and is used to input multiple high-precision reference voltages to the voltage divider module; the voltage divider module is connected to the ADC self-test module, and is used to divide the multiple high-precision reference voltages to obtain multiple groups of voltages, and input the multiple groups of voltages into the ADC self-test module; the self-test module performs self-test based on the multiple groups of voltages. This solves the problem of high cost and low precision caused by configuring a DC power supply for each test station when performing ADC self-test on the existing production line.

[0024] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described in detail below in conjunction with the accompanying drawings. However, it will be appreciated by those skilled in the art that in the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed in the present application can also be implemented. The division of the following embodiments is for the convenience of description, and the specific implementation of the present application should not be construed as any limitation, and the various embodiments can be combined and referenced with each other under the premise of no contradiction.

[0025] like Figure 1 As shown, the ADC self-test system includes a power supply module, the power supply module includes a DC power supply and multiple high-precision voltage reference sources, and the multiple high-precision voltage reference sources are connected in parallel between the DC power supply and the voltage divider module. Specifically, the DC power supply can be a DC 5V DC power supply, and the DC power supply outputs a DC voltage to provide voltage for the multiple high-precision voltage reference sources.

[0026] Voltage reference source, also known as reference voltage source, refers to a high-stability voltage source used as a voltage reference in a circuit. With the continuous increase in the scale of integrated circuits, especially the development of system integration technology (SOC), it has also become an indispensable basic circuit module in large-scale, ultra-large-scale integrated circuits and almost all digital analog systems. In many integrated circuits and circuit units, such as digital-to-analog converters (DACs), analog-to-digital converters (ADCs), linear regulators and switching regulators, precise and stable voltage references are required. In a digital-to-analog converter, the DAC selects and generates analog outputs from a DC reference voltage according to the digital input signal presented at its input; in an analog-to-digital converter, the DC voltage module is used together with the analog input signal to generate a digital output signal. In precision measuring instruments and widely used digital communication systems, reference voltage sources are often used as references for system measurement and calibration. Therefore, the reference voltage source occupies a very important position in analog integrated circuits, which directly affects the performance and accuracy of electronic systems. In recent years, research on it has also been very active, and the reference voltage source made using bipolar technology has been able to achieve quite high performance and accuracy.

[0027] In an embodiment of the present application, the multi-channel high-precision voltage reference source includes at least a first voltage reference source and a second voltage reference source, wherein the voltage range of the first voltage reference source and the second voltage reference source are the same.

[0028] like Figure 1 As shown, the voltage divider module includes a first analog switch, a high-precision voltage divider resistor module, and a second analog switch. The first analog switch is connected to the high-precision voltage divider resistor module, the high-precision voltage divider resistor module is connected to the second analog switch, and the second analog switch is connected to the ADC self-test module.

[0029] The first analog switch switches the channel to control the connection status of the first voltage reference source and the second voltage reference source. For example, in a first time period, the first analog switch switches to the first voltage reference source channel to control the first voltage reference source to be connected to the high-precision voltage divider resistor module. In a second time period, the first analog switch switches to the second voltage reference source channel to control the second voltage reference source to be connected to the high-precision voltage divider resistor module.

[0030] The high-precision voltage-dividing resistor module has an input port connected to the second analog switch, and has multiple output ports connected to the ADC self-test module. Each output port outputs a voltage value. For example, the voltage of the first voltage reference source is input into the high-precision voltage-dividing resistor module. After the voltage division processing of the high-precision voltage-dividing resistor module, multiple voltage values ​​are obtained to form a voltage group. Taking the 0-1.8V voltage output by the general ADC voltage reference source as an example, the voltage of the voltage reference source (0-1.8V) is transmitted to the high-precision voltage-dividing resistor module. Assuming that the high-precision voltage-dividing resistor module has 10 groups of high-precision voltage-dividing resistors, there are 10 output channels, and each channel outputs a fixed voltage value to obtain a first voltage group, where the 10 fixed voltages can be: 0.1818V, 0.3624V, 0.5389V, 0.7262V, 0.8904V, 1.024V, 1.2288V, 1.408V, 1.6317V, 1.7655V.

[0031] The second analog switch is arranged between the high-precision voltage-dividing resistor module and the AD self-test module. Since the high-precision has multiple output ports and the AD self-test module has one input port, it is necessary to switch the channel through the second analog switch to control which output port of the high-precision voltage-dividing resistor module is connected to the AD self-test module. In an embodiment of the present application, the output port of the high-precision voltage-dividing resistor module is connected to the AD self-test module in a time-sharing manner through the second analog switch, so as to transmit the voltage group to the AD self-test module.

[0032] In the embodiment of the present application, when the project is mass-produced, multiple test lines are used to perform ADC self-test in parallel. At this time, only the output channel of the DC power supply needs to be increased. Figure 1 , a standard voltage reference source can be output based on a universal ADC, with a volt value range of 0-1.8V. The 1.8V reference voltage is output by the LD01 channel for calibration voltage, and the 1.8V reference voltage is output by the LD02 channel for self-test voltage; at the same time, voltage sources with other volt values ​​can also be output based on VBAT_ADC. For example, the volt value in the figure is 0-4.2V, the 4.2V reference voltage is output by the LD03 channel for calibration voltage, and the 4.2V reference voltage is output by the LD04 channel for self-test voltage; the specific voltage value range and the number of channels can be set according to actual conditions and are not limited here.

[0033] In the embodiments of the present application, only one DC power supply is required. When the scale of the production line increases, the number of high-precision voltage reference sources can be increased. The production line tester only needs to operate one DC power supply to implement the ADC self-test process of multiple production lines, which greatly reduces the number of test stations. Compared with the prior art, one DC power supply is added for each additional production line, which greatly reduces the cost and can also avoid inaccurate detection caused by output errors between different DC power supplies.

[0034] In an embodiment of the present application, the first analog switch and the second analog switch play the role of connecting or disconnecting the signal, and the switching method of the MOS tube is used to realize the shutdown or opening of the signal link. It has the characteristics of low power consumption, high speed, no mechanical contacts, small size and long service life.

[0035] In an embodiment of the present application, the ADC self-test module is used to receive a first voltage group and a second voltage group, and save the first voltage group and the second voltage group, the first voltage group is a plurality of voltage values ​​obtained by dividing the first voltage reference source by the high-precision voltage divider resistor module, and the second voltage group is a plurality of voltage values ​​obtained by dividing the second voltage reference source by the high-precision voltage divider resistor module.

[0036] The ADC self-test module receives a first voltage group, which is a plurality of voltage values ​​obtained by dividing the first voltage reference source by the high-precision voltage-dividing resistor module. In an embodiment of the present application, the first analog switch switches channels to control the first voltage reference source to be connected to the high-precision voltage-dividing resistor module, and multiple voltage values ​​are obtained by dividing the high-precision voltage-dividing resistor module as the first voltage group, and the second analog switch switches channels to transmit the multiple voltage values ​​to the ADC self-test module respectively.

[0037] In an embodiment of the present application, the ADC self-test module saves the first voltage group inside the ADC self-test module.

[0038] The ADC self-test module receives a second voltage group, where the second voltage group is a plurality of voltage values ​​obtained by dividing the second voltage reference source by the high-precision voltage-dividing resistor module.

[0039] In an embodiment of the present application, the first analog switch switches the channel to control the second voltage reference source to be connected to the high-precision voltage-dividing resistor module, and multiple voltage values ​​are obtained by voltage division by the high-precision voltage-dividing resistor module as the second voltage group. The second analog switch switches the channel to transmit the multiple voltage values ​​to the ADC self-test module respectively.

[0040] The self-test module performs self-test based on the multiple groups of voltages.

[0041] In one embodiment of the present application, the ADC self-test module is also used to read the first voltage group, calculate the difference between the corresponding voltage points of the first voltage group and the second voltage group, and record the result of the self-test passing when the difference corresponding to each voltage point is less than a preset calibration parameter.

[0042] The first voltage group has been stored in advance inside the ADC self-test module in the aforementioned steps. During the self-test, the first voltage group is read first. Since the first voltage group and the second voltage group are obtained by voltage division by the same high-precision voltage-dividing resistor module, the number of voltage points of the first voltage group and the second voltage group is the same. The difference between the voltage in the second voltage group and the corresponding voltage in the first voltage group is calculated in turn. If the difference is less than the calibration parameter, the self-test passes, otherwise the self-test fails.

[0043] In another embodiment of the present application, the ADC self-test module is also used to read the first voltage group, generate a calibration curve based on the first voltage group, draw a self-test curve based on the voltage points in the second voltage group in the coordinate system where the calibration curve is located, and record the result of the self-test passing when the distance between the calibration curve and the self-test curve is less than a preset calibration parameter.

[0044] In an embodiment of the present application, the preset calibration parameters are parameters set according to the voltage range output by the multiple high-precision voltage reference sources.

[0045] Figure 2 This is a schematic diagram of a power supply module in an embodiment of the present application, wherein the power supply module also includes a low voltage dropout linear regulator LDO, which is connected between the DC power supply and multiple high-precision voltage reference sources, and is used to convert the DC voltage into a low voltage preset by each high-precision voltage source.

[0046] Low-dropout linear regulator (LDO) is an integrated circuit regulator. Its main feature is to convert a higher voltage input into a slightly lower stable output voltage while maintaining a small output-input voltage difference. The LDO is usually composed of components such as a voltage divider sampling circuit, a reference voltage, an error amplifier circuit, and a transistor adjustment circuit. The stability of the output voltage is controlled by a negative feedback regulation loop. Compared with traditional linear regulators, the advantage of LDO is that it can work when the voltage difference between the input and output voltage is small. For example, in a 5V to 3.3V application, the voltage difference between the input and output is only 1.7V, which is difficult for traditional linear regulators to meet. In addition, LDO also has the advantages of low output noise and low quiescent current. It is widely used in various electronic devices in power management, battery power supply, signal processing and other fields.

[0047] In an embodiment of the present application, the ADC self-test module is connected to the voltage divider module via a test fixture, which is a device used to fix and position the object under test (such as electronic components, mechanical parts, software modules, etc.) during the test process and provide necessary connections and interfaces to ensure the accuracy and repeatability of the test. The test fixture enables the test work to be carried out in a stable and controllable environment.

[0048] In an embodiment of the present application, before performing ADC self-test, the multi-channel high-precision voltage reference source, the first analog switch, the second analog switch, the high-precision voltage divider resistor module, the second analog switch and the ADC self-test module are pre-set.

[0049] Specifically, the voltage range of multiple high-precision voltage reference sources is set, for example, the voltage range for self-testing a general ADC is 0-1.8V, and the voltage range for self-testing a VBAT_ADC is 0-4.2V; the switching time and frequency of the first analog switch and the second analog switch are set; the number of resistance values ​​and the voltage dividing spacing of the high-precision voltage dividing resistor module are set; the function pins of the ADC self-test module are calibrated, and the calibration parameters are set.

[0050] In an embodiment of the present invention, the ADC self-test system includes a power supply module, a device for inputting multiple high-precision reference voltages to the voltage divider module, and a self-test voltage source for multiple ADC production lines. There is no need to provide a DC voltage source for each voltage reference source, thereby reducing costs, while avoiding the accuracy differences between multiple DC voltage sources leading to inaccurate self-tests, and also avoiding the DC voltage source from being misoperated or causing damage to the module due to its own unstable high voltage output. The voltage divider module is connected to the ADC self-test module, divides the multiple high-precision reference voltages to obtain multiple groups of voltages, and performs self-tests based on the multiple groups of voltages, greatly simplifying the self-test process.

[0051] It is not difficult to find that this embodiment is a device embodiment corresponding to the above method embodiment, and this embodiment can be implemented in conjunction with the above method embodiment. The relevant technical details mentioned in the above method embodiment are still valid in this embodiment, and in order to reduce repetition, they are not repeated here. Accordingly, the relevant technical details mentioned in this embodiment can also be applied in the above method embodiment.

[0052] It is worth mentioning that all modules involved in this embodiment are logic modules. In practical applications, a logic unit can be a physical unit, a part of a physical unit, or a combination of multiple physical units. In addition, in order to highlight the innovative part of the present invention, this embodiment does not introduce units that are not closely related to solving the technical problem proposed by the present invention, but this does not mean that there are no other units in this embodiment.

[0053] Another embodiment of the present application relates to an electronic device 300, see Figure 3 , including: a processor 301, a memory 302, and a computer program, such as a data processing program, stored in the memory 302 and executable on the processor 301. When the processor 301 executes the computer program, the functions of the modules of the above-mentioned ADC self-test system are realized.

[0054] Exemplarily, the computer program may be divided into one or more modules / units, which are stored in the memory 302 and executed by the processor 301 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program in the electronic device.

[0055] The electronic device may be a computing device such as a desktop computer, a notebook, a PDA, and a cloud server. The electronic device may include, but is not limited to, a processor 301 and a memory 302. Those skilled in the art will appreciate that the schematic diagram is merely an example of an electronic device and does not constitute a limitation on the electronic device. The electronic device may include more or fewer components than shown in the diagram, or may combine certain components, or different components. For example, the electronic device may also include an input / output device, a network access device, a bus, etc.

[0056] The processor 301 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or the processor 301 may also be any conventional processor, etc. The processor 301 is the control center of the electronic device, and uses various interfaces and lines to connect various parts of the entire electronic device.

[0057] The memory 302 can be used to store the computer program and / or module, and the processor 301 realizes various functions of the electronic device by running or executing the computer program and / or module stored in the memory 302, and calling the data stored in the memory 302. The memory 302 can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, an application required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area can store data created according to the use of the mobile phone (such as audio data, a phone book, etc.), etc. In addition, the memory 302 can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0058] Wherein, if the module / unit integrated in the electronic device is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor 301. Wherein, the computer program includes a computer program code, and the computer program code can be in the form of source code, object code, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a mobile hard disk, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electrical carrier signal, a telecommunication signal, and a software distribution medium.

[0059] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0060] It should be noted that the collection, collection, updating, analysis, processing, use, transmission, storage and other aspects of user personal information involved in the technical solution of this disclosure are in compliance with the provisions of relevant laws and regulations, are used for legitimate purposes, and do not violate public order and good morals. Necessary measures are taken for user personal information to prevent illegal access to user personal information data and maintain the security of user personal information and network security.

[0061] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0062] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for enabling a service classification device (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0063] The above is only a preferred implementation of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. An ADC self-test system, characterized in that: Including power supply module, voltage divider module and ADC self-test module; The power supply module is connected to the voltage divider module, and is used to input multiple high-precision reference voltages to the voltage divider module; The voltage divider module is connected to the ADC self-test module, and is used to divide the multiple high-precision reference voltages to obtain multiple groups of voltages, and input the multiple groups of voltages into the ADC self-test module; The self-test module performs self-test based on the multiple groups of voltages.

2. The ADC self-test system according to claim 1, wherein: The power supply module includes a DC power supply and multiple high-precision voltage reference sources; The multiple high-precision voltage reference sources are connected in parallel and connected between the DC power supply and the voltage divider module; The multiple high-precision voltage reference sources include at least a first voltage reference source and a second voltage reference source, the first voltage reference source outputs a first high-precision voltage, and the second voltage reference source outputs a second high-precision voltage.

3. The ADC self-test system according to claim 1, wherein: The voltage divider module includes a first analog switch, a high-precision voltage divider resistor module, and a second analog switch, wherein the first analog switch is connected to the high-precision voltage divider resistor module, the high-precision voltage divider resistor module is connected to the second analog switch, and the second analog switch is connected to the ADC self-test module; The first analog switch is used to switch the connection channel between the high-precision voltage-dividing resistor module and the multiple high-precision reference voltages; The high-precision voltage-dividing resistor module is used for the plurality of output channels; The second analog switch is used to switch the connection channels between each input channel of the high-precision voltage-dividing resistor module and the ADC self-test module.

4. The ADC self-test system according to claim 1, wherein: The ADC self-test module is used to receive a first voltage group and a second voltage group, and save the first voltage group and the second voltage group, the first voltage group is a plurality of voltage values ​​obtained by dividing the first voltage reference source by the high-precision voltage-dividing resistor module, and the second voltage group is a plurality of voltage values ​​obtained by dividing the second voltage reference source by the high-precision voltage-dividing resistor module.

5. The ADC self-test system as claimed in claim 4, characterized in that: The ADC self-test module is also used to read the first voltage group, calculate the difference between the corresponding voltage points of the first voltage group and the second voltage group, and record the result of the self-test passing when the difference corresponding to each voltage point is less than a preset calibration parameter.

6. The ADC self-test system according to claim 4, wherein: The ADC self-test module is also used to read the first voltage group, generate a calibration curve based on the first voltage group, draw a self-test curve based on the voltage points in the second voltage group in the coordinate system where the calibration curve is located, and record the result of the self-test passing when the distance between the calibration curve and the self-test curve is less than a preset calibration parameter.

7. The ADC self-test system according to claim 5 or 6, characterized in that: The preset calibration parameters are parameters set according to the voltage range output by the multiple high-precision voltage reference sources.

8. The ADC self-test system according to claim 2, wherein: The power module also includes a low voltage dropout linear regulator, which is connected between the DC power supply and multiple high-precision voltage reference sources and is used to convert the DC voltage into a low voltage preset by each high-precision voltage source.

9. The ADC self-test system according to claim 1, wherein: The ADC self-test module is connected to the voltage divider module through a test fixture.

10. An electronic device, characterized in that: include: at least one processor; as well as, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the functions of the ADC self-test system according to any one of claims 1 to 9.

Images