Anti-damage integrated plug-in ATE test fixture upper and lower machine assembly and use method

By designing the integrated plug-in and unplugged ATE test fixture upper and lower machine components for damage prevention, and using USB connectors and quick connectors to achieve direct connection, the problem of low production line operation efficiency caused by structural defects of existing pallet test fixtures is solved, and the test time is significantly shortened and the production line operation efficiency is improved.

CN119667226APending Publication Date: 2025-03-21DONGGUAN CAITU INTELLECTUAL PROPERTY CO LTD
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Patent Information

Application Number
CN202510133355.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-06
Publication Date
2025-03-21

AI Technical Summary

Technical Problem

The existing pallet test fixtures have structural defects, resulting in low operating efficiency of the production line and a long test time.

Method used

A damage-proof integrated plug-and-pull-out ATE test fixture upper and lower machine assembly is designed, including a pallet, USB connection, quick connection and handle. A USB connection part is provided on the top of the tray and a quick connection part is provided on the side. Direct connection is achieved through the USB connector and the quick connector, reducing operational complexity and time.

Benefits of technology

By optimizing the structure of the pallet, it is directly connected to the test bench and the test machine, reducing the time to load and exit the test fixture, improving the operating efficiency of the production line, saving about 5S/PCS, and approximately 300-500PCS/H.

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Abstract

The invention relates to the field of electronic jigs, and particularly discloses an anti-damage integrated plug-in ATE test jig upper and lower machine assembly and a use method. An existing tray testing jig is improved and optimized, an interface, connected with a USB / DC patch cord, on an existing tray is replaced with the USB connector, the tray can be directly connected with a testing table, the trouble that testing personnel use the patch cord is effectively avoided, meanwhile, a connecting wire, connected with a testing machine, on the existing tray is replaced with the quick connector, and the testing efficiency is improved. A plurality of connecting wires do not need to be operated and connected by on-machine testers, connection can be established between the tray test fixture and a test machine through the quick connectors, the on-off time of the test fixture is shortened, the ATE test time of the test fixture tray can be effectively shortened through structural optimization of two parts, the operation efficiency of a production line is effectively improved, the time is saved by about 5S / PCS, and the production cost is reduced. And the capacity can be generally improved to 300 to 500 PCS / H.
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Description

Technical Field

[0001] The invention belongs to the technical field of electronic fixtures, and in particular relates to upper and lower machine components of an anti-damage integrated plug-in ATE test fixture and a use method thereof. Background Art

[0002] At present, ATE testing in the packaging section is the bottleneck for improving the operating efficiency of the production line. The current production line operation requirement reaches 1400-1500PCS / H. The existing production line uses a single USB and DC adapter for operation. During the operation, the operator not only needs to plug the two ends of the adapter into the test bench and the tray respectively, but also needs to use the adapter to connect the USB head again. There are many test tools used and the test steps are relatively cumbersome. In the subsequent on-machine testing process, multiple AC plugs are needed to connect the test machine and the tray together, which will also lead to a longer on-machine and off-machine testing time for the tray, reducing the operating efficiency of the production line. It can be seen that the current tray has structural defects, which will reduce the operating efficiency of the production line. Summary of the invention

[0003] In order to overcome the deficiencies of the prior art, the purpose of the present invention is to provide a damage-resistant integrated plug-in ATE test fixture upper and lower machine assembly and a method of use, so as to solve the problem that the current tray test fixture has structural defects, resulting in low production line operation efficiency.

[0004] To achieve the above object, the present invention provides the following technical solutions:

[0005] Anti-damage integrated plug-in ATE test fixture upper and lower machine components, including:

[0006] A tray, wherein a USB connection portion is disposed on the top of the tray, and a quick connection portion is disposed on the side of the tray;

[0007] A handle is fixedly mounted on a side of the tray away from the quick connection portion.

[0008] Preferably, the USB connection portion comprises a first groove formed on the tray and a second groove formed at the bottom of the first groove, and a USB connector is connected to the second groove.

[0009] Preferably, the quick connection portion comprises a quick connector connected to the tray and capable of being quickly plugged in and out.

[0010] The method for using the upper and lower machine components of the anti-damage integrated plug-in ATE test fixture is applied to the upper and lower machine components of the anti-damage integrated plug-in ATE test fixture, including:

[0011] Place the tray on the workbench, and directly insert the USB connector into the first groove and the second groove to connect with the USB connector, so as to quickly enter the test phase and avoid scratches caused by getting on and off the test machine, resulting in poor product appearance;

[0012] Place the connected tray on the test machine and quickly connect it to the test machine through the quick connector to complete the test.

[0013] Compared with the prior art, the present invention has the following beneficial effects:

[0014] The present invention improves and optimizes the existing tray test fixture, replaces the interface connected to the USB / DC adapter cable on the existing tray with a USB connector, so that the tray can be directly connected to the test bench, effectively avoiding the trouble of testers using the adapter cable, and at the same time replaces the wiring connected to the test machine on the existing tray with a quick connector, without the need for testers on the machine to operate and connect multiple wiring. A connection can be established between the tray test fixture and the test machine through the quick connector, reducing the time for the test fixture to be put on and off the machine. The two structural optimizations can effectively reduce the ATE test time of the test fixture tray, thereby effectively improving the operating efficiency of the production line, saving about 5S / PCS of time, and approximately increasing the production capacity by 300-500PCS / H. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 The overall structure of the test fixture of the present invention is shown in FIG. Figure 1 ;

[0016] Figure 2 For the present invention Figure 1 A magnified image of the middle part;

[0017] Figure 3 The overall structure of the test fixture of the present invention is shown in FIG. Figure 2 ;

[0018] In the figure: 1. tray; 2. first groove; 3. second groove; 4. USB connector; 5. handle; 6. quick connector. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] Embodiment 1:

[0021] See also Figure 1 - Figure 3 As shown in the figure, the anti-damage integrated plug-in ATE test fixture upper and lower machine components include:

[0022] A tray 1, wherein a USB connection portion is disposed on the top of the tray 1, and a quick connection portion is disposed on the side of the tray 1;

[0023] The handle 5 is fixedly mounted on a side of the tray 1 away from the quick connection portion.

[0024] The USB connection portion includes a first groove 2 opened on the tray 1 and a second groove 3 opened at the bottom of the first groove 2 , and a USB connector 4 is connected to the second groove 3 .

[0025] The quick connection portion includes a quick connector 6 connected to the tray 1 and capable of being quickly plugged in and out.

[0026] As can be seen from the above, the existing tray 1 test fixture is improved and optimized, and the interface on the existing tray 1 connected to the USB / DC adapter is replaced with a USB connector 4, so that the tray 1 can be directly connected to the test bench, effectively avoiding the trouble of the tester using the adapter. At the same time, the wiring on the existing tray 1 connected to the test machine is replaced with a quick connector 6. There is no need for the tester to operate and connect multiple wirings on the machine. The connection between the tray 1 test fixture and the test machine can be established through the quick connector 6, reducing the time for the test fixture to be put on and off the machine. Through the two structural optimizations, the ATE test time of the test fixture tray 1 can be effectively reduced, thereby effectively improving the operating efficiency of the production line, saving about 5S / PCS time, and the production capacity can be increased by about 300-500PCS / H.

[0027] In order to cooperate with the use of the test fixture tray 1, the user can integrate the USB interfaces on the operating table so that all USB interfaces can be plugged and unplugged together on the USB connector 4, thereby reducing the USB connection test time. In addition, the user can also use other structures that can be quickly plugged and unplugged instead of the quick connector 6 to achieve rapid loading and unloading of the test fixture tray 1. It should be noted that a part of the quick connector 6 is connected to the test fixture tray 1, and the other part is connected to the test machine for establishing a connection with the test fixture tray 1.

[0028] The method for using the upper and lower machine components of the anti-damage integrated plug-in ATE test fixture is applied to the upper and lower machine components of the anti-damage integrated plug-in ATE test fixture, including:

[0029] Place the tray 1 on the workbench, and directly insert the USB connector into the first groove 2 and the second groove 3 to connect with the USB connector 4, so as to quickly enter the test phase and avoid scratches caused by getting on and off the test machine, resulting in poor product appearance;

[0030] The connected tray 1 is placed on the testing machine, and the connection is quickly established between the tray 1 and the testing machine through the quick connector 6 to complete the test.

[0031] The standard parts used in the present invention can all be purchased from the market, and the special-shaped parts can be customized according to the description and the drawings. The specific connection methods of each part adopt conventional means such as mature bolts, rivets, welding, etc. in the prior art. The machinery, parts and equipment all adopt conventional models in the prior art, and the circuit connection adopts the conventional connection method in the prior art, which will not be described in detail here. The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in this field.

[0032] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. "Multiple" means two or more, unless otherwise clearly and specifically defined.

[0033] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0034] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0035] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0036] In the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved, and other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other.

Claims

1. Anti-damage integrated plug-in ATE test fixture upper and lower machine components, characterized in that: include: A tray (1), wherein a USB connection portion is arranged on the top of the tray (1), and a quick connection portion is arranged on the side of the tray (1); A handle (5) is fixedly mounted on a side of the tray (1) away from the quick connection portion.

2. The damage-resistant integrated plug-in ATE test fixture upper and lower machine components according to claim 1, characterized in that: The USB connection portion comprises a first groove (2) formed on the tray (1) and a second groove (3) formed at the bottom of the first groove (2); a USB connector (4) is connected to the second groove (3).

3. The damage-resistant integrated plug-in ATE test fixture upper and lower machine components according to claim 1, characterized in that: The quick connection part comprises a quick connector (6) connected to the tray (1) and capable of being quickly plugged in and out.

4. A method for using the upper and lower machine components of an anti-damage integrated plug-in ATE test fixture, characterized in that: The damage-resistant integrated plug-in ATE test fixture upper and lower machine components used in any one of claims 1 to 3 include: Place the tray (1) on the workbench, and directly insert the USB connection end into the first groove (2) and the second groove (3) to connect with the USB connector (4) so ​​as to quickly enter the test phase and avoid scratches caused by getting on and off the test machine, which may result in a poor product appearance; The connected tray (1) is placed on the testing machine, and the connection is quickly established between the tray and the testing machine via the quick connector (6) to complete the test.