Method and device for testing bimetallic strip of circuit breaker

Abstract

The invention relates to the technical field of testing of parts of low-voltage apparatuses, and discloses a method and a device for testing bimetallic strips of a circuit breaker. The test method for the bimetallic strip of the circuit breaker comprises the following steps: step 10, assembling and fixing a to-be-tested assembly, including assembling and fixing the bimetallic strip, a flexible connection structure, an operating mechanism and a moving contact in a connection mode in the circuit breaker; step 20, connecting the to-be-tested assembly with a test circuit, and obtaining a real-time test posture of the bimetallic strip; and step 30, calculating thermal deformation data of the bimetallic strip according to the test posture and the initial posture. According to the test method for the bimetallic strip of the circuit breaker, the connection relation of the bimetallic strip in the circuit breaker is simulated, the test is carried out in the state, it is guaranteed that thermal deformation data of the test position of the bimetallic strip is consistent with the actual application process, and then the circuit breaker with higher reliability can be obtained.

Description

Technical Field

[0001] The invention relates to the technical field of component testing of low-voltage electrical appliances, and in particular to a testing method for a bimetallic strip of a circuit breaker. Background Art

[0002] A circuit breaker is a switching device that can close, carry and interrupt current under normal circuit conditions and can close, carry and interrupt current under abnormal circuit conditions within a specified time.

[0003] The bimetallic strip is the core functional part of the thermal tripping system of the circuit breaker. Specifically, in the circuit breaker, Figure 1 As shown, one end of the bimetallic strip is connected to the wiring board (the wiring board is used to connect to the external circuit) and the arc-starting plate, and the other end is electrically connected to the moving contact installed on the operating mechanism through a soft connection structure. When the moving contact contacts the static contact of the circuit breaker, the circuit is connected. When an abnormal current appears in the circuit, the temperature of the bimetallic strip rises and the end connected to the soft connection mechanism is deformed and bent, thereby triggering the operating mechanism to trip, thereby achieving the breaking of the abnormal circuit. Figure 1 The operating mechanism in the figure does not show the U-shaped part, wherein the bimetallic strip deforms and applies force to the U-shaped part, thereby triggering the operating mechanism to trip.

[0004] It can be seen that the thermal deformation performance of the bimetallic strip will directly affect the reliability of the circuit breaker. Therefore, in the production process of the circuit breaker, the material, number of layers, size, structure and other parameters of the bimetallic strip will be studied, and its thermal deformation performance will be tested respectively. However, the applicant found that the thermal deformation data of the bimetallic strip during actual operation is different from the thermal deformation data during the test process, that is, the bimetallic strip selected by the existing test method will affect the reliability of the circuit breaker. Summary of the invention

[0005] An object of the present invention is to propose a testing method for a bimetallic strip of a circuit breaker, simulating the connection relationship of the bimetallic strip in the circuit breaker and performing a test in this state to ensure that the thermal deformation data of the test location of the bimetallic strip is consistent with the actual application process, thereby obtaining a circuit breaker with higher reliability.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] The test method of bimetallic strip of circuit breaker includes:

[0008] Step 10, assembling and fixing the component to be tested, including assembling and fixing the bimetallic strip, the flexible connection structure, the operating mechanism and the moving contact in a connection manner in the circuit breaker;

[0009] Step 20, connecting the component to be tested to a test circuit to obtain a real-time test posture of the bimetallic strip;

[0010] Step 30, calculating the thermal deformation data of the bimetallic strip according to the test posture and the initial posture.

[0011] As an optional solution, before proceeding to step 20, perform the following:

[0012] Step 15, adjusting the bimetallic strip to the initial posture.

[0013] As an optional solution, one end of the bimetallic strip connected to the soft connection structure is defined as the first end, and the other end is defined as the second end. The method of adjusting the bimetallic strip to the initial posture includes:

[0014] Acquire a first distance from the first end to a preset straight line, and acquire a second distance from the second end to the preset straight line;

[0015] The position of the bimetallic strip is adjusted according to the first distance and the second distance.

[0016] As an optional solution, when the difference between the first distance and the second distance is and remains for a preset time, the posture adjustment of the bimetallic strip is stopped.

[0017] As an optional solution, define one end of the bimetallic strip connected to the soft connection structure as the first end, and the other end as the second end. The method of obtaining the test posture in step 30 is: obtaining a third distance between the first end and a preset straight line.

[0018] As an optional solution, after completing step 30, the following further steps are included:

[0019] Step 40, disconnecting the component to be tested from the test circuit and cooling the bimetallic strip to room temperature;

[0020] Step 50, repeat step 30.

[0021] As an optional solution, the method of fixing the component to be tested is: fixing the end of the bimetallic strip away from the soft connection structure, and fixing the moving contact.

[0022] As an optional solution, assembling the component to be tested also includes connecting an arc starting plate and a terminal plate to the bimetallic strip.

[0023] Another object of the present invention is to provide a testing device for a bimetallic strip of a circuit breaker. By applying the above-mentioned testing method for a bimetallic strip of a circuit breaker, the test result of the bimetallic strip is consistent with the actual application process, thereby facilitating the acquisition of a circuit breaker with higher reliability.

[0024] To achieve this object, the present invention adopts the following technical solutions:

[0025] A test device for a bimetallic strip of a circuit breaker, using the test method for a bimetallic strip, the test device for a bimetallic strip of a circuit breaker comprises:

[0026] frame;

[0027] A first clamping assembly, mounted on the frame and used to clamp the moving contact;

[0028] A second clamping assembly, mounted on the frame and used to clamp an end of the bimetallic strip away from the flexible connection structure;

[0029] The detection component is installed on the frame and is used to obtain the posture of the bimetallic strip.

[0030] As an optional solution, it also includes an adjustment drive component, the second clamping component is connected to the output end of the adjustment drive component, the adjustment drive component is electrically connected to the detection component, and is used to adjust the posture of the bimetallic strip.

[0031] As an optional solution, the detection component includes:

[0032] A first bracket, mounted on the frame;

[0033] A first sensor, mounted on the first bracket, the first sensor being used to detect a distance between the first sensor and the first end of the bimetallic strip;

[0034] The second sensor is mounted on the first bracket. The first sensor and the second sensor are arranged along a preset straight line. The second sensor is used to detect the distance between the second sensor and the second end of the bimetallic strip.

[0035] As an optional scheme, a limiting groove and a slot are provided on the first clamping assembly, the limiting groove is configured to clamp the moving contact, and the slot is configured to be connected to the terminal of the external test circuit. A conductor is also provided in the first clamping assembly, one end of the conductor extends to the inner wall of the limiting groove, and the other end extends to the side wall of the slot.

[0036] As an optional solution, the first clamping assembly is detachably connected to the frame, and the second clamping assembly is detachably connected to the frame.

[0037] The beneficial effects of the present invention are:

[0038] Test method for bimetallic strip of circuit breaker:

[0039] (1) By first assembling and fixing the bimetallic strip, the flexible connection structure, the operating mechanism and the moving contact in the connection mode in the circuit breaker, the test process simulates the stress state of the bimetallic strip when it is actually applied to the circuit breaker. That is to say, the test method of the present invention not only takes into account the material and structure of the bimetallic strip itself, but also takes into account the factors that may affect the thermal deformation data of the bimetallic strip when it is applied to the circuit breaker, thereby ensuring that the thermal deformation data of the bimetallic strip obtained by the test is consistent with the thermal deformation data in the actual application, thereby providing more reliable data support for the manufacture of the circuit breaker, and ensuring that the reliability of the finally manufactured circuit breaker is higher.

[0040] (2) Before the component to be tested is connected to the test circuit, the bimetallic strip is adjusted to its initial posture to compensate for the error caused by the assembly process, thereby ensuring that the calculated thermal deformation data is more reliable.

[0041] (3) Whether the bimetallic strip is adjusted to its initial position is determined based on the difference in distances from the two ends of the bimetallic strip to the preset straight lines. This is not only easy to implement, but also makes the result easier to distinguish and confirm.

[0042] (4) By determining whether the bimetallic strip is adjusted to a preset state after the difference between the first distance and the second distance is maintained for a preset time, unstable factors in the bimetallic strip posture adjustment process are eliminated, thereby avoiding malfunctions and improving the anti-interference ability during the test process.

[0043] The bimetallic strip testing device of the present invention applies the bimetallic strip testing method of the above-mentioned circuit breaker, fixes one end of the bimetallic strip away from the soft connection structure by the second clamping component, and clamps the moving contact by the first clamping component, so as to fix the component to be tested in its connection mode in the circuit breaker, thereby ensuring that the test data of the bimetallic strip is consistent with the data when it is actually used in the circuit breaker, thereby providing more reliable data support for the manufacture of the circuit breaker, and ensuring that the reliability of the finally manufactured circuit breaker is higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 It is a partial structural diagram of the circuit breaker;

[0045] Figure 2 is a schematic structural diagram of a bimetallic strip testing device provided in an embodiment of the present invention;

[0046] Figure 3 It is a partial structural schematic diagram of the bimetallic strip testing device provided by an embodiment of the present invention when the component to be tested is not fixed;

[0047] Figure 4 It is a schematic diagram of the partial structure of the bimetallic strip testing device provided by an embodiment of the present invention after fixing the component to be tested;

[0048] Figure 5is a schematic structural diagram of a second clamping assembly provided in an embodiment of the present invention;

[0049] Figure 6 It is a schematic structural diagram of a first clamping assembly provided in an embodiment of the present invention.

[0050] In the figure:

[0051] 100, component to be tested; 101, bimetallic strip; 102, flexible connection structure; 103, operating mechanism; 104, moving contact; 105, terminal block; 106, arc starting plate;

[0052] 10. Rack;

[0053] 20. Second clamping assembly; 21. Clamping member; 211. Clamping groove; 212. Shaft hole; 213. Through hole; 22. Pressing member; 23. Limiting member;

[0054] 30. First clamping assembly; 31. Base; 311. Limiting groove; 312. Slot; 313. Threaded hole; 32. Press plate; 321. Through hole; 33. Connector; 34. Conductor;

[0055] 40. Detection component; 41. First bracket; 411. Long hole; 42. First sensor; 43. Second sensor;

[0056] 50. Adjusting driving assembly; 51. Rotating driving source; 52. Second bracket;

[0057] 60. Insulation cover;

[0058] 70. Computer;

[0059] 80. Electric cabinet;

[0060] 90. Wiring assembly; 91. Wiring barrel; 92. Pressing member. DETAILED DESCRIPTION

[0061] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only the parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0062] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0063] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0064] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0065] This embodiment provides a method for testing a bimetallic strip of a circuit breaker. Figure 2-Figure 4 As shown, it includes:

[0066] Step 10, assembling and fixing the component to be tested 100, including assembling and fixing the bimetallic strip 101, the soft connection structure 102, the operating mechanism 103 and the moving contact 104 in a connection manner in the circuit breaker;

[0067] Step 20, connecting the component to be tested 100 to the test circuit to obtain the real-time test posture of the bimetallic strip 101;

[0068] Step 30, calculating the thermal deformation data of the bimetallic strip 101 according to the test posture and the initial posture.

[0069] The testing method of the bimetallic strip of the circuit breaker of the present embodiment is to first assemble and fix the bimetallic strip 101, the soft connection structure 102, the operating mechanism 103 and the moving contact 104 in the connection mode in the circuit breaker, so that the testing process simulates the stress state of the bimetallic strip 101 when it is actually applied to the circuit breaker. That is to say, the testing method of the present invention not only considers the material and structure of the bimetallic strip 101 itself, but also considers the factors that may affect the thermal deformation data of the bimetallic strip 101 when it is applied to the circuit breaker, thereby ensuring that the thermal deformation data of the bimetallic strip 101 obtained by the test is consistent with the thermal deformation data in the actual application, thereby providing more reliable data support for the manufacture of the circuit breaker, and ensuring that the reliability of the finally manufactured circuit breaker is higher.

[0070] It should be noted that the "posture" in the initial posture and the test posture includes the shape of the bimetallic strip 101 itself and / or its position in space, so the deformation data of the bimetallic strip 101 can be calculated based on this. In this embodiment, the initial posture of the bimetallic strip 101 is located in a vertical plane. In other embodiments, the initial posture may also be that the bimetallic strip 101 is located in a horizontal plane.

[0071] In the test circuit, the magnitude of the current, the change of the current over time, etc. can be flexibly set according to the needs. During the test, the real-time test posture will change with the change of the current, so the deformation data calculated by the real-time test posture and the initial posture is actually a curve of the deformation of the bimetallic strip 101 with time / current.

[0072] In addition, the actual maximum deformation of the bimetallic strip 101 may be greater than the deformation required to trigger the tripping of the operating mechanism 103. In order to fully test the performance of the bimetallic strip 101 and avoid the tripping of the operating mechanism 103 during the testing of the bimetallic strip 101, in this embodiment, the operating mechanism 103 in the component to be tested 100 does not contain a component for being triggered by the bimetallic strip 101, that is, it does not contain a U-shaped piece.

[0073] In step 10, in order to more accurately simulate the stress state of the bimetallic strip 101 in the circuit breaker, the assembly of the component to be tested 100 also includes connecting the arc-starting plate 106 and the terminal block 105 to the bimetallic strip 101. Specifically, Figure 4As shown, in the component to be tested 100, the moving contact 104 is connected to the operating mechanism 103, the two ends of the bimetallic strip 101 are defined as the first end and the second end respectively, the two ends of the soft connection structure 102 are electrically connected to the moving contact 104 and the first end of the bimetallic strip 101 respectively, and the arc-starting plate 106 and the terminal block 105 are fixedly connected to the two sides of the second end of the bimetallic strip 101 respectively. The moving contact 104 is used to be electrically connected to one end of the test circuit, and the terminal block 105 is used to be electrically connected to the other end of the test circuit. It should be noted that the specific connection method of the terminal block 105 and the test circuit can also adopt the connection method of the terminal block 105 with the terminal of the circuit breaker when it is in the circuit breaker.

[0074] In step 10, in order to simulate the connection relationship of the component under test 100 in the circuit breaker, the specific fixing method of the component under test 100 during the test process is: the second end of the bimetallic strip 101, the portion connecting the arc-starting plate 106 and the second end, and the portion connecting the terminal block 105 and the second end are fixed as a whole. At the same time, the moving contact 104 is fixed.

[0075] There may be installation errors during the process of fixing the component to be tested 100, resulting in the bimetallic strip 101 not being accurately in the initial posture before being connected to the test circuit, which in turn causes deviations in subsequent calculation results.

[0076] In this regard, the test method of the bimetallic strip of the circuit breaker in this embodiment further includes: before the component to be tested 100 is connected to the test circuit, step 15 is performed to adjust the bimetallic strip 101 to an initial posture. This step strictly ensures that the bimetallic strip 101 is in an initial posture before the test circuit is connected, compensates for the error generated during the assembly and fixing process of the component to be tested 100, and further ensures that the calculated thermal deformation data is more reliable.

[0077] Specifically, the method of adjusting the bimetallic strip 101 to the initial posture includes:

[0078] Obtain a first distance from the first end to the preset straight line, and obtain a second distance from the second end to the preset straight line;

[0079] The position of the bimetallic strip 101 is adjusted according to the first distance and the second distance.

[0080] When the difference between the first distance and the second distance is 0, it indicates that the bimetallic strip 101 is parallel to the preset straight line, and further indicates that the bimetallic strip 101 is adjusted to the initial posture.

[0081] In the test method of this embodiment, the difference in distances from the two ends of the bimetallic strip 101 to the preset straight line is used to determine whether the bimetallic strip 101 is adjusted to the initial posture, which is not only easy to implement, but also easier to distinguish and confirm the result. Specifically, the preset straight line is a straight line parallel to the midline of the width of the bimetallic strip 101 in the initial position.

[0082] In this embodiment, the position of the first end and the second end of the bimetallic strip 101 can be detected by sensors respectively, thereby obtaining the first distance and the second distance. Specifically, the preset straight line is a straight line along the vertical direction, and two sensors are arranged on the preset straight line, one of which detects the first distance to the first end, and the other detects the second distance to the second end. By comparing the difference between the first distance and the second distance in real time, the position of the bimetallic strip 101 can be adjusted accordingly.

[0083] In this embodiment, the posture of the bimetallic strip 101 can be adjusted by adjusting the driving assembly 50 to drive the bimetallic strip 101 to rotate around a straight line in the horizontal direction, thereby finally adjusting the bimetallic strip 101 to a vertical plane.

[0084] Preferably, when the difference between the first distance and the second distance is 0 and is maintained for a preset time, the posture adjustment of the bimetallic strip 101 is stopped. Such a setting eliminates the unstable factors of the bimetallic strip 101 during the posture adjustment process, thereby avoiding malfunction and improving the anti-interference ability during the test process. Optionally, the preset time can be 1s, 2s, 3s, 4s, 5s, etc., which are not specifically limited here.

[0085] In step 30, the test posture is obtained by obtaining the third distance between the first end and the preset straight line. Since the second end of the bimetallic strip 101 is in a fixed state, the first end of the bimetallic strip 101 will bend under the action of the test circuit, so the deformation data of the bimetallic strip 101 can be calculated by only detecting the position change of the first end. In this embodiment, the parameter characterizing the test posture of the bimetallic strip 101 (the third distance) and the parameter characterizing the adjustment of the initial posture of the bimetallic strip 101 (the first distance) are both the distances from the first end of the bimetallic strip 101 to the preset straight line, so they can be realized through the same detection structure, thereby simplifying the structural configuration required for the test and reducing the test cost.

[0086] In this embodiment, after completing step 30 once and calculating the deformation data once, the following steps are also included:

[0087] Step 40, disconnecting the component under test 100 from the test circuit and cooling the bimetallic strip 101 to room temperature;

[0088] Step 50, repeat step 30.

[0089] By repeating the test two or more times, the deformation data can be averaged to ensure the reliability of the test results.

[0090] In summary, the testing method of the bimetallic strip of the circuit breaker in this embodiment includes:

[0091] Step 10, assembling and fixing the component to be tested 100, including assembling and fixing the bimetallic strip 101, the flexible connection structure 102, the operating mechanism 103, the moving contact 104, the terminal block 105 and the arc-starting plate 106 in a connection manner in the circuit breaker;

[0092] Step 15, obtaining a first distance from the first end to a preset straight line, and obtaining a second distance from the second end to the preset straight line; adjusting the position of the bimetallic strip 101 according to the first distance and the second distance until the difference between the first distance and the second distance is 0 and maintained for a preset time;

[0093] Step 20, connecting the component to be tested 100 to the test circuit to obtain the real-time test posture of the bimetallic strip 101;

[0094] Step 30, calculating the thermal deformation data of the bimetallic strip 101 according to the test posture and the initial posture.

[0095] Step 40, disconnecting the component under test 100 from the test circuit and cooling the bimetallic strip 101 to room temperature;

[0096] Step 50, repeat step 30.

[0097] This embodiment further provides a test device for a bimetallic strip of a circuit breaker, which is used to implement the above-mentioned test method for a bimetallic strip, specifically:

[0098] like Figure 2-Figure 3As shown, the test device of the bimetal strip of the circuit breaker includes a frame 10, a second clamping assembly 20, a first clamping assembly 30, a detection assembly 40, a test circuit (not shown in the figure) and a computer 70. Among them, the first clamping assembly 30 is installed on the frame 10 and is used to clamp the moving contact 104. The second clamping assembly 20 is installed on the frame 10 and is used to clamp the end of the bimetal strip 101 away from the soft connection structure 102 (i.e., the second end of the bimetal strip 101). The detection assembly 40 is installed on the frame 10 and is used to obtain the posture of the bimetal strip 101. Specifically, the detection assembly 40 can obtain the initial posture and real-time test posture of the bimetal strip 101. The test circuit is used to connect with the component to be tested 100 and provide a preset current. Specifically, the terminals at both ends of the test circuit are electrically connected to the second end of the bimetal strip 101 and the moving contact 104 respectively. The detection assembly 40 and the test circuit are both electrically connected to the computer 70. In this embodiment, the computer 70 includes a data acquisition and processing module and a display. The data acquisition and processing module can obtain the current change information provided by the test circuit, and can also obtain the initial posture information and test posture information of the bimetallic strip 101 detected by the detection component 40. The data acquisition and processing module can also process the current change information, the initial posture information, and the test posture information, and make a curve of the deformation amount of the bimetallic strip 101 changing with time / current (i.e., thermal deformation data). The display can display the thermal deformation data for user use and analysis.

[0099] The test device for the bimetallic strip of the circuit breaker of this embodiment fixes the end of the bimetallic strip 101 away from the soft connection structure 102 by the second clamping component 20, and clamps the moving contact 104 by the first clamping component 30, so as to fix the component to be tested 100 in its connection mode in the circuit breaker, thereby ensuring that the test data of the bimetallic strip 101 is consistent with the data when it is actually used in the circuit breaker, thereby providing more reliable data support for the manufacture of the circuit breaker, and ensuring that the reliability of the finally manufactured circuit breaker is higher.

[0100] like Figure 3 and Figure 4 As shown, the detection assembly 40 includes a first bracket 41, a first sensor 42, and a second sensor 43. The first bracket 41 is mounted on the frame 10, the first sensor 42 is mounted on the first bracket 41, the first sensor 42 is used to detect the distance between it and the first end of the bimetallic strip 101, the second sensor 43 is mounted on the first bracket 41, the first sensor 42 and the second sensor 43 are arranged along a preset straight line, and the second sensor 43 is used to detect the distance between it and the second end of the bimetallic strip 101. In this embodiment, the first sensor 42 and the second sensor 43 can both be laser position sensors. In other embodiments, the first sensor 42 and the second sensor 43 can also be other sensors capable of realizing distance detection, which are not specifically limited here.

[0101] like Figure 3 As shown, the test device of the bimetal strip of the circuit breaker also includes an adjustment drive component 50, the second clamping component 20 is connected to the output end of the adjustment drive component 50, the adjustment drive component 50 is electrically connected to the detection component 40, and is used to adjust the posture of the bimetal strip 101. That is, the adjustment drive component 50 can adjust the position of the bimetal strip 101 according to the difference between the first distance and the second distance detected by the detection component 40, until the bimetal strip 101 is adjusted to the vertical direction. In this embodiment, the adjustment drive component 50 includes a rotation drive source 51, and the second clamping component 20 is connected to the output end of the rotation drive source 51. Optionally, the rotation drive source 51 can be a servo motor. Further, the adjustment drive component 50 also includes a second bracket 52, the second bracket 52 is installed on the frame 10, and the rotation drive source 51 is fixed on the second bracket 52. By setting the second bracket 52, the rotation drive source 51 can be adjusted to an appropriate height, and then the second clamping component 20 can be adjusted to an appropriate height. In this embodiment, a avoidance hole is provided on the second bracket 52 , the rotation driving source 51 is installed on one side of the second bracket 52 , and the output end passes through the avoidance hole and extends to the other side of the second bracket 52 to facilitate connection with the second clamping assembly 20 .

[0102] like Figure 3 As shown, the first bracket 41 is constructed in an L-shape and includes a horizontal portion and a vertical portion, wherein the horizontal portion is mounted on the frame 10 by fasteners, and the first sensor 42 and the second sensor 43 are mounted on the vertical portion. Specifically, a long hole 411 extending vertically is provided on the vertical portion, and the first sensor 42 and the second sensor 43 are fixed at the long hole 411 by fasteners, respectively. The long hole 411 is provided to facilitate the arrangement of the first sensor 42 and the second sensor 43 mounted on the first bracket 41 in the vertical direction. In addition, when the height dimensions of the bimetallic strip 101 to be tested are different, it is also convenient to flexibly adjust the positions of the first sensor 42 and the second sensor 43.

[0103] like Figure 5As shown, the first clamping assembly 30 includes a base 31, a pressure plate 32 and a connecting member 33, wherein the base 31 is installed on the frame 10, a limiting groove 311 is provided at the upper end of the base 31, and the pressure plate 32 is covered on the base 31 and connected to the base 31 through the connecting member 33. In actual use, the moving contact 104 is installed in the limiting groove 311, and the moving contact 104 is locked in the limiting groove 311 by the pressure plate 32. In this embodiment, the connecting member 33 is a bolt, a through hole 321 is provided on the pressure plate 32, and a threaded hole 313 is provided on the base 31. The bolt is connected to the threaded hole 313 after passing through the through hole 321. The structure is simple and easy to disassemble and assemble, which can improve the convenience of disassembly and assembly of the moving contact 104, and thus can improve the efficiency of the test. It should be noted that the base 31 and the pressure plate 32 are both made of insulating materials.

[0104] In this embodiment, the first clamping assembly 30 is detachably connected to the frame 10. Specifically, the base 31 is detachably connected to the frame 10, so when it is necessary to clamp the moving contact 104 of the component 100 to be tested of different sizes, the first clamping assembly 30 of matching size can be selected and installed on the frame 10. Specifically, the base 31 is constructed as an inverted "T"-shaped structure, and the two side wings of the inverted "T"-shaped structure are respectively installed on the frame 10 by fasteners. In other embodiments, the specific structure of the first clamping assembly 30 is not limited, as long as it can reliably fix the moving contact 104 and can be detachably connected to the frame 10.

[0105] like Figure 5 As shown, the first clamping assembly 30 also includes a conductor 34, and a slot 312 is also provided on the base 31, wherein one end of the conductor 34 extends to the inner wall of the limit groove 311, and the other end extends to the side wall of the slot 312, and the slot 312 is configured to be connected to the terminal of the external test circuit. That is to say, after the moving contact 104 is installed in the limit groove 311, the terminal of the test circuit is inserted into the slot 312, and the electrical connection between the moving contact 104 and the terminal can be achieved. When it is necessary to replace a different component 100 to be tested, there is no need to re-disassemble the terminal of the test circuit, thereby improving the test efficiency. In this embodiment, the slot 312 is a square structure. In other embodiments, the specific shape of the slot 312 is not limited, as long as it matches the terminal of the test circuit. Optionally, the conductor 34 can be a wire buried in the base 31.

[0106] In order to realize the connection between the terminal block 105 and the other terminal of the test circuit, as shown in FIG. Figure 4As shown, the test device for the bimetallic strip of the circuit breaker also includes a wiring assembly 90. Specifically, the wiring assembly 90 includes a wiring barrel 91 and a pressing member 92. When wiring, the end of the terminal block 105 and the terminal of the test circuit are both extended into the wiring barrel 91, and the pressing member 92 penetrates the side wall of one side of the wiring barrel 91 and presses the terminal block 105 and the terminal against the side wall of the other side of the wiring barrel 91. The method of the above-mentioned wiring assembly 90 is consistent with the connection method of the terminal block 105 and the terminal in the circuit breaker, so that the state of the bimetallic strip 101 in the circuit breaker can be accurately simulated, thereby improving the reliability of the test results. Of course, in other embodiments, the terminal block 105 and the terminal of the test circuit can also be connected in other ways, which are not specifically limited here.

[0107] like Figure 4 and Figure 6 As shown, the second clamping assembly 20 includes a clamping member 21 and a pressing member 22, wherein the clamping member 21 is used to connect with the frame 10, specifically, the clamping member 21 is connected with the rotating drive source 51, and then connected with the frame 10 at a distance. A clamping groove 211 is provided on the upper side of the clamping member 21, and a through hole 213 is provided on the clamping side wall, and the through hole 213 is a threaded hole. The second end of the bimetallic strip 101, the portion where the terminal block 105 is connected to the bimetallic strip 101, and the portion where the arc-starting plate 106 is connected to the bimetallic strip 101 are inserted into the clamping groove 211, and the pressing member 22 is threadedly connected to the through hole 213 and abuts against the terminal block 105 or the arc-starting plate 106, thereby achieving the fixation of the bimetallic strip 101.

[0108] like Figure 6 As shown, the second clamping assembly 20 also includes a limit member 23, which is arranged on one side of the clamping groove 211. The limit member 23 is configured to be abutted by the bimetallic strip 101. By setting the limit member 23, the bimetallic strip 101 can be limited along its width direction, thereby ensuring that the first sensor 42 and the second sensor 43 can detect the position of the bimetallic strip 101 along the width center.

[0109] In this embodiment, the second clamping assembly 20 is detachably connected to the frame 10. Specifically, the rotation driving source 51 is detachably connected to the clamping member 21, so when it is necessary to test the components 100 of different sizes, it is convenient to replace the second clamping assembly 20 of the corresponding size. Figure 6 As shown, an axial hole 212 is provided on the clamping member 21, and the output shaft of the rotation driving source 51 is installed in the axial hole 212 and fixed by a key connection. In other embodiments, the specific connection method between the output shaft of the rotation driving source 51 and the clamping member 21 is not limited.

[0110] like Figure 2As shown, the test device for the bimetallic strip of the circuit breaker also includes a thermal insulation cover 60, which is connected to the frame 10, and covers the second clamping assembly 20, the first clamping assembly 30, the detection assembly 40, and the adjustment drive assembly 50 inside, which can not only have a thermal insulation effect to prevent the temperature of the bimetallic strip 101 from being affected by the external temperature and ensure the accuracy of the test results, but also can protect the above structure to prevent the above components from being damaged due to user misoperation.

[0111] like Figure 2 As shown, the bimetallic strip test device of the circuit breaker also includes an electric cabinet 80, which is used to supply power for the operation of the bimetallic strip test device of the circuit breaker. Specifically, the electric cabinet 80 can supply power to the detection component 40, the computer 70, the adjustment drive component 50 and the test circuit.

[0112] Obviously, the above embodiments of the present invention are only examples for clearly explaining the present invention, and are not intended to limit the implementation of the present invention. For those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation and application scope, and the content of this specification should not be understood as limiting the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A method for testing a bimetallic strip of a circuit breaker, characterized in that: include: Step 10, assembling and fixing the component to be tested (100), including assembling and fixing the bimetallic strip (101), the soft connection structure (102), the operating mechanism (103) and the moving contact (104) in a connection manner in a circuit breaker; Step 20, connecting the component to be tested (100) to a test circuit to obtain a real-time test posture of the bimetallic strip (101); Step 30, calculating the thermal deformation data of the bimetallic strip (101) according to the test posture and the initial posture.

2. The method for testing the bimetallic strip of a circuit breaker according to claim 1, characterized in that: Before proceeding to step 20, do: Step 15, adjusting the bimetallic strip (101) to the initial posture.

3. The method for testing the bimetallic strip of a circuit breaker according to claim 2, characterized in that: One end of the bimetallic strip (101) connected to the soft connection structure (102) is defined as the first end, and the other end is defined as the second end. The method of adjusting the bimetallic strip (101) to the initial posture includes: Acquire a first distance from the first end to a preset straight line, and acquire a second distance from the second end to the preset straight line; The position of the bimetallic strip (101) is adjusted according to the first distance and the second distance.

4. The method for testing the bimetallic strip of a circuit breaker according to claim 3, characterized in that: When the difference between the first distance and the second distance reaches 0 and remains at that value for a preset time, the posture adjustment of the bimetallic strip (101) is stopped.

5. The method for testing the bimetallic strip of a circuit breaker according to claim 1, characterized in that: One end of the bimetallic strip (101) connected to the soft connection structure (102) is defined as the first end, and the other end is defined as the second end. The method for obtaining the test posture in step 30 is: obtaining a third distance between the first end and a preset straight line.

6. The method for testing the bimetallic strip of a circuit breaker according to any one of claims 1 to 5, characterized in that: After completing step 30, the following steps are also included: Step 40, disconnecting the component to be tested (100) from the test circuit, and cooling the bimetallic strip (101) to room temperature; Step 50, repeat step 30.

7. The method for testing a bimetallic strip of a circuit breaker according to any one of claims 1 to 5, characterized in that: The method of fixing the component to be tested (100) is: fixing one end of the bimetallic strip (101) away from the soft connection structure (102), and fixing the moving contact (104).

8. The method for testing a bimetallic strip of a circuit breaker according to any one of claims 1 to 5, characterized in that: When assembling the component to be tested (100), the process also includes connecting an arc starting plate (106) and a terminal plate (105) to the bimetallic strip (101).

9. A test device for a bimetallic strip of a circuit breaker, characterized in that: The bimetallic strip testing method according to any one of claims 1 to 8 is applied, and the bimetallic strip testing device of the circuit breaker comprises: Frame (10); A first clamping assembly (30) mounted on the frame (10) and used for clamping the moving contact (104); A second clamping assembly (20) is mounted on the frame (10) and is used to clamp an end of the bimetallic strip (101) away from the flexible connection structure (102); A detection component (40) is mounted on the frame (10) and is used to obtain the posture of the bimetallic strip (101).

10. The test device for the bimetallic strip of the circuit breaker according to claim 9, characterized in that: It also comprises an adjusting drive component (50), the second clamping component (20) is connected to the output end of the adjusting drive component (50), the adjusting drive component (50) is electrically connected to the detection component (40), and is used to adjust the posture of the bimetallic strip (101).

11. The testing device for the bimetallic strip of the circuit breaker according to claim 9, characterized in that: The detection component (40) comprises: A first bracket (41) mounted on the frame (10); A first sensor (42) is mounted on the first bracket (41), and the first sensor (42) is used to detect the distance between the first sensor and the first end of the bimetallic strip (101); The second sensor (43) is mounted on the first bracket (41); the first sensor (42) and the second sensor (43) are arranged along a preset straight line; the second sensor (43) is used to detect the distance between the second end of the bimetallic strip (101) and the second sensor (43).

12. The testing device for the bimetallic strip of the circuit breaker according to claim 9, characterized in that: The first clamping assembly (30) is provided with a limiting groove (311) and a slot (312), the limiting groove (311) being configured to clamp the moving contact (104), and the slot (312) being configured to be connected to a terminal of an external test circuit, and a conductor (34) is also provided in the first clamping assembly (30), one end of the conductor (34) extending to an inner wall of the limiting groove (311), and the other end extending to a side wall of the slot (312).

13. The testing device for the bimetallic strip of the circuit breaker according to claim 9, characterized in that: The first clamping assembly (30) is detachably connected to the frame (10), and the second clamping assembly (20) is detachably connected to the frame (10).

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