Testing device and method for electronic equipment

Abstract

The embodiment of the invention provides a device and a method for testing electronic equipment, relates to the field of testing, can greatly reduce the testing cost of parameters such as SAR (Synthetic Aperture Radar) values and the like, can simply and quickly determine the electronic equipment of which the parameters such as the SAR values and the like may not meet requirements, and has relatively high practicability. The device comprises a host, a test box and a test link. A plurality of devices to be tested are placed in the test box. The first end of the test link is in wireless communication connection with the plurality of to-be-tested devices, and the second end of the test link is connected with the host. The host is used for determining the total radiation power of the to-be-tested devices through the test link. And calculating a first discrete value according to the total radiation power of each to-be-tested device. And when the first discrete value is greater than a first preset value, calculating a first contribution value of each to-be-tested device according to the total radiation power of each to-be-tested device. And identifying the to-be-tested equipment of which the first contribution value is greater than a second preset value as not passing the test.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of testing, and in particular to a testing device and method for electronic equipment. Background Art

[0002] In production line testing, the testing cost of some parameters of electronic equipment is very high. Taking the SAR value of electronic equipment as an example, SAR (Specific Absorption Rate) refers to the electromagnetic power absorbed or consumed by a unit mass of human tissue, which is used to measure the impact of electromagnetic waves on the human body. For electronic equipment, the larger the SAR value, the greater the adverse effect on human health. Therefore, before electronic equipment leaves the factory, it is necessary to screen out electronic equipment whose SAR values ​​do not meet the requirements to reduce the risk of non-compliance with the SAR value of electronic equipment.

[0003] However, the solution of directly measuring parameters such as the SAR value of electronic equipment has a long measurement cycle and a complicated testing process, resulting in high testing costs and is not conducive to large-scale application. Summary of the invention

[0004] The embodiments of the present application provide a testing device and method for electronic devices, which can significantly reduce the testing cost of parameters such as SAR values, and simply and quickly determine electronic devices whose parameters such as SAR values ​​may not meet the requirements, and have high practicality.

[0005] In order to achieve the above-mentioned purpose, the embodiment of the present application adopts the following technical solution.

[0006] In a first aspect, a testing device for an electronic device is provided, comprising: a host, a test box, and a test link. The test box is used to place multiple devices under test. The first end of the test link is wirelessly connected to the multiple devices under test, and the second end of the test link is connected to the host. The host is used to determine the total radiation power of each device under test through the test link. A first discrete value is calculated according to the total radiation power of each device under test. When the first discrete value is greater than a first preset value, a first contribution value of each device under test is calculated according to the total radiation power of each device under test. The device under test whose first contribution value is greater than a second preset value is marked as failing the test. The first discrete value is used to indicate the degree of discreteness of the first parameter of each device under test. The first parameter is positively correlated with the total radiation power. The first contribution value of the first device under test is used to indicate the contribution of the first device under test to the first discrete value, and the first device under test is any device under test. The first preset value and the second preset value are both positive numbers.

[0007] Based on this solution, since the first parameter is positively correlated with the total radiated power, the first discrete value calculated according to the total radiated power of each device under test can reflect the degree of discreteness of the first parameter of each device under test. And since most of a batch of devices under test should meet the requirements of various parameters, that is, the first parameters of most devices under test have small differences, the devices under test that contribute more to the degree of discreteness (that is, the first contribution value is larger) can be screened out as devices whose first parameters may not meet the requirements, and marked as failed the test. In this way, the testing cost of parameters such as SAR values ​​can be greatly reduced, and electronic equipment whose parameters such as SAR values ​​may not meet the requirements can be simply and quickly determined, which has high practicality.

[0008] In a possible design, the electronic device test device further includes: a control link. The first end of the control link is connected to the host, and the second end of the control link is wirelessly connected to multiple devices under test. Therefore, the host is also used to control the device under test to enter a test state through the control link in response to receiving a test instruction. The device under test has the ability to receive radio frequency signals and the ability to transmit radio frequency signals in the test state.

[0009] In one possible design, the control link includes a router and a first antenna. The host is connected to the first antenna via the router. The first antenna is disposed in the test box and is in communication connection with each device under test. Therefore, the host is specifically used to control the device under test to enter a test state via the router and the first antenna in response to receiving a test instruction.

[0010] In a possible design, the test link includes a router, a comprehensive tester, a radio frequency switch board, and multiple second antennas. The host is connected to the multiple second antennas through the router, the comprehensive tester, and the radio frequency switch board in turn. The host is also connected to the radio frequency switch board. The multiple second antennas are arranged inside the test box and are wirelessly connected to each device under test. The router is used to realize communication between the host and the comprehensive tester. The comprehensive tester is used to receive the test case sent by the host and output the radio frequency signal corresponding to the test case. The radio frequency switch board is used to control the connection and disconnection between each second antenna and the comprehensive tester, and the connection and disconnection between each second antenna and the host.

[0011] In a possible design, the host is specifically used to measure the receiving power of each device under test at different positions in space through the test link. The gain of each device under test at different positions in space is determined based on the receiving power of each device under test at different positions in space. The transmitting power of each device under test at different positions in space is determined based on the gain of each device under test at different positions in space, the input power of the antenna in each device under test that is pre-stored, and the feeder loss of the antenna in each device under test that is pre-stored. The transmitting power of each device under test at different positions in space is integrated to obtain the total radiated power of each device under test.

[0012] In a possible design, the host is further configured to mark each device under test as having passed the test when the first discrete value is less than a first preset value.

[0013] In a possible design, the test box is an electromagnetic wave shielding box, and the inner wall of the test box is provided with an absorbing material for shielding electromagnetic waves.

[0014] In a possible design, one or more placement tables are provided in the test box, and the placement tables are used to place one or more devices to be tested.

[0015] In a possible design, the test box is provided with a switch door. The switch door is connected to the host through a cylinder. The host is also used to control the opening and closing of the switch door through the cylinder. When the switch door is opened, the device to be tested is allowed to pass through.

[0016] In a possible design, the first parameter is specific absorption rate. The first discrete value is variance or standard deviation.

[0017] In a second aspect, a method for testing an electronic device is provided, which is applied to a host in a testing device of an electronic device according to any one of the first aspects. The method comprises: determining the total radiation power of each device under test. Calculating a first discrete value according to the total radiation power of each device under test. The first discrete value is used to indicate the degree of discreteness of a first parameter of each device under test. The first parameter is positively correlated with the total radiation power. When the first discrete value is greater than a first preset value, calculating a first contribution value of each device under test according to the total radiation power of each device under test. The first contribution value of the first device under test is used to indicate the contribution of the first device under test to the first discrete value, and the first device under test is any device under test. The device under test whose first contribution value is greater than a second preset value is marked as failed. Both the first preset value and the second preset value are positive numbers.

[0018] In one possible design, before determining the total radiation power of each device under test, the method further includes: in response to receiving a test instruction, controlling the device under test to enter a test state.

[0019] In one possible design, determining the total radiated power of each device under test includes: obtaining the received power of each device under test at different positions in space. Determining the gain of each device under test at different positions in space based on the received power of each device under test at different positions in space. Determining the transmit power of each device under test at different positions in space based on the gain of each device under test at different positions in space, the pre-stored input power of the antenna in each device under test, and the pre-stored feeder loss of the antenna in each device under test. Integrating the transmit power of each device under test at different positions in space to obtain the total radiated power of each device under test.

[0020] In a possible design, after calculating the first discrete value according to the total radiation power of each device under test, the method further includes: when the first discrete value is less than a first preset value, marking each device under test as having passed the test.

[0021] In a third aspect, an electronic device is provided, the electronic device comprising one or more processors and one or more memories. The one or more memories are coupled to the one or more processors, and the one or more memories store computer instructions. When the one or more processors execute the computer instructions, the electronic device executes the test method of any electronic device in the second aspect.

[0022] In a fourth aspect, a chip system is provided, wherein the chip includes a processing circuit and an interface. The processing circuit is used to call and run a computer program stored in a storage medium from a storage medium, so as to perform any electronic device testing method of the second aspect.

[0023] In a fifth aspect, a computer-readable storage medium is provided, the computer-readable storage medium comprising computer instructions, and when the computer instructions are executed, the testing method of the electronic device as described in any one of the second aspects is executed.

[0024] In a sixth aspect, a computer program product is provided, wherein the computer program product includes instructions. When the computer program product runs on a computer, the computer can execute the test method of any electronic device as described in the second aspect according to the instructions.

[0025] It should be understood that the technical solutions provided in the second, third, fourth, fifth and sixth aspects above and their technical features can all correspond to the testing devices for electronic devices provided in the first aspect and its possible designs, and therefore the beneficial effects that can be achieved are similar and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application;

[0027] Figure 2 It is a schematic diagram of the relationship between a spherical coordinate system and a rectangular coordinate system;

[0028] Figure 3 A schematic diagram of a TRP curve and a SAR value curve of an electronic device provided in an embodiment of the present application;

[0029] Figure 4 A schematic diagram of a testing device for an electronic device provided in an embodiment of the present application;

[0030] Figure 5 A schematic diagram of another electronic device testing device provided in an embodiment of the present application;

[0031] Figure 6 A flowchart of a method for testing an electronic device provided in an embodiment of the present application;

[0032] Figure 7 A schematic diagram of the composition of an electronic device provided in an embodiment of the present application;

[0033] Figure 8 A schematic diagram of the composition of a chip system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] The words "first", "second" and "third" in the embodiments of the present application are used to distinguish different objects rather than to limit a specific order. In addition, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete way.

[0035] For ease of description, the following embodiments are introduced by taking the parameter of the electronic device as the SAR value as an example.

[0036] Excessively high SAR values ​​of electronic devices can affect human health. Therefore, SAR value testing is required for electronic devices before they leave the factory to screen out electronic devices with SAR values ​​that do not meet the requirements.

[0037] Generally speaking, directly measuring the SAR value of electronic devices is more intuitive and accurate. However, the solution of directly measuring the SAR value requires the use of expensive test equipment, and has defects such as a relatively long test cycle (usually 24 hours), complex test cases, manual participation in the test process, and a relatively complicated process, which is not suitable for large-scale testing scenarios.

[0038] In order to solve the above problems, an electronic device testing device and method provided in an embodiment of the present application can simply and quickly determine electronic devices whose parameters such as SAR values ​​may not meet the requirements at a low cost, and has high practicality.

[0039] In the embodiment of the present application, the electronic device to be tested refers to a device equipped with an antenna, such as a mobile phone, a tablet computer, a wearable device (such as a smart watch), a vehicle-mounted device, a laptop computer, a desktop computer, etc. Exemplary embodiments of the terminal device include but are not limited to a device equipped with Or portable terminals with other operating systems.

[0040] As an example, see Figure 1, is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0041] like Figure 1 As shown, the electronic device 100 may include a processor 101 and a communication module 102 , etc.

[0042] The processor 101 may include one or more processing units, for example, the processor 101 may include an application processor (AP), a modem processor, a graphics processor (GPU), an image signal processor (ISP), a controller, a memory, a video stream codec, a digital signal processor (DSP), a baseband processor, and / or a neural-network processing unit (NPU), etc. Different processing units may be independent devices or integrated in one or more processors 101.

[0043] The communication module 102 may include an antenna x, an antenna y, a mobile communication module 102A, and / or a wireless communication module 102B. For example, the communication module 102 includes the antenna x, the antenna y, the mobile communication module 102A, and the wireless communication module 102B.

[0044] The wireless communication function of the electronic device 100 can be implemented through the antenna x, the antenna y, the mobile communication module 102A, the wireless communication module 102B, the modem processor and the baseband processor.

[0045] Antenna x and antenna y are used to transmit and receive electromagnetic wave signals. Each antenna in the electronic device 100 can be used to cover a single or multiple communication frequency bands. Different antennas can also be reused to improve the utilization of the antennas. For example, antenna x can be reused as a diversity antenna for a wireless local area network. In some other embodiments, the antenna can be used in combination with a tuning switch.

[0046] The mobile communication module 102A can provide solutions for wireless communications including 2G / 3G / 4G / 5G, etc., applied to the electronic device 100. The mobile communication module 102A may include at least one filter, a switch, a power amplifier, a low noise amplifier (LNA), etc. The mobile communication module 102A may receive electromagnetic waves through the antenna x, and filter, amplify, and process the received electromagnetic waves, and transmit them to the modulation and demodulation processor for demodulation. The mobile communication module 102A may also amplify the signal modulated by the modulation and demodulation processor, and convert it into electromagnetic waves for radiation through the antenna x. In some embodiments, at least some of the functional modules of the mobile communication module 102A may be arranged in the processor 101. In some embodiments, at least some of the functional modules of the mobile communication module 102A may be arranged in the same device as at least some of the modules of the processor 101.

[0047] The wireless communication module 102B can provide wireless communication solutions including wireless local area networks (WLAN) (such as wireless fidelity (Wi-Fi) networks), bluetooth (BT), global navigation satellite system (GNSS), frequency modulation (FM), near field communication (NFC), infrared (IR), etc., which are applied to the electronic device 100. The wireless communication module 102B can be one or more devices integrating at least one communication processing module. The wireless communication module 102B receives electromagnetic waves via antenna y, modulates the frequency of the electromagnetic wave signal and performs filtering processing, and sends the processed signal to the processor 101. The wireless communication module 102B can also receive the signal to be sent from the processor 101, modulate the frequency of the signal, amplify it, and convert it into electromagnetic waves for radiation through the antenna y.

[0048] In some embodiments, the antenna x of the electronic device 100 is coupled to the mobile communication module 102A, and the antenna y is coupled to the wireless communication module 102B, so that the electronic device 100 can communicate with the network and other devices through wireless communication technology. The wireless communication technology may include global system for mobile communications (GSM), general packet radio service (GPRS), code division multiple access (CDMA), wideband code division multiple access (WCDMA), time-division code division multiple access (TD-SCDMA), long term evolution (LTE), BT, GNSS, WLAN, NFC, FM, and / or IR technology, etc. The GNSS may include a global positioning system (GPS), a global navigation satellite system (GLONASS), a Beidou navigation satellite system (BDS), a quasi-zenith satellite system (QZSS) and / or a satellite based augmentation system (SBAS).

[0049] The electronic device tested by the embodiment of the present application is introduced above. It should be understood that the structure illustrated in this embodiment does not constitute a specific limitation on the electronic device 100. In other embodiments, the electronic device 100 may include more or fewer components than shown in the figure, or combine some components, or split some components, or arrange the components differently. The components shown in the figure may be implemented in hardware, software, or a combination of software and hardware.

[0050] Based on the above introduction to the electronic device to be tested, the testing device for the electronic device provided in the embodiment of the present application is described below.

[0051] The test device of the electronic device is realized based on two factors. For ease of understanding, the two factors are first introduced here.

[0052] First, in order to control production costs and increase profits, the yield rate of electronic equipment produced by manufacturers is generally higher.

[0053] The yield rate refers to the proportion of electronic devices that meet the factory specifications among the electronic devices produced. The factory specifications may include SAR value, equivalent isotropic radiated power at a certain point in space, radiation intensity, hot spot distribution, radiation direction, etc. Among them, meeting the SAR value specification means that the SAR value of the electronic device is less than the SAR value specification.

[0054] In other words, most of the electronic equipment produced by manufacturers should comply with the SAR value indicators and other parameter indicators.

[0055] Secondly, the TRP (Total Radiated Power) of electronic equipment is positively correlated with parameters such as SAR value.

[0056] The TRP of an electronic device refers to the power value obtained by performing area integration and averaging on the transmission power of the entire radiation sphere of the electronic device. It can reflect the integral value of the radio frequency radiation power of the electronic device on the three-dimensional spherical surface of space, that is, the transmission characteristics of the electronic device in all directions.

[0057] A plurality of sampling points are set on the radiation sphere of the electronic device, and the transmission power of the plurality of sampling points is integrated and averaged to obtain the measured value of TRP. The specific process of calculating TRP is described below using the spherical coordinate system as an example.

[0058] Please refer to Figure 2 , is a schematic diagram of the relationship between a spherical coordinate system and a rectangular coordinate system. Figure 2 In the spherical coordinate system shown, the counterclockwise direction around the z-axis in the rectangular coordinate system is the direction of the φ-axis in the spherical coordinate system, and the clockwise direction around the origin O in the plane where the z-axis in the rectangular coordinate system is located is the direction of the θ-axis in the spherical coordinate system, and r represents the distance between the point and the origin O. In this way, the coordinates of any point A in space can be expressed by the three coordinates r, θ, and φ.

[0059] Place the radiation sphere of the electronic device in the spherical coordinate system, take a fixed r value, and take a sampling point every 15° along the φ axis and the θ axis. The measured value of TRP can be obtained by the following formula (1).

[0060]

[0061] Wherein, N is the number of sampling points on the θ axis, M is the number of sampling points on the φ axis, and EIRP is the equivalent isotropic radiated power (i.e., the aforementioned transmit power) at a certain point in space.

[0062] EIRP can be obtained by the following formula (2).

[0063] EIRP=P-loss+G Formula (2).

[0064] Among them, P is the input power of the antenna in the electronic device, loss is the feeder loss of the antenna, and G is the antenna gain.

[0065] Generally speaking, the antenna input power P and feeder loss loss are both known. Therefore, by measuring the antenna gain at each sampling point, the transmission power at each sampling point can be obtained, thereby obtaining the TRP of the electronic device.

[0066] The SAR value calculation formula is as follows (3).

[0067]

[0068] Wherein, σ is the conductivity of human tissue fluid, ρ is the density of human tissue fluid, and E is the radiated electric field. E can be obtained by the following formula (4).

[0069]

[0070] Based on the above formula (2), formula (3), and formula (4), the following formula (5) representing the relationship between EIRP and SAR can be obtained.

[0071]

[0072] Substituting formula (5) into formula (1) yields the following formula (6).

[0073]

[0074] Based on formula (6), it can be seen that the TRP of the electronic device is positively correlated with the SAR value. This conclusion can be verified through simulation experiments.

[0075] Please refer to Figure 3 , is a schematic diagram of a TRP curve and a SAR value curve of an electronic device provided in an embodiment of the present application. The horizontal axis is the electronic device serial number, 1 to 12 represent the electronic device with serial number 1 to the electronic device with serial number 12 respectively, the unit of the vertical axis is dBm, curve 1 is the TRP curve, and curve 2 is the SAR value curve.

[0076] Depend on Figure 3 It can be seen that the SAR value curve and the TRP curve have the same changing trend. In other words, the TRP of the electronic device is positively correlated with the SAR value.

[0077] Based on the above two factors, it should be understood that when testing whether the SAR values ​​of multiple electronic devices are suitable for the requirements, if the TRP of an electronic device is significantly different from the TRP of most electronic devices, the SAR value of the electronic device is likely to not meet the requirements. In other words, by measuring the consistency of the TRP of multiple electronic devices, the consistency of the SAR values ​​of multiple electronic devices can be determined, and then the electronic devices whose SAR values ​​do not meet the requirements can be determined.

[0078] It should also be understood that in addition to testing SAR values, the testing device and method for electronic devices provided in the embodiments of the present application are suitable for testing any parameters that are positively correlated with TRP, such as the above-mentioned EIRP, conducted power, antenna radiation direction of electronic devices, radiation intensity, hot spot distribution, etc. The embodiments of the present application are described using the testing SAR value as an example and will not be repeated later.

[0079] Based on the above two factors, the embodiment of the present application provides a testing device and method for electronic devices, which uses the TRP of the electronic device as the simulated SAR value, and screens out electronic devices with a large difference in simulated SAR values ​​from most electronic devices by measuring the dispersion of the simulated SAR values ​​of each electronic device, thereby screening out electronic devices whose SAR values ​​may not meet the requirements at a low cost, simply and quickly, and has high practicality. A detailed introduction is given below.

[0080] It should be noted that the electronic device testing device and method provided in the present application are mainly used to determine the electronic device whose SAR value may not meet the requirements among multiple electronic devices to be tested. Among them, multiple electronic devices to be tested refer to three or more electronic devices to be tested.

[0081] Please refer to Figure 4 , is a schematic diagram of a testing device for an electronic device provided in an embodiment of the present application. Figure 4 As shown, the electronic device test device includes a host 401, a test box 402, a test link 403, and a control link 404. The host 401 is connected to the test box 402 through the test link 403 and the control link 404 respectively. The control link 404 is connected to the electronic device 400 to be tested placed in the test box 402 by communication, and the test link 403 is connected to the electronic device 400 to be tested placed in the test box 402 by wireless communication. Among them, the wireless communication connection can include WIFI, Bluetooth, NFC (Near Field Communication, near field communication), etc., which are not limited here.

[0082] The test box 402 is used to place the electronic device 400 to be tested. In some possible implementations, the test box 402 may be a shielding box that can shield the interference of signals outside the box on the electronic device 400 to be tested, thereby improving the test error of the electronic device test device and improving the test accuracy.

[0083] A placement table for placing the electronic device 400 to be tested may be provided in the test box 402. In some possible implementations, a placement table may be provided in the test box 402, and a plurality of electronic devices to be tested 400 may be placed on the placement table. In other possible implementations, a plurality of placement tables may be provided in the test box 402, and one or more electronic devices to be tested 400 may be placed on each placement table, which is not limited here.

[0084] A door that can be opened or closed may also be provided on the test box 402. The electronic device 400 to be tested may be placed into or taken out of the test box 402 through the door. In some possible implementations, the door may be opened and closed by a cylinder.

[0085] The host 401 is used to control the state of the electronic device 400 to be tested through the control link 404 and to test the TRP of the electronic device through the test link 403 .

[0086] The state of the electronic device under test may include a standby state, a test state, etc. The standby state refers to a state in which the electronic device under test stores the data currently in operation in the memory, and the battery only supplies power to the memory, but not to the hard disk, the screen, and the CPU (Central Processing Unit). The test state refers to a state in which wireless radio frequency signals can be received and sent.

[0087] It should be understood that in some possible implementations, the RF parameters of the electronic device directly measured by the test link 403 may be the receiving power of the electronic device at different positions in space. Then the host 401 determines the gain of the electronic device at different positions in space based on the receiving power of the electronic device at different positions in space, and then obtains the transmission power of the electronic device at different positions in space according to the above formula (2), and finally obtains the TRP of the electronic device according to the above formula (1). Among them, the input power of the antenna in the electronic device, the feeder loss of the antenna, etc. can be pre-stored in the host 401 or obtained by the host 401 from the electronic device 400 to be tested through the control link 404 or the test link 403, which is not limited here.

[0088] The following is an introduction to the test status and test process of electronic equipment.

[0089] First, the host 401 can set the electronic device 400 to be tested to a test state via the control link 404 in response to a test instruction.

[0090] The test state is a state in which radio frequency signals can be received and sent. The test instruction can be used to instruct the host to start testing the electronic device to be tested. For example, the host may be installed with test software, and a start test button is displayed in the interface of the test software, and the test instruction can be a single-click operation on the start test button.

[0091] Please refer to Figure 5 , is a schematic diagram of another electronic device testing device provided in an embodiment of the present application. Figure 5 As shown, the control link 404 may include a router 414 and a first antenna 424, and the host 401 is connected to the first antenna 424 via the router 414. The first antenna 424 is disposed in the test box 402. The first antenna 424 is wirelessly connected to each electronic device 400 under test.

[0092] In response to receiving the test instruction, the host 401 may send a first instruction to the electronic device 400 under test via the router 414 and the first antenna 424. The first instruction is used to instruct the electronic device 400 under test to enter the above-mentioned test state.

[0093] After the electronic device 400 under test enters the test state, a first signaling may be sent to the host 401 through the first antenna 424 and the router 414 , where the first signaling indicates that the electronic device 400 under test has entered the test state.

[0094] In some other possible implementations, the control link may also include a serial port module, such as a USB (Universal Serial Bus) serial port, etc. The host is wiredly connected to each electronic device 400 under test via the serial port module, thereby controlling the state of each electronic device 400 under test.

[0095] Secondly, after receiving the first signaling sent by the electronic device 400 under test, the host 401 can transmit a test signal through the test link 403 and receive a feedback signal returned by the electronic device 400 under test based on the test signal.

[0096] like Figure 5As shown, the test link 403 may include a router 414, a comprehensive tester 413, a radio frequency switch board 423 and multiple second antennas 433. The host 401 is connected to multiple second antennas 433 through the router 414, the comprehensive tester 413, and the radio frequency switch board 423 in sequence. The second antenna 433 is arranged inside the test box 402 and distributed at various positions in the test box 402. The host 401 is also connected to the radio frequency switch board 423. Among them, the radio frequency switch board 424 is used to control the connection and disconnection between the host 401 and any second antenna 433, and between the comprehensive tester 213 and any second antenna 433. The comprehensive tester 413 can also be called a base station, which is used to output a radio frequency signal. The second antenna can also be called an antenna probe, a sampling probe, an omnidirectional antenna probe, etc., for performing a TRP test.

[0097] It should also be noted that Figure 5 Among the connection lines between the components, the thicker lines represent network cables, the thinner lines represent radio frequency lines, and the dotted lines indicate wireless communication connections.

[0098] After receiving the first signaling sent by the electronic device 400 to be tested, the host can input the test case into the comprehensive tester 413 through the router 414. A test case is a description of a test task for a specific software product, reflecting the test plan, method, technology and strategy. Its content includes test objectives, test environment, input data, test steps, expected results, test scripts, etc., and finally forms a document.

[0099] The comprehensive tester 413 outputs a radio frequency signal according to the received test case.

[0100] The RF switch board 423 can control which second antenna 433 the RF signal generated by the comprehensive tester 413 is transmitted through, and can also control which second antenna 433 receives the RF signal transmitted by the electronic device 400 to be tested and can be transmitted to the host 401. The second antenna 433 is used to transmit or receive RF signals. In some possible implementations, the RF switch board 423 can respond to the control of the host 401, and sequentially connect the comprehensive tester 413 with different second antennas 433, so that the RF signal generated by the comprehensive tester 413 is sequentially transmitted through different second antennas 433, or the RF signal transmitted by the electronic device 400 to be tested received by different second antennas 433 is sequentially transmitted to the host 401. In other possible implementations, the RF switch can also respond to the control of the host 401, and simultaneously connect the comprehensive tester 413 with different second antennas 433 to perform parallel testing.

[0101] In some possible implementations, after the second antenna 433 transmits the radio frequency signal transmitted by the comprehensive tester 413 , the second antenna 433 may transmit the received feedback signal transmitted by the electronic device 400 to be tested to the host 401 .

[0102] In some possible implementations, the feedback signal transmitted by the electronic device 400 under test may be the received power of the electronic device at different positions in space. The host 401 may calculate the TRP of each electronic device 400 under test based on the feedback signal of the electronic device 400 under test. The calculation process may refer to the above embodiment, and will not be described in detail here.

[0103] In some other possible implementations, the feedback signal transmitted by the electronic device 400 under test may also be the TRP of the electronic device 400 under test.

[0104] Then, after the host 401 determines the TRP of each electronic device 400 to be tested, the host 401 may obtain the simulated SAR value of each electronic device 400 to be tested according to the TRP of each electronic device 400 to be tested.

[0105] As described in the above embodiments, the TRP of the electronic device is positively correlated with the SAR value, so a conversion relationship can be established to convert the TRP of the electronic device into a simulated SAR value.

[0106] Exemplarily, the conversion relationship may be y=kt+m. Wherein, t is the TRP of the electronic device, y is the simulated SAR value of the electronic device, and k and m are preset parameters, which may be pre-calibrated by the TRP and SAR values ​​of multiple electronic devices. For example, the TRP and SAR values ​​of multiple groups of electronic devices are measured in advance, and the above k and t are obtained by linearly fitting the multiple groups of TRP and SAR values.

[0107] It should be understood that the simulated SAR value is only a simulation of the actual SAR value of the electronic device, and does not represent the actual SAR value of the electronic device. However, as described in the above embodiments, the discreteness of the TRP of multiple electronic devices can indicate the discreteness of the actual SAR values ​​of the multiple electronic devices. Therefore, the discreteness of the simulated SAR value linearly related to the TRP can also indicate the discreteness of the actual SAR value.

[0108] The degree of dispersion of each electronic device may refer to the variance, standard deviation, etc. of each electronic device, which is not limited here.

[0109] After the host 401 determines the simulated SAR value of each electronic device 400 to be tested, the host 401 can calculate the dispersion degree of the simulated SAR value of each electronic device 400 to be tested.

[0110] As described above, the degree of dispersion may refer to variance, standard deviation, etc., and the calculation process of the variance and standard deviation will not be described in detail here.

[0111] The host 401 can determine the relationship between the dispersion degree of the simulated SAR value of each electronic device 400 to be tested and the first preset value. When the dispersion degree is the variance, the first preset value can be 0.01. When the dispersion degree is the standard deviation, the first preset value can be 0.1.

[0112] When the dispersion of the simulated SAR values ​​of each electronic device 400 to be tested is less than the first preset value, it means that the simulated SAR value distribution fluctuation of the electronic device 400 to be tested is small, and the difference between the simulated SAR values ​​of each electronic device 400 to be tested is small. In this case, it can be considered that the SAR values ​​of the tested electronic devices meet the requirements and the test passes.

[0113] When the dispersion of the simulated SAR values ​​of the electronic devices 400 to be tested is greater than the first preset value, it means that the simulated SAR value distribution of the electronic devices 400 to be tested fluctuates greatly, and there is a large difference between the simulated SAR values ​​of the electronic devices 400 to be tested and the majority of the electronic devices 400 to be tested. In this case, it can be considered that there is an electronic device whose SAR value does not meet the requirements among the electronic devices under test, and the test fails.

[0114] When the test fails, the host 401 may calculate the contribution value of the simulated SAR value of each electronic device 400 to the discreteness.

[0115] The contribution value of the simulated SAR value of the electronic device under test to the discreteness refers to the absolute value of the difference between the discreteness of the simulated SAR values ​​of each electronic device under test when the electronic device is included and the discreteness of the simulated SAR values ​​of each electronic device under test when the electronic device is not included.

[0116] For example, the simulated SAR values ​​of four electronic devices A, B, C, and D to be tested are respectively a, b, c, and d, with the degree of dispersion being the standard deviation. Among them, the standard deviation of a, b, c, and d is x. The standard deviation of b, c, and d is x1. The standard deviation of a, c, and d is x2. The standard deviation of a, b, and d is x3. The standard deviation of a, b, and c is x4. Then the contribution value of the simulated SAR value of the electronic device A to the degree of dispersion is the absolute value of x-x1, the contribution value of the simulated SAR value of the electronic device B to the degree of dispersion is the absolute value of x-x2, the contribution value of the simulated SAR value of the electronic device C to the degree of dispersion is the absolute value of x-x3, and the contribution value of the simulated SAR value of the electronic device D to the degree of dispersion is the absolute value of x-x4.

[0117] It should be understood that in the above example, the degree of discreteness may also be the variance, which will not be elaborated here.

[0118] Then, the host 401 selects the electronic devices to be tested whose contribution to the discreteness is greater than a second preset value as electronic devices that have failed the test.

[0119] The second preset value can be set according to actual needs.

[0120] Based on the above description, it can be seen that when the test device of the electronic device performs a test, at least two test results are included. The first is that the test passed, that is, the SAR value of the tested electronic device meets the requirements. The second is that the test failed, and the identification of the electronic device that failed the test is listed, such as the product serial number (Serial Number, SN) of the electronic device. In the embodiment of the present application, the host 401 may include a display screen, and the above test results may be displayed in the display screen of the host 401 in the form of text, and the present application does not limit this.

[0121] It should be understood that the simulated SAR value is first calculated according to the TRP of each electronic device 400 to be tested, and then the test result is obtained according to the discrete degree of the simulated SAR value. In some possible implementations, the test result can also be directly obtained according to the discrete degree of the TRP of the electronic device 400 to be tested. The above process is similar and will not be repeated here.

[0122] It should also be noted that, in the above connection relationship, the host 401 and the router 414, the host 401 and the RF switch board 423, and the router 414 and the comprehensive tester 413 can be connected through a network cable, a local area network, etc. The router 414 and the first antenna 424, the comprehensive tester 413 and the RF switch board 423, and the RF switch board 423 and the second antenna 433 can be connected through a radio frequency line.

[0123] The above is the electronic device test device and its working principle provided by the embodiment of the present application. It can be seen that the electronic device test device has a simple structure and can quickly and easily determine the electronic device whose SAR value may not meet the requirements at a low cost, and has high practicality.

[0124] The electronic device testing method provided in the embodiment of the present application is based on the electronic device testing device described above and can be applied to the host in the electronic device testing device described above. For ease of description, the electronic device to be tested is referred to as the device to be tested below.

[0125] Please refer to Figure 6 , is a flow chart of a method for testing an electronic device provided in an embodiment of the present application. Figure 6 As shown, the method includes the following steps.

[0126] S601: Determine the total radiation power of each device under test respectively.

[0127] S602: Calculate a first discrete value according to the total radiation power of each device under test.

[0128] The first discrete value is used to indicate the degree of dispersion of the SAR value of each device under test. Exemplarily, the first discrete value may be the variance or standard deviation of the total radiated power of each device under test, or the variance or standard deviation of the simulated SAR value obtained according to the total radiated power of each device under test, which is not limited here.

[0129] S603: When the first discrete value is greater than a first preset value, calculate a first contribution value of each device under test according to a total radiation power of each device under test.

[0130] The first contribution value is the contribution value of the TRP or simulated SAR value of the electronic device to be tested to the discreteness in the aforementioned embodiment, which will not be described in detail here.

[0131] S604: Mark the device under test whose first contribution value is greater than the second preset value as failing the test.

[0132] It should be understood that when the first discrete value is less than the first preset value, each device under test may be identified as having passed the test.

[0133] All relevant contents of each step of the design of the test method for the electronic device can be referred to the functional description of the corresponding device, and will not be elaborated here.

[0134] Please refer to Figure 7 , is a schematic diagram of the composition of an electronic device provided in an embodiment of the present application. The electronic device 700 may be any of the electronic devices in the above examples, for example, the electronic device 700 may be a mobile phone, a computer, etc. For example, Figure 7 As shown, the electronic device 700 may include: a processor 701 and a memory 702. The memory 702 is used to store computer-executable instructions. Exemplarily, in some embodiments, when the processor 701 executes the instructions stored in the memory 702, the electronic device 700 may perform any function of the electronic device in the above embodiments to implement any antenna testing method in the above examples.

[0135] It should be noted that all relevant contents of each step involved in the above method embodiment can be referred to the functional description of the corresponding functional module and will not be repeated here.

[0136] Figure 8A schematic diagram of the composition of a chip system 800 is shown. The chip system 800 can be arranged in an electronic device. For example, the chip system 800 can be arranged in a mobile phone. Exemplarily, the chip system 800 may include: a processor 801 and a communication interface 802, which are used to support the electronic device to implement the functions involved in the above embodiments. In one possible design, the chip system 800 also includes a memory for storing program instructions and data necessary for the electronic device. The chip system can be composed of chips, and can also include chips and other discrete devices. It should be noted that in some implementations of the present application, the communication interface 802 may also be referred to as an interface circuit.

[0137] It should be noted that all relevant contents of each step involved in the above method embodiment can be referred to the functional description of the corresponding functional module and will not be repeated here.

[0138] An embodiment of the present application also provides a computer storage medium, in which computer instructions are stored. When the computer instructions are executed on a terminal device, the terminal device executes the above-mentioned related method steps to implement the method in the above-mentioned embodiment.

[0139] The embodiments of the present application also provide a computer program product. When the computer program product is run on a computer, the computer is enabled to execute the above-mentioned related steps to implement the method in the above-mentioned embodiments.

[0140] In addition, an embodiment of the present application also provides a device, which can specifically be a chip, component or module, and the device may include a connected processor and memory; wherein the memory is used to store computer-executable instructions, and when the device is running, the processor can execute the computer-executable instructions stored in the memory so that the chip executes the methods in the above-mentioned method embodiments.

[0141] Among them, the terminal device, computer storage medium, computer program product or chip provided in the embodiments of the present application are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0142] The above mainly introduces the solution provided by the embodiment of the present application from the perspective of electronic equipment. In order to realize the above functions, it includes hardware structures and / or software modules corresponding to the execution of each function. It should be easily appreciated by those skilled in the art that, in combination with the units and algorithm steps of each example described in the embodiments disclosed herein, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0143] The embodiment of the present application can divide the functional modules of the devices involved therein according to the above method examples. For example, each functional module can be divided corresponding to each function, or two or more functions can be integrated into one processing module. The above integrated modules can be implemented in the form of hardware or in the form of software functional modules. It should be noted that the division of modules in the embodiment of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation.

[0144] The functions or actions or operations or steps in the above embodiments can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using a software program, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions may be transmitted from a website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The computer-readable storage medium may be any available medium that a computer can access or may include one or more servers, data centers and other data storage devices that can be integrated with the medium. The available medium may be a magnetic medium (eg, a floppy disk, a hard disk, a magnetic tape), an optical medium (eg, a DVD), or a semiconductor medium (eg, a solid state disk (SSD)).

[0145] Although the present application has been described in conjunction with specific features and embodiments thereof, it is obvious that various modifications and combinations may be made thereto without departing from the spirit and scope of the present application. Accordingly, this specification and the drawings are merely exemplary illustrations of the present application as defined by the appended claims, and are deemed to have covered any and all modifications, variations, combinations or equivalents within the scope of the present application. Obviously, those skilled in the art may make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A testing device for electronic equipment, characterized in that: Including: host, test box, test link; The test box is used to place multiple devices to be tested; The first end of the test link is wirelessly connected to the multiple devices under test, and the second end of the test link is connected to the host; The host is used to determine the total radiation power of each of the devices under test through the test link; and calculate a first discrete value according to the total radiation power of each of the devices under test; When the first discrete value is greater than a first preset value, calculating a first contribution value of each of the devices under test according to a total radiation power of each of the devices under test; Marking the device under test whose first contribution value is greater than a second preset value as failing the test; Among them, the first discrete value is used to indicate the discrete degree of the first parameter of each device under test; the first parameter is positively correlated with the total radiation power; the first contribution value of the first device under test is used to indicate the contribution of the first device under test to the first discrete value, and the first device under test is any of the devices under test; the first preset value and the second preset value are both positive numbers.

2. The device according to claim 1, characterized in that The electronic equipment test device further comprises: a control link; The first end of the control link is connected to the host, and the second end of the control link is wirelessly connected to the multiple devices under test; Therefore, the host is also used to control the device under test to enter a test state through the control link in response to receiving a test instruction; the device under test has the ability to receive and transmit radio frequency signals in the test state.

3. The device according to claim 2, characterized in that The control link includes a router and a first antenna; the host is connected to the first antenna through the router; the first antenna is arranged in the test box and is communicatively connected with each of the devices under test; Therefore, the host is specifically configured to control the device under test to enter a test state through the router and the first antenna in response to receiving a test instruction.

4. The device according to any one of claims 1 to 3, characterized in that: The test link includes a router, a comprehensive tester, a radio frequency switch board and a plurality of second antennas; the host is connected to the plurality of second antennas through the router, the comprehensive tester and the radio frequency switch board in sequence; The host is also connected to the radio frequency switch board; the plurality of second antennas are arranged inside the test box and are wirelessly connected to each of the devices under test; The router is used to realize the communication between the host and the comprehensive tester; The comprehensive tester is used to receive the test case sent by the host and output the radio frequency signal corresponding to the test case; The radio frequency switch board is used to control the connection and disconnection between each of the second antennas and the comprehensive tester, and the connection and disconnection between each of the second antennas and the host.

5. The device according to claim 1, characterized in that The host is specifically used to measure the receiving power of each device under test at different positions in space through the test link; determine the gain of each device under test at different positions in space according to the receiving power of each device under test at different positions in space; determine the transmitting power of each device under test at different positions in space according to the gain of each device under test at different positions in space, the pre-stored input power of the antenna in each device under test, and the pre-stored feeder loss of the antenna in each device under test; integrate the transmitting power of each device under test at different positions in space to obtain the total radiated power of each device under test.

6. The device according to any one of claims 1 to 5, characterized in that: The host is further configured to mark each of the devices under test as having passed the test when the first discrete value is less than a first preset value.

7. The device according to claim 1, characterized in that The test box is an electromagnetic wave shielding box; the inner wall of the test box is provided with an absorbing material for shielding electromagnetic waves.

8. The device according to claim 1, characterized in that One or more placement tables are arranged in the test box; the placement tables are used to place one or more of the devices to be tested.

9. The device according to claim 1, characterized in that The test box is provided with a switch door; the switch door is connected to the host through a cylinder; the host is also used to control the opening and closing of the switch door through the cylinder; When the switch door is opened, the device under test is allowed to pass through.

10. The device according to any one of claims 1 to 9, characterized in that: The first parameter is the specific absorption rate; the first discrete value is the variance or the standard deviation.

11. A method for testing an electronic device, characterized in that: A host used in a testing device for an electronic device according to any one of claims 1 to 10; the method comprising: Determining the total radiated power of each of the devices under test; Calculating a first discrete value according to the total radiation power of each of the devices under test; the first discrete value is used to indicate the degree of discreteness of a first parameter of each of the devices under test; the first parameter is positively correlated with the total radiation power; When the first discrete value is greater than a first preset value, calculating a first contribution value of each of the devices under test according to the total radiation power of each of the devices under test; wherein the first contribution value of the first device under test is used to indicate the contribution of the first device under test to the first discrete value, and the first device under test is any of the devices under test; The device under test whose first contribution value is greater than the second preset value is marked as failed; the first preset value and the second preset value are both positive numbers.

12. The method according to claim 11, characterized in that Before determining the total radiation power of each of the devices under test, the method further includes: In response to receiving the test instruction, the device under test is controlled to enter a test state.

13. The method according to claim 11, characterized in that The determining of the total radiation power of each of the devices under test includes: Obtaining the received power of each of the devices under test at different positions in space; Determine the gain of each of the devices under test at different positions in space according to the received power of each of the devices under test at different positions in space; Determine the transmission power of each device under test at different positions in space according to the gain of each device under test at different positions in space, the pre-stored input power of the antenna in each device under test, and the pre-stored feeder loss of the antenna in each device under test; The transmission power of each of the devices under test at different positions in space is integrated to obtain the total radiation power of each of the devices under test.

14. The method according to any one of claims 11 to 13, characterized in that: After calculating the first discrete value according to the total radiation power of each of the devices under test, the method further includes: When the first discrete value is less than a first preset value, each of the devices under test is marked as having passed the test.

15. An electronic device, characterized in that: The electronic device comprises one or more processors and one or more memories; the one or more memories are coupled to the one or more processors, and the one or more memories store computer instructions; When the one or more processors execute the computer instructions, the electronic device executes the electronic device testing method as described in any one of claims 11 to 14.

16. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes computer instructions, and when the computer instructions are executed, the test method for an electronic device according to any one of claims 11 to 14 is executed.

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