High temperature resistant testing method and testing device of photovoltaic tube

Abstract

The application discloses a kind of high-temperature-resistant test methods and testing devices of photovoltaic tube, it is related to photovoltaic device testing technical field, when testing, respectively to standard photovoltaic tube and test photovoltaic tube irradiation ultraviolet, and the ultrasonic detection of both, real-time monitoring whether the cavity structure in it exceeds preset quantity.When the cavity structure of standard photovoltaic tube is earlier than test photovoltaic tube threshold value, it indicates that test photovoltaic tube has better resistance under ultraviolet irradiation, at this time, test photovoltaic tube is heated and is treated, and continues preset heating time, then carries out thermal evaluation test, to further evaluate its high-temperature-resistant performance.Conversely, then directly to test tube material evaluation test, analysis test photovoltaic tube performance loss.Avoid unnecessary heating step, improve test efficiency, while by testing standard photovoltaic tube and test photovoltaic tube simultaneously, effectively eliminate environmental and operational factors on test result interference, improve the reliability of result.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of photovoltaic device testing, and particularly relates to a high-temperature resistance testing method and testing device for a photovoltaic tube. BACKGROUND

[0002] A photovoltaic device is a semiconductor device that converts light energy into electrical energy through the photovoltaic effect, and is the core component of a solar power generation system. It can generate an electric current when exposed to sunlight, providing clean and renewable energy for people. In order to ensure the safe and efficient operation of the photovoltaic system, the power output wire needs to be protected and isolated, and a photovoltaic tube needs to be designed accordingly. Specifically, the photovoltaic tube is a tubular structure used to cover and protect the wire, and has good weather resistance, mechanical strength and insulation performance, which can effectively prevent the influence of the external environment on the wire, such as mechanical damage, moisture intrusion and ultraviolet radiation, etc.

[0003] In the existing technical solution, the performance test of the photovoltaic tube usually refers to international standards such as IEC 61215 and IEC 61646; for example, when performing a heat test, the photovoltaic tube needs to be placed in a constant temperature oven for heating, and when performing an ultraviolet test, the photovoltaic tube needs to be placed under an ultraviolet light source; after each test, the performance is evaluated separately. The above-mentioned prior art is suitable for product quality certification, but because of its low efficiency, it is not suitable for laboratory iteration scenarios. If each item of the photovoltaic tube is tested, a large amount of manpower and material resources are required, and different tests are required for each generation of photovoltaic tube, which has the disadvantage of low efficiency. SUMMARY

[0004] The purpose of the present application is to provide a high-temperature resistance testing method and testing device for a photovoltaic tube, which solves the problem of low efficiency of the detection scheme used in the iteration test process of the photovoltaic tube.

[0005] To achieve this purpose, the present application adopts the following technical solution:

[0006] A high-temperature resistance testing method for a photovoltaic tube, comprising:

[0007] ultraviolet light is respectively irradiated on a standard photovoltaic tube and a test photovoltaic tube;

[0008] ultrasonic testing is respectively performed on the standard photovoltaic tube and the test photovoltaic tube, and it is determined whether the hollow structure in the standard photovoltaic tube or the test photovoltaic tube exceeds a preset first number;

[0009] when the hollow structure in the standard photovoltaic tube exceeds the first number earlier than the test photovoltaic tube, the test photovoltaic tube is heated for a preset heating time, and the heated test photovoltaic tube is subjected to a thermal evaluation test;

[0010] When the hollow structure in the test photovoltaic tube exceeds the first number earlier than the standard photovoltaic tube, a material evaluation test is performed on the test photovoltaic tube.

[0011] Optionally, the material evaluation test performed on the test photovoltaic tube comprises:

[0012] A test sample is taken from the test photovoltaic tube, a standard sample is taken from the standard photovoltaic tube, Fourier infrared spectrum analysis is performed on the test sample and the standard sample respectively, a test peak graph and a standard peak graph are obtained, and the chemical degradation ratio of the test sample compared with the standard sample is obtained by comparing the test peak graph with the standard peak graph.

[0013] A test sample is taken from the test photovoltaic tube, a standard sample is taken from the standard photovoltaic tube, mechanical performance test is performed on the test sample and the standard sample respectively, test mechanical performance values and standard mechanical performance values are obtained, and the mechanical performance degradation ratio of the test sample compared with the standard sample is obtained by comparing the test mechanical performance values with the standard mechanical performance values.

[0014] Optionally, the comparison of the test peak graph and the standard peak graph to obtain the chemical degradation ratio of the test sample compared with the standard sample comprises:

[0015] Baseline correction and normalization processing are performed on the test peak graph and the standard peak graph.

[0016] Characteristic absorption peaks in the test peak graph and the standard peak graph are identified, and the characteristic absorption peaks correspond to characteristic functional groups of materials used in the photovoltaic tube.

[0017] The peak intensity of each characteristic absorption peak in the test peak graph and the standard peak graph is measured to obtain the absorption intensity value of each functional group.

[0018] The absorption intensity ratio of the characteristic functional groups in the test sample and the standard sample is calculated to obtain a degradation index.

[0019] The chemical degradation ratio is obtained according to the degradation index J1 of the test sample, the degradation index J2 of the standard sample, and the formula of the chemical degradation ratio; the formula of the chemical degradation ratio is H1= (J1-J2) / J2; H J is the chemical degradation ratio.

[0020] Optionally, the mechanical performance test performed on the test sample and the standard sample respectively to obtain the test mechanical performance values and the standard mechanical performance values, and the comparison of the test mechanical performance values with the standard mechanical performance values to obtain the mechanical performance degradation ratio of the test sample compared with the standard sample comprises:

[0021] respectively, and record the tensile strength of the test sample and the standard sample, to obtain the test tensile strength value σ of the test sample T and the standard tensile strength value σ of the standard sample S ;

[0022] respectively, and record the impact toughness of the test sample and the standard sample, to obtain the test impact toughness value T of the test sample T and the standard impact toughness value T of the standard sample S ;

[0023] respectively, and record the impact toughness of the test sample and the standard sample, to obtain the test impact toughness value T of the test sample σ and the impact toughness degradation ratio H of the standard sample T , wherein , ;

[0024] The tensile strength degradation ratio Hσ and the impact toughness degradation ratio H of the test sample are calculated by using a weighted average formula T The mechanical property degradation ratio H2 of the test sample is calculated by using a weighted average formula σ ·H σ +w T ·H T , wherein w σ +w T =1; w σ and w T are weight coefficients of the tensile strength and the impact toughness, respectively.

[0025] Optionally, the material evaluation test on the test photovoltaic tube also includes:

[0026] determining whether the chemical degradation ratio of the test sample is lower than a preset chemical degradation threshold value and whether the mechanical property degradation ratio of the test sample is lower than a preset mechanical property degradation threshold value;

[0027] If yes, the test photovoltaic tube corresponding to the test sample is marked as a second-type photovoltaic tube; if no, the test photovoltaic tube corresponding to the test sample is marked as an unqualified photovoltaic tube.

[0028] Optionally, the thermal evaluation test on the heated test photovoltaic tube includes:

[0029] a test sample is taken out from the test photovoltaic tube, a standard sample is taken out from the standard photovoltaic tube, a voltage breakdown resistance test is performed on the test sample and the standard sample respectively, to obtain a test breakdown voltage value and a standard breakdown voltage value; the test breakdown voltage value and the standard breakdown voltage value are compared, to obtain an insulation degradation ratio of the test sample compared with the standard sample;

[0030] A test sample is taken from the test photovoltaic tube, and a standard sample is taken from the standard photovoltaic tube. Mechanical properties are tested on the test sample and the standard sample respectively to obtain the test mechanical property values ​​and the standard mechanical property values. The test mechanical property values ​​are compared with the standard mechanical property values ​​to obtain the mechanical property degradation ratio of the test sample compared with the standard sample.

[0031] Optionally, it can be determined whether the insulation degradation ratio of the test sample is lower than a preset insulation degradation threshold, and whether the mechanical property degradation ratio of the test sample is lower than a preset mechanical property degradation threshold.

[0032] If yes, the photovoltaic tube corresponding to the test sample will be marked as a Class I photovoltaic tube; otherwise, the photovoltaic tube corresponding to the test sample will be marked as a Class II photovoltaic tube.

[0033] A photovoltaic tube testing device includes a standard area and a testing area. The standard area is used to place a standard photovoltaic tube, and the testing area is used to place a test photovoltaic tube. An ultraviolet irradiation device and a heating device are provided outside both the standard area and the testing area.

[0034] The testing device for the photovoltaic tube employs the high-temperature resistance testing method described above.

[0035] Compared with existing technologies, the present invention has the following advantages: The high-temperature resistance testing method and apparatus for photovoltaic tubes provided by the present invention irradiate both a standard photovoltaic tube and a test photovoltaic tube with ultraviolet light during the testing process, and perform ultrasonic testing on both to monitor in real time whether the void structure exceeds a preset number. When the void structure of the standard photovoltaic tube exceeds the threshold earlier than that of the test photovoltaic tube, it indicates that the test photovoltaic tube has better resistance to ultraviolet irradiation. At this time, the test photovoltaic tube is heated for a preset heating time, and then a thermal evaluation test is performed to further evaluate its high-temperature resistance performance. Conversely, a material evaluation test is directly performed on the test photovoltaic tube to analyze the performance loss of the test photovoltaic tube. The above scheme avoids unnecessary heating steps, improves testing efficiency, and effectively eliminates the interference of environmental and operational factors on the test results by simultaneously testing the standard photovoltaic tube and the test photovoltaic tube, thereby improving the reliability of the results. Attached Figure Description

[0036] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0037] The structure, proportion, size, etc. shown in the drawings of the specification are only used to cooperate with the content disclosed in the specification, to be understood and read by those skilled in the art, and do not have technical significance to limit the conditions under which the application can be implemented. Any modification of the structure, change of the proportion relationship, or adjustment of the size, without affecting the effects and purposes that the application can produce, should still fall within the scope of the technology disclosed by the application.

[0038] Figure 1 A flowchart of a high-temperature resistance test method of a photovoltaic tube provided by the embodiment of the application is shown. DETAILED DESCRIPTION

[0039] In order to make the purposes, features and advantages of the application more obvious and easy to understand, the technical solutions in the embodiments of the application will be described clearly and completely below in combination with the drawings in the embodiments of the application. Obviously, the embodiments described below are only some of the embodiments of the application, rather than all the embodiments. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the application.

[0040] In the description of the application, it should be understood that the terms "upper", "lower", "top", "bottom", "inner", "outer" and the like indicate the orientation or positional relationship shown in the drawings, and are only used to facilitate the description of the application and simplify the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application. It should be noted that when a component is considered to be "connected" to another component, it can be directly connected to the other component or there can be a component disposed therebetween.

[0041] The technical solutions of the application will be further described below in combination with the drawings and through specific embodiments.

[0042] Embodiment one:

[0043] The high-temperature resistance test method of the photovoltaic tube provided by the embodiment is suitable for the scene of rapid screening of photovoltaic tubes in a laboratory. In the embodiment, the high-temperature resistance test method of the photovoltaic tube is optimized, and compared with the prior art, the efficiency of screening high-quality photovoltaic tubes can be improved.

[0044] As shown in Figure 1 The high-temperature resistance test method of the photovoltaic tube provided by the embodiment includes:

[0045] S100, respectively irradiating the standard photovoltaic tube and the test photovoltaic tube with ultraviolet rays;

[0046] S200, respectively, the standard photovoltaic tube and the test photovoltaic tube are subjected to ultrasonic detection, and it is judged whether the cavity structure in the standard photovoltaic tube or the test photovoltaic tube exceeds a preset first number; wherein the first number can be measured by calculating the average cavity number of a plurality of standard photovoltaic tubes after a plurality of ultraviolet irradiation experiments on the standard photovoltaic tubes and then detecting the cavity number by ultrasonic waves;

[0047] S300, when the cavity structure in the standard photovoltaic tube exceeds the first number earlier than the test photovoltaic tube, the test photovoltaic tube is heated for a preset heating time; and the heated test photovoltaic tube is subjected to thermal evaluation test;

[0048] When the cavity structure in the standard photovoltaic tube exceeds the first number earlier than the test photovoltaic tube, it means that under the same ultraviolet irradiation conditions, the defects such as cavities and cracks generated inside the standard photovoltaic tube reach the preset critical number faster and earlier than the test photovoltaic tube, indicating that the test photovoltaic tube performs more outstandingly in terms of ultraviolet aging resistance, and its material has stronger resistance to ultraviolet radiation. In this case, the test photovoltaic tube is heated for a preset heating time, and then the heated test photovoltaic tube is subjected to thermal evaluation test, based on the excellent performance of the test photovoltaic tube in the ultraviolet environment, to further evaluate its resistance in high temperature conditions.

[0049] S400, when the cavity structure in the test photovoltaic tube exceeds the first number earlier than the standard photovoltaic tube, the test photovoltaic tube is subjected to material evaluation test.

[0050] When the cavity structure in the test photovoltaic tube exceeds the first number earlier than the standard photovoltaic tube, it means that the test photovoltaic tube generates internal defects faster than the standard photovoltaic tube under ultraviolet irradiation conditions, and has poorer ultraviolet aging resistance. At this time, the heating step is skipped and the test photovoltaic tube is directly subjected to material evaluation test, which can reduce the processing time of the test photovoltaic tube, directly perform material evaluation test including chemical analysis and mechanical performance analysis on the test photovoltaic tube, identify the problems existing in the test photovoltaic tube in the ultraviolet environment, and analyze the severity of the problem and the performance loss of the test photovoltaic tube.

[0051] Specifically, in the high temperature resistance test method of the photovoltaic tube in the embodiment, ultraviolet rays are respectively irradiated to the standard photovoltaic tube and the test photovoltaic tube during the test, and ultrasonic detection is performed on the two, so as to monitor in real time whether the cavity structure in the two exceeds a preset number. When the cavity structure of the standard photovoltaic tube exceeds the threshold earlier than that of the test photovoltaic tube, it indicates that the test photovoltaic tube has better resistance to ultraviolet irradiation. At this time, the test photovoltaic tube is subjected to a heating treatment and is continuously heated for a preset heating time, and then a thermal evaluation test is performed to further evaluate the high temperature resistance performance thereof. Conversely, a material evaluation test is directly performed on the test photovoltaic tube to analyze the performance loss of the test photovoltaic tube. The above scheme avoids unnecessary heating steps, improves the test efficiency, and effectively eliminates the interference of environmental and operation factors on the test results by simultaneously testing the standard photovoltaic tube and the test photovoltaic tube, thereby improving the reliability of the results.

[0052] Specifically, the step S100 of irradiating ultraviolet rays to the standard photovoltaic tube and the test photovoltaic tube respectively specifically includes the following steps.

[0053] S101, providing an arc-shaped quartz glass cover, one end of the quartz glass cover is provided with an air inlet pipe, and the other end is provided with an air outlet pipe. An external hot air device can spray a hot air flow into the quartz glass cover through the air inlet pipe. The temperature of the hot air flow is determined by the hot air device, and the hot air device can set the hot air flow according to the temperature in the subsequent steps;

[0054] S102, respectively covering the standard photovoltaic tube and the test photovoltaic tube in the corresponding quartz glass cover, and irradiating ultraviolet rays into the quartz glass cover through the ultraviolet irradiation device.

[0055] Specifically, the step S200 of respectively performing ultrasonic detection on the standard photovoltaic tube and the test photovoltaic tube includes the following steps.

[0056] S201, irradiating the photovoltaic tube in the quartz glass cover with high frequency 5-10 MHz through an ultrasonic probe to obtain an ultrasonic echo signal. The quartz glass cover does not block ultraviolet rays and high frequency ultrasonic waves, so that the photovoltaic tube can be detected by ultrasonic waves during ultraviolet irradiation;

[0057] S202, band-pass filtering and denoising the ultrasonic echo signal to reduce the interference of multiple reflections of the glass interface on the signal;

[0058] S203, identifying the cavities or cracks in the photovoltaic tube by analyzing the delay time and amplitude change of the ultrasonic echo signal, and obtaining the number of cavity structures in the photovoltaic tube. The delay time reflects whether there is a cavity. The amplitude change reflects the density of the cavity. The number of cavities in the standard photovoltaic tube and the test photovoltaic tube is estimated according to the above parameters to facilitate the subsequent judgment of which cavity structure in the photovoltaic tube can reach the first number faster.

[0059] Further, the material evaluation test on the test photovoltaic tube in step S400 includes:

[0060] S410, taking out a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing Fourier infrared spectrum analysis on the test sample and the standard sample to obtain a test peak graph and a standard peak graph; comparing the test peak graph with the standard peak graph to obtain a chemical degradation ratio of the test sample compared with the standard sample;

[0061] Specifically, the two samples are respectively finely ground and sieved to obtain powders with uniform particle sizes. Then, a tabletting method is used to mix the samples and potassium bromide (KBr) at a mass ratio of 1:100, uniformly mix, and press into transparent thin sheets under high pressure for use in a Fourier infrared spectrum analysis device, which is well known to those skilled in the art and will not be described here. Then, the Fourier infrared spectrum analysis device is used to scan the spectra of the samples to obtain their respective infrared absorption spectra, i.e., the test peak graph and the standard peak graph.

[0062] S420, taking out a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing mechanical property tests on the test sample and the standard sample to obtain test mechanical property values and standard mechanical property values; comparing the test mechanical property values with the standard mechanical property values to obtain a mechanical property degradation ratio of the test sample compared with the standard sample.

[0063] Specifically, the test sample and the standard sample are respectively cut from the test photovoltaic tube and the standard photovoltaic tube, and each of the test sample and the standard sample is placed into a corresponding mechanical property testing device to measure the test mechanical property values and the standard mechanical property values. The mechanical property testing device includes but is not limited to a tensile testing machine, an impact testing machine, etc.

[0064] Further, the comparison of the test peak graph with the standard peak graph in step S410 to obtain the chemical degradation ratio of the test sample compared with the standard sample includes:

[0065] S411, performing baseline correction and normalization processing on the test peak graph and the standard peak graph;

[0066] The baseline correction on the above two groups of spectra eliminates the influence of background noise and baseline drift. Then, the spectra are normalized to make the absorption intensities between samples comparable. An internal reference peak that is not affected by aging is usually selected for normalization, such as a carbon-hydrogen bond (C-H).

[0067] S412, identify the characteristic absorption peaks in the test peak map and the standard peak map, the characteristic absorption peaks corresponding to the characteristic functional groups of the material used in the photovoltaic tube; for example, carbonyl, hydroxyl, vinyl double bond, etc. can be selected according to the material of the photovoltaic tube;

[0068] S413, measure the peak intensity of each characteristic absorption peak in the test peak map and the standard peak map to obtain the absorption intensity value of each functional group;

[0069] S414, calculate the absorption intensity ratio of the characteristic functional groups in the test sample and the standard sample to obtain the degradation index;

[0070] S415, according to the degradation index J1 of the test sample, the degradation index J2 of the standard sample and the formula of the chemical degradation ratio, the chemical degradation ratio is obtained; the formula of the chemical degradation ratio is: H1= (J1-J2) / J2; H1 is the chemical degradation ratio.

[0071] It can be understood that the degradation index J1 reflects the peak change value of a functional group of the test sample before and after being irradiated by ultraviolet light, and the degradation index J2 reflects the peak change value of a functional group of the standard sample before and after being irradiated by ultraviolet light, which means that the peak change value of the test sample is greater than that of the standard sample, for example, the degradation index J1 is 0.15, and the degradation index J2 is 0.05, then the chemical degradation ratio H1 is calculated to be 200%, which reflects the degree of chemical degradation of the test photovoltaic tube compared with the standard photovoltaic tube.

[0072] Further, in step S420, the mechanical property test is performed on the test sample and the standard sample respectively to obtain the test mechanical property value and the standard mechanical property value; by comparing the test mechanical property value with the standard mechanical property value, the mechanical property degradation ratio of the test sample compared with the standard sample is obtained, including:

[0073] S421, respectively, the tensile property test is performed on the test sample and the standard sample, the tensile strength is measured and recorded, the test tensile strength value σ T of the test sample and the standard tensile strength value σ S of the standard sample are obtained;

[0074] S422, respectively, the impact property test is performed on the test sample and the standard sample, the impact toughness is measured and recorded, the test impact toughness value T T of the test sample and the standard impact toughness value T S of the standard sample are obtained;

[0075] S423, respectively, the tensile strength degradation ratio H σ and the impact toughness degradation ratio H T of the test sample are calculated, wherein, , ;

[0076] S424, calculate the tensile strength degradation ratio Hσ and the impact toughness degradation ratio H using a weighted average formula T of the mechanical property degradation ratio H2 = w σ · H σ + w T · H T , wherein w σ + w T = 1; w σ and w T are weight coefficients of the tensile strength and the impact toughness, respectively.

[0077] The weight coefficients of the tensile strength and the impact toughness are set according to the application scenario of the photovoltaic tube, for example, in a scenario with more static load, the weight coefficient w σ of the tensile strength is set to 0.7; for example, in a scenario with more wind load, the weight coefficient w T of the impact toughness is set to 0.7.

[0078] Further, the material evaluation test on the test photovoltaic tube in step S400 further comprises:

[0079] S430, determine whether the chemical degradation ratio of the test sample is lower than a preset chemical degradation threshold value, and whether the mechanical property degradation ratio of the test sample is lower than a preset mechanical property degradation threshold value; for example, the chemical degradation threshold value can be set to 0.2, and the mechanical property degradation threshold value can be set to 0.05; it should be noted that if the mechanical property degradation threshold value is negative, it means that the mechanical property of the test photovoltaic tube is improved in the short term.

[0080] S440, if yes, mark the test photovoltaic tube corresponding to the test sample as a second type photovoltaic tube; if no, mark the test photovoltaic tube corresponding to the test sample as an unqualified photovoltaic tube.

[0081] It can be understood that when the test sample has more cavities than the standard sample, but has less mechanical performance degradation or even enhanced mechanical performance, the following situations may occur: 1. Under the action of ultraviolet irradiation, the polymer chains in the material undergo crosslinking reaction to form a more compact three-dimensional network structure, which reduces the mechanical performance degradation in the short term, or even improves the mechanical performance of the material; 2. Small cavities are formed inside to induce local stress concentration and improve energy absorption capacity; 3. The existence of cavities enables the material to deform at the micro level when stressed, and stress relaxation is performed to avoid early damage caused by stress concentration……, which is related to the material ratio of the test photovoltaic tube, the molding process and other parameters. Through this step, the second type of photovoltaic tube can be screened out. The second type of photovoltaic tube has relatively reliable mechanical performance in short-term outdoor use and is suitable for short-term or one-time power generation projects, outdoor non-load-bearing line connections and other scenarios. Unqualified photovoltaic tubes are prone to change and aging under ultraviolet irradiation, and are difficult to maintain the structure, which can be quickly screened out from the experimental objects.

[0082] On the basis of the above-mentioned embodiments, the thermal evaluation test on the heated test photovoltaic tube in step S300 comprises:

[0083] S310, a test sample is taken out from the test photovoltaic tube, and a standard sample is taken out from the standard photovoltaic tube. The test sample and the standard sample are subjected to pressure breakdown resistance tests respectively to obtain a test breakdown voltage value and a standard breakdown voltage value. The test breakdown voltage value and the standard breakdown voltage value are compared to obtain an insulation degradation ratio of the test sample compared with the standard sample.

[0084] Insulation degradation ratio Vs is the breakdown voltage value of the standard sample, and Vt is the breakdown voltage value of the test sample.

[0085] S320, a test sample is taken out from the test photovoltaic tube, and a standard sample is taken out from the standard photovoltaic tube. The test sample and the standard sample are subjected to mechanical performance tests respectively to obtain a test mechanical performance value and a standard mechanical performance value. The test mechanical performance value and the standard mechanical performance value are compared to obtain a mechanical performance degradation ratio of the test sample compared with the standard sample. The calculation method of this step is similar to that of step S420, which is not described herein.

[0086] Further, the thermal evaluation test on the heated test photovoltaic tube in step S300 further comprises:

[0087] S330, judge whether the insulation deterioration ratio of the test sample is lower than the preset insulation deterioration threshold value and whether the mechanical property deterioration ratio of the test sample is lower than the preset mechanical property deterioration threshold value; the insulation deterioration threshold value is set to -0.1-0, and the mechanical property deterioration threshold value is set to -0.05-0, which means that in the subsequent steps, the performance needs to be better than the standard sample to meet the requirements of the first type of photovoltaic tube.

[0088] S340, if yes, the test photovoltaic tube corresponding to the test sample is marked as a first type of photovoltaic tube; if no, the test photovoltaic tube corresponding to the test sample is marked as a second type of photovoltaic tube. It can be understood that by means of the voltage breakdown test and the mechanical property test, the insulation performance and the mechanical property of the test photovoltaic tube after heating are compared with those of the standard photovoltaic tube, the insulation deterioration ratio and the mechanical property deterioration ratio are calculated, the performance of the photovoltaic tube is further distinguished, the test photovoltaic tube can be divided into the first type of photovoltaic tube with higher performance requirements and the second type of photovoltaic tube in step S440, and thus the test photovoltaic tube is divided into the first type of photovoltaic tube (more suitable for long-term load scenes), the second type of photovoltaic tube (suitable for short-term and / or low-load scenes) and unqualified photovoltaic tubes through two environmental impact steps and corresponding test steps, so that the qualified products can be preliminarily screened and classified from a plurality of types of photovoltaic tubes in the laboratory, and the classified photovoltaic tubes can be more comprehensively detected.

[0089] Embodiment two:

[0090] The embodiment also provides a photovoltaic tube testing device, which comprises a standard area and a test area, the standard area is used for placing a standard photovoltaic tube, the test area is used for placing a test photovoltaic tube, ultraviolet irradiation devices, heating devices and ultrasonic probes are arranged outside the standard area and the test area; the standard area and the test area are covered with quartz glass covers, the heating devices comprise an air inlet pipe arranged at one end of the quartz glass cover and an air outlet pipe arranged at the other end of the quartz glass cover, and external hot air devices can spray hot air flow into the quartz glass cover through the air inlet pipe; the photovoltaic tube testing device adopts the high-temperature resistance test method in the embodiment one. In addition, in order to perform steps S300 and S400, the testing device further comprises a Fourier infrared spectrum analysis device, a tensile testing machine, an impact testing machine, a voltage breakdown test and the like.

[0091] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than limit them; although the foregoing embodiments of the present application have been described in detail, those skilled in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacements for some technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method of high temperature testing of a photovoltaic tube, characterized in that, The method comprises the following steps: respectively irradiating the standard photovoltaic tube and the test photovoltaic tube with ultraviolet rays; respectively performing ultrasonic detection on the standard photovoltaic tube and the test photovoltaic tube, and determining whether the hollow structure in the standard photovoltaic tube or the test photovoltaic tube exceeds a preset first number; the first number is measured by performing ultrasonic detection on the hollow number and calculating the average hollow number of multiple groups of standard photovoltaic tubes after multiple groups of ultraviolet irradiation experiments on the standard photovoltaic tube; when the hollow structure in the standard photovoltaic tube exceeds the first number earlier than the test photovoltaic tube, heating the test photovoltaic tube for a preset heating time; and performing a thermal evaluation test on the heated test photovoltaic tube; when the hollow structure in the test photovoltaic tube exceeds the first number earlier than the standard photovoltaic tube, performing a material evaluation test on the test photovoltaic tube; the material evaluation test on the test photovoltaic tube comprises: taking a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing Fourier infrared spectrum analysis on the test sample and the standard sample to obtain a test wave peak graph and a standard wave peak graph; comparing the test wave peak graph with the standard wave peak graph to obtain a chemical degradation ratio of the test sample relative to the standard sample; taking a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing mechanical performance tests on the test sample and the standard sample to obtain test mechanical performance values and standard mechanical performance values; comparing the test mechanical performance values with the standard mechanical performance values to obtain a mechanical performance degradation ratio of the test sample relative to the standard sample; the thermal evaluation test on the heated test photovoltaic tube comprises: taking a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing pressure breakdown resistance tests on the test sample and the standard sample to obtain test breakdown voltage values and standard breakdown voltage values; comparing the test breakdown voltage values with the standard breakdown voltage values to obtain an insulation degradation ratio of the test sample relative to the standard sample; taking a test sample from the test photovoltaic tube and a standard sample from the standard photovoltaic tube, respectively performing mechanical performance tests on the test sample and the standard sample to obtain test mechanical performance values and standard mechanical performance values; comparing the test mechanical performance values with the standard mechanical performance values to obtain a mechanical performance degradation ratio of the test sample relative to the standard sample.

2. The method of claim 1, wherein the temperature is 85°C. the comparison of the test wave peak graph and the standard wave peak graph to obtain the chemical degradation ratio of the test sample relative to the standard sample comprises: performing baseline correction and normalization processing on the test wave peak graph and the standard wave peak graph; identifying characteristic absorption peaks in the test wave peak graph and the standard wave peak graph, the characteristic absorption peaks corresponding to characteristic functional groups of the materials used in the photovoltaic tube; measuring the peak intensity of each characteristic absorption peak in the test wave peak graph and the standard wave peak graph to obtain the absorption intensity values of the corresponding functional groups; calculating the absorption intensity ratio of the characteristic functional groups in the test sample and the standard sample to obtain a degradation index; According to the degradation index J1 of the test sample, the degradation index J2 of the standard sample, and the formula of the chemical deterioration ratio, the chemical deterioration ratio is obtained; the formula of the chemical deterioration ratio is: H1= (J1-J2) / J2; H J is the chemical deterioration ratio.

3. The method of claim 1, wherein the temperature is 85°C. the mechanical performance tests on the test sample and the standard sample to obtain the test mechanical performance values and the standard mechanical performance values; Comparing the test mechanical property value with the standard mechanical property value, a mechanical property degradation ratio of the test sample compared with the standard sample is obtained, including: The tensile property test is performed on the test sample and the standard sample respectively, the tensile strength is measured and recorded, and the test tensile strength value σ of the test sample is obtained T and the standard tensile strength value σ of the standard sample S ; The impact performance test is performed on the test sample and the standard sample, respectively, the impact toughness is measured and recorded, and the test impact toughness value T of the test sample is obtained T and the standard impact toughness value T of the standard sample S ; The tensile strength deterioration ratio H of the test sample is calculated σ and the impact toughness deterioration ratio H T wherein, , ; The tensile strength deterioration ratio Hσ and the impact toughness deterioration ratio H are calculated by using a weighted average formula T The mechanical property deterioration ratio H2 = w σ · H σ + w T · H T , wherein w σ + w T = 1; w σ and w T are weight coefficients of the tensile strength and the impact toughness, respectively.

4. The method of claim 1, wherein the temperature is 85°C. The material evaluation test on the test photovoltaic tube further includes: determining whether the chemical degradation ratio of the test sample is lower than a preset chemical degradation threshold value and whether the mechanical property degradation ratio of the test sample is lower than a preset mechanical property degradation threshold value; if yes, the test photovoltaic tube corresponding to the test sample is marked as a second type photovoltaic tube; if no, the test photovoltaic tube corresponding to the test sample is marked as an unqualified photovoltaic tube.

5. The method of claim 4, wherein the temperature is 85°C. determining whether the insulation degradation ratio of the test sample is lower than a preset insulation degradation threshold value and whether the mechanical property degradation ratio of the test sample is lower than a preset mechanical property degradation threshold value; if yes, the test photovoltaic tube corresponding to the test sample is marked as a first type photovoltaic tube; if no, the test photovoltaic tube corresponding to the test sample is marked as a second type photovoltaic tube.

6. A testing device for photovoltaic tubes, characterized by The test device for the photovoltaic tube adopts the high-temperature resistance test method according to any one of claims 1-5. The test device for the photovoltaic tube adopts the high-temperature resistance test method according to any one of claims 1-5.

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