A method for testing the epitaxial structure performance of gallium oxide-based diodes

Abstract

This invention discloses a method for testing the epitaxial structure performance of gallium oxide-based diodes, relating to the field of transistors. It solves the problem of detection effectiveness in existing epitaxial structure performance testing methods. The method includes the following steps: Step S1: Obtaining the luminous efficiency values ​​of the target diode under test at each preset power, and plotting a power-luminous efficiency coordinate graph accordingly. Based on the power-luminous efficiency coordinate graph, the qualified luminous efficiency power range corresponding to the target diode under test is obtained. Step S2: Obtaining the color rendering index values ​​of the target diode under test at each characteristic power, and plotting a color rendering index coordinate graph accordingly. Based on the color rendering index coordinate graph, the qualified color rendering power range corresponding to the target diode under test is obtained. Step S3: Performing performance testing on the sample gallium oxide-based diodes based on the qualified color rendering power range and the qualified luminous efficiency power range, and issuing performance warnings based on the test results. This invention can improve the accuracy of diode performance testing results.

Description

Technical Field

[0001] This invention belongs to the field of transistors, and particularly relates to a method for testing the epitaxial structure performance of gallium oxide-based diodes. Background Technology

[0002] In the field of transistors, gallium oxide (GaO)-based diodes have attracted widespread attention due to their excellent photoelectric performance. The performance testing of their epitaxial structures is crucial for ensuring device reliability and application effectiveness. However, existing methods for testing the performance of epitaxial structures have significant shortcomings when testing the luminous efficacy of GaO-based diodes. Firstly, existing methods cannot plot power-efficiency coordinates based on the luminous efficacy values ​​of the target diode at different preset power levels, nor can they determine the corresponding acceptable luminous efficacy power range for the target diode, resulting in inaccurate luminous efficacy performance testing of GaO-based diodes. Secondly, existing methods also cannot plot color rendering index (CRI) coordinates based on the color rendering index values ​​of the target diode at different characteristic power levels, nor can they determine the corresponding acceptable color rendering power range for the target diode through the CRI coordinates, thus making it difficult to guarantee the accuracy of color rendering performance testing. These problems not only affect the comprehensive evaluation of the overall performance of GaO-based diodes but also limit their promotion and use in demanding applications. Therefore, developing a method that can accurately test the luminous efficacy and color rendering performance of GaO-based diodes has significant technical importance and practical application value. This invention aims to improve the accuracy and reliability of gallium oxide-based diode performance testing by constructing a quantitative model of luminous efficacy-power characteristics and a dynamic tracking system for color rendering performance, thereby providing support for the technological development in related fields. Summary of the Invention

[0003] This invention addresses the shortcomings of existing epitaxial structure performance testing methods in terms of luminous efficacy and color rendering performance by proposing a new method for testing the epitaxial structure performance of gallium oxide-based diodes. This method significantly improves the accuracy and reliability of the testing results by establishing a luminous efficacy-power characteristic quantification model and a color rendering index evaluation mechanism.

[0004] To achieve the above objectives, this invention provides a method for testing the epitaxial structure performance of gallium oxide-based diodes. The method includes the following specific steps:

[0005] S1: Obtain the target diode to be tested, set multiple preset power values ​​to obtain luminous efficiency values, and draw a power-luminous efficiency coordinate graph to further determine the qualified luminous efficiency power range;

[0006] S2: Set multiple characteristic powers to obtain color rendering index values, and draw a color rendering index coordinate graph to further determine the qualified color rendering power range;

[0007] S3: Perform performance testing on the sample gallium oxide-based diodes by combining the qualified luminous efficacy power range and the qualified color rendering power range, and issue performance warnings based on the test results.

[0008] Furthermore, step S1 includes the following specific steps:

[0009] S11: Acquire gallium oxide-based diodes that need to be tested for performance, obtain multiple gallium oxide-based diodes, and select one sample gallium oxide-based diode from the multiple acquired gallium oxide-based diodes;

[0010] S12: In the process of detecting the luminous efficiency of the sample gallium oxide-based diode, the value 0 is taken as the lower limit of the luminous efficiency driving power range, and the rated power corresponding to the sample gallium oxide-based diode is taken as the upper limit of the luminous efficiency driving power range, so as to obtain the preset range of luminous efficiency driving power.

[0011] S13: Divide the preset range of light effect driving power into several light effect driving powers, and the power value between each two consecutive light effect driving powers is equal. Then, mark the several light effect driving powers into Q1 driving power to Qa driving power according to their numerical values.

[0012] S14: Monitor the luminous efficiency of the sample gallium oxide-based diode under the Q1 driving power, and obtain the steady-state luminous efficiency of Q1 based on the monitoring results;

[0013] S15: Obtain the steady-state luminous efficiency of the sample gallium oxide-based diodes at driving power from Q2 to Qa, and obtain the steady-state luminous efficiency from Q2 to Qa.

[0014] S16: Create a luminous efficiency line graph based on the driving power of Q1 to the driving power of Qa and the steady-state luminous efficiency of Q1 to the steady-state luminous efficiency of Qa. Obtain the qualified luminous efficiency power range corresponding to the sample gallium oxide-based diode based on the luminous efficiency line graph.

[0015] Furthermore, step S14 includes the following specific steps:

[0016] Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the Q1 drive power;

[0017] During the operation of the sample gallium oxide-based diode, a luminous efficacy monitoring cycle is marked. Several luminous efficacy monitoring time points are selected within the luminous efficacy monitoring cycle. The luminous flux of the sample gallium oxide-based diode at each luminous efficacy monitoring time point is obtained through an integrating sphere spectroradiometer, resulting in multiple monitored luminous fluxes.

[0018] The ratio of each monitored luminous flux to the Q1 driving power is obtained to obtain multiple monitored luminous efficacy values. The average of the obtained multiple monitored luminous efficacy values ​​is calculated to obtain the steady-state luminous efficacy of Q1.

[0019] Furthermore, step S16 includes the following specific steps:

[0020] In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state luminous efficiency is marked as the vertical axis to obtain the steady-state luminous efficiency coordinate system.

[0021] In the steady-state luminous efficiency coordinate system, the coordinate point with Q1 driving power as the abscissa and Q1 steady-state luminous efficiency as the ordinate is marked as the Q1 efficiency coordinate point; the coordinate point with Q2 driving power as the abscissa and Q2 steady-state luminous efficiency as the ordinate is marked as the Q2 efficiency coordinate point; and so on, the coordinate point with Qa driving power as the abscissa and Qa steady-state luminous efficiency as the ordinate is marked as the Qa efficiency coordinate point.

[0022] Connect the efficiency coordinates from Q1 to Qa sequentially to obtain a luminous efficiency coordinate broken line, and then re-mark the steady-state luminous efficiency coordinate system as a luminous efficiency broken line graph.

[0023] Furthermore, step S16 also includes setting a reference luminous efficiency feature point on the y-axis of the luminous efficiency graph, drawing a straight line perpendicular to the y-axis through the reference luminous efficiency feature point to obtain a reference luminous efficiency feature line, marking the area of ​​the luminous efficiency coordinate line above the reference luminous efficiency feature line as a qualified luminous efficiency line, and obtaining the interval value of the abscissa corresponding to the qualified luminous efficiency line to obtain the qualified luminous efficiency power range.

[0024] Furthermore, step S2 includes the following specific steps:

[0025] S21: Obtain a sample gallium oxide-based diode. During the color rendering index detection of the sample gallium oxide-based diode, take the value 0 as the lower limit of the color rendering driving power range and take the rated power corresponding to the sample gallium oxide-based diode as the upper limit of the color rendering driving power range to obtain the preset range of color rendering driving power.

[0026] S22: Divide the preset range of color driving power into several color driving powers, and the power value between each two consecutive color driving powers is equal, and mark the several divided color driving powers as P1 driving power to Pb driving power according to their numerical values.

[0027] S23: Monitor the color rendering index of the sample gallium oxide-based diode under the P1 driving power, and obtain the P1 steady-state color rendering index based on the monitoring results;

[0028] S24: Obtain the steady-state color rendering index of the sample gallium oxide-based diodes at driving power from P2 to Pb, and obtain the steady-state color rendering index from P2 to Pb.

[0029] S25: Create a color rendering index line graph based on the P1 driving power to the Pb driving power and the P1 steady-state color rendering index to the Pb steady-state color rendering index, and obtain the qualified color rendering power range corresponding to the sample gallium oxide-based diode based on the color rendering index line graph.

[0030] Further, step S23 includes the following steps:

[0031] Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the P1 drive power;

[0032] During the operation of the sample gallium oxide-based diode, a colorimetric monitoring period is marked. Several colorimetric monitoring time points are selected within the colorimetric monitoring period. The colorimetric index of the sample gallium oxide-based diode at each colorimetric monitoring time point is obtained using a colorimeter. The average of the obtained multiple colorimetric indices is calculated to obtain the P1 steady-state colorimetric index.

[0033] Further, step S25 includes the following steps:

[0034] In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state color rendering index is marked as the vertical axis, thus obtaining the steady-state color rendering index coordinate system;

[0035] In the steady-state color rendering index coordinate system, the point where P1 driving power is used as the abscissa and P1 steady-state color rendering index is used as the ordinate is marked as the P1 efficiency coordinate point. Similarly, the point where P2 driving power is used as the abscissa and P2 steady-state color rendering index is used as the ordinate is marked as the P2 efficiency coordinate point. And so on, the point where Pb driving power is used as the abscissa and Pb steady-state color rendering index is used as the ordinate is marked as the Pb efficiency coordinate point.

[0036] Furthermore, step S25 also includes the following steps:

[0037] Connect the P1 efficiency coordinate point to the Pb efficiency coordinate point in sequence to obtain the color rendering index coordinate broken line, and re-mark the steady-state color rendering index coordinate system as a color rendering index broken line graph;

[0038] In the color rendering index (CRI) line graph, a reference CRI feature point is set on the y-axis. A straight line perpendicular to the y-axis is drawn through the reference CRI feature point to obtain the reference CRI feature line. The area of ​​the CRI coordinate line above the reference CRI feature line is marked as a qualified CRI line. The numerical range of the abscissa corresponding to the qualified CRI line is obtained to obtain the qualified CRI power range.

[0039] Further, step S3 includes the following steps:

[0040] S31: Obtain the qualified color rendering power range and the qualified luminous efficacy power range respectively. Obtain the power range value covered by the qualified color rendering power range to obtain the first performance index range value. Obtain the power range value covered by the qualified luminous efficacy power range to obtain the second performance index range value.

[0041] S32: Obtain the first performance index range benchmark value and the second performance index range benchmark value respectively, calculate the difference between the first performance index range value and the first performance index range benchmark value to obtain the first performance index deviation, and calculate the difference between the second performance index range value and the second performance index range benchmark value to obtain the second performance index deviation.

[0042] S33: If both the deviation of the first performance index and the deviation of the second performance index are greater than or equal to 0, then the performance test of the sample gallium oxide-based diode is deemed qualified.

[0043] S34: If either the first performance index deviation or the second performance index deviation is less than 0, then the performance test of the sample gallium oxide-based diode is deemed unqualified.

[0044] The beneficial effects of this invention are:

[0045] First, by establishing a quantitative model of luminous efficacy-power characteristics, luminous flux data from multiple monitoring points are collected using an integrating sphere spectroradiometer to eliminate transient fluctuation interference and ensure the stability of luminous efficacy evaluation. Simultaneously, a visual coordinate system is used to present the efficiency decay trend, intuitively identifying the nonlinear characteristics of the power-efficiency relationship and supporting multi-range qualification determination, thereby improving the accuracy of luminous efficacy performance testing.

[0046] Secondly, by employing a time-segmented steady-state monitoring mechanism, the colorimeter is used to dynamically track the color rendering index, establishing a power-color rendering performance mapping relationship, eliminating transient color deviation interference, and ensuring the accuracy of color rendering index evaluation. Through analysis of the intersection of the benchmark color rendering threshold and the coordinate broken line, the power window that meets the color reproduction requirements is automatically identified, thereby improving the accuracy of color rendering performance detection.

[0047] Finally, by combining dual evaluation indicators (luminous efficacy and color rendering performance), a complete luminous performance evaluation matrix is ​​constructed, which not only ensures energy efficiency compliance but also guarantees color quality, providing comprehensive and accurate data support for the performance testing of gallium oxide-based diodes.

[0048] In summary, this invention, through scientific quantitative models and visualization analysis methods, solves the problem of insufficient accuracy in the detection of luminous efficacy and color rendering performance in existing technologies, significantly improves the reliability and practicality of the detection results, and provides important technical support for the performance evaluation of gallium oxide-based diodes. Attached Figure Description

[0049] Figure 1 This is an overall system block diagram of the present invention;

[0050] Figure 2 This is a line graph showing the luminous efficiency in this invention;

[0051] Figure 3 This is a line graph of the color rendering index in this invention. Detailed Implementation

[0052] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. The illustrative embodiments and descriptions herein are used to explain the present invention, but are not intended to limit the present invention.

[0053] Example 1

[0054] Please see Figure 1 This invention provides a technical solution: a method for testing the epitaxial structure performance of a gallium oxide-based diode, comprising the following specific steps:

[0055] S1: Obtain the target diode to be tested, set several preset power for the target diode to be tested, obtain the luminous efficiency value of the target diode to be tested at each preset power, and draw a power luminous efficiency coordinate graph accordingly. Obtain the qualified luminous efficiency power range corresponding to the target diode to be tested based on the power luminous efficiency coordinate graph.

[0056] Step S1 further includes the following specific steps:

[0057] The gallium oxide-based diodes that need to be tested for performance are acquired, resulting in multiple gallium oxide-based diodes. A sample gallium oxide-based diode is then selected from the acquired multiple gallium oxide-based diodes.

[0058] It should be noted here that:

[0059] In this application, the gallium oxide-based diode specifically refers to a gallium oxide-based light-emitting diode;

[0060] In the process of detecting the luminous efficiency of the sample gallium oxide-based diode, the value of 0 is taken as the lower limit of the luminous efficiency driving power range, and the rated power corresponding to the sample gallium oxide-based diode is taken as the upper limit of the luminous efficiency driving power range, thus obtaining the preset range of luminous efficiency driving power.

[0061] The preset range of light effect driving power is divided into several light effect driving powers, and the power value between each two consecutive light effect driving powers is equal. The several light effect driving powers are then labeled as Q1 driving power to Qa driving power according to their numerical values.

[0062] It should be noted here that:

[0063] In this application, Q is a symbol corresponding to the light effect driving power, and a is a quantity value corresponding to the light effect driving power, and a is an integer greater than 0.

[0064] Please see Figure 2 The luminous efficiency of the sample gallium oxide-based diodes under the Q1 driving power was monitored, and the steady-state luminous efficiency of Q1 was obtained based on the monitoring results.

[0065] Specifically as follows:

[0066] Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the Q1 drive power;

[0067] During the operation of the sample gallium oxide-based diode, a luminous efficacy monitoring cycle is marked. Several luminous efficacy monitoring time points are selected within the luminous efficacy monitoring cycle. The luminous flux of the sample gallium oxide-based diode at each luminous efficacy monitoring time point is obtained through an integrating sphere spectroradiometer, resulting in multiple monitored luminous fluxes.

[0068] The ratio of each monitored luminous flux to the Q1 driving power is obtained to obtain multiple monitored luminous efficacy values. The average of the multiple monitored luminous efficacy values ​​is then calculated to obtain the steady-state luminous efficacy of Q1.

[0069] Repeat the process of obtaining the steady-state luminous efficiency of Q1, and obtain the steady-state luminous efficiency of the sample gallium oxide-based diodes at driving powers from Q2 to Qa, respectively, to obtain the steady-state luminous efficiency from Q2 to Qa.

[0070] A luminous efficiency line graph is created based on the driving power of Q1 to the driving power of Qa and the steady-state luminous efficiency of Q1 to the steady-state luminous efficiency of Qa. The qualified luminous efficiency power range corresponding to the sample gallium oxide-based diode is obtained based on the luminous efficiency line graph.

[0071] Specifically as follows:

[0072] In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state luminous efficiency is marked as the vertical axis to obtain the steady-state luminous efficiency coordinate system.

[0073] In the steady-state luminous efficiency coordinate system, the coordinate point with Q1 driving power as the abscissa and Q1 steady-state luminous efficiency as the ordinate is marked as the Q1 efficiency coordinate point; the coordinate point with Q2 driving power as the abscissa and Q2 steady-state luminous efficiency as the ordinate is marked as the Q2 efficiency coordinate point; and so on, the coordinate point with Qa driving power as the abscissa and Qa steady-state luminous efficiency as the ordinate is marked as the Qa efficiency coordinate point.

[0074] Connect the efficiency coordinate points Q1 to Qa sequentially to obtain the luminous efficiency coordinate broken line, and re-mark the steady-state luminous efficiency coordinate system as a luminous efficiency broken line graph;

[0075] In the luminous efficacy line graph, a reference luminous efficacy feature point is set on the y-axis. A straight line perpendicular to the y-axis is drawn through the reference luminous efficacy feature point to obtain the reference luminous efficacy feature line. The area of ​​the luminous efficacy line above the reference luminous efficacy feature line is marked as the qualified luminous efficacy line. The interval values ​​of the abscissa corresponding to the qualified luminous efficacy line are obtained to obtain the qualified luminous efficacy power range.

[0076] It should be noted here that:

[0077] There can be multiple acceptable luminous efficacy power ranges involved here.

[0078] The above step S1 has the following advantages:

[0079] Step S1 constructs a quantitative model of luminous efficacy-power characteristics in luminous performance testing. Through equally spaced power sampling and steady-state efficiency monitoring, a continuous curve of luminous efficacy versus power is plotted, and a qualified operating range is dynamically defined based on a benchmark efficiency threshold. This step achieves three core functions: First, it acquires luminous flux data from multiple monitoring points using an integrating sphere spectroradiometer, eliminating transient fluctuation interference and ensuring the stability of efficiency assessment; second, it uses a coordinate system to visualize the efficiency decay trend, intuitively identifying the nonlinear characteristics of the power-efficiency relationship; and third, it supports multi-range qualified range determination, adapting to the energy efficiency requirements of devices in different application scenarios and providing data support for diode performance testing.

[0080] S2: Obtain the target diode to be tested, set several characteristic powers for the target diode to be tested, obtain the color rendering index value of the target diode to be tested at each characteristic power, and draw a color rendering index coordinate graph accordingly. Obtain the qualified color rendering power range corresponding to the target diode to be tested based on the color rendering index coordinate.

[0081] Step S2 further includes the following specific steps:

[0082] A sample gallium oxide-based diode is obtained. During the color rendering index detection of the sample gallium oxide-based diode, the value of 0 is used as the lower limit of the color rendering driving power range, and the rated power corresponding to the sample gallium oxide-based diode is used as the upper limit of the color rendering driving power range, thus obtaining the preset range of color rendering driving power.

[0083] The preset range of color driving power is divided into several color driving powers, and the power value between any two consecutive color driving powers is equal. The several color driving powers are then labeled as P1 driving power to Pb driving power according to their numerical values.

[0084] It should be noted here that:

[0085] In this application, P is a symbol corresponding to color driving power, b is a quantity value corresponding to color driving power, and b is an integer greater than 0.

[0086] The color rendering index of the sample gallium oxide-based diode under P1 driving power was monitored, and the steady-state color rendering index of P1 was obtained based on the monitoring results.

[0087] Specifically as follows:

[0088] Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the P1 drive power;

[0089] During the operation of the sample gallium oxide-based diode, a color development monitoring cycle is marked. Several color development monitoring time points are selected in the color development monitoring cycle. The color development index of the sample gallium oxide-based diode at each color development monitoring time point is obtained by a colorimeter. The average of the obtained multiple color development indices is calculated to obtain the P1 steady-state color development index.

[0090] Repeat the process of obtaining the steady-state color rendering index of P1, and obtain the steady-state color rendering index of the sample gallium oxide-based diodes at driving power from P2 to Pb, respectively, to obtain the steady-state color rendering index from P2 to Pb.

[0091] A color rendering index line graph is created based on the P1 driving power to the Pb driving power and the P1 steady-state color rendering index to the Pb steady-state color rendering index. The qualified color rendering power range corresponding to the sample gallium oxide-based diode is obtained based on the color rendering index line graph.

[0092] Specifically as follows:

[0093] In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state color rendering index is marked as the vertical axis, thus obtaining the steady-state color rendering index coordinate system;

[0094] Please see Figure 3 In the steady-state color rendering index coordinate system, the coordinate point with P1 driving power as the abscissa and P1 steady-state color rendering index as the ordinate is marked as the P1 efficiency coordinate point. The coordinate point with P2 driving power as the abscissa and P2 steady-state color rendering index as the ordinate is marked as the P2 efficiency coordinate point. And so on, the coordinate point with Pb driving power as the abscissa and Pb steady-state color rendering index as the ordinate is marked as the Pb efficiency coordinate point.

[0095] Connect the P1 efficiency coordinate point to the Pb efficiency coordinate point in sequence to obtain the color rendering index coordinate broken line, and re-mark the steady-state color rendering index coordinate system as a color rendering index broken line graph;

[0096] In the color rendering index (CRI) line graph, a reference CRI feature point is set on the y-axis. A straight line perpendicular to the y-axis is drawn through the reference CRI feature point to obtain the reference CRI feature line. The area of ​​the CRI coordinate line above the reference CRI feature line is marked as a qualified CRI line. The numerical range of the horizontal coordinate corresponding to the qualified CRI line is obtained to obtain the qualified CRI power range.

[0097] It should be noted here that:

[0098] There can be multiple acceptable color rendering power ranges involved here.

[0099] The following advantages exist in step S2 above:

[0100] Step S2 refines the color rendering dimension evaluation system for luminous performance testing by dynamically tracking the color rendering index using a colorimeter and establishing a power-color rendering performance mapping relationship. The key functions of this step are: first, it employs a time-segmented steady-state monitoring mechanism to eliminate transient color shift interference and ensure the accuracy of the color rendering index evaluation; second, it automatically identifies the power window that meets color reproduction requirements through the intersection analysis of the benchmark color rendering threshold and the coordinate broken line; finally, it forms a complementary detection dimension with the luminous efficacy range in Step S1, constructing a complete luminous performance evaluation matrix that ensures both energy efficiency compliance and color quality, providing dual evaluation indicators for diode performance testing.

[0101] S3: Perform performance testing on the sample gallium oxide-based diodes according to the qualified color rendering power range and the qualified luminous efficacy power range, and issue performance warnings based on the test results;

[0102] Step S3 further includes the following steps:

[0103] The qualified color rendering power range and the qualified luminous efficacy power range are obtained respectively. The power range value covered by the qualified color rendering power range is obtained to obtain the first performance index range value. The power range value covered by the qualified luminous efficacy power range is obtained to obtain the second performance index range value.

[0104] Obtain the first performance index range benchmark value and the second performance index range benchmark value respectively, calculate the difference between the first performance index range value and the first performance index range benchmark value to obtain the first performance index deviation, and calculate the difference between the second performance index range value and the second performance index range benchmark value to obtain the second performance index deviation.

[0105] It should be noted here that:

[0106] In this application, several historical gallium oxide-based diodes that have passed performance testing are obtained, and the first performance index range value corresponding to each historical gallium oxide-based diode is obtained. The minimum value among the multiple first performance index range values ​​is marked as the first performance index range benchmark value. The second performance index range value corresponding to each historical gallium oxide-based diode is obtained, and the minimum value among the multiple second performance index range values ​​is marked as the second performance index range benchmark value.

[0107] The historical gallium oxide-based diodes mentioned here are the same type of gallium oxide-based diodes as the sample gallium oxide-based diodes.

[0108] If both the deviation of the first performance index and the deviation of the second performance index are greater than or equal to 0, then the performance test of the sample gallium oxide-based diode is deemed to be qualified.

[0109] If either the first performance index deviation or the second performance index deviation is less than 0, then the sample gallium oxide-based diode is deemed to have failed the performance test.

[0110] In this application, if a corresponding calculation formula appears, the above calculation formula is a dimensionless calculation. The weighting coefficient, proportional coefficient and other coefficients in the formula are set to quantify each parameter to obtain a result value. The size of the weighting coefficient and proportional coefficient is only required to not affect the proportional relationship between the parameter and the result value.

[0111] The technical solutions of the present invention are not limited to the specific embodiments described above. Any technical modifications made in accordance with the technical solutions of the present invention fall within the protection scope of the present invention.

Claims

1. A method for testing the epitaxial structure performance of a gallium oxide-based diode, characterized in that, Includes the following steps: Step S1: Obtain the target diode to be tested, set several preset power for the target diode to be tested, obtain the luminous efficiency value of the target diode to be tested at each preset power, and draw a power luminous efficiency coordinate graph accordingly. Obtain the qualified luminous efficiency power range corresponding to the target diode to be tested based on the power luminous efficiency coordinate graph. Step S2: Obtain the target diode to be tested. Set several characteristic powers for the target diode to be tested. Obtain the color rendering index value of the target diode to be tested at each characteristic power. Draw a color rendering index coordinate graph based on this. Obtain the qualified color rendering power range corresponding to the target diode to be tested based on the color rendering index coordinate graph. Step S3: Perform performance testing on the sample gallium oxide-based diodes according to the qualified color rendering power range and the qualified luminous efficacy power range, and issue performance warnings based on the test results; Step S1 includes the following specific steps: S11: Select one sample gallium oxide diode from among the multiple gallium oxide diodes that need to be tested for performance. S12: In the process of detecting the luminous efficiency of the sample gallium oxide-based diode, the value 0 is taken as the lower limit of the luminous efficiency driving power range, and the rated power corresponding to the sample gallium oxide-based diode is taken as the upper limit of the luminous efficiency driving power range, so as to obtain the preset range of luminous efficiency driving power. S13: Divide the preset range of light effect driving power into Q1 driving power to Qa driving power; S141: Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the Q1 drive power; S142: During the operation of the sample gallium oxide-based diode, a luminous efficacy monitoring cycle is marked. Several luminous efficacy monitoring time points are selected in the luminous efficacy monitoring cycle. The luminous flux of the sample gallium oxide-based diode at each luminous efficacy monitoring time point is obtained by using an integrating sphere spectroradiometer, and multiple monitoring luminous fluxes are obtained. S143: Obtain the ratio of each monitored luminous flux to the Q1 driving power to obtain multiple monitored luminous efficacy values, and calculate the average of the multiple monitored luminous efficacy values ​​to obtain the steady-state luminous efficiency of Q1. S15: Obtain the steady-state luminous efficiency of the sample gallium oxide-based diodes at driving power from Q2 to Qa, and obtain the steady-state luminous efficiency from Q2 to Qa. S16: Create a luminous efficiency line graph based on the Q1 driving power to the Qa driving power and the Q1 steady-state luminous efficiency to the Qa steady-state luminous efficiency, and obtain the qualified luminous efficiency power range corresponding to the sample gallium oxide-based diode based on the luminous efficiency line graph; Step S2 includes the following specific steps: S21: Obtain a sample gallium oxide-based diode. During the color rendering index detection of the sample gallium oxide-based diode, take the value 0 as the lower limit of the color rendering driving power range and take the rated power corresponding to the sample gallium oxide-based diode as the upper limit of the color rendering driving power range to obtain the preset range of color rendering driving power. S22: Divide the preset range of color rendering drive power into P1 drive power to Pb drive power; S231: Connect the sample gallium oxide-based diode to the power-on circuit, and adjust the circuit power corresponding to the power-on circuit to the P1 drive power; S232: During the operation of the sample gallium oxide-based diode, a color development monitoring cycle is marked. Several color development monitoring time points are selected in the color development monitoring cycle. The color development index of the sample gallium oxide-based diode at each color development monitoring time point is obtained by a colorimeter. The average of the obtained multiple color development indices is calculated to obtain the P1 steady-state color development index. S24: Obtain the steady-state color rendering index of the sample gallium oxide-based diodes at driving power from P2 to Pb, and obtain the steady-state color rendering index from P2 to Pb. S25: Create a color rendering index line graph based on the P1 driving power to the Pb driving power and the P1 steady-state color rendering index to the Pb steady-state color rendering index, and obtain the qualified color rendering power range corresponding to the sample gallium oxide-based diode based on the color rendering index line graph.

2. The method for testing the epitaxial structure performance of a gallium oxide-based diode according to claim 1, characterized in that, Step S16 includes the following specific steps: S161: In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state luminous efficiency is marked as the vertical axis to obtain the steady-state luminous efficiency coordinate system. S162: In the steady-state luminous efficiency coordinate system, the coordinate point with Q1 driving power as the abscissa and Q1 steady-state luminous efficiency as the ordinate is marked as the Q1 efficiency coordinate point. Similarly, the coordinate point with Qa driving power as the abscissa and Qa steady-state luminous efficiency as the ordinate is marked as the Qa efficiency coordinate point. S163: Connect the efficiency coordinate points Q1 to Qa sequentially to obtain the luminous efficiency coordinate broken line, and re-mark the steady-state luminous efficiency coordinate system as a luminous efficiency broken line graph.

3. The method for testing the epitaxial structure performance of a gallium oxide-based diode according to claim 2, characterized in that, Step S16 further includes: In the luminous efficacy line graph, a reference luminous efficacy feature point is set on the y-axis. A straight line perpendicular to the y-axis is drawn through the reference luminous efficacy feature point to obtain the reference luminous efficacy feature line. The area of ​​the luminous efficacy line above the reference luminous efficacy feature line is marked as the qualified luminous efficacy line. The interval values ​​of the abscissa corresponding to the qualified luminous efficacy line are obtained to obtain the qualified luminous efficacy power range.

4. The method for testing the epitaxial structure performance of a gallium oxide-based diode according to claim 1, characterized in that, Step S25 includes the following steps: S251: In the existing Cartesian coordinate system, the driving power is marked as the horizontal axis and the steady-state color rendering index is used as the vertical axis to obtain the steady-state color rendering index coordinate system. S252: In the steady-state color rendering index coordinate system, the coordinate point with P1 driving power as the abscissa and P1 steady-state color rendering index as the ordinate is marked as the P1 efficiency coordinate point. Similarly, the coordinate point with Pb driving power as the abscissa and Pb steady-state color rendering index as the ordinate is marked as the Pb efficiency coordinate point.

5. The method for testing the epitaxial structure performance of a gallium oxide-based diode according to claim 4, characterized in that, Step S25 includes the following steps: S251: Connect the P1 efficiency coordinate point to the Pb efficiency coordinate point in sequence to obtain the color rendering index coordinate broken line, and re-mark the steady-state color rendering index coordinate system as a color rendering index broken line graph; S252: On the y-axis of the color rendering index (CRI) graph, set a reference CRI feature point. Draw a straight line perpendicular to the y-axis through the reference CRI feature point to obtain the reference CRI feature line. Mark the area of ​​the CRI coordinate line above the reference CRI feature line as a qualified CRI line. Obtain the numerical range of the abscissa corresponding to the qualified CRI line to obtain the qualified CRI power range.

6. The method for testing the epitaxial structure performance of a gallium oxide-based diode according to claim 1, characterized in that, Step S3 includes the following steps: S31: Obtain the qualified color rendering power range and the qualified luminous efficacy power range respectively. Obtain the power range value covered by the qualified color rendering power range to obtain the first performance index range value. Obtain the power range value covered by the qualified luminous efficacy power range to obtain the second performance index range value. S32: Obtain the first performance index range benchmark value and the second performance index range benchmark value respectively, calculate the difference between the first performance index range value and the first performance index range benchmark value to obtain the first performance index deviation, and calculate the difference between the second performance index range value and the second performance index range benchmark value to obtain the second performance index deviation. S33: If both the deviation of the first performance index and the deviation of the second performance index are greater than or equal to 0, then the performance test of the sample gallium oxide-based diode is deemed qualified. S34: If either the first performance index deviation or the second performance index deviation is less than 0, then the performance test of the sample gallium oxide-based diode is deemed unqualified.

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