High-precision full-automatic single-mode and multi-mode full-index testing device

Abstract

The utility model provides a high-precision full-automatic single-mode and multi-mode full-index testing device. The high-precision full-automatic single-mode and multi-mode full-index testing device comprises a box body, a tester body is fixedly installed at the top of the box body, an air cylinder is fixedly installed at the top of an inner cavity of the box body, and a lifting seat is fixedly connected to the bottom of the air cylinder. According to the high-precision full-automatic single-mode and multi-mode full-index testing device provided by the utility model, through the arrangement of the first threaded rod, when a chip fixing test is carried out, a chip is fixed at the top of the positioning plate, and the rotating motor is started at the moment, so that the rotating motor drives the sliding block to move through the first threaded rod; according to the technical scheme, the chip is driven to move in a reciprocating mode, so that the position of the chip is adjusted through the scale groove, the effect of adjusting the fixing position of the chip is achieved, the problem that large errors occur in index testing when the installation position of the chip deviates is solved, and the accuracy of index testing is improved.

Description

Technical Field

[0001] The utility model relates to the field of index testing devices, in particular to a high-precision fully automatic single-mode and multi-mode full-index testing device. Background Art

[0002] The RF part of a mobile phone consists of two parts: RF receiving and RF transmitting. Its main circuits include antenna, wireless switch, receiving filter, frequency synthesizer, high-frequency amplification, receiving local oscillator, mixing, intermediate frequency, transmitting local oscillator, power amplifier control, power amplifier, etc. The prior art tests RF by transporting the RF module chip in the mobile phone to the inside of the RF test device, placing the chip in contact with the probe installed on the board, and then using the front baffle to close the entrance of the test device, transmitting signals to the RF module chip, and receiving signals generated by the RF module chip to test the strength of the RF signal.

[0003] In the existing technology, such as the "Mobile Phone Radio Frequency Index Test Device" with Chinese Authorization Announcement No. CN218888566U, it includes a tester housing, a placement table and a mobile bonding mechanism, the placement table is slidably connected to the tester housing, a test component is connected to the placement table, and the mobile bonding mechanism includes a driving component and a bonding component, the driving component is used to switch the placement table between a placement state and a test state, and the driving component can make the bonding component and the placement table linked; in the placement state, the placement table moves to the outside of the tester housing, and the bonding component moves away from the placement table; in the test state, the placement table moves to the inside of the tester housing, the bonding component moves toward the placement table and the bonding test component is bonded. By implementing the technical solution disclosed in the present invention, the problem of chip placement tilting and shaking, resulting in loose connection between the probe and the chip, and inaccurate testing can be solved, and the operation is simple and efficient.

[0004] When performing index testing in the existing technology, it is difficult to adjust the position of the chip due to the fixing components, which makes the chip prone to position deviation after being fixed, thereby causing the problem that chips with a large number of conductive pins are difficult to successfully install.

[0005] Therefore, it is necessary to provide a high-precision, fully-automatic single-mode and multi-mode full-index testing device to solve the above technical problems. Utility Model Content

[0006] The utility model provides a high-precision fully automatic single-mode and multi-mode full-index testing device, which solves the problem that it is difficult to adjust the position of the chip due to the fixing components, which makes the chip prone to position deviation after being fixed, thereby making it difficult to successfully install the chip with a large number of conductive pins.

[0007] In order to solve the above technical problems, the utility model provides a high-precision fully automatic single-mode and multi-mode full-index testing device, comprising a box body, a tester body is fixedly installed on the top of the box body, a cylinder is fixedly installed on the top of the inner cavity of the box body, a lifting seat is fixedly connected to the bottom of the cylinder, a connecting seat is fixedly sleeved on the bottom of the lifting seat, a limiting rod is fixedly connected to the top of the lifting seat, a support rod is fixedly connected to the side of the inner wall of the box body, a positioning seat is movably sleeved on the outside of the support rod, a rotating motor is fixedly installed on the front of the positioning seat, a No. 1 threaded rod is fixedly connected to the output shaft of the rotating motor, a slider is movably sleeved inside the positioning seat, a positioning plate is fixedly connected to the top of the slider, a scale groove is opened on the top of the positioning seat, and a sliding ball is movably sleeved on the top of the positioning seat, a fixing mechanism is arranged on the top of the positioning plate, a No. 2 threaded rod is sleeved on the internal thread of the positioning seat, a limiting mechanism is arranged on the front of the inner wall of the box body, and a moving mechanism is arranged at the bottom of the box body.

[0008] Preferably, the No. 1 threaded rod is threadedly sleeved inside the slider, and the No. 1 threaded rod is located in the middle of the slider.

[0009] Preferably, the cylinder and the positioning plate are perpendicular to each other, and the cylinder is located directly above the connecting seat.

[0010] Preferably, the limiting rod is movably sleeved on the top of the box body, and the number of the limiting rods is four, and the four limiting rods are parallel to each other.

[0011] Preferably, there are several sliding balls, and the several sliding balls are evenly distributed on the top of the positioning seat.

[0012] Preferably, the fixing mechanism comprises a fixing block, the fixing block is fixedly connected to the top of the positioning plate, the internal thread of the fixing block is sleeved with a threaded column, and one end of the threaded column is movably sleeved with a positioning sleeve.

[0013] Preferably, the No. 2 threaded rod and the support rod are parallel to each other, and the No. 2 threaded rod and the sliding block are perpendicular to each other.

[0014] Preferably, the limiting mechanism comprises a baffle, the baffle is fixedly connected to the front side of the inner wall of the box body, and a shock absorbing plate is fixedly connected to the side of the baffle.

[0015] Preferably, the moving mechanism comprises a support column, the support column is fixedly connected to the bottom of the box, and a sliding wheel is installed at the bottom of the support column.

[0016] Compared with the related art, the high-precision fully automatic single-mode and multi-mode full-index testing device provided by the utility model has the following beneficial effects:

[0017] The utility model provides a high-precision fully automatic single-mode and multi-mode full-index testing device. By setting a No. 1 threaded rod, when performing a chip fixing test, the chip is fixed on the top of a positioning plate, and a rotating motor is started at this time, so that the rotating motor can drive a slider to move through the No. 1 threaded rod, that is, drive the chip to move back and forth, so that the chip position can be adjusted through a scale groove, thereby achieving an adjustment effect of the chip fixing position, so that the problem of a large error in the index test caused by a deviation in the chip installation position is avoided, thereby improving the accuracy of the index test;

[0018] By setting up the cylinder, when the chip index test is required, the chip is moved to the bottom of the connecting seat, and the cylinder is started at this time, so that the cylinder can drive the connecting seat through the lifting seat to tightly squeeze the top of the chip, thereby achieving the effect of connecting the chip and the connecting seat. At this time, the tester body is started, so that the tester body can perform index tests on the chip through the connecting seat, thereby achieving the chip testing effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic structural diagram of a preferred embodiment of a high-precision, fully automatic single-mode and multi-mode full-index testing device provided by the utility model;

[0020] Figure 2 for Figure 1 A front view of a high-precision, fully automatic single-mode and multi-mode full-index testing device is shown;

[0021] Figure 3 for Figure 1 A front view of a cylinder in a high-precision fully automatic single-mode and multi-mode full-index testing device is shown;

[0022] Figure 4 for Figure 1 The front cross-sectional view of a positioning seat in a high-precision fully automatic single-mode and multi-mode full-index testing device is shown.

[0023] Numbers in the figure: 1. Box; 2. Tester body; 3. Cylinder; 4. Lifting seat; 5. Connecting seat; 6. Limit rod; 7. Support rod; 8. Positioning seat; 9. Rotating motor; 10. No. 1 threaded rod; 11. Sliding block; 12. Positioning plate; 13. Scale groove; 14. Sliding ball; 15. Fixing mechanism; 151. Fixing block; 152. Threaded column; 153. Positioning sleeve; 16. No. 2 threaded rod; 17. Limiting mechanism; 171. Baffle; 172. Shock-absorbing plate; 18. Moving mechanism; 181. Support column; 182. Sliding wheel. DETAILED DESCRIPTION

[0024] The utility model is further described below in conjunction with the accompanying drawings and implementation modes.

[0025] Please refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 ,in, Figure 1 A schematic structural diagram of a preferred embodiment of a high-precision, fully automatic single-mode and multi-mode full-index testing device provided by the utility model;

[0026] Figure 2 for Figure 1 A front view of a high-precision, fully automatic single-mode and multi-mode full-index testing device is shown; Figure 3 for Figure 1 A front view of a cylinder in a high-precision fully automatic single-mode and multi-mode full-index testing device is shown; Figure 4 for Figure 1 The front cross-sectional view of a positioning seat in a high-precision fully automatic single-mode and multi-mode full-index testing device is shown. A high-precision fully automatic single-mode and multi-mode full-index testing device comprises a box body 1, a tester body 2 is fixedly installed on the top of the box body 1, a cylinder 3 is fixedly installed on the top of the inner cavity of the box body 1, a lifting seat 4 is fixedly connected to the bottom of the cylinder 3, a connecting seat 5 is fixedly sleeved on the bottom of the lifting seat 4, a limiting rod 6 is fixedly connected to the top of the lifting seat 4, a support rod 7 is fixedly connected to the side of the inner wall of the box body 1, a positioning seat 8 is movably sleeved on the outside of the support rod 7, a rotating motor 9 is fixedly installed on the front of the positioning seat 8, a No. 1 threaded rod 10 is fixedly connected to the output shaft of the rotating motor 9, a slider 11 is movably sleeved inside the positioning seat 8, a positioning plate 12 is fixedly connected to the top of the slider 11, a scale groove 13 is opened on the top of the positioning seat 8, and a sliding ball 14 is movably sleeved on the top of the positioning seat 8, a fixing mechanism 15 is arranged on the top of the positioning plate 12, a No. 2 threaded rod 16 is sleeved on the internal thread of the positioning seat 8, a limiting mechanism 17 is arranged on the front of the inner wall of the box body 1, and a moving mechanism 18 is arranged on the bottom of the box body 1.

[0027] The No. 1 threaded rod 10 is threadedly sleeved on the inside of the slider 11, and the No. 1 threaded rod 10 is located in the middle of the slider 11; by setting the No. 1 threaded rod 10, when the chip fixing test is performed, the chip is fixed on the top of the positioning plate 12, and the rotating motor 9 is started at this time, so that the rotating motor 9 can drive the slider 11 to move through the No. 1 threaded rod 10, that is, drive the chip to move back and forth, so that the chip position can be adjusted through the scale groove 13, thereby achieving the effect of adjusting the chip fixing position, so that the problem of large errors in the index test caused by the deviation of the chip installation position is avoided, thereby improving the accuracy of the index test.

[0028] The cylinder 3 and the positioning plate 12 are perpendicular to each other, and the cylinder 3 is located directly above the connecting seat 5; by setting the cylinder 3, when the chip index test is required, the chip is moved to directly below the connecting seat 5, and the cylinder 3 is started at this time, so that the cylinder 3 can drive the connecting seat 5 to be tightly squeezed on the top of the chip through the lifting seat 4, thereby achieving the effect of connecting the chip and the connecting seat 5. At this time, the tester body 2 is started, so that the tester body 2 can perform index tests on the chip through the connecting seat 5, thereby achieving the chip testing effect.

[0029] The limiting rod 6 is movably sleeved on the top of the box body 1, and there are four limiting rods 6, and the four limiting rods 6 are parallel to each other; by setting the limiting rod 6, when the chip test is performed, the limiting rod 6 can limit the lifting seat 4 that moves up and down, so as to avoid the problem of error in the position of the connecting seat 5 caused by the displacement of the lifting seat 4 when it is lifted or lowered, thereby improving the accuracy of the position of the connecting seat 5.

[0030] There are several sliding balls 14, which are evenly distributed on the top of the positioning seat 8. By setting the sliding balls 14, when the position of the positioning plate 12 is adjusted, the sliding balls 14 can move the positioning plate 12, thereby avoiding the problem of friction between the positioning plate 12 and the top of the positioning seat 8 when moving, thereby improving the smoothness of the chip movement adjustment.

[0031] The fixing mechanism 15 includes a fixing block 151, which is fixedly connected to the top of the positioning plate 12. The internal thread of the fixing block 151 is sleeved with a threaded column 152, and one end of the threaded column 152 is movably sleeved with a positioning sleeve 153. By setting the fixing mechanism 15, when the chip is fixed, the chip is placed on the top of the positioning plate 12. At this time, the threaded column 152 is rotated so that the threaded column 152 can push the positioning sleeve 153 to be tightly squeezed on the side of the chip, so that the chip can be squeezed and fixed on the top of the positioning plate 12, thereby achieving the chip fixing effect.

[0032] The No. 2 threaded rod 16 is parallel to the support rod 7, and the No. 2 threaded rod 16 is perpendicular to the slider 11. By setting the No. 2 threaded rod 16, when the chip is tested, the chip is fixed on the top of the positioning plate 12. At this time, the No. 2 threaded rod 16 is rotated to drive the positioning seat 8 to move horizontally, that is, to drive the chip to move horizontally to the bottom of the connecting seat 5, thereby facilitating the movement of the chip.

[0033] The limiting mechanism 17 includes a baffle 171, which is fixedly connected to the front of the inner wall of the box body 1, and a shock-absorbing plate 172 is fixedly connected to the side of the baffle 171; by setting the limiting mechanism 17, when the chip is moved and transported, the baffle 171 can block and limit the horizontally moving positioning seat 8, so that the positioning seat 8 can be accurately moved to the bottom of the lifting seat 4 when it moves horizontally, thereby improving the accuracy of the chip position after movement.

[0034] The moving mechanism 18 includes a support column 181, which is fixedly connected to the bottom of the box body 1, and a sliding wheel 182 is installed at the bottom of the support column 181; by setting the moving mechanism 18, when the working position of the chip index testing device needs to be adjusted, the box body 1 is pushed so that the sliding wheel 182 can drive the box body 1 to move horizontally through the support column 181, that is, drive the tester body 2 to move horizontally, thereby facilitating the movement and transportation of the index testing device.

[0035] The working principle of a high-precision fully automatic single-mode and multi-mode full-index testing device provided by the utility model is as follows:

[0036] Step 1: First, when performing a chip fixing test, fix the chip on the top of the positioning plate 12. At this time, start the rotating motor 9, so that the rotating motor 9 can drive the slider 11 to move through the No. 1 threaded rod 10, that is, drive the chip to move back and forth, so that the chip position can be adjusted through the scale groove 13, thereby achieving the adjustment effect of the chip fixed position, so as to avoid the problem of large errors in the index test caused by the deviation of the chip installation position, thereby improving the accuracy of the index test. When the chip index test is required, move the chip to the bottom of the connecting seat 5, and start the cylinder 3 at this time, so that the cylinder 3 can drive the connecting seat 5 to squeeze tightly on the core through the lifting seat 4. The top of the chip is moved to the top of the chip, thereby achieving the effect of connecting the chip to the connecting seat 5. At this time, the tester body 2 is started, so that the tester body 2 can perform index test on the chip through the connecting seat 5, thereby achieving the chip test effect. When the chip is tested, the limit rod 6 can limit the lifting seat 4 that moves up and down, so as to avoid the problem of deviation of the lifting seat 4 during lifting and lowering, which leads to the error of the position of the connecting seat 5, thereby improving the accuracy of the position of the connecting seat 5. When adjusting the position of the positioning plate 12, the sliding ball 14 can move the moving positioning plate 12, thereby avoiding the problem of friction between the positioning plate 12 and the top of the positioning seat 8 when moving, thereby improving the smoothness of the chip movement adjustment;

[0037] Step 2: When fixing the chip, place the chip on the top of the positioning plate 12. At this time, rotate the threaded column 152 so that the threaded column 152 can push the positioning sleeve 153 to be tightly pressed on the side of the chip, so that the chip can be squeezed and fixed on the top of the positioning plate 12, thereby achieving the chip fixing effect. When testing the chip, fix the chip on the top of the positioning plate 12. At this time, rotate the No. 2 threaded rod 16 so that the No. 2 threaded rod 16 can drive the positioning seat 8 to move horizontally, that is, drive the chip to move horizontally to the bottom of the connecting seat 5, thereby facilitating the movement of the chip. When the chip is moved and transported, the baffle 171 can block and limit the horizontally moving positioning seat 8, so that the positioning seat 8 can be accurately moved to the bottom of the lifting seat 4 when it moves horizontally, thereby improving the accuracy of the position of the chip after movement. When it is necessary to adjust the working position of the chip index test device, push the box 1 so that the sliding wheel 182 can drive the box 1 to move horizontally through the support column 181, that is, drive the tester body 2 to move horizontally, thereby facilitating the movement and transportation of the index test device.

[0038] Compared with the related art, the high-precision fully automatic single-mode and multi-mode full-index testing device provided by the utility model has the following beneficial effects:

[0039] By setting a No. 1 threaded rod 10, when performing a chip fixing test, the chip is fixed on the top of the positioning plate 12. At this time, the rotating motor 9 is started, so that the rotating motor 9 can drive the slider 11 to move through the No. 1 threaded rod 10, that is, drive the chip to move back and forth, so that the chip position can be adjusted through the scale groove 13, thereby achieving the effect of adjusting the chip fixing position, avoiding the problem of large errors in the index test caused by deviations in the chip installation position, thereby improving the accuracy of the index test.

[0040] The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A high-precision fully automatic single-mode and multi-mode full-index testing device, comprising a box (1), characterized in that: The top of the box (1) is fixedly mounted with a tester body (2); the top of the inner cavity of the box (1) is fixedly mounted with a cylinder (3); the bottom of the cylinder (3) is fixedly connected with a lifting seat (4); the bottom of the lifting seat (4) is fixedly sleeved with a connecting seat (5); the top of the lifting seat (4) is fixedly connected with a limiting rod (6); the side of the inner wall of the box (1) is fixedly connected with a support rod (7); the outside of the support rod (7) is movably sleeved with a positioning seat (8); a rotating motor (9) is fixedly mounted on the front of the positioning seat (8); and the output shaft of the rotating motor (9) is fixedly mounted with a connecting seat (5). A first threaded rod (10) is fixedly connected, a slider (11) is movably sleeved inside the positioning seat (8), a positioning plate (12) is fixedly connected to the top of the slider (11), a scale groove (13) is opened on the top of the positioning seat (8), and a sliding ball (14) is movably sleeved on the top of the positioning seat (8), a fixing mechanism (15) is arranged on the top of the positioning plate (12), a second threaded rod (16) is sleeved on the internal thread of the positioning seat (8), a limiting mechanism (17) is arranged on the front of the inner wall of the box body (1), and a moving mechanism (18) is arranged on the bottom of the box body (1).

2. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The first threaded rod (10) is threadably sleeved inside the slider (11), and the first threaded rod (10) is located in the middle of the slider (11).

3. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The cylinder (3) and the positioning plate (12) are perpendicular to each other, and the cylinder (3) is located directly above the connecting seat (5).

4. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The limiting rod (6) is movably sleeved on the top of the box body (1), and there are four limiting rods (6), and the four limiting rods (6) are parallel to each other.

5. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The number of the sliding balls (14) is several, and the several sliding balls (14) are evenly distributed on the top of the positioning seat (8).

6. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The fixing mechanism (15) comprises a fixing block (151), the fixing block (151) is fixedly connected to the top of the positioning plate (12), the internal thread of the fixing block (151) is sleeved with a threaded column (152), and one end of the threaded column (152) is movably sleeved with a positioning sleeve (153).

7. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The second threaded rod (16) and the support rod (7) are parallel to each other, and the second threaded rod (16) and the sliding block (11) are perpendicular to each other.

8. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The limiting mechanism (17) comprises a baffle (171), the baffle (171) being fixedly connected to the front side of the inner wall of the box body (1), and a shock absorbing plate (172) being fixedly connected to the side of the baffle (171).

9. A high-precision fully automatic single-mode and multi-mode full-index testing device according to claim 1, characterized in that: The moving mechanism (18) comprises a support column (181), the support column (181) is fixedly connected to the bottom of the box body (1), and a sliding wheel (182) is installed at the bottom of the support column (181).

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