IST test module with single hole and hole chain

Abstract

The utility model discloses an I ST test module simultaneously provided with a single hole and a hole chain, which comprises a top solder mask layer, a bottom solder mask layer positioned on the other side of the top solder mask layer, a standard resistance circuit arranged on the top solder mask layer, a test module circuit positioned on one side of the standard resistance circuit, a first resistance circuit arranged on one side of the test module circuit, and a second resistance circuit arranged on the other side of the test module circuit. A second resistance circuit is arranged on the bottom solder mask layer, the test module circuit comprises a first resistance test wiring position and a second resistance test wiring position arranged on the other side of the first resistance test wiring position, a single-hole test circuit is arranged in a wiring section of the first resistance test wiring position, and the single-hole test circuit comprises a first test point; the second test point is arranged on the opposite side of the first test point, and a third test point and a fourth test point are arranged on one side of the first test point and one side of the second test point respectively. According to the utility model, the problem that the prior art lacks a test module structure capable of integrally measuring the resistance change rate of the circuit is solved.

Description

Technical Field

[0001] The utility model relates to the field of PCB testing, in particular to an IST testing module having both a single hole and a hole chain. Background Art

[0002] Interconnect Strength Test (IST) is an accelerated strength test method used to evaluate the integrity of printed PCB interconnection structures. IST testing is widely used in automotive board testing. With the development of electric vehicles, there are more and more functional and link control components in automotive circuit boards, and measuring resistance changes requires a module that can measure the resistance change of the overall circuit and the resistance change of a single circuit. Measure the resistance change rate of the overall circuit and a single circuit.

[0003] The existing IST is a daisy-hole chain that measures the resistance change rate of hundreds of holes. The disadvantage is that if the resistance change rate of a single or a small number of holes exceeds the standard, it will be flattened by the resistance change rate of hundreds of holes and cannot be discovered.

[0004] In view of this, the present technical solution proposes an IST test module with both a single hole and a hole chain, which retains the hole chain and adds a single hole. The resistance change rate of both the hole chain and the single hole can be measured. Utility Model Content

[0005] The technical solution of the utility model aims to solve one of the technical problems in the related art at least to a certain extent. To this end, the main purpose of the utility model is to provide an IST test module with both a single hole and a hole chain, aiming to solve the problem in the prior art that there is a lack of a test module structure that can perform an overall measurement of the circuit resistance change rate.

[0006] To achieve the above object, the utility model provides an IST test module with both a single hole and a hole chain, comprising a PCB composed of a top solder resist layer and a bottom solder resist layer located on the other side of the top solder resist layer.

[0007] The top solder resist layer is provided with a standard resistance circuit and a test module circuit located on one side of the standard resistance circuit, and the test module circuit is provided with a first resistance circuit on one side.

[0008] A second resistance circuit is provided on the bottom solder resist layer.

[0009] The test module circuit includes a first resistance test wiring position and a second resistance test wiring position arranged on the other side of the first resistance test wiring position, wherein a single-hole test circuit is arranged in a wiring section of the first resistance test wiring position.

[0010] The single-hole test circuit includes a first test point and a second test point arranged on the opposite side of the first test point. A third test point and a fourth test point are respectively arranged on one side of the first test point and the second test point. The first test point and the third test point are respectively connected in parallel with the second test point and the fourth test point.

[0011] As a further solution of the utility model, the standard resistance circuit includes a fifth test point, a sixth test point, a seventh test point and an eighth test point arranged in sequence, and the fifth test point and the sixth test point are respectively connected in parallel with the seventh test point and the eighth test point.

[0012] As a further solution of the present invention, the first resistance circuit and the second resistance circuit are located at the center of the circuit and are connected through a single hole.

[0013] As a further solution of the present invention, the areas of the first resistance circuit and the second resistance circuit are equal to the area of ​​the standard resistance circuit.

[0014] The beneficial effects of the utility model are as follows:

[0015] The utility model proposes an IST test module with both a single hole and a hole chain. By setting the IST test module with both a single hole and a hole chain, this module retains the hole chain and adds a single hole. The resistance change rate of the hole chain and the single hole can be measured. The module can measure the resistance change of the overall circuit and the resistance change rate of a single circuit. Measure the resistance change rate of the overall circuit and the resistance change rate of a single circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the utility model technical solution or the utility model technical solution in the prior art, the drawings required for use in the embodiments or the prior art descriptions will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the utility model technical solution. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0017] Figure 1 It is a schematic diagram of the test module circuit and the first resistor circuit arranged on the top solder resist layer in the present invention.

[0018] Figure 2 It is a schematic diagram of the bottom solder resist layer and the second resistor circuit in the present invention.

[0019] Figure 3 This is a schematic diagram of setting up each test point of the standard resistance circuit in the utility model.

[0020] Figure 4The figure is a schematic diagram showing the arrangement of the test points of the single-hole test circuit in the present invention.

[0021] Figure 5 This is a schematic diagram of the current chain hole test module circuit.

[0022] Figure 6 This is a schematic diagram of another type of chain hole test module circuit.

[0023] [Main parts / assembly reference numerals]

[0024] Label name Label name 1 PCB 130 First resistor circuit 10 Top solder mask 131 Second resistor circuit 11 First resistor circuit 132 Single hole test line 12 Standard resistance circuit 1320 First test point 120 Fifth test point 1321 Second test point 121 The sixth test point 1322 The third test point 122 Seventh test point 1323 The fourth test point 123 The eighth test point 14 Bottom solder mask 13 Test module circuit 140 Second resistor circuit DETAILED DESCRIPTION

[0025] as follows:

[0026] Please see attached Figure 1-6 ,

[0027] The main structure includes a PCB1 composed of a top solder resist layer 10 and a bottom solder resist layer 14 located on the other side of the top solder resist layer 10, the top solder resist layer 10 is provided with a standard resistance circuit 12, and a test module circuit 13 located on one side of the standard resistance circuit 12, a first resistance circuit 13011 is provided on one side of the test module circuit 13, a second resistance circuit 140131 is provided on the bottom solder resist layer 14, the test module circuit 13 includes a first resistance test wiring position, and a second resistance circuit 140131 is arranged on the other side of the first resistance test wiring position. A single-hole test circuit 132 is provided in the wiring section of the first resistance test wiring position, and the single-hole test circuit 132 includes a first test point 1320 and a second test point 1321 arranged on the opposite side of the first test point 1320. A third test point 1322 and a fourth test point 1323 are respectively provided on one side of the first test point 1320 and the second test point 1321. The first test point 1320 and the third test point 1322 are respectively connected in parallel with the second test point 1321 and the fourth test point 1323.

[0028] Here’s how it works:

[0029] This technical solution adds a single-hole test module (single-hole test circuit 132) to the normal IST test module (test module circuit 13), uses the single-hole IST to measure the resistance minus the resistance of the standard resistance circuit 12, and measures the rate of change of resistance.

[0030] Specifically, the first resistance circuit 13011 and the second resistance circuit 140131 are equal to the standard resistance circuit 12, that is, the sum of the areas of the first resistance circuit 13011 and the second resistance circuit 140131 is equal to the area of ​​the standard resistance circuit 12; the first resistance circuit 13011, the second resistance circuit 140131 and the inner layer of the standard resistance circuit 12 are not designed with graphics; the first resistance circuit 13011 and the second resistance circuit 140131 are at the center of the circuit and are connected by a single hole.

[0031] Measurement method: When testing the resistance of the standard resistance circuit 12, use a resistance tester, with one test needle at the fifth test point 120 and the sixth test point 121, and the other test needle at the seventh test point 122 and the eighth test point 123, to measure the resistance.

[0032] Single-hole IST test: After preprocessing, use the IST tester to test, connect the first test point 1320 and the second test point 1321 to one incoming line, and connect the third test point 1322 and the fourth test point 1323 to one incoming line to perform IST test.

[0033] Resistance change rate measurement: Subtract the resistance of the standard resistance circuit 12 from the resistance measured by the single-hole IST, and calculate the resistance change rate based on the subtracted value.

[0034] A preferred embodiment of the present invention: the standard resistance circuit 12 includes a fifth test point 120, a sixth test point 121, a seventh test point 122 and an eighth test point 123 arranged in sequence, and the fifth test point 120 and the sixth test point 121 are respectively connected in parallel with the seventh test point 122 and the eighth test point 123.

[0035] A preferred embodiment of the present invention: the first resistance circuit 13011 and the second resistance circuit 140131 are located at the center of the circuit and are connected through a single hole.

[0036] A preferred embodiment of the present invention: the areas of the first resistance circuit 13011 and the second resistance circuit 140131 are equal to the area of ​​the standard resistance circuit 12.

[0037] The above description is only a preferred embodiment of the technical solution of the utility model, and does not limit the patent scope of the technical solution of the utility model. All equivalent structural changes made by using the contents of the technical solution description and drawings of the utility model under the conception of the technical solution of the utility model, or direct / indirect application in other related technical fields are included in the patent protection scope of the technical solution of the utility model.

Claims

1. An IST test module with both single-hole and hole chain, characterized in that: include A PCB consisting of a top solder resist layer and a bottom solder resist layer located on the other side of the top solder resist layer, The top solder resist layer is provided with a standard resistance circuit and a test module circuit located on one side of the standard resistance circuit, and the test module circuit is provided with a first resistance circuit on one side. A second resistance circuit is provided on the bottom solder resist layer. The test module circuit includes a first resistance test wiring position and a second resistance test wiring position arranged on the other side of the first resistance test wiring position, wherein a single-hole test circuit is arranged in a wiring section of the first resistance test wiring position. The single-hole test circuit includes a first test point and a second test point arranged on the opposite side of the first test point. A third test point and a fourth test point are respectively arranged on one side of the first test point and the second test point. The first test point and the third test point are respectively connected in parallel with the second test point and the fourth test point.

2. The IST test module having both a single hole and a hole chain according to claim 1, characterized in that: The standard resistance circuit includes a fifth test point, a sixth test point, a seventh test point and an eighth test point which are arranged in sequence, and the fifth test point and the sixth test point are connected in parallel with the seventh test point and the eighth test point respectively.

3. The IST test module with both a single hole and a hole chain according to claim 1, characterized in that: The first resistance circuit and the second resistance circuit are located at the center of the circuit and are connected through a single hole.

4. The IST test module with both a single hole and a hole chain according to claim 1, characterized in that: The areas of the first resistance circuit and the second resistance circuit are equal to the area of ​​the standard resistance circuit.

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