EL test probe and photovoltaic module test device

By designing horizontal contacts and arc-shaped connections of EL test probes, combined with insulating material blocks and drive components, the problem of poor contact of existing probes is solved, the detection effect and compatibility are improved, and the service life is extended.

CN222169772UActive Publication Date: 2024-12-13HANWHA SOLARONE QIDONG
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Patent Information

Application Number
CN202323659467.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2023-12-29
Publication Date
2024-12-13
Estimated Expiration
2033-12-29

AI Technical Summary

Technical Problem

The inclination surface and thickness of the existing EL test probes are large, which leads to the lifting of the extruded bus bar, poor contact, and poor downward pressure on the inverted cone surface of the press, resulting in failure of detection.

Method used

Design an EL test probe, the contact part and the surface of the connecting part are horizontal planes, the width is smaller than the connecting part, the mounting part is arranged perpendicularly, and an arc-shaped surface is provided at the connection between the contact part and the connecting part, and the insulation is matched. The material is made of briquetting and drive assembly to ensure good contact between the probe and the bus bar and stable pressure.

Benefits of technology

It achieves good contact between the probe and the bus bar, avoids damage, improves detection effect, enhances compatibility and service life, and facilitates maintenance.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to an EL test probe and a photovoltaic assembly test device, the probe is made of metal materials, the probe comprises a body and an installation portion, the body comprises a contact portion and a connection portion, the contact portion is connected with one end of the connection portion, the upper surface and the lower surface of the contact portion are both horizontal planes, and the installation portion is arranged on the installation portion. The upper surface of the contact part and the upper surface of the connecting part are positioned on the same plane, and the lower surface of the contact part and the lower surface of the connecting part are positioned on the same plane; the installation part is connected with the other end of the connection part and is vertically arranged. The width of the contact part is smaller than that of the connection part. The probe provided by the utility model is provided with the contact part and the connecting part, the upper surface and the lower surface of the contact part are horizontal planes, the upper surface of the contact part and the upper surface of the connecting part are positioned on the same plane, and the lower surface of the contact part and the lower surface of the connecting part are positioned on the same plane, so that the contact part is in good contact with a bus bar, and the bus bar cannot be damaged; the matching with the pressing block is easy; the compatibility is very strong, the service life is long and the maintenance is convenient.
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Description

Technical Field

[0001] The utility model relates to an EL test probe and a photovoltaic component test device. Background Art

[0002] EL stands for Electro Luminescence, which can also be called electronic luminescence detection. By using the electroluminescence principle of crystalline silicon, a high-resolution infrared camera is used to capture near-infrared images of crystalline silicon. The acquired images are analyzed and processed by image software to detect whether the solar cell components have hidden cracks, fragments, cold solder joints, broken grids, and abnormal phenomena of single-chip cells with different conversion efficiencies.

[0003] The probe of the existing extruded busbar has an inclined surface, see Fig.11 After squeezing the busbar, the busbar will still be lifted; the probe is thick and will hit the busbar when tightened; the pressure block has an inverted cone surface, see Fig.12 , the contact is not good when pressing down, resulting in test failure. Utility Model Content

[0004] The utility model aims to provide an EL test probe and a photovoltaic component test device to improve the detection effect.

[0005] In order to achieve the above object, a technical solution adopted by the utility model is:

[0006] An EL test probe, the probe is made of metal material, the probe comprises a body and a mounting portion, the body comprises a contact portion and a connecting portion, the contact portion is connected to one end of the connecting portion, the upper surface and the lower surface of the contact portion are both horizontal planes, the upper surface of the contact portion and the upper surface of the connecting portion are located in the same plane, and the lower surface of the contact portion and the lower surface of the connecting portion are located in the same plane; the mounting portion is connected to the other end of the connecting portion and is vertically arranged, and the width of the contact portion is smaller than the width of the connecting portion.

[0007] In some embodiments, a connection point between the contact portion and one end of the connection portion has an arc-shaped surface.

[0008] In some embodiments, the contact portion is connected to a middle portion of one end of the connecting portion.

[0009] In some embodiments, the width of the mounting portion is equal to that of the connecting portion; and the thickness of the main body is 0.5-1.5 mm.

[0010] In some embodiments, a mounting hole is provided on the mounting portion.

[0011] Another technical solution adopted by the utility model is:

[0012] A photovoltaic module testing device, comprising the EL test probe, the device further comprising two probe fixings, a pressure block, a probe driving assembly, and a pressure block driving assembly, wherein two probes are provided, the probe fixing is connected to the probes, the probe driving assembly is connected to the two probe fixings to drive the probe fixings to move toward or away from each other, the pressure block driving assembly is connected to the pressure block to drive the pressure block to move in a vertical direction, the pressure block is made of insulating material, the pressure block comprises a main body, and a convex plate arranged at the lower side of the main body, and the convex plate is perpendicular to the main body;

[0013] The device has a working state. When in the working state, the contact portion of the body is arranged horizontally, the contact portion is located below the bus bar, and the convex plate of the pressing block abuts against the two probes and the bus bar.

[0014] In some embodiments, the probe fixture contacts the connecting portion and the mounting portion of the probe, and a mounting hole corresponding to the mounting hole of the mounting portion of the probe is provided on the probe fixture, and the probe fixture is connected to the probe by installing a fastener in the mounting hole.

[0015] In some embodiments, the probe holder is in a cube shape.

[0016] In some embodiments, the device further comprises a connecting plate, wherein the connecting plate is located between the probe drive assembly and the pressure block drive assembly, the probe drive assembly, the pressure block drive assembly and the connecting plate are all connected, and the pressure block is located below the connecting plate.

[0017] In some embodiments, the device further comprises a lifting assembly, and the lifting assembly is connected to the probe driving assembly to drive the probe driving assembly to move in a vertical direction.

[0018] Due to the application of the above technical solution, the utility model has the following advantages compared with the prior art:

[0019] The EL test probe provided by the utility model is provided with a contact part and a connecting part, the upper surface and the lower surface of the contact part are both horizontal planes, the upper surface of the contact part and the upper surface of the connecting part are located in the same plane, and the lower surface of the contact part and the lower surface of the connecting part are located in the same plane, the contact part has good contact with the bus bar and will not damage the bus bar, and is easy to cooperate with the pressure block; the compatibility is extremely strong, the service life is long, and the maintenance is convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Attached Figure 1A structural diagram of a photovoltaic module testing device provided by the utility model from a first perspective;

[0021] Attached Figure 2 A structural diagram of the photovoltaic module testing device provided by the utility model from a second viewing angle;

[0022] Attached Figure 3 A structural diagram of the EL test probe and the probe fixing member provided by the utility model from a first perspective;

[0023] Attached Figure 4 A structural diagram of the EL test probe and the probe fixing member provided by the utility model from a second viewing angle;

[0024] Attached Figure 5 A structural diagram of the EL test probe provided by the utility model from the first perspective;

[0025] Attached Figure 6 A structural diagram of the EL test probe provided by the utility model from a second viewing angle;

[0026] Attached Figure 7 A structural diagram of a first-view structure of a pressing block provided by the utility model;

[0027] Attached Figure 8 A structural diagram of a pressing block provided by the utility model from a second perspective;

[0028] Attached Fig. 9 A structural diagram of another structure of a pressing block provided by the utility model from a first perspective;

[0029] Attached Fig.10 A structural diagram from a second perspective of another structure of a pressing block provided by the utility model;

[0030] Attached Fig.11 is a structural diagram of an existing probe;

[0031] Attached Fig.12 This is a structural diagram of an existing briquette.

[0032] In the above attached figure:

[0033] 1-probe, 11-contact part, 12-connecting part, 13-mounting part, 131-mounting hole, 14-arc surface;

[0034] 2-probe fixing piece;

[0035] 3-pressing block, 31-main body, 32-convex plate, 33-convex part;

[0036] 4-probe drive assembly; 5-pressing block drive assembly; 6-connecting plate; 7-lifting assembly; 8-bus bar; 9-battery cell. DETAILED DESCRIPTION

[0037] The technical solution of the utility model will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0038] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0039] One end of the bus bar 8 passes through the battery cell and is located above the battery cell. The bus bar 8 located above the battery cell 9 extends upward, that is, a gap is maintained between the bus bar 8 and the battery cell.

[0040] Example 1

[0041] See also Figures 3 to 6 The EL test probe 1 shown is made of metal material. The probe 1 includes a body and a mounting portion 13. The body includes a contact portion 11 and a connecting portion 12. The contact portion 11 is connected to one end of the connecting portion 12 and is located in the same plane. The upper surface and the lower surface of the contact portion 11 are both horizontal planes. The upper surface of the contact portion 11 and the upper surface of the connecting portion 12 are located in the same plane, and the lower surface of the contact portion 11 and the lower surface of the connecting portion 12 are located in the same plane, that is, the thickness of the contact portion 11 and the connecting portion 12 are consistent, and the bus bar 8 can be better flattened in cooperation with the pressing block 3 when in contact with the bus bar 8; the mounting portion 13 is connected to the other end of the connecting portion 12 and is vertically arranged, and the width of the contact portion 11 is smaller than the width of the connecting portion 12; a mounting hole 131 is opened on the mounting portion 13.

[0042] In a preferred embodiment, the contact portion 11 is connected to the middle of one end of the connecting portion 12, and the main body has a symmetrical structure and is stable as a whole.

[0043] In this example, the connection between the contact portion 11 and one end of the connection portion 12 has an arc surface 14 (rounded corners), which reduces the resistance when the probe 1 is inserted between the bus bar 8 and the battery cell while ensuring strength, and avoids damage to the product due to excessive contact area. The smooth edge will not scratch the product. Figure 6The radius (indicated by R2) can be 5mm.

[0044] In this example, the width of the mounting portion 13 is equal to that of the connecting portion 12. The thickness of the body is in the range of 0.5-1.5 mm, and can be 1 mm; the width of the body is in the range of 8-15 mm; the length of the body is in the range of 30-40 mm, which has strong compatibility and is suitable for busbars 8 of various sizes; the length of the connecting portion 12 is in the range of 10-20 mm.

[0045] Example 2

[0046] See also Figures 1 to 10 The photovoltaic module testing device shown in the figure includes an EL test probe 1, two probe fixtures 2, a pressing block 3, a probe driving assembly 4, and a pressing block driving assembly 5. Two EL test probes 1 are provided, and the two EL test probes 1 are arranged opposite to each other. The probe fixture 2 is connected to the probe 1, and the probe driving assembly 4 is connected to the two probe fixtures 2 to drive the probe fixtures 2 to move toward or away from each other; the pressing block 3 is used to press the bus bar 8; the pressing block 3 is made of insulating material, such as plastic; the pressing block driving assembly 5 is connected to the pressing block 3 to drive the pressing block 3 to move in the vertical direction.

[0047] See also Figure 1-2 The two probe fixing members 2 are arranged opposite to each other, and the probe fixing members 2 are in contact with the connecting portion 12 and the mounting portion 13 of the probe 1, that is, the bottom surface of the probe fixing member 2 is in contact with the upper surface of the connecting portion 12, and the side surface of the probe fixing member 2 is in contact with a side surface of the mounting portion 13 facing the connecting portion 12, so as to better fix the probe 1.

[0048] In one embodiment, the probe fixture 2 is made of an insulating material; a mounting hole 131 corresponding to the mounting hole 131 of the mounting portion 13 of the probe 1 is provided on the probe fixture 2, and a plurality of mounting holes 131 may be provided, and the probe fixture 2 is connected to the probe 1 by installing a fastener in the mounting hole 131. The probe fixture 2 may be in a cubic shape, and the height of the probe fixture 2 is greater than the height of the mounting portion 13. The portion of the probe fixture 2 that exceeds the mounting portion 13 is provided with a mounting hole 131 for easy installation of the fastener, and the fastener is a bolt and nut assembly.

[0049] See also Figure 7-8 The pressing block 3 includes a main body 31 and a convex plate 32 arranged on the lower side of the main body 31. The convex plate 32 is perpendicular to the main body 31. The main body 31 can be a cube and the convex plate 32 can be a cube. The convex plate 32 is arranged at the left end (or right end) of the lower side of the main body 31. One end face (left end face) of the convex plate 32 is flush with one end face (left end face) of the main body 31 (the same vertical face), that is, an L shape is formed.

[0050] The lower end surface of the convex plate 32 away from the main body 31 is a horizontal surface. In the working state, the convex plate 32 faces the battery cell located below, and the convex plate 32 of the pressing block abuts against the two probes.

[0051] In some embodiments, see Figure 9-10 A protrusion 33 is provided on one side of the protrusion 32 away from the main body 31. The protrusion 33 extends away from the main body 31. The protrusion 33 can be located in the middle of one side of the protrusion 32. When the probe 1 is pressed, the protrusion 33 can be pressed against the two probes 1 to avoid deformation of the busbar contacted by the probe 1 and avoid defects.

[0052] The device also includes a connecting plate 6, which is located between the probe drive assembly 4 and the pressure block drive assembly 5. The probe drive assembly 4, the pressure block drive assembly 5 and the connecting plate 6 are all connected. The pressure block 3 is located below the connecting plate 6. The connecting plate 6 can be connected to the bracket to support and fix the probe drive assembly 4 and the pressure block drive assembly 5.

[0053] In some embodiments, the pressure block driving assembly 5 may be a cylinder; the probe driving assembly 4 may be a parallel opening and closing finger cylinder.

[0054] The device also includes a lifting assembly 7, which is connected to the probe driving assembly 4 to drive the probe driving assembly 4 to move in the vertical direction. In this example, the probe driving assembly 4 is connected to the connecting plate 6, and the pressing block driving assembly 5 is connected to the connecting plate 6. Under the drive of the lifting assembly 7, the probe driving assembly 4, the pressing block driving assembly 5, the pressing block 3, the probe 1, and the probe fixing member 2 can all move in the vertical direction.

[0055] The working process of the photovoltaic module testing device in this example is as follows: the battery cell moves to the bottom of the device, the two probes 1 first move downward to a suitable position, and then the two probes 1 move toward each other until the contact portion 11 of one probe 1 is located under one bus bar 8, and the contact portion 11 of the other probe 1 is located under another bus bar 8; next, the pressing block 3 moves downward to abut against the contact portions 11 of the two probes 1 and the bus bar 8, so that the bus bar 8 is no longer tilted, and finally the battery cell is removed, the device returns to its original position, and the above actions are repeated when the next battery cell comes over.

[0056] The above embodiments are only for illustrating the technical concept and features of the utility model, and their purpose is to enable people familiar with the technology to understand the content of the utility model and implement it accordingly, and they cannot be used to limit the protection scope of the utility model. Any equivalent changes or modifications made according to the spirit of the utility model should be included in the protection scope of the utility model.

Claims

1. An EL test probe, characterized in that: The probe is made of metal material, and the probe includes a body and a mounting portion, the body includes a contact portion and a connecting portion, the contact portion is connected to one end of the connecting portion, the upper surface and the lower surface of the contact portion are both horizontal planes, the upper surface of the contact portion and the upper surface of the connecting portion are located in the same plane, and the lower surface of the contact portion and the lower surface of the connecting portion are located in the same plane; the mounting portion is connected to the other end of the connecting portion and is vertically arranged, and the width of the contact portion is smaller than the width of the connecting portion.

2. The EL test probe according to claim 1, characterized in that: The connection point between the contact portion and one end of the connection portion has an arc surface.

3. The EL test probe according to claim 1, characterized in that: The contact portion is connected to the middle portion of one end of the connecting portion.

4. The EL test probe according to claim 1, characterized in that: The width of the mounting portion is equal to that of the connecting portion; the thickness of the main body is 0.5-1.5 mm.

5. The EL test probe according to claim 1, characterized in that: The mounting portion is provided with a mounting hole.

6. A photovoltaic module testing device, characterized in that: The EL test probe comprises the EL test probe as described in any one of claims 1 to 5, the device further comprises two probe fixings, a pressure block, a probe driving assembly, and a pressure block driving assembly, two probes are provided, the probe fixings are connected to the probes, the probe driving assembly is connected to the two probe fixings to drive the probe fixings to move toward or away from each other, the pressure block driving assembly is connected to the pressure block to drive the pressure block to move in a vertical direction, the probe fixings and the pressure block are both made of insulating materials, the pressure block comprises a main body, a convex plate arranged on the lower side of the main body, and the convex plate is perpendicular to the main body; The device has a working state. When in the working state, the contact portion of the body is arranged horizontally, the contact portion is located below the bus bar, and the convex plate of the pressing block abuts against the two probes and the bus bar.

7. The photovoltaic module testing device according to claim 6, characterized in that: The probe fixing part contacts the connecting part and the mounting part of the probe, and a mounting hole corresponding to the mounting hole of the mounting part of the probe is opened on the probe fixing part. The probe fixing part is connected to the probe by installing a fastener in the mounting hole.

8. The photovoltaic module testing device according to claim 6, characterized in that: The probe fixing piece is in a cube shape.

9. The photovoltaic module testing device according to claim 6, characterized in that: The device also includes a connecting plate, which is located between the probe drive assembly and the pressure block drive assembly. The probe drive assembly, the pressure block drive assembly and the connecting plate are all connected, and the pressure block is located below the connecting plate.

10. The photovoltaic module testing device according to claim 6, characterized in that: The device also includes a lifting assembly, which is connected to the probe driving assembly and is used to drive the probe driving assembly to move in a vertical direction.