Spring probe for semiconductor sealing detection

Abstract

The utility model discloses a spring probe for semiconductor sealing detection, which relates to the technical field of semiconductor sealing detection and comprises a sleeve, a spring mounting unit and a probe stabilizing unit. The sleeve is of a slender hollow cylindrical structure; the spring mounting unit comprises an end cover, a spring clamping block, a spring, a plug block, a clamping block and a socket; the probe stabilizing unit is installed on the lower side of the sleeve. According to the utility model, the reliable spring installation unit is provided, the spring can be effectively installed and fixed, the spring is prevented from displacing in the sleeve, the plug block is plugged into the lower end of the spring, and the clamping block clamps the spring from the lower side, thereby enabling the elastic force of the spring to act on the socket, enabling the probe to have the restoring force of automatic resetting when the probe contracts, and improving the detection precision. A reliable probe stabilizing unit is arranged, a short connecting rod is used for installing arc-shaped clamping blocks, the three arc-shaped clamping blocks clamp the outer side of a cylindrical socket together, and therefore it is ensured that the socket slides stably in the vertical direction.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor packaging and testing, in particular to a spring probe for semiconductor packaging and testing. Background Art

[0002] The semiconductor production process is as follows: It consists of wafer manufacturing, wafer testing, chip packaging and post-packaging testing. Semiconductor packaging testing refers to the process of processing the tested wafers into independent chips according to product models and functional requirements. By testing semiconductor products before packaging, faulty products can be discovered in time to reduce subsequent losses;

[0003] Spring probes are often used in the prior art to perform semiconductor testing. However, the existing spring probe tools lack the ability to fix the internal spring components. In addition, when the probe is tilted due to force during its extension and retraction, the probe cannot slide smoothly, thereby affecting the normal production testing of the semiconductor. To this end, we propose a spring probe for semiconductor packaging and testing. Utility Model Content

[0004] The technical problem to be solved by the utility model is to overcome the existing defects and provide a spring probe for semiconductor packaging and testing. The spring probe has a reliable spring installation unit, which can effectively install and fix the spring to prevent the spring from being displaced inside the sleeve. The plug is inserted into the lower end of the spring, and the clamping block clamps the spring from the bottom, so that the elastic force of the spring acts on the socket, so that the probe can have a restoring force for automatic reset when it is contracted. The utility model also has a reliable probe stabilizing unit, and a short connecting rod is used for the installation of the arc clamping block. The three arc clamping blocks are clamped together on the outside of the cylindrical socket, thereby ensuring the smooth sliding of the socket in the up and down directions, which can effectively solve the problems in the background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a spring probe for semiconductor packaging and testing, comprising a sleeve, a spring mounting unit and a probe stabilizing unit;

[0006] Sleeve: It is a slender hollow cylindrical structure;

[0007] Spring installation unit: comprising an end cover, a spring block, a spring, a plug, a block and a socket, the upper end of the sleeve is threadedly connected to the end cover, the inner end of the end cover is fixedly connected to the center of the circle, the upper end of the spring is clamped on the outside of the spring block, the upper and lower ends of the block are respectively fixedly connected to a plug and a socket, the plug is plugged inside the lower end of the spring, the socket is a cylindrical structure and has a circular slot inside;

[0008] Probe fixing unit: Installed on the lower side of the sleeve.

[0009] The sleeve is used for the installation of the spring and the probe. The end cover closes the upper end of the sleeve and clamps the spring from the upper side. The spring clamp block can limit the spring to prevent the spring from moving inside the sleeve. The socket is used for the insertion of the probe. The block is inserted into the lower end of the spring. The clamp block clamps the spring from the bottom, thereby applying the elastic force of the spring to the socket, so that the probe can have a restoring force for automatic reset when it is retracted. The probe stabilization unit is used to ensure the stability of the probe during extension and retraction.

[0010] Furthermore, the spring installation unit also includes a conductive terminal and a friction strip. The conductive terminal is embedded and installed inside the plug, and the upper and lower ends of the conductive terminal extend slightly respectively. A circle of friction strips is fixedly connected to the outer circumference of the end cap. The conductive terminal realizes conductive connection between the probe and the end cap through a wire, and the friction strip can easily twist the end cap.

[0011] Furthermore, the probe stabilizing unit comprises a probe, a contact and a limit block, the probe is inserted into the sleeve, and the upper end of the probe is inserted into the circular slot inside the socket, the lower end of the probe is screwed and connected with the contact, and the outer middle part of the probe is fixedly connected with the limit block. The contact is used to contact the semiconductor terminal.

[0012] Furthermore, the probe stabilizing unit further comprises a plug, a nozzle and a gasket. The plug is a mushroom-shaped structure and is screwed and connected to the lower end of the sleeve through a short threaded column at the upper end. The plug is hollow inside and a ring-shaped nozzle is fixedly connected to the lower end. The limit block is clamped on the upper side of the nozzle, and a gasket is placed between the nozzle and the limit block. The plug is screwed and connected to the sleeve, and then the nozzle blocks the limit block, thereby limiting the distance the probe slides outward. The gasket can reduce the noise generated when the limit block contacts the nozzle.

[0013] Furthermore, the probe stabilizing unit also includes a connecting short rod and an arc-shaped clamping block. Three connecting short rods are fixedly connected to the circumference of the lower middle position of the inner wall of the sleeve. The three connecting short rods are all horizontally facing the central axis of the sleeve, and an arc-shaped clamping block is fixedly connected to the end of each connecting short rod. The arc-shaped clamping block is clamped on the outside of the socket. The connecting short rod is used to install the arc-shaped clamping block. The three arc-shaped clamping blocks are clamped together on the outside of the cylindrical socket, thereby ensuring the smooth sliding of the socket in the up and down directions.

[0014] Furthermore, it also includes a hand grip groove and a hand pinching groove. The outer side of the sleeve is provided with an inwardly concave hand grip groove, and the outer side of the circumference of the plug is provided with three hand pinching grooves in an array. The hand grip groove facilitates the hand to hold the sleeve tightly, and the hand pinching groove facilitates the fingers to pinch the plug, so as to conveniently tighten or disassemble.

[0015] Compared with the prior art, the beneficial effects of the utility model are: the spring probe for semiconductor packaging and testing has the following advantages:

[0016] 1. It has a reliable spring installation unit, which can effectively install and fix the spring to prevent the spring from shifting inside the sleeve. The plug is inserted into the lower end of the spring, and the clamping block clamps the spring from the bottom, so that the elastic force of the spring acts on the socket, so that the probe can have a restoring force to automatically reset when it is retracted;

[0017] 2. It has a reliable probe stabilizing unit, which is connected with a short rod for installing the arc-shaped clamping block. The three arc-shaped clamping blocks are clamped together on the outside of the cylindrical socket to ensure the smooth sliding of the socket in the up and down directions;

[0018] 3. The utility model has a reliable spring installation unit, which can effectively install and fix the spring to prevent the spring from being displaced inside the sleeve. The plug is inserted into the lower end of the spring, and the clamping block clamps the spring from the bottom, so that the elastic force of the spring acts on the socket, so that the probe can have a restoring force for automatic reset when it is retracted, and has a reliable probe stabilizing unit. The short rod is connected for the installation of the arc-shaped clamping block. The three arc-shaped clamping blocks are clamped together on the outside of the cylindrical socket, thereby ensuring smooth sliding of the socket in the up and down directions. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the structure of the utility model;

[0020] Figure 2 This is an internal cross-sectional view of the utility model;

[0021] Figure 3 It is an internal bottom view of the utility model.

[0022] In the figure: 1 sleeve, 2 spring mounting unit, 21 end cover, 22 spring block, 23 spring, 24 plug block, 25 block, 26 socket, 27 conductive terminal, 28 friction strip, 3 probe stabilizing unit, 31 probe, 32 contact, 33 limit block, 34 plug, 35 nozzle, 36 washer, 37 connecting short rod, 38 arc clamp block, 4 hand grip groove, 5 hand pinch groove. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] See also Figure 1-Figure 3 ,This embodiment provides a technical solution: a spring probe for semiconductor packaging and testing, comprising a sleeve 1, a spring mounting unit 2 and a probe stabilizing unit 3;

[0025] Sleeve 1: It is a slender hollow cylindrical structure;

[0026] Spring installation unit 2: includes an end cover 21, a spring block 22, a spring 23, a plug 24, a block 25 and a socket 26. The upper end of the sleeve 1 is threadedly connected with the end cover 21, and the spring block 22 is fixedly connected at the center position of the inner end of the end cover 21. The upper end of the spring 23 is clamped on the outer side of the spring block 22. The upper and lower ends of the block 25 are respectively fixedly connected with a plug 24 and a socket 26. The plug 24 is plugged inside the lower end of the spring 23. The socket 26 is a cylindrical structure and has a circular slot inside.

[0027] Probe fixing unit 3: installed on the lower side of sleeve 1.

[0028] The sleeve 1 is used for the installation of the spring 23 and the probe 31. The end cover 21 closes the upper end of the sleeve 1 and holds the spring 23 in place from the upper side. The spring block 22 can limit the spring 23 to prevent the spring 23 from being displaced inside the sleeve 1. The socket 26 is used for the insertion of the probe 31. The plug 24 is inserted into the lower end of the spring 23. The block 25 holds the spring 23 from the lower side, thereby applying the elastic force of the spring 23 to the socket 26, so that the probe 31 can have a restoring force for automatic reset when it is retracted. The probe stabilizing unit 3 is used to ensure the stability of the probe 31 during the extension and retraction process.

[0029] The spring mounting unit 2 further includes a conductive terminal 27 and a friction strip 28. The conductive terminal 27 is embedded and mounted inside the plug 24. The upper and lower ends of the conductive terminal 27 extend slightly, and a circle of friction strips 28 are fixedly connected to the outer circumference of the end cap 21. The conductive terminal 27 realizes conductive connection between the probe 31 and the end cap 21 through a wire, and the friction strip 28 can easily twist the end cap 21.

[0030] The probe stabilizing unit 3 comprises a probe 31, a contact 32 and a limit block 33. The probe 31 extends into the sleeve 1, and the upper end of the probe 31 is inserted into the circular slot inside the socket 26. The lower end of the probe 31 is screwed and connected with the contact 32, and the outer middle part of the probe 31 is fixedly connected with the limit block 33. The contact 32 is used to contact the semiconductor terminal.

[0031] The probe stabilizing unit 3 further comprises a plug 34, a nozzle 35 and a washer 36. The plug 34 is a mushroom-shaped structure and is screwed and connected to the lower end of the sleeve 1 through a short threaded column at the upper end. The plug 34 is hollow inside and a ring-shaped nozzle 35 is fixedly connected to the lower end. The limit block 33 is clamped on the upper side of the nozzle 35, and a washer 36 is padded between the nozzle 35 and the limit block 33. The plug 34 is screwed and connected to the sleeve 1, and then the nozzle 35 blocks the limit block 33, thereby limiting the distance that the probe 31 slides outward. The washer 36 can reduce the noise generated when the limit block 33 contacts the nozzle 35.

[0032] The probe stabilizing unit 3 also includes a connecting short rod 37 and an arc-shaped clamping block 38. Three connecting short rods 37 are fixedly connected to the circumference of the lower middle position of the inner wall of the sleeve 1. The three connecting short rods 37 are all horizontally facing the central axis of the sleeve 1, and an arc-shaped clamping block 38 is fixedly connected to the end of each connecting short rod 37. The arc-shaped clamping block 38 is clamped on the outside of the socket 26. The connecting short rod 37 is used to install the arc-shaped clamping block 38. The three arc-shaped clamping blocks 38 are clamped together on the outside of the cylindrical socket 26, thereby ensuring the smooth sliding of the socket 26 in the up and down directions.

[0033] The sleeve 1 is provided with a hand-grip groove 4 and a hand-pinch groove 5. The outer side of the sleeve 1 is provided with a concave hand-grip groove 4, and the outer side of the circumference of the plug 34 is provided with three hand-pinch grooves 5 in an array. The hand-grip groove 4 is convenient for the hand to hold the sleeve 1 tightly, and the hand-pinch groove 5 is convenient for the fingers to hold the plug 34, so as to conveniently tighten or disassemble.

[0034] The working principle of a spring probe for semiconductor packaging and testing provided by the utility model is as follows: when installing the device, first insert the socket 26 into the sleeve 1 from the upper side, the arc-shaped clamping block 38 can block the card block 25, and then limit the position of the socket 26, then install the spring 23, and screw on the end cover 21, the spring card block 22 at the lower end of the end cover 21 can limit the spring 23 to prevent the spring 23 from being displaced inside the sleeve 1, the socket 26 is used for the insertion of the probe 31, the plug block 24 is inserted into the lower end of the spring 23, and the card block 25 clamps the spring 23 from the bottom, so that the elastic force of the spring 23 acts on the socket 26, so that the probe 31 can have a restoring force for automatic reset when it shrinks. The contact 32 is used to contact the semiconductor terminal. The plug 34 is connected to the sleeve 1 by screwing it, and then the stopper 35 blocks the limit block 33, thereby limiting the distance that the probe 31 slides outward. The washer 36 can reduce the noise generated when the limit block 33 contacts the nozzle 35. The connecting short rod 37 is used to install the arc clamp 38. The three arc clamps 38 are clamped together on the outside of the cylindrical socket 26 to ensure the smooth sliding of the socket 26 in the up and down directions. In addition, the conductive terminal 27 realizes the conductive connection between the probe 31 and the end cover 21 through the wire, and the friction strip 28 can easily turn the end cover 21. The hand grip groove 4 is convenient for the hand to hold the sleeve 1, and the hand pinching groove 5 is convenient for the fingers to pinch the plug 34, so as to conveniently tighten or disassemble.

[0035] The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A spring probe for semiconductor packaging and testing, characterized in that: It comprises a sleeve (1), a spring mounting unit (2) and a probe fixing unit (3); Sleeve (1): a slender hollow cylindrical structure; The spring installation unit (2) comprises an end cover (21), a spring clamping block (22), a spring (23), a plugging block (24), a clamping block (25) and a socket (26); the upper end of the sleeve (1) is threadedly connected to the end cover (21); the spring clamping block (22) is fixedly connected at the center position of the inner end of the end cover (21); the upper end of the spring (23) is clamped on the outer side of the spring clamping block (22); the upper and lower ends of the clamping block (25) are respectively fixedly connected to a plugging block (24) and a socket (26); the plugging block (24) is plugged into the lower end of the spring (23); the socket (26) is a cylindrical structure and has a circular slot therein; Probe fixing unit (3): Installed on the lower side of the sleeve (1).

2. A spring probe for semiconductor packaging and testing according to claim 1, characterized in that: The spring mounting unit (2) further comprises a conductive terminal (27) and a friction strip (28); the conductive terminal (27) is embedded and mounted inside the plug (24); the upper and lower ends of the conductive terminal (27) extend slightly respectively; and a circle of friction strips (28) is fixedly connected to the outer circumferential array of the end cover (21).

3. The spring probe for semiconductor packaging and testing according to claim 1, characterized in that: The probe stabilizing unit (3) comprises a probe (31), a contact (32) and a limit block (33); the probe (31) extends into the sleeve (1), and the upper end of the probe (31) is inserted into a circular slot inside the socket (26); the lower end of the probe (31) is screwed and connected to the contact (32); and the middle outer side of the probe (31) is fixedly connected to the limit block (33).

4. The spring probe for semiconductor packaging and testing according to claim 3, characterized in that: The probe stabilizing unit (3) further comprises a plug (34), a nozzle (35) and a gasket (36); the plug (34) is a mushroom-shaped structure and is screwed and connected to the lower end of the sleeve (1) via a short threaded column at the upper end; the inside of the plug (34) is hollow and a ring-shaped nozzle (35) is fixedly connected to the lower end; the limiting block (33) is clamped on the upper side of the nozzle (35), and a gasket (36) is placed between the nozzle (35) and the limiting block (33).

5. The spring probe for semiconductor packaging and testing according to claim 1, characterized in that: The probe stabilizing unit (3) further comprises a connecting short rod (37) and an arc-shaped clamping block (38). Three connecting short rods (37) are fixedly connected to the circumference of the lower middle portion of the inner wall of the sleeve (1). The three connecting short rods (37) are all horizontally oriented toward the central axis of the sleeve (1), and an arc-shaped clamping block (38) is fixedly connected to the end of each connecting short rod (37). The arc-shaped clamping block (38) is clamped on the outer side of the socket (26).

6. The spring probe for semiconductor packaging and testing according to claim 4, characterized in that: It also comprises a hand grip groove (4) and a hand pinching groove (5), wherein the outer side of the sleeve (1) is provided with an inwardly concave hand grip groove (4), and the outer side of the circumference of the cock (34) is provided with three hand pinching grooves (5) in an array.

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