Optical storage all-in-one machine test system based on mutual use of current sensors

By using the current sensor interoperability system in the detection of the optical storage all-in-one machine, the number of current sensors and power analyzers is reduced, and the problems of high cost and complex operation of the optical storage all-in-one machine detection equipment are solved, achieving efficient detection efficiency.

CN222192309UActive Publication Date: 2024-12-17XUCHANG KETOP DETECTION TECH CO LTD
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Patent Information

Application Number
CN202420914346.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-04-29
Publication Date
2024-12-17
Estimated Expiration
2034-04-29

AI Technical Summary

Technical Problem

The detection of the optical storage all-in-one machine requires more current sensors and power analyzers, resulting in high investment costs and complex operation of detection equipment. The existing four-channel power analyzers cannot meet their detection needs.

Method used

Design an all-in-one optical storage machine test system based on current sensor interoperability, using a power analyzer with seven voltage acquisition channels, a DC-side current sensor and three AC-side current sensors for grid-connected/off-grid interoperability , the current data is transmitted to the power analyzer through the current sensor power supply box, reducing the number of current sensors and power analyzers.

Benefits of technology

It effectively reduces the investment cost of testing equipment, improves the detection efficiency, and realizes efficient detection of optical storage all-in-one machines.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The utility model discloses an optical storage all-in-one machine test system based on mutual use of current sensors. The system is provided with a power analyzer with seven voltage acquisition channels, and a current sensor A at a DC side. The three current sensors B are located on the alternating current side and used for the grid-connected test and the off-grid test; and the current sensor power supply box is used for providing working voltage for the current sensors and transmitting current data of the current sensors A and the current sensors B to the power analyzer. According to the optical storage all-in-one machine test system, only one power analyzer and four current sensors are needed, so that one power analyzer and three current sensors are reduced, and the current sensor B1, the current sensor B2 and the current sensor B3 are used as alternating current sensors during grid-connected and off-grid tests; therefore, the optical storage all-in-one machine test system can effectively reduce the detection cost and improve the detection efficiency.
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Description

Technical Field

[0001] The utility model relates to the technical field of electrical control detection, in particular to an optical storage integrated machine testing system based on the mutual use of current sensors. Background Art

[0002] At present, conventional photovoltaic inverters and energy storage converter detection ports are one DC voltage port and three AC grid voltage ports, and the number of detection ports is relatively small. Therefore, a common four-channel power analyzer with four voltage acquisition channels and four current sensors can be used to achieve the detection of corresponding projects, such as a photovoltaic inverter low voltage ride-through test device disclosed in Chinese patent announcement No. CN204967761U.

[0003] The photovoltaic and energy storage integrated device (hereinafter referred to as the device under test) integrates the functions of the photovoltaic inverter and the energy storage converter to realize the integration of photovoltaic power generation and energy storage. The photovoltaic and energy storage integrated device is a device used in microgrid systems, which realizes the conversion of DC / AC power. Compared with photovoltaic inverters or energy storage converters, the photovoltaic and energy storage integrated device has three additional AC load voltage ports. The current four-channel power analyzer cannot meet its detection requirements, so a four-channel power analyzer needs to be added. More importantly, the photovoltaic and energy storage integrated device test requires the addition of three additional current sensors. In other words, the photovoltaic and energy storage integrated device detection requires the use of two four-channel power analyzers and 7 current sensors to achieve the detection task. The actual operation is relatively complicated, which will greatly increase the detection cost.

[0004] Therefore, in view of the shortcomings of the existing technology, it is necessary to provide an integrated optical storage device testing system based on the mutual use of current sensors to solve the shortcomings of the existing technology. Utility Model Content

[0005] The purpose of the utility model is to avoid the shortcomings of the prior art and provide a test system for an integrated optical storage device based on the mutual use of current sensors. Compared with the prior art, the test system for an integrated optical storage device based on the mutual use of current sensors reduces the use of three current sensors and a four-channel power analyzer, thereby reducing the investment cost of the detection equipment and improving the detection efficiency.

[0006] The above-mentioned purpose of the utility model is achieved through the following technical measures:

[0007] Provided is a test system for an integrated optical storage device based on the mutual use of current sensors. The system comprises a power analyzer with seven voltage acquisition channels, a current sensor A on the DC side, three current sensors B on the AC side and used in grid-connected testing and off-grid testing, and a current sensor power supply box for providing working voltages for the current sensors and transmitting current data of the current sensors A and B to the power analyzer. The three current sensors B are defined as current sensor B1, current sensor B2, and current sensor B3, respectively. The current sensor A passes through a DC connection path of a device under test, and the current sensors B1, B2, and B3 respectively pass through an AC connection path of the device under test. The power analyzer is connected to the current sensor power supply box.

[0008] The utility model is a photovoltaic storage integrated machine testing system based on the mutual use of current sensors, and is also provided with a load and an AC power supply device, wherein the load is respectively connected to the AC load A phase port, the AC load B phase port and the AC load C phase port of the device under test, and the AC power supply device is respectively connected to the AC grid A phase port, the AC grid B phase port and the AC grid C phase port of the device under test.

[0009] Preferably, the power connection line connecting the A phase port of the AC load and the load, and the power connection line connecting the A phase port of the AC power grid and the AC power supply device simultaneously pass through the current sensor B1; the power connection line connecting the B phase port of the AC load and the load, and the power connection line connecting the B phase port of the AC power grid and the AC power supply device simultaneously pass through the current sensor B2; the power connection line connecting the C phase port of the AC load and the load, and the power connection line connecting the C phase port of the AC power grid and the AC power supply device simultaneously pass through the current sensor B3.

[0010] Preferably, the above-mentioned current sensor power supply box is provided with a first input terminal, a second input terminal, a third input terminal and a fourth input terminal, the current sensor A is connected to the first input terminal, the current sensor B1 is connected to the second input terminal, the current sensor B2 is connected to the third input terminal, and the current sensor B3 is connected to the fourth input terminal.

[0011] Preferably, the current sensor power supply box is provided with a first output terminal, a second output terminal, a third output terminal, a fourth output terminal, a fifth output terminal, a sixth output terminal, a seventh output terminal and an eighth output terminal, the first output terminal and the second output terminal are connected to the first current collection port of the power analyzer as a pair of current output ports, the third output terminal and the fourth output terminal are connected to the second current collection port of the power analyzer as a pair of current output ports, the fifth output terminal and the sixth output terminal are connected to the third current collection port of the power analyzer as a pair of current output ports, and the seventh output terminal and the eighth output terminal are connected to the fourth current collection port of the power analyzer as a pair of current output ports.

[0012] The seven voltage acquisition ports of the power analyzer are respectively defined as a first voltage acquisition port, a second voltage acquisition port, a third voltage acquisition port, a fourth voltage acquisition port, a fifth voltage acquisition port, a sixth voltage acquisition port and a seventh voltage acquisition port, wherein the first voltage acquisition port is respectively connected to the DC+ terminal and the DC- terminal of the device under test, the second voltage acquisition port, the third voltage acquisition port and the fourth voltage acquisition port are respectively connected to the AC power supply device, and the fifth voltage acquisition port, the sixth voltage acquisition port and the seventh voltage acquisition port are respectively connected to the load.

[0013] The optical storage integrated machine test system based on the current sensor interoperability of the utility model is also provided with a DC power supply device, which is respectively connected to the DC+ terminal and DC- terminal of the device under test. The current sensor A passes through the power connection line connecting the DC power supply device and the DC+ terminal of the device under test.

[0014] Preferably, the DC power supply device is a photovoltaic module PV DC power supply device or a programmable DC analog power supply device.

[0015] Preferably, the AC power supply device is a power grid or a programmable AC power supply device.

[0016] Preferably, the model of the power analyzer is WT5000 or PA8000.

[0017] The optical-storage integrated machine testing system based on the mutual use of current sensors of the utility model is also provided with a computer for recording the data collected by the power analyzer, and the computer is connected to the power analyzer.

[0018] Preferably, the A-phase port of the AC power supply device and the C-phase port of the AC power supply device are respectively the second voltage collection ports.

[0019] Preferably, the B-phase port of the AC power supply device and the C-phase port of the AC power supply device are respectively connected to the third voltage collection port.

[0020] Preferably, the A-phase port of the AC power supply device and the B-phase port of the AC power supply device are respectively connected to the fourth voltage collection port.

[0021] Preferably, the A-phase port of the load and the C-phase port of the load are respectively connected to the fifth voltage acquisition port.

[0022] Preferably, the B-phase port of the load and the C-phase port of the load are respectively connected to the sixth voltage collection port.

[0023] The B-phase port of the load and the C-phase port of the load are respectively connected to the A-phase port of the load and the B-phase port of the load are respectively connected to the seventh voltage acquisition port.

[0024] The B-phase port of the load and the C-phase port of the load are respectively connected to the A-phase port of the load and the AC load A-phase port of the device under test through power connection lines, the B-phase port of the load and the AC load B-phase port of the device under test are connected through power connection lines, and the C-phase port of the load and the AC load C-phase port of the device under test are connected through power connection lines.

[0025] The B-phase port of the load and the C-phase port of the load are respectively connected to the A-phase port of the AC power supply device and the A-phase port of the AC power grid of the device under test through a power connection line, the B-phase port of the AC power supply device and the B-phase port of the AC power grid of the device under test are connected through a power connection line, and the C-phase port of the AC power supply device and the C-phase port of the AC power grid of the device under test are connected through a power connection line.

[0026] The utility model discloses a test system for an integrated optical storage device based on the mutual use of current sensors, which is provided with a power analyzer with seven voltage acquisition channels, a current sensor A on the DC side, three current sensors B located on the AC side and used in grid-connected and off-grid tests, and a current sensor power supply box for providing working voltage for the current sensors and transmitting the current data of the current sensors A and B to the power analyzer. The three current sensors B are defined as current sensor B1, current sensor B2, and current sensor B3, respectively. The current sensor A passes through the DC connection path of the device under test, and the current sensor B1, the current sensor B2, and the current sensor B3 pass through the AC connection path of the device under test, respectively. The power analyzer is connected to the current sensor power supply box. The test system for an integrated optical storage device only needs to use one power analyzer and four current sensors, thereby reducing the use of one power analyzer and three current sensors. Moreover, the current sensors B1, B2, and B3 are used as mutual use AC sensors in grid-connected and off-grid tests. Therefore, the test system for an integrated optical storage device can effectively reduce the detection cost and improve the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The present invention is further described with reference to the accompanying drawings, but the contents in the accompanying drawings do not constitute any limitation to the present invention.

[0028] Figure 1 The figure is a connection diagram of an integrated optical storage device test system based on the mutual use of current sensors and a device under test.

[0029] exist Figure 1 Including:

[0030] Power analyzer 100 , current sensor A 200 , current sensor B1 300 , current sensor B2 400 , current sensor B3 500 , current sensor power supply box 600 , load 700 , DC power supply device 800 , AC power supply device 900 , computer 1000 , device under test 1100 . DETAILED DESCRIPTION

[0031] The technical solution of the utility model is further described in conjunction with the following embodiments.

[0032] Example 1

[0033] A test system for an integrated optical storage device based on the mutual use of current sensors, such as Figure 1As shown, there is provided a power analyzer 100 with seven voltage acquisition channels, a current sensor A 200 on the DC side, three current sensors B located on the AC side and used interchangeably in grid-connected testing and off-grid testing, a current sensor power supply box 600 for providing working voltage to the current sensors and transmitting current data of the current sensors A 200 and the current sensor B to the power analyzer 100, a load 700 and an AC power supply device 900, a DC power supply device 800 and a computer 1000 for recording the data collected by the power analyzer 100.

[0034] The three current sensors B are defined as current sensor B1 300, current sensor B2 400 and current sensor B3 500 respectively. The current sensor A 200 passes through the DC connection path between the current sensor power supply box 600 and the device under test 1100. The current sensor B1 300, current sensor B2 400 and current sensor B3 500 respectively pass through the AC connection path between the current sensor power supply box 600 and the device under test 1100. The power analyzer 100 is connected to the current sensor power supply box 600.

[0035] The load 700 is connected to the AC load A phase port, the AC load B phase port and the AC load C phase port of the device under test 1100 respectively, and the AC power supply device 900 is connected to the AC grid A phase port, the AC grid B phase port and the AC grid C phase port of the device under test 1100 respectively. The DC power supply device 800 is connected to the DC+ terminal and the DC- terminal of the device under test 1100 respectively. The current sensor A200 passes through the power connection line connecting the DC power supply device 800 and the DC+ terminal of the device under test 1100. Among them, the model of the power analyzer 100 is WT5000 or PA8000, the DC power supply device 800 is a photovoltaic module PV DC power supply device 800 or a programmable DC analog power supply device; the AC power supply device 900 is a grid or a programmable AC power supply device 900, and the computer 1000 is connected to the power analyzer 100.

[0036] It should be noted that, although the power level of the integrated photovoltaic and storage machine is not high, the corresponding current sensor needs to be high-precision, and the cost of high-precision current sensors is relatively high; and the use of multiple current sensors makes the actual test operation more complicated. Based on the low power level of the integrated photovoltaic and storage machine, the diameter of the power connection line used is relatively thin, so it is possible to simultaneously pass two power connection lines through the aperture of the same current sensor, providing a basis for the implementation of the present utility model. Therefore, the present utility model adopts the method of using current sensors interchangeably during the grid-connected and off-grid testing of the integrated photovoltaic and storage machine. During the grid-connected test, it is only necessary to disconnect the load 700 switch. During the off-grid test, while disconnecting the grid switch, the voltage acquisition interfaces of the power analyzer 100 three-phase grid voltage and the three-phase load 700 voltage are interchanged to ensure the normal collection of the corresponding detection data. The current sensor B of the utility model can be used interchangeably on the three AC sides when running on the grid or off the grid. When conducting a grid-connected test, it is only necessary to disconnect the load 700 switch; when running off the grid, it is only necessary to swap the voltage sampling interfaces of the three-phase grid voltage of the power analyzer 100 and the three-phase load 700 voltage, thereby ensuring the normal collection of corresponding parameters such as power.

[0037] It should also be noted that the function of the current sensor power supply box 600 is to aggregate all current collection channels of three current sensors B and one current sensor A 200 to the current sensor power supply box 600, and the current sensor power supply box 600 also supplies the current sensor with working voltage and interface conversion. The four-way current signal of the current sensor power supply box 600 after conversion is connected to the power analyzer 100, and the computer 1000 records and stores the corresponding detection items according to the actual test conditions. The seven voltage collection channels of the power analyzer 100 of the utility model collect one DC voltage, three AC grid voltages and three load 700 voltages respectively. The function of the computer 1000 of the utility model is to record and store the data collected by the power analyzer 100 according to the actual test conditions.

[0038] The power connection line connecting the A phase port of the AC load and the load 700 and the power connection line connecting the A phase port of the AC power grid and the AC power supply device 900 pass through the current sensor B1 300 at the same time; the power connection line connecting the B phase port of the AC load and the load 700 and the power connection line connecting the B phase port of the AC power grid and the AC power supply device 900 pass through the current sensor B2 400 at the same time; the power connection line connecting the C phase port of the AC load and the load 700 and the power connection line connecting the C phase port of the AC power grid and the AC power supply device 900 pass through the current sensor B3 500 at the same time.

[0039] The current sensor power supply box 600 is provided with a first input terminal, a second input terminal, a third input terminal and a fourth input terminal, the current sensor A 200 is connected to the first input terminal, the current sensor B1 300 is connected to the second input terminal, the current sensor B2 400 is connected to the third input terminal, and the current sensor B3 500 is connected to the fourth input terminal.

[0040] The current sensor power supply box 600 is also provided with a first output terminal, a second output terminal, a third output terminal, a fourth output terminal, a fifth output terminal, a sixth output terminal, a seventh output terminal and an eighth output terminal. The first output terminal and the second output terminal are connected to the first current collection port of the power analyzer 100 as a pair of current output ports, the third output terminal and the fourth output terminal are connected to the second current collection port of the power analyzer 100 as a pair of current output ports, the fifth output terminal and the sixth output terminal are connected to the third current collection port of the power analyzer 100 as a pair of current output ports, and the seventh output terminal and the eighth output terminal are connected to the fourth current collection port of the power analyzer 100 as a pair of current output ports.

[0041] It should be noted that the current sensor power supply box 600 of the present invention receives four current signals corresponding to four current sensors respectively, and then connects the four current signals to the power analyzer 100 .

[0042] The seven voltage acquisition ports of the power analyzer 100 are defined as a first voltage acquisition port, a second voltage acquisition port, a third voltage acquisition port, a fourth voltage acquisition port, a fifth voltage acquisition port, a sixth voltage acquisition port and a seventh voltage acquisition port, respectively. The first voltage acquisition port is connected to the DC+ terminal and the DC- terminal of the device under test 1100, respectively. The second voltage acquisition port, the third voltage acquisition port and the fourth voltage acquisition port are connected to the AC power supply device 900, respectively. The fifth voltage acquisition port, the sixth voltage acquisition port and the seventh voltage acquisition port are connected to the load 700, respectively.

[0043] The A-phase port of the AC power supply device 900 and the C-phase port of the AC power supply device 900 are respectively connected to the second voltage acquisition port. The B-phase port of the AC power supply device 900 and the C-phase port of the AC power supply device 900 are respectively connected to the third voltage acquisition port. The A-phase port of the AC power supply device 900 and the B-phase port of the AC power supply device 900 are respectively connected to the fourth voltage acquisition port. The A-phase port of the load 700 and the C-phase port of the load 700 are respectively connected to the fifth voltage acquisition port. The B-phase port of the load 700 and the C-phase port of the load 700 are respectively connected to the sixth voltage acquisition port. The A-phase port of the AC power supply device 900 and the B-phase port of the load 700 are respectively connected to the seventh voltage acquisition port.

[0044] The A phase port of load 700 is connected to the A phase port of the AC load of the device under test 1100 via a power connection line, the B phase port of load 700 is connected to the B phase port of the AC load of the device under test 1100 via a power connection line, and the C phase port of load 700 is connected to the C phase port of the AC load of the device under test 1100 via a power connection line.

[0045] The A-phase port of the AC power supply device 900 and the A-phase port of the AC power grid of the device under test 1100 are connected via a power connection line, the B-phase port of the AC power supply device 900 and the B-phase port of the AC power grid of the device under test 1100 are connected via a power connection line, and the C-phase port of the AC power supply device 900 and the C-phase port of the AC power grid of the device under test 1100 are connected via a power connection line.

[0046] It should be noted that the three-phase AC power supply device and the three-phase load of the utility model share three current sensors B. The power connection lines of the A-phase power grid and the A-phase load simultaneously pass through the A-phase current sensor B1, the power connection lines of the B-phase power grid and the B-phase load simultaneously pass through the B-phase current sensor B2, and the power connection lines of the C-phase power grid and the C-phase load simultaneously pass through the C-phase current sensor B3.

[0047] The integrated photovoltaic and storage device test system only needs to use one power analyzer 100 and four current sensors, thereby reducing the use of one power analyzer 100 and three current sensors. In addition, the current sensor B1 300, the current sensor B2400 and the current sensor B3 500 are used as interchangeable AC sensors during grid-connected and off-grid testing. Therefore, the integrated photovoltaic and storage device test system can effectively reduce the detection cost and improve the detection efficiency.

[0048] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the utility model rather than to limit the protection scope of the utility model. Although the utility model is described in detail with reference to the preferred embodiments, ordinary technicians in this field should understand that the technical solution of the utility model can be modified or replaced by equivalents without departing from the essence and scope of the technical solution of the utility model.

Claims

1. A test system for an integrated optical storage device based on the mutual use of current sensors, characterized in that: A power analyzer with seven voltage acquisition channels, a current sensor A on the DC side, three current sensors B on the AC side and used interchangeably in grid-connected testing and off-grid testing, and a current sensor power supply box for providing working voltage to the current sensors and transmitting current data of the current sensors A and B to the power analyzer are provided. The three current sensors B are defined as current sensor B1, current sensor B2 and current sensor B3, respectively. The current sensor A passes through the DC connection path of the device under test, and the current sensor B1, the current sensor B2 and the current sensor B3 respectively pass through the AC connection path of the device under test. The power analyzer is connected to the current sensor power supply box.

2. The optical-storage integrated machine test system based on current sensor interoperability according to claim 1 is characterized in that: A load and an AC power supply device are also provided, wherein the load is respectively connected to the AC load A phase port, the AC load B phase port and the AC load C phase port of the device under test, and the AC power supply device is respectively connected to the AC grid A phase port, the AC grid B phase port and the AC grid C phase port of the device under test.

3. The optical-storage integrated machine test system based on current sensor interoperability according to claim 2 is characterized in that: The power connection line connecting the A phase port of the AC load and the load and the power connection line connecting the A phase port of the AC grid and the AC power supply device simultaneously pass through the current sensor B1; A power connection line connecting the AC load B-phase port and the load and a power connection line connecting the AC grid B-phase port and the AC power supply device simultaneously pass through the current sensor B2; A power connection line connecting the C-phase port of the AC load and the load and a power connection line connecting the C-phase port of the AC power grid and the AC power supply device pass through the current sensor B3 at the same time.

4. The optical-storage integrated machine test system based on current sensor interoperability according to claim 3 is characterized in that: The current sensor power supply box is provided with a first input terminal, a second input terminal, a third input terminal and a fourth input terminal. The current sensor A is connected to the first input terminal, the current sensor B1 is connected to the second input terminal, the current sensor B2 is connected to the third input terminal, and the current sensor B3 is connected to the fourth input terminal.

5. The optical-storage integrated machine test system based on current sensor interoperability according to claim 4 is characterized in that: The current sensor power supply box is provided with a first output end, a second output end, a third output end, a fourth output end, a fifth output end, a sixth output end, a seventh output end and an eighth output end. The first output end and the second output end are connected to the first current acquisition port of the power analyzer as a pair of current output ports, the third output end and the fourth output end are connected to the second current acquisition port of the power analyzer as a pair of current output ports, the fifth output end and the sixth output end are connected to the third current acquisition port of the power analyzer as a pair of current output ports, and the seventh output end and the eighth output end are connected to the fourth current acquisition port of the power analyzer as a pair of current output ports.

6. The optical-storage integrated machine test system based on current sensor interoperability according to claim 5 is characterized in that: The seven voltage acquisition ports of the power analyzer are respectively defined as a first voltage acquisition port, a second voltage acquisition port, a third voltage acquisition port, a fourth voltage acquisition port, a fifth voltage acquisition port, a sixth voltage acquisition port and a seventh voltage acquisition port, wherein the first voltage acquisition port is respectively connected to the DC+ terminal and the DC- terminal of the device under test, the second voltage acquisition port, the third voltage acquisition port and the fourth voltage acquisition port are respectively connected to the AC power supply device, and the fifth voltage acquisition port, the sixth voltage acquisition port and the seventh voltage acquisition port are respectively connected to the load.

7. The optical-storage integrated machine test system based on current sensor interoperability according to claim 2, characterized in that: A DC power supply device is also provided, and the DC power supply device is respectively connected to the DC+ terminal and the DC- terminal of the device under test; The current sensor A passes through a power connection line connecting the DC power supply device and the DC+ terminal of the device under test.

8. The optical-storage integrated machine test system based on current sensor interoperability according to claim 7 is characterized in that: The DC power supply device is a photovoltaic module PV DC power supply device or a programmable DC analog power supply device; The AC power supply device is a power grid or a programmable AC power supply device; The model of the power analyzer is WT5000 or PA8000.

9. The optical-storage integrated machine test system based on current sensor interoperability according to claim 1, characterized in that: A computer for recording the data collected by the power analyzer is also provided, and the computer is connected to the power analyzer.

10. The optical-storage integrated machine test system based on current sensor interoperability according to claim 6, characterized in that: The A-phase port of the AC power supply device and the C-phase port of the AC power supply device are respectively the second voltage collection ports; The B-phase port of the AC power supply device and the C-phase port of the AC power supply device are respectively connected to the third voltage collection port; The A-phase port of the AC power supply device and the B-phase port of the AC power supply device are respectively connected to the fourth voltage collection port; The A-phase port of the load and the C-phase port of the load are respectively connected to the fifth voltage acquisition port; The B-phase port of the load and the C-phase port of the load are respectively connected to the sixth voltage acquisition port; The A-phase port of the load and the B-phase port of the load are respectively connected to the seventh voltage acquisition port; The A-phase port of the load is connected to the A-phase port of the AC load of the device under test through a power connection line, the B-phase port of the load is connected to the B-phase port of the AC load of the device under test through a power connection line, and the C-phase port of the load is connected to the C-phase port of the AC load of the device under test through a power connection line; The A-phase port of the AC power supply device and the A-phase port of the AC power grid of the device under test are connected via a power connection line, the B-phase port of the AC power supply device and the B-phase port of the AC power grid of the device under test are connected via a power connection line, and the C-phase port of the AC power supply device and the C-phase port of the AC power grid of the device under test are connected via a power connection line.