TO test aging clamp

Abstract

The utility model discloses a TO test aging clamp, which comprises a circuit board test seat, a plurality of groups of electrical interfaces corresponding to TO circuits are uniformly distributed on the upper side surface of the circuit board test seat, a handle is fixedly arranged at the top of the upper side surface of the circuit board test seat, and metal wear-resistant strips are respectively arranged on the left side and the right side of the circuit board test seat. The two metal wear-resistant strips are made of stainless steel and are more wear-resistant, the service life of the circuit board test seat is prolonged, the cost is less than 5% of the overall cost of a clamp, the two sides of the circuit board test seat 1 are respectively provided with mounting grooves corresponding to the two metal wear-resistant strips, and the metal wear-resistant strips are movably provided with fixing structures corresponding to the circuit board test seat. And the metal wear-resistant strip is fixed on the circuit board test seat through the fixing structure, so that the metal wear-resistant strip is convenient to disassemble, assemble and replace while being fixed.

Description

Technical Field

[0001] The utility model relates to the technical field of optical communication devices, in particular to a TO test aging fixture. Background Art

[0002] In the field of optical communication device production, the most common packaging form is LD TO (Transistor Outline). In the TO production process, the most commonly used aging test board is Figure 1 There are 64 stations on this fixture board, and each station can be equipped with a TO product.

[0003] The original test aging fixture circuit board part is mainly supported by epoxy board, in which the circuit layer is sandwiched. This TO test aging fixture is the most commonly used workpiece and is used frequently. During production, it is necessary to use the non-circuit parts on both sides of the circuit board to fix the position. When inserted into the aging equipment or test equipment, it will cause a certain amount of wear on the supporting parts on both sides of the circuit board. As the number of uses increases, the circuit board gradually loses its positioning accuracy and becomes scrapped, thereby increasing the cost of testing. Utility Model Content

[0004] In view of the technical problems in the above-mentioned prior art, the utility model provides a TO test aging fixture, the purpose of which is to solve the above-mentioned problems.

[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0006] A TO test aging fixture, a fixture for TO test aging, comprises a circuit board test seat, a plurality of groups of electrical interfaces corresponding to TO circuits are evenly distributed on the upper side of the circuit board test seat, a handle is fixedly provided on the top of the upper side of the circuit board test seat, metal wear-resistant strips are respectively provided on the left and right sides of the circuit board test seat, the two metal wear-resistant strips are symmetrically arranged, and the sides are arranged in a Z shape, installation grooves are respectively opened on the two sides of the circuit board test seat corresponding to the two metal wear-resistant strips, a fixed structure is movably provided on the metal wear-resistant strip corresponding to the circuit board test seat, and the metal wear-resistant strip is fixed to the circuit board test seat through the fixed structure.

[0007] Preferably, the fixing structure comprises a plurality of insertion rods which are arranged in a longitudinal array at the upper ends of the two metal wear-resistant strips corresponding to the circuit board test sockets, and matching insertion holes are provided corresponding to the insertion rods on both sides of the circuit board test socket.

[0008] Preferably, reinforcing ribs are transversely provided at the lower side of the circuit board test socket corresponding to the insertion rod, and the two ends of the plurality of reinforcing ribs are respectively inserted on the corresponding insertion rods, and a fastening nut is sleeved at the end of the insertion rod, and an external thread matching the fastening nut is provided at the end of the insertion rod corresponding to the fastening nut, and the fastening nut is threadedly connected to the insertion rod.

[0009] Preferably, anti-slip pads are respectively provided on opposite sides of the two metal wear-resistant strips.

[0010] Preferably, the two metal wear-resistant strips are made of stainless steel.

[0011] Preferably, a heat sink aluminum plate is fixedly provided on the upper side of the circuit board test socket, and the heat sink aluminum plate is provided with corresponding plug holes corresponding to the multiple groups of electrical interfaces.

[0012] Compared with the prior art, the utility model has the following beneficial effects:

[0013] The utility model provides a TO test aging fixture, which increases metal wear-resistant edges. When in use, the clamping wear on both sides of the circuit board test seat is converted into wear of the metal wear-resistant edges. The metal wear-resistant edges are made of stainless steel, which is more wear-resistant than the circuit board test seat. The increase in wear-resistant edges also improves positioning accuracy, increases the reliability of testing and aging, and the cost is less than 5% of the overall fixture cost, greatly reducing the test cost. The setting of the fixed structure can minimize the pressure on the circuit board test seat when clamping and fixing, thereby extending the service life of the circuit board test seat. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is an overall disassembled diagram of a TO test aging fixture described in the utility model;

[0015] Figure 2 This is a cross-sectional view of the overall style of a TO test aging fixture described in the utility model;

[0016] Figure 3 This is an enlarged view of point A of a TO test aging fixture described in the utility model.

[0017] In the figure: 1. Circuit board test socket; 11. Handle; 12. Mounting slot; 13. Insertion hole; 2. Metal wear-resistant strip; 21. Anti-slip pad; 3. Fixing structure; 31. Insertion rod; 32. Reinforcement rib; 33. Fastening nut; 4. Heat sink aluminum plate; 41. Insertion hole. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0019] See also Figures 1 to 3In the embodiment proposed in the present application, a TO test aging fixture is provided, which is used for TO test aging, and includes a circuit board test seat 1. A plurality of groups of electrical interfaces corresponding to TO circuits are evenly distributed on the upper side of the circuit board test seat 1. A heat sink aluminum plate 4 is fixedly provided on the upper side of the circuit board test seat 1 to facilitate uniform heat conduction during testing. The heat sink aluminum plate 4 is provided with corresponding plug-in holes 41 corresponding to the plurality of groups of electrical interfaces to facilitate insertion during TO testing. A handle 11 is fixedly provided on the top of the upper side of the circuit board test seat 1 to make the operation of the manufacturer more convenient and labor-saving. Metal wear-resistant strips 2 are provided on the left and right sides of the circuit board test seat 1, and two metal wear-resistant strips are provided. 2 is symmetrically arranged, and the side is Z-shaped, and the two metal wear-resistant strips 2 are respectively provided with anti-skid pads 21 on the opposite sides to each other to increase the stability of their positioning, and the two metal wear-resistant strips 2 are made of stainless steel, which are more wear-resistant, extend the service life of the circuit board test seat 1, and the cost is less than 5% of the overall fixture cost, and the two metal wear-resistant strips 2 on both sides of the circuit board test seat 1 are respectively provided with mounting grooves 12, and the metal wear-resistant strips 2 are movably provided with a fixing structure 3 corresponding to the circuit board test seat 1, and the metal wear-resistant strips 2 are fixed to the circuit board test seat 1 through the fixing structure 3, which is convenient for fixing the metal wear-resistant strips 2 while also making it easy to disassemble and replace.

[0020] In another embodiment, see Figures 1 to 3 The fixing structure 3 includes a plurality of insertion rods 31, which are arranged in a longitudinal array at the upper ends of the two metal wear-resistant strips 2 corresponding to the circuit board test socket 1. The circuit board test socket 1 has matching insertion holes 13 opened on both sides of the insertion rods 31 corresponding to the insertion rods. The lower side of the circuit board test socket 1 is provided with reinforcing ribs 32 in the horizontal direction corresponding to the insertion rods 31. The two ends of the plurality of reinforcing ribs 32 are respectively inserted into the corresponding insertion rods 31. The end of the insertion rod 31 is sleeved with a fastening nut 33. The end of the insertion rod 31 is provided with an external thread corresponding to the fastening nut 33, and the fastening nut 33 is threadedly connected to the insertion rod 31, so as to fix the reinforcing rib 32 to the bottom of the two metal wear-resistant strips 2.

[0021] The reinforcement ribs 32 are provided to reduce the pressure on the circuit board test socket 1 to the greatest extent when the circuit board test socket 1 is clamped and fixed, thereby extending the service life of the circuit board test socket 1.

[0022] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0023] In the description of the present invention, unless otherwise specified, "plurality" means two or more; the terms "upper", "lower", "left", "right", "inside", "outside", "front end", "rear end", "head", "tail", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0024] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A TO test aging fixture, a fixture for TO test aging, comprising a circuit board test seat (1), a plurality of groups of electrical interfaces corresponding to the TO circuit are evenly distributed on the upper side of the circuit board test seat (1), and a handle (11) is fixedly provided on the top of the upper side of the circuit board test seat (1), characterized in that: The circuit board test seat (1) is provided with metal wear-resistant strips (2) on the left and right sides respectively. The two metal wear-resistant strips (2) are symmetrically arranged and the sides are arranged in a Z shape. The two sides of the circuit board test seat (1) are provided with mounting grooves (12) corresponding to the two metal wear-resistant strips (2). The metal wear-resistant strips (2) are movably provided with fixing structures (3) corresponding to the circuit board test seat (1). The metal wear-resistant strips (2) are fixed to the circuit board test seat (1) through the fixing structures (3).

2. A TO test aging fixture according to claim 1, characterized in that: The fixing structure (3) comprises a plurality of insertion rods (31) which are arranged in a longitudinal array at the upper ends of the two metal wear-resistant strips (2) corresponding to the circuit board test seat (1), and matching insertion holes (13) are provided on both sides of the circuit board test seat (1) corresponding to the insertion rods (31).

3. A TO test aging fixture according to claim 2, characterized in that: A reinforcing rib (32) is transversely arranged at the lower side of the circuit board test socket (1) corresponding to the insertion rod (31), and the two ends of a plurality of the reinforcing ribs (32) are respectively inserted on the corresponding insertion rods (31), and a fastening nut (33) is sleeved on the end of the insertion rod (31), and an external thread matching the fastening nut (33) is arranged at the end of the insertion rod (31), and the fastening nut (33) is threadedly connected to the insertion rod (31).

4. A TO test aging fixture according to claim 1, characterized in that: Anti-slip pads (21) are respectively provided on opposite sides of the two metal wear-resistant strips (2).

5. A TO test aging fixture according to claim 1, characterized in that: The two metal wear-resistant strips (2) are made of stainless steel.

6. A TO test aging fixture according to claim 1, characterized in that: A heat sink aluminum plate (4) is fixedly provided on the upper side of the circuit board test seat (1), and the heat sink aluminum plate (4) is provided with corresponding plug holes (41) corresponding to the multiple groups of electrical interfaces.

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