Wafer test probe box

Abstract

The utility model discloses a wafer test probe box, which comprises a box body and a box cover, one side of the box body is hinged with one side of the box cover through a connecting piece, the other side of the box body is connected with the box cover through a buckling device, at least one probe fixing device is arranged in the box body, the probe fixing device comprises two symmetrically arranged needle tube supports, the top end of each needle tube support is provided with an opening penetrating through a support groove, and the needle tube supports are connected with the box cover. Wherein the outer side of one needle tube support is provided with a needle tail fixing structure, the needle tail fixing structure comprises two needle tail positioning plates which are arranged in parallel, the two needle tail positioning plates penetrate through the support groove relative to the opening and are symmetrically distributed, a needle tail groove is formed between the two needle tail positioning plates, and labels corresponding to the probe fixing devices are arranged in the box body. A supporting structure is further arranged on the end face of the inner cover, the probe is supported through a needle tube support, the needle tail of the special-shaped probe is limited through a needle tail fixing structure, the probe can be better stored, and the probe can be prevented from falling off and being damaged when the box is opened; the upper and lower parts of the probe are protected through the two frame plates and the supporting beam.

Description

Technical Field

[0001] The utility model relates to the technical field of wafer testing probes, in particular to a wafer testing probe box. Background Art

[0002] Most of the existing storage boxes for wafer test probes are based on receiving slots. When the storage box is opened and extracted, the probes are prone to rotate and slide in the receiving slots, and are also prone to fall out of the receiving slots, affecting the precision of the probes and causing damage to the probes. The receiving slots are also not convenient for storing special-shaped probes, and the storage effect is poor.

[0003] To solve the above problems, we propose a wafer test probe box to improve the deficiencies of the prior art. Utility Model Content

[0004] The technical problem to be solved by the utility model is to overcome the defects of the prior art and provide a wafer test probe box. In order to solve the above technical problems, the utility model provides the following technical solutions:

[0005] The utility model is a wafer test probe box, comprising a box body and a box cover hingedly connected by a connecting piece on one side, the other side of the box body is connected to the box cover by a snap device, at least one probe fixing device is arranged in the box body, the probe fixing device comprises two symmetrically arranged needle tube supports, the top of the needle tube supports is provided with an opening penetrating the bracket, a needle tail fixing structure is arranged on the outer side of one of the needle tube supports, the needle tail fixing structure comprises two parallel needle tail positioning plates, and the two needle tail positioning plates are symmetrically distributed about the opening penetrating the bracket, a needle tail groove is arranged between the two needle tail positioning plates, a number is arranged in the box body corresponding to the probe fixing device, and a support structure is also arranged on the inner cover end face included in the box cover.

[0006] Preferably, at least one placement rack is provided in the box body, and at least one probe fixing device is evenly distributed on the placement rack.

[0007] Preferably, the placement rack includes two rack plates arranged in parallel, and the two needle tube supports of the same probe fixing device are respectively and correspondingly arranged on the two rack plates.

[0008] Preferably, a support beam is provided on the end surface of the inner cover corresponding to the symmetry axis of the two needle tube supports.

[0009] Preferably, at least one of the support structures is evenly distributed on the lower end surface of the support beam, and the support structure includes a support plate, the top end of the support plate is fixedly connected to the lower end surface of the support beam, and when the box cover is closed with the box body, the support plate is inserted between two adjacent probe fixing devices.

[0010] Preferably, the inner cover end surface is provided with reinforcing ribs, and the reinforcing ribs are arranged perpendicular to the support beam.

[0011] Preferably, the connecting member includes a first rotating plate, a second rotating plate and an axle rod, the first rotating plate is fixedly connected to the box body, the second rotating plate is fixedly connected to the box cover, the first rotating plate is rotatably connected to the second rotating plate via the axle rod, a torsion spring is sleeved on the axle rod, one end of the torsion spring is fixedly connected to the first rotating plate, and the other end is fixedly connected to the second rotating plate.

[0012] Preferably, the buckle device comprises a buckle 1 and a buckle 2, the buckle 2 comprises a base, one side of the base is fixedly connected to the box body, the base is provided with a slot at the front and rear, the slot is provided with a notch facing upwards at one side of the box body, and the base has a limit slide symmetrically formed at both ends, the limit slide is connected to the slot, a tongue is slidably provided in the slot, a spring is provided between the tongue and the box body, and limit sliders are symmetrically provided at both ends of the tongue, the limit slider is inserted in the limit slide and slides along the limit slide, the tongue is provided with a slot at the top and bottom, and a claw is provided on the inner groove wall of the slot close to one side of the box body, the buckle 1 comprises a card plate fixedly connected to the box cover, and a bayonet is provided on the card plate, when the box cover is closed with the box body, the card plate is inserted in the slot, and the bayonet and the claw are buckled and connected.

[0013] Preferably, a pressing plate is provided on a side of the latch away from the box body.

[0014] Compared with the prior art, the beneficial effects achieved by the utility model are:

[0015] 1. In the utility model, the probe is supported by the needle tube support in the probe fixing device, so that the probe is not easily damaged when taking the probe;

[0016] 2. In the present invention, the needle tail of the special-shaped probe is limited by the needle tail fixing structure, so that the special-shaped probe can be better stored and prevented from falling and being damaged when the box is opened;

[0017] 3. In the present invention, when the bottom surface of the box body or the box cover is broken, the two frame plates and the support beam can still protect the probe from top to bottom. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0019] Figure 1 It is a structural schematic diagram of the utility model;

[0020] Figure 2 It is a schematic diagram of the top view structure of the utility model;

[0021] Figure 3 It is a schematic diagram of the enlarged structure of point A of the utility model;

[0022] Figure 4 It is a schematic diagram of the structure of the utility model when viewed from above;

[0023] Figure 5 It is a schematic diagram of the structure of the connector of the utility model;

[0024] Figure 6 It is a schematic diagram of the exploded structure of the buckle device of the utility model.

[0025] In the figure: 1. box body; 2. box cover; 3. connecting piece; 31. first rotating plate; 32. second rotating plate; 33. shaft rod; 4. buckle 1; 41. clamping plate; 42. bayonet; 5. buckle 2; 51. clamping tongue; 52. limiting slider; 53. pressing plate; 54. clamping claw; 55. slot; 56. limiting slide groove; 57. clamping seat; 58. clamping groove; 6. placement rack; 61. rack plate; 62. needle tube support; 621. opening through the bracket; 63. needle tail positioning plate; 631. needle tail groove; 7. support plate; 8. support beam; 9. reinforcing rib; 10. raised ring; 11. number; 12. inner cover end face. DETAILED DESCRIPTION

[0026] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention. Example

[0027] like Figure 1-6As shown, a wafer test probe box comprises a box body 1 and a box cover 2 which are hingedly connected by a connecting piece 3 on one side, and the other side of the box body 1 is connected to the box cover 2 by a snap-fit ​​device. At least one probe fixing device is arranged in the box body 1, and the probe fixing device is used to place the wafer test probe. The probe fixing device comprises two symmetrically arranged needle tube supports 62, and an opening through the bracket 621 is opened at the top of the needle tube support 62, and the needle tube is just placed in the opening through the bracket 621. A needle tail fixing structure is arranged on the outer side of one of the needle tube supports 62, and the needle tail fixing structure comprises two parallel needle tail positioning plates 63, and the two needle tail positioning plates 63 are symmetrically distributed about the opening through the bracket 621. For the convenience of production, the bottom ends of the two needle tail positioning plates 63 extend downward and are fixedly connected to the box body 1, and the lower part of the end where the needle tail positioning plate 63 is connected to the needle tube support 62 is connected to the frame plate 61, which not only facilitates production but also strengthens the stability of the overall structure and prolongs the service life. The needle tail positioning plate 63 has good anti-damage performance, and the top of the needle tail positioning plate 63 is slightly higher than the bottom of the opening through bracket 621 of the needle tube holder 62, so that when the needle tube is placed in the opening through bracket 621, the needle tail is naturally placed in the needle tail groove 631. A needle tail groove 631 is arranged between the two needle tail positioning plates 63. The needle tail groove 631 is actually a reserved gap between the two needle tail positioning plates 63 for placing and clamping the needle tail. When the wafer test probe is arranged in the opening through bracket 621 of the two needle tube holders 62, the needle tail of the wafer test probe just falls into the needle tail groove 631, and the two needle tail positioning plates 63 clamp the needle tail, which can prevent the needle tail from rotating with the needle tube of the wafer test probe as the center point. The corresponding probe fixing device in the box body 1 is provided with a label 11, and the label 11 is arranged between the two rack plates 61 of the unified placement rack 6, which can easily complete the counting and statistics of the wafer test probes. The inner cover end face 12 included in the box cover 2 is also provided with a supporting structure.

[0028] In this embodiment, at least one placement rack 6 is provided in the box body 1, and at least one probe fixing device is evenly distributed on the placement rack 6. In this embodiment, one placement rack is provided with 25 probe fixing devices. The placement rack 6 can not only play a role in strengthening the strength of the box body 1, but also can arrange a plurality of probe fixing devices, so that the overall layout is more perfect.

[0029] In this embodiment, two placement racks 6 are provided.

[0030] In this embodiment, the placement rack 6 includes two parallel racks 61, and two needle tube holders 62 of the same probe fixing device are respectively arranged on the two racks 61. When the box body 1 is broken, the rack 61 is equivalent to a reinforcing beam, which can ensure that the needle tube holder 62 on the rack 61 is intact, thereby better protecting the wafer test probe.

[0031] In this embodiment, the inner cover end surface 12 is provided with a support beam 8 corresponding to the symmetric axis of the two needle tube supports 62. The support beam 8 is located at the symmetric axis of the two needle tube supports 62, that is, at the parallel line of the two racks 61, so that when the box cover 2 is broken, the support beam 8 can still play the role of supporting foreign objects and protecting the wafer test probes mounted on the two needle tube supports 62.

[0032] In this embodiment, at least one supporting structure is evenly distributed on the lower end surface of the support beam 8, and the supporting structure includes a support plate 7. The top end of the support plate 7 is fixedly connected to the lower end surface of the support beam 8. When the box cover 2 is closed with the box body 1, the support plate 7 is inserted between two adjacent probe fixing devices.

[0033] In this embodiment, the support plates 7 are equidistantly distributed on the lower end surface of the support beam 8 in groups of three, and four groups are provided. The support plates 7 are provided in an inverted trapezoidal shape that is wide at the top and narrow at the bottom. When the box cover 2 is closed on the box body 1, the lower part of the support plate 7 is inserted between the two shelf plates 61 of the same placement rack 6 and between two adjacent probe fixing devices, that is, between two adjacent wafer test probes. The inverted trapezoidal design can increase the force on the top of the support plate 7 and make it less prone to damage. When the degree of damage is not high, the support plate 7 will not be damaged. The contracted waistline of the support plate 7 allows it to be inserted between two wafer test probes without colliding with the wafer test probes and causing damage to them. If a heavy object is placed on the top of the entire wafer test probe box, when the box cover 2 naturally deforms downward, the bottom end of the support plate 7 is subjected to force against the inner end surface of the box body 1, thereby improving the pressure resistance and load-bearing capacity of the entire storage box.

[0034] In this embodiment, the inner cover end surface 12 is provided with reinforcing ribs 9, and the reinforcing ribs 9 are arranged perpendicular to the support beam 8, so as to further improve the damage resistance, compression resistance and load-bearing capacity of the entire storage box.

[0035] In order to facilitate future product application upgrades, improve usage efficiency and increase the degree of automation of the assembly line, in this embodiment, the connecting member 3 includes a first rotating plate 31, a second rotating plate 32 and a shaft rod 33. The first rotating plate 31 is fixedly connected to the box body 1, and the second rotating plate 32 is fixedly connected to the box cover 2. The first rotating plate 31 is rotatably connected to the second rotating plate 32 through the shaft rod 33. A torsion spring is sleeved on the shaft rod 33. One end of the torsion spring is fixedly connected to the first rotating plate 31, and the other end is fixedly connected to the second rotating plate 32.

[0036] In order to further improve the use efficiency and the degree of production automation, in this embodiment, the buckle device includes a buckle 1 4 and a buckle 2 5. The buckle 2 5 includes a base 57. One side of the base 57 is fixedly connected to the box body 1. A card slot 58 is provided through the front and rear of the base 57. In order to facilitate the insertion of the card plate 41 into the slot 55, an upward notch is provided on the side of the card slot 58 away from the box body 1. The two ends of the base 57 are symmetrically penetrated by limited sliding grooves 56. The limited sliding grooves 56 are connected to the card slot 58. A card tongue 5 is slidably provided in the card slot 58. 1, a spring is arranged between the latch tongue 51 and the box body 1, and limiting sliders 52 are symmetrically arranged at both ends of the latch tongue 51, and the limiting sliders 52 are inserted in the limiting slide groove 56 and slide along the limiting slide groove 56, and a slot 55 is opened through the upper and lower parts of the latch tongue 51, and a claw 54 is arranged on the inner groove wall of the slot 55 close to the box body 1. The buckle 4 includes a card plate 41 fixedly connected to the box cover 2, and a bayonet 42 is opened on the card plate 41. When the box cover 2 is closed with the box body 1, the card plate 41 is inserted in the slot 55, and the bayonet 42 and the claw 54 are buckled and connected.

[0037] In this embodiment, a pressing plate 53 is provided on the side of the latch tongue 51 away from the box body 1 for easy pressing.

[0038] A raised ring 10 is arranged at the top of the box body 1, and a buckle ring groove is correspondingly provided at the lower end surface of the box cover 2. When the box cover 2 and the box body 1 are closed, the buckle ring groove is clamped on the raised ring 10 to complete the buckle, which has a certain sealing effect and improves the sealing performance.

[0039] The wafer test probe in this embodiment is mainly a probe with an L-shaped needle tail, and can also be adapted to a linear probe. Other special-shaped probes such as oblique needle tails can also be placed in a suitable shape.

[0040] The principle and advantages of the utility model are as follows: when in the closed state, the front end surface of the limit slider 52 conflicts with the front inner groove wall of the limit slide groove 56, and the pressing plate 53 only needs to be pressed backward to push the latch tongue 51 to slide backward along the groove 58, so that the claw 54 is disengaged from the bayonet 42, and the torsion spring resets the second rotating plate 32 to rotate with the shaft rod 33 as the axis, and drives the box cover 2 to rotate with the shaft rod 33 as the rotation axis, so that the latch plate 41 is disengaged from the slot 55, and the opening is completed, and the pressing plate 53 is released. The spring installed between the latch tongue 51 in the card seat 57 and the box body 1 pushes the latch tongue 51 to reset, and pushes the latch tongue 51 to slide forward until the limit slider 52 conflicts with the front inner groove wall of the limit slide groove 56, and the limit is completed. , the movement of the latch 51 stops, and the needle tube of the wafer test probe is set in the opening of the two needle tube holders 62 of the same probe fixing device through the bracket 621. The needle tail of the wafer test probe is naturally placed in the needle tail groove 631 and is restricted from rotating thereby, thereby completing the fixation. When in use, because the number 11 is between the two needle tube holders 62, the number of wafer test probes can be easily checked. After use, it is only necessary to press the box cover 2 and rotate it in the opposite direction so that the card plate 41 is inserted into the slot 55, and the latch 51 moves back slightly, and the bayonet 42 and the claw 54 are engaged. The latch 51 is reset to complete the closure, and the automatic box opening greatly improves the degree of automated production in subsequent production upgrades, and also increases the efficiency of use during use.

[0041] The physical properties of the production materials used are shown in Tables 1 and 2.

[0042] Table 1 Physical properties.

[0043]

[0044] Table 2 Price list.

[0045]

[0046] Finally, it should be noted that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions described in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A wafer test probe box, comprising a box body (1) and a box cover (2) hingedly connected at one side by a connecting piece (3), characterized in that: The other side of the box body (1) is connected to the box cover (2) by a snap-fit ​​device. At least one probe fixing device is arranged in the box body (1), and the probe fixing device includes two symmetrically arranged needle tube supports (62). The top of the needle tube support (62) is provided with an opening penetrating the bracket (621). A needle tail fixing structure is arranged on the outer side of one of the needle tube supports (62). The needle tail fixing structure includes two parallel needle tail positioning plates (63), and the two needle tail positioning plates (63) are symmetrically distributed about the opening penetrating the bracket (621). A needle tail groove (631) is arranged between the two needle tail positioning plates (63). A number (11) is arranged in the box body (1) corresponding to the probe fixing device, and the inner cover end surface (12) included in the box cover (2) is also provided with a support structure.

2. The wafer test probe box according to claim 1, wherein: At least one placement rack (6) is arranged in the box body (1), and at least one probe fixing device is evenly distributed on the placement rack (6).

3. The wafer test probe box according to claim 2, characterized in that: The placement rack (6) comprises two frame plates (61) arranged in parallel, and the two needle tube supports (62) of the same probe fixing device are respectively and correspondingly arranged on the two frame plates (61).

4. The wafer testing probe box according to claim 1, wherein: The inner cover end surface (12) is provided with a support beam (8) corresponding to the symmetry axes of the two needle tube supports (62).

5. The wafer testing probe box according to claim 4, characterized in that: The lower end surface of the support beam (8) is evenly distributed with at least one support structure, and the support structure comprises a support plate (7), the top end of the support plate (7) is fixedly connected to the lower end surface of the support beam (8), and when the box cover (2) and the box body (1) are covered, the support plate (7) can be inserted between two adjacent probe fixing devices.

6. The wafer testing probe box according to claim 4, characterized in that: The inner cover end surface (12) is provided with a reinforcing rib (9), and the reinforcing rib (9) is arranged perpendicular to the support beam (8).

7. The wafer testing probe box according to claim 1, wherein: The connecting member (3) comprises a first rotating plate (31), a second rotating plate (32) and a shaft (33); the first rotating plate (31) is fixedly connected to the box body (1); the second rotating plate (32) is fixedly connected to the box cover (2); the first rotating plate (31) is rotatably connected to the second rotating plate (32) via the shaft (33); a torsion spring is sleeved on the shaft (33); one end of the torsion spring is fixedly connected to the first rotating plate (31), and the other end is fixedly connected to the second rotating plate (32).

8. The wafer testing probe box according to claim 1, wherein: The buckle device comprises a buckle 1 (4) and a buckle 2 (5), wherein the buckle 2 (5) comprises a base (57), one side of the base (57) is fixedly connected to the box body (1), a slot (58) is provided through the front and rear of the base (57), a notch facing upward is provided on the side of the slot (58) away from the box body (1), limiting slide grooves (56) are symmetrically provided through the two ends of the base (57), the limiting slide grooves (56) are connected to the slot (58), a tongue (51) is slidably provided in the slot (58), a spring is provided between the tongue (51) and the box body (1), and the tongue (51) is provided with a spring. ) are symmetrically provided with limit sliders (52) at both ends, the limit sliders (52) are inserted into the limit slide grooves (56) and can slide along the limit slide grooves (56), the latch tongue (51) is provided with a slot (55) extending through the upper and lower parts, the inner groove wall of the slot (55) close to the box body (1) is provided with a claw (54), the buckle (4) comprises a card plate (41) fixedly connected to the box cover (2), the card plate (41) is provided with a snap-on (42), when the box cover (2) is closed with the box body (1), the card plate (41) is inserted into the slot (55), and the snap-on (42) and the claw (54) are snap-on connected.

9. The wafer testing probe box according to claim 8, characterized in that: A pressing plate (53) is provided on the side of the latch tongue (51) away from the box body (1).

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