Thermal test probe structure

Abstract

The utility model belongs to the technical field of thermal test probes, and particularly relates to a thermal test probe structure which comprises a pipe body, a heating wire and a thermocouple are arranged in the pipe body, a through hole is formed in one end of the pipe body, an I-shaped handle is connected to the outer wall of one end of the pipe body in a sleeved mode, a clamping groove is formed in the outer wall of the pipe body, and a clamping groove is formed in the other end of the pipe body. A mounting groove is formed in the I-shaped handle, a spring is arranged in the mounting groove, one end of the spring is connected with a connecting block, one end of the connecting block is connected with a bayonet lock, and the top of the connecting block is connected with a shifting block. At the moment, one end of the clamping pin is separated from the clamping groove in the outer wall of the pipe body, then the pipe body is pulled out to be separated from the inner side of the I-shaped handle, separation between the I-shaped handle and the pipe body can be completed, and therefore a user can replace damaged parts conveniently.

Description

Technical Field

[0001] The utility model belongs to the technical field of thermal testing probes, and in particular relates to a thermal testing probe structure. Background Art

[0002] Connector thermal test probe is a special probe used for electronic testing and measurement, mainly used to detect and analyze the thermal performance of connectors in electronic testing.

[0003] At present, the existing thermal test probe structure is such as patent number: CN219285074U, a thermal test probe structure, including a probe top and a probe tail, the lower end of the probe top is connected to the top of the probe tail; the probe tail includes a tube body, a heating wire and a thermocouple, the heating wire and the thermocouple are respectively arranged in the tube body, the heating point of the heating wire is in close contact with the temperature measuring point of the thermocouple and is fixed on the inner side of the bottom of the tube body;

[0004] Although this patent cooperates with the hot wire temperature measurement principle and reduces the requirements for sample specifications to facilitate probe insertion and measurement, during use, the user usually holds the thermal test probe structure through an I-shaped handle. However, the I-shaped handle and the tube body in the thermal test probe structure are integrated. Therefore, after long-term use, if the I-shaped handle or the tube body is damaged, it is difficult to maintain it, thereby reducing practicality. Utility Model Content

[0005] The utility model aims to provide a thermal test probe structure, aiming to solve the problem that during the use of the existing thermal test probe structure, the user usually holds the thermal test probe structure by an I-shaped handle, but the I-shaped handle and the tube body in the thermal test probe structure are integrated. Therefore, after long-term use, if the I-shaped handle or the tube body is damaged, it is difficult to maintain them, thereby reducing the practicality.

[0006] To achieve the above object, the utility model provides the following technical solutions: a thermal test probe structure, comprising a tube body, a heating wire and a thermocouple are arranged inside the tube body, a through hole is opened at one end of the tube body, and an I-shaped handle is sleeved on the outer wall of one end of the tube body;

[0007] The outer wall of the tube body is provided with a slot, the interior of the I-shaped handle is provided with a mounting slot, a spring is arranged inside the mounting slot, one end of the spring is connected to a connecting block, one end of the connecting block is connected to a bayonet pin, and the top of the connecting block is connected to a shift block.

[0008] As a preferred thermal test probe structure of the utility model, one end of the bayonet extends through and into the interior of the I-shaped handle.

[0009] As a preferred thermal test probe structure of the utility model, one end of the I-shaped handle is provided with an opening, and one end of the shift block extends to the outside through the opening at one end of the I-shaped handle.

[0010] As a preferred thermal test probe structure of the utility model, the I-shaped handle can form an elastic engaging structure with the tube body through a slot, a mounting slot, a spring, a connecting block, a latch and a shifting block.

[0011] As a preferred thermal test probe structure of the utility model, the sizes of the slot and the pin are matched.

[0012] As a preferred thermal test probe structure of the utility model, the outer wall of the I-shaped handle is sleeved with a heat insulating sleeve.

[0013] As a preferred thermal test probe structure of the utility model, the material of the thermal insulation sleeve is silicone.

[0014] Compared with the prior art, the beneficial effects of the utility model are:

[0015] By moving the shifting block, the connecting block drives the bayonet pin to contract. At this time, one end of the bayonet pin will be disengaged from the slot on the outer wall of the tube body. The tube body is then pulled outward to disengage it from the inside of the I-shaped handle. At this point, the I-shaped handle and the tube body can be separated, making it convenient for the user to replace damaged parts.

[0016] By sleeved a heat insulating sleeve made of silicone material on the outer wall of the I-shaped handle, the heat insulating effect of the I-shaped handle can be improved, thereby making it easier for staff to hold and use it. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0018] Figure 1 This is a schematic diagram of the main structure of the utility model;

[0019] Figure 2 This is a schematic diagram of the main cross-sectional structure of the utility model;

[0020] Figure 3 This is a schematic diagram of the structure of the utility model when viewed from above;

[0021] Figure 4 It is a schematic diagram of the A enlarged structure of the utility model.

[0022] In the figure: 1. tube body; 2. heating wire; 3. thermocouple; 4. through hole; 5. I-shaped handle; 6. slot; 7. mounting slot; 8. spring; 9. connecting block; 10. bayonet pin; 11. shift block; 12. thermal insulation sleeve. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] See also Figure 1-4 The utility model provides the following technical solutions: a thermal test probe structure, comprising a tube body 1, a heating wire 2 and a thermocouple 3 are arranged inside the tube body 1, a through hole 4 is opened at one end of the tube body 1, and an I-shaped handle 5 is sleeved on the outer wall of one end of the tube body 1;

[0025] It should be noted that in order to make it easier to insert the thermal test probe structure into a harder sample and avoid bending or breaking of the end of the thermal test probe structure, it is preferred in this embodiment that the lower end of the tube body 1 is a tapered tube with a diameter gradually decreasing from top to bottom;

[0026] It is more important to note that the working principle of the thermal test probe structure in this application can be referred to patent: CN219285074U;

[0027] A card slot 6 is provided on the outer wall of the tube body 1, a mounting slot 7 is provided inside the I-shaped handle 5, a spring 8 is provided inside the mounting slot 7, one end of the spring 8 is connected to a connecting block 9, one end of the connecting block 9 is connected to a card pin 10, and the top of the connecting block 9 is connected to a shift block 11.

[0028] Preferably: one end of the bayonet 10 extends through and into the interior of the I-shaped handle 5, one end of the I-shaped handle 5 is provided with an opening, and one end of the shift block 11 extends to the outside through the opening at one end of the I-shaped handle 5, and the I-shaped handle 5 can form an elastic snap-fit ​​structure with the tube body 1 through the slot 6, the mounting slot 7, the spring 8, the connecting block 9, the bayonet 10, and the shift block 11, and the dimensions between the slot 6 and the bayonet 10 are adapted.

[0029] During specific use, the connecting block 9 drives the bayonet 10 to retract by toggling the toggle block 11, at which time one end of the bayonet 10 will be disengaged from the slot 6 on the outer wall of the tube body 1, and then the tube body 1 is pulled outward to disengage it from the inner side of the I-shaped handle 5, so that the separation between the I-shaped handle 5 and the tube body 1 can be completed, thereby facilitating the user to replace damaged parts.

[0030] Preferably, the outer wall of the I-shaped handle 5 is sleeved with a heat insulating sleeve 12, and the material of the heat insulating sleeve 12 is silicone.

[0031] During specific use, by sleeve-fitting the heat-insulating sleeve 12 made of silicone material on the outer wall of the I-shaped handle 5 , the heat-insulating effect of the I-shaped handle 5 can be improved, thereby making it easier for workers to hold and use it.

[0032] Working principle: First, hold the I-shaped handle 5, then press the end of the tube body 1 against the surface of the sample, and then push the I-shaped handle 5 downward. The I-shaped handle 5 will push the end of the tube body 1 into the sample, and then the entire tube body 1 will enter the sample. Then, power on to perform thermal testing. When it is necessary to disassemble the I-shaped handle 5 and the tube body 1, the connecting block 9 drives the bayonet 10 to contract by shifting the shift block 11. At this time, one end of the bayonet 10 will be disengaged from the slot 6 on the outer wall of the tube body 1, and then the tube body 1 will be pulled outward to be disengaged from the inner side of the I-shaped handle 5. At this point, the separation between the I-shaped handle 5 and the tube body 1 can be completed, so that the user can replace the damaged parts conveniently, and by sleeve-fitting the thermal insulation sleeve 12 made of silicone material on the outer wall of the I-shaped handle 5, the thermal insulation effect of the I-shaped handle 5 can be improved, so that it is convenient for the staff to hold and use it.

[0033] Finally, it should be noted that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions described in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A thermal test probe structure, comprising a tube body (1), characterized in that: A heating wire (2) and a thermocouple (3) are arranged inside the tube body (1); a through hole (4) is opened at one end of the tube body (1); and an I-shaped handle (5) is sleeved on the outer wall of one end of the tube body (1); The outer wall of the tube body (1) is provided with a slot (6), the interior of the I-shaped handle (5) is provided with a mounting slot (7), a spring (8) is arranged inside the mounting slot (7), one end of the spring (8) is connected to a connecting block (9), one end of the connecting block (9) is connected to a bayonet pin (10), and the top of the connecting block (9) is connected to a shifting block (11).

2. A thermal test probe structure according to claim 1, characterized in that: One end of the bayonet (10) extends through the interior of the I-shaped handle (5).

3. A thermal test probe structure according to claim 1, characterized in that: One end of the I-shaped handle (5) is provided with an opening, and one end of the shift block (11) extends to the outside through the opening at one end of the I-shaped handle (5).

4. A thermal test probe structure according to claim 1, characterized in that: The I-shaped handle (5) can form an elastic locking structure with the tube body (1) through a locking groove (6), a mounting groove (7), a spring (8), a connecting block (9), a locking pin (10), and a shifting block (11).

5. The thermal test probe structure according to claim 1, characterized in that: The sizes of the card slot (6) and the card pin (10) are matched.

6. A thermal test probe structure according to claim 1, characterized in that: The outer wall of the I-shaped handle (5) is sleeved with a heat insulating sleeve (12).

7. A thermal test probe structure according to claim 6, characterized in that: The material of the heat insulation sleeve (12) is silica gel.

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