Test probe for oscilloscope
By using spring leads, filter circuits and clamping state detection components in the oscilloscope probe, the problems of ground noise and electromagnetic interference in the prior art are solved, and more efficient and accurate electrical signal measurement is achieved, and operation is improved Convenience.
CN222461544UActive Publication Date: 2025-02-11SHANGHAI ZHISHI ELECTRONIC TECH CO LTD
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Patent Information
- Application Number
- CN202420854004.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-24
- Publication Date
- 2025-02-11
- Estimated Expiration
- 2034-04-24
Smart Images
Figure CN222461544U_ABST
Abstract
The utility model relates to a test probe for an oscilloscope, and relates to the field of oscilloscopes, the test probe comprises a grounding ring, a spring lead and a grounding clamp, one end of the spring lead is fixedly connected with the grounding ring, and one end, far away from the grounding ring, of the spring lead is fixedly connected with the grounding clamp; the grounding clamp is provided with a filter circuit and a clamping state detection assembly, and the filter circuit is electrically connected with a twisted pair in the spring lead. According to the invention, the convenience for an operator to use the oscilloscope probe to detect signal grounds and grounding points at different positions can be improved.
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