Multifunctional integrated circuit chip testing machine

Abstract

The utility model discloses a multifunctional integrated circuit chip testing machine, relates to the technical field of chip testing equipment, and aims to solve the problems that when an existing chip is detected, in order to reduce the damage rate of a conveying device, a tool is kept in contact with the running conveying device, the chip possibly vibrates when being detected, and the detection efficiency of the chip is influenced. According to the technical scheme, the chip detection device comprises a rack, a test tool and an ejection piece, a conveying roller is arranged on the rack and used for conveying chips, a lifting mechanism and an identification mechanism are arranged on the rack, the identification mechanism comprises a top support, and a test mechanism is arranged on the top support. According to the utility model, the lifting mechanism, the testing mechanism and the identification mechanism are matched for use, so that the chip can be separated from the conveying device during detection, the conveying device does not need to be closed, the damage rate of the conveying device is reduced, the accuracy of a detection result is improved, and the use effect is good.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing equipment, in particular to a multifunctional integrated circuit chip testing machine. Background Art

[0002] Integrated circuit chips are tiny chips composed of a large number of electronic devices and circuit elements (such as transistors, resistors, capacitors, etc.) and interconnection lines. These chips are usually manufactured on semiconductor wafers and are widely used in various electronic devices and systems, such as computers, mobile phones, cars, home appliances, etc.

[0003] After searching, a Chinese patent with authorization announcement number CN212341374U discloses a multifunctional integrated circuit chip tester, including a main bracket, a conveying mechanism, a testing mechanism, a marking mechanism, a fixture and a CCD camera. The conveying mechanism is used to move the fixture carrying the integrated circuit chip to the testing station, the testing mechanism detects the integrated circuit chip at the testing station, the CCD camera is used to identify the specific position of the fixture, and the marking mechanism includes a driving component and a laser coding device. When unqualified products are detected, the driving component drives the laser coding device to move to the corresponding position according to the position information fed back by the CCD camera, and performs coding marking on the marking plate at the corresponding position of the fixture, so as to facilitate the sorting of chips on the loading station and avoid sorting confusion.

[0004] However, there are still shortcomings in the prior art. When the existing integrated circuit chip tester is in use, the tooling with the chip installed is usually placed on a conveying device for testing. When the tooling moves to the testing position, the tooling is limited and fixed, but the tooling still maintains contact with the running conveying device, which may cause the chip to vibrate during testing, thereby affecting the accuracy of the test results. For this reason, we propose a multifunctional integrated circuit chip tester to solve this problem. Utility Model Content

[0005] The utility model is a multifunctional integrated circuit chip tester proposed to solve the problem that when the existing chip is tested, in order to reduce the damage rate of the conveying device, the tooling is kept in contact with the running conveying device, which may cause the chip to vibrate during the test, thereby affecting the accuracy of the test result.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A multifunctional integrated circuit chip testing machine, comprising:

[0008] A frame, a testing fixture and an ejector, wherein the frame is provided with a conveying roller for conveying chips, the frame is provided with a lifting mechanism and a marking mechanism, the marking mechanism comprises a top bracket, and the top bracket is provided with a testing mechanism.

[0009] Preferably, the lifting mechanism comprises a U-shaped bracket, a first cylinder is fixedly provided on the U-shaped bracket, an I-shaped plate is fixedly provided on the output shaft of the first cylinder, baffles are fixedly provided on the four corners of the I-shaped plate for positioning the chip.

[0010] Preferably, a second cylinder is fixedly provided on the top of the I-shaped plate, a support plate is fixedly provided on the output shaft of the second cylinder, ejectors are fixedly provided on the four corners of the top of the support plate, and the ejectors are hollowed out for weight reduction and pressure relief.

[0011] Preferably, the testing mechanism includes a testing tool for installing chips, two testing plates are symmetrically arranged on the top of the testing tool, third cylinders are fixedly arranged on both sides of the top bracket, rubber plates and probes are respectively fixedly arranged on the output shafts of the two third cylinders, and the probes are electrically connected to the corresponding testing plates.

[0012] Preferably, two detection devices are fixedly provided on the top inner wall of the top bracket, and the detection devices are adapted to the test fixture. A guide plate is fixedly provided on the bottom of the test fixture, and the guide plate is adapted to the conveying roller. Card slots are provided on the four corners of the bottom of the test fixture, and the card slots are adapted to the ejection piece.

[0013] Preferably, two laser coding devices are fixedly arranged on the top inner wall of the top bracket, and an installation groove is opened on the test fixture. An identification plate is movably arranged in the installation groove, and the identification plate is adapted to the laser coding device. An identification block is fixedly arranged on one end of the identification plate for identifying the installation direction.

[0014] Preferably, two limit rods are fixedly provided on the bottom inner wall of the mounting groove, a spring is provided on the sliding sleeve of the limit rod, the limit rod is slidably connected to the identification plate, a fixing plate is provided on the test fixture, and the fixing plate is located above the identification plate.

[0015] In the utility model, a multifunctional integrated circuit chip tester is described, by placing a test fixture with a chip installed on a conveying roller, the test fixture and the chip move with the conveying roller, and when it moves to a preset position, the first cylinder is started, so that the baffle can be driven to move upward and position the test fixture, and then the second cylinder is started, so that the ejector can be driven to move upward and inserted into the card slot, so that the positioning fixture and the chip can be raised to the preset position, thereby breaking away from the contact with the conveying roller;

[0016] In the utility model, the multifunctional integrated circuit chip tester can drive the rubber plate and the probe to contact the corresponding test plate by starting the two third cylinders, and cooperate with the detection device to detect the chip, and control the laser coding device to print the corresponding detection information on the identification plate according to the detection result, at this time, the detection of the chip is completed;

[0017] The utility model cooperates with the lifting mechanism, the testing mechanism and the marking mechanism to enable the chip to be separated from the contact with the conveying device during detection without closing the conveying device, thereby reducing the damage rate of the conveying device and improving the accuracy of the detection result, and having a good use effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a three-dimensional structural schematic diagram of a multifunctional integrated circuit chip tester proposed by the utility model;

[0019] Figure 2 This is a structural schematic diagram of the lifting mechanism of a multifunctional integrated circuit chip tester proposed by the utility model;

[0020] Figure 3 This is a structural schematic diagram of the lifting mechanism of a multifunctional integrated circuit chip tester proposed by the utility model;

[0021] Figure 4 This is a structural schematic diagram of the identification mechanism part of a multifunctional integrated circuit chip tester proposed by the utility model;

[0022] Figure 5 This is a structural schematic diagram of the identification mechanism part of a multifunctional integrated circuit chip tester proposed by the utility model;

[0023] Figure 6 This is a structural schematic diagram of the testing mechanism part of a multifunctional integrated circuit chip testing machine proposed by the utility model;

[0024] Figure 7 The utility model provides a structural schematic diagram of the testing mechanism part of a multifunctional integrated circuit chip testing machine.

[0025] In the figure: 1, frame; 2, conveyor roller; 3, lifting mechanism; 4, testing mechanism; 5, identification mechanism; 301, U-shaped bracket; 302, first cylinder; 303, I-shaped plate; 304, baffle; 305, second cylinder; 306, ejector; 307, slot; 401, test fixture; 402, test plate; 403, third cylinder; 404, rubber plate; 405, probe; 406, detection device; 407, guide plate; 501, top bracket; 502, laser coding device; 503, mounting slot; 504, limit rod; 505, spring; 506, identification plate; 507, identification block; 508, fixing plate. DETAILED DESCRIPTION

[0026] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0027] Reference Figure 1-7 , an embodiment provided by this scheme: a multifunctional integrated circuit chip tester, comprising:

[0028] The frame 1, the testing fixture 401 and the ejector 306, the frame 1 is provided with a conveying roller 2 for conveying chips, the frame 1 is provided with a lifting mechanism 3 and an identification mechanism 5, the identification mechanism 5 includes a top bracket 501, and the top bracket 501 is provided with a testing mechanism 4.

[0029] In this embodiment, the lifting mechanism 3 includes a U-shaped bracket 301, on which a first cylinder 302 is fixedly provided, on the output shaft of the first cylinder 302 an I-shaped plate 303 is fixedly provided, and on the four corners of the I-shaped plate 303 baffles 304 are fixedly provided for positioning the chip.

[0030] In this embodiment, a second cylinder 305 is fixedly provided on the top of the I-shaped plate 303, a support plate is fixedly provided on the output shaft of the second cylinder 305, and ejectors 306 are fixedly provided on the four corners of the top of the support plate. The ejectors 306 are hollowed out for weight reduction and pressure relief.

[0031] In this embodiment, the testing mechanism 4 includes a testing tool 401 for installing chips. Two testing plates 402 are symmetrically arranged on the top of the testing tool 401. A third cylinder 403 is fixedly arranged on both sides of the top bracket 501. Rubber plates 404 and probes 405 are respectively fixedly arranged on the output shafts of the two third cylinders 403. The probes 405 are electrically connected to the corresponding testing plates 402.

[0032] In this embodiment, two detection devices 406 are fixedly provided on the top inner wall of the top bracket 501, and the detection devices 406 are adapted to the test fixture 401. A guide plate 407 is fixedly provided on the bottom of the test fixture 401, and the guide plate 407 is adapted to the conveying roller 2. The four corners of the bottom of the test fixture 401 are provided with card slots 307, and the card slots 307 are adapted to the ejection piece 306.

[0033] In this embodiment, two laser coding devices 502 are fixedly installed on the top inner wall of the top bracket 501, and a mounting groove 503 is opened on the test fixture 401. An identification plate 506 is movably arranged in the mounting groove 503. The identification plate 506 is adapted to the laser coding device 502, and an identification block 507 is fixedly installed on one end of the identification plate 506 for identifying the installation direction.

[0034] In this embodiment, two limit rods 504 are fixedly provided on the bottom inner wall of the installation groove 503, and a spring 505 is slidably sleeved on the limit rods 504. The limit rods 504 are slidably connected to the identification plate 506. A fixing plate 508 is clamped on the test tooling 401, and the fixing plate 508 is located above the identification plate 506.

[0035] In this embodiment, when in use, first, the test fixture 401 with the chip installed is placed on the conveying roller 2, and the test fixture 401 and the chip move with the conveying roller 2. When it moves to the preset position, the first cylinder 302 is started, so that the baffle 304 can be driven to move upward and the test fixture 401 is positioned. Then, the second cylinder 305 is started, and the ejector 306 can be driven to move upward and inserted into the card slot 307, so that the positioning fixture and the chip can be raised to the preset position, thereby breaking away from the contact with the conveying roller 2. At this time, the two third cylinders 403 are started, so that the rubber plate 404 and the probe 405 can be driven to contact the corresponding test plate 402, and cooperate with the detection device 406 to detect the chip, and the laser coding device 502 is controlled according to the detection result to print the corresponding detection information on the identification plate 506. At this time, the detection of the chip is completed.

[0036] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0037] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0038] The preferred embodiments of the utility model disclosed above are only used to help explain the utility model. The preferred embodiments do not describe all the details in detail, nor do they limit the utility model to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the utility model, so that technicians in the relevant technical field can well understand and use the utility model. The utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A multifunctional integrated circuit chip tester, characterized in that: include: A frame (1), a testing fixture (401) and an ejector (306), wherein the frame (1) is provided with a conveying roller (2) for conveying chips, the frame (1) is provided with a lifting mechanism (3) and a marking mechanism (5), the marking mechanism (5) comprises a top bracket (501), and the top bracket (501) is provided with a testing mechanism (4).

2. A multifunctional integrated circuit chip tester according to claim 1, characterized in that: The lifting mechanism (3) comprises a U-shaped bracket (301), a first cylinder (302) is fixedly arranged on the U-shaped bracket (301), an I-shaped plate (303) is fixedly arranged on the output shaft of the first cylinder (302), and baffles (304) are fixedly arranged on the four corners of the I-shaped plate (303) for positioning the chip.

3. A multifunctional integrated circuit chip tester according to claim 2, characterized in that: A second cylinder (305) is fixedly arranged on the top of the I-shaped plate (303), a support plate is fixedly arranged on the output shaft of the second cylinder (305), and ejector parts (306) are fixedly arranged on the four corners of the top of the support plate. The ejector parts (306) are hollowed out and are used for weight reduction and pressure relief.

4. The multifunctional integrated circuit chip tester according to claim 1, characterized in that: The testing mechanism (4) comprises a testing fixture (401) for mounting a chip, two testing boards (402) are symmetrically arranged on the top of the testing fixture (401), third cylinders (403) are fixedly arranged on both sides of the top bracket (501), and rubber plates (404) and probes (405) are respectively fixedly arranged on the output shafts of the two third cylinders (403), and the probes (405) are electrically connected to the corresponding testing boards (402).

5. The multifunctional integrated circuit chip tester according to claim 1, characterized in that: Two detection devices (406) are fixedly arranged on the top inner wall of the top bracket (501), and the detection devices (406) are compatible with the test fixture (401). A guide plate (407) is fixedly arranged on the bottom of the test fixture (401), and the guide plate (407) is compatible with the conveying roller (2). The four corners of the bottom of the test fixture (401) are each provided with a card slot (307), and the card slot (307) is compatible with the ejector (306).

6. The multifunctional integrated circuit chip tester according to claim 1, characterized in that: Two laser coding devices (502) are fixedly arranged on the top inner wall of the top bracket (501), a mounting groove (503) is provided on the test fixture (401), an identification plate (506) is movably arranged in the mounting groove (503), the identification plate (506) is adapted to the laser coding device (502), and an identification block (507) is fixedly arranged on one end of the identification plate (506) for identifying the installation direction.

7. A multifunctional integrated circuit chip tester according to claim 6, characterized in that: Two limit rods (504) are fixedly arranged on the inner wall of the bottom of the installation groove (503), and a spring (505) is slidably sleeved on the limit rods (504). The limit rods (504) are slidably connected to the identification plate (506), and a fixing plate (508) is clamped on the test fixture (401), and the fixing plate (508) is located above the identification plate (506).

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