High-temperature reverse bias testing machine capable of rapidly replacing elements

Abstract

The utility model discloses a high-temperature reverse bias voltage testing machine capable of quickly replacing elements, which belongs to the technical field of electronic element testing and comprises a testing machine body, a control screen is mounted on one side of the testing machine body, and a high-temperature area and a storage area are arranged in the testing machine body. A plurality of high-temperature anti-deviation aging plates are fixedly mounted between the inner walls of the high-temperature area, a plurality of supporting frames are slidably mounted between the inner walls of the high-temperature area, a connecting rod is fixedly mounted between every two adjacent supporting frames, electric push rods are symmetrically and fixedly mounted at the top ends of the inner walls of the high-temperature area, and the output ends of the electric push rods are fixedly connected with the top end of the uppermost supporting frame; a placing plate is slidably mounted on the inner wall of the supporting frame, a positioning assembly and a clamping assembly are mounted in the placing plate, the placing plate and the high-temperature anti-deviation burn-in plate can be quickly and fixedly connected conveniently, meanwhile, pins of electronic elements can be quickly fixed and taken out conveniently, and the testing efficiency of the electronic elements is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing, in particular to a high-temperature reverse bias testing machine capable of quickly replacing components. Background Art

[0002] At present, electronic components are basic elements in electronic circuits. They are usually individually packaged and have two or more leads or metal contacts. Electronic component testing is the application of testing service industry technology in the electronic information industry. It is an important link in the specific industrial chain of electronic components. The technical level of testing services is closely related to the quality of electronic components. Electronic technology is an emerging technology that began to develop in the late 19th century and early 20th century. It developed most rapidly and was most widely used in the 20th century, becoming an important symbol of the development of modern science and technology. How to accurately and effectively detect the relevant parameters of components and identify the quality of components must adopt different methods according to different components, so as to determine whether the components can work normally.

[0003] In the prior art, when testing is required, the pins of the electronic components are generally fixed on a placement board first, and then the placement board and the high-temperature anti-bias aging board are fixed by pins. However, the pins need to be fixed to the four corners of the placement board and the high-temperature anti-bias aging board at the same time, which makes the operation more complicated and difficult to disassemble, resulting in a lower speed for replacing components, thereby reducing the detection efficiency. Utility Model Content

[0004] In order to make up for the above shortcomings, the utility model provides a high-temperature reverse bias testing machine that can quickly replace components, aiming to improve the problem that pins need to fix the four corners of the placement plate and the high-temperature reverse bias aging board at the same time, the operation is cumbersome and difficult to disassemble, resulting in a decrease in the speed of replacing components, thereby reducing the detection efficiency.

[0005] The utility model is implemented as follows: a high-temperature reverse bias tester capable of quickly replacing components, comprising a tester body, a control panel installed on one side of the tester body, a high-temperature zone and a storage zone arranged in the tester body, a sliding door hingedly arranged on one side of the high-temperature zone, a plurality of high-temperature anti-bias aging plates fixedly installed between the inner walls of the high-temperature zone and a plurality of support frames slidably installed, a connecting rod fixedly installed between two adjacent support frames, an electric push rod symmetrically fixedly installed on the top of the inner wall of the high-temperature zone, an output end of the electric push rod fixedly connected to the top of the uppermost support frame, the support frame having an opening on the side closest to the sliding door, a placement plate slidably installed on the inner wall of the support frame, a positioning assembly and a clamping assembly installed in the placement plate.

[0006] In the preferred technical solution of the utility model, the support frame and the high-temperature anti-bias aging board are arranged alternately, a plurality of pin holes are opened on the placement board, a plurality of pin slots are opened on the high-temperature anti-bias aging board, the pin holes and the pin slots are arranged correspondingly, and the top of each of the high-temperature anti-bias aging boards is movably connected to one of the support frames.

[0007] In the preferred technical solution of the utility model, limit strips are fixedly installed on both sides of the placement plate, and the inner wall of the support frame is provided with limit slide grooves matching the limit strips. When the limit strips are inserted into the limit slide grooves, the bottom end of the placement plate and the bottom end of the support frame are in the same plane.

[0008] In the preferred technical solution of the utility model, a plurality of placement frames matching the placement plates are fixedly installed in the storage area, and the placement frames have the same structure as the support frame.

[0009] In the preferred technical solution of the utility model, the placement plate is hollow, and a partition is fixedly installed on the inner wall of the placement plate. The partition divides the placement plate into a positioning area and a clamping area, and the positioning assembly and the clamping assembly are respectively installed in the positioning area and the clamping area.

[0010] In the preferred technical solution of the present utility model, the clamping assembly includes a slide plate, a spring and a first slider, the slide plate is slidably installed on the inner wall of the clamping area, the slide plate is provided with a through hole matching the pin socket, a plurality of the springs are fixedly installed between one side of the slide plate and one side of the partition, the first slider is fixedly installed on the other side of the partition, one end of the first slider slides through one side of the placement plate and extends to the outside, and the plurality of through holes correspond one-to-one to the plurality of pin sockets.

[0011] In the preferred technical solution of the present utility model, a limit plate is symmetrically fixedly installed on the inner wall of the clamping area, one side of the slide plate is movably connected to one side of the limit plate, and when the first slider is not subjected to external force, the elastic force of the spring pushes the slide plate to move to fit with one side of the limit plate. At this time, one end of the first slider extends to the outside of the placement plate, and the through hole is aligned and connected with the pin socket.

[0012] In the preferred technical solution of the present utility model, the positioning assembly includes a threaded rod, a second slider and an insertion rod, the side plates are symmetrically fixedly installed on the inner wall of the positioning area, the threaded rod is symmetrically rotated to install the two side plates farthest from each other, the second slider is threadedly installed on the threaded rod, the insertion rod is symmetrically fixedly installed on one side of the second slider, one end of the insertion rod slides through one side of the placement plate and extends to the outside, the inner wall of the support frame is provided with a positioning groove matching the insertion rod, a driving member is installed between the two threaded rods, and the second slider is slidably connected to the inner wall of the positioning area.

[0013] In the preferred technical solution of the present utility model, the driving member includes a first rotating shaft and a turntable, the first rotating shaft is fixedly connected between the two threaded rods, the first rotating shaft is fixedly installed with a first bevel gear, the second rotating shaft is rotatably installed on one side of the inner wall of the positioning area, the second bevel gear is fixedly installed on one end of the second rotating shaft, the first bevel gear and the second bevel gear are meshingly connected, one end of the second rotating shaft passes through one side of the placement plate and the turntable is fixedly installed, and the first rotating shaft slides through the side plate.

[0014] In the preferred technical solution of the utility model, a plurality of guide rods are fixedly installed between the two sides of the inner wall of the high temperature zone, the support frame is slidably installed on the guide rods, the guide rods are arranged at the four corners of the high temperature zone, and the length of the support frame is longer than the length of the high temperature anti-bias aging board.

[0015] The beneficial effects of the utility model are as follows: the utility model obtains a high-temperature reverse bias tester capable of quickly replacing components through the above-mentioned design. When in use, the pins of the electronic components are passed through the pin jacks and the through holes and extended to the outside, the placement plate full of electronic components is first placed in the placement frame, and when multiple placement plates are full, the sliding door is opened, and the placement plate is slid into the support frame, and when the first sliding block is squeezed and moved with the inner wall of the support frame, the sliding plate is driven to move, and the movement of the sliding plate squeezes the spring and drives the through holes to move to clamp and fix the pins of the electronic components, and the state of squeezing the placement plate into the support frame is maintained and the turntable is rotated, and the rotation of the turntable is controlled by the second rotating shaft, the first bevel gear and the second bevel gear. The cooperation drives the first rotating shaft to rotate, the rotation of the first rotating shaft drives the threaded rod to rotate, the rotation of the threaded rod drives the second sliding block to move, the movement of the second sliding block drives the insertion rod to move into the positioning groove and be fixed, and finally the electric push rod is started to drive the support frame to move, and the support frame cooperates with the connecting rod to make multiple support frames move at the same time, and the movement of the support frame drives the placement plate to move to fit with the top of the high-temperature anti-bias aging board. At this time, the pins of the electronic components are inserted into the pin slots, and the sliding door is closed for testing. This device is convenient for quickly fixing and connecting the placement plate and the high-temperature anti-bias aging board, and is also convenient for quickly fixing and removing the pins of the electronic components. It is easy to operate and improves the testing efficiency of the electronic components. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solution of the implementation mode of the utility model, the drawings required for use in the implementation mode will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1This is a schematic diagram of the structure of a high-temperature reverse bias tester capable of quickly replacing components provided by an embodiment of the utility model;

[0018] Figure 2 A schematic diagram of the internal structure of the high temperature zone is provided for the implementation mode of the utility model;

[0019] Figure 3 A schematic diagram of the structure of the placement plate is provided for the implementation mode of the utility model;

[0020] Figure 4 A schematic diagram of the internal structure of a placement plate is provided for an embodiment of the utility model;

[0021] Figure 5 for Figure 4 Enlarged view of point A in the middle.

[0022] In the figure: 110-high temperature zone; 111-sliding door; 112-guide rod; 120-storage area; 121-placing frame; 130-high temperature anti-bias aging board; 131-support frame; 132-connecting rod; 133-electric push rod; 140-placing plate; 141-pin jack; 142-limiting strip; 143-partition; 150-slide plate; 151-spring; 152-first slider; 153-through hole; 154-limiting plate; 160-threaded rod; 161-second slider; 162-insertion rod; 163-side plate; 164-first rotating shaft; 165-turntable. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the implementation of the utility model clearer, the technical solution in the implementation of the utility model will be clearly and completely described below in conjunction with the drawings in the implementation of the utility model. Obviously, the described implementation is a part of the implementation of the utility model, not all of the implementations. Based on the implementation of the utility model, all other implementations obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] See also Figure 1 , Figure 2 and Figure 5The utility model provides a technical solution: a high-temperature reverse bias tester capable of quickly replacing components, comprising a tester body, a control panel installed on one side of the tester body, a high-temperature zone 110 and a storage area 120 arranged in the tester body, a hinged sliding door 111 arranged on one side of the high-temperature zone 110, a plurality of high-temperature anti-bias aging plates 130 and a plurality of slidably installed support frames 131 are fixedly installed between the inner walls of the high-temperature zone 110, a connecting rod 132 is fixedly installed between two adjacent support frames 131, an electric push rod 133 is symmetrically fixedly installed on the top of the inner wall of the high-temperature zone 110, an output end of the electric push rod 133 is fixedly connected to the top of the uppermost support frame 131, and the side of the support frame 131 closest to the sliding door 111 is an opening. The support frame 131 is provided with a placement plate 140 which is slidably installed on the inner wall of the placement plate 140. A positioning component and a clamping component are installed in the placement plate 140. The support frame 131 and the high-temperature anti-bias aging plate 130 are staggered. A plurality of pin sockets 141 are provided on the placement plate 140. A plurality of pin slots are provided on the high-temperature anti-bias aging plate 130. The pin sockets 141 and the pin slots are correspondingly arranged. The top of each high-temperature anti-bias aging plate 130 is movably connected to a support frame 131. Limiting strips 142 are fixedly installed on both sides of the placement plate 140. A limiting slide groove matching the limiting strip 142 is provided on the inner wall of the support frame 131. When the limiting strip 142 is inserted into the limiting slide groove, the bottom end of the placement plate 140 and the bottom end of the support frame 131 are in the same plane.

[0025] In some specific implementation schemes, a plurality of placement frames 121 matching the placement plates 140 are fixedly installed in the storage area 120 . The placement frames 121 have the same structure as the support frames 131 , so as to facilitate the placement plates 140 to be stored before being placed in the high temperature area 110 .

[0026] In some specific implementation schemes, a plurality of guide rods 112 are fixedly installed between the two sides of the inner wall of the high temperature zone 110, and the support frame 131 is slidably installed on the guide rods 112. The guide rods 112 are arranged at the four corners of the high temperature zone 110. The length of the support frame 131 is longer than the length of the high temperature anti-bias aging board 130. The guide rods 112 improve the stability of the support frame 131 when driving the placement board 140 to move.

[0027] See also Figure 3 and Figure 4The placement plate 140 is hollow, and a partition 143 is fixedly installed on the inner wall of the placement plate 140. The partition 143 divides the placement plate 140 into a positioning area and a clamping area. The positioning component and the clamping component are respectively installed in the positioning area and the clamping area. The clamping component includes a slide plate 150, a spring 151 and a first slider 152. The slide plate 150 is slidably installed on the inner wall of the clamping area. The slide plate 150 is provided with a through hole 153 matching the pin socket 141. A plurality of springs 151 are fixedly installed between one side of the slide plate 150 and one side of the partition 143. The first slider 152 is fixedly installed on the other side of the partition 143. One end of the first slider 152 slides through one side of the placement plate 140 and extends to the outside. The plurality of through holes 153 correspond to the plurality of pin sockets 141 one by one. The positioning component includes a threaded rod 160, a second slider 161 and an insertion rod 162. The side plates 163 are symmetrically fixedly installed on the inner wall of the positioning area. The two side plates 163 The threaded rod 160 is symmetrically and rotatably installed on the farthest side, and a second slider 161 is threadedly installed on the threaded rod 160. An insertion rod 162 is symmetrically and fixedly installed on one side of the second slider 161. One end of the insertion rod 162 slides through one side of the placement plate 140 and extends to the outside. A positioning groove matching the insertion rod 162 is provided on the inner wall of the support frame 131. A driving member is installed between the two threaded rods 160. The second slider 161 is slidably connected to the inner wall of the positioning area. The driving member includes a first rotating shaft 164 and a rotating disk 165. The first rotating shaft 164 is fixedly connected between the two threaded rods 160. The first bevel gear is fixedly installed on the first rotating shaft 164. The second rotating shaft is rotatably installed on one side of the inner wall of the positioning area, and the second bevel gear is fixedly installed on one end of the second rotating shaft. The first bevel gear and the second bevel gear are meshed and connected. One end of the second rotating shaft passes through one side of the placement plate 140 and is fixedly installed with the rotating disk 165. The first rotating shaft 164 slides through the side plate 163

[0028] In some specific implementation schemes, a limit plate 154 is symmetrically fixedly installed on the inner wall of the clamping area, and one side of the slide plate 150 is movably connected to one side of the limit plate 154. When the first slider 152 is not subjected to external force, the elastic force of the spring 151 pushes the slide plate 150 to move to fit with one side of the limit plate 154. At this time, one end of the first slider 152 extends to the outside of the placement plate 140, and the through hole 153 is aligned and connected with the pin socket 141, which is convenient for quickly fixing the pins of the electronic components and also convenient for disassembly after the test is completed.

[0029] In some specific embodiments, the driving member includes a first rotating shaft 164 and a turntable 165. The first rotating shaft 164 is fixedly connected between the two threaded rods 160. The first bevel gear is fixedly installed on the first rotating shaft 164. The second rotating shaft is rotatably installed on one side of the inner wall of the positioning area. The second bevel gear is fixedly installed on one end of the second rotating shaft. The first bevel gear and the second bevel gear are meshingly connected. One end of the second rotating shaft passes through one side of the placement plate 140 and is fixedly installed with the turntable 165. The first rotating shaft 164 slides through the side plate 163 to facilitate driving the threaded rod 160 to rotate, thereby quickly fixing and disassembling the placement plate 140.

[0030] Working principle: When in use, the pins of the electronic components are passed through the pin insertion holes 141 and the through holes 153 and extended to the outside. The placement plate 140 filled with electronic components is first placed in the placement frame 121. When multiple placement plates 140 are full, the sliding door 111 is opened, and the placement plate 140 is slid into the support frame 131. When the first slider 152 is squeezed and moved with the inner wall of the support frame 131, the slide plate 150 is driven to move. The movement of the slide plate 150 squeezes the spring 151 and drives the through hole 153 to move to clamp and fix the pins of the electronic components. The state of squeezing the placement plate 140 into the support frame 131 is maintained and the turntable 165 is rotated. The turntable 165 rotates through the first slider 152 and the inner wall of the support frame 131. The cooperation of the two rotating shafts, the first bevel gear and the second bevel gear drives the first rotating shaft 164 to rotate, the rotation of the first rotating shaft 164 drives the threaded rod 160 to rotate, the rotation of the threaded rod 160 drives the second slider 161 to move, the movement of the second slider 161 drives the insertion rod 162 to move to the positioning groove and be fixed, and finally the electric push rod 133 is started to drive the support frame 131 to move, the support frame 131 cooperates with the connecting rod 132 to make multiple support frames 131 move at the same time, the movement of the support frame 131 drives the placement plate 140 to move to fit with the top of the high-temperature anti-bias aging board 130, at this time, the pins of the electronic components are inserted into the pin slots, and the sliding door 111 is closed for testing.

[0031] The above description is only the preferred implementation of the utility model, and is not intended to limit the utility model. For those skilled in the art, the utility model can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A high temperature reverse bias tester capable of quickly replacing components, comprising a tester body, a control panel being installed on one side of the tester body, characterized in that: A high-temperature zone and a storage area are provided in the body of the testing machine, a sliding door is hingedly provided on one side of the high-temperature zone, a plurality of high-temperature anti-bias aging plates and a plurality of support frames are slidably installed between the inner walls of the high-temperature zone, a connecting rod is fixedly installed between two adjacent support frames, an electric push rod is symmetrically fixedly installed on the top of the inner wall of the high-temperature zone, the output end of the electric push rod is fixedly connected to the top of the uppermost support frame, the support frame is opened on the side closest to the sliding door, a placement plate is slidably installed on the inner wall of the support frame, and a positioning assembly and a clamping assembly are installed in the placement plate.

2. A high temperature reverse bias tester with quick component replacement according to claim 1, characterized in that: The support frame and the high temperature anti-bias aging board are arranged alternately, the placement board is provided with a plurality of pin holes, the high temperature anti-bias aging board is provided with a plurality of pin slots, and the pin holes and the pin slots are arranged correspondingly.

3. A high temperature reverse bias tester with quick component replacement according to claim 1, characterized in that: Limiting strips are fixedly installed on both sides of the placement plate, and the inner wall of the support frame is provided with limiting sliding grooves matching the limiting strips.

4. A high temperature reverse bias tester with quick component replacement according to claim 1, characterized in that: A plurality of placement frames matching the placement plates are fixedly installed in the storage area, and the placement frames have the same structure as the support frame.

5. The high temperature reverse bias tester capable of quickly replacing components according to claim 2, characterized in that: The placement plate is hollow inside, and a partition is fixedly installed on the inner wall of the placement plate. The partition divides the placement plate into a positioning area and a clamping area. The positioning component and the clamping component are respectively installed in the positioning area and the clamping area.

6. A high temperature reverse bias tester capable of quickly replacing components according to claim 5, characterized in that: The clamping assembly includes a slide plate, a spring and a first slider. The slide plate is slidably mounted on the inner wall of the clamping area. The slide plate is provided with a through hole matching the pin socket. A plurality of springs are fixedly mounted between one side of the slide plate and one side of the partition. The first slider is fixedly mounted on the other side of the partition. One end of the first slider slides through one side of the placement plate and extends to the outside.

7. A high temperature reverse bias tester capable of quickly replacing components according to claim 6, characterized in that: A limiting plate is symmetrically fixedly mounted on the inner wall of the clamping area, and one side of the sliding plate is movably connected to one side of the limiting plate.

8. The high temperature reverse bias tester capable of quickly replacing components according to claim 5, characterized in that: The positioning assembly includes a threaded rod, a second slider and an insertion rod. The inner wall of the positioning area is symmetrically fixed with side plates. The threaded rod is symmetrically and rotationally installed on the side farthest from the two side plates. The second slider is threadedly installed on the threaded rod. The insertion rod is symmetrically and fixedly installed on one side of the second slider. One end of the insertion rod slides through one side of the placement plate and extends to the outside. The inner wall of the support frame is provided with a positioning groove matching the insertion rod, and a driving member is installed between the two threaded rods.

9. A high temperature reverse bias tester capable of quickly replacing components according to claim 8, characterized in that: The driving member includes a first rotating shaft and a rotating disk. The first rotating shaft is fixedly connected between the two threaded rods. The first bevel gear is fixedly installed on the first rotating shaft. The second rotating shaft is rotatably installed on one side of the inner wall of the positioning area. The second bevel gear is fixedly installed on one end of the second rotating shaft. The first bevel gear and the second bevel gear are meshed and connected. One end of the second rotating shaft passes through one side of the placement plate and is fixedly installed on the rotating disk.

10. The high temperature reverse bias tester capable of quickly replacing components according to claim 1, characterized in that: A plurality of guide rods are fixedly installed between two sides of the inner wall of the high temperature zone, and the support frame is slidably installed on the guide rods.

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