Backlight automatic aging device
By designing the backlight automatic aging device and dynamically controlling the power supply status of the backlight components with computers and control systems, the problem of not being able to effectively eliminate process defects and being unable to simulate the actual use environment in the prior art is solved, and efficient and reliable LED backlight aging experiment is achieved.
Patent Information
- Application Number
- CN202420592110.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-26
- Publication Date
- 2025-03-07
- Estimated Expiration
- 2034-03-26
AI Technical Summary
The prior art cannot effectively eliminate process defects in LED backlight aging screening, and traditional preset aging parameters cannot truly simulate changes in the actual use environment, resulting in insufficient reliability and accuracy of aging experiments.
Design a backlight automatic aging device, which is connected to the programmable power supply and the test chamber through a computer and control system, dynamically controls the power supply status of the backlight components, and automatically adjusts the high and low temperature cycle curves according to the status of the test chamber to simulate the actual use environment.
Automatic high and low temperature power supply aging and recording is realized, the test efficiency is improved, and the switching state of the lamp can be dynamically controlled according to the aging parameters of the experiment box, which enhances the reliability and accuracy of the aging experiment.
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Figure CN222580228U_ABST
Abstract
Description
Technical Field
[0001] The utility model mainly relates to the technical field of backlight aging detection, and in particular to an automatic backlight aging device. Background Art
[0002] At present, LED lights have been widely used in various fields. In industries and fields with high reliability requirements, the failure control of LED lights is extremely high, which requires aging screening, especially screening of components made of LED lights, to eliminate early process defects to ensure the reliability of subsequent applications. When LED is used in the display field, it is combined with LCD screens to form liquid crystal displays, which are widely used in various fields and become the eyes of various terminal equipment as an essential component.
[0003] The aging screening of LEDs in the prior art usually involves controlling the aging of the lamp in a test chamber at a high temperature for continuous operation, so that the aging process quickly reaches the stable period of the component's "bathtub curve", such as operating at a high temperature of 70 degrees for 4 hours, or longer. This only enables the LED backlight to enter a stable period, and cannot eliminate process defects. The prior art controls the switching of the lamp according to the aging parameters of the test chamber, and does not control the change of the lamp's aging parameters, but only records the lamp's parameters. Therefore, the traditional preset aging parameters are only used for aging with fixed parameters, which cannot truly simulate changes in the actual use environment. Utility Model Content
[0004] 1. Technical problems to be solved by the utility model:
[0005] The utility model provides a backlight automatic aging device to solve the technical problems existing in the above-mentioned background technology.
[0006] 2. Technical solution:
[0007] To achieve the above-mentioned purpose, the technical solution provided by the utility model is: a backlight automatic aging device, including a computer and a control system installed in the computer, the control system is connected to a programmable power supply for two-way communication, the control system is connected to a test box for two-way communication, the programmable power supply is connected to a backlight assembly, the backlight assembly is arranged in the test box, the control system identifies the state of the test box, and the control system controls the programmable power supply to power on and off the backlight assembly.
[0008] Preferably, the test chamber adopts a constant temperature and humidity test chamber, and the test chamber is set with a high and low temperature cycle curve.
[0009] Preferably, the computer is connected to a communication serial port via a communication line, and the communication serial port is connected to a plurality of power supplies via a communication line.
[0010] Preferably, the computer is connected to a communication server or two communication serial ports via a communication line, and the communication server and the two communication serial ports are connected to a power source via a communication line.
[0011] Preferably, the two power supplies on the same layer form a group, the two power supplies are connected in series or in parallel, and a group of power supplies is connected to one backlight assembly to be tested.
[0012] 3. Beneficial effects:
[0013] Compared with the prior art, the technical solution provided by the utility model has the following beneficial effects:
[0014] The utility model first sets the high and low temperature cycle curve of the test box, then connects the control system to the test box and the programmable power supply for communication, and finally controls the automatic on and off aging of the backlight component through the control system on the computer, identifies the state of the test box through the control system in the computer, and controls the programmable power supply to power on and off the backlight component. The utility model can realize automatic high and low temperature power supply aging and recording, improve the test efficiency, and can dynamically control the switch state of the light according to the aging parameters of the test box to adapt to the aging requirements of the test box at different stages. By dynamically controlling according to the state of the test box, it can better simulate the actual use environment and improve the reliability and accuracy of the aging experiment. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0016] Figure 2 It is the wiring diagram of the utility model;
[0017] Figure 3 This is a wiring diagram of an embodiment of the utility model. DETAILED DESCRIPTION
[0018] To facilitate the understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. Several embodiments of the present invention are given in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.
[0019] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "page", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.
[0020] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.
[0021] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed", "provided with", etc. should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0022] It should be noted that the structures not introduced in the present invention are not related to the design points and improvement directions of the present invention, and are the same as the prior art or can be implemented by using the prior art, and will not be described in detail here. Example
[0023] See attached Figures 1 to 3 A backlight automatic aging device includes a computer and a control system installed in the computer, the control system is bidirectionally connected to a programmable power supply, the control system is bidirectionally connected to a test box, the programmable power supply is connected to a backlight component, the backlight component is arranged in the test box, the control system identifies the state of the test box, and the control system controls the programmable power supply to power on and off the backlight component.
[0024] The test chamber adopts a constant temperature and humidity test chamber, and the test chamber is set with high and low temperature cycle curves.
[0025] like Figure 3As shown, the computer is connected to the communication server through a communication line, and the communication server is connected to several power supplies through the communication line. In this embodiment, the model of the communication server is Uport1650-8, which can be connected to 8 power supplies at the same time. In this embodiment, the computer is also connected to two communication serial ports through a communication line, and the two communication serial ports are connected to two power supplies through a communication line. The model of the two communication serial ports is Usb-serial CH340. Figure 3 As shown, the computer is connected to 10 power supplies at the same time.
[0026] Two power supplies on the same layer form a group. The two power supplies are connected in series or in parallel, and one group of power supplies is connected to a backlight component to be tested. Currently, the power supply uses a three-way programmable power supply. Since the third channel of the power supply is 5V, it is not suitable for aging of the backlight component. Therefore, the third channel of the power supply is not used, and only the first and second channels of the power supply are used. The series and parallel connection of the power supply can be achieved through internal settings, or it can be operated externally in the same way as the settings of ordinary power supplies. One model of backlight includes four colors: white, red (orange), green, and blue. The wiring is achieved using two power supplies on the same layer for aging of one model of backlight. 3 and 4 form a group, 5 and 6 form a group, 7 and 8 form a group, 9 and 10 form a group, and 11 and 12 form a group. A group of backlight requires four power supplies. In the early days, there were only three power supply channels, so two power supplies were used to match a group of lights. In addition, if Figure 2 As shown, in the prior art, one power supply can also output four channels, so in other embodiments, only one power supply is needed for a group of backlights using the above power supply.
[0027] Working process: For the backlight components, mainly select the temperature aging content in the standard, select the low temperature TL and high temperature TH temperature points according to the application environment of the backlight components, and perform high and low temperature cycles. The heating and cooling speed must reach at least 5 degrees per minute. The low temperature TL does not work and keeps warm for t1 time, then it is powered on and the test box is heated to the high temperature TH. It uses the constant current mode and works at the rated current for t2 time. Then the LED lamp is powered off and the test box is cooled to the low temperature TL. The above cycle is continued for several cycles. Figure 3As shown, first select the corresponding COM port, such as COM1 port, according to the COM port marked on the power supply, and then set the parameters through the control system, such as voltage limiting, current limiting, voltage, and current. The power supply is provided by a programmable power supply, and the constant current mode is adopted. According to the number of backlight components, the wiring is connected in parallel, and the current is set to the current of a single group of LED lamps multiplied by the number of backlight components in parallel. The test box can communicate the acquisition stage status and set the temperature cycle stage. The control system controls the power on and off of the backlight component by identifying the temperature cycle stage of the test box to achieve the purpose of automatic aging control of the backlight component. And record the temperature curve of the experimental process, as well as the supply voltage and current of the backlight component. Since the LED lamp is powered by a constant current, and the voltage corresponding to the same current is different at high and low temperatures, the upper limit of the voltage setting is required to be more than 20% of the normal temperature to ensure that it can be aged in the same constant current mode at high and low temperatures.
[0028] The above-described embodiments only express a certain implementation method of the utility model, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the patent of the utility model. It should be pointed out that, for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the patent of the utility model shall be based on the attached claims.
Claims
1. A backlight automatic aging device, characterized in that: The invention comprises a computer and a control system installed in the computer, wherein the control system is connected to a programmable power supply for two-way communication, the control system is connected to a test box for two-way communication, the programmable power supply is connected to a backlight assembly, the backlight assembly is arranged in the test box, the control system identifies the state of the test box, and the control system controls the programmable power supply to power on and off the backlight assembly.
2. The backlight automatic aging device according to claim 1, characterized in that: The test box adopts a constant temperature and humidity test box, and the test box is set with a high and low temperature temperature cycle curve.
3. The backlight automatic aging device according to claim 1, characterized in that: The computer is connected to a communication serial port through a communication line, and the communication serial port is connected to a plurality of power supplies through the communication line.
4. The backlight automatic aging device according to claim 1, characterized in that: The computer is connected to a communication server or two communication serial ports through a communication line, and the communication server and the two communication serial ports are connected to a power source through a communication line.
5. The backlight automatic aging device according to claim 4, characterized in that: The two power supplies in the same layer form a group, the two power supplies are connected in series or in parallel, and a group of power supplies is connected to one backlight assembly to be tested.