Test fixture

Abstract

The utility model provides a test fixture. The test fixture comprises a cabinet, a plurality of interface assemblies and at least one EMC baffle plate. The case comprises a mounting panel and a case body, the mounting panel and the case body define a containing cavity, a plurality of plug-in mounting openings are formed in the mounting panel, the plurality of interface assemblies are arranged in the containing cavity, and the plurality of interface assemblies are arranged on the mounting panel in a penetrating mode through mounting openings in the mounting panel and fixedly connected with the mounting panel. The plurality of interface assemblies and the plurality of plug-in mounting openings are alternately arranged on the mounting panel, and the plurality of interface assemblies are used for being electrically connected with a to-be-tested single board; the at least one EMC baffle plate is matched with the plurality of plug-in mounting openings and is detachably connected with the case, and one end of the at least one EMC baffle plate is inserted into the case body through the corresponding plug-in mounting opening so as to isolate the plurality of interface assemblies; and the other end of the at least one EMC baffle plate is positioned on the outer side of the case and is detachably connected with the mounting panel. According to the utility model, the test complexity of the to-be-tested single board can be reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of electromagnetic compatibility, in particular to a test fixture. Background Art

[0002] When performing EMC (Electromagnetic Compatibility) tests on a single board or a single main board without a matching whole machine chassis, a closed shielding environment, i.e., the whole machine, is required for the test.

[0003] Specifically, during the EMC test process, a pure empty chassis needs to be used, and special IO baffles need to be sampled and installed on the front panel of the chassis according to the characteristics of each single board. At the same time, secondary shielding needs to be carried out by means of conductive cloth or conductive copper foil, which is not only time-consuming but also wastes manpower and material resources. Summary of the Utility Model

[0004] To solve the above problems, the test fixture provided by the utility model can reduce the test complexity and save manpower and material resources while ensuring good shielding performance of the whole chassis by setting at least one EMC baffle.

[0005] The utility model provides a test fixture, which includes: a chassis, a plurality of interface components, and at least one EMC baffle;

[0006] The chassis includes: a mounting panel and a box body. The mounting panel and the box body enclose a receiving cavity. A plurality of insertion openings are formed on the mounting panel. A plurality of interface components are arranged in the receiving cavity. The plurality of interface components pass through the mounting panel through the mounting openings on the mounting panel and are fixedly connected to the mounting panel. The plurality of interface components and the plurality of insertion openings are alternately arranged on the mounting panel. The plurality of interface components are used for electrically connecting to the single board to be tested;

[0007] At least one EMC baffle is adapted to the plurality of insertion openings and is detachably connected to the chassis. One end of at least one EMC baffle is inserted into the box body through the corresponding insertion opening to isolate the plurality of interface components;

[0008] The other end of at least one EMC baffle is located outside the chassis and is detachably connected to the mounting panel.

[0009] Optionally, the plurality of interface components include multiple types, and the interface components of the same type are located on the same side of adjacent EMC baffles.

[0010] Optionally, the test fixture further includes: a guide rail;

[0011] The guide rail is fixedly arranged in the box body, and at least one EMC baffle is slidably connected to the box body through the guide rail.

[0012] Optionally, the test fixture further includes: a support frame;

[0013] The support frame is located inside the box body and is used to fix the single board to be tested.

[0014] Optionally, the support frame includes a first support and a first stud;

[0015] A first strip-shaped sliding hole is formed in the first support. The first stud is slidably connected to the first support along a first direction through the first strip-shaped sliding hole, and the first stud is fixedly connected to the single board to be tested by screws.

[0016] Optionally, the support frame includes a second support and a second stud;

[0017] A second strip-shaped sliding hole is formed in the second support. The second stud is slidably connected to the second support along a second direction through the second strip-shaped sliding hole. The second direction intersects with the first direction, and the second stud is fixedly connected to the single board to be tested by screws.

[0018] Optionally, the first support is fixedly connected to the box body, and the second support is slidably connected to the box body.

[0019] Optionally, a ventilation opening is formed in the box body.

[0020] Optionally, the test fixture further includes a metal shielding wire mesh;

[0021] The metal shielding wire mesh is fixedly connected to the box body and covers the ventilation opening.

[0022] Optionally, each EMC baffle includes a partition sub-board and a mounting sub-board;

[0023] The partition sub-board is adapted to the insertion opening and is inserted into the mounting panel. The mounting sub-board intersects with the partition sub-board and is fixedly connected to one end of the partition sub-board. The mounting sub-board is detachably connected to the mounting panel.

[0024] The test fixture provided by the embodiment of the present invention can isolate multiple interface components from each other by setting at least one EMC baffle and inserting at least one EMC baffle into the insertion openings alternately arranged with multiple interface components, improving the shielding performance of the chassis. At the same time, the EMC baffle is convenient to load and unload, saving manpower and physical resources, and effectively improving the test efficiency of the single board to be tested. Description of the Drawings

[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0026] Figure 1 Exploded view of the EMC test fixture according to an embodiment of the present application;

[0027] Figure 2 Schematic structural diagram of the EMC test fixture according to an embodiment of the present application;

[0028] Figure 3 Schematic partial sectional view of the EMC test fixture according to an embodiment of the present application;

[0029] Figure 4 Schematic partial structural diagram of the EMC test fixture according to an embodiment of the present application;

[0030] Figure 5 Schematic cross-sectional view of the first stud / second stud according to an embodiment of the present application.

[0031] Reference numerals:

[0032] 1. Chassis; 11. Mounting panel; 111. Insertion opening; 12. Box body; 121. Ventilation opening; 2. Interface assembly; 3. EMC baffle; 31. Partition sub-board; 32. Mounting sub-board; 41. Guide rail; 42. Cross beam; 5. Support frame; 51. First bracket; 511. First strip-shaped sliding hole; 512. First loading and unloading hole; 52. First stud; 53. Second bracket; 531. Second strip-shaped sliding hole; 532. Second loading and unloading hole; 54. Second stud; 55. Card slot; 56. Threaded hole; 57. Fixed-point stud; 61. Metal shielding wire mesh; 62. Pressing frame; 63. Handle; 64. Hanging ear; 7. DUT (Device Under Test). Detailed implementation manners

[0033] To facilitate the understanding of the present application, the present application will be described more comprehensively below with reference to the relevant drawings. Embodiments of the present application are given in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the disclosure of the present application more thorough and comprehensive.

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present application belongs. The terms used in the specification of the present application herein are only for the purpose of describing specific embodiments and are not intended to limit the present application.

[0035] Spatial relation terms such as "under", "below", "lower", "beneath", "above", "upper", etc. can be used herein to describe the relationship of one element or feature shown in the figure with other elements or features. It should be understood that, in addition to the orientations shown in the figure, spatial relation terms also include different orientations of the device during use and operation. For example, if the device in the attached drawing is flipped, an element or feature described as "under other elements" or "beneath it" or "under it" will be oriented "above" other elements or features. Therefore, the exemplary terms "under" and "beneath" can include both upper and lower orientations. In addition, the device can also have other orientations (such as rotating 90 degrees or other orientations), and the spatial descriptors used herein are accordingly interpreted.

[0036] It should be noted that when an element is referred to as "fixedly connected" to another element, it can be directly on the other element or there can also be an intermediate element. When an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are only for illustrative purposes.

[0037] As used herein, the singular forms "a", "an" and "the" may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that terms such as "comprising" or "having" etc. specify the presence of the stated features, wholes, steps, operations, components, parts or combinations thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof.

[0038] This embodiment provides an EMC test fixture. Refer to Figure 1 and Figure 2 , the EMC test fixture includes: a chassis 1, a plurality of interface components 2 and at least one EMC baffle 3.

[0039] The chassis 1 includes: a mounting panel 11 and a box body 12. The mounting panel 11 and the box body 12 enclose a closed receiving cavity. A plurality of insertion openings 111 are formed in the mounting panel 11. Among them, a plurality of interface components 2 are arranged in the receiving cavity. The plurality of interface components 2 pass through the mounting panel 11 through the mounting openings on the mounting panel 11 and are fixedly connected to the mounting panel 11. The plurality of interface components 2 and the plurality of insertion openings 111 are alternately arranged on the mounting panel 11. The plurality of interface components 2 are used for electrically connecting to the to-be-tested single board 7.

[0040] At least one EMC baffle 3 is adapted to a plurality of insertion openings 111 and is detachably connected to the chassis 1. One end of at least one EMC baffle 3 is inserted into the box body 12 through the corresponding insertion opening 111 to isolate a plurality of interface components 2. The other end of at least one EMC baffle 3 is located outside the chassis 1 and is detachably connected to the mounting panel 11.

[0041] It should be noted that the mounting holes on multiple groups of mounting panels 11 and the plurality of insertion openings 111 are alternately arranged on the mounting panel 11. The specific number of mounting holes on one group of mounting panels 11 is at least one. Each mounting hole on the mounting panel 11 is adapted to one end of the corresponding interface component extending out of the chassis 1. The EMC baffle 3 and the mounting panel 11 can be detachably connected by devices such as screws or buckles; the mounting panel 11 and the box body 12 can be fixedly connected to the box body 12 by an integrally formed manner, or can be detachably connected to the box body 12 by screws or buckles.

[0042] In this embodiment, the entire chassis 1 is made of hot-dip galvanized sheet material; handles 63 and hanging ears 64 are respectively fixedly arranged on the left and right sides of the front end of the box body 12; the mounting panel 11 is formed by bending the box body 12, and the mounting panel 11 is the front panel of the chassis 1. The rear panel of the box body 12 is detachably connected to the side panel and the bottom panel of the box body 12 by screws. The overall shape of the chassis 1 is a hexahedron structure; the insertion openings 111 and the interface components 2 are alternately arranged in the left-right direction. The overall shape of the EMC baffle 3 is L-shaped; the specific number of mounting holes on each group of mounting panels 11 is 4.

[0043] Specifically, each EMC baffle 3 includes a partition sub-board 31 and a mounting sub-board 32. The insertion opening 111 is a vertical strip structure. The partition sub-board 31 is adapted to the insertion opening 111 and is inserted into the mounting panel 11. The mounting sub-board 32 is perpendicular to the partition sub-board 31 and is fixedly connected to one end of the partition sub-board 31. The mounting sub-board 32 is located outside the mounting panel 11 and is detachably connected to the mounting panel 11 by non-loosening screws.

[0044] The EMC test fixture provided in this embodiment, by setting at least one EMC baffle 3 and inserting at least one EMC baffle 3 into the insertion openings 111 alternately arranged with a plurality of interface components 2 respectively, can isolate a plurality of interface components 2 from each other, improve the shielding performance of the chassis 1, and at the same time, the EMC baffle 3 is convenient for loading and unloading and installation, saving manpower and physical resources, and can effectively improve the test efficiency of the to-be-tested single board 7.

[0045] Further, the multiple interface components 2 include multiple types. Interface components 2 of the same type are located on the same side of adjacent EMC baffles 3. For example, the multiple interface components 2 include high-speed line interfaces and low-speed line interfaces. That is, an insertion opening 111 is provided on the mounting panel 11, and only one EMC baffle 3 of the chassis 1 is inserted and fixed to the mounting panel 11 to isolate the high-speed line interfaces and low-speed line interfaces on the left and right sides of the EMC baffle 3 respectively. In this way, electromagnetic interference between the high-speed line interfaces and low-speed line interfaces during simultaneous testing can be avoided. Another example is that the high-speed line interfaces among the multiple interface components 2 include interfaces such as USB, LAN, VGA, DVI, HDMI, etc., and the low-speed line interfaces among the multiple interface components 2 include interfaces such as COM, LPT, PS / 2, etc. The number of EMC baffles 3 is multiple, and the EMC baffles 3 isolate USB, LAN, VGA, DVI, HDMI, COM, LPT, PS / 2 respectively, that is, each specific type of interface is isolated separately. It should be noted that the number of each type of interface is at least one.

[0046] In this embodiment, multiple types of interface components 2 such as USB, VGA, HDMI, COM, etc. are installed on the mounting panel 11, and multiple EMC baffles 3 isolate the multiple types of interface components 2 such as USB, VGA, HDMI, COM, etc. respectively. This embodiment will not be elaborated too much here.

[0047] It should be noted that each interface component 2 includes a male head, a connecting wire, and a female head. Among them, the connecting wire uses a shielded wire. The male head is fixed on the mounting panel 11. Both the connecting wire and the female head are inside the chassis 1. The male head is used for electrical connection with the test equipment outside the chassis 1. The male head is electrically connected to the female head through the connecting wire, and the female head is used for electrical connection with the DUT 7. In this way, the test equipment can test the DUT 7 through the interface component 2.

[0048] Combined with Figure 2 、 Figure 3 and Figure 4 , the EMC test fixture further includes: a guide rail 41. The guide rail 41 is fixedly arranged inside the box body 12, and at least one EMC baffle 3 is slidably connected to the box body 12 through the guide rail 41.

[0049] In this embodiment, two cross beams 42 are fixedly arranged on the upper and lower parts of the front end of the box body 12. The guide rail 41 is fixedly connected to the top cover and the bottom plate of the box body 12 through the cross beam 42. Among them, the upper and lower two guide rails 41 are a group, and each group of guide rails 41 is located behind the corresponding insertion opening 111. After the partition sub-board 31 is inserted into the box body 12 through the insertion opening 111, the top and bottom of the rear end of the partition sub-board 31 are slidably connected to the corresponding guide rails 41 until the mounting sub-board 32 abuts against the mounting panel 11, and then the EMC baffle 3 can be fixed by using a non-loosening screw.

[0050] By providing the guide rail 41, not only can the EMC baffle 3 be smoothly inserted into the box body 12, but also the structural stability of the EMC baffle 3 can be improved.

[0051] Furthermore, the EMC test fixture further includes: a support frame 5. The support frame 5 is located inside the box body 12, and the support frame 5 is used to fix the single board under test 7. By providing the support frame 5, the single board under test 7 can be stably fixed inside the box body 12.

[0052] Furthermore, the support frame 5 includes a first support 51 and a first stud 52. At least one first strip-shaped sliding hole 511 is provided on the first support 51. The first stud 52 is slidably connected to the first support 51 along a first direction through the first strip-shaped sliding hole 511, and the first stud 52 is fixedly connected to the single board under test 7 by screws.

[0053] Wherein, the first support 51 is of a long strip structure, and the first strip-shaped sliding hole 511 is opened along the length direction of the first support 51 and penetrates through the first support 51 in the up and down direction.

[0054] Combined with Figure 3 、 Figure 4 and Figure 5 wherein Figure 5 in “51 / 53” represents 51 or 53, “52 / 54” represents 52 or 54. When “51 / 53” represents 51, “52 / 54” represents 52, and when “51 / 53” represents 53, “52 / 54” represents 54. A card slot 55 is provided on the circumferential side of the bottom end of the first stud 52. The first stud 52 is snapped into the first strip-shaped sliding hole 511 through the card slot 55. A threaded hole 56 is provided at the top of the first stud 52, so that the screw passing through the mounting hole on the single board under test 7 can be inserted into the threaded hole 56 and threadedly connected to the first stud 52 through the threaded hole 56, thereby fixing the single board under test 7 on the first stud 52.

[0055] In addition, a first loading and unloading hole 512 is provided on the first support 51. The first loading and unloading hole 512 communicates with the first strip-shaped sliding groove. The diameter of the first loading and unloading hole 512 is larger than the diameter of the first stud 52, and the diameter of the first stud 52 is larger than the width of the first strip-shaped sliding groove. The first stud 52 can be mounted and dismounted relative to the first support 51 through the first loading and unloading hole 512. Wherein, each first strip-shaped sliding groove communicates with at least one first loading and unloading hole 512, and the first loading and unloading hole 512 can be located at any position of the first strip-shaped sliding groove.

[0056] It should be noted that the first support 51 can be directly welded inside the box body 12, or fixed inside the box body 12 by screws, or slidably connected to the box body 12 through a limit slide rail, and the first support 51 is fixed after its position is determined.

[0057] In this embodiment, the first bracket 51 is directly fixedly connected to the box body 12 by screws. The number of the first brackets 51 is two, and they are respectively located at the rear side of the guide rail 41 and arranged in the front-rear direction. The first direction is the left-right direction. The number of the first strip-shaped sliding holes 511 on the first bracket 51 is two, and a first loading and unloading hole 512 is respectively opened at both ends of each first strip-shaped sliding hole 511.

[0058] In an alternative embodiment, in combination with Figure 1 and Figure 4 , a fixed-point stud 57 is further fixedly arranged on the upper surface of the first bracket 51. The fixed-point stud 57 is used to fix the to-be-tested single board 7 by screws. By providing the fixed-point stud 57, the deficiency of the limited moving space of the first stud 52 can be made up for, and the applicability of the EMC test fixture can be further improved. In this alternative embodiment, the fixed-point stud 57 is fixedly arranged at both ends of the first strip-shaped sliding hole 511.

[0059] Furthermore, the support frame 5 includes a second bracket 53 and a second stud 54. A second strip-shaped sliding hole 531 is opened on the second bracket 53. The second stud 54 is slidably connected to the second bracket 53 along the second direction through the second strip-shaped sliding hole 531. The second direction intersects with the first direction. The second stud 54 is fixedly connected to the to-be-tested single board 7 by screws.

[0060] Wherein, the second bracket 53 is of a long strip structure. The second strip-shaped sliding hole 531 is opened along the length direction of the second bracket 53 and penetrates through the second bracket 53 in the up-down direction. In combination with Figure 5 , a clamping groove 55 is opened on the circumferential side of the bottom end of the second stud 54. The second stud 54 is snapped into the second strip-shaped sliding hole 531 through the clamping groove 55. A threaded hole 56 is opened at the top of the second stud 54, so that the screw passing through the mounting hole on the to-be-tested single board 7 can be inserted into the threaded hole 56 and threadedly connected to the second stud 54 through the threaded hole 56, thereby fixing the to-be-tested single board 7 on the second stud 54.

[0061] In addition, a second loading and unloading hole 532 is opened on the second bracket 53. The second loading and unloading hole 532 communicates with the second strip-shaped sliding groove. The diameter of the second loading and unloading hole 532 is larger than the diameter of the second stud 54. The diameter of the second stud 54 is larger than the width of the second strip-shaped sliding groove. The second stud 54 can be mounted and dismounted relative to the second bracket 53 through the second loading and unloading hole 532. Wherein, each second strip-shaped sliding groove communicates with at least one second loading and unloading hole 532, and the second loading and unloading hole 532 can be located at any position of the second strip-shaped sliding groove.

[0062] It should be noted that the second bracket 53 can be directly welded inside the box body 12, fixed to the box body 12 by screws, or slidably connected to the box body 12 through a limiting slide rail, and the second bracket 53 is fixed after its position is determined.

[0063] In this embodiment, a guide post is fixedly arranged at the bottom end of the second bracket 53. The second bracket 53 is inserted into the first strip-shaped chute through the guide post to slidably connect with the first bracket 51. The number of the second brackets 53 is two, which are respectively located at the rear side of the guide rail 41 and arranged in the left-right direction, and the second direction is the front-back direction. The number of the second strip-shaped slide holes 531 on the second bracket 53 is two, and a second loading and unloading hole 532 is respectively arranged at both ends of each second strip-shaped slide hole 531.

[0064] By providing the first bracket 51 and the second bracket 53, the support frame 5 can fix the single board to be tested 7 from four directions of front, back, left and right. By providing the slidable first stud 52 and second stud 54, the support frame 5 can support single boards to be tested 7 of various sizes, improving the applicability of the EMC test fixture.

[0065] Combined Figure 1 and Figure 2 , a ventilation opening 121 is provided on the box body 12. The EMC test fixture further includes a metal shielding wire mesh 61. The metal shielding wire mesh 61 is fixedly connected to the box body 12 and covers the ventilation opening 121.

[0066] By providing the ventilation opening 121 and arranging the metal shielding wire mesh 61, the requirements for heat dissipation and electromagnetic shielding of the single board to be tested 7 during the test can be met.

[0067] In this embodiment, the ventilation opening 121 is opened on the top cover of the box body 12; the EMC test fixture further includes a pressing frame 62. The metal shielding wire mesh 61 is clamped between the pressing frame 62 and the top cover of the box body 12. The pressing frame 62 is fixedly connected to the top cover of the box body 12 by screws so that the metal shielding wire mesh 61 fits against the top cover of the box body 12.

[0068] The EMC test fixture provided by this embodiment has a simple structure, is convenient to operate, and has a wide application range. Among them, by classifying and isolating multiple interface components 2, the high shielding performance of the chassis 1 is ensured.

[0069] In the description of this specification, the description referring to terms such as "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic description of the above terms does not necessarily refer to the same embodiment or example.

[0070] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0071] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation to the scope of the patent of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims.

Claims

1. A test fixture, characterized in that: The test fixture comprises: a chassis (1), a plurality of interface components (2) and at least one EMC baffle (3); The chassis (1) comprises: an installation panel (11) and a box body (12); the installation panel (11) and the box body (12) together enclose a receiving cavity; a plurality of plug-in openings (111) are provided on the installation panel (11); the plurality of interface components (2) are arranged in the receiving cavity; the plurality of interface components (2) are inserted into the installation panel (11) through the installation openings on the installation panel (11) and are fixedly connected to the installation panel (11); the plurality of interface components (2) and the plurality of plug-in openings (111) are alternately arranged on the installation panel (11); and the plurality of interface components (2) are used to be electrically connected to a single board (7) to be tested; The at least one EMC baffle (3) is adapted to the multiple insertion openings (111) and is detachably connected to the chassis (1); one end of the at least one EMC baffle (3) is inserted into the box body (12) through the corresponding insertion opening (111) to isolate the multiple interface components (2); The other end of the at least one EMC baffle (3) is located outside the chassis (1) and is detachably connected to the installation panel (11).

2. The test fixture according to claim 1, characterized in that: The plurality of interface components (2) include a plurality of types, and interface components (2) of the same type are located on the same side of adjacent EMC baffles (3).

3. The test fixture according to claim 1, characterized in that: The test fixture further comprises: a guide rail (41); The guide rail (41) is fixedly arranged in the box body (12), and the at least one EMC baffle (3) is slidably connected to the box body (12) via the guide rail (41).

4. The test fixture according to claim 1, characterized in that: The test fixture further comprises: a support frame (5); The support frame (5) is located inside the box (12), and the support frame (5) is used to fix the single board (7) to be tested.

5. The test fixture according to claim 4, characterized in that: The support frame (5) comprises a first bracket (51) and a first stud (52); The first bracket (51) is provided with a first strip-shaped sliding hole (511), the first stud (52) is slidably connected to the first bracket (51) along a first direction through the first strip-shaped sliding hole (511), and the first stud (52) is fixedly connected to the single board (7) to be tested by means of screws.

6. The test fixture according to claim 5, characterized in that: The support frame (5) comprises a second bracket (53) and a second stud (54); The second bracket (53) is provided with a second strip-shaped sliding hole (531), and the second stud (54) is slidably connected to the second bracket (53) along a second direction through the second strip-shaped sliding hole (531), the second direction intersecting the first direction, and the second stud (54) is fixedly connected to the single board (7) to be tested by means of screws.

7. The test fixture according to claim 6, characterized in that: The first bracket (51) is fixedly connected to the box body (12), and the second bracket (53) is slidably connected to the box body (12).

8. The test fixture according to claim 1, characterized in that: The box body (12) is provided with a ventilation hole (121).

9. The test fixture according to claim 8, characterized in that: The test fixture also includes a metal shielding wire mesh (61); The metal shielding wire mesh (61) is fixedly connected to the box body (12) and covers the ventilation opening (121).

10. The test fixture according to any one of claims 1 to 9, characterized in that: Each EMC baffle (3) comprises a partition sub-plate (31) and a mounting sub-plate (32); The partition sub-plate (31) is adapted to the insertion opening (111) and plugged into the installation panel (11); the installation sub-plate (32) intersects with the partition sub-plate (31) and is fixedly connected to one end of the partition sub-plate (31); the installation sub-plate (32) is detachably connected to the installation panel (11).

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