Test fixture for transistor module

Abstract

The utility model discloses a test fixture for a transistor module, which comprises a bottom plate and a bottom frame arranged on the outer wall of the top of the bottom plate, and further comprises a limit adjusting mechanism, a first clamping mechanism, a second clamping mechanism, a third clamping mechanism, a fourth clamping mechanism and a fourth clamping mechanism, long grooves distributed at equal intervals are formed in the outer wall of the top of the top frame, long plates are arranged on the inner walls of the opposite sides of the long grooves, sliding grooves are formed in the inner walls of the opposite sides of the two long plates, sliding blocks are arranged on the inner walls of the two sliding grooves, and lifting frames are connected to the outer walls of the opposite sides of the two sliding blocks. A spring is arranged at the bottom of the sliding block, and two containing holes are formed in the lifting frame. The test fixture for the transistor module has the technical effects of reducing operation steps, saving labor investment and improving test efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of transistors, and in particular to a test fixture for a transistor module. Background Art

[0002] Transistor module test fixtures are primarily used to check individual IC components and circuit networks for open and short circuits, as well as to test analog device functionality and digital device logic. These fixtures enable extremely fast and efficient chip testing, saving significant time and effort while ensuring accurate test results. These fixtures are logic-based and may vary depending on the time and location of use, but their primary purpose is to improve productivity, repeat specific actions, or enable more precise work.

[0003] The patent document with application number 202010795404.X discloses a testing device and a testing method for testing a display substrate, wherein the display substrate has a display area and a testing area connected to one side of the display area; the testing area is provided with multiple first thin-film transistors, and the display area is provided with multiple second thin-film transistors; the testing device includes: a stress applying jig and a measuring platform; the stress applying jig is used to apply bending stress to the first thin-film transistor or the second thin-film transistor; the measuring platform is used to measure the electrical parameters of each electrode of the first thin-film transistor or the second thin-film transistor to which the bending stress is applied.

[0004] However, traditional test fixtures for transistor modules can only operate on a single transistor in terms of transistor clamping operations, and require a series of tedious steps. Such operations are too complicated, require high manual labor, lack machine automation, and are not conducive to the implementation of large-scale testing work.

[0005] For example, a traditional transistor module test fixture requires placing a single transistor in the test area, pressing a switch to measure data, taking it out after the measurement is completed, and then measuring the next transistor. Utility Model Content

[0006] The utility model discloses a test fixture for a transistor module, which aims to solve the technical problem that traditional test fixtures for transistor modules can only operate on a single transistor in the clamping operation of the transistor and require a series of tedious steps. Such operations are too complicated, require high manual labor, lack machine automation, and are not conducive to the performance of large-scale testing work.

[0007] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0008] A test fixture for a transistor module, comprising a base plate and a chassis mounted on the top outer wall of the base plate, and further comprising:

[0009] Limit adjustment mechanism: The limit adjustment mechanism includes a top frame arranged above the bottom frame, the top outer wall of the top frame is provided with long grooves distributed at equal distances, a long plate is provided on the inner wall on the opposite side of the long groove, a slide groove is provided on the inner wall on the opposite side of the two long plates, a slider is provided on the inner wall of the two slide grooves, a lifting frame is connected to the outer wall on the opposite side of the two sliders, a spring is provided at the bottom of the slider, and two placement holes are provided inside the lifting frame;

[0010] Patch mechanism: the patch mechanism is arranged on the base plate.

[0011] In this solution, the lifting frame can be moved up and down by setting a slide groove and a slider inside the long board and a spring at the bottom of the slide groove. This design enables the transistor to move downward by simply pressing it, saving operating steps, and the method of use is convenient and efficient.

[0012] In a preferred solution, threaded rods are provided on both sides of the top outer wall of the base frame, and the top frame is mounted on the outer walls of the two threaded rods.

[0013] The height adjustment between the top frame and the bottom frame can be achieved by means of a threaded rod arranged between the bottom frame and the top frame.

[0014] In a preferred embodiment, the patch mechanism includes a reaction patch and an electric telescopic rod arranged on the top outer wall of the base plate, the output end of the electric telescopic rod is connected to a steering rod, the bottom of the steering rod is connected to a pressure plate, and the pressure plate cooperates with the reaction patch.

[0015] Through the reaction patch and electric telescopic rod set on the top of the base plate, the pressure plate connected to the electric telescopic rod can automatically move down when measuring the patch component, pressing the patch component on the reaction patch for testing. This operation can effectively save labor input, realize automated testing, and improve test efficiency.

[0016] As can be seen from the above, a test fixture for transistor modules includes a base plate and a base frame mounted on the top outer wall of the base plate, and further includes: a limit adjustment mechanism: the limit adjustment mechanism includes a top frame arranged above the base frame, the top outer wall of the top frame is provided with long grooves distributed at equal distances, a long plate is provided on the inner wall on the opposite side of the long groove, a slide groove is provided on the inner wall on the opposite side of the two long plates, a slider is provided on the inner wall of the two slide grooves, a lifting frame is connected to the outer wall on the opposite side of the two sliders, a spring is provided at the bottom of the slider, and two placement holes are provided inside the lifting frame; a patch mechanism: the patch mechanism is provided on the base plate. The test fixture for transistor modules provided by the utility model has the technical effect of reducing operating steps, saving labor input, and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a structural schematic diagram of a test fixture for transistor modules proposed by the present invention.

[0018] Figure 2 This is a schematic diagram of the lifting frame structure of a test fixture for transistor modules proposed in the present invention.

[0019] Figure 3 This is a schematic diagram of a spring for a test fixture for a transistor module proposed in the present invention.

[0020] Figure 4 This is a schematic diagram of a patch mechanism of a test fixture for transistor modules proposed in the present invention.

[0021] In the attached figure: 1. Base plate; 2. Display screen; 3. Connecting wire; 4. Battery; 5. Switch; 6. Indicator light; 7. Reaction patch; 8. Base frame; 9. Reaction block; 10. Top frame; 11. Threaded rod; 12. Lifting frame; 13. Placement hole; 14. Slide groove; 15. Spring; 16. Electric telescopic rod; 17. Pressing plate. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application generally described and marked in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work fall within the scope of protection of the present application.

[0023] The utility model discloses a test fixture for a transistor module, which is mainly used in scenarios where conventional test fixtures for transistor modules can only operate on a single transistor in terms of transistor clamping operations and require a series of tedious steps. Such operations are too complicated, require high manual labor, lack automated machine operation, and are not conducive to the performance of large-scale testing work.

[0024] Reference Figure 1 and Figure 3 A test fixture for a transistor module includes a base plate 1 and a base frame 8 mounted on the top outer wall of the base plate 1, and further includes: a limit adjustment mechanism: the limit adjustment mechanism includes a top frame 10 arranged above the base frame 8, the top outer wall of the top frame 10 is provided with long grooves distributed at equal distances, long plates are provided on the inner walls on opposite sides of the long grooves, and slide grooves 14 are provided on the inner walls on opposite sides of the two long plates. Slide blocks are provided on the inner walls of the two slide grooves 14, and a lifting frame 12 is connected to the outer walls on opposite sides of the two slide blocks. A spring 15 is provided at the bottom of the slide block, and two placement holes 13 are provided inside the lifting frame 12;

[0025] Patch mechanism: The patch mechanism is arranged on the base plate 1.

[0026] Specifically, in this solution, the up and down movement of the lifting frame 12 can be achieved by means of the slide groove 14 and the slider arranged inside the long plate and the spring 15 arranged at the bottom of the slide groove 14. This design enables the transistor to move downward by simply pressing, saving operating steps (it should be noted that in the specific use process, the complicated transfer steps of traditional transistors are omitted, and the transistors to be tested can be directly placed in the placement holes 13 on each lifting frame 12 in turn, and each transistor can be straightened using the adjustable height top frame 10. With each pressing of a separate lifting frame 12, it can be tested in turn). The method of use is convenient and efficient.

[0027] The interior of the base frame 8 is provided with square grooves distributed at equal distances, and a reaction block 9 is provided at the bottom of the square groove, and the reaction block 9 is matched with the placement hole 13.

[0028] Specifically, by providing the square groove and the reaction block 9 at the bottom of the base frame 8 , the transistor can be brought into contact with the reaction block 9 when moving downward, thereby completing the test and saving time.

[0029] Reference Figure 1 and Figure 2 In a preferred embodiment, threaded rods 11 are provided on both sides of the top outer wall of the bottom frame 8 , and the top frame 10 is installed on the outer walls of the two threaded rods 11 .

[0030] Specifically, the height adjustment between the top frame 10 and the bottom frame 8 can be achieved by providing a threaded rod 11 between the bottom frame 8 and the top frame 10 .

[0031] Reference Figure 1 and Figure 4 In a preferred embodiment, the patch mechanism includes a reaction patch 7 and an electric telescopic rod 16 arranged on the top outer wall of the base plate 1, the output end of the electric telescopic rod 16 is connected to a steering rod, and the bottom of the steering rod is connected to a pressure plate 17, which cooperates with the reaction patch 7.

[0032] Specifically, by setting the reaction patch 7 and the electric telescopic rod 16 on the top of the base plate 1, the pressure plate 17 connected to the electric telescopic rod 16 can automatically move downward when measuring the patch component, and press the patch component on the reaction patch 7 for testing. Such operation can effectively save labor input, realize automated testing, and improve test efficiency.

[0033] Reference Figure 1 and Figure 3 In a preferred embodiment, a junction box is installed on one side outer wall of the base plate 1, the inner wall of the junction box is connected to a connecting wire 3, and the other end of the connecting wire 3 is connected to a battery 4.

[0034] A display screen 2 is installed on the top outer wall of the base plate 1 .

[0035] A switch 5 and an indicator light 6 are provided on the top outer wall of the base plate 1 .

[0036] Specifically, through the junction box and connecting wire 3 arranged on one side of the base plate 1, and the battery 4 connected to the connecting wire 3, the test fixture can be powered for better operation; through the display screen 2 arranged on the top of the base plate 1, the data of the electronic components can be displayed on the display screen 2 after the test, and the data is visible and clear; through the switch 5 and indicator light 6 arranged on the base plate 1, the switch 5 can operate the test fixture, and the indicator light 6 can display whether the test fixture is operating normally.

[0037] Working principle: When in use, the height of the top frame 10 can be adjusted by the threaded rod 11 according to the average height of the transistor to be tested, and then the switch 5 can be pressed. After observing that the indicator light 6 lights up, the transistor to be tested can be placed on the placement hole 13 in the lifting frame 12 in turn, and then the lifting frame 12 can be pressed in turn. Because the long plate on the top frame 10 is provided with a slide groove 14 and a slider, and the bottom of the slide groove 14 is provided with a spring 15, the lifting frame 12 can drive the transistor to move downward through the action of the spring 15, and then touch the reaction block 9. Next, the test data of the transistor will be displayed on the display screen 2. For patch components, the components can be placed on the reaction patch 7, and the pressure plate 17 connected by the electric telescopic rod 16 will press the electronic components for testing.

[0038] The above description is merely a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. The replacements described may be partial structures, devices, or method steps, or they may be complete technical solutions. Any equivalent replacements or modifications based on the technical solution and the concept of the present invention shall be covered by the scope of protection of the present invention.

Claims

1. A test fixture for a transistor module, comprising a base plate (1) and a base frame (8) mounted on the top outer wall of the base plate (1), characterized in that: Also includes: Limit adjustment mechanism: The limit adjustment mechanism includes a top frame (10) arranged above the bottom frame (8), the top outer wall of the top frame (10) is provided with long grooves distributed at equal distances, a long plate is provided on the inner wall on the opposite side of the long groove, a sliding groove (14) is provided on the inner wall on the opposite side of the two long plates, a slider is provided on the inner wall of the two sliding grooves (14), a lifting frame (12) is connected to the outer wall on the opposite side of the two sliders, a spring (15) is provided at the bottom of the slider, and two placement holes (13) are provided inside the lifting frame (12); Patch mechanism: the patch mechanism is arranged on the base plate (1).

2. A test fixture for a transistor module according to claim 1, characterized in that: The interior of the base frame (8) is provided with square grooves distributed at equal distances, and a reaction block (9) is provided at the bottom of the square groove, and the reaction block (9) cooperates with the placement hole (13).

3. A test fixture for a transistor module according to claim 2, characterized in that: Threaded rods (11) are provided on both sides of the top outer wall of the bottom frame (8), and the top frame (10) is mounted on the outer walls of the two threaded rods (11).

4. A test fixture for a transistor module according to claim 1, characterized in that: The patch mechanism comprises a reaction patch (7) and an electric telescopic rod (16) arranged on the top outer wall of the base plate (1), the output end of the electric telescopic rod (16) is connected to a steering rod, the bottom of the steering rod is connected to a pressure plate (17), and the pressure plate (17) cooperates with the reaction patch (7).

5. The test fixture for a transistor module according to claim 1, characterized in that: A junction box is installed on one outer wall of the base plate (1), a connecting wire (3) is connected to the inner wall of the junction box, and the other end of the connecting wire (3) is connected to a battery (4).

6. A test fixture for a transistor module according to claim 1, characterized in that: A display screen (2) is mounted on the top outer wall of the base plate (1).

7. A test fixture for a transistor module according to claim 1, characterized in that: A switch (5) and an indicator light (6) are provided on the top outer wall of the base plate (1).

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