Batch aging test device for industrial logic controller

Abstract

The utility model discloses a batch aging test device for industrial logic controllers, which comprises a frame, a plurality of groups of equidistantly arranged partition plates are mounted on the frame, the plurality of groups of partition plates are stacked, a plurality of groups of industrial logic controllers are mounted on the partition plates, and a plurality of groups of probe fixing plates corresponding to the plurality of groups of partition plates are mounted on the frame. And a probe matched with a power supply terminal of the industrial logic controller is mounted on the probe fixing plate. The industrial logic controller frame has the advantages that the industrial logic controllers are arranged on the multiple sets of partition plates arranged on the frame in a stacked mode, space can be effectively saved, the occupied area of the industrial logic controllers is reduced, meanwhile, the probes arranged on the probe fixing plates can rapidly supply power to the power terminals of the industrial logic controllers, and the industrial logic controllers are convenient to use. The industrial logic controller detection device is simple in operation and labor-saving, wiring errors can be avoided, the detection efficiency of the industrial logic controller is improved, and the detection precision of the industrial logic controller is ensured.

Description

Technical Field

[0001] This utility model relates to the field of industrial logic controller testing technology, and in particular to a batch aging test device for industrial logic controllers. Background Technology

[0002] An industrial logic controller (PLC) is a microprocessor-based digital control unit used for automation control. It can load control instructions into memory for storage and execution. A PLC consists of a CPU, instruction and data memory, input / output interfaces, a power supply, and digital-to-analog converters. Early PLCs only had logic control functions, hence the name. Later, with continuous development, these initially simple computer modules have evolved to include various functions such as logic control, timing control, analog control, and multi-machine communication.

[0003] Current methods for aging tests on industrial logic controllers involve placing all the controllers to be tested on a desktop, connecting each controller to a 24V DC power supply to keep them in continuous operation, and observing the stability of each controller during the aging test or checking for any controllers that stop working after the test period. This method not only occupies a significant amount of desktop space and requires powering each controller individually, making it cumbersome, but also makes it difficult to move the controllers once the aging test begins, thus occupying desktop space for an extended period. Utility Model Content

[0004] The purpose of this invention is to overcome the shortcomings of existing aging test devices for industrial logic controllers, which not only occupy a large amount of desktop space, require power connection for each industrial logic controller, are cumbersome to operate, and are inconvenient to move after the aging test process begins, but also provide a batch aging test device for industrial logic controllers.

[0005] The purpose of this utility model is achieved through the following technical solution: a batch aging test device for industrial logic controllers, comprising a frame, multiple sets of equally spaced partitions mounted on the frame, the multiple sets of partitions being stacked, multiple sets of industrial logic controllers mounted on the partitions, and multiple sets of probe fixing plates corresponding to the multiple sets of partitions mounted on the frame, the probe fixing plates being equipped with probes adapted to the power terminals of the industrial logic controllers. By placing the industrial logic controllers on the multiple sets of stacked partitions on the frame, space can be effectively saved and the area occupied by the industrial logic controllers can be reduced. At the same time, the probes on the probe fixing plates can quickly supply power to the power terminals of the industrial logic controllers, which not only simplifies operation and saves manpower, but also avoids wiring errors, improves the testing efficiency of the industrial logic controllers, and ensures the testing accuracy of the industrial logic controllers.

[0006] The bottom of the frame is equipped with casters, which are omnidirectional self-locking casters. By setting the casters to be omnidirectional self-locking casters, the ease of moving the frame can be improved, while also making it easier to fix the frame.

[0007] A further technical solution involves assembling the frame from four sets of aluminum tubular profiles arranged in a rectangular array. The four corners of the probe fixing plate are slidably connected to the four sets of aluminum tubular profiles on the frame. Each of the four corners of the probe fixing plate is threaded with a locking bolt, and each of the four corners of the probe fixing plate has a threaded hole that matches the locking bolt. One end of the locking bolt passes through the threaded hole and contacts the frame. This slidable connection between the probe fixing plate and the frame facilitates the raising and lowering of the probe fixing plate on the frame, thereby enabling the multiple sets of probes on the probe fixing plate to make unified contact with or disconnect the power terminals on multiple industrial logic controllers, improving operational convenience and making it suitable for industrial logic controllers of different heights and models. At the same time, the locking bolt, with one end passing through the threaded hole and contacting the frame, locks and fixes the probe fixing plate, improving its stability on the frame and ensuring stable operation of the equipment.

[0008] A further technical solution is that guide grooves are provided at all four corners of the probe fixing plate, and guide blocks that are slidably connected to the guide grooves are installed on one side of each of the four sets of aluminum tube profiles on the frame. By setting the guide grooves and guide blocks in combination, the stability of the probe fixing plate when moving on the frame can be improved.

[0009] A further technical solution is to have multiple sets of grooves on the partition, in which the industrial logic controller is snapped into the grooves, and the industrial logic controller is detachably connected to the grooves. By setting the grooves to position the industrial logic controller, the stability of the industrial logic controller placed on the frame can be ensured.

[0010] A further technical solution is to install a power supply on the upper part of the frame. The power supply is a 24V DC switching power supply, which is responsible for converting the external AC power input into 24V DC power to power multiple industrial logic controllers. The power supply is set to uniformly power multiple industrial logic controllers.

[0011] A further technical solution is to use a hollow design for the probe fixing plate. This hollow design can effectively reduce the weight of the probe fixing plate and improve the ease of operation.

[0012] This utility model has the following advantages: The industrial logic controller is placed on multiple stacked partitions on a frame, effectively saving space and reducing the area occupied by the controller. Simultaneously, the probes on the probe mounting plate enable rapid power supply to the power terminals of the industrial logic controller, simplifying operation, saving manpower, avoiding wiring errors, improving testing efficiency, and ensuring testing accuracy. The sliding connection between the probe mounting plate and the frame facilitates raising and lowering the plate, allowing for unified contact and disconnection of the multiple probes on the mounting plate with the power terminals of the industrial logic controllers, improving operational convenience and making it suitable for industrial logic controllers of different heights and models. Attached Figure Description

[0013] Figure 1 This is a three-dimensional schematic diagram of the overall structure of this utility model;

[0014] Figure 2 For the present utility model Figure 1 Enlarged schematic diagram of structure A in the middle;

[0015] In the diagram, 1. Frame; 2. Partition; 3. Industrial logic controller; 4. Probe fixing plate; 5. Probe; 6. Groove; 7. Power supply; 8. Caster wheel; 9. Locking bolt; 10. Guide groove; 11. Guide block. Detailed Implementation

[0016] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can typically be arranged and designed in various different configurations.

[0017] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0018] It should be noted that, where there is no conflict, the embodiments and features in the embodiments of this utility model can be combined with each other.

[0019] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0020] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this utility model is in use, or the orientation or positional relationship commonly understood by those skilled in the art. They are only used for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first," "second," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0021] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0022] like Figures 1-2As shown, a batch aging test device for industrial logic controllers includes a frame 1, on which multiple sets of equally spaced partitions 2 are installed. The multiple sets of partitions 2 are stacked, and multiple sets of industrial logic controllers 3 are installed on the partitions 2. Multiple sets of probe fixing plates 4 corresponding to the multiple sets of partitions 2 are installed on the frame 1. Probes 5 adapted to the power terminals of the industrial logic controllers 3 are installed on the probe fixing plates 4. By placing the industrial logic controllers 3 on the multiple sets of stacked partitions 2 on the frame 1, space can be effectively saved and the area occupied by the industrial logic controllers 3 can be reduced. At the same time, the probes 5 on the probe fixing plates 4 can quickly supply power to the power terminals of the industrial logic controllers 3. This not only simplifies operation and saves manpower, but also avoids wiring errors, improves the testing efficiency of the industrial logic controllers 3, and ensures the testing accuracy of the industrial logic controllers 3.

[0023] The bottom of the frame 1 is equipped with casters 8, which are universal self-locking casters. By setting the casters 8 to be universal self-locking casters, the ease of moving the frame 1 can be improved, and at the same time, it is convenient to fix the frame 1.

[0024] The frame 1 is assembled from four sets of aluminum tube profiles arranged in a rectangular array. The four corners of the probe fixing plate 4 are slidably connected to the four sets of aluminum tube profiles on the frame 1. Locking bolts 9 are threadedly installed at the four corners of the probe fixing plate 4. Threaded holes that match the locking bolts 9 are opened at the four corners of the probe fixing plate 4. One end of the locking bolt 9 passes through the threaded hole and contacts the frame 1. The sliding connection between the probe fixing plate 4 and the frame 1 facilitates the raising and lowering of the probe fixing plate 4 on the frame 1, thereby facilitating the unified contact and energization or disconnection of the multiple sets of probes 5 on the probe fixing plate 4 with the power terminals of multiple sets of industrial logic controllers 3, improving the convenience of operation, and also making it suitable for industrial logic controllers 3 of different heights and models. At the same time, the locking bolts 9, with one end passing through the threaded hole and contacting the frame 1, can lock and fix the probe fixing plate 4, improving the stability of the probe fixing plate 4 on the frame 1 and ensuring the stable operation of the equipment.

[0025] The probe fixing plate 4 has guide grooves 10 at each of its four corners. Each of the four sets of aluminum tube profiles on the frame 1 has a guide block 11 that is slidably connected to the guide groove 10. By setting the guide groove 10 and the guide block 11 to cooperate, the stability of the probe fixing plate 4 when moving on the frame 1 can be improved.

[0026] Multiple sets of grooves 6 are provided on the partition 2. The industrial logic controller 3 is snapped into the groove 6 and the industrial logic controller 3 is detachably connected to the groove 6. By setting the groove 6 to position the industrial logic controller 3, the stability of the industrial logic controller 3 placed on the frame 1 can be guaranteed.

[0027] A power supply 7 is installed on the upper part of the frame 1. The power supply 7 is a 24V DC switching power supply. The power supply 7 is responsible for converting the external AC power input into 24V DC power to power multiple industrial logic controllers 3. The power supply 7 is set to provide power to multiple industrial logic controllers 3 in a unified manner.

[0028] The probe fixing plate 4 has a hollow design, which can effectively reduce the weight of the probe fixing plate 4 and improve the convenience of operation.

[0029] The working process of this utility model is as follows: When using this device to conduct aging tests, firstly, multiple sets of industrial logic controllers 3 are snapped into the grooves 6 on the partition 2. After one layer of partition 2 is filled, the probe fixing plate 4 is lowered until the probe 5 is in complete contact with the power terminals of the industrial logic controller 3. Then, the locking bolt 9 is tightened to lock and fix the probe fixing plate 4. After this step is completed, the same operation is performed on another layer of partition 2. When the entire device is filled or all the industrial logic controllers 3 that need to be aged have been placed, the device can be powered on so that each industrial logic controller 3 can start to conduct aging tests.

[0030] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A batch aging test apparatus for industrial logic controllers, comprising a frame (1), characterized in that: The frame (1) is equipped with multiple sets of partitions (2) arranged at equal intervals. Multiple sets of industrial logic controllers (3) are installed on the partitions (2). The frame (1) is equipped with multiple sets of probe fixing plates (4) corresponding to the multiple sets of partitions (2). Probes (5) adapted to the power terminals of the industrial logic controllers (3) are installed on the probe fixing plates (4). The bottom of the frame (1) is equipped with a movable wheel (8), which is a universal self-locking wheel.

2. The batch aging test device for an industrial logic controller according to claim 1, characterized in that: The frame (1) is assembled from four sets of aluminum tube profiles arranged in a rectangular array. The four corners of the probe fixing plate (4) are slidably connected to the four sets of aluminum tube profiles on the frame (1). Locking bolts (9) are threadedly installed at the four corners of the probe fixing plate (4). Threaded holes that match the locking bolts (9) are opened at the four corners of the probe fixing plate (4). One end of the locking bolt (9) passes through the threaded hole and contacts the frame (1).

3. The batch aging test device for an industrial logic controller according to claim 2, characterized in that: The probe fixing plate (4) has guide grooves (10) at each of its four corners, and guide blocks (11) that are slidably connected to the guide grooves (10) are installed on one side of each of the four sets of aluminum tube profiles on the frame (1).

4. The batch aging test device for an industrial logic controller according to claim 1, characterized in that: The partition (2) has multiple sets of grooves (6), the industrial logic controller (3) is snapped into the grooves (6), and the industrial logic controller (3) is detachably connected to the grooves (6).

5. The batch aging test device for an industrial logic controller according to claim 1, characterized in that: A power supply (7) is installed on the upper part of the frame (1). The power supply (7) is a 24V DC switching power supply. The power supply (7) is responsible for converting the externally input AC power into 24V DC power to supply power to multiple industrial logic controllers (3).

6. The batch aging test apparatus for an industrial logic controller according to claim 1, characterized in that: The probe fixing plate (4) has a hollow design.

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