Analysis device, analysis method, and analysis program

Abstract

To provide an analysis device with which it is possible to easily refer to data with which the manufacturing history data of a plurality of processes is associated in each point of a sheet.SOLUTION: The analysis device is constituted to comprise a data acquisition unit 101, a position identification unit 102, and a map display unit 103. The data acquisition unit 101 acquires the manufacturing history data of a plurality of processes when manufacturing a sheet. The position identification unit 102 associates manufacturing history data the positions of which in the long-side direction on the sheet are the same in the plurality of processes. The map display unit 103 displays, at the corresponding position on a map that indicates the sheet, manufacturing history data the positions of which in the long-side direction are the same, in association with each other.SELECTED DRAWING: Figure 14

Description

[Technical field]

[0001] The present invention relates to visualization of a manufacturing history, and more particularly to visualization of a manufacturing history of a sheet product. [Background technology]

[0002] When processing a sheet product, the sheet is pulled out from a roll, and the sheet is subjected to surface treatment, heat treatment, etc. in each device through which the sheet passes, and then the sheet is stored as a roll again. In sheet products manufactured in such a manner through multiple manufacturing processes, when an abnormality occurs in the product, it is often difficult to check the history of manufacturing conditions at the location where the abnormality occurred. Therefore, technology for comparing data obtained in multiple processes is being considered. As such a technology for comparing data obtained in multiple processes, technologies such as those in Patent Document 1 and Patent Document 2 are disclosed.

[0003] The foreign matter inspection method of Patent Document 1 relates to a method for determining whether foreign matters detected in multiple inspection processes in a sheet product are the same. In the foreign matter inspection method of Patent Document 1, foreign matters detected in each inspection process are displayed on a map based on the coordinates in the long side direction of the sheet, and whether the areas where the foreign matters exist overlap is used to determine whether they are the same foreign matter. In addition, the sheet product quality monitoring system of Patent Document 2 manages the position of a defect calculated from the unwinding length in association with data on the operating status of the manufacturing equipment. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2019-191127 A [Patent Document 2] JP 2010-70386 A Summary of the Invention [Problem to be solved by the invention]

[0005] However, the technology of Patent Document 1 is insufficient in the following respects. The technology of Patent Document 1 judges whether the foreign objects detected in each inspection process are the same, but the worker needs to search and compare the historical data of the manufacturing conditions at the position where the foreign object is detected for each process, which may require complex and extensive work. Also, the technology of Patent Document 2 associates the data of the operating state of the device with the inspection data, but cannot associate how the historical data of the operating state of the device changed at the time the foreign object was generated. Therefore, the technologies of Patent Document 1 and Patent Document 2 are insufficient as a technology for investigating the historical data of the manufacturing conditions of each process at the position where the abnormality was detected when an abnormality occurred.

[0006] SUMMARY OF THE PRESENT DISCLOSURE In order to solve the above-mentioned problems, an object of the present invention is to provide an analysis device etc. that can easily refer to data that associates manufacturing history data of multiple processes at each location on a sheet. [Means for solving the problem]

[0007] In order to solve the above problems, the analysis device of the present invention includes a data acquisition unit, a position identification unit, and a display unit. The data acquisition unit acquires manufacturing history data of a plurality of processes when manufacturing a sheet. The position identification unit associates manufacturing history data that are located at the same position in the long side direction on the sheet between the plurality of processes. The display unit displays the manufacturing history data that are located at the same position in the long side direction in association with each other at corresponding positions on a map showing the sheet.

[0008] The solution of the present invention obtains manufacturing history data for a plurality of processes when manufacturing a sheet. The solution of the present invention associates manufacturing history data for the same positions in the long side direction on the sheet between a plurality of processes. The solution of the present invention displays the manufacturing history data for the same positions in the long side direction in association with each other at corresponding positions on a map showing the sheet.

[0009] The analysis program of the present invention causes a computer to execute a process of acquiring manufacturing history data for a plurality of processes when manufacturing a sheet.The analysis program of the present invention causes a computer to execute a process of associating manufacturing history data that are located at the same position in the long side direction on a sheet between a plurality of processes.The analysis program of the present invention causes a computer to execute a process of associating and displaying manufacturing history data that are located at the same position in the long side direction on corresponding positions on a map showing the sheet. Effect of the Invention

[0010] According to the present invention, data that associates manufacturing history data for a plurality of processes can be easily referenced at each location on the sheet. [Brief description of the drawings]

[0011] [Figure 1] 1 is a diagram showing an outline of a configuration of a first exemplary embodiment of the present invention. [Diagram 2] 1 is a diagram illustrating a configuration of an analysis device according to a first embodiment of the present invention. [Diagram 3] FIG. 4 is a diagram showing an operation flow of the analysis device according to the first embodiment of the present invention. [Figure 4] FIG. 2 is a diagram illustrating an example of data processing in the first embodiment of the present invention. [Diagram 5] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 6] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 7] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 8] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 9] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 10] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 11] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 12] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 13] 1A to 1C are diagrams illustrating an example of a manufacturing process according to a first embodiment of the present invention. [Figure 14] FIG. 4 is a diagram illustrating a configuration of an analysis device according to a second embodiment of the present invention. [Figure 15] FIG. 11 is a diagram showing an operation flow of an analysis device according to a second embodiment of the present invention. [Figure 16] FIG. 13 is a diagram showing an example of another configuration of the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] (First embodiment) A first embodiment of the present invention will be described in detail with reference to the drawings. Fig. 1 is a diagram showing an outline of the configuration of a quality control system of this embodiment. The quality control system of this embodiment includes an analysis device 10 and a management device 20. This quality control system has a function in which the management device 20 collects each piece of history data in the manufacturing process of a sheet, and the analysis device 10 displays the history data of each manufacturing process by superimposing it on each position in the long side direction on a map corresponding to the sheet.

[0013] The management device 20 is connected to each device in the sheet manufacturing process and an inspection device via a network. FIG. 1 shows an example in which the management device 20 is connected to a coating device, a drying device, and an inspection device. FIG. 1 shows an example in which two coating devices, two drying devices, and two inspection devices are installed, but the types and numbers of devices are not limited to those shown in FIG. 1. FIG. 1 also shows an example in which processing and inspection are performed in each process while the sheet is pulled out from the roll and wound up on the roll, but pulling out from the roll and winding up may be performed multiple times in the product manufacturing process.

[0014] The following describes the configuration of the analysis device 10. Fig. 2 is a block diagram showing the configuration of the analysis device 10. The analysis device 10 includes a data acquisition unit 11, a position identification unit 12, an input reception unit 13, and a map display unit 14.

[0015] The data acquisition unit 11 acquires history data of manufacturing conditions and inspection data in each device during sheet manufacturing from the management device 20. A sheet is a product whose long side is longer than its short side and whose thickness is thin. A sheet is also called a film.

[0016] The data acquisition unit 11 acquires data related to the manufacture of the seat as historical data of the manufacturing conditions. Hereinafter, the historical data of the manufacturing conditions is also referred to as manufacturing historical data. The data acquisition unit 11 acquires data related to the manufacture of the seat, including data on materials, workers, measurements and inspections, equipment, work methods, and the environment.

[0017] The data of materials may include, for example, the part number, lot number, amount used, part number of auxiliary material, lot number of auxiliary material, and amount used of auxiliary material. The data of materials may also include information on the start time and end time of supply of each lot to the manufacturing process. The data of materials may also include quality data of finished products and intermediate products. The quality data may include, for example, data on length, foreign matter occurrence state, wrinkle occurrence state, scratch occurrence state, film thickness, and storage period. The occurrence state refers to, for example, shape, position, and number.

[0018] The worker data includes the ID of the worker who performed the work, the work content, the start time of the work, and the completion time of the work. The worker data may also include inspection records, repair content, and setup records. Setup records include, for example, records of fixture replacement, equipment test runs, and cleaning work.

[0019] The measurement and inspection data includes, for example, product part number, lot number, measuring device identification number, and inspection machine identification number. The measurement and inspection data includes product quality data. The product quality data includes, for example, product film thickness, surface temperature, defects, MI (Melt Index) value, and EW (Equivalent Weight) value. The defects include, for example, data on foreign matter, wrinkles, and scratches on the product.

[0020] The equipment data includes, for example, the name of the equipment used in the production, the machine number, the operation start time, the operation stop time, the equipment stop time, and the reason for the stop. The equipment data also includes the setting parameter data of the equipment. The equipment parameters include, for example, the heating temperature, the heating time, the temperature rise rate, the feed speed, the winding speed, the pressure, the tension, the coating amount, the ion concentration, the rotation speed, and the extrusion amount.

[0021] As data on work methods, for example, data on basic QC (Quality Control) process chart items, process numbers, process names, procedure numbers, procedure names, processing conditions, construction methods, equipment setting values, measuring instrument setting values, inspection device setting values, equipment management methods, standard work methods, and standard work times are acquired.

[0022] As the environmental data, for example, data on the temperature, humidity, air pressure, and amount of particles inside the building are acquired. Also, the data on the sheet manufacturing listed above is only an example, and data on all items does not have to be acquired, and data on items other than the above may also be acquired.

[0023] The position identification unit 12 associates the history data of the manufacturing process with the corresponding position in the long side direction of the sheet. The position identification unit 12 also converts the time series history data into position data corresponding to the position in the long side direction of the sheet, and associates the history data with the corresponding position on the sheet. By associating the time series history data with the position data corresponding to the position on the sheet in the long side direction, it is possible to visualize which position on the sheet the time series history data corresponds to in the manufacturing history. The position data is indicated by the distance from the leading edge of the sheet in the long side direction. The leading edge of the sheet refers to the edge on the side that is pulled out from the roll and enters the device first. The long side direction of the sheet corresponds to the sheet conveyance direction. The position identification unit 12 converts the time of the time series data into a position in the long side direction of the sheet based on the sheet conveyance start time and the conveyance speed.

[0024] The input acceptance unit 13 accepts input of the selection result of a data item by a worker. The input acceptance unit 13 acquires the selection result from an input device when the worker selects a data item to be displayed. The selection result is input, for example, by clicking and selecting a data item displayed on the screen with a mouse. The selection result may also be input by the worker touching a data item displayed on a display device equipped with a touch panel. The input acceptance unit 13 may also accept the input of the selection result of a data item by recognizing the worker's voice. When accepting input through voice recognition, the input acceptance unit 13 is connected to a microphone that acquires the worker's voice.

[0025] The map display unit 14 generates data by superimposing each history data of the manufacturing process during sheet manufacturing and the inspection data. The map display unit 14 generates data that associates each data with a position in the long side direction of the sheet, and generates map data. The map display unit 14 also outputs a map based on the generated map data to the display device. The map display unit 14 outputs display data used when selecting data items to be displayed together with the map to the display device.

[0026] The management device 20 acquires data from each device and inspection device in the sheet manufacturing process, and stores the acquired data. The management device 20 sends data used by the analysis device 10 for analysis to the analysis device 10. The management device 20 may acquire inspection data from multiple inspection devices in the intermediate and final processes when manufacturing the sheet. The management device 20 may acquire inspection data from inspection devices in multiple inspection processes in the intermediate process. Furthermore, the management device 20 may acquire inspection data from an inspection device that performs inspection only in either the intermediate process or the final process. Furthermore, the management device 20 may be provided as a part of a production management system that instructs each device to start processing and on manufacturing conditions.

[0027] The operation of the quality control system of this embodiment will be described. FIG. 3 is a diagram showing the operation flow of the analysis device 10. During sheet manufacturing, each device and inspection device in the manufacturing process stores history data and inspection data. The management device 20 acquires history data from each device and inspection device for each predetermined period. The predetermined period is set in hours or days. The management device 20 may also acquire history data from each device and inspection device for each predetermined number of lots or when the type of product being manufactured is changed. The management device 20 stores the history data acquired from each device and inspection device in a storage device inside the device or connected to the management device 20.

[0028] 3, the data acquisition unit 11 of the analysis device 10 acquires history data of a lot to be analyzed from the management device 20 (step S11). The items of the history data to be acquired are set in advance for each type of sheet, for example. The lot to be analyzed and the items of the history data to be acquired may be selected by the operator.

[0029] When the data acquisition unit 11 acquires the history data, the position identification unit 12 associates the history data with a position on the long side of the sheet (step S12). For example, when the history data is data that records temperature data in the device for each time, i.e., a time-series temperature data, the position identification unit 12 converts the time into a corresponding position on the long side of the sheet. The position identification unit 12 converts the time data into position data on the sheet based on the time when the leading edge of the sheet enters the area where temperature data is acquired and the sheet conveyance speed.

[0030] For example, when the sheet conveying speed is A (m / sec) and the time when the leading edge of the sheet enters the area where temperature data is acquired is t0, the position identifying unit 12 calculates the position of the sheet in the long side direction at time t using the distance D (m) from the leading edge of the sheet as D = (t - t0) x A. When the conveying speed is in seconds, the position identifying unit 12 calculates (t - t0) as the time difference in seconds.

[0031] When the acquired data is the length from the midpoint in the long side direction of the sheet, the position identification unit 12 converts the acquired data into data on the distance from the end in the long side direction of the sheet. When the acquired data is data on the distance from the end of the sheet, the acquired data is used as is.

[0032] When the position identification unit 12 converts each piece of data into data associated with a position in the long side direction of the sheet, the map display unit 14 generates map data that displays each piece of data associated with a position in the long side direction of the sheet on a map (step S13). When the map data is generated, the map display unit 14 displays the generated map data on the display device (step S14).

[0033] FIG. 4 is a diagram showing examples of history data and map data. The upper left part of FIG. 4 shows an example of history data of temperature in a manufacturing device. The history data in the upper left part of FIG. 4 is time and temperature data, so the position identification unit 12 converts the time and temperature data into position and temperature data. The data in the lower left part of FIG. 4 shows an example of inspection data, and shows an example in which wrinkles have occurred in a part of the sheet. The numerical value below the sheet in the lower left part of FIG. 4 shows the distance from the edge of the sheet. The lower left part of FIG. 4 shows an enlarged view of the range from 300 mm to 500 mm from the leading edge of the sheet.

[0034] The map display unit 14 generates data that associates temperature and wrinkles with the position in the long side direction, and generates map data as shown on the right side of FIG. 4. The map data on the right side of FIG. 4 is generated as a map in which temperature changes and wrinkles in the long side direction of the sheet are superimposed. The numerical values ​​on the bottom of the sheet on the right side of FIG. 4 indicate the distance from the leading edge of the sheet. The right side of FIG. 4 shows the area from the leading edge of the sheet to the vicinity of more than 600 mm. In addition, the diagram on the right side of FIG. 4 shows the high and low temperatures when the sheet is treated with the heater shown in the upper right part of FIG. 4 by the density of points. For example, the area around 400 mm where the density of points is high indicates that the temperature is higher than other areas when the sheet is treated with the heater. By referring to a map such as the one on the right side of FIG. 4, the worker can recognize that wrinkles have occurred in the area around 400 mm from the leading edge of the sheet, and that the temperature is higher than other areas. By referring to a map where the temperature is high near the location where the sheet is generated, the worker can infer that the temperature change is the cause of the wrinkles.

[0035] FIG. 5 shows an example of a display screen in which the inspection results displayed as a map are associated with the position of the temperature data in the long side direction and displayed as a graph. The numerical values ​​at the bottom of the map in FIG. 5 indicate the distance from the leading edge of the sheet. The graph at the bottom of FIG. 5 is a graph in which the temperature data of process A is associated with each position on the map, with the vertical axis indicating high and low temperatures. In the example of FIG. 5, based on the same data as in FIG. 4, the temperature data is displayed in association with the inspection results and the position in the long side direction, allowing the worker to more easily recognize the temperature change at the position where the wrinkles occurred by the change in the graph.

[0036] Next, a case where the displayed history data item is changed will be described. FIG. 6 is a diagram showing a typical example of a display screen in which the data item to be displayed is selected by an operator. In the example of the display screen in FIG. 6, buttons for the items of inspection and history data, such as "inspection", "temperature in process A", "pressure in process B", and "discharge amount in process B", are displayed on the left side. When the operator clicks on an item to be displayed using a mouse, the selection result of the item to be displayed on the map display unit 14 is sent via the input receiving unit 13. In the example of FIG. 6, "inspection", "temperature in process A", and "discharge amount in process B" are selected, and the map display unit 14 generates data that combines the inspection results displayed on the map with the graph data of the temperature in process A and the discharge amount in process B corresponding to the position in the long side direction of the map. The selection of data may be performed by the operator touching the button portion on a touch panel display device. Also, the selection may be canceled by clicking or touching the selected area again with the mouse.

[0037] Next, a case where candidates for display data are displayed by clicking on the map or touching the screen will be described. FIG. 7 shows an example where only the inspection results of the sheet are displayed. In FIG. 7, when the worker clicks on the wrinkled part with the mouse or touches the screen, the map display unit 14 displays candidates for items of history data of the related process as shown in FIG. 8. When the worker selects an item to be displayed from the candidates of history data, the map display unit 14 displays the data of the selected item on the map and on the graph as shown in FIG. 9. The example in FIG. 9 shows a case where "Process A Temperature", "Process B Pressure" and "Process B Discharge Volume" are selected. Based on the display screen as shown in FIG. 9, the worker can infer that the wrinkles were caused by the temperature of process A, from the result that the temperature of process A has changed and the other items have not changed.

[0038] Next, an example of displaying information on a lot related to a lot whose inspection result is displayed will be described. FIG. 10 shows an example of a case where a related lot number is displayed when a wrinkled portion or a map is clicked on a screen such as that of FIG. 5. The related lots are preset, such as several lots before and after the displayed lot. Also, a lot that has been processed under the same conditions as the displayed lot or with the same material rod may be set as the related lot. Also, a lot that has been processed between pre-processing maintenance and post-processing maintenance of the device that processed the displayed lot may be set as the related lot. By clicking on the number of the related lot, the inspection result and history data of the clicked lot may be further displayed. In this way, by displaying information on related lots, when an abnormality occurs, it is possible to easily check whether or not there is an abnormality in other lots.

[0039] Next, an example of displaying data on multiple sheets will be described. FIG. 11 shows an example of displaying a map for two sheets. By displaying multiple sheets in this way, it is possible to grasp whether the change occurred only in the lot in which the abnormality occurred or the abnormality is common to multiple lots, making it easier to estimate the cause of the abnormality. In addition, by displaying multiple sheets, it is also possible to determine whether an abnormality has occurred over a period longer than the manufacturing time of one sheet. In addition, although an example of two sheets is shown in FIG. 11, three or more sheets may be displayed. When three or more sheets are displayed, for example, by displaying sheets of lots before and after the lot in which the abnormality occurred, it is easier to determine whether an abnormality has occurred in other lots.

[0040] In the above explanation, an example of displaying one or more sheets has been shown, but it is also possible to enlarge and display only a portion of a sheet. Also, it is also possible to simultaneously display the entire sheet and the enlarged portion. By making it possible to change the display range according to the operator's operation, it is possible to more easily analyze the cause of an abnormality.

[0041] In the above explanation, an example of displaying the temperature change in the long side direction has been shown, but the temperature change in the short side direction may also be displayed. In FIG. 12, the film thickness data in the short side direction is displayed around 200 mm where the defect displayed as a square on the map occurred. Also, the temperature data is displayed around 600 mm. In the case of FIG. 12, the temperature data and the film thickness data are measured by sensors at several points in the direction of rotation and recorded as two-dimensional data. If the film thickness and temperature are higher on the right side of the figure, it can be seen that the defect in the section from 200 mm to 400 mm away from the leading edge of the sheet is caused by a thin film thickness. Also, it can be seen that the defect in the area from 600 mm to 800 mm away from the leading edge of the sheet is caused by a high temperature. By displaying the temperature distribution and film thickness distribution in the short side direction in association with the position in the long side direction in this way, the cause of the abnormality can be analyzed in more detail.

[0042] In the above description, an example of a sheet drawn from one roll has been shown, but the above described example may be applied to a sheet in which sheets drawn from multiple rolls are laminated together. Laminating multiple sheets is also called lamination. FIG. 13 is a schematic diagram showing a state in which sheets drawn from three rolls are laminated together, processed and inspected in each device, and then wound up into a single roll. In the fairness shown in FIG. 13, the history data and inspection data at the time of manufacturing each roll alone and the history data and inspection data of each process after the sheets are laminated are displayed as a map by associating the positions in the long side direction. With such a configuration, even in a sheet manufactured by laminating multiple sheets, it is easy to identify in which process an abnormality occurred, before or after the sheets are laminated. When laminating multiple sheets together, data is associated based on the positions in the long side direction from the leading position of each sheet when laminating.

[0043] In the quality control system of this embodiment, the management device 20 collects device history data and inspection data, and the analysis device 10 associates data that are located at the same position on the sheet. Furthermore, the analysis device 10 associates data that are located at the same position on the sheet with each other and displays them. Therefore, by using the quality control system of this embodiment, data that associates history data of multiple processes at each location on the sheet can be easily referenced. As a result, in the quality control system of this embodiment, by associating and displaying history data and inspection data that are located at the same position, when an abnormality occurs in a manufactured sheet, it becomes easy to identify the cause.

[0044] Second Embodiment The second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 14 is a diagram showing an outline of the configuration of an analysis device of this embodiment. The analysis device of this embodiment includes a data acquisition unit 101, a position identification unit 102, and a map display unit 103. The data acquisition unit 101 acquires manufacturing history data of a plurality of processes when manufacturing a sheet. Specifically, the data acquisition unit 101 acquires, for example, manufacturing history data and inspection data of each device when manufacturing a sheet. The position identification unit 102 associates history data that are located at the same position in the long side direction on the sheet between a plurality of processes. The map display unit 103 associates manufacturing history data that are located at the same position in the long side direction with each other and displays them at corresponding positions on a map showing the sheet. Specifically, the position identification unit 102 associates manufacturing history data and inspection data that are located at the same position in the long side direction of the sheet, and the map display unit 103 displays the associated data on a map.

[0045] Here, the data acquisition unit 11 of the first embodiment is an example of the data acquisition unit 101. Moreover, the data acquisition unit 101 is one aspect of a data acquisition means. The position identification unit 12 of the first embodiment is an example of the position identification unit 102. Moreover, the position identification unit 102 is one aspect of a position identification means. The map display unit 103 is an example of the map display unit 14 of the first embodiment. Moreover, the map display unit 14 is one aspect of a map display means.

[0046] The operation of the analysis device of this embodiment will be described. Fig. 15 is a diagram showing an operation flow of the analysis device of this embodiment. The data acquisition unit 101 of the analysis device acquires manufacturing history data of a plurality of processes when manufacturing a sheet (step S21). When the manufacturing history data is acquired, the position identification unit 102 associates manufacturing history data having the same position in the long side direction on the sheet between the plurality of processes (step S22). When the manufacturing history data having the same position is associated, the map display unit 103 displays the manufacturing history data having the same position in the long side direction in association with each other at the corresponding position on the map showing the sheet (step S23).

[0047] The analysis device of this embodiment associates manufacturing history data for multiple processes that are located at the same position in the long side direction of the sheet with each other, and displays the data in association with each other at corresponding positions on a map showing the sheet. Therefore, by using the analysis device of this embodiment, data in which manufacturing history data for multiple processes is associated with each other can be referenced on a map at each location on the sheet, and the manufacturing history between multiple processes in the sheet manufacturing process can be compared in a visualized state.

[0048] Each process in the analysis device 10 of the first embodiment and the analysis device of the second embodiment can be performed by executing a computer program on a computer. Fig. 16 shows an example of the configuration of a computer 200 that executes a computer program that performs each process in the analysis device 10 of the first embodiment and the analysis device of the second embodiment. The computer 200 includes a CPU (Central Processing Unit) 201, a memory 202, a storage device 203, an input / output I / F (Interface) 204, and a communication I / F 205. The management device 20 of the first embodiment can also have a similar configuration.

[0049] The CPU 201 reads out and executes computer programs for performing each process from the storage device 203. The memory 202 is configured with a dynamic random access memory (DRAM) or the like, and temporarily stores the computer programs executed by the CPU 201 and data being processed. The storage device 203 stores the computer programs executed by the CPU 201. The storage device 203 is configured with, for example, a non-volatile semiconductor storage device. Other storage devices such as a hard disk drive may be used for the storage device 203. The input / output I / F 204 is an interface that receives input from an operator and outputs display data and the like. The communication I / F 205 is an interface that transmits and receives data between each device and the operator's terminal and the like.

[0050] Furthermore, the computer programs used to execute each process may be stored in a recording medium and distributed. As the recording medium, for example, a magnetic disk such as a magnetic tape for recording data or a hard disk may be used. As the recording medium, an optical disk such as a CD-ROM (Compact Disc Read Only Memory) may also be used. A non-volatile semiconductor storage device may also be used as the recording medium. [Explanation of symbols]

[0051] 10 Analysis device 11 Data Acquisition Section 12 Location identification part 13 Input reception section 14 Map display section 20 Management device 101 Data Acquisition Section 102 Location identification part 103 Map display section 200 Computers 201 CPU 202 Memory 203 Storage device 204 Input / Output Interface 205 Communication I / F

Claims

1. A data acquisition means for acquiring manufacturing history data of a plurality of processes in manufacturing a sheet; a position specifying means for associating manufacturing history data having the same position in a long side direction on the sheet among the plurality of processes; a map display means for displaying the manufacturing history data having the same position in the long side direction in association with each other at corresponding positions on a map showing the sheet; An analysis device comprising:

2. The data acquisition means further acquires inspection data of the sheet, The analysis device according to claim 1 , wherein the map display means displays the test data by superimposing the test data at positions on the map corresponding to positions at which the test data was acquired.

3. 3. The analysis device according to claim 1, wherein the position identifying means converts the time-series manufacturing history data into position data in a long side direction of the sheet, and associates the data with history data having the same position in the long side direction.

4. 4. The analysis device according to claim 1, wherein the map display means displays the manufacturing history data of the plurality of sheets in the order in which the processing was performed.

5. 5. The analysis device according to claim 1, wherein the map display means displays the manufacturing history data of a selected item on the map.

6. 6. The analysis device according to claim 1, wherein the map display means displays information related to an item selected on the map.

7. Obtain manufacturing history data for multiple processes in manufacturing seats, Associating manufacturing history data having the same position in the long side direction on the sheet between the plurality of processes; An analysis method in which manufacturing history data having the same position in the long side direction is displayed in association with each other at corresponding positions on a map showing the sheet.

8. Further obtaining inspection data of the sheet; The analysis method according to claim 7 , wherein the inspection data is displayed superimposed on a position on the map corresponding to a position where the inspection data was acquired.

9. 9. The analysis method according to claim 7, further comprising converting the time-series manufacturing history data into position data in a long side direction of the sheet, and associating the data with history data having the same position in the long side direction.

10. A process of acquiring manufacturing history data of a plurality of processes in manufacturing a seat; A process of associating manufacturing history data of the same position in the long side direction on the sheet between the plurality of processes; a process of displaying the manufacturing history data having the same position in the long side direction in association with each other at a corresponding position on a map showing the sheet; An analysis program that causes a computer to execute the above.

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