Super I/O test method

A test method and chip test technology, applied in the field of testing, can solve problems such as difficulty in reading for ordinary users

Inactive Publication Date: 2008-10-01
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the prior art, the contents of the I / O registers in the Super I / O chip can be used to understand the current hardware information, but it is difficult for ordinary users to understand, and it is necessary to consult relevant information to understand the various I / O registers. meaning

Method used

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Embodiment Construction

[0009] Please refer to FIG. 1 , the test system implementing the preferred embodiment of the Super I / O test method of the present invention includes a display 20 , a test fixture 30 and a motherboard 40 . The display 20 is used to display the test results of the computer hardware test, which is convenient for users to debug. The test fixture 30 is used to call out required data from a Super I / O chip 41 on the main board 40 . Other chips such as South Bridge and North Bridge are also arranged on the main board 40 .

[0010] Before testing the hardware on the main board 40, it is necessary to connect the display 20 and the main board 40 together, run the test fixture 30, and input relevant content according to system needs, and various corresponding information can be displayed .

[0011] see figure 2 , the flowchart for realizing the preferred embodiment of the hardware monitoring method of the present invention includes the following steps:

[0012] S1: Determine the Super ...

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Abstract

The present invention provides a Super I / O test method, testing the temperature, voltage of the computer hardware and the rotating speed of the fan by a Super I / O chip mounted on the mainboard, compared with the prior art, the invention not only includes reading I / O register content of the prior test method, but also directly showing the computer hardware information on the display according to the requirement, convenient to help user know the hardware state.

Description

technical field [0001] The invention relates to a testing method, in particular to a testing method utilizing Super I / O chip testing. Background technique [0002] In order to allow users to understand the working status of the hardware (temperature, speed, voltage, etc.), there are usually one or two hardware monitoring chips dedicated to monitoring the working status of the hardware on the motherboard. When the hardware monitoring chip cooperates with various sensing elements (voltage, temperature, speed), it can automatically take protective measures or adjust the working parameters of the corresponding components in time when the hardware is not working properly, so as to ensure the operation of various accessories in the computer. under normal conditions. Common ones include temperature control chips and general hardware monitoring chips. [0003] General-purpose hardware monitoring chips usually also integrate super I / O (input / output management) functions, which can ...

Claims

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Application Information

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IPC IPC(8): G06F11/32
Inventor汪永安
OwnerHONG FU JIN PRECISION IND (SHENZHEN) CO LTD