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Voltage test device and voltage test method

A technology of voltage testing and voltage, which is applied in the direction of measuring devices, electronic circuit testing, measuring current/voltage, etc., and can solve problems such as economic losses of manufacturers and damage to electronic components

Inactive Publication Date: 2013-07-31
MINGSHUO COMP (SUZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, this approach has certain risks. If the power supply of the motherboard is abnormal, or the connectors of the electronic components are abnormal, these electronic components may be damaged after power supply, thereby bringing economic losses to the manufacturer.

Method used

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  • Voltage test device and voltage test method

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Embodiment Construction

[0013] figure 1 Shown is a structural block diagram of a voltage testing device according to a preferred embodiment of the present invention. The voltage testing device 1 provided in this embodiment is used for measuring the power supply of the first connector 21 on the first circuit board 2 . In this embodiment, the first circuit board 2 is a motherboard, and the first connector 21 is a central processing unit (CPU) socket. The first circuit board 2 also includes a power supply unit 22 . In other embodiments, the first circuit board 2 is a motherboard of a computer device, and the power supply unit 22 is a power supply of the above-mentioned computer device, and the power supply unit 22 is not arranged on the first circuit board 2. The present invention does not This is not limited.

[0014] The above-mentioned voltage testing device 1 includes a second circuit board 11 , a third circuit board 12 , a voltage generating unit 110 , a connection part 120 , a comparing module ...

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Abstract

The invention discloses a voltage test device and a voltage test method. The voltage test device is used to test a first circuit board, wherein the circuit board comprises a fist connector. The voltage test device is couple with a power supply unit so as to obtain input voltage from the power supply unit, and the power supply unit provides a power supply for the first circuit board. The voltage test device comprises a voltage generating unit, a connection part and a comparison module, wherein the voltage generating unit is used to receive the input voltage and converts the input voltage to a preset voltage; the connection part is used to be coupled with the fist connector of the first circuit board and obtain a first measurement voltage from the fist connector; and the comparison module is coupled with the connection part and the voltage generating unit separately, receives the first measurement voltage and the preset voltage and compares the first measurement voltage with the preset voltage to provide the test result.

Description

technical field [0001] The present invention relates to a test device, and in particular to a voltage test device and a voltage test method. Background technique [0002] With the rapid progress of the electronics industry, the quality and variety of related products circulating on the market are changing with each passing day. The rapid popularization of computers is an obvious example. The motherboard is an indispensable and important component of the computer, and its quality can determine the performance of the entire computer. Therefore, in order to improve the quality of the computer, manufacturers usually improve the reliability of the motherboard through testing. [0003] In the process of production, in order to perform a functional test on the motherboard, the traditional method is to install the necessary electronic components on the motherboard and directly power on for testing. For example: the central processing unit (CPU) on the motherboard is powered only a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/165G01R31/28
Inventor 孙燕尹国煌
Owner MINGSHUO COMP (SUZHOU) CO LTD
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