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An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer

A technology of ion guidance and ion lens, which is applied in the field of mass spectrometers and can solve problems such as defects and ion lens contamination

Active Publication Date: 2013-05-15
DH TECH DEVMENT PTE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, such ion lenses have a tendency to contaminate and are therefore generally defective

Method used

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  • An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer
  • An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer
  • An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer

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Embodiment Construction

[0014] A first aspect of the invention provides an ion lens for reducing the effect of contamination in an ion guide of a mass spectrometer. The ion lens comprises a structural member (comprising an aperture with a given radius) for supporting the ion lens at the exit region of the ion guide. The ion lens further comprises a conical member extending from the structural member, the conical member being hollow and comprising a given cone angle, and a base having a given radius, the perimeter of the base being connected to the small The perimeter of the bore, the conical member further comprising a bore through the tip of the conical member for receiving ions therethrough from the ion guide.

[0015] The given radius and the given cone angle may enable at least a portion of the conical member, including the tip, to reside in an exit region of the ion guide.

[0016] The aperture may be located in a central portion of the structural member and the conical member may extend from t...

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PUM

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Abstract

An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer is provided. The ion lens comprises a structural member comprising an orifice of a given radius, the structural member for supporting the ion lens at an exit region of the ion guide. The ion lens further comprises a conical member extending from the structural member, the conical member being hollow and comprising a given cone angle, and a base of the given radius, a perimeter of the base connected to a perimeter of the orifice. The conical member further comprises an aperture through an apex of the conical member, the aperture for receiving ions there through from the ion guide.

Description

technical field [0001] The present invention relates generally to mass spectrometers, and more particularly to an ion lens for reducing the effects of contaminants in an ion guide of a mass spectrometer. Background technique [0002] In a mass spectrometer, an ion guide typically has an ion lens at the exit end that contains a plate with holes through which ions from the ion guide pass. The ion lens can be used as an element in a differential pumping system. However, such ion lenses have a tendency to foul and are therefore generally defective. Contents of the invention Description of drawings [0003] Embodiments are described with reference to the following drawings, in which: [0004] figure 1 A block diagram depicting a mass spectrometer with a flat ion lens according to the prior art; [0005] figure 2 Depicting a block diagram of a mass spectrometer with an ion lens for reducing the effect of contamination in an ion guide, according to a non-limiting embodime...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/26
CPCH01J49/26H01J49/067
Inventor 亚历山大·洛博达
Owner DH TECH DEVMENT PTE