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Device specially used for grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and regulating method of device

A grazing-incidence, experimental technique, used in measurement devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of low quality of spectrum, difficult to accurately locate the initial position of the sample, and high detection noise.

Active Publication Date: 2015-06-03
INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0008] This setup has the following problems: the initial position of the sample is difficult to locate precisely
Also, the angle of rotation of the sample in this setup is difficult to adjust precisely
In addition, the detection noise of this setting is large, and the quality of the spectrum is not high

Method used

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  • Device specially used for grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and regulating method of device
  • Device specially used for grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and regulating method of device
  • Device specially used for grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and regulating method of device

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Embodiment Construction

[0045] Before describing the device dedicated to the grazing-incidence XAFS experiment of the embodiment of the present application, the basic principle of the grazing-incidence XAFS spectrum experiment will be described first.

[0046] figure 2 The basic principle of the grazing incidence XAFS spectroscopy experiment is schematically shown. The X-ray 11 is grazingly incident on the sample S at a grazing incidence angle slightly smaller than the critical angle, and the incident X-ray 11 is fully emitted on the surface of the sample S, and only interacts with the material on the surface of the sample S with a thickness of several nanometers to tens of nanometers (specifically The penetration depth is related to factors such as the energy of X-rays and the material itself). The fluorescence 13 generated on the surface contains the structural information of the material on the surface of the sample. The single-energy X-ray scanning is performed on the absorption edge of the de...

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Abstract

The invention discloses a device specially used for a grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and a regulating method of the device. The device comprises a device for generating an X ray required by the grazing incidence XAFS experiment, a front slit for defining the size of the X ray, a first lifting platform for enabling the front slit to go up and down in the vertical direction, a sample frame for bearing a sample, a rotating platform for rotating the sample on the sample frame to obtain the required X ray grazing incidence angle, a second lifting platform for enabling the rotating platform to go up and down in the vertical direction, a rear slit for limiting the size of a total-reflection X ray, a third lifting platform for enabling the rear slit to go up and down in the vertical direction, a first detector for detecting a fluorescence signal sent by the sample, and a second detector for detecting a total-reflection X ray signal. By adopting the device and method, the initial position of the sample can be rapidly and accurately set, the sample angle can be accurately regulated, experimental detection data of the sample can be obtained at high signal to noise ratio, and a high-quality grazing incidence XAFS experiment spectrum is acquired.

Description

technical field [0001] The present invention relates to a modern material structure analysis method - synchrotron radiation experiment method, in particular to a device specially used for grazing incidence X-ray Absorption Fine Structure (X-ray Absorption Fine Structure, XAFS) experiment and an adjustment method of the device. Background technique [0002] The synchrotron radiation XAFS spectrum experiment system has become an effective means to study the structure of matter, serving multidisciplinary fields, such as life sciences, new materials, environmental health, and industrial applications. [0003] XAFS spectra were determined by photon energy scanning using a twin crystal monochromator. The monoenergetic beam from the monochromator is incident on the sample, and the sample absorbs different photons with different energies, and the XAFS spectrum can be obtained by detecting the change of the light intensity before and after the sample with the photon energy. The stru...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 谢亚宁张静张久昶宋冬燕
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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