Testing method and testing system of integrated test instrument

Abstract

The invention provides a testing method and a testing system of an integrated test instrument. According to the testing method, when the testing system is used for testing a tested device, starting corresponding testing modules by invoking pre-configured interfaces and interfaces in various testing modules in the test instrument; after the completion of the running of the started test modules is determined, obtaining test logs which are recorded by the testing modules and comprise the test processes and / or the test results; and continuously testing the tested device based on the obtained test logs. According to the testing method and the testing system of the integrated test instrument, the interfaces corresponding to the testing modules in the test instrument are configured to combine two test devices which are completely different in execution environment, and therefore, the discordance of the two test devices is effectively avoided and the efficiency of testing the tested device is effectively improved; meanwhile, the testing system automatically extracts desired test records and continuously performs testing by use of the test logs in the test instrument, so that the completely automatic testing between two completely different test environments is realized.

Description

technical field [0001] The invention relates to the field of testing of communication equipment, in particular to a testing method and system for an integrated testing instrument. Background technique [0002] There are many kinds of tests for communication electronic equipment, such as protocol conformance test, functional test, performance statistics test, etc. In order to fully test the device under test, testers need to use a variety of test platforms to test the device under test. [0003] At present, testers need to do as much testing on the device under test as possible on one test platform during the test process, and then move to another test platform. Because the hardware and software environment of each test platform are inconsistent. Therefore, both designing test modules and maintaining test environments need to be handled by testers alone. In addition, in many cases, the test process on a certain test platform needs to rely on the test results or test proces...

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Problems solved by technology

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a test method and system for an integrated test instrument, which is used to solve the problem that the existing multi-test platform coupling degree in the prior art is too low to realize automatic testing. question

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