Three-dimensional visual sense reconstruction method

A 3D vision and 3D reconstruction technology, applied in the field of structured light measurement, can solve the problems of low practicality and achieve the effect of fast 3D reconstruction

Active Publication Date: 2016-06-22
SICHUAN UNIV
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[0004] The purpose of the present invention is to provide a three-dimensional visual reconstruction method to solve the problem that the three-dimensional recon

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[0024] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0025] Figure 5 An embodiment of a three-dimensional vision reconstruction method of the present invention is shown: a three-dimensional vision reconstruction method includes the following steps:

[0026] Step 1: Set up a three-dimensional measurement system, place the measured object in the range that the camera can capture, and the light emitted by the projector can cover the range to be scanned;

[0027] Step 2: Using the multi-frequency phase measurement profilometry (PMP) structured light scanning method, the sinusoidal projection pattern with phase shift is projected by the projector and t...

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Abstract

The invention relates to the technology of structured light measurement and specifically relates to a three-dimensional visual sense reconstruction method, comprising following steps: establishing a three-dimensional measurement system; projecting a sine projection pattern with phase shift by a projector and capturing modulated sine pattern on a measured object surface with a camera in real time by use of a multi-frequency phase measuring profilometry structured light scan method, and calculating measured object surface phase information according to the multi-frequency phase measuring profilometry phase developing method; calculating the relative depth of the measured object by use of torsion resistance which changes with the surface depth of the measured object for the phase pattern in space, and realizing three-dimensional reconstruction according to the relative depth. The method can be applied in situations where complicated calibration cannot be realized due to condition limiting, calibration is difficult to carried out, or only low precision three-dimensional coordinate image reconstruction is required to quickly realize three-dimensional reconstruction; the method gives a solution to the problem that the present three-dimensional reconstruction method can not be carried out with insufficient calibrating data; the method has wide applications in the field of archaeology and three-dimensional data visualization.

Description

technical field [0001] The invention relates to structured light measurement technology, in particular to a three-dimensional vision reconstruction method. Background technique [0002] Structured light illumination (SLI) has gradually become a main three-dimensional measurement technology due to its advantages of reliability, accuracy and non-contact. A typical structured light measurement system includes a projector and a camera. The SLI algorithm first needs to calibrate the system to obtain calibration information. The calibration process begins with the projector projecting a coded structured light pattern onto a calibrated object surface, and at the same time The structured light pattern modulated on the surface of the object to be calibrated is captured by the camera in real time, and then the calibration information is calculated based on the image captured by the camera. If the calibration data is unknown, it is impossible for the structured light measurement system...

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Application Information

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IPC IPC(8): G01B11/25G06T17/00
CPCG01B11/2527G06T17/00G06T2200/08
Inventor 刘凯郑宏博龙云飞余翔
Owner SICHUAN UNIV
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