Three-dimensional visual sense reconstruction method
A 3D vision and 3D reconstruction technology, applied in the field of structured light measurement, can solve the problems of low practicality and achieve the effect of fast 3D reconstruction
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2016-06-22
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to structured light measurement technology, in particular to a three-dimensional vision reconstruction method. Background technique
[0002] Structured light illumination (SLI) has gradually become a main three-dimensional measurement technology due to its advantages of reliability, accuracy and non-contact. A typical structured light measurement system includes a projector and a camera. The SLI algorithm first needs to calibrate the system to obtain calibration information. The calibration process begins with the projector projecting a coded structured light pattern onto a calibrated object surface, and at the same time The structured light pattern modulated on the surface of the object to be calibrated is captured by the camera in real time, and then the calibration information is calculated based on the image captured by the camera. If the calibration data is unknown, it is impossible for the structured light measurement system...
Examples
Embodiment Construction
[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0025] Figure 5 An embodiment of a three-dimensional vision reconstruction method of the present invention is shown: a three-dimensional vision reconstruction method, comprising the following steps:
[0026] Step 1: Set up a three-dimensional measurement system, place the measured object in the range that the camera can capture, and the light emitted by the projector can cover the range to be scanned;
[0027] Step 2: Use the multi-frequency phase measurement profilometry (PMP) structured light scanning method to project the sinusoidal projection pattern with phase shift through the projector and...