Method and system for replacing XDP for SBR testing

A cyclic execution and subroutine technology, applied in the field of SBR testing instead of XDP, can solve problems such as cost, and achieve the effect of improving the solution speed, maintaining product image, and facilitating maintenance.

Active Publication Date: 2019-07-30
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a method and system for performing SBR testing instead of XDP, aiming to solve the problem that the cost of using XDP tools for SBR testing in the prior art is huge, and realize that SBR testing can be performed without XDP, saving costs and improving efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for replacing XDP for SBR testing
  • Method and system for replacing XDP for SBR testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] In order to clearly illustrate the technical features of the present solution, the present invention will be described in detail below through specific implementation methods and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily lim...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method and a system for replacing XDP for SBR testing. The method comprises the steps of inputting a BDF value of PCIe PORT to be tested, and setting the number of cycles anda delay value; executing a Linkup subprogram, setting SBR bit enable 1, and carrying out delay operation; executing a Linkdown subprogram, setting SBR bit enabling 0, and performing delay operation; and circularly executing the operation until the set number of cycles is completed. According to the invention, the SBR test is realized in a script running manner; any hardware resource does not needto be changed; the SBR operation is carried out in a script running mode under the system, the effect same as that of XDP can be achieved, the cost for purchasing an XDP tool can be saved, maintenancecan be carried out more conveniently, the verification mode and the like can be changed according to the needs of a user, the problem solving speed is increased, and a product image is maintained.

Description

technical field [0001] The invention relates to the technical field of SBR testing, in particular to a method and system for performing SBR testing instead of XDP. Background technique [0002] In current servers, there are more and more devices on the PCIe bus on the motherboard, and the speed is getting faster and faster. When there is a problem on the PCIe bus, debugging the PCIe bus is often used, which can quickly reproduce and solve it. Therefore, the XDP interface will be reserved in the design of the motherboard for Debug use. [0003] However, in the actual use process, XDP needs to be equipped with host computer software and tools, but the practicability of the tools is not very good, and it is often easy to fail to connect, resulting in failure to debug. The technical scheme of the PCIe bus SBR test currently adopted is: use the XDP interface on the main board, enter the corresponding command on the host computer software, connect to the main board interface thro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/2273
Inventor 赵波
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap