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Two-box type high-low temperature impact test device

An impact test, high and low temperature technology, applied in the field of test boxes, can solve problems such as instability, high temperature and low temperature of the test box cannot be cut off, test products cannot be automatically lifted, etc., to achieve the effect of improving stability and preventing interpenetration

Inactive Publication Date: 2021-04-27
BENGBU ZHENGYUAN ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In order to solve the above technical problems, a two-box type high and low temperature impact test device is provided. This technical solution solves the problems that the traditional test box cannot be separated from the high temperature and low temperature, and the test product cannot be automatically lifted or the lifting is unstable.

Method used

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  • Two-box type high-low temperature impact test device
  • Two-box type high-low temperature impact test device
  • Two-box type high-low temperature impact test device

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Embodiment Construction

[0076] The following description serves to disclose the present invention to enable those skilled in the art to carry out the present invention. The preferred embodiments described below are only examples, and those skilled in the art can devise other obvious variations.

[0077] refer to Figure 1 to Figure 10 As shown, a two-box type high and low temperature impact test device includes:

[0078] The bottom plate 1 is provided with a supporting foot 2 around the bottom;

[0079] The discharge box 3 is arranged on the top of the bottom plate 1, one side and the upper end of the discharge box 3 are open, and the upper ends of both sides of the discharge box 3 are also provided with vents 4;

[0080] The discharge assembly is used to place the test product, and the discharge assembly is arranged inside the discharge box 3;

[0081] The positioning component is used to position the test product at the center of the discharging component, and the positioning component is arrang...

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Abstract

The invention relates to the technical field of experiment boxes, in particular to a two-box type high-low temperature impact test device which comprises: a bottom plate, wherein a supporting leg arranged on the periphery of the bottom of the bottom plate; a discharging box, wherein ventilation openings formed in the upper ends of the two sides of the discharging box; a discharging assembly used for containing test articles; a positioning assembly used for positioning the test articles in the center of the discharging assembly; a first partition assembly which is used for partitioning high temperature and low temperature, a high-temperature box which is used for high-temperature impact of a test article; a second partition assembly, wherein the second partition assembly and the first partition assembly are the same in structure; a low-temperature box which is used for low-temperature impact of the test article; a top plate; a three-jaw manipulator which is used for grabbing a test article; and a lifting rope assembly which is used for lifting the three-jaw manipulator upwards. The problems that high temperature and low temperature of a traditional test box cannot be separated, and a test article cannot be automatically lifted or is not stably lifted are solved, the lifting stability of the test article is improved, and the phenomenon of interpenetration between the high temperature and the low temperature is prevented.

Description

technical field [0001] The invention relates to the technical field of experiment boxes, in particular to a two-box type high and low temperature impact test device. Background technique [0002] The high and low temperature impact test chamber can be used to test the degree to which materials or composite materials can withstand the continuous environment of extremely high temperature and extremely low temperature in an instant, and to test the chemical changes or physical damage caused by thermal expansion and contraction in the shortest time. Its test objects can also be electronic and electrical components, automation components, communication components, electronic chips, auto parts, PCB substrates, metals, chemical materials, polymer materials, plastics, etc. High and low temperature impact test chambers are widely used in ten defense industries, In the fields of aerospace and household appliances, the common high and low temperature impact test chambers are divided in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/60G01N3/02
CPCG01N3/02G01N3/60G01N2203/0224
Inventor 夏云
Owner BENGBU ZHENGYUAN ELECTRONICS TECH
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