System for performing dynamic and short-circuit test on intelligent power module

Abstract

The invention discloses a system for performing dynamic and short-circuit testing on an intelligent power module. The system comprises a control module, a driving circuit and a power circuit. The control module firstly generates a control instruction and sends the control instruction to the power circuit, and then generates a control signal and sends the control signal to the driving module; meanwhile, according to the received waveform data and the waveform data of the control signal, a plurality of parameters required by the test item are calculated. The drive circuit isolates the control signal and then outputs the control signal to the tested intelligent power module, and the tested intelligent power module turns on or turns off the IGBT according to a time sequence. The power circuit is connected with each IGBT of the tested intelligent power module, is communicated with a test channel of the corresponding IGBT according to a received control instruction, collects the waveform data of the current of the IGBT and the CE end voltage in the test process, and sends the waveform data to the control module. According to the invention, through automatic switching between channels, automatic acquisition of parameters and automatic calculation of parameters, dynamic parameter testing and short-circuit parameter testing of an intelligent power module product are realized.

Description

Technical Field

[0001] The invention relates to a system for performing dynamic and short-circuit tests on an intelligent power module, belonging to the technical field of intelligent power module testing. Background Art

[0002] The intelligent power module IPM (Intelligent Powr Module) not only integrates the power switch device and the drive circuit, but also has an overcurrent detection circuit built in, and can send the detection signal to the CPU or DSP for interrupt processing. It consists of a high-speed, low-power consumption die, an optimized gate-level drive circuit, and a fast protection circuit. Even if a load accident or improper use occurs, the IPM itself will not be damaged. The verification technology of the short-circuit and dynamic characteristics of the IPM is a key verification technology in the development and design of intelligent power module products. At present, domestic equipment is basically dynamic and short-circuit test equipment for IGBT, and there is no dynamic test equipment for IPM. It is necessary to design a dynamic and short-circuit test system with a dedicated interface for IPM. Summary of the invention

[0003] The technical problem solved by the present invention is: to overcome the deficiencies of the prior art and to propose a dynamic and short-circuit test system for an intelligent power module, so as to realize dynamic parameter test and short-circuit parameter test of an intelligent power module product.

[0004] The technical solution of the present invention is:

[0005] A system for dynamic and short-circuit testing of an intelligent power module, comprising a control module, a drive circuit and a power circuit;

[0006] The control module generates a control instruction according to the product information and test items of the intelligent power module under test and sends it to the power circuit. After receiving the completion mark signal of the power circuit, the control module generates a control signal and sends it to the drive module. The control module calculates multiple parameters required for the test items according to the received waveform data and the waveform data of the control signal. The test items include dynamic test and short circuit test.

[0007] The driving circuit is used to isolate the control module and the intelligent power module under test; the control signal is used as a PWM control voltage signal input to the driving circuit, and is output to the intelligent power module under test after isolation processing, and the intelligent power module under test turns on or off the IGBT according to the timing;

[0008] The power circuit connects the IGBTs of the intelligent power module under test, connects the test channels of the corresponding IGBTs according to the received control instructions, sends a completion flag signal to the control module after the connection action is completed, collects the waveform data of the IGBT current and CE terminal voltage during the test and sends them to the control module.

[0009] Furthermore, the power module includes a data collector, a capacitor C1, an inductor L1, a power supply, and an oscilloscope;

[0010] The power supply charges the capacitor C1 by connecting the busbars P and N. The capacitor C1 stores energy and provides transient current. The inductor L1 provides an inductive load.

[0011] The data acquisition device includes multiple relays, which control the on and off of the test channels connected to each IGBT through the combination of multiple relays; the data acquisition device receives the control instruction, and according to the control instruction requirement, switches the relay to achieve the IGBT connection required by the instruction, performs dynamic test or short-circuit test, and obtains the waveform data of the current and CE terminal voltage of the IGBT when connected through the oscilloscope and sends it to the control module.

[0012] Furthermore, when the intelligent power module under test is dynamically tested, the control module calculates multiple parameters according to the received waveform data, and the calculation method is:

[0013] According to the received IGBT current waveform data, the current rises to 10% I c The position corresponds to the time t2, and the current rises to 90% I c The position corresponds to the time t3, and the current drops to 90% I c The position corresponds to time t7, and the current drops to 10% I c The position corresponds to the time t8, and the current rises to I c The position corresponds to time t9, and the current drops to I c The position corresponding to the time t 10 ; Among them, I c is the rated current of IGBT;

[0014] According to the waveform data of the CE terminal voltage of the IGBT received, the voltage drops to 10% V CE The position corresponds to time t4, and the voltage rises to 10% V CE The position corresponds to time t6; where V CE is the rated current of CE terminal of IGBT;

[0015] According to the waveform data of the received PWM control signal voltage, the voltage drop position corresponding to the time t1 and the voltage rise position corresponding to the time t5 are obtained respectively;

[0016] The calculation results are:

[0017] t d(on) =t2-t1

[0018] t on =t3-t1

[0019] tr=t3-t2

[0020] t c(on) =t4-t2

[0021] t d(off) =t7-t5

[0022] t c(off) =t8-t6

[0023] t off =t8-t5

[0024] t f =t8-t7

[0025] t rr =t 10 -t9

[0026] I rr =I rmax -Ic

[0027]

[0028]

[0029] Among them, t d(on) is the opening delay time, t on is the turn-on time, tr is the current rise time, t c(on) is the opening crossover time, t d(off) is the turn-off delay time, t c(off) is the turn-off crossover time, t off is the turn-off time, t f is the current fall time, t rr is the reverse recovery time, I rr is the reverse recovery current; E off is the turn-off loss, I is the current of IGBT, V is the CE terminal voltage of IGBT; E on For the opening loss.

[0030] Furthermore, when a short-circuit test is performed on the intelligent power module under test, the control module calculates multiple parameters according to the received waveform data, and the calculation method is:

[0031] According to the received IGBT current waveform data, the time from the overcurrent protection point to the start of the current drop is obtained as the short-circuit protection delay time t off(SC) ; Get the maximum current value as the short-circuit protection current.

[0032] Furthermore, the data logger is provided with ten relays K1 to K10; among them, relay K1 and relay K2 are used to switch the inductor L1 to the P or N end of the input bus, relay K3 and relay K4 are used to switch the common end line to the P or N end of the input bus when testing a short circuit, and relay K7, relay K8, relay K9, and relay K10 are respectively used to switch U, V, W, and B to the middle common end.

[0033] Furthermore, the point where the control signal is connected to the data collector is the RLY point. When the RLY point is connected to the ground, there is voltage in the relay coil and the relay is turned on. When the control signal is high, the relay is turned on, and when the RLY point is low, the relay is turned off.

[0034] Furthermore, the busbar is used for connection between the capacitor C1 and the intelligent power module under test, and the interface of the busbar is connected to the PN level of the intelligent power module under test.

[0035] Furthermore, a PWM control signal is generated and sent through a signal generator and an optical coupler; the signal generator is used to generate a double-pulse PWM control signal, and the double-pulse PWM control signal is isolated and transmitted to the intelligent power module under test through the optical coupler.

[0036] The advantages of the present invention compared with the prior art are:

[0037] (1) The present invention realizes automatic switching between channels, automatic collection of parameters and automatic calculation of parameters through the design of control circuits and power circuits, thereby realizing dynamic parameter testing and short-circuit parameter testing of intelligent power module products.

[0038] (2) The present invention has a reasonable structure and hardware design. The busbar is used to connect the energy storage capacitor and the product. The interface of the busbar can be connected to the PN level of the product. Such a design can reduce the area between PNs, reduce the influence of parasitic inductance on dynamic testing and short-circuit testing, and improve the accuracy of dynamic testing and short-circuit testing of the intelligent power module. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0040] Figure 1 This is a system composition diagram of an embodiment of the present invention;

[0041] Figure 2 This is an operation flow chart of an embodiment of the present invention;

[0042] Figure 3 A schematic diagram of a human-machine interface for testing an embodiment of the present invention;

[0043] Figure 4 This is a diagram illustrating parameter calculation in an embodiment of the present invention;

[0044] Figure 5 This is a diagram illustrating parameter calculation in an embodiment of the present invention;

[0045] Figure 6 A connection diagram of a dynamic and short-circuit verification circuit according to an embodiment of the present invention;

[0046] Figure 7 This is a circuit diagram of a relay short-circuit protection circuit according to an embodiment of the present invention;

[0047] Figure 8 This is a test waveform diagram of an embodiment of the present invention;

[0048] Fig. 9 This is an isolation drive circuit diagram of an intelligent power module according to an embodiment of the present invention;

[0049] Fig.10 The relay driving circuit diagram of the embodiment of the present invention;

[0050] Fig.11 This is a schematic diagram of the structure of an intelligent power module according to an embodiment of the present invention;

[0051] Fig.12 This is a screenshot of the interface of the dynamic and short-circuit verification system of the embodiment of the present invention;

[0052] Fig.13 This is a screenshot of the dynamic test of the embodiment of the present invention;

[0053] Fig.14 This is a screenshot of a short circuit test in an embodiment of the present invention;

[0054] Fig.15 This is a schematic diagram of the system composition of an embodiment of the present invention;

[0055] Fig.16 This is a schematic diagram of a dynamic test of an embodiment of the present invention;

[0056] Fig.17 Schematic diagram of short circuit test according to an embodiment of the present invention. DETAILED DESCRIPTION

[0057] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0058] The present invention proposes a system for performing dynamic and short-circuit testing on an intelligent power module, such as Figure 1 As shown, it includes a control module, a drive circuit, a power circuit, a test device, and a host computer. The drive circuit is used to isolate the control module and the intelligent power module under test for signal isolation.

[0059] The control module controls the test equipment according to the product information of the intelligent power module under test. Figure 2 As shown, after the program starts running, first enter the basic test information, including product name, product type, test item, test channel, test voltage, test current, short-circuit test time and other information; then click "Select Test Item" to start the test, the equipment is initialized, the test channel is switched through the relays K1-K10 in the power circuit, the control waveform is output through the signal generator, and it is determined whether the waveform is normal. If it is normal, the test channel is selected, and then the capacitor is charged. After charging, a control signal is sent, and then the waveform data is read, and the parameters are calculated according to the waveform data. After the calculation is completed, the data and waveform are displayed and stored.

[0060] During dynamic testing, each IGBT in the full-bridge circuit needs to be tested separately, so the connection relationship of the system needs to be automatically switched. The present invention uses K1-K10 to switch the connection relationship, wherein K1 and K2 are used to switch the L1 load inductor to the P or N end of the input bus, K3 and K4 are used to switch the common end line to the P or N end of the input bus when testing short circuit, and K7, K8, K9, and K10 are used to switch U, V, W, and B to the middle common end. By opening some switches of K1-K10, one of the IGBTs in G1-G6 can be determined as the test object, and the test circuit required for testing the dynamic characteristics or short-circuit characteristics of the IGBT can be achieved. The specific opening combinations are shown in Tables 1 and 2.

[0061] Table 1 Dynamic test opening relay table

[0062] Serial number Test subjects Activate 1 G1 K2,K7,K6 2 G2 K1,K7,K5 3 G3 K2,K8,K6 4 G4 K1,K8,K5 5 G5 K2,K9,K6 6 G6 K1,K9,K5 7 G7 K1,K10,K5

[0063] Table 2 Short circuit test opening relay table

[0064] Serial number Test subjects Activate 1 G1 K4,K7,K6 2 G2 K3,K7,K5 3 G3 K4,K8,K6 4 G4 K3,K8,K5 5 G5 K4,K9,K6 6 G6 K3,K9,K5 7 G7 K3,K10,K5

[0065] Power circuits such as Figure 6 As shown, the 7 IGBTs are G1 to G7 ( Fig.11 As shown), C1 is the storage capacitor, L1 is the load inductor, P, N, U, V, W, B are Fig.11There are 6 power terminals of the product under test, K1-K10 are 10 relays for controlling the circuit connection mode, and the control relationship is shown in Table 1 and Table 2. The film capacitor C1 is used to store energy to provide transient large current, the high-voltage relay is used to switch the power module connection mode, and the inductor L1 is used to realize the inductive load required for the double pulse test. The short-circuit state required for the short-circuit test is realized through K3 and K4.

[0066] Fig.16 This is a schematic diagram of the turn-on current when testing the U-phase upper bridge. By opening K2 and K7, the current rushes from P to the upper bridge IGBT chip of G1 to L1 and K2 to N to realize a path. K6 is used to connect the positive terminal of the oscilloscope probe to test the voltage V at both ends of the IGBT. CE .

[0067] According to the parameters obtained, such as Figure 3 As shown, according to Fig.13 In a, b, and c, the oscilloscope reads the four-channel time domain waveform data. Channel 1 is the IGBT current, Channel 2 is the IGBT CE terminal voltage, Channel 3 is the PWM control signal input, and Channel 4 is the Fo signal. Figure 4 Get t1~t 10 The value of, t1 is the corresponding moment of VCIN falling; t2 is the corresponding moment of I rising to 10% Ic; t3 is the corresponding moment of I rising to 90% Ic; t4 is the corresponding moment of V falling to 10% VCE; t5 is the corresponding moment of VCIN rising; t6 is the corresponding moment of V rising to 10% VCE; t7 is the corresponding moment of I falling to 90% Ic; t8 is the corresponding moment of I falling to 10% Ic; t9 is the corresponding moment of I rising to Ic; t 10 is the moment when I drops to the position of Ic.

[0068] Then calculate:

[0069] t d(on) =t2-t1

[0070] t on =t3-t1

[0071] tr=t3-t2

[0072] t c(on) =t4-t2

[0073] t d(off) =t7-t5

[0074] t c(off) =t8-t6

[0075] t off =t8-t5

[0076] t f =t8-t7

[0077] t rr =t 10 -t9

[0078] I rr =I rmax -Ic

[0079] Among them, t d(on) is the opening delay time, t on is the turn-on time, tr is the current rise time, t c(on) is the opening crossover time, t d(off) is the turn-off delay time, t c(off) is the turn-off crossover time, t off is the turn-off time, t f is the current fall time, t rr is the reverse recovery time, I rr is the reverse recovery current; E off is the turn-off loss, I is the current of IGBT, V is the CE terminal voltage of IGBT; E on For the opening loss. Figure 5 t in off(SC) Is the short-circuit protection delay time, which starts from the Is overcurrent protection point until the current starts to decrease. SC It is the short-circuit protection current, and this value is the maximum value of the current.

[0080] Calculate the turn-off loss, I is the current of the IGBT, and V is the CE terminal voltage of the IGBT:

[0081]

[0082] Calculate the turn-on loss:

[0083]

[0084] The host computer is used to input the product information of the intelligent power module under test and display the parameter data obtained by dynamic test and short circuit test, such as Figure 3 , 12 shown. Fig.12 The right side is the parameter calculation result and test process display area, the top is the parameter setting and function input area, and the middle diagrams are the oscilloscope data reading area, bus voltage monitoring area, IC*VC area and energy integral calculation area. Fig.13 As shown, channel 1 is I current, channel 2 is V voltage, channel 3 is the signal generator voltage signal, and channel 4 is FO output. The short circuit test diagram is as follows Fig.14 As shown, the relationship between each channel and Fig.13 The intelligent power module under test used in this embodiment is as follows Fig.11 As shown, it includes 6 inverter channels and one brake module, realizing the switch control and short-circuit protection of IGBT.

[0085] like Fig.15 As shown, the test equipment includes a high-voltage power supply, a low-voltage power supply, a signal generator, a 34980 data acquisition device and an oscilloscope. The high-voltage power supply is connected to the capacitor C1 ( Figure 6 ) for charging. Since the system needs to provide a maximum current of 3000A in transient state, a storage capacitor is required for energy storage. The low voltage power supply is provided to Figure 1 The 24V low-voltage power supply for the drive circuit in the power supply is converted into 4 15V by DCDC to power the IPM and relays K1-K10 ( Figure 6 ) controls the supply of 24V DC power and operates the related relays according to the program requirements. The oscilloscope is used to collect the current signal (channel 1), voltage signal (channel 2), PWM control voltage signal (channel 3) and FO alarm signal (channel 4) of the IGBT. After the control module collects the data, it is transmitted to the computer for solution to obtain the parameters that need to be collected.

[0086] like Fig.15 As shown, the host computer software sends instructions to the signal generator through the control interface. The signal generator is used to generate a control signal. The control signal is received Fig. 9 The PWM_IN terminal of the driving circuit is then connected to the control terminal of the product after being isolated by the driving circuit, so that the IGBT is turned on and off according to the signal sequence of the signal generator. When the signal is high, the IGBT is turned on, and when the signal is low, the IGBT is turned off. Figure 8 The 3-channel waveforms in the figure are waveforms generated by the signal generator. The signal generator generates control signals to control the intelligent power module under test. The control circuit board provides four isolated 15V power supplies for the intelligent power module under test. The signal generator, optocoupler and data acquisition device are used to generate and send 7-channel control PWM signals. The signal generator is used to generate a dual-pulse control signal, which uses optocoupler isolation to isolate the drive signal PWM. At the same time, the FO alarm signal is also isolated by optocoupler. Fig. 9 As shown, the PWM_IN signal generated by the signal generator is isolated and transmitted to PWM_OUT through the optical coupler to provide a control signal to the IPM. The FO signal FO_IN generated by the IPM is isolated and transmitted to FO_OUT through the optical coupler. The host computer software sends a control command to 34980, and the relays K1-K10 are turned on and off by the control of the 34980 data logger, as shown in Fig.10As shown, the control point RLY is connected to 34980, JDQF is connected to the switch control end coil of the relay. When RLY is connected to the ground, there is voltage in the relay coil and the relay is turned on. Fig.10 The control signal input part in the circuit, when the signal is high, the relay is turned on, when RLY is low, the relay is turned off, the high and low of RLY are controlled by 34980, and the control source of 34980 is the host computer software. Since a single test only needs to send one signal to the control port of one IPM, the control signal generated by the signal generator is sent to the channel to be controlled through the relay switching function in the 34908 data collector, and other channels are off by default. Figure 8 The blue signal in the middle is the control signal waveform.

[0087] A relay anti-shoot-through protection circuit is designed, such as Figure 7 As shown, when RLY1, RLY3, and RLY5 are high, the control terminals of RLY2, RLY4, and RLY6 are automatically pulled down by default through MOSG2, MOSG4, and MOSG6 to prevent K2, K4, and K6 from being turned on when K1, K3, and K5 are turned on, and vice versa. Since the relay groups are connected in series on the high-voltage busbar in pairs, in order to prevent the relays from being directly connected in series due to interference signals or misoperation, this circuit is designed to prevent the relays from being misconnected. The basic principle is that when the relays of the upper bridge or the lower bridge are turned on, the circuit automatically blocks the drive signal of the lower bridge, making it unable to be turned on, and the risk of direct connection after misoperation is prevented through the hardware circuit.

[0088] According to the opening status of Table 1 and Table 2, dynamic test and short circuit test of G1~G7 can be performed respectively. Dynamic test G1 Fig.16 As shown, the short circuit test of G1 is as follows Fig.17 shown.

[0089] The above-described embodiments are only preferred specific implementations of the present invention. Common changes and substitutions made by those skilled in the art within the scope of the technical solution of the present invention should be included in the protection scope of the present invention.

Claims

1. A system for performing dynamic and short-circuit testing on an intelligent power module, characterized in that: Including control module, drive circuit and power circuit; The control module generates a control instruction according to the product information and test items of the intelligent power module under test and sends it to the power circuit. After receiving the completion mark signal of the power circuit, the control module generates a control signal and sends it to the drive module. The control module calculates multiple parameters required for the test items according to the received waveform data. The test items include dynamic test and short circuit test. The driving circuit is used to isolate the control module and the intelligent power module under test; the control signal is used as a PWM control voltage signal input to the driving circuit, and is output to the intelligent power module under test after isolation processing, and the intelligent power module under test turns on or off the IGBT according to the timing; The power circuit connects the IGBTs of the intelligent power module under test, connects the test channels of the corresponding IGBTs according to the received control instructions, sends a completion flag signal to the control module after the connection action is completed, collects the waveform data of the IGBT current and CE terminal voltage during the test and sends them to the control module.

2. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 1, characterized in that: The power module includes a data collector, a capacitor C1, an inductor L1, a power supply, and an oscilloscope; The power supply charges the capacitor C1 by connecting the busbars P and N. The capacitor C1 stores energy and provides transient current. The inductor L1 provides an inductive load. The data collector includes a plurality of relays, and the on and off of the test channels connected to each IGBT are controlled respectively by the combination of the plurality of relays; The data acquisition device receives the control instruction, and according to the control instruction requirement, implements the IGBT connection required by the instruction by switching the relay, performs dynamic test or short-circuit test, and obtains the waveform data of the current and CE terminal voltage of the IGBT when connected through the oscilloscope and sends it to the control module.

3. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 2, characterized in that: When performing dynamic testing on the intelligent power module under test, the control module calculates multiple parameters based on the received waveform data. The calculation method is: According to the received IGBT current waveform data, the current rises to 10% I c The position corresponds to the time t2, and the current rises to 90% I c The position corresponds to the time t3, and the current drops to 90% I c The position corresponds to time t7, and the current drops to 10% I c The position corresponds to the time t8, and the current rises to I c The position corresponds to time t9, and the current drops to I c The position corresponding to the time t 10 ; Among them, I c is the rated current of IGBT; According to the waveform data of the CE terminal voltage of the IGBT received, the voltage drops to 10% V CE The position corresponds to time t4, and the voltage rises to 10% V CE The position corresponds to time t6; where V CE is the rated current of CE terminal of IGBT; According to the waveform data of the received PWM control signal voltage, the voltage drop position corresponding to the time t1 and the voltage rise position corresponding to the time t5 are obtained respectively; The calculation results are: t d(on) =t2-t1 t on =t3-t1 tr=t3-t2 t c(on) =t4-t2 t d(off) =t7-t5 <h2 style=";text-align:left;direction:ltr">t<h2 style=";text-align:left;direction:ltr"> c(off) <h2 style=";text-align:left;direction:ltr"> =t8-t6 t off =t8-t5 t f =t8-t7 t rr =t 10 -t9 I rr =I rmax -Ic Among them, t d(on) is the opening delay time, t on is the turn-on time, tr is the current rise time, t c(on) is the opening crossover time, t d(off) is the turn-off delay time, t c(off) is the turn-off crossover time, t off is the turn-off time, t f is the current fall time, t rr is the reverse recovery time, I rr is the reverse recovery current; E off is the turn-off loss, I is the current of IGBT, V is the CE terminal voltage of IGBT; E on For the opening loss.

4. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 2, characterized in that: When performing a short-circuit test on the intelligent power module under test, the control module calculates multiple parameters based on the received waveform data. The calculation method is: According to the received IGBT current waveform data, the time from the overcurrent protection point to the start of the current drop is obtained as the short-circuit protection delay time t off(SC) ; Get the maximum current value as the short-circuit protection current.

5. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 2, characterized in that: The data logger is equipped with ten relays K1 to K10; among them, relay K1 and relay K2 are used to switch the inductor L1 to the P or N end of the input bus, relay K3 and relay K4 are used to switch the common end line to the P or N end of the input bus when testing short circuit, and relay K7, relay K8, relay K9 and relay K10 are used to switch U, V, W, and B to the middle common end respectively.

6. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 5, characterized in that: The point where the control signal is connected to the data logger is the RLY point. When the RLY point is connected to the ground, there is voltage in the relay coil and the relay is turned on. When the control signal is high, the relay is turned on, and when the RLY point is low, the relay is turned off.

7. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 2, characterized in that: The busbar is used for connection between capacitor C1 and the intelligent power module under test, and the interface of the busbar is connected to the PN level of the intelligent power module under test.

8. A system for performing dynamic and short-circuit testing on an intelligent power module according to claim 1, characterized in that: The PWM control signal is generated and sent through the signal generator and the optical coupler; the signal generator is used to generate a double-pulse PWM control signal, and the double-pulse PWM control signal is isolated and transmitted to the intelligent power module under test through the optical coupler.

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