Device and method for measuring photothermal effect of two-dimensional material

Abstract

The invention discloses a device and method for measuring the photothermal effect of a two-dimensional material, and the device comprises an optical bread board, the optical bread board is provided with a light heating module, an electric heating module and a measurement module, the measurement module is provided with a to-be-measured material, and is used for supporting the to-be-measured material and obtaining the temperature of the to-be-measured material; the electric heating module is used for heating a to-be-tested material and obtaining the temperature in the heating process; the light heating module is used for illuminating a to-be-tested material and acquiring light power during illumination; the measurement principle advantage of the measurement device is remarkable, the Newton's cooling law is used as the core calculation principle, a physical model for calculating the photothermal conversion efficiency is simplified, the measurement device can calculate the photothermal effect of the two-dimensional material more visually and accurately, the measurement cost can be effectively reduced, and the measurement operation can be simplified.

Description

Technical Field

[0001] The present invention belongs to the technical field of photothermal effect, and in particular relates to a device and method for measuring the photothermal effect of a two-dimensional material. Background Art

[0002] In the context of the rapid development of modern science and technology, two-dimensional materials have become a research hotspot due to their unique physical properties and broad application prospects. These materials have the characteristics of ultra-thin layered structures, which provide opportunities for exploring new physical phenomena and developing high-performance devices. For example, in the field of photothermal conversion, some two-dimensional materials have attracted much attention due to their ultra-high light absorption capacity and excellent photothermal conversion efficiency. Their ultra-thin structure helps to efficiently absorb light energy and convert it into heat energy, showing great application prospects in photothermal conversion, energy storage, solar energy utilization, etc., and also provides possibilities for application in many fields such as thermal management, sensors, and electronic devices.

[0003] The photothermal effect refers to the property of a material to generate heat under sunlight or laser irradiation, and has great development potential and application prospects. Researchers have conducted extensive and in-depth research and exploration in many fields such as energy utilization, biomedicine, catalytic conversion, and smart devices, and have realized the application of this effect in the fields of photothermal desalination, photothermal therapy, photothermal catalysis, and photothermal smart materials. Existing photothermal materials can be divided into three photothermal mechanisms based on the interaction mechanism between light and matter and different heat generation mechanisms, namely plasma local heating, non-radiative relaxation, and thermal vibration of molecules. These mechanisms provide a theoretical basis for the application of two-dimensional materials in the field of photothermal.

[0004] Traditional methods for measuring photothermal conversion efficiency include battery measurement, spectral measurement, thermal measurement, etc., but all have certain problems. a. The battery measurement method mainly measures the efficiency of the integrated system, rather than the photothermal conversion efficiency of the material itself, because the battery itself will have energy loss. b. The spectral measurement method uses equipment such as a spectrometer to measure the light absorption, reflection and transmission characteristics of the material at different wavelengths to calculate the photothermal conversion efficiency, but the measuring instrument itself is expensive, the measurement cost is high, and the operation technology is relatively complex, which is not suitable for promotion and application. c. The thermal test method evaluates the photothermal conversion efficiency by measuring the energy consumed by illumination and the energy required for the material to heat up, but the experimental operation is complicated, it is difficult to accurately control the variables, and the experimental error is large.

[0005] Therefore, the present application provides a device and method for measuring the photothermal effect of two-dimensional materials, which are used to reduce measurement costs and simplify measurement operations. Summary of the invention

[0006] The present invention provides a device and method for measuring the photothermal effect of two-dimensional materials, aiming to solve the problems pointed out in the above background technology.

[0007] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0008] A device for measuring the photothermal effect of a two-dimensional material, comprising: an optical breadboard, on which a light heating module, an electric heating module and a measuring module are arranged:

[0009] The measuring module is provided with a material to be measured, and is used to support the material to be measured and obtain the temperature of the material to be measured;

[0010] The electric heating module is used to heat the material to be tested and obtain the electric power during the heating process;

[0011] The optical heating module is used to illuminate the material to be tested and obtain the light power during the illumination.

[0012] Furthermore, the optical heating module includes: a light source, a semi-reflective and semi-mirror lens, an optical power meter, and a plurality of spot adjustment lenses;

[0013] The light source is used to emit light with adjustable power;

[0014] The half-reflecting half-mirror is used to receive the light emitted by the light source and convert it into a transmitted light and a reflected light;

[0015] The optical power meter is used to measure the optical power of the transmitted light and the reflected light;

[0016] One of the transmitted light and the reflected light is irradiated on the material to be tested, and the other is irradiated on the optical power meter, so that the optical power meter obtains the power of the corresponding light.

[0017] Furthermore, a plurality of light spot adjustment lenses are arranged on the paths of the transmitted light and the reflected light, and the light spot adjustment lenses are used to adjust the size of the light spots formed by the transmitted light and the reflected light on the optical power meter or the material to be measured.

[0018] Furthermore, the measuring module includes: a material support frame and an infrared imager, a placement hole is provided in the middle of the material support frame, the placement hole is used to place the material to be measured, and the infrared imager is arranged on the side of the material support frame away from the light source, and the infrared imager is used to obtain the temperature of the material to be measured.

[0019] Furthermore, the electric heating module includes: a heating plate support frame and a ceramic electric heating plate, the heating plate support frame is arranged on the side of the material support frame away from the infrared imager, and the heating plate support frame is provided with an installation groove for installing the ceramic electric heating plate, and the installation groove enables the ceramic electric heating plate to abut against the material to be tested.

[0020] Furthermore, a power supply is provided on the optical breadboard, and the power supply is used to supply power to the light source, the optical power meter, the infrared imager and the ceramic electric heater, and to provide a power-adjustable current to the ceramic electric heater.

[0021] Furthermore, the optical breadboard is placed in an optical dark box, an upper cover is provided on the upper part of the optical dark box, and a handle is provided on the upper cover.

[0022] The present invention also provides a method for measuring the photothermal effect of a two-dimensional material, the method using the device for measuring the photothermal effect of a two-dimensional material as described above, and the method comprising the following steps:

[0023] Step 1: Use the ceramic electric heating sheet in the electric heating module to heat the material to be tested. Under different electric power settings, wait for the temperature of the material to be tested to reach a stable state, read and record the average temperature of the material to be tested under the electric power, and calculate the temperature difference between the average temperature and the ambient temperature. The electric power is recorded as P E , the temperature difference is recorded as ΔT;

[0024] Step 2: Fit the measured data through a straight line to obtain P E =kΔT, k is the proportionality coefficient;

[0025] Step 3: Calculate the area coefficient λ of the ceramic electric heating plate; the area coefficient is the ratio of the contact area of ​​the heating plate to the total area, that is,

[0026] Step 4: Obtain the heat dissipation coefficient H of the material to be tested;

[0027] The calculation formula is:

[0028] Step 5: Use the optical heating module to measure the power of the transmitted light and the reflected light at different optical powers, where the power of the transmitted light is recorded as I and the power of the reflected light is recorded as P L ; Fit the transmitted light power and reflected light power data through a straight line to obtain Where, μ is the transmittance-reflectance ratio coefficient;

[0029] Step 6: Measure the temperature of the material under test at different transmitted light powers. The transmitted light power is converted from the reflected light power, I = μP L , calculate the temperature difference ΔT between the material to be tested and the ambient temperature;

[0030] Step 7: Calculate the photothermal conversion efficiency η of the material to be tested. The calculation formula is: Wherein, A is the absorptivity of the material to be tested to light of different wavelengths, which is obtained by referring to the relevant information of the material to be tested.

[0031] Compared with the prior art, the present invention has the following technical effects:

[0032] 1. The device for measuring the photothermal effect of two-dimensional materials described in the present invention has abandoned redundant measuring elements in design, achieved lightweight and high efficiency of the device, and reduced manufacturing costs. At the same time, the repeatability and stability of the device are significantly improved. For example, the optical dark box provides a closed experimental environment to isolate external light and air flow interference; the material support frame firmly supports the material to be tested to prevent displacement and deformation during heating, etc., providing a reliable experimental platform for the accurate measurement of the photothermal effect and other thermal property parameters of two-dimensional materials, reducing experimental costs and time.

[0033] 2. The device for measuring the photothermal effect of two-dimensional materials described in the present invention integrates electric heating and optical heating modules, making the experimental operation simpler and faster. The construction and use of the experimental device do not require complicated steps, which is convenient for scientific researchers and students to conduct experimental teaching and research.

[0034] 3. The device for measuring the photothermal effect of two-dimensional materials described in the present invention can not only observe the photothermal effect of two-dimensional materials and accurately measure the photothermal conversion efficiency, but is also suitable for studying and measuring thermal properties data such as thermal conductivity and specific heat capacity of the materials. It has multifunctional uses and can be applied to the teaching and research of various aspects of the characteristics of two-dimensional materials.

[0035] 4. The measurement principle of the method for measuring the photothermal effect of a two-dimensional material described in the present invention has significant advantages. The present invention uses Newton's cooling law as the core calculation principle and simplifies the physical model for calculating the photothermal conversion efficiency. Traditional measurement methods such as battery measurement method, spectral measurement method and thermal measurement method have many shortcomings. The battery measurement method mainly measures the efficiency of the integrated system rather than the efficiency of the material itself; the spectral measurement method has expensive instruments and complex operations; the thermal measurement method has complex experimental operations and large errors. The principle of the present invention makes the calculation more intuitive and accurate, effectively overcomes the defects of traditional methods, and can effectively reduce measurement costs and simplify measurement operations. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a schematic diagram of the interior of a device for measuring the photothermal effect of a two-dimensional material according to the present invention;

[0037] Figure 2 It is a schematic diagram of the optical path of a device for measuring the photothermal effect of a two-dimensional material according to the present invention;

[0038] Figure 3 This is a schematic diagram of an optical dark box arrangement of a device for measuring the photothermal effect of a two-dimensional material according to the present invention;

[0039] Figure 4 It is an external schematic diagram of a device for measuring the photothermal effect of two-dimensional materials described in the present invention.

[0040] In the figure: 1. light source; 2. half-reflective half-mirror; 3. spot adjustment lens; 4. optical power meter; 5. material support frame; 6. material to be tested; 7. infrared imager; 8. heating plate support frame; 9. ceramic electric heating plate; 10. power supply; 11. optical breadboard; 12. optical dark box; 13. upper cover; 14. handle. DETAILED DESCRIPTION

[0041] In order to make the objectives, technical solutions and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in combination with specific embodiments of the present application and with reference to the accompanying drawings.

[0042] like Figure 1 As shown, a device for measuring the photothermal effect of a two-dimensional material includes: an optical breadboard 11, on which a light heating module, an electric heating module and a measuring module are arranged:

[0043] The measuring module is provided with a material to be measured 6, which is used to support the material to be measured 6 and obtain the temperature of the material to be measured 6;

[0044] The electric heating module is used to heat the material to be tested 6 and obtain the electric power during the heating process;

[0045] The optical heating module is used to illuminate the material 6 to be tested and obtain the light power during illumination.

[0046] like Figure 1-2 As shown, the optical heating module includes: a light source 1, a semi-reflective and semi-mirror 2, an optical power meter 4 and a plurality of light spot adjustment lenses 3;

[0047] The light source 1 is used to emit light with adjustable power;

[0048] The semi-reflective and semi-mirror lens 2 is used to receive the light emitted by the light source 1 and convert it into a transmitted light and a reflected light;

[0049] The optical power meter 4 is used to measure the optical power of the transmitted light and the reflected light;

[0050] One of the transmitted light and the reflected light is irradiated on the material to be tested 6, and the other is irradiated on the optical power meter 4, so that the optical power meter 4 obtains the power of the corresponding light;

[0051] For the same half-reflective half-mirror 2, the transmitted light power, the reflected light power and the light power emitted by the light source 1 are linearly changed, so there is a certain proportional relationship between the transmitted light power and the reflected light power. Therefore, by first measuring several groups of data on the transmitted light power and the reflected light power under the same light illumination power, the proportional relationship between the two can be obtained; therefore, when a ray of light directly shines on the material to be tested 6 and its power cannot be directly measured, the power can be converted from another ray of light; the above-mentioned setting can simply obtain the light illumination power on the material to be tested 6, reduces the requirements for hardware equipment, thereby reducing the measurement cost, and is simple to operate and intuitive to calculate, which can effectively overcome the defects of traditional measurement methods.

[0052] like Figure 1-2 As shown, a plurality of spot adjustment lenses 3 are arranged on the paths of the transmitted light and the reflected light, and the spot adjustment lenses 3 are used to adjust the size of the spots formed by the transmitted light and the reflected light on the optical power meter 4 or the material to be measured 6.

[0053] like Figure 1-2 As shown, the measuring module includes: a material support frame 5 and an infrared imager 7. A placement hole is provided in the middle of the material support frame 5, and the placement hole is used to place the material to be measured 6. The infrared imager 7 is arranged on a side of the material support frame 5 away from the light source 1, and the infrared imager 7 is used to obtain the temperature of the material to be measured 6.

[0054] like Figure 1-2 As shown, the electric heating module includes: a heating plate support frame 8 and a ceramic electric heating plate 9. The heating plate support frame 8 is arranged on the side of the material support frame 5 away from the infrared imager 7. The heating plate support frame 8 is provided with a mounting groove for mounting the ceramic electric heating plate 9. The mounting groove allows the ceramic electric heating plate 9 to abut against the material to be tested 6.

[0055] like Figure 1-2 As shown, a power supply 10 is provided on the optical breadboard 11, and the power supply 10 is used to supply power to the light source 1, the optical power meter 4, the infrared imager 7 and the ceramic electric heater 9, and provide the ceramic electric heater 9 with a power-adjustable current.

[0056] In a specific embodiment, each component on the optical breadboard 11 is connected to the optical breadboard 11 via a threaded telescopic rod, which facilitates the disassembly of each component or adjustment of the component height, and facilitates the adjustment or replacement of the components on the optical breadboard 11.

[0057] like Figure 3-4 As shown, the optical breadboard 11 is placed in an optical dark box 12 , an upper cover 13 is provided on the upper portion of the optical dark box 12 , and a handle 14 is provided on the upper cover 13 .

[0058] The present invention also provides a method for measuring the photothermal effect of a two-dimensional material, which uses the above-mentioned measuring device and specifically comprises the following steps:

[0059] Step 1: Use the ceramic electric heating plate 9 in the electric heating module to heat the material 6 to be tested. Under different electric power settings, wait for the temperature of the material to be tested to reach a stable state, read and record the average temperature of the material under the electric power, and calculate the temperature difference between the average temperature and the ambient temperature, where the electric power is recorded as P E , the temperature difference is recorded as ΔT;

[0060] Step 2: Fit the measured data through a straight line to obtain P E =kΔT, k is the proportionality coefficient;

[0061] Step 3: Calculate the area coefficient λ of the ceramic electric heating plate 9;

[0062] Since the ceramic heating plate dissipates heat in all directions, in order to better describe the actual heating power, we need to introduce the concept of "area coefficient". Since the material to be tested 6 is closely attached to a very thin resistor, such as the ceramic electric heating plate 9, during the electric heating measurement, the influence of thermal radiation from the side of the resistor is ignored, and the amount of heat absorbed by the material is proportional to the total heat, and the ratio is equal to the ratio of the contact area of ​​the heating plate to the total area, that is,

[0063] Step 4: Obtain the heat dissipation coefficient H of the material to be tested 6;

[0064] The calculation formula is:

[0065] Step 5: Use the optical heating module to measure the power of the transmitted light and the reflected light at different optical powers, where the power of the transmitted light is recorded as I and the power of the reflected light is recorded as P L ; Since the power of a ray of light cannot be directly measured by the optical power meter 4 during the illumination process of the material to be tested, the transmittance-reflectance ratio coefficient μ is introduced; By fitting the transmitted light power and reflected light power data through a straight line, the transmittance-reflectance ratio coefficient μ can be obtained;

[0066] Step 6: Measure the temperature of the material 6 under different transmitted light powers. The transmitted light power can be converted from the reflected light power, I = μP L , calculate the temperature difference ΔT between the temperature of the material to be tested 6 and the ambient temperature;

[0067] Step 7: Calculate the light-to-heat conversion efficiency η of the material 6 to be tested, using the following formula: Wherein, A is the absorptivity of the material 6 to be tested to light of different wavelengths, which can be obtained by referring to the relevant information of the material 6 to be tested.

[0068] In a specific embodiment, the light source 1 adopts an 808nm laser system to provide a stable and tunable 808nm wavelength laser output, which serves as a precisely controllable light source in the experiment to realize the optical heating process of the material.

[0069] Half-reflecting and half-transmitting mirror: By partially reflecting and transmitting the laser beam, the optical path layout is adjusted to ensure that the laser energy is transmitted to the target area along the predetermined path;

[0070] The light plate adjustment lens 3 uses a convex lens to focus the laser beam to a tiny focus, significantly improving the local energy density and achieving efficient light-to-heat conversion and local heating;

[0071] The optical power meter 4 uses a laser power meter to accurately measure and monitor the light power to ensure the accuracy of the experimental conditions;

[0072] The present invention uses the principle of current passing through a resistor to generate heat to directly contact the material 6 to be tested. Compared with light heating, the electric heating module has the advantage of simpler and more accurate power measurement. In the experiment, the electric heating module provides a stable and controllable heat source for the experiment, thereby calculating the heat dissipation coefficient of the material 6 to be tested. The present invention uses an infrared imager 7 to measure the temperature distribution of the target surface in a non-contact manner, generate a high-definition thermal image, and provide intuitive and accurate temperature data for the experiment.

[0073] The above is only a preferred embodiment of the present invention. It should be pointed out that a person skilled in the art can make several modifications and improvements without departing from the inventive concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. A device for measuring the photothermal effect of two-dimensional materials, characterized in that: include: An optical breadboard (11), wherein the optical breadboard (11) is provided with a light heating module, an electric heating module and a measuring module: The measuring module is provided with a material to be measured (6), and is used to support the material to be measured (6) and obtain the temperature of the material to be measured (6); The electric heating module is used to heat the material to be tested (6) and obtain the electric power during the heating process; The optical heating module is used to illuminate the material to be tested (6) and obtain the light power during illumination.

2. The device for measuring the photothermal effect of a two-dimensional material according to claim 1, characterized in that: The optical heating module comprises: a light source (1), a semi-reflective and semi-mirror lens (2), an optical power meter (4) and a plurality of light spot adjustment lenses (3); The light source (1) is used to emit light with adjustable power; The semi-reflective and semi-mirror lens (2) is used to receive the light emitted by the light source (1) and convert it into a transmitted light and a reflected light; The optical power meter (4) is used to measure the optical power of the transmitted light and the reflected light; One of the transmitted light and the reflected light is irradiated onto the material to be tested (6), and the other is irradiated onto the optical power meter (4), so that the optical power meter (4) obtains the power of the corresponding light.

3. The device for measuring the photothermal effect of a two-dimensional material according to claim 2, characterized in that: A plurality of light spot adjustment lenses (3) are arranged on the paths of the transmitted light and the reflected light, and the light spot adjustment lenses (3) are used to adjust the size of the light spots formed by the transmitted light and the reflected light on the optical power meter (4) or the material to be measured (6).

4. The device for measuring the photothermal effect of a two-dimensional material according to claim 3, characterized in that: The measuring module comprises: a material support frame (5) and an infrared imager (7); a placement hole is provided in the middle of the material support frame (5) and is used to place the material to be measured (6); the infrared imager (7) is arranged on a side of the material support frame (5) away from the light source (1); and is used to obtain the temperature of the material to be measured (6).

5. The device for measuring the photothermal effect of a two-dimensional material according to claim 4, characterized in that: The electric heating module comprises: a heating plate support frame (8) and a ceramic electric heating plate (9); the heating plate support frame (8) is arranged on a side of the material support frame (5) away from the infrared imager (7); a mounting groove for mounting the ceramic electric heating plate (9) is arranged on the heating plate support frame (8); the mounting groove enables the ceramic electric heating plate (9) to abut against the material to be tested (6).

6. The device for measuring the photothermal effect of a two-dimensional material according to claim 5, characterized in that: The optical breadboard (11) is provided with a power supply (10), and the power supply (10) is used to supply power to the light source (1), the optical power meter (4), the infrared imager (7) and the ceramic electric heating plate (9), and to provide the ceramic electric heating plate (9) with a current with adjustable power.

7. The device for measuring the photothermal effect of a two-dimensional material according to claim 6, characterized in that: The optical breadboard (11) is placed in an optical dark box (12); an upper cover (13) is provided on the upper part of the optical dark box (12); and a handle (14) is provided on the upper cover (13).

8. A method for measuring the photothermal effect of a two-dimensional material, characterized in that: The measuring method uses the measuring device for the photothermal effect of a two-dimensional material as claimed in any one of claims 5 to 6, and the measuring method comprises the following steps: Step 1: Use the ceramic electric heating plate (9) in the electric heating module to heat the material to be tested (6). Under different electric power settings, wait for the temperature of the material to be tested to reach a stable state, read and record the average temperature of the material to be tested (6) under the electric power, and calculate the temperature difference between the average temperature and the ambient temperature, where the electric power is recorded as P E , the temperature difference is recorded as ΔT; Step 2: Fit the measured data through a straight line to obtain P E =kΔT, k is the proportionality coefficient; Step 3: Calculate the area coefficient λ of the ceramic electric heating plate 9; the area coefficient is the ratio of the contact area of ​​the heating plate to the total area, that is, Step 4: Obtain the heat dissipation coefficient H of the material to be tested 6; The calculation formula is: Step 5: Use the optical heating module to measure the power of the transmitted light and the reflected light at different optical powers, where the power of the transmitted light is recorded as I and the power of the reflected light is recorded as P L ; Fit the transmitted light power and reflected light power data through a straight line to obtain Where, μ is the transmittance-reflectance ratio coefficient; Step 6: Measure the temperature of the material to be tested (6) at different transmitted light powers. The transmitted light power is converted from the reflected light power, I = μP L , calculate the temperature difference ΔT between the temperature of the material to be tested (6) and the ambient temperature; Step 7: Calculate the light-to-heat conversion efficiency η of the material to be tested (6), the calculation formula is: Wherein, A is the absorptivity of the material to be tested (6) to light of different wavelengths, which is obtained by consulting relevant information of the material to be tested (6).

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