Time keeping module test system
By designing a punctual module test system, using multi-stage buffers and multiple switches to realize the multiple distribution and switching of 1PPS signals and communication signals, the problem of not being able to realize batch automatic testing of punctual modules in the prior art is solved, and production efficiency and capacity are improved.
Patent Information
- Application Number
- CN202411701564.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-26
- Publication Date
- 2025-02-25
AI Technical Summary
The prior art cannot realize batch automatic testing of punctual modules, resulting in inefficient production.
A punctual module testing system is designed, including GPS/Beidou antenna, timing module, 1PPS signal split module and communication split module. The multi-channel distribution of 1PPS signals and the multi-channel switching of communication signals are realized through multi-level buffers and multiple switches, supporting automatic testing of multi-channel punctual modules.
Large-scale automatic testing of punctual modules is realized, work efficiency and production capacity are improved, and batch testing needs are met.
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Figure CN119519876A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of testing of timekeeping modules, and in particular to a large-scale timekeeping module timekeeping performance testing system. Background Art
[0002] The timekeeping module is a module that uses its own timekeeping algorithm to maintain high-precision time and frequency output in the process of taming the loss of time source. In modern communications, navigation, power systems and other fields, high-precision time synchronization and timekeeping functions are crucial. During the production process, the timekeeping performance of the timekeeping module needs to be screened to meet the needs of customers. The current testing method can only test a single one. Each crystal oscillator needs to be connected to a GPS antenna and a timing module to provide it with a 1PPS signal. At the same time, it is connected to a computer through a serial port line to receive message information, and batch testing is not possible. Summary of the invention
[0003] The technical problem to be solved by the present invention is to provide a timekeeping module testing system to realize batch automatic testing of the timekeeping indicators of the timekeeping modules and improve production efficiency.
[0004] In order to achieve the above object, the technical solution adopted by the present invention is:
[0005] A timekeeping module testing system, comprising:
[0006] GPS / Beidou antenna, connected to the timing module, provides GPS / Beidou signal for the timing module;
[0007] The timing module connects the GPS / Beidou antenna and the 1PPS signal splitter module to analyze the GPS / Beidou signal and output the 1PPS signal.
[0008] 1PPS signal splitter module, connected to the timing module and the timekeeping module, including a multi-stage buffer, the buffer input end is connected to the 1PPS signal output of the timing module, the output end is connected to the timekeeping module or the next-stage buffer, the 1PPS signal is divided into multiple paths for the timekeeping module to use, the buffer expands the number of output paths through a one-to-many cascade, and the specific number of buffers is determined by the number of timekeeping modules to be tested;
[0009] The communication branch module is connected to the control module and the timing module, and is used for the control module and the multi-way timing module communication link selection. The number of branch paths can be expanded by cascading multi-way switches. The common end of the first-level multi-way switch is connected to the control module, and the independent end is connected to the timing module communication interface or the independent end of the next-level multi-way switch. The independent end of the final-level multi-way switch is connected to the timing module communication interface. The specific number of multi-way switches used is determined by the number of independent ends of the multi-way switch and the number of timing modules to be tested;
[0010] The control module includes at least one MCU, MUC connected to the computer and the communication branch module, and is used to control the communication branch module according to the control instructions of the computer to realize the communication between the computer and a certain timekeeping module;
[0011] The computer includes a test program for sending control instructions to the control module, and is used for receiving the operation of the operator, sending control instructions to the MCU according to the execution program, and receiving and storing message data.
[0012] Compared with the prior art, the present invention has the following advantages:
[0013] The test system of the present invention can complete the multi-channel distribution of 1PPS signals and the multi-channel switching of communication signals to meet the normal operation of the timing module and the communication between the multi-channel timing modules and the computer. Through the communication switching, the test data of the multi-channel timing modules are stored in the computer, and the large-scale automatic testing of the timing modules is realized, which improves the work efficiency and the production capacity. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 A schematic diagram of a timekeeping module testing system according to a first embodiment of the present invention;
[0015] Figure 2 This is a schematic diagram of a 1PPS signal splitting module according to a first embodiment of the present invention;
[0016] Figure 3 A schematic diagram of a communication branching module according to a first embodiment of the present invention;
[0017] Figure 4 This is a general block diagram of a timing module test system according to a second embodiment of the present invention;
[0018] Figure 5 This is a functional schematic diagram of a primary control backplane according to a second embodiment of the present invention;
[0019] Figure 6 This is a functional schematic diagram of a secondary control backplane according to a second embodiment of the present invention;
[0020] Figure 7 This is a functional schematic diagram of a test board according to a second embodiment of the present invention. DETAILED DESCRIPTION
[0021] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0022] The present invention is further described below in conjunction with embodiments, the purpose of which is only to better understand the content of the present invention. Therefore, the specific embodiments cited do not limit the protection scope of the present invention. In addition, the accompanying drawings only show parts related to the present invention rather than all structures.
[0023] First embodiment:
[0024] See also Figure 1 The timing module testing system of the present invention includes: a GPS / Beidou antenna, a timing module, a 1PPS signal branch module, a communication branch module, a control module, and a computer.
[0025] See also Figure 2 , 1PPS signal splitter module, including one primary buffer, n secondary buffers, and n N-level buffers;
[0026] See also Figure 3 , a communication branching module, including a primary multi-way switch, n secondary multi-way switches, and n N-level multi-way switches;
[0027] The operator loads n timing modules into the test system, operates the test software in the computer, sets test channels 1 to n, sets the test time, clicks to start the test, the test software sends a channel 1 instruction to the control module, the control module MCU executes the control instruction, controls the first-level multi-way switch, the second-level multi-way switch 1, and the N-level multi-way analog switch 1 of the communication branch module, connects the communication interface of the timing module 1 to the control module, the control module receives the timing module message data, and forwards it to the operating software in the computer, the operating software stores the message data in the computer, the test software sends the set channel instructions in turn, the control module turns on the timing modules to the timing module n in turn, the test software stores the message data of the timing modules in the computer in turn, and cyclically tests the timing modules 1 to n until the set test time terminates the test, the operator processes the message data through the test software, generates a selection file, and selects qualified products according to the qualified product selection data.
[0028] Second embodiment:
[0029] See also Figure 4 The timekeeping module test system of the present invention comprises: GPS / Beidou antenna, computer, test frame, switch power supply group, primary control backplane, secondary control backplane, and test board. One primary control backplane and multiple secondary control backplanes are installed on the test frame, and multiple test boards are placed. The primary control backplane is connected to the GPS / Beidou antenna through a coaxial line, and the primary control backplane and the secondary control backplane are connected to each other through a serial line and a coaxial line, and connected to the switch power supply group through a power line, and the primary backplane is connected to the computer through a serial line. The control computer sends control instructions to the control backplane and reads data.
[0030] See also Figure 5 The first-level control backplane includes a single-chip microcomputer, a serial communication unit, a serial forwarding unit, a timing module, a 1PPS forwarding unit, a power supply interface, and a multi-pin transmission interface socket;
[0031] See also Figure 6,The secondary control backplane includes a control microcontroller, a serial port forwarding unit, a 1PPS forwarding unit, a power supply interface, a timekeeping module power supply unit, and a multi-pin transmission interface socket;
[0032] See also Figure 7 ,The test board includes a timing module loading unit, a serial port switching unit, a 1PPS distribution unit, a timing module power supply unit, and a multi-pin transmission interface plug;
[0033] After the operator loads the timing module on the test board, the test board is placed on the slide slot of the test frame, slides inward, and inserts the multi-pin transmission interface plug of the test board into the multi-pin transmission interface socket of the control backplane. The switch power supply group is connected to the timing module power supply unit of the test board through the multi-pin transmission interface socket of the control backplane to power the timing module. The GPS antenna is connected to the first-level control backplane timing module to generate a 1PPS signal. The 1PPS input pin of the timing module is connected through the 1PPS forwarding unit and the 1PPS distribution unit to provide it with a 1PPS signal. Open the test software in the computer, check the test channel according to the unit for loading the timing module, select a new file, select a path, set the file name and create a new data storage table, set the start time, end time, and stabilization time, click the loop test, and after the stabilization time is up, the computer communicates with the serial port of the first-level control backplane through the serial port line. Unit, send test channel instruction, the serial communication unit converts the level and sends the instruction to the control microcontroller, the control microcontroller determines whether it is the channel of this layer, if not, it is sent down step by step through the serial forwarding unit until the control microcontroller determines it is the channel of this layer, and the serial port switching unit of the test board is controlled through the multi-pin transmission interface socket, the communication interface of the selected channel timing module is connected to the control microcontroller, the control microcontroller receives the message information sent by the selected channel timing module, and forwards it step by step through the serial forwarding unit after processing until it is forwarded to the first-level control backplane, and sent to the computer through the serial communication unit, the computer stores the message information in the data storage table, the test program turns on the selected channels in turn, stores the message information of the corresponding channel timing module until the end time, the test terminates, the operator processes the test data through the test software, generates a selection file, and selects qualified products according to the qualified product selection data.
[0034] The present invention is not limited to the above embodiments, but may include more other equivalent embodiments without departing from the concept of the present invention. The scope of the present invention is determined by the scope of the appended claims.
Claims
1. A timekeeping module testing system, characterized in that: include: GPS / Beidou antenna, timing module, 1PPS signal branch module, communication branch module, control module and computer. The GPS / Beidou antenna is connected to the timing module to provide GPS / Beidou signals for the timing module; The timing module has two ends connected to the GPS / Beidou antenna and the 1PPS signal splitter module, respectively, for analyzing the GPS / Beidou signal and outputting the 1PPS signal; The 1PPS signal splitter module has two ends connected to the timing module and the timekeeping module; It includes a multi-stage buffer, the buffer input end is connected to the 1PPS signal output end of the timing module, and the output end is connected to the timing module or the next-stage buffer, the 1PPS signal is divided into multiple channels for the timing module to use, and the buffer expands the number of output channels through a one-to-many cascade connection. The specific number of buffers is determined by the number of timing modules to be tested; The communication branch module is connected to the control module and the timing module, and is used for the control module and the multi-way timing module communication link selection. The number of branch paths can be expanded by cascading multi-way switches. The common end of the first-level multi-way switch is connected to the control module, and the independent end is connected to the timing module communication interface or the independent end of the next-level multi-way switch. The independent end of the final-level multi-way switch is connected to the timing module communication interface. The specific number of multi-way switches used is determined by the number of independent ends of the multi-way switch and the number of timing modules to be tested; The control module includes at least one MCU, MUC connected to the computer and the communication branch module, and is used to control the communication branch module according to the control instructions of the computer to realize the communication between the computer and a certain timekeeping module; The computer operation includes a test program for sending control instructions to the control module, receiving the operation of the operator, sending control instructions to the MCU according to the execution program, and receiving and storing message data.