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Method for testing storage unit having universal serial bus interface and storage unit

A technology for a universal serial bus and a storage device is applied in the field of testing storage devices with a universal serial bus interface and storage devices with a self-testing universal serial bus interface, and can solve problems such as time-consuming and long time.

Inactive Publication Date: 2004-09-01
ELAN MICROELECTRONICS CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Known storage devices with bulk flash memory, such as the storage device of Big Brother, its testing method is to send test data (test pattern) by the host computer, read and write the flash memory via the USB bus, write the test data into the flash memory, and then Reading the fast memory, comparing the test data and reading the data on the host computer, such a known method takes a long time to complete the test, especially the test of the storage device with a large storage capacity is more time-consuming

Method used

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  • Method for testing storage unit having universal serial bus interface and storage unit
  • Method for testing storage unit having universal serial bus interface and storage unit
  • Method for testing storage unit having universal serial bus interface and storage unit

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Embodiment Construction

[0023] figure 1 A block diagram of a memory device implemented in accordance with the principles of the invention is shown. Storage device 10 comprises: USB interface 103, is used for connecting host computer 12, or connects host computer 12 via USB hub 14 again; At least one semiconductor memory 105 that connects USB controller 101, is used as data storage, and the storage capacity of semiconductor memory 105 There is no limit, for example, it can be configured as 32MB, 64MB, 128MB... etc. according to actual needs, and the specific implementation example of semiconductor memory 105 can be fast memory; program code 107 and USB controller, wherein program code 107 is used to provide to the USB controller 101 to perform figure 2 The flow shown, whereby program code 107 is figure 2 The specific implementation of the flow shown, and the program code 107 can be implemented in the storage device 10 in the form of firmware. The host 12 can be a personal computer or a tool for t...

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Abstract

The invention is a method of testing USB interface storage device, where the storage device at least contains USB interface, a USB controller linked with the USB interface, at least a semiconductor memory linked with the USB controller and the method includes the steps: USB controller receives test command transmitted by host machine through the USB interface; after the USB controller has received the test command, the USB controller makes write and read operations on the semiconductor memory and compare if the write and read data are the same, thus testing if the semiconductor memory is good or not; after the write and read test, the USB controller transmits the data of test result to the host machine through the USB interface.

Description

technical field [0001] The invention relates to a test method for testing a storage device with a semiconductor memory and the storage device thereof, in particular to a test method for testing a storage device with a USB-Universal Serial Bus (USB-Universal Serial Bus) interface, and a self-test universal Storage device with serial bus interface. Background technique [0002] Known storage devices with bulk flash memory, such as the storage device of Big Brother, its testing method is to send test data (test pattern) by the host computer, read and write the flash memory via the USB bus, write the test data into the flash memory, and then The known method of reading the flash memory and comparing the test data with the read data on the host computer takes quite a long time to complete the test, especially the test of a storage device with a large storage capacity is more time-consuming. Contents of the invention [0003] The object of the present invention is to provide a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 邱延诚叶奇典邱文彬
Owner ELAN MICROELECTRONICS CORPORATION
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