Test management method, device, equipment and test system

Abstract

The test management method, device, equipment and test system provided in this embodiment are applied to the test management equipment. The test management method includes: obtaining the current test function of the device to be tested, and the tested time of the device to be tested corresponding to the current test function, and the communication connection between the device to be tested and the access point AP; obtaining the first time corresponding to the current test function; if the tested time is greater than or equal to the first time, disconnecting the device to be tested from the AP. This embodiment can automatically disconnect the device to be tested from the AP when the test of the device to be tested times out, further realizing the implementation management of a large number of APs and a large number of devices to be tested, without the need to manually disconnect the device to be tested from the AP, saving labor costs and improving the test efficiency of the device to be tested.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of network technology, and in particular to a test management method, device, equipment and test system. Background Art

[0002] Smart electronic products such as mobile phones, tablets and smart watches usually need to be connected to the Internet for functional testing after production. Due to the small size of current smart electronic products and the fact that the communication rate of WIFI (wireless) is already better than the communication speed of traditional data lines, the physical communication interfaces corresponding to smart electronic products are gradually being abandoned, so that smart electronic products can only be tested through the Internet through WIFI (wireless) technology. In order to conduct Internet testing on a large number of smart electronic products, multiple APs (access points) need to be provided, and each access point is connected to the Internet with multiple smart electronic products.

[0003] Various test problems may occur during the testing of smart electronic products. Currently, in order to troubleshoot these test problems, manpower is required to troubleshoot them one by one. Therefore, for a large number of APs and smart electronic products, it takes a lot of manpower to troubleshoot these test problems, and there are problems of missed inspections and / or mis-inspections, which in turn affects the test efficiency of smart electronic products. Summary of the invention

[0004] The embodiments of the present application provide a test management method, device, equipment and test system to overcome the problem that the prior art uses manpower to troubleshoot test problems, which affects the test efficiency of smart electronic products.

[0005] In a first aspect, an embodiment of the present application provides a test management method, which is applied to a test management device. The test management method includes: obtaining a current test function of the device to be tested, and a tested duration of the device to be tested corresponding to the current test function, wherein the device to be tested is communicatively connected to an access point AP; obtaining a first duration corresponding to the current test function; and disconnecting the device to be tested from the AP if the tested duration is greater than or equal to the first duration.

[0006] In an optional embodiment, disconnecting the device to be tested from the AP includes: adding the device to be tested to a blacklist within a second time period, where the second time period is a time period during which the device to be tested is prohibited from connecting to the AP.

[0007] In an optional embodiment, disconnecting the device under test from the AP includes: sending a target instruction to the device under test, where the target instruction is used to instruct the device under test to close the wireless connection.

[0008] In an optional embodiment, the test management method further includes: if it is detected that the AP cannot establish a communication connection with the device to be tested, adding the device to be tested to a blacklist.

[0009] In an optional embodiment, the test management method also includes: periodically obtaining the access rate of the AP; if the access rate is less than the rate threshold, outputting a first warning message, the first warning message is used to prompt that the AP has an access problem; and / or, periodically obtaining the access port of the AP, if the access port is different from the preset port, outputting a first warning message.

[0010] In an optional embodiment, the test management method further includes: obtaining communication parameters of the AP, the communication parameters including: channel identification, channel utilization, retransmission ratio, environmental noise and at least one of signal strength; if the communication parameters do not meet the preset requirements, outputting a second warning information, the second warning information is used to prompt the AP that there is communication interference.

[0011] In a second aspect, an embodiment of the present application provides a test management device, which is applied to a test management device. The test management device includes:

[0012] A first acquisition module is used to acquire a current test station of the device to be tested and a test time of the device to be tested at the current test station when the device to be tested is connected to the AP and the device to be tested is tested;

[0013] The second acquisition module is used to obtain the preset duration corresponding to the current test station;

[0014] The disconnection module is used to disconnect the device to be tested from the AP if the test duration is greater than a preset duration.

[0015] In a third aspect, an embodiment of the present application provides a test management device, comprising: a processor and a memory; the memory stores computer execution instructions; the processor executes the computer execution instructions stored in the memory, so that the processor executes a test management method as any one of the first aspect.

[0016] In a fourth aspect, an embodiment of the present application provides a test management system, comprising: at least one AP, at least one device to be tested, and a test management device; wherein the AP and at least one device to be tested are communicatively connected; the test management device is communicatively connected to at least one AP and at least one device to be tested respectively; the test management device is used to execute a test management method as described in any one of the first aspects.

[0017] In an optional embodiment, the test management system also includes: a central controller, which is respectively communicated with the test management device and at least one AP, and is used to receive communication parameters and load information sent by at least one AP, and send the communication parameters and load information to the test management device; the load information includes: the number of devices to be tested connected to the AP, the IP address and the corresponding tested time.

[0018] In a fifth aspect, an embodiment of the present application provides a test management device, including: a processor and a memory;

[0019] Memory stores computer-executable instructions;

[0020] The processor executes the computer-executable instructions stored in the memory, so that at least one processor executes the test management method of the first aspect as described above.

[0021] In a sixth aspect, an embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the test management method of the first aspect described above is implemented.

[0022] In a seventh aspect, an embodiment of the present application provides a computer program product on which a computer program is stored. When the computer program is executed by a processor, the electronic device executes the test management method of the first aspect as described above.

[0023] The test management method, device, equipment and test system provided in this embodiment are applied to the test management equipment. The test management method includes: obtaining the current test function of the device to be tested, and the tested time of the device to be tested corresponding to the current test function, and the communication connection between the device to be tested and the access point AP; obtaining the first time corresponding to the current test function; if the tested time is greater than or equal to the first time, disconnecting the device to be tested from the AP. This embodiment can automatically disconnect the device to be tested from the AP when the test of the device to be tested times out, further realizing the implementation management of a large number of APs and a large number of devices to be tested, without the need to manually disconnect the device to be tested from the AP, saving labor costs and improving the test efficiency of the device to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0025] Figure 1 An application scenario diagram of a test management method provided in an embodiment of the present application;

[0026] Figure 2 A flowchart of the steps of the test management method provided in the embodiment of the present application;

[0027] Figure 3 A schematic diagram of a test management system provided in an embodiment of the present application;

[0028] Figure 4 Interface of the test management method provided in the embodiment of the present application Figure 1 ;

[0029] Figure 5 Interface of the test management method provided in the embodiment of the present application Figure 2 ;

[0030] Figure 6 Interface of the test management method provided in the embodiment of the present application Figure 3 ;

[0031] Figure 7 Interface of the test management method provided in the embodiment of the present application Figure 4 ;

[0032] Figure 8 A structural block diagram of a test management device provided in an embodiment of the present application;

[0033] Fig. 9 A schematic diagram of the hardware structure of the test management device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0035] Reference Figure 1 , is an application scenario diagram of a test management method provided by this application, wherein, Figure 1 The application scenario includes: multiple access points AP 11 and multiple devices to be tested 12. One AP 11 is in communication connection with multiple devices to be tested 12, and is used to provide network support to the devices to be tested 12 when the devices to be tested 12 are under test.

[0036] Based on the above application scenarios, the current test management method is that when the device 12 to be tested communicates with the AP to test related functions, due to the large number of APs 11, various problems may occur during the test of the device 12 to be tested. For example, mutual interference between APs 11, too many devices 12 to be tested connected to the AP causing congestion of the AP 11, abnormalities in the access network cable and port of the AP 11 causing the access network rate, and further causing the test process of the device 12 to be tested to be unstable. Manual monitoring and management are currently used to address these problems, which has the problems of high cost and low efficiency.

[0037] Based on the above problems, the present application provides a test management method, which reduces the investment of manpower costs through automated management and improves the test efficiency of smart electronic products.

[0038] Reference Figure 2 The present application implements a flow chart of the steps of a test management method. The test management method is applied to a test management device and specifically includes the following steps:

[0039] S201, obtaining a current test function of the device to be tested and a test duration of the device to be tested corresponding to the current test function, and the device to be tested is connected to an access point AP for communication.

[0040] Reference Figure 3 , which is a test management system 30 provided by the present application, wherein the test management system 30 includes: a test management device 31, a plurality of devices to be tested 32, a plurality of access points AP 33, and at least one central controller 34.

[0041] The test management system 30 is arranged in a test site of the device to be tested 32, and the test site includes a plurality of test stations, such as Figure 3 A(1) to A(6) in the figure. Each test station is used to test a function of the device to be tested 32. For example, test station A(1) is used to test the audio function of the device to be tested, test station A(2) is used to test the radio frequency function of the device to be tested, and test station A(3) is used to test the image processing function of the device to be tested. At least one AP 33 is set in a test station to communicate with the device to be tested 32 in the test station and provide network support for the device to be tested 32 in the test station.

[0042] In addition, the central controller 34 is connected to each AP 33 for communication to obtain communication parameters and load information reported by each AP. The test management system 30 is connected to each AP 33, the device to be tested 32 and the central controller 34 for communication to obtain corresponding data.

[0043] The test management device 31 communicates with the AP 33 and the central controller 34 via SSH (Secure Shell) or Telnet (Remote Login Service Protocol). The test management device 31 communicates with the device to be tested 32 via Socket.

[0044] like Figure 3, the device to be tested 32 is at a test station, connected to the AP of the test station, and the corresponding function is tested. After the test at the test station is completed, it can reach the next test station by a conveyor belt or other means to connect to the AP of the next test station and test the next function. Exemplarily, the device to be tested 32 is connected to the AP of the test station A(1) at the test station A(1) to test the audio function. After the audio function test is completed, the device to be tested is transferred to the test station A(2), connected to the AP of the test station A(2) to test the radio frequency function.

[0045] In the embodiment of the present application, when the device to be tested is in communication connection with the corresponding AP, the IP address of the device to be tested is transmitted to the connected AP. The AP will time the connection time of the device to be tested, where the connection time is also the tested time of the current test function of the device to be tested at the test station corresponding to the AP. The AP then reports its own identification, tested time and corresponding IP address to the central processor AC.

[0046] Furthermore, the test management device provided in the present application can obtain the AP identification, tested time and IP address of the corresponding device to be tested from the central processor, and can also obtain the AP identification, tested time and IP address of the corresponding device to be tested from the AP.

[0047] In addition, since the AP corresponds to the test station, and the test station corresponds to the corresponding test function, the AP corresponds to the test function. Then the test management device can obtain the current test function of the corresponding device to be tested according to the identification of the AP.

[0048] In an optional embodiment, since the test management device is connected to the AP and the device to be tested, the device to be tested can detect the current test function of the corresponding test during the test, and then send the current test function to the test management device.

[0049] In another optional embodiment, one AP may also correspond to multiple test stations, each test station tests a different test function, and each test function corresponds to a different test time, then the first duration is the preset duration corresponding to the multiple test functions. Exemplarily, the test functions include: audio test, radio frequency test and automation test. These three test functions correspond to three test stations, corresponding to one AP. Among them, the audio test takes 30 seconds, the radio frequency test takes 60 seconds, and the automation test takes 120 seconds. Then the first duration can be set to 5 minutes, then the first durations corresponding to the audio test, radio frequency test and automation test are all 5 minutes. The first duration can also be the duration corresponding to the AP, then when the connection time between the device to be tested and the AP is greater than or equal to the first duration, the connection between the device to be tested and the AP can also be disconnected.

[0050] The test management device obtains the tested time of the device to be tested at a preset time interval, and the preset time may be 1 minute, 2 minutes, etc. The specific setting may be based on actual needs.

[0051] In the embodiment of the present application, the test management device can obtain the current test function and the tested time of the device to be tested in any manner, which is not limited here.

[0052] S202, obtaining a first duration corresponding to the current test function.

[0053] Among them, the first duration corresponding to each test function can be preset, and the corresponding relationship can be stored. Then, after the current test function is obtained, the corresponding first duration can be obtained according to the current test function. Exemplarily, the first duration of the preset test audio function is 10 minutes, and the first duration of the preset test radio frequency function is 15 minutes.

[0054] Specifically, the first duration is the sum of the preset test duration and the timeout duration. For example, if the audio function test usually takes 5 minutes to complete, the preset test duration is 5 minutes, and the timeout duration can be set to 5 minutes, then the corresponding first duration is 10 minutes.

[0055] In the embodiment of the present application, the first duration can be set according to the specific test function and specific requirements, and is not limited here.

[0056] S203: If the tested time is greater than or equal to the first time, disconnect the device to be tested from the AP.

[0057] If the tested time is greater than or equal to the first time, it means that the current test function of the device to be tested has been tested or a failure occurs during the test and the test cannot be performed, and the connection between the device to be tested and the AP is disconnected.

[0058] In an optional embodiment, disconnecting the device to be tested from the AP includes: the test management device sends a disconnection instruction to the AP, and the AP kicks the device to be tested offline after receiving the disconnection instruction.

[0059] In an optional embodiment, disconnecting the device to be tested from the AP includes: adding the device to be tested to a blacklist within a second time period, where the second time period is a time period during which the device to be tested is prohibited from connecting to the AP.

[0060] Among them, after the device under test is kicked offline, since the wireless network of the device under test is turned on, the device under test will continue to send network requests to the AP. Therefore, in order to prevent the device under test from connecting to the AP within the second time period, the device under test is added to the blacklist, and the device under test is prohibited from connecting to the AP within the second time period. In the embodiment of the present application, prohibiting the device under test from connecting to the AP means prohibiting the device under test from connecting to any AP.

[0061] Normally, within the first time period, the device under test can complete the test of the current test function, and then within the second time period, the device under test can enter the next test station to test the next test function. After the second time period, the device under test is removed from the blacklist, and the device under test can connect to the AP at the next test station to test the next test function.

[0062] In an optional embodiment, disconnecting the device under test from the AP includes: sending a target instruction to the device under test, where the target instruction is used to instruct the device under test to close the wireless connection.

[0063] Among them, after the device to be tested is kicked offline, since the wireless network of the device to be tested is turned on, the device to be tested will continue to send network requests to the AP. Therefore, since the test management device can establish a communication connection with the device to be tested, in order to prevent the device to be tested from connecting to the AP within the second time period, the test management device can send a target instruction to close the wireless connection to the device to be tested. When the second time period has passed, the test management device can send a first instruction to open the wireless connection to the device to be tested, so that the device to be tested can connect to the AP at the next test station after entering the next station to test the next test function.

[0064] Specifically, the test management device obtains the IP address of the device to be tested, further obtains the communication port number of the device to be tested, and sends the target instruction to the device to be tested through the communication port number.

[0065] The test management method provided in this embodiment includes: obtaining the current test function of the device to be tested, and the tested time corresponding to the current test function of the device to be tested, and the device to be tested is in communication connection with the access point AP; obtaining the first time corresponding to the current test function; if the tested time is greater than or equal to the first time, disconnecting the device to be tested from the AP. This embodiment can automatically disconnect the device to be tested from the AP when the test of the device to be tested times out, further realizing the implementation management of a large number of APs and a large number of devices to be tested, without the need to manually disconnect the device to be tested from the AP, saving labor costs and improving the test efficiency of the device to be tested.

[0066] Furthermore, the embodiment of the present application also includes: if it is detected that the AP cannot establish a communication connection with the device to be tested, the device to be tested is added to a blacklist.

[0067] Among them, if the device to be tested performs a test of the corresponding function at the test station corresponding to the current test function, but the AP corresponding to the test station cannot establish a communication connection with the device to be tested, or the AP cannot communicate with the device to be tested with poor quality, for example, the AP and the device to be tested are repeatedly disconnected and connected within a preset time, then the device to be tested will be added to the blacklist. The duration of joining the blacklist can be set to a third duration, that is, within the third duration, the device to be tested cannot connect to the AP corresponding to the current test function. After the third duration, the device to be tested can be removed from the blacklist so that the device to be tested can connect to the AP on the next test station after entering the next station to test the next test function.

[0068] The embodiments of the present application also include: periodically obtaining the access rate of the AP; if the access rate is less than the rate threshold, outputting a first warning message, the first warning message being used to prompt that the AP has an access problem; and / or periodically obtaining the access port of the AP, and if the access port is different from the preset port, outputting a first warning message.

[0069] The periodicity refers to every preset time, which may be 5 minutes, 10 minutes, etc. The access rate and access port corresponding to the AP will be reported to the AC, and the test management device can obtain the access rate and access port of the AP from the AP or the AC.

[0070] In the embodiment of the present application, the AP has multiple ports, and the AP is connected to the network cable through the ports. If the network cable is accessed incorrectly, or the network cable port is accessed incorrectly, the access rate of the AP will be reduced, which will in turn affect the test efficiency of the device to be tested. Therefore, when the access rate is less than the rate threshold and / or the access port is different from the preset port, the first warning information is output. Among them, the first warning information is used to remind engineering personnel to deal with the corresponding access problem.

[0071] For example, if the rate threshold of the access network cable of the AP is 1 Gbps, but the current access rate is 100 Mbps, the first warning information is output. Or if the preset port of the AP is E0, and the current access port is E1, the first warning information is output.

[0072] The embodiment of the present application also includes: obtaining the communication parameters of the AP, the communication parameters including: at least one of the channel identification, channel utilization, retransmission ratio, environmental noise and signal strength; if the communication parameters do not meet the preset requirements, outputting a second warning information, the second warning information is used to prompt the AP that there is communication interference.

[0073] The communication parameters generated by the AP will be reported to the AC. The test management device can obtain the communication parameters of the AP from the AP or the AC.

[0074] Specifically, the channel utilization rate and the channel identifier of the AP are obtained; if the channel utilization rate of the AP is greater than the channel utilization rate threshold, the channel of the AP is switched according to the channel identifier. Exemplarily, the channel identifiers are channel 1 and channel 2. The channel currently connected to the AP is channel 1, and the channel utilization rate is greater than the channel utilization rate threshold, then the AP is switched from channel 1 to channel 2.

[0075] Furthermore, if the channel utilization rate is greater than the channel utilization rate threshold, it is determined that the AP has WIFI (wireless signal) interference, and a warning message can be output accordingly to remind the engineering staff that WIFI interference exists. If the retransmission rate is greater than the retransmission rate threshold, it is determined that electromagnetic wave and / or microwave interference exists, and a warning message is output accordingly to remind the engineering staff that electromagnetic wave and / or microwave interference exists. If the ambient noise is greater than the noise threshold, it is determined that there is ambient background noise, and a warning message can be output accordingly to remind the engineering staff that there is ambient background noise.

[0076] In the embodiment of the present application, the test management device is connected to multiple APs in communication, and the test management device can obtain the communication parameters corresponding to the multiple APs, and then can determine the AP with interference according to the communication parameters of each AP, and then determine the specific location of interference according to the interfering AP, and further prompt the engineering personnel to eliminate the interference at the corresponding location. Figure 3 In the example, the test management device obtains that several APs in the test station A(1) have microwave interference, so it can locate the microwave interference at the test station A(1), and then remind the engineering personnel to eliminate the microwave interference at the test station A(1).

[0077] Reference Figures 4 to 7 , which is a management interface diagram of the test management device provided by this application, including three titles: device management to be tested, blacklist management and AP management. Users can click on different titles to perform different management operations.

[0078] exist Figure 4In the test management, the user clicks on the device to be tested management, and the interface of the test management device displays the IP addresses of each device to be tested connected to the test management device, the AP to which the device to be tested is currently connected, the current test function of the test device, and the current wireless network status of the device to be tested. The user can select one or more devices to be tested to perform some operations. For example, refreshing the list means refreshing the device to be tested that is currently connected to the test management device. Copying can be copying the IP address of the device to be tested or other contents of the current list. Turning off the wireless network means sending a target instruction to the selected device to be tested, so that the device to be tested turns off the wireless network. Obtaining devices connected to the same AP means filtering out other devices to be tested that are connected to the same AP as the selected device to be tested.

[0079] exist Figure 5 In the test management device interface, if the user selects blacklist management, the IP addresses in the blacklist will be displayed on the test management device interface. The current test function means that the test management device is added to the blacklist when testing the current test function. It also includes the current wireless network status of the device to be tested and the remaining time in the blacklist. Figure 5 The user can also select one or more devices to be tested to perform some management tasks, such as removing them from the blacklist.

[0080] exist Figure 6 In the test management, if the user selects AP management, each AP, that is, the test function corresponding to each AP, and the group to which each AP belongs are displayed on the interface of the test management device, where APs in the same group correspond to the same test function. Figure 6 B1 to B9 are identifiers corresponding to APs. Other identifiers may be used to represent APs, and other codes may be used to represent the group to which the AP belongs.

[0081] Among them, Figure 6 In the interface, the user can select one or more APs to obtain the device to be tested, interference analysis, and access analysis connected to the AP. If the user selects the device to be tested connected to B5, the interface is as follows: Figure 7 , Figure 7 The following table shows the devices to be tested connected to B5 and the corresponding test duration. Figure 7 Select one or more devices to be tested, check the box to add the timed-out devices to the blacklist, and then make corresponding settings on the right display interface. Figure 7 It means that the user sets the detection interval to 1 minute, obtains the tested time of the device to be tested, and adds the device to be tested whose tested time is longer than the first time to the blacklist for 120 seconds.

[0082] In the embodiments of this application, refer to Figure 6, the user can click on Interference Analysis, and the interface will display the communication parameters corresponding to the AP, and then conduct interference analysis, such as determining whether there is interference and the type of interference. If the user clicks on Access Analysis, the interface will display the access rate and access port of the AP, and conduct related analysis, such as determining whether there is an access error.

[0083] In addition, in the embodiment of the present application, a page may be set to display the communication parameters corresponding to all APs, thereby facilitating engineering personnel to perform interference analysis on each AP.

[0084] In the embodiments of this application Figures 4 to 7 The interface diagram of the test management method provided by the present application is only an exemplary illustration. The interface diagram of the present application may also be other interface diagrams that can arbitrarily express the test management method of the present application, and is not limited here.

[0085] Corresponding to the test management method of the above embodiment, Figure 8 This is a structural block diagram of a test management device provided in an embodiment of the present application. The test management device is applied to a test management device. For ease of description, only the part related to the embodiment of the present application is shown. Figure 8 , the test management device 800 includes:

[0086] The first acquisition module 801 is used to acquire the current test station of the device to be tested and the test time of the device to be tested at the current test station when the device to be tested is connected to the AP and the device to be tested is tested;

[0087] The second acquisition module 802 is used to obtain the preset duration corresponding to the current test station;

[0088] The disconnection module 803 is used to disconnect the device to be tested from the AP if the test duration is greater than a preset duration.

[0089] In an optional embodiment, the disconnection module 803 is specifically used to: send a target instruction to the device to be tested, where the target instruction is used to instruct the device to be tested to close the wireless connection.

[0090] In an optional embodiment, the disconnection module 803 is specifically configured to: add the device to be tested to a blacklist within a second time period, where the second time period is a time period during which the device to be tested is prohibited from connecting to the AP.

[0091] In an optional embodiment, the disconnection module 803 is further configured to: if it is detected that the AP cannot establish a communication connection with the device to be tested, add the device to be tested to a blacklist.

[0092] In an optional embodiment, the test management device 800 also includes: a first output module (not shown), which is specifically used to: periodically obtain the access rate of the AP; if the access rate is less than the rate threshold, output a first warning message, and the first warning message is used to prompt that the AP has an access problem; and / or periodically obtain the access port of the AP, and if the access port is different from the preset port, output a first warning message.

[0093] In an optional embodiment, the test management device 800 also includes: a second output module (not shown), which is specifically used to: obtain the communication parameters of the AP, the communication parameters include: channel identification, channel utilization, retransmission ratio, environmental noise and at least one of signal strength; if the communication parameters do not meet the preset requirements, a second warning information is output, and the second warning information is used to prompt the AP that there is communication interference.

[0094] The test management device provided in this embodiment can be used to execute the technical solution of the above-mentioned test management method embodiment. Its implementation principle and technical effect are similar, and this embodiment will not be repeated here.

[0095] refer to Fig. 9 , which shows a schematic diagram of the structure of a test management device 31 suitable for implementing an embodiment of the present application, and the test management device 31 may be a terminal device or a server. The terminal device may include but is not limited to mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, personal digital assistants (PDAs), tablet computers (Portable Android Devices, PADs), portable multimedia players (PMPs), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Fig. 9 The test management device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0096] like Fig. 9As shown, the test management device 31 may include a processing device (e.g., a central processing unit, a graphics processing unit, etc.) 901, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 902 or a program loaded from a storage device 908 to a random access memory (RAM) 903. Various programs and data required for the operation of the test management device 31 are also stored in the RAM 903. The processing device 901, the ROM 902, and the RAM 903 are connected to each other via a bus 904. An input / output (I / O) interface 905 is also connected to the bus 904.

[0097] Typically, the following devices may be connected to the I / O interface 905: input devices 906 including, for example, a touch screen, a touch pad, a keyboard, a mouse, a camera, a microphone, an accelerometer, a gyroscope, etc.; output devices 907 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; storage devices 908 including, for example, a magnetic tape, a hard disk, etc.; and communication devices 909. The communication devices 909 may allow the test management device 31 to communicate with other devices wirelessly or by wire to exchange data. Although Fig. 9 The test management device 31 is shown with various devices, but it should be understood that it is not required to implement or have all of the devices shown. More or fewer devices may be implemented or have instead.

[0098] Reference Figure 3 An embodiment of the present application provides a test management system 30, comprising: at least one AP, at least one device to be tested, and a test management device; wherein the AP and at least one device to be tested are communicatively connected; the test management device is communicatively connected to at least one AP and at least one device to be tested respectively; the test management device is used to execute a test management method as described in any one of the first aspects.

[0099] In an alternative embodiment, referring to Figure 3 The test management system 30 also includes: a central controller, which is respectively connected to the test management device and at least one AP for communication, and is used to receive communication parameters and load information sent by at least one AP, and send the communication parameters and load information to the test management device; the load information includes: the number of devices to be tested connected to the AP, the IP address and the corresponding tested time.

[0100] In addition, the access rate and access port of the AP can also be uploaded to the central controller.

[0101] Among them, the test management device can obtain the communication parameters, access rate, access port and load information corresponding to the AP through the AP or the central controller. Specifically, the test management device preferentially obtains the communication parameters, access rate, access port and load information through the central controller. If the communication parameters, access rate, access port and load information cannot be obtained through the central controller, the communication parameters, access rate, access port and load information data can be obtained through the AP.

[0102] The test management system provided in this embodiment can be used to execute the technical solution of the above-mentioned test management method embodiment. Its implementation principle and technical effects are similar, and this embodiment will not be repeated here.

[0103] In order to implement the above embodiment, the embodiment of the present application also provides a test management device.

[0104] In particular, according to an embodiment of the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from the network through the communication device 909, or installed from the storage device 908, or installed from the ROM 902. When the computer program is executed by the processing device 901, the above-mentioned functions defined in the method of the embodiment of the present application are executed.

[0105] It should be noted that the computer-readable medium mentioned above in the present application may be a computer-readable signal medium or a computer-readable storage medium or any combination of the above two. The computer-readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present application, a computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, device or device.

[0106] The computer-readable medium carries one or more programs. When the one or more programs are executed by the test management device, the test management device executes the method shown in the above embodiment.

[0107] The above description is only a preferred embodiment of the present application and an explanation of the technical principles used. Those skilled in the art should understand that the scope of disclosure involved in the present application is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above disclosed concept. For example, the above features are replaced with the technical features with similar functions disclosed in this application (but not limited to) by each other to form a technical solution.

[0108] In addition, although each operation is described in a specific order, this should not be construed as requiring these operations to be performed in the specific order shown or to be performed in a sequential order. Under certain circumstances, multitasking and parallel processing may be advantageous. Similarly, although some specific implementation details are included in the above discussion, these should not be construed as limiting the scope of the application. Some features described in the context of a separate embodiment can also be implemented in a single embodiment in combination. On the contrary, the various features described in the context of a single embodiment can also be implemented in multiple embodiments individually or in any suitable sub-combination mode.

[0109] Although the subject matter has been described in language specific to structural features and / or methodological logical actions, it should be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or actions described above. On the contrary, the specific features and actions described above are merely example forms of implementing the claims.

Claims

1. A test management method, characterized in that: Applied to a test management device, the test management device is included in a test management system, the test management system is arranged in a test site of a device to be tested, the test site includes a plurality of test stations, each test station tests a different test function, each test function corresponds to a different preset test duration, the test function includes at least: audio test, radio frequency test and automated test, the test management method includes: Acquire a current test function of the device to be tested and a test duration of the device to be tested corresponding to the current test function, wherein the device to be tested is communicatively connected with an access point AP; Obtain a first duration corresponding to the current test function, where the first duration is the sum of a preset test duration and a timeout duration; If the tested duration is greater than or equal to the first duration, disconnecting the device to be tested from the AP; After the second time period, the device to be tested is connected to the AP at the next test station to perform a test of the next test function. The second time period is the time period during which the device to be tested is prohibited from connecting to the AP.

2. The test management method according to claim 1, characterized in that: The disconnecting the test device from the AP comprises: The device to be tested is added to a blacklist within a second time period, and the second time period is a time period during which the device to be tested is prohibited from connecting to the AP.

3. The test management method according to claim 1, characterized in that: The disconnecting the test device from the AP comprises: A target instruction is sent to the device to be tested, where the target instruction is used to instruct the device to be tested to close a wireless connection.

4. The test management method according to any one of claims 1 to 3, characterized in that: Also includes: If it is detected that the AP cannot establish a communication connection with the device to be tested, the device to be tested is added to a blacklist.

5. The test management method according to any one of claims 1 to 3, characterized in that: Also includes: Periodically obtaining the access rate of the AP; If the access rate is less than the rate threshold, outputting a first warning message, wherein the first warning message is used to prompt that the AP has an access problem; And / or, periodically obtaining the access port of the AP, and if the access port is different from a preset port, outputting the first warning information.

6. The test management method according to any one of claims 1 to 3, characterized in that: Also includes: Acquire communication parameters of the AP, the communication parameters including: at least one of a channel identifier, a channel utilization rate, a retransmission ratio, environmental noise, and a signal strength; If the communication parameter does not meet the preset requirements, a second warning message is output, where the second warning message is used to prompt the AP that communication interference exists.

7. A test management device, characterized in that: Applied to a test management device, the test management device is included in a test management system, the test management system is arranged in a test site of a device to be tested, the test site includes a plurality of test stations, each test station tests a different test function, each test function corresponds to a different preset test duration, the test function includes at least: audio test, radio frequency test and automated test, the test management device includes: A first acquisition module is used to acquire a current test function of the device to be tested and a test duration of the device to be tested corresponding to the current test function when the device to be tested is connected to the AP and the device to be tested is tested; A second acquisition module is used to acquire a first duration corresponding to the current test function, where the first duration is the sum of a preset test duration and a timeout duration; A disconnection module is used to disconnect the connection between the device to be tested and the AP if the tested time is greater than or equal to the first time; after a second time, the device to be tested is connected to the AP at the next test station to perform the next test function test, and the second time is the time for prohibiting the device to be tested from connecting to the AP.

8. A test management device, characterized in that: include: Processor and memory; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory, so that the processor executes the test management method according to any one of claims 1 to 6.

9. A test management system, characterized in that: include: At least one AP, at least one device to be tested, and a test management device; wherein the AP is communicatively connected to at least one of the devices to be tested; the test management device is communicatively connected to the at least one AP and the at least one device to be tested, respectively; The test management device is used to execute the test management method according to any one of claims 1 to 6.

10. The test management system according to claim 9, characterized in that: Also includes: A central controller, wherein the central controller is respectively connected to the test management device and the at least one AP for communication, and is used to receive communication parameters and load information sent by the at least one AP, and send the communication parameters and the load information to the test management device; the load information includes: the number of devices to be tested connected to the AP, the IP address and the corresponding tested time.

11. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions. When a processor executes the computer-executable instructions, the test management method according to any one of claims 1 to 6 is implemented.

12. A computer program product having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the electronic device executes the test management method according to any one of claims 1 to 6.

Images