A hard disk drive power chip testing method and system

Abstract

The invention discloses a hard disk drive power chip testing method and system, including a hard disk drive power chip testing method and a hard disk drive power chip system used by the method as a whole, including a chip testing system module, a chip testing circuit module and a hard disk module to be tested, the chip testing system is used to provide a logic level for reading and writing tests on a hard disk, the chip testing circuit module is used to connect pins of each module to form a complete testing circuit, the hard disk module to be tested is used to provide a hard disk interface to be tested, the chip testing circuit module includes a peripheral circuit module, a peripheral filtering capacitor module, a power output module, a clock signal module, a relay module, and a writing unit module, the peripheral circuit module is used to complete the control of a relay coil, and the peripheral filtering capacitor module is used to filter out noise and AC components of a power supply in a peripheral circuit, and the invention has the characteristics of accurate and comprehensive testing.

Description

Technical Field

[0001] The present invention relates to the technical field of hard disk testing, in particular to a hard disk drive power chip testing method and system. Background Art

[0002] As a data storage device of computer system, hard disk is mainly used to store data. Hard disk is divided into mechanical hard disk and solid state hard disk. Mechanical hard disk is a traditional ordinary hard disk, which is mainly composed of disk, head, disk shaft, control motor, head controller and other parts. The head can move along the radius of the disk. With the high-speed rotation of the disk at several thousand revolutions per minute, the head can be positioned at the specified position of the disk to read and write data. The information passes through the head very close to the magnetic surface, and is written to the disk by electromagnetic flow to change the polarity. Compared with traditional mechanical hard disk, solid state hard disk is much simpler in structure. It is mainly a PCB circuit board with main control chip, flash memory particles and cache particles welded on the board. It has faster transmission speed and is less prone to damage.

[0003] With the development of informatization, hard disks are used in all kinds of computers. However, since hard disks must be powered and equipped to operate, they need to be installed before they can be tested. In most cases, internal damage is not obvious, and problems such as unsmooth reading and writing of data occur, which are difficult for users to detect. By the time the hard disk is completely damaged, the data has been lost, causing unnecessary losses. At present, there is a lack of direct detection methods for hard disks. Therefore, it is necessary to design a hard disk drive power chip test method and system that is accurate and comprehensive. Summary of the invention

[0004] The object of the present invention is to provide a hard disk drive power chip testing method and system to solve the problems raised in the above background technology.

[0005] In order to solve the above technical problems, the present invention provides the following technical solutions: a hard disk drive power chip testing method and system, the hard disk drive power chip testing system comprising a chip testing system module, a chip testing circuit module and a hard disk module to be tested, the chip testing system is used to provide a logic level for reading and writing tests on the hard disk, the chip testing circuit module is used to connect the pins of each module to form a complete test circuit, the hard disk module to be tested is used to provide a hard disk interface to be tested, the chip testing system module is electrically connected to the chip testing circuit module, the chip testing circuit module is electrically connected to the hard disk module to be tested, the chip testing circuit module comprises a peripheral circuit module, a peripheral filter capacitor module, a power output module, a clock signal module, a relay module, a pull-up resistor module, and a write unit module, the peripheral circuit module is electrically connected to the peripheral filter capacitor module, and the The power output module is electrically connected to the pull-up resistor module and the relay module, the relay module is electrically connected to the write unit module, the peripheral circuit module is used to complete the control of the relay coil and drive the relay to operate, the peripheral filter capacitor module is used to filter out the noise and AC components of the power supply in the peripheral circuit, so that the impedance between the power line and the ground line is low, and the power supply is close to the ideal power supply, the power output module is used to provide a DC power supply in the circuit to drive the test chip, the clock signal module is used to provide a clock signal inside the circuit as a control signal for the coordinated work of various components in the chip, the relay module is used to switch the connection object and detect the diode characteristics of each pin of the chip to be tested, the pull-up resistor module is used to change the high and low states of the level and limit the current of the circuit at the same time, and the write unit module is used to write the specified data into the register or read data from the register through the circuit interface.

[0006] According to the above technical solution, the chip testing system module includes a peripheral circuit pin, a power pin, and a clock signal pin. The peripheral circuit pin is used to provide a pin for a peripheral filter capacitor connected to the peripheral circuit. The power pin is used to connect the power output module and the pull-up resistor to form a high and low level. The clock signal pin is used to connect the clock signal module. The peripheral circuit pin, power pin and clock signal pin are electrically connected.

[0007] According to the above technical solution, the hard disk module to be tested includes a peripheral circuit receiving pin, a write pin, and a clock signal input pin. The peripheral circuit receiving pin is used to connect the hard disk to be tested and the I2C peripheral circuit, the write pin is used to connect the relay and the hard disk to be tested, and the clock signal input pin is used to receive a clock signal. The peripheral circuit receiving pin, the write pin and the clock signal input pin are electrically connected to the hard disk to be tested.

[0008] According to the above technical solution, the hard disk drive power chip testing method comprises the following steps:

[0009] Step S1: Before the hard disk is tested, it needs to be installed on a test platform with a pin interface and wait for testing. The interfaces of hard disks of different types and brands are different. In order to facilitate testing, the hard disk needs to be placed on a test platform with multiple connection interfaces. After placement, only the external pins on the test platform need to be connected and tested, which reduces the complexity of hard disk testing and improves efficiency.

[0010] Step S2: After the peripheral circuit is connected according to the circuit diagram, the diode characteristics of the chip pins inside the hard disk to be tested are detected by controlling the level state of the relay input voltage. The relay used in this system is a double-pole double-throw relay. The relay has ten pins, of which pins 5 and 6 are suspended, pin 1 is connected to a +5V power supply, and pins 3 and 8 are common terminals. When the input voltage is at a high level, it is connected to pins 2 and 9 respectively, and when the input voltage is at a low level, it is connected to pins 4 and 7 respectively. The double-pole double-throw relay is used, and its characteristic of being able to switch the connection object is utilized. The diode characteristics of multiple pins of the chip to the ground can be detected without changing the circuit state, which greatly reduces the complexity of the test;

[0011] Step S3: Before testing the read / write capability of the hard disk to be tested, a clock signal needs to be input as a control signal for the hard disk to be tested and various components in the test system to coordinate work. The hard disk and the test system both contain chips, and the chips need to complete different instruction functions through complex timing circuits. Since they do not have an oscillation circuit themselves, they cannot generate a unified clock signal. Therefore, a clock signal needs to be introduced from the outside to ensure the coordinated work of the chips.

[0012] Step S4: After the test platform is connected to the DC power supply, it generates a corresponding control signal, and writes the specified data into the register address of the hard disk to be tested through the writing unit, and then reads the data in the register of the hard disk to be tested in the original way. After comparison by the comparison module, it is determined whether the hard disk to be tested meets the requirements. The written data is directly stored in the register address specified by the hard disk, and the data is read according to the stack reading method, which reduces the transmission of data between the other circuits in the hard disk and makes the detection more efficient.

[0013] According to the above technical solution, step S4 further includes the following steps:

[0014] Step S41: The current of the DC power supply generates a high-level input signal after passing through the pull-up resistor, and flows into the peripheral circuit from the SDA pin of the I2C peripheral circuit, generating a control signal to the double-pole double-throw relay, and the pull-up resistor connects the power supply and the device pin, injecting current into the device, improving the circuit stability, avoiding malfunction, and improving the load capacity of the output pin;

[0015] Step S42: After the double-pole double-throw relay receives the control signal, pins 3 and 8 are connected to pins 2 and 9 respectively. At this time, pins 2 and 9 are simultaneously connected to the SCL and SDA pins of the hard disk to be tested;

[0016] Step S43: Under the action of the external clock signal, the test system and the chip of the hard disk to be tested work simultaneously, and the writing unit writes the specified data into the register address of the hard disk to be tested.

[0017] According to the above technical solution, step S43 further includes the following steps:

[0018] Step S431: The SDA pin of the chip to be tested needs to be connected to a DC power supply through a pull-up resistor according to the I2C protocol, and the clock signal flows into the circuit from the SCL pin and flows into the chip to be tested from the CLOCK pin of the hard disk to be tested;

[0019] Step S432: Under the action of the clock signal, the internal chips of the test system and the hard disk to be tested start working and send control signals to the write unit. The clock signal module provides high-frequency pulses through the internal oscillator, which are processed by frequency division and become the clock signals between the internal chips of the circuit to ensure the stability of the circuit.

[0020] Step S433: After receiving the control signal, the writing unit writes data D1 into the register address of the hard disk to be tested through the SDA pin, and records the time t1 when the writing is completed. The writing speed and reading speed of the hard disk are the basic factors for testing the quality of the hard disk. By comparing the test value with the factory nominal value, it is determined whether the hard disk meets the requirements;

[0021] Step S434: After writing is completed, the data in the register of the hard disk to be tested is read again according to the first-in-last-out stack rule. After reading is completed, the time t2 consumed in the reading process and the amount of data read D2 are recorded. The hard disk reading speed is obviously faster than the writing speed, so the hard disk reading and writing speeds need to be tested separately to comprehensively judge the hard disk quality;

[0022] Step S435: By comparing the amount of data written and read, determine whether data loss occurs, and then calculate the speed V of the hard disk writing and reading data per unit time, and compare them with the standard value to determine whether the hard disk meets the requirements.

[0023] According to the above technical solution, in step S435, the calculation formula of the speed V of hard disk writing and reading data per unit time is:

[0024]

[0025] Among them, D i The amount of data written and read by the hard disk during the test, in bytes, ti It is the writing completion time and reading completion time of the hard disk during the test, in seconds. When i is 1, it is in the writing state, and when i is 2, it is in the reading state. After the test is completed, the speed V of the hard disk writing and reading data per unit time is compared with the design value to determine whether it meets the standard.

[0026] According to the above technical solution, a voltage stabilizing circuit module is installed between the power output module and the relay module. The voltage stabilizing circuit module includes a voltage stabilizing circuit. The voltage stabilizing circuit is used to keep the output voltage in the balance circuit stable when measuring multiple hard disks at the same time. When testing multiple hard disks at the same time, the power output module needs to output multiple voltages. Since different hard disks have different types, the required voltages are also different. When multiple voltages appear in the circuit, fluctuations will occur, affecting the test results.

[0027] Compared with the prior art, the beneficial effects achieved by the present invention are as follows: the present invention, by providing a double-pole double-throw relay and utilizing its characteristic of being able to change the connection object, tests the pin-to-ground diode characteristics of multiple devices without changing the circuit state, thereby simplifying the circuit complexity; and by providing a voltage stabilizing circuit module, ensures that when multiple hard disks are tested simultaneously, the circuit voltage is stable, and abnormal heating, voltage fluctuations, etc. will not occur to affect the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0029] Figure 1 It is a schematic diagram of the system module composition of the present invention. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0031] See also Figure 1The present invention provides a technical solution: a hard disk drive power chip test method and system, a hard disk drive power chip test system includes a chip test system module, a chip test circuit module and a hard disk module to be tested, the chip test system is used to provide a logic level for reading and writing tests on the hard disk, the chip test circuit module is used to connect the pins of each module to form a complete test circuit, the hard disk module to be tested is used to provide a hard disk interface to be tested, the chip test system module is electrically connected to the chip test circuit module, the chip test circuit module is electrically connected to the hard disk module to be tested, the chip test circuit module includes a peripheral circuit module, a peripheral filter capacitor module, a power output module, a clock signal module, a relay module, a pull-up resistor module, a write unit module, the peripheral circuit module is electrically connected to the peripheral filter capacitor module, the power output module It is electrically connected to the pull-up resistor module and the relay module. The relay module is electrically connected to the write unit module. The peripheral circuit module is used to complete the control of the relay coil and drive the relay to operate. The peripheral filter capacitor module is used to filter out the noise and AC components of the power supply in the peripheral circuit, so that the impedance between the power line and the ground line is low and the power supply is close to the ideal power supply. The power output module is used to provide a DC power supply in the circuit to drive the test chip. The clock signal module is used to provide a clock signal inside the circuit as a control signal for the coordinated work of various components in the chip. The relay module is used to switch the connection object and detect the diode characteristics of each pin of the chip to be tested. The pull-up resistor module is used to change the high and low states of the electrical level and limit the current of the circuit at the same time. The write unit module is used to write the specified data into the register or read data from the register through the circuit interface.

[0032] The chip test system module includes peripheral circuit pins, power pins, and clock signal pins. The peripheral circuit pins are used to provide pins for peripheral filter capacitors connected to the peripheral circuit. The power pins are used to connect the power output module and the pull-up resistor to form high and low levels. The clock signal pins are used to connect the clock signal module. The peripheral circuit pins, power pins and clock signal pins are electrically connected.

[0033] The hard disk module to be tested includes a peripheral circuit receiving pin, a write pin, and a clock signal input pin. The peripheral circuit receiving pin is used to connect the hard disk to be tested with the I2C peripheral circuit, the write pin is used to connect the relay with the hard disk to be tested, and the clock signal input pin is used to receive the clock signal. The peripheral circuit receiving pin, the write pin and the clock signal input pin are electrically connected to the hard disk to be tested.

[0034] A hard disk drive power chip testing method comprises the following steps:

[0035] Step S1: Before the hard disk is tested, it needs to be installed on a test platform with a pin interface and wait for testing. The interfaces of hard disks of different types and brands are different. In order to facilitate testing, the hard disk needs to be placed on a test platform with multiple connection interfaces. After placement, only the external pins on the test platform need to be connected and tested, which reduces the complexity of hard disk testing and improves efficiency.

[0036] Step S2: After the peripheral circuit is connected according to the circuit diagram, the diode characteristics of the chip pins inside the hard disk to be tested are detected by controlling the level state of the relay input voltage. The relay used in this system is a double-pole double-throw relay. The relay has ten pins, of which pins 5 and 6 are suspended, pin 1 is connected to a +5V power supply, and pins 3 and 8 are common terminals. When the input voltage is at a high level, it is connected to pins 2 and 9 respectively, and when the input voltage is at a low level, it is connected to pins 4 and 7 respectively. The double-pole double-throw relay is used, and its characteristic of being able to switch the connection object is utilized. The diode characteristics of multiple pins of the chip to the ground can be detected without changing the circuit state, which greatly reduces the complexity of the test;

[0037] Step S3: Before testing the read / write capability of the hard disk to be tested, a clock signal needs to be input as a control signal for the hard disk to be tested and various components in the test system to coordinate work. The hard disk and the test system both contain chips, and the chips need to complete different instruction functions through complex timing circuits. Since they do not have an oscillation circuit themselves, they cannot generate a unified clock signal. Therefore, a clock signal needs to be introduced from the outside to ensure the coordinated work of the chips.

[0038] Step S4: After the test platform is connected to the DC power supply, it generates a corresponding control signal, and writes the specified data into the register address of the hard disk to be tested through the writing unit, and then reads the data in the register of the hard disk to be tested in the original way. After comparison by the comparison module, it is determined whether the hard disk to be tested meets the requirements. The written data is directly stored in the register address specified by the hard disk, and the data is read according to the stack reading method, which reduces the transmission of data between the other circuits in the hard disk and makes the detection more efficient.

[0039] Step S4 further comprises the following steps:

[0040] Step S41: The current of the DC power supply generates a high-level input signal after passing through the pull-up resistor, and flows into the peripheral circuit from the SDA pin of the I2C peripheral circuit, generating a control signal to the double-pole double-throw relay, and the pull-up resistor connects the power supply and the device pin, injecting current into the device, improving the circuit stability, avoiding malfunction, and improving the load capacity of the output pin;

[0041] Step S42: After the double-pole double-throw relay receives the control signal, pins 3 and 8 are connected to pins 2 and 9 respectively. At this time, pins 2 and 9 are simultaneously connected to the SCL and SDA pins of the hard disk to be tested;

[0042] Step S43: Under the action of the external clock signal, the test system and the chip of the hard disk to be tested work simultaneously, and the writing unit writes the specified data into the register address of the hard disk to be tested.

[0043] Step S43 further includes the following steps:

[0044] Step S431: The SDA pin of the chip to be tested needs to be connected to a DC power supply through a pull-up resistor according to the I2C protocol, and the clock signal flows into the circuit from the SCL pin and flows into the chip to be tested from the CLOCK pin of the hard disk to be tested;

[0045] Step S432: Under the action of the clock signal, the internal chips of the test system and the hard disk to be tested start working and send control signals to the write unit. The clock signal module provides high-frequency pulses through the internal oscillator, which are processed by frequency division and become the clock signals between the internal chips of the circuit to ensure the stability of the circuit.

[0046] Step S433: After receiving the control signal, the writing unit writes data D1 into the register address of the hard disk to be tested through the SDA pin, and records the time t1 when the writing is completed. The writing speed and reading speed of the hard disk are the basic factors for testing the quality of the hard disk. By comparing the test value with the factory nominal value, it is determined whether the hard disk meets the requirements;

[0047] Step S434: After writing is completed, the data in the register of the hard disk to be tested is read again according to the first-in-last-out stack rule. After reading is completed, the time t2 consumed in the reading process and the amount of data read D2 are recorded. The hard disk reading speed is obviously faster than the writing speed, so the hard disk reading and writing speeds need to be tested separately to comprehensively judge the hard disk quality;

[0048] Step S435: By comparing the amount of data written and read, determine whether data loss occurs, and then calculate the speed V of the hard disk writing and reading data per unit time, and compare them with the standard value to determine whether the hard disk meets the requirements.

[0049] In step S435, the calculation formula of the speed V of hard disk writing and reading data per unit time is:

[0050]

[0051] Among them, D i The amount of data written and read by the hard disk during the test, in bytes, t iIt is the writing completion time and reading completion time of the hard disk during the test, in seconds. When i is 1, it is in the writing state, and when i is 2, it is in the reading state. After the test is completed, the speed V of the hard disk writing and reading data per unit time is compared with the design value to determine whether it meets the standard.

[0052] A voltage stabilizing circuit module is installed between the power output module and the relay module. The voltage stabilizing circuit module includes a voltage stabilizing circuit. The voltage stabilizing circuit is used to keep the output voltage in the balance circuit stable when multiple hard disks are measured simultaneously. When multiple hard disks are tested simultaneously, the power output module needs to output multiple voltages. Due to the different types of hard disks, the required voltages are also different. When multiple voltages appear in the circuit, fluctuations will occur, affecting the test results.

[0053] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0054] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A hard disk drive power chip testing system, comprising a hard disk drive power chip testing method and a hard disk drive power chip system used by the method as a whole, characterized in that: The hard disk drive power chip test system comprises a chip test system module, a chip test circuit module and a hard disk module to be tested, wherein the chip test system is used to provide a logic level for reading and writing tests on the hard disk, the chip test circuit module is used to connect the pins of each module to form a complete test circuit, the hard disk module to be tested is used to provide a hard disk interface to be tested, the chip test system module is electrically connected to the chip test circuit module, the chip test circuit module is electrically connected to the hard disk module to be tested, the chip test circuit module comprises a peripheral circuit module, a peripheral filter capacitor module, a power output module, a clock signal module, a relay module, a pull-up resistor module, a write unit module, and a voltage stabilizing circuit module, the peripheral circuit module is electrically connected to the peripheral filter capacitor module, the power output module is electrically connected to the pull-up resistor module, the relay module, the The device module is electrically connected, the relay module is electrically connected to the write unit module, the peripheral circuit module is used to complete the control of the relay coil and drive the relay to operate, the peripheral filter capacitor module is used to filter out the clutter and AC components of the power supply in the peripheral circuit, so that the impedance between the power line and the ground line is low, and the power supply is close to the ideal power supply, the power output module is used to provide a DC power supply in the circuit to drive the test chip, the clock signal module is used to provide a clock signal inside the circuit as a control signal for the coordinated work of various components in the chip, the relay module is used to switch the connection object and detect the diode characteristics of each pin of the chip to be tested, the pull-up resistor module is used to change the high and low states of the level and limit the current of the circuit at the same time, and the write unit module is used to write the specified data into the register or read the data from the register through the circuit interface; A voltage stabilizing circuit module is installed between the power output module and the relay module. The voltage stabilizing circuit module includes a voltage stabilizing circuit. The voltage stabilizing circuit is used to keep the output voltage in the balancing circuit stable when multiple hard disks are measured simultaneously.

2. A hard disk drive power chip testing system according to claim 1, characterized in that: The chip testing system module includes peripheral circuit pins, power pins, and clock signal pins. The peripheral circuit pins are used to provide pins for peripheral filter capacitors connected to the peripheral circuits. The power pins are used to connect the power output module and the pull-up resistor to form high and low levels. The clock signal pins are used to connect the clock signal module. The peripheral circuit pins, power pins, and clock signal pins are electrically connected.

3. A hard disk drive power chip testing system according to claim 2, characterized in that: The hard disk module to be tested includes a peripheral circuit receiving pin, a write pin, and a clock signal input pin. The peripheral circuit receiving pin is used to connect the hard disk to be tested and the I2C peripheral circuit, the write pin is used to connect the relay and the hard disk to be tested, and the clock signal input pin is used to receive a clock signal. The peripheral circuit receiving pin, the write pin and the clock signal input pin are electrically connected to the hard disk to be tested.

4. A hard disk drive power chip testing system according to claim 3, characterized in that: The hard disk drive power chip testing method comprises the following steps: Step S1: Before the hard disk is tested, it needs to be installed on a test platform with a pin interface and wait for testing; Step S2: After the peripheral circuit is connected according to the circuit diagram, the diode characteristics of the chip pins inside the hard disk to be tested are detected by controlling the level state of the relay input voltage; Step S3: Before testing the read and write capabilities of the hard disk to be tested, a clock signal needs to be input as a control signal for the hard disk to be tested and various components in the test system to coordinate work; Step S4: After the test platform is connected to the DC power supply, it generates a corresponding control signal, writes the specified data into the register address of the hard disk to be tested through the writing unit, and then reads the data in the register of the hard disk to be tested in the original way. After comparison by the comparison module, it is determined whether the hard disk to be tested meets the requirements.

5. A hard disk drive power chip testing system according to claim 4, characterized in that: The step S4 further comprises the following steps: Step S41: the current of the DC power supply generates a high level input signal after passing through the pull-up resistor, and flows into the peripheral circuit through the SDA pin of the I2C peripheral circuit, generating a control signal to the double-pole double-throw relay; Step S42: After the double-pole double-throw relay receives the control signal, pins 3 and 8 are connected to pins 2 and 9 respectively. At this time, pins 2 and 9 are simultaneously connected to the SCL and SDA pins of the hard disk to be tested; Step S43: Under the action of the external clock signal, the test system and the chip of the hard disk to be tested work simultaneously, and the writing unit writes the specified data into the register address of the hard disk to be tested.

6. A hard disk drive power chip testing system according to claim 5, characterized in that: The step S43 further comprises the following steps: Step S431: The SDA pin of the chip to be tested needs to be connected to a DC power supply through a pull-up resistor according to the I2C protocol, and the clock signal flows into the circuit from the SCL pin and flows into the chip to be tested from the CLOCK pin of the hard disk to be tested; Step S432: Under the action of the clock signal, the internal chip of the test system and the hard disk to be tested starts working and sends a control signal to the writing unit; Step S433: after receiving the control signal, the writing unit writes data with a data volume of D1 into the register address of the hard disk to be tested through the SDA pin, and records the time t1 when the writing is completed; Step S434: after writing is completed, the data in the register of the hard disk to be tested is read again according to the first-in-last-out stack rule, and after reading is completed, the time t2 consumed in the reading process and the amount of data D2 read are recorded; Step S435: By comparing the amount of data written and read, determine whether data loss occurs, and then calculate the speed V of the hard disk writing and reading data per unit time, and compare them with the standard value to determine whether the hard disk meets the requirements.

7. A hard disk drive power chip testing system according to claim 6, characterized in that: In step S435, the calculation formula of the speed V of hard disk writing and reading data per unit time is: Among them, D i The amount of data written and read by the hard disk during the test, in bytes, t i It is the writing completion time and reading completion time of the hard disk during the test, in seconds. When i is 1, it is in the writing state, and when i is 2, it is in the reading state. After the test is completed, the speed V of the hard disk writing and reading data per unit time is compared with the design value to determine whether it meets the standard.

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