A room temperature automatic sample changing device for neutron diffraction experiments
By designing a normal temperature automatic sample change device, using the sample disk rotation and sample feeding mechanism, combining vacuum servo and stepper motor, the safe and reliable sample replacement of the sample box in neutron diffraction experiments is achieved, and the sample box and sample in the prior art are solved The problem of unsafe rod separation and gripping improves sample replacement efficiency and neutron machine utilization efficiency.
Patent Information
- Application Number
- CN202410452719.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-16
- Publication Date
- 2025-01-03
- Estimated Expiration
- 2044-04-16
AI Technical Summary
In the neutron diffraction experiment, the automatic sample change device has the unsafe separation and grasping process of sample box and sample rod, and the use of robot arms abroad is expensive and has poor radiation resistance. The domestic mechanical grasping control is complex and the accuracy requirements are high, and sample drops are present. risk.
A normal temperature automatic sample change device is designed, including a sample disk rotating mechanism and a sample feeding mechanism. The sample drive assembly and sample feeding head are used to realize the rotation of the sample disk and the sample tube dropping through a vacuum servo motor and a stepper motor, combined with the reset assembly and rotary drive components to achieve safe and reliable sample replacement of sample boxes and simplify assembly process.
It improves sample replacement efficiency and safety, reduces the risk of errors, uses cheap radiation-resistant materials, simplifies the structure, reduces the experimenter's stay in the radiation environment, and improves the utilization efficiency of neutron machines.
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Figure CN118501191B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of material analysis, in particular to a room-temperature automatic sample changing device for neutron diffraction experiments. Background Art
[0002] Neutron diffraction technology is an indispensable and important means to study the microstructure of matter. The microstructure of matter is invisible to the naked eye and requires the use of special probes to achieve observation. Neutrons are not charged and therefore have strong penetrating power. The de Broglie wavelength range of neutrons (related to the neutron energy) obtained based on the wave-particle duality of quantum mechanics is exactly equivalent to the range of interatomic distances in matter. After neutrons pass through matter, they have the opportunity to form a specific diffraction pattern. By analyzing the diffraction pattern obtained in the experiment, the microstructure at the atomic level in the matter can be obtained.
[0003] When conducting neutron diffraction experiments, experimenters should enter the neutron irradiation environment as little as possible due to the ionizing radiation damage of neutrons. At the same time, the process of generating usable neutrons is complex and costly, and neutron machine time is very expensive. Experimenters should use neutron machine time as efficiently as possible. Combining the above two aspects, automatic sample changers are often a necessity in neutron diffraction spectrometers. After the sample is installed once, automatic sample change measurement is performed, which greatly reduces the experimenter's stay in the radiation environment and reduces the waste of neutron machine time caused by sample change. The demand for automatic sample changing is very wide, and the specific implementation plan varies greatly depending on the application scenario.
[0004] For neutron diffraction, currently foreign neutron diffraction spectrometers often use robot arms to change samples, while domestic neutron spectrometers mostly use mechanical grabbing and mechanical movement to switch samples. Robot arms are highly intelligent, but more expensive, and their radiation resistance is not as good as general mechanical devices; while the mechanical grabbing method has more control processes, high movement accuracy requirements, and there is a risk of misgrasping and sample loss. Summary of the invention
[0005] The present invention aims to provide a technical solution that can solve the above problems.
[0006] A room temperature automatic sample changing device for neutron diffraction experiments comprises a base, a sample tray rotating mechanism and a sample feeding mechanism. The base is provided with a mounting opening, the sample tray rotating mechanism is arranged in the mounting opening, the sample tray rotating mechanism comprises a mounting frame, a sample tray rotatably arranged in the mounting frame and a sample driving assembly for driving the sample tray to rotate, a plurality of sample rods are erected along the circumference of the sample tray, a sample box is arranged at the lower end of the sample rod, a plurality of reset assemblies corresponding to the sample rods are arranged in the sample tray, under the action of the reset assemblies, the sample rods always have an upward trend, the sample feeding mechanism is arranged on the base and located at one side of the sample tray rotating mechanism, and the sample feeding mechanism is used to push one of the sample tubes down and drive it to rotate.
[0007] As a further solution of the present invention: the mounting frame includes a mounting plate, an upper support plate and a lower support plate are spaced apart on one side of the mounting plate, the sample plate includes a center rod, the center rod is rotatably disposed between the upper support plate and the lower support plate, the sample drive assembly is disposed on the top of the upper support plate, the upper end of the center rod is connected to the drive end of the sample drive assembly, three disks are spaced apart on the center rod, a plurality of external through holes are provided on the disks for sample tubes to pass through, an extension hole is provided on the lower support plate, and the center of the extension hole is on the same axis as the center of one of the external through holes.
[0008] As a further solution of the present invention: the sample feeding mechanism includes a bracket, a vertical linear module is provided on the bracket, a sample feeding seat is provided on the movable end of the vertical linear module, a sample feeding head is provided at the bottom of the sample feeding seat, a rotating drive assembly for driving the sample feeding head to rotate is provided at the top of the sample feeding seat, and a groove is provided at the bottom of the sample feeding head for the top end of the sample tube to extend into.
[0009] As a further solution of the present invention: the sample tube resetting assembly includes a guide rod, a slider and a tension spring. An inner through hole is opened on the disk. The guide rod is inserted into the inner through hole. The slider is slidably arranged on the guide rod. The slider and the sample rod are rigidly connected in the vertical direction. The tension spring is sleeved on the guide rod. One end of the tension spring is connected to the disk, and the other end of the tension spring is connected to the slider.
[0010] As a further solution of the present invention: a guide hole for the guide rod to pass through is provided on the slider, a fixing hole is provided on the slider, a fixing sleeve is provided in the fixing hole, an annular protrusion is provided on the inner wall of the fixing sleeve, an annular groove is provided on the surface of the sample rod, the sample rod is passed through the fixing sleeve, and the annular protrusion is embedded in the annular groove.
[0011] As a further solution of the present invention: the sample driving assembly includes a second vacuum servo motor, a first harmonic reducer and a rotary encoder, the rotating shaft of the second vacuum servo motor is connected to the input end of the first harmonic reducer, the output end of the first harmonic reducer is connected to the input end of the rotary encoder, and the output end of the rotary encoder is connected to the center rod.
[0012] As a further solution of the present invention: the rotary drive component includes a vacuum stepper motor, a second harmonic reducer, a driving gear shaft and a driven gear shaft, the rotating shaft of the vacuum stepper motor is connected to the input end of the second harmonic reducer, the output end of the second harmonic reducer is engaged with the driving gear shaft, the driving gear shaft and the driven gear shaft, and the sample feeding head is arranged at the lower end of the driven gear shaft.
[0013] As a further solution of the present invention: the sample delivery stand includes a first shell and a second shell, the first shell and the second shell are connected to each other and are used to accommodate a driving gear shaft and a driven gear shaft, the vacuum stepper motor and the second harmonic reducer are arranged on the top of the first shell, and the lower end of the driven gear shaft passes through the bottom of the second shell and is connected to the sample delivery head.
[0014] As a further solution of the present invention: it also includes a frame, a base is arranged on the frame, a vacuum cover is arranged on the top of the base, the sample plate rotating mechanism and the sample feeding mechanism are both arranged in the vacuum cover, a driver mounting box is arranged on the top of the vacuum cover, a fixing plate is arranged at the bottom of the base, a monitoring camera is arranged at the lower end of the fixing plate, and the monitoring camera faces the extension hole.
[0015] As a further solution of the present invention: a travel groove for lifting and lowering the sample feeding seat is opened on the installation plate, and a micro switch is provided at the bottom of the travel groove.
[0016] Compared with the prior art, the present invention has the following beneficial effects:
[0017] 1. The present invention is innovatively used in neutron diffraction experiments, which makes up for the fact that currently foreign neutron diffraction spectrometers often use robot arms or manual operations to change samples. At the same time, the present invention uses the sample tray rotating mechanism and the sample feeding mechanism to set up, so there is no separation and grabbing process between the sample box and the sample rod during the sample change process, which is safer and more reliable. In addition, by setting up a sample tube reset part, the position of the sample is adjusted during assembly, and the sample can be changed in two steps, thereby improving the sample change efficiency.
[0018] 2. The assembly materials of the present invention, such as springs, metal discs, motors, etc., are all very common elements, cheap and have good radiation resistance.
[0019] 3. The structure of the present invention is simple and reasonable, cheap and efficient, and the risk of error is small.
[0020] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0022] Figure 1 It is a schematic diagram of the structure of the present invention.
[0023] Figure 2 It is a cross-sectional view of the present invention.
[0024] Figure 3 It is a partial structural schematic diagram of the mounting plate of the present invention.
[0025] Figure 4 It is a schematic diagram of the structure of the travel groove part of the present invention.
[0026] Figure 5 It is a schematic diagram of the structure of the central rod part of the present invention.
[0027] Figure 6 It is a partial structural schematic diagram of the vertical linear module of the present invention.
[0028] Figure 7 It is a schematic diagram of the structure of the active gear shaft portion of the present invention.
[0029] Figure 8 yes Figure 2 A partial enlarged view of point A.
[0030] Fig. 9 It is a partial structural schematic diagram of the vacuum cover of the present invention.
[0031] In the figure: 1, base, 2, sample plate rotating mechanism, 3, sample feeding mechanism, 4, rack, 5, driver mounting box, 6, fixing plate, 7, monitoring camera, 8, vacuum cover, 11, mounting port, 21, mounting frame, 22, sample plate, 23, sample drive assembly, 24, sample rod, 25, sample box, 26, reset assembly, 211, mounting plate, 212, upper support plate, 213, lower support plate, 214, extension hole, 221, center rod, 222, disc, 223, inner through hole, 224, outer through hole, 231, second vacuum servo motor, 232, first harmonic reducer, 233, rotation Encoder, 241, annular groove, 261, guide rod, 262, slider, 263, tension spring, 2111, travel groove, 2112, micro switch, 2621, guide hole, 2622, fixing hole, 2623, fixing sleeve, 2624, annular protrusion, 31, bracket, 32, vertical linear module, 33, sample feeding seat, 34, sample feeding head, 35, rotation drive assembly, 36, first vacuum servo motor, 331, first shell, 332, second shell, 341, groove, 351, vacuum stepping motor, 352, second harmonic reducer, 353, driving gear shaft, 354, driven gear shaft. DETAILED DESCRIPTION
[0032] The technical solutions in the embodiments of the present invention are described clearly and completely below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0033] See also Figures 1 to 9In an embodiment of the present invention, a room temperature automatic sample changing device for neutron diffraction experiments includes a base 1, a sample tray rotating mechanism 2 and a sample feeding mechanism 3. The base 1 is provided with a mounting port 11, and the sample tray rotating mechanism 2 is arranged in the mounting port 11. The sample tray rotating mechanism 2 includes a mounting frame 21, a sample tray 22 rotatably arranged in the mounting frame 21, and a sample driving component 23 for driving the sample tray 22 to rotate. A plurality of sample rods 24 are erected along the circumference of the outer periphery of the sample tray 22, and a sample box 25 is arranged at the lower end of the sample rod 24. A plurality of reset components 26 corresponding to the sample rods 24 are arranged in the sample tray 22, and the reset components 26 are arranged in the sample tray 22. Under the action of the sample rod 24, the sample rod 24 always has an upward trend. The sample feeding mechanism 3 is arranged on the base 1 and is located on one side of the sample tray rotating mechanism 2. The sample feeding mechanism 3 is used to push one of the sample tubes down and drive it to rotate. When in use, the sample rod 24 is loaded on the edge of the sample tray 22 and just falls on the center of the installation port 11. The center position of the installation port 11 is on a vertical line with the center of the neutron beam during the experiment. The sample can be switched by driving the sample tray 22 around the center of the circle by the sample driving component 23. The position of the sample rod 24 on the sample tray 22 can be reached by rotating a specific angle to the center of the installation port 11, that is, directly above the beam center. Then, the sample rod 24 can be pushed down by the feeding mechanism to send the sample box 25 to the neutron beam center set in the experiment. After the experiment is over, the sample rod 24 can be raised and reset under the drive of the reset member. It should also be noted that the sample box and the sample rod are connected by threads. The sample box can be replaced with a clamping tool as needed to be suitable for more types of test samples.
[0034] The mounting frame 21 includes a mounting plate 211, and an upper support plate 212 and a lower support plate 213 are arranged at intervals on one side of the mounting plate 211. The sample tray 22 includes a central rod 221, and the central rod 221 is rotatably arranged between the upper support plate 212 and the lower support plate 213. The sample driving assembly 23 is arranged on the top of the upper support plate 212, and the upper end of the central rod 221 is connected to the driving end of the sample driving assembly 23. Three disks 222 are arranged at intervals on the central rod 221, and a plurality of external through holes 224 for sample tubes to pass through are provided on the disks 222. An extension hole 214 is provided on the lower support plate 213, and the center of the extension hole 214 is on the same axis as the center of one of the external through holes 224. It should be noted that the center of the extension hole 214 is directly above the beam center. During the experiment, the feeding mechanism pushes the sample rod 24 above the extension hole 214 to descend, so that the sample box 25 is delivered to the neutron beam center set in the experiment.
[0035] The sample delivery mechanism 3 includes a bracket 31, on which a vertical linear module 32 is provided, and the top of the vertical linear module 32 is transmission-connected to a first vacuum servo motor 36, and a sample delivery seat 33 is provided on the movable end of the vertical linear module 32, and a sample delivery head 34 is provided at the bottom of the sample delivery seat 33, and a rotating drive assembly 35 for driving the sample delivery head 34 to rotate is provided at the top of the sample delivery seat 33, and a groove 341 for the top end of the sample tube to extend into is provided at the bottom of the sample delivery head 34. During the sample delivery process, the sample delivery head 34 is driven by the vertical linear module 32 to descend, so as to push the sample rod 24 to descend and deliver the sample box 25 to the neutron beam center set in the experiment. During the experiment, the rotary motion of the first vacuum servo motor 36 is converted into linear motion through the vertical linear module 32, thereby driving the sample delivery head 34 to rise and fall. During the descent process, the sample delivery head 34 pushes the sample rod 24 above the extension hole 214 to descend, so that the sample box 25 is delivered to the neutron beam center set in the experiment. The sample delivery head 34 can rotate under the drive of the rotary drive component 35, thereby driving the sample rod 24 to rotate. Through the setting of the groove 341, the top of the sample tube can be embedded in the groove 341, so that the sample delivery head 34 and the sample rod 24 can be better connected. The vertical linear module 32 can use a screw slide.
[0036] The sample tube reset assembly 26 includes a guide rod 261, a slider 262 and a tension spring 263. An inner through hole 223 is provided on the disk 222. The guide rod 261 is inserted into the inner through hole 223. The slider 262 is slidably set on the guide rod 261. The slider 262 and the sample rod 24 are rigidly connected in the vertical direction. The tension spring 263 is sleeved on the guide rod 261. One end of the tension spring 263 is connected to the disk 222, and the other end of the tension spring 263 is connected to the slider 262. After the experiment is completed, the sample feeding head 34 rises under the drive of the vertical linear module 32. Under the action of the tension spring 263, the slider 262 moves up along the guide rod 261, thereby driving the sample rod 24 to rise and reset.
[0037] The slider 262 is provided with a guide hole 2621 for the guide rod 261 to pass through, and the slider 262 is also provided with a fixing hole 2622. A fixing sleeve 2623 is provided in the fixing hole 2622, and an annular protrusion 2624 is provided on the inner wall of the fixing sleeve 2623. An annular groove 241 is provided on the surface of the sample rod 24. The sample rod 24 is inserted into the fixing sleeve 2623, and the annular protrusion 2624 is embedded in the annular groove 241. In this way, the fixing sleeve 2623, the annular protrusion 2624 and the annular groove 241 are arranged to realize a rigid connection between the slider 262 and the sample rod 24 in the vertical direction, and the sample rod 24 can rotate freely in the horizontal direction.
[0038] The sample drive assembly 23 includes a second vacuum servo motor 231, a first harmonic reducer 232 and a rotary encoder 233. The rotating shaft of the second vacuum servo motor 231 is connected to the input end of the first harmonic reducer 232, the output end of the first harmonic reducer 232 is connected to the input end of the rotary encoder 233, and the output end of the rotary encoder 233 is connected to the center rod 221. The second vacuum servo motor 231 is used to drive the sample disk 22 to rotate, the first harmonic reducer 232 is used to reduce the rotation speed of the sample turntable, and the reduction ratio is 100. The rotary encoder 233 is used to detect and feedback the rotation angle of the sample disk 22, and the system accuracy is ±20.
[0039] The rotary drive assembly 35 includes a vacuum stepper motor 351, a second harmonic reducer 352, a driving gear shaft 353 and a driven gear shaft 354. The rotating shaft of the vacuum stepper motor 351 is connected to the input end of the second harmonic reducer 352, and the output end of the second harmonic reducer 352 is meshed with the driving gear shaft 353, and the driving gear shaft 353 is meshed with the driven gear shaft 354. The sample feeding head 34 is arranged at the lower end of the driven gear shaft 354. The vacuum stepper motor 351 is used to provide a driving force for driving the sample feeding head 34 to rotate, and the sample feeding head 34 is driven to rotate through the driving gear shaft 353 and the driven gear shaft 354. The second harmonic reducer 352 is used to make the sample feeding head 34 rotate at a low speed, and the reduction ratio is 80.
[0040] The sample feeding station 33 includes a first shell 331 and a second shell 332. The first shell 331 and the second shell 332 are connected to each other and are used to accommodate a driving gear shaft 353 and a driven gear shaft 354. The vacuum stepper motor 351 and the second harmonic reducer 352 are arranged on the top of the first shell 331. The lower end of the driven gear shaft 354 passes through the bottom of the second shell 332 and is connected to the sample feeding head 34. In this way, the sample feeding station 33 adopts a split structural design, which is convenient for installing the vacuum stepper motor 351, the second harmonic reducer 352, the driving gear shaft 353 and the driven gear shaft 354.
[0041] The automatic sample changing device also includes a frame 4, a base is arranged on the frame 4, a vacuum cover 8 is arranged on the top of the base 1, a sample tray rotating mechanism 2 and a sample feeding mechanism 3 are both arranged in the vacuum cover 8, a driver installation box 5 is arranged on the top of the vacuum cover 8, a fixing plate 6 is arranged at the bottom of the base 1, a monitoring camera 7 is arranged at the lower end of the fixing plate 6, the monitoring camera 7 faces the extension hole 214, the vacuum cover 8 is used to form a vacuum environment, the driver installation box 5 is used to install a control module, the control module can adopt Beckhoff CX5130-0125, EL1809, EL2809, EL5032, BK1110, the programming platform can adopt Twincat3, the programming language can adopt ST language, and the monitoring camera 7 is used to monitor the sample changing process to prevent the risk of sample falling.
[0042] Beckhoff control components are used to control the three axes of the three motors: the first vacuum servo motor 36, the second vacuum servo motor 231, and the vacuum stepper motor 351. The automatic sample changer includes several working modes, such as equipment self-diagnosis, equipment initialization, automatic mode, and manual mode. It includes input parameters such as the sample number to be tested, the descent distance, the sample rotation angle, and the sample rotation time, and displays the running speed of each axis, the current position / angle of each axis, the equipment operating status, and fault indication in real time. In automatic mode, you only need to enter the sample number to complete the sample change.
[0043] The mounting plate 211 is provided with a travel groove 2111 for the sample holder 33 to be raised and lowered. A micro switch 2112 is provided at the bottom of the travel groove 2111. The micro switch 2112 is used to prompt whether the sample rod 24 has reached the set position.
[0044] The working principle of the present invention is: the control module controls the sample driving assembly 23 to output corresponding movement through a set program, driving the central rod 221 to rotate, and the rotation of the central rod 221 drives the disk 222 to rotate, driving the sample rod 24 loaded on the disk 222 to move to above the extension hole 214 (directly above the beam center), and then the vertical linear module 32 drives the sample delivery head 34 to descend, and the descent of the sample delivery head 34 pushes the sample rod 24 located above the extension hole 214 to descend, so that the sample box 25 is delivered to the neutron beam center set in the experiment. After the experiment is over, the sample delivery head 34 rises and resets under the drive of the vertical linear module 32, and the sample rod 24 rises and resets under the action of the tension spring 263.
[0045] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be considered exemplary and non-restrictive in all respects, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention.
Claims
1. A room temperature automatic sample changing device for neutron diffraction experiments, characterized in that: include: A base, wherein a mounting opening is provided on the base; The sample tray rotating mechanism is arranged in the mounting opening, and comprises a mounting frame, a sample tray rotatably arranged in the mounting frame, and a sample driving assembly for driving the sample tray to rotate. A plurality of sample rods are erected along the circumference of the sample tray, and a sample box is arranged at the lower end of the sample rod. A plurality of reset assemblies corresponding to the sample rods are arranged in the sample tray, and under the action of the reset assemblies, the sample rods always have an upward trend; The sample delivery mechanism is arranged on the base and located on one side of the sample plate rotating mechanism, and is used to push one of the sample tubes down and drive it to rotate; The sample feeding mechanism includes a bracket, a vertical linear module is provided on the bracket, the top of the vertical linear module is transmission-connected to a first vacuum servo motor, a sample feeding seat is provided on the movable end of the vertical linear module, a sample feeding head is provided at the bottom of the sample feeding seat, a rotating drive assembly for driving the sample feeding head to rotate is provided at the top of the sample feeding seat, and a groove is provided at the bottom of the sample feeding head for the top end of the sample tube to extend into.
2. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: The mounting frame includes a mounting plate, an upper support plate and a lower support plate are spaced apart on one side of the mounting plate, the sample plate includes a center rod, the center rod is rotatably disposed between the upper support plate and the lower support plate, the sample drive assembly is disposed on the top of the upper support plate, the upper end of the center rod is connected to the drive end of the sample drive assembly, three disks are spaced apart on the center rod, a plurality of external through holes are provided on the disks for sample tubes to pass through, an extension hole is provided on the lower support plate, and the center of the extension hole is on the same axis as the center of one of the external through holes.
3. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: The sample rod resetting assembly includes a guide rod, a slider and a tension spring. An inner through hole is opened on the disk, the guide rod is inserted into the inner through hole, the slider is slidably arranged on the guide rod, the slider and the sample rod are rigidly connected in the vertical direction, the tension spring is sleeved on the guide rod, one end of the tension spring is connected to the disk, and the other end of the tension spring is connected to the slider.
4. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: The slider is provided with a guide hole for the guide rod to pass through, and the slider is also provided with a fixing hole, a fixing sleeve is provided in the fixing hole, an annular protrusion is provided on the inner wall of the fixing sleeve, an annular groove is provided on the surface of the sample rod, the sample rod is passed through the fixing sleeve, and the annular protrusion is embedded in the annular groove.
5. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 2, characterized in that: The sample driving assembly includes a second vacuum servomotor, a first harmonic reducer and a rotary encoder. The rotating shaft of the second vacuum servomotor is connected to the input end of the first harmonic reducer, the output end of the first harmonic reducer is connected to the input end of the rotary encoder, and the output end of the rotary encoder is connected to the center rod.
6. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: The rotary drive assembly includes a vacuum stepper motor, a second harmonic reducer, a driving gear shaft and a driven gear shaft. The rotating shaft of the vacuum stepper motor is connected to the input end of the second harmonic reducer, the output end of the second harmonic reducer is meshed with the driving gear shaft, the driving gear shaft and the driven gear shaft, and the sample feeding head is arranged at the lower end of the driven gear shaft.
7. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: The sample delivery stand includes a first shell and a second shell, which are connected to each other and are used to accommodate a driving gear shaft and a driven gear shaft. The vacuum stepper motor and the second harmonic reducer are arranged on the top of the first shell, and the lower end of the driven gear shaft passes through the bottom of the second shell and is connected to the sample delivery head.
8. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 1, characterized in that: It also includes a frame, a base is arranged on the frame, a vacuum cover is arranged on the top of the base, a sample plate rotating mechanism and a sample feeding mechanism are arranged in the vacuum cover, a driver mounting box is arranged on the top of the vacuum cover, a fixing plate is arranged at the bottom of the base, a monitoring camera is arranged at the lower end of the fixing plate, and the monitoring camera faces the extension hole.
9. The room temperature automatic sample changing device for neutron diffraction experiment according to claim 2, characterized in that: A travel groove for lifting and lowering the sample feeding seat is provided on the mounting plate, and a micro switch is provided at the bottom of the travel groove.
Citation Information
Patent Citations
Sample replacing device for neutron scattering experiment
CN105548226A
