An on-orbit inspection quality capture control simulation device and control method thereof

Abstract

The present application belongs to the technical field of space gravitational wave detection, and specifically discloses an on-orbit test mass capture control simulation device and its control method. The device includes a vacuum mechanism, a controller, a carrying platform, and a test mass, a torsion pendulum mechanism, a capture positioning mechanism, a capacitor control unit and a displacement measurement module arranged inside the vacuum mechanism; the torsion pendulum mechanism is used to suspend the test mass, and the capacitor control unit includes a plurality of capacitor plates arranged at intervals around the test mass, which is used to control the movement of the test mass by applying electrostatic force; when the test mass is subjected to external disturbance, the displacement measurement module measures the displacement information of the test mass relative to the original position, and then the controller controls the capacitor control unit and the capture positioning mechanism to adjust the posture of the test mass based on the displacement information. Through this application, the capture control of the disturbed test mass in the on-orbit state can be effectively simulated, and the accuracy of the capture control of the test mass is improved.

Description

Technical Field

[0001] The present application belongs to the technical field of space gravitational wave detection, and more specifically, to an on-orbit inspection mass capture control simulation device and a control method thereof. Background Art

[0002] Space gravitational wave detection is of great significance to fields such as general relativity, astronomical observation and cosmology. In the space gravitational wave detection mission, inertial sensors are one of the key payloads, and their internal test mass, locking and release mechanism and capacitor control system are important components. After the satellite reaches a certain orbital altitude, the locking and release mechanism in the inertial sensor needs to release the test mass so that it is suspended in the inertial sensor as an inertial reference for gravitational wave detection. During the free suspension process, the test mass may be disturbed by the outside world, causing its state to change, so it is necessary to re-capture, control and reposition the test mass.

[0003] In the prior art, a ground simulation evaluation device for on-orbit release of an inertial sensor is built on the ground, but it can only be used to study the adhesion characteristics generated by the contact between the test mass and the release mechanism when on-orbit, but cannot simulate the capture control of the test mass that is disturbed in the on-orbit state.

[0004] Therefore, how to effectively simulate the capture and control of disturbed inspection mass in the on-orbit state has become a technical problem that needs to be solved urgently in the industry. Summary of the invention

[0005] In view of the defects of the prior art, the purpose of the present application is to provide an on-orbit inspection mass capture control simulation device and a control method thereof, aiming to solve the problem in the prior art that it is impossible to simulate the capture control of the inspection mass that is disturbed in the on-orbit state.

[0006] To achieve the above-mentioned purpose, in a first aspect, the present application provides an on-orbit inspection mass capture control simulation device, comprising: a vacuum mechanism, a controller, a carrying platform, and an inspection mass, a torsion swing mechanism, a capture positioning mechanism, a capacitance control unit, and a displacement measurement module arranged inside the vacuum mechanism;

[0007] The vacuum mechanism is fixed on the carrying platform; the capture and positioning mechanism is arranged on the carrying platform and is movably arranged around the inspection mass; the displacement measurement module, the capacitance control unit and the capture and positioning mechanism are all connected to the controller;

[0008] The top end of the torsion swing mechanism is fixedly connected to the top inner wall of the vacuum mechanism, and the bottom end of the torsion swing mechanism is fixedly connected to the top end of the inspection mass to suspend the inspection mass;

[0009] The capacitance control unit comprises a plurality of capacitance plates arranged at intervals around the inspection mass, and is used to control the movement of the inspection mass by applying electrostatic force; the capture and positioning mechanism comprises a telescopic member, and the telescopic member contacts the inspection mass through the gaps between the capacitance plates, and is used to control the movement of the inspection mass by applying mechanical force;

[0010] The displacement measurement module is used to measure the displacement information of the inspection mass relative to the original position when the inspection mass is subjected to external disturbance, and send the displacement information to the controller;

[0011] The controller is used to control the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information.

[0012] Optionally, the torsion and sway mechanism includes a first torsion and sway mechanism and a second torsion and sway mechanism;

[0013] The first torsion pendulum mechanism includes a vacuum guide, an upper end suspension wire, a sleeve and a first clamp; the second torsion pendulum mechanism includes a steelyard, a balancing mass, a lower end suspension wire, a second clamp and a third clamp; the balancing mass is equal to the weight of the inspection mass;

[0014] The vacuum guide extends from the outside into the interior of the vacuum mechanism and is sealed and fixedly connected to the vacuum mechanism. The top end of the upper end suspension wire is fixedly connected to the vacuum guide through the sleeve, and the bottom end of the upper end suspension wire is fixedly connected to the middle part of the steelyard through the first clamp, so that the steelyard is arranged in parallel with the carrying platform.

[0015] One end of the beam balance is fixedly connected to the top end of the lower end suspension wire through the second clamp, and the bottom end of the lower end suspension wire is fixedly connected to the top end of the inspection mass through the third clamp; the other end of the beam balance is fixedly connected to the balancing mass for balancing the weight of the inspection mass.

[0016] Optionally, the capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass; each of the sub-mechanisms includes the telescopic member, the movable platform and the adapter plate, and the telescopic member is a plunger; the plunger contacts the inspection mass through the gap between the capacitor plates;

[0017] For each of the sub-mechanisms, the plunger is fixedly connected to the top of the mobile platform through the adapter plate, and is used to adjust the contact position between the plunger and the inspection mass through the movement of the mobile platform, and drive the plunger to adjust the posture of the inspection mass.

[0018] Optionally, the plunger comprises a column body and a column head;

[0019] The column body is a retractable cylindrical metal structure and is fixed to the top of the mobile platform through the adapter plate; the column head is a conical metal, and the diameter of the circular surface of the tail of the column head is the same as the diameter of the circular surface of the side of the column body; the top of the head of the column head is a plane, which is used to fit with the surface of the inspection mass.

[0020] Optionally, the device further comprises: an excitation module; the excitation module is arranged inside the vacuum mechanism and on the carrying platform, and is located on either side of the inspection mass;

[0021] The excitation module is used to apply external excitation to the inspection mass to change the posture of the inspection mass.

[0022] In a second aspect, the present application provides a control method applied to an on-orbit inspection mass capture control simulation device as described in any one of the above, the method comprising:

[0023] When it is detected that the inspection mass moves due to external disturbance, the controller controls the displacement measurement module to measure the displacement information of the inspection mass relative to the original position and obtains the displacement information;

[0024] The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information.

[0025] Optionally, the controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0026] When it is determined that the displacement information is within the displacement control range of the capacitor control unit and the posture of the inspection mass is not tilted, the controller controls the plate voltage of the capacitor control unit to adjust the electrostatic force applied to the inspection mass so that the inspection mass moves to the original position.

[0027] Optionally, the capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass; each of the sub-mechanisms includes the telescopic member, the mobile platform and the adapter plate, and the telescopic member is a plunger; the controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0028] When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is not tilted, the controller controls the target sub-mechanism closest to the inspection mass among the two sub-mechanisms to move, so that the target sub-mechanism drives its plunger to contact and push the inspection mass to move horizontally until the inspection mass is captured by the electrostatic force applied by the capacitance control unit;

[0029] The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

[0030] Optionally, the controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0031] When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is tilted, the controller controls each of the sub-mechanisms to act so that each of the sub-mechanisms drives its own plunger to adjust the tilted posture of the inspection mass until the posture of the inspection mass is restored;

[0032] The controller controls the target sub-mechanism to move so that the target sub-mechanism drives its plunger to push the proof mass to move horizontally until the proof mass is captured by the electrostatic force applied by the capacitance control unit;

[0033] The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

[0034] In a third aspect, the present application provides an electronic device, including:

[0035] at least one memory for storing a computer program;

[0036] At least one processor is used to execute the program stored in the memory. When the program stored in the memory is executed, the processor is used to execute any of the above methods.

[0037] In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method described in the first aspect or any possible implementation of the first aspect.

[0038] In a fifth aspect, the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method described in the first aspect or any possible implementation of the first aspect.

[0039] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art:

[0040] The present application provides an on-orbit inspection mass capture control simulation device and a control method thereof, the device comprising a vacuum mechanism, a controller, a carrying platform, and an inspection mass, a torsion mechanism, a capture positioning mechanism, a capacitance control unit and a displacement measurement module arranged inside the vacuum mechanism, the capture positioning mechanism being arranged on the carrying platform and movably arranged around the inspection mass, the capacitance control unit comprising a plurality of capacitance plates arranged at intervals around the inspection mass; by jointly controlling the capture positioning mechanism and the capacitance control unit, when the inspection mass is disturbed by the external environment, the capture positioning mechanism can be used to roughly adjust the posture of the inspection mass by applying mechanical force, and the capacitance control unit can be used to further fine-tune the posture of the inspection mass, thereby effectively simulating the capture control of the disturbed inspection mass in the on-orbit state and improving the accuracy of the capture control of the inspection mass. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 It is one of the structural schematic diagrams of the on-orbit inspection mass capture control simulation device provided in the embodiment of the present application;

[0042] Figure 2 It is a schematic diagram of a capture and positioning mechanism in an on-orbit inspection mass capture control simulation device provided in an embodiment of the present application;

[0043] Figure 3 It is a schematic diagram of the mechanism of the plunger in the on-orbit inspection mass capture control simulation device provided in an embodiment of the present application;

[0044] Figure 4 This is the second structural schematic diagram of the on-orbit inspection mass capture control simulation device provided in the embodiment of the present application;

[0045] Figure 5 It is one of the flow charts of the control method of the on-orbit inspection mass capture control simulation device provided in the embodiment of the present application;

[0046] Figure 6 This is the second flow chart of the control method of the on-orbit inspection mass capture control simulation device provided in the embodiment of the present application;

[0047] Figure 7 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] The terms "first", "second", etc. in the specification and claims herein are used to distinguish different objects rather than to describe a specific order of the objects. For example, a first sway mechanism and a second sway mechanism are used to distinguish different sway mechanisms rather than to describe a specific order of the sway mechanisms.

[0050] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0051] In the description of the embodiments of the present application, unless otherwise specified, “plurality” means more than two, for example, a plurality of capacitor plates means more than two capacitor plates, etc.

[0052] Figure 1 is one of the structural schematic diagrams of the on-orbit inspection quality capture control simulation device provided in the embodiment of the present application, such as Figure 1 As shown, the device comprises: a vacuum mechanism 1, a controller 7, a carrying platform 8, and a test mass 2, a torsion mechanism 3, a capture and positioning mechanism 4, a capacitance control unit 5 and a displacement measurement module 6 arranged inside the vacuum mechanism 1;

[0053] The vacuum mechanism 1 is fixed on the carrying platform 8; the capture and positioning mechanism 4 is arranged on the carrying platform 8 and is movably arranged around the inspection mass 2; the displacement measurement module 6, the capacitance control unit 5 and the capture and positioning mechanism 4 are all connected to the controller 7;

[0054] The top end of the torsion swing mechanism 3 is fixedly connected to the top inner wall of the vacuum mechanism 1, and the bottom end of the torsion swing mechanism 3 is fixedly connected to the top end of the inspection mass 2 to suspend the inspection mass;

[0055] The capacitance control unit 5 includes a plurality of capacitance plates 51 arranged at intervals around the inspection mass, and is used to control the movement of the inspection mass 2 by applying an electrostatic force; the capture and positioning mechanism 4 includes a telescopic member 411, and the telescopic member 411 contacts the inspection mass through the gaps between the capacitance plates 51, and is used to control the movement of the inspection mass 2 by applying a mechanical force;

[0056] The displacement measurement module 6 is used to measure the displacement information of the inspection mass 2 relative to the original position when the inspection mass 2 is subjected to external disturbance, and send the displacement information to the controller 7;

[0057] The controller 7 is used to control the capacitance control unit 5 and the capture and positioning mechanism 4 to adjust the posture of the inspection mass 2 based on the displacement information.

[0058] Specifically, in the embodiments of the present application, the interior of the vacuum mechanism is a vacuum environment for simulating the vacuum environment of space, and is provided with a test mass, a torsion pendulum mechanism, a capture and positioning mechanism, a capacitance control unit and a displacement measurement module.

[0059] The capacitance control unit includes a plurality of capacitance plates arranged at intervals around the inspection mass, and is used to control the movement of the inspection mass by applying electrostatic force.

[0060] In an embodiment of the present application, the vacuum mechanism is fixed on the carrying platform, the capture and positioning mechanism is arranged on the carrying platform, and is movably arranged around the inspection mass; the displacement measurement module can be arranged at any position around the inspection mass, as long as it ensures that the module can accurately measure the displacement of the inspection mass. In addition, the displacement measurement module, the capacitance control unit and the capture and positioning mechanism are all connected to the controller to perform measurement information exchange and electrical control. Among them, the position of the controller can be arranged inside the vacuum mechanism or outside the vacuum mechanism, and this application does not make specific restrictions on this.

[0061] The bearing platform may be a vibration isolation platform, so as to reduce the influence of ground vibration on the simulation results when the bearing platform is placed on the ground.

[0062] In an embodiment of the present application, the test mass is suspended at the center of the vacuum mechanism by a torsion pendulum mechanism, and the torsion pendulum mechanism is suspended on the inner wall of the top of the vacuum mechanism, so as to overcome the influence of the earth's gravity by suspending the test mass. Among them, the test mass can be a standard cubic mass block, and the specific material can be determined according to the material of the test mass used in the actual satellite. For example, the test mass can be a standard cube of 5 cm×5 cm×5 cm, and the material is a gold-platinum alloy, and its surface is processed by polishing, grinding, coating and other processes.

[0063] It should be noted that, in the embodiments of the present application, the torsion swing mechanism can be used as follows: Figure 1 The single pendulum mechanism shown can also adopt a two-stage pendulum system mechanism to further improve the flexibility and reliability of the torsion pendulum mechanism.

[0064] In an embodiment of the present application, the capture and positioning mechanism includes a telescopic member, wherein the telescopic member can be an electric telescopic rod device, a pneumatic telescopic rod device, or a hydraulic telescopic rod device. The telescopic member can be extended through the gap between the capacitor plates to contact the inspection mass, and push the inspection mass to move by applying mechanical force.

[0065] It should be noted that the telescopic member is arranged horizontally relative to the bearing platform, and its telescopic direction is the central axis direction in the horizontal direction of the inspection mass to ensure that it can push the inspection mass to move horizontally.

[0066] In an embodiment of the present application, the capacitance control unit includes a plurality of capacitance plates spaced apart around the inspection mass. By applying a control voltage to the capacitance plates, an electrostatic force can be further applied to the surrounding inspection mass, thereby controlling the movement of the inspection mass.

[0067] In the embodiments of the present application, a disturbance can be applied to the entire device from the outside, and the test mass changes its position due to inertia. An excitation module can also be set inside the vacuum mechanism to directly apply a disturbance to the test mass, so that the test mass changes its position. When the test mass is subjected to an external disturbance, the displacement measurement module can measure the displacement information of the test mass relative to the original position and send the displacement information to the controller.

[0068] It should be noted that, in the embodiments of the present application, the displacement measurement module may adopt a capacitive displacement sensor or an optical displacement sensor. When a capacitive displacement sensor is adopted, it may be located outside the vacuum mechanism and electrically connected to the capacitance control unit to detect the differential capacitance signal generated by the inspection mass and the capacitor plate, thereby determining the release displacement of the inspection mass; when an optical displacement sensor is adopted, it may be located inside the vacuum mechanism and arranged around the inspection mass to ensure that the detection light of the optical displacement sensor can pass through the gap between the capacitor plates, and optically detect the displacement of the inspection mass, thereby determining the release displacement of the inspection mass.

[0069] It is understandable that by measuring the displacement information of the inspection mass in various directions through the displacement measurement module, the displacement of the inspection mass in the horizontal direction parallel to the supporting platform and the posture tilt information in the vertical direction perpendicular to the supporting platform can be calculated.

[0070] It should also be noted that the original position of the test mass refers to the position where the test mass is in a static equilibrium state when the torsion pendulum mechanism has not swung and the test mass is suspended vertically.

[0071] Furthermore, in an embodiment of the present application, the controller can determine a corresponding control strategy based on the displacement information of the inspection mass measured by the displacement measurement module, and control the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass until the inspection mass returns to its original position.

[0072] In an embodiment of the present application, when it is determined that the displacement information of the inspection mass indicates that the inspection mass has only undergone a slight shift and its posture has not undergone a tilt change, the capacitance control unit can be directly used to apply an electrostatic force to fine-tune the position of the inspection mass to return the inspection mass to its original position; when it is determined that the displacement information of the inspection mass indicates that the inspection mass has undergone a large shift but its posture has not undergone a tilt change, the capture and positioning mechanism can be used to first coarsely adjust the position of the inspection mass by applying mechanical force, and then the capacitance control unit can be used to further fine-tune the position of the inspection mass, and ultimately the inspection mass can be returned to its original position.

[0073] In the embodiment of the present application, when the displacement information of the inspection mass indicates that the inspection mass has a large offset and its posture has also changed inclination, the capture and positioning mechanism can be used to adjust the posture and position of the inspection mass by applying mechanical force in sequence, and finally the capacitive control unit can be used to fine-tune the position of the inspection mass to return the inspection mass to its original position. In this way, it is possible to effectively simulate the capture control of the inspection mass under different degrees of disturbance in the on-orbit state.

[0074] The on-orbit inspection mass capture control simulation device of the embodiment of the present application comprises a vacuum mechanism, and an inspection mass, a torsion mechanism, a capture positioning mechanism, a capacitance control unit, a displacement measurement module, a controller and a carrying platform arranged inside the vacuum mechanism. The capture positioning mechanism is arranged on the carrying platform and is movably arranged around the inspection mass. The capacitance control unit comprises a plurality of capacitance plates arranged at intervals around the inspection mass. By jointly controlling the capture positioning mechanism and the capacitance control unit, when the inspection mass is disturbed by the external environment, the capture positioning mechanism can be used to roughly adjust the posture of the inspection mass by applying mechanical force, and the capacitance control unit can be used to fine-tune the posture of the inspection mass, thereby effectively simulating the capture control of the disturbed inspection mass in the on-orbit state and improving the accuracy of the capture control of the inspection mass.

[0075] Figure 2 is a schematic diagram of a capture and positioning mechanism in an on-orbit inspection quality capture control simulation device provided in an embodiment of the present application, such as Figure 2As shown, as an optional embodiment, the capture and positioning mechanism 4 includes two movable sub-mechanisms 41, and the two sub-mechanisms 41 are respectively arranged on both sides of the inspection mass; each sub-mechanism 41 includes a telescopic member 411, a movable platform 412 and an adapter plate 413, and the telescopic member 411 is a plunger; the plunger contacts the inspection mass 2 through the gap between the capacitor plates 51;

[0076] For each sub-mechanism, the plunger is fixedly connected to the top of the mobile platform 412 through the adapter plate 413, which is used to adjust the contact position between the plunger and the inspection mass 2 through the movement of the mobile platform 412, and drive the plunger to adjust the posture of the inspection mass 2.

[0077] It should be noted that, for the convenience of description, Figure 2 The main structure of the capture and positioning mechanism in the device is shown in the figure. For the structure of other parts of the device, please refer to Figure 1 shown.

[0078] Specifically, in an embodiment of the present application, the capture and positioning mechanism can be composed of two movable sub-mechanisms, and the two sub-mechanisms are respectively arranged on both sides of the inspection mass, that is, the positions of the two sub-mechanisms are relatively arranged to better jointly adjust the posture of the inspection mass.

[0079] More specifically, each sub-mechanism includes a telescopic member, a mobile platform and an adapter plate. Specifically, the telescopic member can be a plunger, which can contact the inspection mass through the gap between the capacitor plates; the mobile platform can be a six-degree-of-freedom electric translation stage, so that the entire sub-mechanism can move in different degrees of freedom, and then the plunger can be driven to gradually approach the inspection mass until it contacts the inspection mass.

[0080] Figure 3 Schematic diagram of the mechanism of the plunger in the on-orbit inspection mass capture control simulation device provided in the embodiment of the present application, as an optional embodiment, refer to Figure 2 and Figure 3 As shown, the plunger includes a column body 4111 and a column head 4112;

[0081] The column body 4111 is a retractable cylindrical metal structure and is fixed to the top of the mobile platform 412 through the adapter plate 413; the column head 4112 is a conical metal, and the diameter of the circular surface at the tail of the column head 4112 is the same as the diameter of the circular surface on the side of the column body 4111; the top of the head of the column head 4112 is a plane, which is used to fit with the surface of the inspection mass 2.

[0082] Specifically, in the embodiment of the present application, the plunger includes a column body and a column head, and the material of the plunger can be aluminum. The column head of the plunger is a conical metal, and the top of the head is a plane, which is used to fit the surface of the inspection mass. Specifically, it can be a cone with a diameter of 2mm at the top of the head, a diameter of 3mm at the tail, and a height of 1mm.

[0083] The plunger body is a retractable cylindrical metal structure, which is rigidly connected to the top of the mobile platform through an adapter plate. Specifically, it can be a cylinder with a diameter of 3mm on both sides and a maximum telescopic length of 30mm, which cooperates with the inspection mass to ensure that the driving column head is fully in contact with the inspection mass.

[0084] The device of the embodiment of the present application, by configuring the column body of the plunger to be a retractable cylindrical metal structure and configuring the column head to be a conical metal with a round surface at the top, can ensure that the column body drives the column head to fully fit and contact the inspection mass, which is beneficial to improving the effectiveness and reliability of capture control of the inspection mass.

[0085] Furthermore, in the embodiments of the present application, for each sub-mechanism, the plunger can be fixedly connected to the top of the mobile platform through an adapter plate. In this way, the top plunger is driven to move by the movement of the bottom mobile platform, thereby adjusting the contact position between the plunger and the inspection mass, and by driving the plunger to extend and retract the column body and the column head to fit in contact with the inspection mass, the position and posture of the inspection mass can be adjusted.

[0086] The device of the embodiment of the present application utilizes two identical substructures to construct a capture and positioning mechanism. Each substructure fixes the plunger to the mobile platform through an adapter plate, ensuring that the substructure can be independently moved and controlled. Furthermore, by arranging the substructures on both sides of the inspection mass, each substructure can adjust the posture and position of the inspection mass from a relative angle, thereby improving the reliability of capture control of the inspection mass under large-scale disturbances.

[0087] Figure 4 This is the second structural diagram of the on-orbit inspection quality capture control simulation device provided in the embodiment of the present application, such as Figure 4 As shown, as an optional embodiment, the torsion swing mechanism 3 includes a first torsion swing mechanism 31 and a second torsion swing mechanism 32;

[0088] The first torsion pendulum mechanism 31 includes a vacuum guide 311, an upper end suspension wire 312, a sleeve 313 and a first clamp 314; the second torsion pendulum mechanism 32 includes a steelyard 321, a balancing mass 322, a lower end suspension wire 323, a second clamp 324 and a third clamp 325; the balancing mass 322 is equal to the weight of the inspection mass 2;

[0089] The vacuum guide 311 extends from the outside into the interior of the vacuum mechanism 1 and is sealed and fixedly connected to the vacuum mechanism 1. The top end of the upper end suspension wire 312 is fixedly connected to the vacuum guide 311 through the sleeve 313. The bottom end of the upper end suspension wire 312 is fixedly connected to the middle part of the steelyard 321 through the first clamp 314, so that the steelyard 321 is arranged parallel to the carrying platform 8.

[0090] One end of the beam balance 321 is fixedly connected to the top end of the lower end suspension wire 323 through the second clamp 324, and the bottom end of the lower end suspension wire 323 is fixedly connected to the top end of the inspection mass 2 through the third clamp 325; the other end of the beam balance 321 is fixedly connected to a balancing mass 322 for balancing the weight of the inspection mass 2.

[0091] Specifically, in the embodiments of the present application, the torsion pendulum mechanism adopts a two-stage pendulum system structure, specifically including a first torsion pendulum mechanism and a second torsion pendulum mechanism connected in sequence. The first torsion pendulum mechanism extends from the outside into the interior of the vacuum mechanism through a vacuum guide, and is sealed and fixedly connected to the vacuum structure. The top end of the upper end suspension wire in the first torsion pendulum mechanism is fixedly connected to the vacuum guide through a sleeve, and the bottom end of the upper end suspension wire is fixedly connected to the middle part of the beam balance in the second torsion pendulum mechanism through a first clamp, so that the beam balance is arranged parallel to the bearing platform. In this way, it can be ensured that the torsion pendulum mechanism is securely connected, while ensuring the sealing of the vacuum mechanism.

[0092] In the second torsion pendulum mechanism, one end of the beam balance is fixedly connected to the top of the lower suspension wire through the second clamp, and the bottom of the lower suspension wire is fixedly connected to the top of the inspection mass through the third clamp, so as to suspend the inspection mass. At the same time, a balancing mass having the same weight as the inspection mass is fixedly connected to the other end of the beam balance, so as to balance the gravitational force on the inspection mass.

[0093] Among them, each clamp can be fixed by tightening screws.

[0094] The upper and lower suspension wires can be made of metal tungsten to ensure the toughness and swing flexibility of the suspension wires. In a specific embodiment, the upper suspension wire is about 50 cm long and about 250 μm in diameter, and the lower suspension wire is about 50 cm long and about 125 μm in diameter.

[0095] The device of the embodiment of the present application adopts a two-stage pendulum system, with one end of the beam balance fixedly connected to the lower suspension wire connected to the inspection mass, the middle connected to the upper suspension wire, and the other end fixedly connected to a balancing mass with the same weight as the inspection mass, so that the suspension wire suspension overcomes the influence of gravity on the inspection mass, and at the same time, the inspection mass has multiple degrees of freedom, which can better simulate the on-orbit state. In addition, compared with the single pendulum system, when the posture of the inspection mass tilts, the beam of the two-stage pendulum system will also tilt, and the position of the suspension point will change accordingly, which can effectively prevent the lower suspension wire from being broken and improve the reliability of the system.

[0096] Continue to refer to Figure 2 As an optional embodiment, the device further includes: an excitation module 9; the excitation module 9 is arranged inside the vacuum mechanism 1 and on the carrying platform 8, and is located on either side of the inspection mass 2;

[0097] The excitation module 9 is used to apply external excitation to the proof mass 2 to change the posture of the proof mass.

[0098] Specifically, in an embodiment of the present application, the device further comprises an excitation module, which is arranged inside the vacuum mechanism and on the carrying platform, and is located on either side of the inspection mass, as long as it is ensured that the excitation module can effectively apply the excitation to the inspection mass. For example, the excitation module can be arranged on the right side of the inspection mass.

[0099] It should be noted that, in this embodiment, the excitation module can be connected to the controller by wired or wireless communication, and the controller sends a control instruction to the excitation module to control the excitation module to apply external excitation to the inspection mass.

[0100] Furthermore, in this embodiment, the excitation module, as an external disturbance source, can apply external disturbance to the test mass by applying electrostatic force or mechanical force. Specifically, the excitation module can use capacitor plates to apply electrostatic force excitation to the test mass to deviate from its original position; the excitation module can also use an electric telescopic rod, which can contact the test mass through the gap between the capacitor plates, and apply external excitation to the test mass by applying thrust, so that the test mass is disturbed by the external environment, so as to simulate the capture control of the test mass by the device when the test mass is subjected to external disturbance.

[0101] The device of the embodiment of the present application can automatically apply external excitation to the inspection mass by introducing an excitation module, simulating the external environmental disturbance on the inspection mass, which helps to better simulate the capture control of the disturbed inspection mass in the on-orbit state and improve the accuracy of the capture control of the inspection mass.

[0102] The control method of the on-orbit inspection quality capture control simulation device provided in the present application is described below. The control method of the on-orbit inspection quality capture control simulation device described below and the on-orbit inspection quality capture control simulation device described above can be referenced to each other.

[0103] Figure 5 It is one of the flow charts of the control method of the on-orbit inspection quality capture control simulation device provided in the embodiment of the present application, which can be applied to any of the above-mentioned on-orbit inspection quality capture control simulation devices, such as Figure 5 As shown, the method includes:

[0104] Step 510, when it is detected that the inspection mass is moved due to external disturbance, the controller controls the displacement measurement module to measure the displacement information of the inspection mass relative to the original position and obtains the displacement information;

[0105] Step 520: The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information.

[0106] Specifically, in an embodiment of the present application, in step 510, the posture of the inspection mass inside the device is changed by external disturbance of the entire device or disturbance generated by the excitation module. At this time, when it is detected that the inspection mass moves due to the external disturbance, the controller will control the displacement measurement module to measure the displacement of the inspection mass to obtain the displacement information of the inspection mass relative to the original position. The displacement measurement module sends the above-mentioned measured displacement information to the controller, so that the controller can obtain the displacement information.

[0107] In an embodiment of the present application, in step 520, after the controller obtains the displacement information, it can determine a corresponding control strategy based on the displacement information, and then control the capacitor control unit and the capture and positioning mechanism to adjust the posture of the inspection mass until the inspection mass returns to its original position.

[0108] The control method of the on-orbit inspection mass capture control simulation device of the embodiment of the present application, by jointly controlling the capture positioning mechanism and the capacitance control unit, can utilize the capture positioning mechanism to roughly adjust the posture of the inspection mass by applying mechanical force when the inspection mass is disturbed by the external environment, and utilize the capacitance control unit to further fine-tune the posture of the inspection mass, thereby effectively simulating the capture control of the disturbed inspection mass in the on-orbit state and improving the accuracy of the capture control of the inspection mass.

[0109] Based on the content of the above embodiment, as an optional embodiment, the controller controls the capacitance control unit and the capture positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0110] When it is determined that the displacement information is within the displacement control range of the capacitance control unit and the posture of the inspection mass is not tilted, the controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the inspection mass to move the inspection mass to the original position.

[0111] Specifically, the displacement control range described in the embodiments of the present application refers to the distance range within which the electrostatic force applied by the capacitance control unit can drive the inspection mass to move horizontally relative to its original position, which can be set according to actual needs.

[0112] For example, the specific value of the displacement control range can be 0 to 1mm, that is, when it is judged that the displacement information of the inspection mass in the horizontal direction does not exceed 1mm, the electrostatic force applied by the capacitor control unit can drive the inspection mass to return to its original position and initial state; and when it is judged that the displacement information of the inspection mass in the horizontal direction exceeds 1mm, the electrostatic force applied by the capacitor control unit will not be able to drive the inspection mass to return to its original position and initial state.

[0113] In an embodiment of the present application, when it is determined that the displacement information is within the displacement control range of the capacitor control unit and it is judged that the posture of the inspection mass has not tilted, it means that the inspection mass has only undergone a small horizontal displacement. Therefore, the controller can directly control the plate voltage of the capacitor control unit, and by applying a feedback control voltage to the capacitor plate, it adjusts the electrostatic force applied to the inspection mass, so that the inspection mass moves to its original position.

[0114] The control method of the embodiment of the present application determines the displacement information of the inspection mass, and when it is determined that it is within the displacement control range of the capacitor control unit and the posture of the inspection mass is not tilted, directly controls the capacitor control unit to apply an electrostatic force to restore the inspection mass to its original position. In the scenario of tiny horizontal displacement, the capture control simulation of the inspection mass can be quickly realized with high control accuracy.

[0115] Based on the content of the above embodiment, as an optional embodiment, the capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass; each sub-mechanism includes a telescopic member, a mobile platform and an adapter plate, and the telescopic member is a plunger; the controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0116] When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is not tilted, the controller controls the target sub-mechanism that is closest to the inspection mass among the two sub-mechanisms to move, so that the target sub-mechanism drives its plunger to contact and push the inspection mass to move horizontally until the inspection mass is captured by the electrostatic force applied by the capacitance control unit;

[0117] The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

[0118] Specifically, in an embodiment of the present application, the capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass, and each sub-mechanism includes a telescopic member, a mobile platform and an adapter plate, and the telescopic member is a plunger. Among them, the mobile platform can adopt a six-degree-of-freedom electric translation platform, so that the entire sub-mechanism can move in multiple directions, thereby adjusting the contact position between the plunger and the inspection mass.

[0119] In an embodiment of the present application, when it is determined that the displacement information exceeds the displacement control range of the capacitance control unit, and the posture of the test mass is not tilted, it means that the test mass has undergone a large horizontal displacement, and the electrostatic force applied by the capacitance control unit can no longer drive the test mass to move. At this time, the controller can control the movement of the target sub-mechanism closest to the test mass in the two sub-mechanisms, and the target sub-mechanism gradually approaches the test mass through its mobile platform until its plunger contacts the test mass. Then, the target sub-mechanism further drives the plunger to push the test mass to move horizontally until the test mass enters the displacement control range of the capacitance control unit and is captured by the electrostatic force applied by the capacitance control unit. At this time, the target sub-mechanism drives the plunger to withdraw and no longer contacts the test mass.

[0120] Further, in an embodiment of the present application, the controller controls the plate voltage of the capacitor control unit, applies a feedback control voltage to the capacitor plate, and adjusts the electrostatic force applied to the inspection mass to move the inspection mass to an original position.

[0121] The control method of the embodiment of the present application judges the displacement information of the inspection mass. When it is determined that it exceeds the displacement control range of the capacitor control unit but the posture of the inspection mass has not tilted, it first controls the sub-mechanism in the capture and positioning mechanism to drive the inspection mass to move until it is captured by the electrostatic force applied by the capacitor control unit, and then uses the electrostatic force applied by the capacitor plates to fine-tune the position of the inspection mass until it is restored to its original position. This method can effectively realize the capture control simulation of the inspection mass in scenarios where large horizontal displacements occur, with high control accuracy.

[0122] Based on the content of the above embodiment, as an optional embodiment, the controller controls the capacitance control unit and the capture positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including:

[0123] When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is tilted, the controller controls the actions of each sub-mechanism so that each sub-mechanism drives its own plunger to adjust the tilted posture of the inspection mass until the posture of the inspection mass is restored;

[0124] The controller controls the target sub-mechanism to move so that the target sub-mechanism drives its plunger to push the inspection mass to move horizontally until the inspection mass is captured by the electrostatic force applied by the capacitance control unit;

[0125] The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

[0126] Specifically, in the embodiment of the present application, when it is determined that the displacement information not only exceeds the displacement control range of the capacitance control unit, but also the posture of the inspection mass is tilted, it means that the inspection mass has undergone a large horizontal displacement, and its posture has also tilted. At this time, the controller will control the two relatively arranged sub-mechanisms to move, and each sub-mechanism drives its own plunger to gradually approach the inspection mass until it contacts the inspection mass, and jointly drives each plunger in the front and rear directions of the inspection mass to adjust the tilted posture of the inspection mass until the normal posture of the inspection mass without tilt is restored.

[0127] Further, in an embodiment of the present application, the controller controls the target sub-mechanism closest to the inspection mass to move so that the target sub-mechanism drives the plunger to push the inspection mass to move horizontally, and at the same time, controls the plunger of another sub-mechanism to withdraw. In this way, the plunger of the target sub-mechanism drives the inspection mass to move continuously until the inspection mass enters the displacement control range of the capacitance control unit and is captured by the electrostatic force applied by the capacitance control unit. At this time, the target sub-mechanism drives the plunger to withdraw and no longer contacts the inspection mass.

[0128] Further, in an embodiment of the present application, the controller controls the plate voltage of the capacitor control unit, applies a feedback control voltage to the capacitor plate, and adjusts the electrostatic force applied to the inspection mass to move the inspection mass to an original position.

[0129] The control method of the embodiment of the present application judges the displacement information of the inspection mass. When it is determined that the displacement information exceeds the displacement control range of the capacitor control unit, but the posture of the inspection mass is also tilted, the sub-mechanism in the capture and positioning mechanism is first controlled to adjust the posture of the inspection mass, and then the plunger of the target sub-mechanism is driven to push the inspection mass to move until it is captured by the electrostatic force applied by the controlled capacitor control unit. Finally, the electrostatic force applied by the capacitor plates is used to fine-tune the position of the inspection mass until it is restored to its original position. This method can effectively realize the capture control simulation of the inspection mass in scenarios where large horizontal displacement occurs and the posture is tilted, with high control accuracy.

[0130] Figure 6 This is a second flow chart of a control method for an on-orbit inspection quality capture control simulation device provided in an embodiment of the present application, such as Figure 6As shown, in an embodiment of the present application, when the inspection mass is in the original position state, an excitation module is used to apply an excitation to the inspection mass to make it move, and determine how to restore it to the original position. The specific steps are as follows:

[0131] Step S1, applying an incentive to the inspection mass through an incentive module to change the state of the inspection mass;

[0132] Step S2, using a capacitive displacement sensor to monitor the differential capacitance signal between the proof mass and the capacitor plate, thereby measuring the displacement and posture generated by the proof mass.

[0133] Step S3, determining whether the displacement generated by the inspection mass exceeds the displacement control range of the capacitance control unit (ie, determining whether the displacement exceeds 1 mm), or whether a posture tilt occurs.

[0134] Step S4, if the displacement generated by the inspection mass does not exceed the displacement control range of the capacitor control unit and no posture tilt occurs, it means that the inspection mass has a slight offset. At this time, the capacitive displacement sensor is directly used to apply a feedback control voltage to the capacitor plate to generate an electrostatic force to return the inspection mass to its original position.

[0135] Step S5: If the displacement of the inspection mass exceeds the displacement control range of the capacitor control unit, but no posture tilt occurs, it means that the inspection mass has a large displacement. At this time, the capacitor plate is used to apply electrostatic force and plunger dual control. The specific steps are as follows:

[0136] Step S51, controlling the six-degree-of-freedom electric translation stage in the capture and positioning mechanism to drive the plunger to gradually approach the inspection mass until it contacts the inspection mass.

[0137] Step S52, driving the plunger to move the position of the proof mass until it can be controlled by the capacitance control unit, and the driving plunger is withdrawn and does not contact the proof mass.

[0138] Step S53, using a capacitive displacement sensor to apply a feedback control voltage to the capacitor plate to generate an electrostatic force to return the inspection mass to its original position.

[0139] Step S6: If the displacement of the inspection mass exceeds the displacement control range of the capacitor control unit and the posture tilt occurs, at this time, the capacitor plate is used to apply electrostatic force and plunger dual control, and the specific steps are as follows:

[0140] Step S61, controlling the six-degree-of-freedom electric translation stage in the capture and positioning mechanism to drive the plunger to gradually approach the inspection mass until it contacts the inspection mass.

[0141] Step S62, the driving plunger adjusts the posture of the proof mass until its posture is normal, and then drives the plunger to move the proof mass position until it can be captured and controlled by the electrostatic force applied by the capacitor plate. At the same time, the driving plunger is withdrawn and does not contact the proof mass.

[0142] Step S63, using a capacitive displacement sensor to apply a feedback control voltage to the capacitor plate to generate an electrostatic force to return the inspection mass to its original position.

[0143] Based on the method in the above embodiment, the embodiment of the present application provides an electronic device, which may include: a processor (Processor) 710, a communication interface (CommunicationsInterface) 720, a memory (Memory) 730 and a communication bus 740, wherein the processor 710, the communication interface 720, and the memory 730 communicate with each other through the communication bus 740. The processor 710 can call the logic instructions in the memory 730 to execute the method in the above embodiment.

[0144] In addition, the logic instructions in the above-mentioned memory 730 can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application.

[0145] Based on the method in the above embodiment, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method in the above embodiment.

[0146] Based on the method in the above embodiment, an embodiment of the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method in the above embodiment.

[0147] It is understandable that the processor in the embodiment of the present application may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor.

[0148] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, and the software modules can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an ASIC.

[0149] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions may be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)), etc.

[0150] It should be understood that the various numerical numbers involved in the embodiments of the present application are only used for the convenience of description and are not used to limit the scope of the embodiments of the present application.

[0151] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

[0152] In addition, it should be understood that expressions such as "including" and "may include" that may be used in the present application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In the present application, terms such as "including" and / or "having" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components, or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0153] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a detachable connection or a non-detachable connection; it can be a direct connection or an indirect connection through an intermediate medium. Among them, "fixed connection" means that the relative position relationship after connection remains unchanged. "Rotational connection" means that the two are connected to each other and can rotate relative to each other after connection. "Sliding connection" means that the two are connected to each other and can slide relative to each other after connection. The directional terms mentioned in the embodiments of the present application, such as "top", "bottom", "inside", "outside", "left", "right", etc., are only reference directions of the accompanying drawings. Therefore, the directional terms used are for better and clearer explanation and understanding of the embodiments of the present application, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the embodiments of the present application.

[0154] In addition, in the embodiments of the present application, the mathematical concepts mentioned are symmetry, equality, parallelism, verticality, etc. These limitations are all for the current state of the art, rather than being absolutely strict definitions in a mathematical sense, and allow a small amount of deviation, approximation to symmetry, approximation to equality, approximation to parallelism, approximation to verticality, etc. are all possible. For example, A and B are parallel, which means that A and B are parallel or approximately parallel, and the angle between A and B can be between 0 and 10 degrees. A and B are perpendicular, which means that A and B are perpendicular or approximately perpendicular, and the angle between A and B can be between 80 and 100 degrees.

[0155] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. An on-orbit inspection quality capture control simulation device, characterized in that: include: A vacuum mechanism, a controller, a carrying platform, and a test mass, a torsion pendulum mechanism, a capture and positioning mechanism, a capacitance control unit, and a displacement measurement module arranged inside the vacuum mechanism; The vacuum mechanism is fixed on the carrying platform; the capture and positioning mechanism is arranged on the carrying platform and is movably arranged around the inspection mass; the displacement measurement module, the capacitance control unit and the capture and positioning mechanism are all connected to the controller; The top end of the torsion swing mechanism is fixedly connected to the top inner wall of the vacuum mechanism, and the bottom end of the torsion swing mechanism is fixedly connected to the top end of the inspection mass to suspend the inspection mass; The capacitance control unit includes a plurality of capacitance plates spaced around the proof mass, and is used to control the movement of the proof mass by applying electrostatic force; The capture and positioning mechanism includes a telescopic member, the telescopic member contacts the inspection mass through the gap between the capacitor plates, and is used to control the movement of the inspection mass by applying a mechanical force; The capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass; each of the sub-mechanisms includes the telescopic member, the movable platform and the adapter plate, and the telescopic member is a plunger; the plunger contacts the inspection mass through the gap between the capacitor plates; For each of the sub-mechanisms, the plunger is fixedly connected to the top of the mobile platform through the adapter plate, and is used to adjust the contact position between the plunger and the inspection mass through the movement of the mobile platform, and drive the plunger to adjust the posture of the inspection mass.

2. The on-orbit inspection quality capture control simulation device according to claim 1, characterized in that: The torsion and sway mechanism comprises a first torsion and sway mechanism and a second torsion and sway mechanism; The first torsion pendulum mechanism includes a vacuum guide, an upper end suspension wire, a sleeve and a first clamp; the second torsion pendulum mechanism includes a steelyard, a balancing mass, a lower end suspension wire, a second clamp and a third clamp; the balancing mass is equal to the weight of the inspection mass; The vacuum guide extends from the outside into the interior of the vacuum mechanism and is sealed and fixedly connected to the vacuum mechanism. The top end of the upper end suspension wire is fixedly connected to the vacuum guide through the sleeve, and the bottom end of the upper end suspension wire is fixedly connected to the middle part of the steelyard through the first clamp, so that the steelyard is arranged in parallel with the carrying platform. One end of the beam balance is fixedly connected to the top end of the lower end suspension wire through the second clamp, and the bottom end of the lower end suspension wire is fixedly connected to the top end of the inspection mass through the third clamp; the other end of the beam balance is fixedly connected to the balancing mass for balancing the weight of the inspection mass.

3. The on-orbit inspection quality capture control simulation device according to claim 1, characterized in that: The displacement measurement module is used to measure the displacement information of the inspection mass relative to the original position when the inspection mass is subjected to external disturbance, and send the displacement information to the controller; The controller is used to control the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information.

4. The on-orbit inspection quality capture control simulation device according to claim 3, characterized in that: The plunger comprises a column body and a column head; The column body is a retractable cylindrical metal structure and is fixed to the top of the mobile platform through the adapter plate; the column head is a conical metal, and the diameter of the circular surface of the tail of the column head is the same as the diameter of the circular surface of the side of the column body; the top of the head of the column head is a plane, which is used to fit with the surface of the inspection mass.

5. The on-orbit inspection mass capture control simulation device according to any one of claims 1 to 4, characterized in that: The device further comprises: an excitation module; the excitation module is arranged inside the vacuum mechanism and on the carrying platform, and is located on either side of the inspection mass; The excitation module is used to apply external excitation to the inspection mass to change the posture of the inspection mass.

6. A control method applied to the on-orbit inspection mass capture control simulation device as claimed in any one of claims 1 to 5, characterized in that: The method comprises: When it is detected that the inspection mass moves due to external disturbance, the controller controls the displacement measurement module to measure the displacement information of the inspection mass relative to the original position and obtains the displacement information; The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information.

7. The control method of the on-orbit inspection mass capture control simulation device according to claim 6, characterized in that: The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including: When it is determined that the displacement information is within the displacement control range of the capacitor control unit and the posture of the inspection mass is not tilted, the controller controls the plate voltage of the capacitor control unit to adjust the electrostatic force applied to the inspection mass so that the inspection mass moves to the original position.

8. The control method of the on-orbit inspection mass capture control simulation device according to claim 6, characterized in that: The capture and positioning mechanism includes two movable sub-mechanisms, which are respectively arranged on both sides of the inspection mass; each of the sub-mechanisms includes the telescopic member, a movable platform and an adapter plate, and the telescopic member is a plunger; The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including: When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is not tilted, the controller controls the target sub-mechanism closest to the inspection mass among the two sub-mechanisms to move, so that the target sub-mechanism drives its plunger to contact and push the inspection mass to move horizontally until the inspection mass is captured by the electrostatic force applied by the capacitance control unit; The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

9. The control method of the on-orbit inspection mass capture control simulation device according to claim 8, characterized in that: The controller controls the capacitance control unit and the capture and positioning mechanism to adjust the posture of the inspection mass based on the displacement information, including: When it is determined that the displacement information exceeds the displacement control range of the capacitance control unit and the posture of the inspection mass is tilted, the controller controls each of the sub-mechanisms to act so that each of the sub-mechanisms drives its own plunger to adjust the tilted posture of the inspection mass until the posture of the inspection mass is restored; The controller controls the target sub-mechanism to move so that the target sub-mechanism drives its plunger to push the proof mass to move horizontally until the proof mass is captured by the electrostatic force applied by the capacitance control unit; The controller controls the plate voltage of the capacitance control unit to adjust the electrostatic force applied to the proof mass to move the proof mass to the original position.

10. An electronic device, characterized in that: include: at least one memory for storing a computer program; At least one processor is used to execute the program stored in the memory. When the program stored in the memory is executed, the processor is used to execute the method according to any one of claims 6 to 9.

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