Insertion status detection module and method for memory stick plug-in test
By using normally closed detection contact group and detection unit in the memory stick test module, the memory stick insertion status and display the results, the poor contact problem caused by inaccurate plugging and unplugging is solved, and the test pass rate and efficiency are improved.
Patent Information
- Application Number
- CN202411287641.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-14
- Publication Date
- 2025-01-14
- Estimated Expiration
- 2044-09-14
AI Technical Summary
Among the existing memory stick test methods, 80% of the test failures are due to poor contact caused by inaccurate plugging and unfailed memory sticks, which may increase the test time and the unfailed memory stick may be missed.
Design an insertion state detection module for memory stick plug-in test, including two sets of normally closed detection contact groups and detection units, to judge the memory stick insertion status by detecting the opening and closing status of the contacts, and display the brightness level of the indicator light As a result, make sure the memory stick is completely inserted to avoid poor contact.
It effectively improves the test pass rate, saves repeated test time, avoids failure caused by poor contact, and ensures the accuracy and efficiency of the test.
Smart Images

Figure CN118819989B_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of memory testing, and in particular relates to an insertion state detection module and method for a memory stick plug-in test. Background Art
[0002] Testing of memory sticks (RAM) is an important step to ensure the reliability and performance of computer memory. Currently, the KT-5SLT machine is commonly used in this field to test memory sticks.
[0003] In the process of testing memory sticks on the KT-5SLT machine, among all the results of unable to boot / Training Failure, about 80% are caused by poor contact caused by inaccurate insertion and removal of the memory stick. In contrast, only about 20% of the failures are caused by electrical problems of the memory stick itself, and this part is the real failure that needs to be caught. It can be seen that there are 4 times more failures.
[0004] The current solution is to perform multiple rounds of testing, collect all faulty memory sticks together, and then perform another round of testing, giving you an extra chance to reinsert and remove memory sticks to filter out the memory sticks that were faulty in the first round but are actually not faulty.
[0005] However, this approach has at least two drawbacks:
[0006] 1. Increased testing time;
[0007] Second, even if a second round of testing is performed, the probability of poor contact will still apply, and a small number of non-faulty memory sticks will eventually be missed. Summary of the invention
[0008] The purpose of the present invention is to provide an insertion state detection module and method for memory stick plug-in test, so as to solve the problems of increased test time and missing of a small number of non-faulty memory sticks in the existing test method.
[0009] In order to achieve the above object, the present invention adopts the following technical solutions:
[0010] In a first aspect, the present invention provides an insertion status detection module for a memory stick plug-in test, wherein the insertion status detection module is integrated on a memory stick plug-in test motherboard, and a memory slot is provided on the memory stick plug-in test motherboard. The insertion status detection module comprises:
[0011] Two detection contact groups, both of which are arranged in the memory slots, each detection contact group includes two detection contacts, and the two detection contacts in each group are of a normally closed structure;
[0012] The detection unit, each group of two detection contacts are electrically connected to the detection unit, and is used to determine the opening and closing status of the two detection contacts in each group, and to display the opening and closing status of the two detection contacts in each group.
[0013] Preferably, a pin area and two non-pin areas are provided in the memory slot, the pin area is located between the two non-pin areas, two groups of detection contact groups are respectively arranged at the bottom of the two non-pin areas, and the two detection contacts of each group are respectively fixed on the inner wall of the memory slot.
[0014] Preferably, the two detection contacts in each group are spring sheets.
[0015] Preferably, the detection unit comprises:
[0016] Power module;
[0017] A logic controller, wherein the power output terminal of the power module is electrically connected to the power input terminal of the logic controller, and the four detection contacts are electrically connected to the four signal ports of the logic controller respectively;
[0018] An indicator light, wherein a power input terminal of the indicator light is electrically connected to a power output terminal of the logic controller;
[0019] The logic controller is used to: obtain level signals of four signal ports, determine the opening and closing states of two detection contacts in each group according to the level signals of the four signal ports, generate brightness adjustment instructions based on the opening and closing states of the two detection contacts in each group, adjust the brightness level of the indicator light based on the brightness adjustment instructions, and display the opening and closing states of the two detection contacts in each group with the brightness level of the indicator light.
[0020] Preferably, the opening and closing states of the two detection contacts of each group include: the two detection contacts are in the on state or the two detection contacts are in the separated state, and the brightness level includes: the indicator light is fully on, the indicator light is slightly on or the indicator light is off;
[0021] Among them, when the two detection contacts of the two groups are in the connected state, the brightness level is that the indicator light is off; when the two detection contacts of one group are in the connected state and the two detection contacts of the other group are in the separated state, the brightness level is that the indicator light is slightly bright; when the two detection contacts of the two groups are in the separated state, the brightness level is that the indicator light is fully bright.
[0022] In a second aspect, the present invention provides an insertion state detection method for a memory stick plug-in test, the method being applied to an insertion state detection module for a memory stick plug-in test, the insertion state detection module being integrated on a memory stick plug-in test motherboard, the memory stick plug-in test motherboard being provided with a memory slot, the insertion state detection module comprising: two groups of detection contact groups and a detection unit, the two groups of detection contact groups being arranged in the memory slot, each group of detection contact groups comprising two detection contacts, the two detection contacts of each group being a normally closed structure; the two detection contacts of each group being electrically connected to the detection unit; the method comprising:
[0023] Determine the open and closed states of the two detection contacts of each group;
[0024] The opening and closing states of the two detection contacts of each group are displayed.
[0025] Preferably, the detection unit comprises: a power module, a logic controller and an indicator light, the power output end of the power module is electrically connected to the power input end of the logic controller, and the four detection contacts are electrically connected to the four signal ports of the logic controller respectively; the power input end of the indicator light is electrically connected to the power output end of the logic controller; determining the opening and closing states of the two detection contacts of each group comprises:
[0026] Get the level signals of four signal ports;
[0027] The opening and closing states of the two detection contacts in each group are determined according to the level signals of the four signal ports, wherein the opening and closing states of the two detection contacts in each group include: the two detection contacts are in the connected state or the two detection contacts are in the separated state.
[0028] Preferably, the opening and closing states of the two detection contacts of each group are displayed, including:
[0029] Generate a brightness adjustment instruction based on the opening and closing states of the two detection contacts of each group;
[0030] The brightness level of the indicator light is adjusted based on the brightness adjustment instruction, and the opening and closing states of the two detection contacts of each group are displayed according to the brightness level of the indicator light.
[0031] Preferably, the brightness levels include: the indicator light is fully on, the indicator light is dimly lit or the indicator light is off; wherein, when the two detection contacts of the two groups are both in the on state, the brightness level is the indicator light is off; when the two detection contacts of one group are in the on state and the two detection contacts of the other group are in the separated state, the brightness level is the indicator light is dimly lit; when the two detection contacts of the two groups are in the separated state, the brightness level is the indicator light is fully on.
[0032] Beneficial effects:
[0033] 1. After the memory stick is inserted into the memory slot, since there are two groups of detection contacts in the memory slot, and the two detection contacts in each group are of a normally closed structure, when the memory stick is fully inserted into the memory slot, the two detection contacts of the normally closed structure will separate. When the memory stick is tilted or not fully inserted after insertion, there will be two detection contacts that remain connected; therefore, the detection unit can detect the open and closed state of the two detection contacts in each group, and can determine whether the memory stick is fully inserted into the memory slot; therefore, before the test machine starts to perform the test task, the operator can understand whether the contact between the memory stick and the memory slot is good, eliminating the failure caused by poor contact, greatly improving the pass rate; and can avoid repeated testing, saving a lot of repeated testing time costs;
[0034] 2. The insertion status detection module of the present invention has the advantages of simple structure, convenient insertion status detection and strong practicality. BRIEF DESCRIPTION OF THE DRAWINGS
[0035] The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the following specific embodiments, they are used to explain the embodiments of the present invention, but do not constitute a limitation on the embodiments of the present invention. In the accompanying drawings:
[0036] Figure 1 It is a block diagram of an insertion status detection module for a memory stick plug-in test provided by an embodiment of the present invention;
[0037] Figure 2 is a schematic diagram of the structure of a memory slot provided by an embodiment of the present invention;
[0038] Figure 3 is a cross-sectional schematic diagram provided by an embodiment of the present invention;
[0039] Figure 4 The present invention provides a flowchart of a method for detecting the insertion state of a memory stick plug-in test in accordance with an embodiment of the present invention.
[0040] Description of Reference Numerals
[0041] 1. Memory slot; 2. Detection contacts. DETAILED DESCRIPTION
[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the present invention will be briefly introduced below in combination with the drawings and the description of the embodiments or the prior art. Obviously, the following description of the structure of the drawings is only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. It should be noted that the description of these embodiments is used to help understand the present invention, but does not constitute a limitation of the present invention.
[0043] Embodiment 1
[0044] Figure 1 FIG. 1 is a block diagram of an insertion state detection module for a memory stick plug-in test provided by an embodiment of the present invention, such as Figure 1 As shown, this embodiment provides an insertion state detection module for a memory stick plug-in test, the insertion state detection module is integrated on a memory stick plug-in test motherboard, the memory stick plug-in test motherboard is provided with a memory slot 1, and the insertion state detection module includes:
[0045] Two detection contact groups, both detection contact groups are arranged in the memory slot, each detection contact group includes two detection contacts 2, and the two detection contacts 2 of each group are normally closed structures, such as Figure 2 As shown;
[0046] The detection unit, each group of two detection contacts 2 is electrically connected to the detection unit, and is used to determine the opening and closing state of the two detection contacts 2 of each group, and to display the opening and closing state of the two detection contacts 2 of each group.
[0047] In this embodiment, the memory slot 1 is divided into a pin area and a non-pin area. The pin area is located in the middle of the memory slot 1, and the non-pin area is located at both ends of the memory slot 1, that is, the pin area is located between the two non-pin areas. The pin area of the conventional memory slot 1 (socket) has 288 pins (288-pin). 144 pins are arranged on one side of the memory slot 1, and 144 pins are arranged on the other side. There is a gap between each pair of pins. When the memory stick is inserted into the memory slot 1, the pins contact the gold fingers on the memory stick. , realizing the electrical connection between the memory stick and the pins; after the memory stick is inserted into the memory slot 1, the insulating area of the memory stick is located in the non-pin area, at this time, the two groups of detection contact groups are respectively arranged at the bottom of the two non-pin areas, and the two detection contacts 2 of each group are respectively fixed on the inner wall of the memory slot; since the two detection contacts 2 of each group are normally closed, that is, when the memory stick is not inserted into the memory slot 1, the two detection contacts 2 of each group are in contact with each other, and when the memory stick is fully inserted into the memory slot 1, the two detection contacts 2 of the two groups will be separated.
[0048] Therefore, when the present invention tests the memory stick, after the operator inserts the memory stick into the memory slot 1 of the test motherboard, since the memory slot 1 is provided with two groups of detection contact groups, and the two detection contacts 2 of each group are of a normally closed structure, when the memory stick is fully inserted into the memory slot 1, the two detection contacts 2 of the normally closed structure will separate, and when the memory stick is tilted after insertion or is not fully inserted, there will be two detection contacts 2 that remain in the connected state; at this time, the detection unit can detect the open and closed state of the two detection contacts 2 of each group, and can determine whether the memory stick is fully inserted into the memory slot 1; therefore, before the test machine starts to execute the test task, the operator can understand whether the contact between the memory stick and the memory slot 1 is good, thereby eliminating the failure caused by poor contact and greatly improving the pass rate; and it can avoid repeated testing and save a lot of time cost for repeated testing.
[0049] As a further optimization of this embodiment, the two detection contacts 2 in each group are both spring pieces, which are made of copper material and have good elasticity.
[0050] As a further optimization of this embodiment, Figure 3 As shown, the detection unit includes: a power module, a logic controller and an indicator light;
[0051] The power module is used to provide working power for the logic controller, the power output end of the power module is electrically connected to the power input end of the logic controller, and the four detection contacts 2 are electrically connected to the four signal ports of the logic controller respectively; the power input end of the indicator light is electrically connected to the power output end of the logic controller;
[0052] The logic controller is used to: obtain the level signals of the four signal ports, determine the opening and closing states of the two detection contacts 2 of each group according to the level signals of the four signal ports, generate a brightness adjustment instruction based on the opening and closing states of the two detection contacts 2 of each group, adjust the brightness level of the indicator light based on the brightness adjustment instruction, and display the opening and closing states of the two detection contacts 2 of each group with the brightness level of the indicator light.
[0053] In this embodiment, the four signal ports of the logic controller are A+ port, A- port, B+ port and B- port respectively; the logic control can adjust the voltage output by the power output end of the logic control according to the brightness adjustment instruction to realize the brightness adjustment of the indicator light, so as to facilitate the display of different opening and closing states and facilitate the operator to observe.
[0054] For the first detection contact group: the A+ port of the logic controller is electrically connected to one of the detection contacts 2 of the first detection contact group, and the A- port is electrically connected to the other detection contact 2 of the first detection contact group. After the A+ port outputs a high level, when the two detection contacts 2 of the first group are closed, the A- port can detect a high level, and when the two detection contacts 2 of the first group are disconnected, the A- port can detect a low level.
[0055] For the second group of detection contacts: the B+ port of the logic controller is electrically connected to one of the detection contacts 2 of the second group of detection contacts, and the B- port is electrically connected to the other detection contact 2 of the second group of detection contacts. After the B+ port outputs a high level, when the two detection contacts 2 of the second group are closed, the B- port can detect a high level, and when the two detection contacts 2 of the second group are disconnected, the B- port can detect a low level.
[0056] Therefore, the opening and closing states of the two detection contacts 2 of the two groups can be determined according to the level changes of the A-port and the B-port. When the two detection contacts 2 of the two groups are disconnected at the same time, it indicates that all the memory sticks are inserted into the memory slots 1, thus avoiding poor contact failure caused by the memory sticks being inserted offset or not fully inserted.
[0057] As a further optimization of this embodiment, the opening and closing states of the two detection contacts 2 of each group include: the two detection contacts 2 are in the connected state or the two detection contacts 2 are in the separated state, and the brightness level includes: the indicator light is fully on, the indicator light is slightly on, or the indicator light is off;
[0058] Among them, when the two detection contacts 2 of the two groups are in the connected state, the brightness level is that the indicator light is off; when the two detection contacts 2 of one group are in the connected state and the two detection contacts 2 of the other group are in the separated state, the brightness level is that the indicator light is slightly bright; when the two detection contacts 2 of the two groups are in the separated state, the brightness level is that the indicator light is fully bright.
[0059] In this embodiment, the indicator light may be an LED light, which may emit colored light, such as yellow light. When the two detection contacts 2 of the two groups are not separated, the LED light is off, indicating that the memory stick is not inserted into the memory slot 1, for example, it is placed between the two slots, or is lightly placed in the memory slot 1 but not pressed down.
[0060] When only one set of two detection contacts 2 are not separated, the LED light is dark yellow, indicating that the memory stick is inserted into the memory slot 1, but the level is not flat, one side is high and the other side is low (this situation occurs most frequently in Failure);
[0061] When the two detection contacts 2 of the two groups are separated, the LED light is yellow, indicating that the memory stick is normally inserted into the memory slot 1.
[0062] The insertion state detection module of the present invention has the advantages of simple structure, convenient insertion state detection and strong practicality.
[0063] Embodiment 2
[0064] Figure 4 FIG. 1 is a flow chart of a method for detecting the insertion status of a memory stick plug-in test provided by an embodiment of the present invention. Figure 4 As shown, this embodiment provides an insertion status detection method for a memory stick plug-in test, the method is applied to an insertion status detection module for a memory stick plug-in test, the insertion status detection module is integrated on a memory stick plug-in test mainboard, a memory slot 1 is provided on the memory stick plug-in test mainboard, the insertion status detection module comprises: two groups of detection contact groups and a detection unit, the two groups of detection contact groups are arranged in the memory slot, each group of detection contact groups comprises two detection contacts 2, the two detection contacts 2 of each group are of a normally closed structure; the two detection contacts 2 of each group are electrically connected to the detection unit; the detection unit comprises: a power supply module, a logic controller and an indicator light; the power output end of the power supply module is electrically connected to the power input end of the logic controller, and the four detection contacts 2 are electrically connected to the four signal ports of the logic controller respectively; the power input end of the indicator light is electrically connected to the power output end of the logic controller.
[0065] The method comprises:
[0066] Step S10: determining the opening and closing states of the two detection contacts 2 of each group;
[0067] Specifically, determining the open and closed states of the two detection contacts 2 of each group includes:
[0068] Step S101: obtaining level signals of four signal ports;
[0069] Step S102: judging the opening and closing state of the two detection contacts 2 of each group according to the level signals of the four signal ports, wherein the opening and closing state of the two detection contacts 2 of each group includes: the two detection contacts 2 are in the connected state or the two detection contacts 2 are in the separated state.
[0070] In this embodiment, the four signal ports of the logic controller are A+ port, A- port, B+ port and B- port;
[0071] For the first detection contact group: the A+ port of the logic controller is electrically connected to one of the detection contacts 2 of the first detection contact group, and the A- port is electrically connected to the other detection contact 2 of the first detection contact group. After the A+ port outputs a high level, when the two detection contacts 2 of the first group are closed, the A- port can detect a high level, and when the two detection contacts 2 of the first group are disconnected, the A- port can detect a low level.
[0072] For the second group of detection contacts: the B+ port of the logic controller is electrically connected to one of the detection contacts 2 of the second group of detection contacts, and the B- port is electrically connected to the other detection contact 2 of the second group of detection contacts. After the B+ port outputs a high level, when the two detection contacts 2 of the second group are closed, the B- port can detect a high level, and when the two detection contacts 2 of the second group are disconnected, the B- port can detect a low level.
[0073] Step S20: displaying the opening and closing states of the two detection contacts 2 of each group.
[0074] Specifically, the opening and closing states of the two detection contacts 2 of each group are displayed, including:
[0075] Step S201: generating a brightness adjustment instruction based on the opening and closing states of the two detection contacts 2 of each group;
[0076] Step S202: adjusting the brightness level of the indicator light based on the brightness adjustment instruction, and displaying the opening and closing states of the two detection contacts 2 of each group according to the brightness level of the indicator light.
[0077] In this embodiment, the logic control can adjust the voltage output by the power output terminal of the logic control according to the brightness adjustment instruction to achieve brightness adjustment of the indicator light, so as to display different opening and closing states and facilitate observation by the operator.
[0078] Therefore, the opening and closing states of the two detection contacts 2 of the two groups can be determined according to the level changes of the A-port and the B-port. When the two detection contacts 2 of the two groups are disconnected at the same time, it indicates that all the memory sticks are inserted into the memory slots 1, thus avoiding poor contact failure caused by the memory sticks being inserted offset or not fully inserted.
[0079] As a further optimization of this embodiment, the opening and closing states of the two detection contacts 2 of each group include: the two detection contacts 2 are in the connected state or the two detection contacts 2 are in the separated state, and the brightness level includes: the indicator light is fully on, the indicator light is slightly on, or the indicator light is off;
[0080] Among them, when the two detection contacts 2 of the two groups are in the connected state, the brightness level is that the indicator light is off; when the two detection contacts 2 of one group are in the connected state and the two detection contacts 2 of the other group are in the separated state, the brightness level is that the indicator light is slightly bright; when the two detection contacts 2 of the two groups are in the separated state, the brightness level is that the indicator light is fully bright.
[0081] In this embodiment, the indicator light may be an LED light, which may emit colored light, such as yellow light. When the two detection contacts 2 of the two groups are not separated, the LED light is off, indicating that the memory stick is not inserted into the memory slot 1, for example, it is placed between the two slots, or is lightly placed in the memory slot 1 but not pressed down.
[0082] When only one set of two detection contacts 2 are not separated, the LED light is dark yellow, indicating that the memory stick is inserted into the memory slot 1, but the level is not flat, one side is high and the other side is low (this situation occurs most frequently in Failure);
[0083] When the two detection contacts 2 of the two groups are separated, the LED light is yellow, indicating that the memory stick is normally inserted into the memory slot 1.
[0084] When the invention tests the memory stick, after the operator inserts the memory stick into the memory slot 1 of the test motherboard, since the memory slot 1 is provided with two groups of detection contact groups, and the two detection contacts 2 of each group are of a normally closed structure, when the memory stick is fully inserted into the memory slot 1, the two detection contacts 2 of the normally closed structure will separate, and when the memory stick is tilted after insertion or is not fully inserted, there will be two detection contacts 2 that remain in the connected state; therefore, the detection unit can detect the open and closed state of the two detection contacts 2 of each group, and can determine whether the memory stick is fully inserted into the memory slot 1; therefore, before the test machine starts to execute the test task, the operator can understand whether the contact between the memory stick and the memory slot 1 is good, thereby eliminating the failure caused by poor contact and greatly improving the pass rate; and it can avoid repeated testing and save a lot of repeated testing time costs.
[0085] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.
[0086] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0087] The above are only embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included within the scope of the claims of the present application.
Claims
1. An insertion status detection module for a memory stick plug-in test, characterized in that: The insertion status detection module is integrated on a memory stick plug-in test motherboard, and the memory stick plug-in test motherboard is provided with a memory slot (1). The insertion status detection module comprises: Two detection contact groups, both detection contact groups are arranged in the memory slot (1), each detection contact group includes two detection contacts (2), and the two detection contacts (2) in each group are of a normally closed structure; A detection unit, wherein the two detection contacts (2) of each group are electrically connected to the detection unit, and are used to determine the open and closed state of the two detection contacts (2) of each group, and to display the open and closed state of the two detection contacts (2) of each group; The memory slot (1) is provided with a pin area and two non-pin areas, the pin area is located between the two non-pin areas, two groups of detection contact points are respectively arranged at the bottom of the two non-pin areas, and two detection contacts (2) of each group are respectively fixed on the inner wall of the memory slot (1); The two detection contacts (2) of each group are both springs.
2. The insertion status detection module for memory stick plug-in and pull-out testing according to claim 1, characterized in that: The detection unit comprises: Power module; A logic controller, wherein the power output terminal of the power module is electrically connected to the power input terminal of the logic controller, and the four detection contacts (2) are electrically connected to the four signal ports of the logic controller respectively; An indicator light, wherein a power input terminal of the indicator light is electrically connected to a power output terminal of the logic controller; The logic controller is used to: obtain level signals of four signal ports, determine the opening and closing states of two detection contacts (2) in each group according to the level signals of the four signal ports, generate a brightness adjustment instruction based on the opening and closing states of the two detection contacts (2) in each group, adjust the brightness level of the indicator light based on the brightness adjustment instruction, and display the opening and closing states of the two detection contacts (2) in each group according to the brightness level of the indicator light.
3. The insertion status detection module for memory stick plug-in and pull-out testing according to claim 2, characterized in that: The opening and closing states of the two detection contacts (2) of each group include: the two detection contacts (2) are in an on state or the two detection contacts (2) are in a separated state, and the brightness levels include: the indicator light is fully on, the indicator light is slightly on, or the indicator light is off; When the two detection contacts (2) of the two groups are both in the connected state, the brightness level is that the indicator light is off; when the two detection contacts (2) of one group are in the connected state and the two detection contacts (2) of the other group are in the separated state, the brightness level is that the indicator light is slightly bright; when the two detection contacts (2) of the two groups are in the separated state, the brightness level is that the indicator light is fully bright.
4. A method for detecting the insertion status of a memory stick plug-in test, characterized in that: The method is implemented based on an insertion status detection module of a memory bar plug-in test according to any one of claims 1 to 3, and the method comprises: Determining the open and closed states of the two detection contacts (2) of each group; The opening and closing states of the two detection contacts (2) of each group are displayed.
5. The method for detecting the insertion status of a memory stick plug-in test according to claim 4, characterized in that: The detection unit comprises: a power module, a logic controller and an indicator light, wherein the power output end of the power module is electrically connected to the power input end of the logic controller, and the four detection contacts (2) are electrically connected to the four signal ports of the logic controller respectively; the power input end of the indicator light is electrically connected to the power output end of the logic controller; and determining the open and closed states of the two detection contacts (2) of each group comprises: Get the level signals of four signal ports; The open / closed state of the two detection contacts (2) in each group is determined according to the level signals of the four signal ports, wherein the open / closed state of the two detection contacts (2) in each group includes: the two detection contacts (2) are in a connected state or the two detection contacts (2) are in a separated state.
6. The method for detecting the insertion status of a memory stick plug-in test according to claim 5, characterized in that: The opening and closing states of the two detection contacts (2) of each group are displayed, including: generating a brightness adjustment instruction based on the opening and closing states of the two detection contacts (2) of each group; The brightness level of the indicator light is adjusted based on the brightness adjustment instruction, and the opening and closing states of the two detection contacts (2) of each group are displayed according to the brightness level of the indicator light.
7. The method for detecting the insertion status of a memory stick plug-in test according to claim 6, characterized in that: The brightness levels include: the indicator light is fully lit, the indicator light is slightly lit, or the indicator light is off; wherein, when the two detection contacts (2) of the two groups are both in the connected state, the brightness level is the indicator light is off; when the two detection contacts (2) of one group are in the connected state and the two detection contacts (2) of the other group are in the separated state, the brightness level is the indicator light is slightly lit; when the two detection contacts (2) of the two groups are in the separated state, the brightness level is the indicator light is fully lit.
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