A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device and test method

Abstract

The invention relates to the technical field of electromagnetic environment effect test, and discloses a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device and a test method. The method comprises the following steps: determining the test frequency range of HIRF for testing, and performing pre-test calibration; determining the lightning waveform, level and quantity parameters for the lightning indirect effect test, and performing performance verification on a transient signal generator; performing a HIRF radiation sensitivity test, injecting a lightning current signal within the same frequency action cycle of the HIRF test, observing and recording test results under the comprehensive effect of lightning and HIRF on an electronic and electrical system; performing a study on the comprehensive effect of lightning and HIRF, and evaluating the comprehensive protection effect of lightning and HIRF on an electronic and electrical system; the test method of the invention can verify the comprehensive lightning and HIRF protection performance of an electronic and electrical system of an aircraft, and reduce the safety hazards of the aircraft.

Description

Technical Field

[0001] The present invention relates to the field of electromagnetic environment effect test, and more specifically, to a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device and test method. Background Art

[0002] Lightning and HIRF protection verification is a rigid requirement for the electromagnetic environment airworthiness of civil aircraft. Europe, the United States and other countries have established a relatively complete aircraft lightning and HIRF airworthiness certification system, which has played a huge role in the industrial production and civil promotion of aircraft. There is an overlap between the lightning and HIRF environmental spectrums, and the lightning and HIRF environmental airworthiness certifications are independent of each other, and the rectification is also independent of each other, resulting in the unknown effects of lightning and HIRF environments in the crossover frequency band, posing a safety hazard. No research has been conducted on the combined effects of lightning and HIRF environments at home and abroad.

[0003] At present, the radiation sensitivity test methods are mainly concentrated in the field of electromagnetic compatibility testing (EMC), and there are relatively few studies on HIRF sensitivity reverberation chamber test methods. The HIRF test method based on the reverberation chamber is mainly used to test the radiation sensitivity of the test product.

[0004] The invention patent "Method for Improving the Repeatability of Radiation Immunity Test of Electronic Equipment in Continuous Stirring Mode of Reverberation Chamber" (Patent Announcement No.: CN104297595B) published in 2015 provides a method for calculating the standard deviation of the statistical mean value using data obtained from multiple sampling time periods, and using the continuous stirring mode of the reverberation chamber to improve the repeatability of the radiation sensitivity test in the sampling time period with a standard deviation less than 3dB. The invention patent "Radiation Sensitivity Test Method and Device under Reverberation Chamber Conditions" (Patent Announcement No.: CN107037283B) published in 2019 provides a radiation sensitivity test method and device under reverberation chamber conditions to solve the problem that the test results under reverberation chamber conditions in the prior art are significantly different from those in the uniform field. The invention patent "A System for Improving the Calibration Accuracy of Radio Frequency Radiation Sensitivity in Reverberation Chambers" (Patent Announcement No.: CN112485538B) published in 2022 provides a radiation sensitivity reverberation chamber test system using a stirrer stepping mode, which improves the calibration accuracy of the reverberation chamber. The invention patent "A method for testing the sensitivity of electromagnetic radiation in a reverberation chamber environment based on interference probability" (patent announcement number: CN113295941B) published in 2022 provides a method for testing the sensitivity of electromagnetic radiation in a reverberation chamber environment based on interference probability, which improves the test accuracy and efficiency.

[0005] Patents related to the indirect effects of lightning are mainly concentrated in the protection aspect, and there are relatively few patents focusing on test methods. The indirect effects of lightning test is mainly used to test the lightning protection performance of the test product.

[0006] The invention patent "A dynamic aircraft lightning effect test device" (patent announcement number: CN102087322B) published in 2012 proposed a dynamic aircraft lightning effect test device that simulates the process of an aircraft encountering a lightning strike in a dynamic flight mode under the limited space conditions of a microwave darkroom. The invention patent "A low-level whole machine lightning indirect effect sweep frequency measurement system" (patent publication number: CN103323709A) published in 2013 mainly proposed a low-level whole machine lightning indirect effect sweep frequency test measurement system. The invention patent "A time-frequency domain data processing method for whole machine lightning indirect effect test" (patent publication number: CN105158562A) published in 2015 uses the lightning current time domain data of the sweep frequency test system to convert it into lightning current frequency domain data to obtain the transient response of the cable bundle of the electronic and electrical system in the real lightning environment, and analyze and determine the lightning effect protection capability. The invention patent "Cable bundle test simultaneous injection test device" (patent announcement number: CN114678819B) published in 2022 solves the technical problem that the cable bundle test cannot simulate the actual arrangement of cables inside the fuselage. The invention patent "A universal protection device for auxiliary equipment in lightning indirect effect test" (patent announcement number: CN114675058B) published in 2022 protects auxiliary equipment from the influence of lightning indirect effect and improves the service life of auxiliary equipment.

[0007] Patents on lightning indirect effects and HIRF radiation sensitivity test methods are all aimed at single electromagnetic environment effects, and there is no research on comprehensive lightning indirect effects and HIRF radiation sensitivity test equipment and methods. Summary of the invention

[0008] The present invention provides a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device and test method, which solve the technical problems raised in the above background technology.

[0009] The present invention provides a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device test method, comprising the following steps:

[0010] Step 101, determining the test frequency range of the HIRF to be tested, and performing pre-test calibration;

[0011] Step 102, determining the lightning waveform, level and quantity parameters for conducting the lightning indirect effect experiment to verify the performance of the transient signal generator;

[0012] Step 103, conducting a HIRF radiation sensitivity test, injecting lightning indirect effect current within the same frequency action cycle of the HIRF test, and observing and recording the test results under the combined effects of lightning and HIRF on the electronic and electrical system;

[0013] Step 104, conduct a study on the comprehensive effects of lightning and HIRF, and evaluate the comprehensive lightning and HIRF protection effects of the electronic and electrical systems.

[0014] In a preferred embodiment, the testing method further comprises the following steps:

[0015] Step 201, setting an initial thickness for the shielding layer of the radio frequency product, using a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device to simulate different electromagnetic environments, and performing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test on the radio frequency product;

[0016] Step 202, adjusting the initial thickness of the shielding layer of the RF product, obtaining historical test data and historical environmental data of the RF product under different electromagnetic environments, the historical test data including lightning data, electromagnetic field strength, electromagnetic field frequency of the comprehensive test device and performance data of the RF product observed by the test monitoring and accompanying test equipment, and the historical environmental data including the ambient temperature and ambient humidity inside the reverberation chamber;

[0017] Step 203, by encoding the historical test data into electromagnetic features, encoding the historical environmental data into environmental features, inputting the electromagnetic features and environmental features into a protection strategy model, the protection strategy model outputs a protection strategy, and the protection strategy includes increasing or decreasing the thickness of the shielding layer of the RF product.

[0018] In a preferred embodiment, the protection strategy model includes a feature splicing layer, a feature processing layer and a strategy output layer, wherein electromagnetic features and environmental features are input into the feature splicing layer, and then the spliced ​​features are output; the spliced ​​features are input into the feature processing layer, the feature processing layer outputs the processed features to the strategy output layer, and the strategy output layer outputs the Q value of each optional protection strategy, and the protection strategy with the largest Q value is selected as the output of the protection strategy model.

[0019] In a preferred embodiment, the calculation formula of the feature splicing layer is:

[0020]

[0021] in, Represents the splicing feature, Represents electromagnetic characteristics, Indicates environmental characteristics, Represents vector concatenation;

[0022] The calculation formula of the feature processing layer is:

[0023]

[0024] in, Represents processing characteristics, Represents the splicing feature, represents the weight matrix of the feature processing layer, represents the bias term of the feature processing layer, Represents the Sigmoid activation function;

[0025] The calculation formula of the strategy output layer is:

[0026]

[0027] in, Indicates the Q value of the protection strategy corresponding to the initial thickness of the RF product. Represents processing characteristics, represents the weight matrix of the strategy output layer, represents the bias term of the policy output layer, express function.

[0028] In a preferred embodiment, the state of the protection strategy model includes electromagnetic characteristics and environmental characteristics;

[0029] Electromagnetic characteristics include lightning waveform, level and quantity, electromagnetic field strength and frequency, and performance data of radio frequency products observed by test monitoring equipment;

[0030] Environmental characteristics include ambient temperature and humidity inside the reverberation chamber;

[0031] The state is composed of a mosaic of electromagnetic characteristics and environmental characteristics;

[0032] The action space of the protection strategy model is generated for each adjustable thickness of the combined RF product, and one action represents increasing or decreasing the thickness of the shielding layer of the RF product.

[0033] In a preferred embodiment, the reward is calculated based on the performance change of the RF product after each adjustment of the shielding layer thickness:

[0034] The reward function is calculated as:

[0035]

[0036] in, Represents the reward value obtained in state s and taking action a. Indicates the current state. Indicates the action taken, represents the positive reward value, Represents a negative reward value, It indicates the performance of the RF product measured in state s and taking action a. Indicates the performance threshold.

[0037] In a preferred embodiment, the training method of the protection strategy model includes the following steps:

[0038] Step 1: Randomly initialize the protection strategy model. Network, whose parameters are the same as the protection strategy model;

[0039] Step 2: Choose an initial state ;

[0040] Step 3: At each time step t, select an action , perform the action , get the next state , Instant Rewards and whether the termination condition done is triggered, the termination condition is that the RF product is no longer tested;

[0041] Experience Deposit into the experience pool, one experience is a four-tuple or ;

[0042] Step 4: Update the calculation formula of Q value:

[0043] ;

[0044] in, Indicates status Down The network's maximum output; represents the learning rate;

[0045] according to and Find LOSS and use gradient descent method to update the protection strategy model;

[0046] ;

[0047] Indicates status and actions The output Q value of the next protection strategy model;

[0048] is the discount factor, a value between 0 and 1, used to balance the weights of immediate rewards and future rewards;

[0049] Step 5: Update every fixed number of network updates. network, making its parameters the same as those of the current protection strategy model;

[0050] Step 6, until After the network converges or the number of updates reaches the set value, the step is terminated.

[0051] A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device and a reverberation chamber are used to provide a test site for HIRF radiation sensitivity test.

[0052] A signal source, used for outputting a test signal;

[0053] A power amplifier, used for amplifying the power of the input test signal;

[0054] A directional coupler is used to couple the forward and reverse output powers of the power amplifier;

[0055] a transmitting antenna for injecting electromagnetic energy into the reverberation chamber;

[0056] A receiving antenna, used to receive signals in the reverberation chamber;

[0057] Receiver, used to measure the signal field strength received on the receiving antenna and the field strength calibration and test monitoring data of the reverberation chamber;

[0058] Power meter, used to measure the coupled output of the directional coupler, obtain the forward and reverse output power of the power amplifier, and monitor the power of the power amplifier;

[0059] Transient signal generator, used to generate the test signal required for the lightning indirect effect test;

[0060] Lightning injection probe, used to couple lightning signals into the test cable bundle;

[0061] Lightning current monitoring probe, used to monitor the lightning current injection signal in the test cable bundle;

[0062] Lightning voltage detection ring and probe, used to detect lightning voltage injection signal in the test cable bundle;

[0063] Test monitoring equipment is used to display, record and monitor the electromagnetic susceptibility of the test system during the test.

[0064] In a preferred embodiment, the output end of the signal source is connected to the input end of the directional coupler through a power amplifier, the output end of the directional coupler is connected to the transmitting antenna, the power meter is connected to the monitoring end of the directional coupler, and the output end of the receiving antenna is connected to the input end of the receiver; the signal source, power amplifier, directional coupler, power meter and receiver are located outside the reverberation chamber, the transmitting antenna is located outside the working area of ​​the reverberation chamber and faces the corner of the reverberation chamber or the agitator, and the receiving antenna is located in the working area of ​​the reverberation chamber.

[0065] In a preferred embodiment, in a lightning indirect effect test device, the output end of a transient signal generator is connected to the input end of a lightning injection probe, a test cable is clamped in the lightning injection probe, a lightning voltage detection ring and a probe are clamped on the lightning injection probe, and an output end thereof is connected to a voltage receiving end of a digital oscilloscope; a lightning current monitoring probe is clamped on a cable bundle, and an output end thereof is connected to a current receiving end of a digital oscilloscope; the signal generator and the digital oscilloscope are located outside the reverberation chamber, the lightning voltage detection ring and the probe, the lightning current monitoring probe, and the lightning injection probe are located in a working area of ​​the reverberation chamber, the lightning current monitoring probe is 5-15 cm away from the cable port of the test product, and the lightning injection probe is 5-50 cm away from the lightning current monitoring probe.

[0066] The beneficial effects of the present invention are as follows: the test method of the present invention can verify the lightning and HIRF comprehensive protection performance of the aircraft electronic and electrical system, reduce the potential safety hazards of the aircraft, the test device is easy to construct, and the test steps are simple and clear and easy to implement. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 It is the first flow chart of the system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test method of the present invention.

[0068] Figure 2 This is the second flow chart of the system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test method of the present invention.

[0069] Figure 3 The invention discloses a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device. DETAILED DESCRIPTION

[0070] The subject matter described herein will now be discussed with reference to example embodiments. It should be understood that the discussion of these embodiments is only to enable those skilled in the art to better understand and implement the subject matter described herein, and the functions and arrangements of the elements discussed may be changed without departing from the scope of protection of the contents of this specification. Each example may omit, replace or add various processes or components as needed. In addition, the features described relative to some examples may also be combined in other examples.

[0071] like Figure 1 As shown, a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test method includes the following steps:

[0072] Step 101, determining the test frequency range of the HIRF to be tested, and performing pre-test calibration;

[0073] Step 102, determining the lightning waveform, level and quantity parameters for conducting the lightning indirect effect experiment to verify the performance of the transient signal generator;

[0074] Step 103, conducting a HIRF radiation sensitivity test, injecting lightning indirect effect current within the same frequency action cycle of the HIRF test, and observing and recording the test results under the combined effects of lightning and HIRF on the electronic and electrical system;

[0075] Step 104, conduct a study on the comprehensive effects of lightning and HIRF, and evaluate the comprehensive lightning and HIRF protection effects of the electronic and electrical systems.

[0076] It should be noted that the test parameters are determined according to the HIRF radiation sensitivity test, and the main parameters include the test frequency band, field strength and scanning rate, etc. Pre-test calibration is performed according to the HIRF radiation sensitivity test parameters to ensure that the reverberation chamber meets the field uniformity requirements after the test equipment is loaded.

[0077] Determine the lightning test parameters according to the requirements of the lightning indirect effect test, the main parameters are the test level and waveform, etc. Perform performance verification on the generator according to the test parameters to ensure that the test parameters meet the range required by the test level.

[0078] The lightning indirect test and HIRF radiation sensitivity test are carried out simultaneously, that is, during the test dwell time of the HIRF test frequency point, the lightning indirect effect test is carried out on the cable bundle at the same time, and the test results of the tested electronic and electrical systems are observed and recorded to obtain the comprehensive effects of lightning and HIRF, and to evaluate the comprehensive protection performance of the electronic and electrical systems in lightning and HIRF environments.

[0079] The specific test steps include the following steps:

[0080] Step 1: Build a test platform;

[0081] Step 2: Perform HIRF test field strength calibration in the reverberation chamber in the range of 100MHz-18GHz;

[0082] Step 3: Verify the performance of the transient signal generator;

[0083] Step 4: Power on the device under test, select the working mode, and keep the device under test in a stable working state;

[0084] Step 5: Set the initial frequency of the HIRF radiated sensitivity test and start the test. At the same time, start the transient signal generator and inject lightning signals during the dwell time of each HIRF test frequency point. The dwell time of the HIRF test frequency point meets the requirements of the lightning indirect effect test.

[0085] Step 6: For the single return stroke test, at least 10 transient signals shall be applied, and the longest time interval between the applied single return stroke transient signals shall not exceed 1 minute;

[0086] Step 7: For the multiple return stroke test, at least 10 multiple return stroke transient signals are applied, and the longest time interval between the applied multiple return stroke transient signals does not exceed 5 minutes;

[0087] Step 8: For the multiple pulse group test, apply a multiple pulse group every 3 seconds for at least 5 minutes;

[0088] Step 9: Change the output polarity of the transient signal generator and repeat steps 5 to 8;

[0089] Step 10: Repeat steps 5 to 9 for each cable under test.

[0090] Step 11: changing the frequency of the HIRF sensitivity test, and repeating steps 5 to 10 until the end frequency of the HIRF sensitivity test is reached;

[0091] Step 12: Repeat steps 4 to 11 for each working mode of the device under test;

[0092] Step 13: Observe and record the conditions of the equipment under the combined effects of lightning and HIRF through the test monitoring equipment, and complete the test verification of the system-level lightning and HIRF comprehensive protection performance.

[0093] Radio frequency products in aircraft (such as GPS, mobile terminals, etc.) may experience performance degradation or even failure in complex electromagnetic environments. Current test methods may not fully cover all possible electromagnetic environmental impacts, especially when it comes to the combined effects of lightning indirect effects and HIRF (high-intensity radiation field). Therefore, under the test method of the above-mentioned lightning indirect effect and HIRF radiation sensitivity comprehensive test device, not only can the thickness of the shielding layer of the RF product that can still work normally in a given electromagnetic environment be tested, but it can also help determine the optimal shielding layer thickness of the RF product, ensuring the reliability and stability of the RF product in the lightning indirect effect and HIRF environment.

[0094] In one embodiment of the present invention, a shielding layer test of a radio frequency product using the above test method is provided, and the purpose is to obtain the best shielding layer of the radio frequency product, such as Figure 2 As shown, a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test method includes the following steps:

[0095] Step 201, setting an initial thickness for the shielding layer of the radio frequency product, using a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device to simulate different electromagnetic environments, and performing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test on the radio frequency product;

[0096] Select a suitable initial thickness as the shielding thickness of the RF product, and use the system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device to test the RF product. The specific operations are as follows:

[0097] Step 1: Set the initial shielding layer thickness of the RF product;

[0098] Step 2: Use a comprehensive test device to conduct the test, including: determining the test frequency band, field strength, scanning rate and other parameters of the HIRF radiation sensitivity test;

[0099] Step 3: Perform pre-test calibration to ensure that the reverberation chamber meets the field uniformity requirements after loading the RF product under test;

[0100] Step 4: Determine the lightning indirect effect test parameters, which include test level and waveform;

[0101] Step 5: Verify the performance of the transient signal generator. The performance verification includes: during the dwell time of each HIRF test frequency point, conduct a lightning indirect effect test on the target cable bundle at the same time, and observe and record the conditions of the tested RF product under the combined effects of lightning and HIRF through the test monitoring equipment.

[0102] Step 202, adjusting the initial thickness of the shielding layer of the RF product, obtaining historical test data and historical environmental data of the RF product under different electromagnetic environments, the historical test data including lightning data, electromagnetic field strength, electromagnetic field frequency of the comprehensive test device and performance data of the RF product observed by the test monitoring and accompanying test equipment, and the historical environmental data including the ambient temperature and ambient humidity inside the reverberation chamber;

[0103] It should be noted that lightning data includes lightning waveform, level and quantity;

[0104] Step 203, encoding the historical test data into electromagnetic features, encoding the historical environmental data into environmental features, inputting the electromagnetic features and environmental features into a protection strategy model, and the protection strategy model outputs a protection strategy, the protection strategy including increasing or decreasing the thickness of the shielding layer of the radio frequency product;

[0105] The protection strategy model includes a feature splicing layer, a feature processing layer and a strategy output layer, wherein electromagnetic features and environmental features are input into the feature splicing layer, and then the spliced ​​features are output; the spliced ​​features are input into the feature processing layer, and the feature processing layer outputs the processed features to the strategy output layer, and the strategy output layer outputs the Q value of each optional protection strategy, and the protection strategy with the largest Q value is selected as the output of the protection strategy model.

[0106] The calculation formula of the feature concatenation layer is:

[0107]

[0108] in, Represents the splicing feature, Represents electromagnetic characteristics, Indicates environmental characteristics, Represents vector concatenation;

[0109] The calculation formula of the feature processing layer is:

[0110]

[0111] in, Represents processing characteristics, Represents the splicing feature, represents the weight matrix of the feature processing layer, represents the bias term of the feature processing layer, Represents the Sigmoid activation function;

[0112] The calculation formula of the strategy output layer is:

[0113]

[0114] in, Indicates the Q value of the protection strategy corresponding to the initial thickness of the RF product. Represents processing characteristics, represents the weight matrix of the strategy output layer, represents the bias term of the policy output layer, express function;

[0115] The states of the protection strategy model include electromagnetic characteristics and environmental characteristics;

[0116] Electromagnetic characteristics include lightning waveform, level and quantity, electromagnetic field strength and frequency, and performance data of radio frequency products observed by test monitoring equipment;

[0117] Environmental characteristics include ambient temperature and humidity inside the reverberation chamber;

[0118] The state is composed of a mosaic of electromagnetic characteristics and environmental characteristics;

[0119] The action space of the protection strategy model is generated for each adjustable thickness of the combined RF product, and one action represents increasing or decreasing the thickness of the shielding layer of the RF product.

[0120] It should be noted that the action space is continuous, allowing the thickness to be freely adjusted within a certain range, which is artificially set, such as any increase or decrease in thickness within 0.5 mm.

[0121] The reward is calculated based on the change in performance of the RF product after each adjustment of the shielding thickness:

[0122] The reward function is calculated as:

[0123]

[0124] in, Represents the reward value obtained in state s and taking action a. Indicates the current state. Indicates the action taken, represents the positive reward value, Represents a negative reward value, It indicates the performance of the RF product measured in state s and taking action a. Indicates performance threshold;

[0125] It should be noted that the state s is the above splicing feature ;

[0126] The purpose of this design award is to adjust the thickness of the shielding layer according to the performance changes of the RF product to ensure that the RF product can work normally under the combined effects of the indirect effect of lightning and HIRF;

[0127] The training method of the protection strategy model includes the following steps:

[0128] Step 1: Randomly initialize the protection strategy model. Network, whose parameters are the same as the protection strategy model;

[0129] Step 2: Choose an initial state ;

[0130] Step 3: At each time step t, select an action , perform the action , get the next state , Instant Rewards and whether the termination condition done is triggered, the termination condition is that the RF product is no longer tested;

[0131] Experience Deposit into the experience pool, one experience is a four-tuple or ;

[0132] Step 4: Update the calculation formula of Q value:

[0133] ;

[0134] in, Indicates status Down The network's maximum output; represents the learning rate;

[0135] according to and Find LOSS and use gradient descent method to update the protection strategy model;

[0136] ;

[0137] Indicates status and actions The output Q value of the next protection strategy model;

[0138] is the discount factor, a value between 0 and 1, used to balance the weights of immediate rewards and future rewards;

[0139] Step 5: Update every fixed number of network updates. network, making its parameters the same as those of the current protection strategy model;

[0140] Step 6, until After the network converges or the number of updates reaches the set value, the step is terminated.

[0141] like Figure 3 As shown, a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device includes:

[0142] Reverberation chamber is used to provide a test site for HIRF radiation sensitivity test.

[0143] A signal source, used for outputting a test signal;

[0144] A power amplifier, used for amplifying the power of the input test signal;

[0145] A directional coupler is used to couple the forward and reverse output powers of the power amplifier;

[0146] a transmitting antenna for injecting electromagnetic energy into the reverberation chamber;

[0147] A receiving antenna, used to receive signals in the reverberation chamber;

[0148] Receiver, used to measure the signal field strength received on the receiving antenna and the field strength calibration and test monitoring data of the reverberation chamber;

[0149] Power meter, used to measure the coupled output of the directional coupler, obtain the forward and reverse output power of the power amplifier, and monitor the power of the power amplifier;

[0150] Transient signal generator, used to generate the test signal required for the lightning indirect effect test;

[0151] Lightning injection probe, used to couple lightning signals into the test cable bundle;

[0152] Lightning current monitoring probe, used to monitor the lightning current injection signal in the test cable bundle;

[0153] Lightning voltage detection ring and probe, used to detect lightning voltage injection signal in the test cable bundle;

[0154] Test monitoring equipment is used to display, record and monitor the electromagnetic susceptibility of the test system during the test.

[0155] In one embodiment of the present invention, the output end of the signal source is connected to the input end of the directional coupler through a power amplifier, the output end of the directional coupler is connected to the transmitting antenna, the power meter is connected to the monitoring end of the directional coupler, and the output end of the receiving antenna is connected to the input end of the receiver. The signal source, power amplifier, directional coupler, power meter and receiver are located outside the reverberation chamber, the transmitting antenna is located outside the working area of ​​the reverberation chamber and faces the corner of the reverberation chamber or the agitator, and the receiving antenna is located in the working area of ​​the reverberation chamber;

[0156] Lightning indirect effect test device, the output end of the transient signal generator is connected to the input end of the lightning injection probe, the test cable is clamped in the lightning injection probe, the lightning voltage detection ring and the probe are clamped on the lightning injection probe, and its output end is connected to the voltage receiving end of the digital oscilloscope, and the lightning current monitoring probe is clamped on the cable bundle, and its output end is connected to the current receiving end of the digital oscilloscope. The signal generator and digital oscilloscope are located outside the reverberation room, the lightning voltage detection ring and probe, the lightning current monitoring probe and the lightning injection probe are located in the working area of ​​the reverberation room, the lightning current monitoring probe is about 5-15cm away from the cable port of the test product, and the lightning injection probe is 5-50cm away from the lightning current monitoring probe.

[0157] The above describes an embodiment of the present embodiment, but the present embodiment is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present embodiment, ordinary technicians in this field can also make many forms, all of which are within the protection of the present embodiment.

Claims

1. A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device test method, characterized in that: The following steps are involved: Set the initial thickness of the shielding layer of the RF product, use the system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device to simulate different electromagnetic environments, and conduct system-level lightning indirect effect and HIRF radiation sensitivity comprehensive tests on RF products; Adjust the initial thickness of the shielding layer of the RF product, and obtain historical test data and historical environmental data of the RF product in different electromagnetic environments. The historical test data includes lightning data, electromagnetic field strength, electromagnetic field frequency of the comprehensive test device, and performance data of the RF product observed by the test monitoring and accompanying test equipment. The historical environmental data includes the ambient temperature and ambient humidity inside the reverberation chamber. Lightning data includes lightning waveform, level and quantity; By encoding historical test data into electromagnetic features, encoding historical environmental data into environmental features, inputting the electromagnetic features and environmental features into a protection strategy model, the protection strategy model outputs a protection strategy, and the protection strategy includes increasing or decreasing the thickness of the shielding layer of the radio frequency product; A suitable initial thickness is selected as the shielding thickness of the RF product, and the RF product is tested using a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device. The specific operations are as follows: Set the initial shielding layer thickness of RF products; The test is conducted using a comprehensive test device, including: determining the test frequency band, field strength and scanning rate for the HIRF radiation sensitivity test; Carry out pre-test calibration to ensure that the reverberation chamber meets the field uniformity requirements after loading the RF product under test; Determine the lightning indirect effect test parameters, which include the test level and waveform; The performance of the transient signal generator is verified. The content of the performance verification includes: during the residence time of each HIRF test frequency point, the target cable bundle is tested for the indirect effects of lightning, and the test monitoring and test equipment are used to observe and record the conditions of the tested RF products under the combined effects of lightning and HIRF.

2. The method for testing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 1, characterized in that: The protection strategy model includes a feature splicing layer, a feature processing layer and a strategy output layer, wherein electromagnetic features and environmental features are input into the feature splicing layer, and then the spliced ​​features are output; the spliced ​​features are input into the feature processing layer, and the feature processing layer outputs the processed features to the strategy output layer, and the strategy output layer outputs the Q value of each optional protection strategy, and the protection strategy with the largest Q value is selected as the output of the protection strategy model.

3. The method for testing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 2, characterized in that: The calculation formula of the feature concatenation layer is: ； in, Represents the splicing feature, Represents electromagnetic characteristics, Represents environmental characteristics, Represents vector concatenation; The calculation formula of the feature processing layer is: ； in, Represents processing characteristics, Represents the splicing feature, represents the weight matrix of the feature processing layer, represents the bias term of the feature processing layer, Represents the Sigmoid activation function; The calculation formula of the strategy output layer is: ； in, Indicates the Q value of the protection strategy corresponding to the initial thickness of the RF product. Represents processing characteristics, represents the weight matrix of the strategy output layer, represents the bias term of the policy output layer, express function.

4. The method for testing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 3, characterized in that: The states of the protection strategy model include electromagnetic characteristics and environmental characteristics; Electromagnetic characteristics include lightning waveform, level and quantity, electromagnetic field strength and frequency, and performance data of radio frequency products observed by test monitoring equipment; Environmental characteristics include ambient temperature and humidity inside the reverberation chamber; The state is composed of a mosaic of electromagnetic characteristics and environmental characteristics; The action space of the protection strategy model is generated for each adjustable thickness of the combined RF product, and one action represents increasing or decreasing the thickness of the shielding layer of the RF product.

5. The method for testing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 4, characterized in that: The reward is calculated based on the change in performance of the RF product after each adjustment of the shielding thickness: The reward function is calculated as: ； in, Represents the reward value obtained in state s and taking action a. Indicates the current state. Indicates the action taken, represents the positive reward value, Represents a negative reward value, It indicates the performance of the RF product measured in state s and taking action a. Indicates the performance threshold.

6. The method for testing a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 5, characterized in that: The training method of the protection strategy model includes the following steps: Step 1: Randomly initialize the protection strategy model. Network, whose parameters are the same as the protection strategy model; Step 2: Choose an initial state ; Step 3: At each time step t, select an action , perform the action , get the next state , Instant Rewards and whether the termination condition done is triggered, the termination condition is that the RF product is no longer tested; Experience Deposit into the experience pool, one experience is a four-tuple or ; Step 4: Update the calculation formula of Q value: ； in, Indicates status Down The network's maximum output; represents the learning rate; according to and Find LOSS and use gradient descent method to update the protection strategy model; ； Indicates status and actions The output Q value of the next protection strategy model; is the discount factor, a value between 0 and 1, used to balance the weights of immediate rewards and future rewards; Step 5: Update every fixed number of network updates. network, making its parameters the same as those of the current protection strategy model; Step 6, until After the network converges or the number of updates reaches the set value, the step is terminated.

7. A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device, characterized in that: It is used to perform a system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device test method as described in any one of claims 1 to 6, and includes the following devices: Reverberation chamber, used to provide a test site for HIRF radiation sensitivity testing; A signal source, used for outputting a test signal; A power amplifier, used for amplifying the power of the input test signal; A directional coupler is used to couple the forward and reverse output powers of the power amplifier; a transmitting antenna for injecting electromagnetic energy into the reverberation chamber; A receiving antenna, used to receive signals in the reverberation chamber; Receiver, used to measure the signal field strength received on the receiving antenna and the field strength calibration and test monitoring data of the reverberation chamber; Power meter, used to measure the coupled output of the directional coupler, obtain the forward and reverse output power of the power amplifier, and monitor the power of the power amplifier; Transient signal generator, used to generate the test signal required for the lightning indirect effect test; Lightning injection probe, used to couple lightning signals into the test cable bundle; Lightning current monitoring probe, used to monitor the lightning current injection signal in the test cable bundle; Lightning voltage detection ring and probe, used to detect lightning voltage injection signal in the test cable bundle; Test monitoring equipment is used to display, record and monitor the electromagnetic susceptibility of the test system during the test.

8. A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 7, characterized in that: The output end of the signal source is connected to the input end of the directional coupler through a power amplifier, the output end of the directional coupler is connected to the transmitting antenna, the power meter is connected to the monitoring end of the directional coupler, and the output end of the receiving antenna is connected to the input end of the receiver; The signal source, power amplifier, directional coupler, power meter and receiver are located outside the reverberation chamber, the transmitting antenna is located outside the working area of ​​the reverberation chamber and faces the corner of the reverberation chamber or the stirrer, and the receiving antenna is located in the working area of ​​the reverberation chamber.

9. A system-level lightning indirect effect and HIRF radiation sensitivity comprehensive test device according to claim 8, characterized in that: Lightning indirect effect test device, the output end of the transient signal generator is connected to the input end of the lightning injection probe, the test cable is clamped in the lightning injection probe, the lightning voltage detection ring and the probe are clamped on the lightning injection probe, and the output end is connected to the voltage receiving end of the digital oscilloscope. The lightning current monitoring probe is clamped on the cable bundle, and the output end is connected to the current receiving end of the digital oscilloscope; the signal generator and the digital oscilloscope are located outside the reverberation room, the lightning voltage detection ring and probe, the lightning current monitoring probe and the lightning injection probe are located in the working area of ​​the reverberation room, the lightning current monitoring probe is 5-15cm away from the cable port of the test product, and the lightning injection probe is 5-50cm away from the lightning current monitoring probe.

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