Error correction method and device of target magnetometer, electronic equipment and storage medium

Abstract

The invention relates to the technical field of magnetic field measurement, and provides an error correction method and device of a target magnetometer, electronic equipment and a storage medium. The method comprises the following steps: acquiring magnetic intensity of a calibration magnetic field, and performing magnetic intensity measurement on the calibration magnetic field corresponding to a plurality of temperatures based on a target magnetometer to obtain a magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature; establishing an error prediction model between the temperature and the measurement error; obtaining a to-be-measured magnetic field temperature, and determining an error offset coefficient corresponding to the to-be-measured magnetic field temperature according to the to-be-measured magnetic field temperature and the error prediction model; performing magnetic intensity measurement on the to-be-measured magnetic field based on target magnetometer measurement to obtain a magnetic intensity measurement value of the to-be-measured magnetic field; and correcting the magnetic intensity measurement value of the to-be-measured magnetic field based on the error offset coefficient corresponding to the temperature of the to-be-measured magnetic field to obtain a magnetic intensity correction value of the to-be-measured magnetic field, thereby solving the problem that the temperature affects the magnetic intensity measurement accuracy of the target magnetometer in the prior art, and improving the measurement precision and reliability of the target magnetometer at different temperatures.

Description

Technical Field

[0001] The present application relates to the field of magnetic field measurement technology, and in particular to an error correction method, device, electronic device and storage medium for a target magnetometer. Background Art

[0002] A magnetometer is an instrument specifically used to measure the magnetic induction intensity of a magnetic field. It is widely used in geological exploration, materials science, biomedicine, physics research and other fields. According to different working principles, magnetometers can be divided into many types, such as atomic magnetometers based on the principle of nuclear spin resonance (NMR). Atomic magnetometers are instruments that use the behavior of the spin magnetic moment of atomic nuclei in an external magnetic field to measure the magnetic intensity of an external magnetic field. However, during the measurement process, the ambient temperature of the external magnetic field can affect the performance of the electronic equipment, coils and other components in the magnetometer, and thus affect the accuracy of the magnetic intensity measurement. Summary of the invention

[0003] In view of this, embodiments of the present application provide a method, device, electronic device and storage medium for error correction of a target magnetometer to solve the problem in the prior art that temperature affects the accuracy of magnetic intensity measured by a target magnetometer.

[0004] In a first aspect of an embodiment of the present application, a method for correcting an error of a target magnetometer is provided, comprising: obtaining the magnetic intensity of a calibration magnetic field, measuring the magnetic intensity of calibration magnetic fields corresponding to multiple temperatures based on a target magnetometer in a temperature-controllable calibration magnetic field environment, and obtaining a magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature; establishing an error prediction model between temperature and a measurement error coefficient based on each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field; obtaining the temperature of the magnetic field to be measured, and determining the error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model; measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement, and obtaining a magnetic intensity measurement value of the magnetic field to be measured; and correcting the magnetic intensity measurement value of the magnetic field to be measured based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured, and obtaining a magnetic intensity correction value of the magnetic field to be measured.

[0005] According to a second aspect of an embodiment of the present application, there is provided an error correction device for a target magnetometer, comprising: a training data acquisition module, for acquiring the magnetic intensity of a calibration magnetic field, and measuring the magnetic intensity of a calibration magnetic field corresponding to multiple temperatures based on a target magnetometer in a temperature-controllable calibration magnetic field environment to obtain a magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature; a model training module, for establishing an error prediction model between temperature and a measurement error coefficient based on each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field; a prediction module, for acquiring the temperature of the magnetic field to be measured, and determining the error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model; a measurement module, for measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain a magnetic intensity measurement value of the magnetic field to be measured; and a correction module, for correcting the magnetic intensity measurement value of the magnetic field to be measured based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured to obtain a magnetic intensity correction value of the magnetic field to be measured.

[0006] According to a third aspect of an embodiment of the present application, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the computer program.

[0007] According to a fourth aspect of an embodiment of the present application, a readable storage medium is provided, which stores a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0008] Compared with the prior art, the embodiments of the present application have the following beneficial effects: by obtaining the magnetic intensity of the calibration magnetic field, a known and accurate magnetic intensity of the calibration magnetic field is determined, and the magnetic intensity of the calibration magnetic field will be used as a reference for subsequent measurement and correction. In a temperature-controllable calibration magnetic field environment, the ambient temperature is changed, and the target magnetometer is used to measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures, and the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each temperature are obtained, and the original data of the measurement values ​​between the temperature and the target magnetometer are collected. A mathematical model is established using the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each temperature and each temperature, that is, an error prediction model between temperature and measurement error. The error prediction model can predict the error offset coefficient caused by temperature influence at a specific temperature. In the process of establishing the error prediction model, the relationship between temperature and measurement error is captured to facilitate the subsequent correction of the measurement results. The temperature of the magnetic field to be measured is obtained, and the error offset coefficient corresponding to the temperature of the magnetic field to be measured is determined according to the temperature of the magnetic field to be measured and the error prediction model. The error offset coefficient corresponding to the temperature of the magnetic field to be measured can represent the error ratio that may occur when the target magnetometer measures the magnetic field to be measured due to the influence of temperature. Without correction, the target magnetometer measures the magnetic intensity of the magnetic field to be measured to obtain the original measurement data, that is, the measured value of the magnetic intensity of the magnetic field to be measured. The measured value of the magnetic intensity of the magnetic field to be measured is adjusted using the error offset coefficient, so as to obtain the correction value of the magnetic intensity of the magnetic field to be measured. The correction value of the magnetic intensity of the magnetic field to be measured has taken into account and corrected the deviation caused by the temperature factor, and is closer to the real magnetic intensity of the magnetic field to be measured. The error correction method of the target magnetometer proposed in the present application predicts the error offset coefficient and corrects the measurement value based on the error prediction model, and systematically and scientifically compensates for the influence of temperature on the measurement of the target magnetometer, thereby solving the problem in the prior art that temperature affects the accuracy of the magnetic intensity measurement of the target magnetometer, and improving the measurement accuracy and reliability of the target magnetometer at different temperatures. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0010] Figure 1 It is a flow chart of an error correction method for a target magnetometer provided in an embodiment of the present application;

[0011] Figure 2 It is a flow chart of another error correction method of a target magnetometer provided in an embodiment of the present application;

[0012] Figure 3It is a flowchart of another target magnetometer error correction method provided in an embodiment of the present application;

[0013] Figure 4 It is a flowchart of another method for error correction of a target magnetometer provided in an embodiment of the present application;

[0014] Figure 5 It is a structural schematic diagram of an error correction device of a target magnetometer provided in an embodiment of the present application;

[0015] Figure 6 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0016] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0017] A method and device for error correction of a target magnetometer according to an embodiment of the present application will be described in detail below with reference to the accompanying drawings.

[0018] Figure 1 FIG. 1 is a flow chart of an error correction method for a target magnetometer provided in an embodiment of the present application. Figure 1 As shown, the error correction method of the target magnetometer includes:

[0019] Step 101, obtaining the magnetic intensity of the calibration magnetic field, measuring the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures based on a target magnetometer in a temperature-controllable calibration magnetic field environment, and obtaining the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature.

[0020] In some embodiments, the target magnetometer may be a magnetometer based on the principle of nuclear spin resonance, for example, the target magnetometer may be a micro laser pumped magnetometer. The micro laser pumped magnetometer is a magnetometer for high-resolution scalar magnetic field measurement in geomagnetic environment, and has the characteristics of high sensitivity, small size and low power consumption. The calibration magnetic field is a magnetic field environment with known precise magnetic intensity, which can be created by using a highly accurate standard magnetic field source. The magnetic intensity of the calibration magnetic field is established through strict calibration and serves as a benchmark for subsequent measurements. In order to explore the influence of temperature on magnetometer measurement and establish an error prediction model between temperature and measurement error, it is necessary to measure the magnetic intensity of the calibration magnetic field in an environment where the temperature can be accurately adjusted. The target magnetometer (i.e., the magnetometer to be calibrated) is used to measure the magnetic intensity of the calibration magnetic field at different temperatures. Before each measurement, the ambient temperature is kept stable within a preset time, and the magnetic intensity measurement value of the calibration magnetic field corresponding to the temperature is recorded. The ambient temperature is adjusted to obtain the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature. Each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field can provide a data basis for subsequently establishing an error prediction model between temperature and measurement error.

[0021] Step 102: establishing an error prediction model between temperature and measurement error coefficient based on each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field.

[0022] In some embodiments, for each temperature, based on the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature and the magnetic intensity of the calibration magnetic field, the error offset coefficient corresponding to each temperature is calculated. A machine learning method can be used to take each temperature as an independent variable and the error offset coefficient corresponding to each temperature as a dependent variable, and each temperature as an independent variable and the error offset coefficient corresponding to each temperature are fitted to obtain a mathematical model describing the relationship between temperature and error offset coefficient, i.e., an error prediction model. When subsequently measuring the magnetic intensity of the magnetic field to be measured, the expected error offset coefficient can be predicted based on the error prediction model and the temperature of the magnetic field to be measured, which is used to correct the measurement result of the target magnetometer in real time, and obtain a correction value of the magnetic intensity of the magnetic field to be measured that is closer to the actual value, thereby improving the accuracy and reliability of the measurement.

[0023] Step 103 , obtaining the temperature of the magnetic field to be measured, and determining the error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model.

[0024] In some embodiments, before measuring the magnetic intensity of an unknown magnetic field to be measured, the temperature of the environment where the magnetic field to be measured is located can be measured by a temperature sensor to obtain the temperature of the magnetic field to be measured, and the temperature sensor measurement can be set in the target magnetometer. Using the established error prediction model, according to the temperature of the magnetic field to be measured, the systematic error that may occur in the magnetometer measurement under the temperature target is predicted, that is, the error offset coefficient corresponding to the temperature of the magnetic field to be measured. The error offset coefficient represents the ratio of the magnetic intensity measurement value of the magnetic field to be measured obtained between the target magnetometers to the ideal error-free situation at the temperature of the magnetic field to be measured. The error offset coefficient can be a positive number or a non-positive number (i.e., a negative number and zero). By knowing in advance the error offset coefficient generated by the target magnetometer measurement at a specific temperature, it can be corrected on the basis of the actual measurement value (value before correction), thereby improving the accuracy of the final measurement result (value after correction) of the target magnetometer, thereby eliminating or reducing the error caused by the temperature effect, and improving the accuracy of the magnetic intensity measurement performed by the target magnetometer.

[0025] Step 104 , performing magnetic intensity measurement on the magnetic field to be measured based on the target magnetometer measurement, and obtaining a magnetic intensity measurement value of the magnetic field to be measured.

[0026] In some embodiments, the target magnetometer is a magnetometer that needs error correction. The target magnetometer can be a micro laser pumped magnetometer, and its working principle is that the atomic cloud in the alkali metal gas chamber of the micro laser pumped magnetometer undergoes Zeeman splitting under the action of the magnetic field to be measured, and a beam of pump light of a specific frequency is injected into the gas chamber. At this time, the atoms in the gas chamber are pumped from the ground state Zeeman sub-level to the excited state under the action of the pump light, and the atoms in the excited state decay to the sub-energy level through spontaneous radiation. The atoms on the sub-energy level are polarized to form a macroscopic magnetic moment, and the atomic spin has a projection in the polarization direction, that is, the vertical direction of the magnetic field. A probe laser is added in the vertical direction of the pump light. The projection of the alkali metal atom after spinning in the direction of the probe light will produce different degrees of dispersion effect with the probe light, thereby generating a polarization angle. The polarization angle is collected by the detection circuit and sent to the circuit for processing. The magnitude of the polarization angle can be calculated by the Bloch equation to calculate the angular frequency of Larmor precession, and further calculate the magnitude of the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured. Without correction, the target magnetometer is used to measure the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured, which is the basis for subsequent correction. The magnetic intensity measurement value of the magnetic field to be measured is the uncorrected data, which contains errors caused by temperature factors.

[0027] Step 105, correcting the measured value of the magnetic field intensity of the magnetic field to be measured based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured, to obtain a corrected value of the magnetic field intensity of the magnetic field to be measured.

[0028] In some embodiments, the error offset coefficient calculation formula can be set as: k = (ab) / b, where k is the error offset coefficient, a is the magnetic intensity measurement value, and b is the true magnetic intensity value. When the error offset coefficient corresponding to the temperature of the magnetic field to be measured and the magnetic intensity measurement value of the magnetic field to be measured are known, the magnetic intensity measurement value of the magnetic field to be measured is corrected according to the above error offset coefficient calculation formula to obtain the magnetic intensity correction value of the magnetic field to be measured. The measurement error caused by temperature can be significantly reduced, so that the corrected magnetic intensity correction value of the magnetic field to be measured is closer to the true magnetic intensity of the magnetic field to be measured, thereby improving the accuracy and reliability of the measurement.

[0029] Based on the error correction method of the target magnetometer proposed in this application, by obtaining the magnetic intensity of the calibration magnetic field, a known and accurate magnetic intensity of the calibration magnetic field is determined, and the magnetic intensity of the calibration magnetic field will be used as a reference for subsequent measurement and correction. In a temperature-controllable calibration magnetic field environment, the ambient temperature is changed, and the target magnetometer is used to measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures, and the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature is obtained, and the original data between the temperature and the target magnetometer measurement value is collected. A mathematical model is established using the magnetic intensity measurement values ​​of the calibration magnetic field at each temperature and each temperature corresponding to each temperature, that is, an error prediction model between temperature and measurement error. The error prediction model can predict the error offset coefficient caused by temperature influence at a specific temperature. In the process of establishing the error prediction model, the relationship between temperature and measurement error is captured to facilitate the subsequent correction of the measurement results. The temperature of the magnetic field to be measured is obtained, and the error offset coefficient corresponding to the temperature of the magnetic field to be measured is determined according to the temperature of the magnetic field to be measured and the error prediction model. The error offset coefficient corresponding to the temperature of the magnetic field to be measured can represent the offset ratio that may occur when the target magnetometer measures the magnetic field to be measured due to the influence of temperature. Without correction, the target magnetometer measures the magnetic intensity of the magnetic field to be measured to obtain the original measurement data, that is, the measured value of the magnetic intensity of the magnetic field to be measured. The error offset coefficient is used to adjust the measured value of the magnetic intensity of the magnetic field to be measured, and the above-mentioned error offset coefficient calculation formula can be used to obtain the correction value of the magnetic intensity of the magnetic field to be measured. The correction value of the magnetic intensity of the magnetic field to be measured has taken into account and corrected the deviation caused by the temperature factor, and is closer to the actual magnetic intensity of the magnetic field to be measured. The error correction method of the target magnetometer proposed in the present application predicts the error offset coefficient and corrects the measurement value based on the error prediction model, and systematically and scientifically compensates for the influence of temperature on the measurement of the target magnetometer, thereby solving the problem of temperature affecting the accuracy of the magnetic intensity measurement of the target magnetometer in the prior art, and improving the measurement accuracy and reliability of the target magnetometer at different temperatures.

[0030] In some embodiments, step 102, i.e., establishing an error prediction model between temperature and measurement error coefficient based on each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field, comprises: step 201, obtaining the error offset coefficient corresponding to each temperature according to the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature and the magnetic intensity of the calibration magnetic field; step 202, establishing an initial prediction model; step 203, inputting each temperature into the initial prediction model to obtain the error prediction coefficient corresponding to each temperature; step 204, obtaining the loss value corresponding to the mean square error loss function based on the error prediction coefficient corresponding to each temperature and the error offset coefficient corresponding to each temperature; step 205, updating the parameters of the initial prediction model based on the loss value until the loss value is less than or equal to the preset value, thereby obtaining the error prediction model.

[0031] In some embodiments, for each temperature, the error offset coefficient corresponding to each temperature can be obtained according to the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, the magnetic intensity of the calibration magnetic field and the above-mentioned error offset coefficient calculation formula. The error offset coefficient corresponding to each temperature can reflect the measurement error of the target magnetometer at each temperature, and is the basic data for the subsequent establishment of the error prediction model. A suitable neural network model can be constructed as an initial prediction model using a machine learning method. At this time, the parameters of the initial prediction model are preliminarily set and have not been optimized. The initial prediction model is the starting point for subsequent iterative optimization and can be used to predict the error offset coefficient at different temperatures. Each temperature is input into the initial prediction model to obtain the error prediction coefficient corresponding to each temperature. The error prediction coefficient corresponding to each temperature is used to compare with the actual error offset coefficient corresponding to each temperature. The mean square error or other suitable loss function can be used to calculate the difference between the error prediction coefficient corresponding to each temperature and the error offset coefficient corresponding to each temperature to obtain a loss value. The loss value can quantify the error prediction performance of the initial prediction model and is the basis for subsequent model optimization. Based on the loss value, an optimization algorithm, such as gradient descent, least squares method, etc., is used to update the parameters of the initial prediction model to reduce the loss value. Through iterative optimization, the initial prediction model can gradually learn the complex relationship between temperature and error offset coefficient during the training process, thereby improving the prediction accuracy. Repeat the iteration until the loss value is less than or equal to the preset value, or stop the iteration when the maximum number of iterations is reached to obtain the error prediction model. The error prediction model obtained through training can obtain the error offset coefficient caused by temperature changes when the magnetic field of the magnetic field to be measured is actually measured by the target magnetometer, thereby improving the accuracy and reliability of the magnetic intensity measurement of the target magnetometer. Based on the error prediction model, corresponding error compensation can be provided under different temperature environmental conditions, so that the target magnetometer can still maintain good measurement performance under changing ambient temperatures.

[0032] In some embodiments, reference Figure 3 Step 104, i.e., performing magnetic intensity measurement on the magnetic field to be measured based on the target magnetometer measurement to obtain the magnetic intensity measurement value of the magnetic field to be measured, includes: step 301, when the temperature of the magnetic field to be measured remains unchanged within a preset time, performing magnetic intensity measurement on the magnetic field to be measured multiple times based on the target magnetometer measurement to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured; step 302, performing average calculation on the multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured.

[0033] In some embodiments, under the premise that the ambient temperature of the magnetic field to be measured remains stable, the magnetic intensity measurement of the magnetic field to be measured based on the target magnetometer measurement is started. The change in temperature can affect the properties of the magnetic material in the target magnetometer, thereby affecting the measurement results of the target magnetometer. The temperature maintenance stability ensures the consistency of multiple measurement conditions, making the results of multiple measurements comparable. When the temperature of the magnetic field to be measured remains unchanged within a preset time, the target magnetometer is used to perform multiple independent magnetic intensity measurements in the magnetic field to be measured to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured, and each measurement should follow the same operating procedures and standards. Performing multiple magnetic intensity measurements on the magnetic field to be measured can reduce the measurement deviation caused by random errors (such as equipment noise, operating errors, etc.), and through multiple measurements, it is helpful to obtain more stable and reliable measurement results. The multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured can reflect the measurement results of the target magnetometer under the same conditions at different times. The multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured are averaged to obtain the magnetic intensity measurement value of the magnetic field to be measured. The average calculation can reduce the influence of random errors and improve the stability and reliability of the magnetic intensity measurement of the magnetic field to be measured by the target magnetometer.

[0034] In some embodiments, reference Figure 4 , step 104, i.e., measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain the magnetic intensity measurement value of the magnetic field to be measured, also includes: step 401, when receiving the zero point correction command of the user, performing zero point correction on the target magnetometer based on the zero point correction command to obtain the target magnetometer after zeroing; step 104, i.e., measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain the magnetic intensity measurement value of the magnetic field to be measured, includes: step 402, performing magnetic intensity measurement on the magnetic field to be measured based on the target magnetometer after zeroing to obtain the magnetic intensity measurement value of the magnetic field to be measured.

[0035] In some embodiments, the target magnetometer receives the zero-point correction command of the user, which can be received through the user interface (such as a button, a touch screen, etc.) of the target magnetometer, or can be a language instruction of the user received by the target magnetometer, and the language instruction means to perform zero-point correction. The zero-point correction command is an instruction to trigger the zero-point correction operation. The target magnetometer may be affected by various factors during use, such as temperature changes and mechanical vibrations, thereby causing the measurement reference to shift. Before the target magnetometer performs magnetic intensity measurement on the magnetic field to be measured, the target magnetometer after zeroing is obtained, which can improve the accuracy of the measurement result. After the target magnetometer receives the zero-point correction command, the target magnetometer is zero-corrected to adjust the reading of the target magnetometer to zero. The measurement error caused by factors such as temperature changes and mechanical vibrations of the target magnetometer can be eliminated by zero-point correction, and the target magnetometer can be in a correct reference state before measurement, thereby improving the accuracy of the measurement result. The magnetometer that has been zero-corrected is used to measure the magnetic intensity of the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured.

[0036] In some embodiments, obtaining the temperature of the magnetic field to be measured includes: determining the temperature of the magnetic field to be measured through temperature information detected by a temperature sensor installed in the target magnetometer.

[0037] In some embodiments, a temperature sensor is installed in the target magnetometer, and the temperature of the environment where the magnetic field to be measured is directly detected by the temperature sensor built into the target magnetometer. The temperature sensor can sense the temperature information of the location of the target magnetometer (i.e., the environment of the magnetic field to be measured), and convert the temperature information into a digital signal for use by the target magnetometer. When the magnetic intensity of the magnetic field to be measured is measured, the target magnetometer receives the digital signal of the temperature provided by the temperature sensor to obtain the temperature of the magnetic field to be measured. This process is automatically executed and can be performed without manual input or intervention by the user. Temperature is one of the important factors affecting the measurement accuracy of the target magnetometer. By obtaining the temperature of the magnetic field to be measured through the temperature sensor, the magnetic intensity measurement value (uncorrected value) of the magnetic field to be measured can be corrected or compensated according to the temperature of the magnetic field to be measured and the error prediction model, and the magnetic intensity correction value (corrected value) of the magnetic field to be measured is obtained, thereby reducing or reducing the influence of temperature on the measurement result and improving the accuracy of the measurement.

[0038] In some embodiments, the error offset coefficient corresponding to the magnetic field temperature to be measured is determined according to the magnetic field temperature to be measured and the error prediction model, including: inputting the magnetic field temperature to be measured into the error prediction model, performing an error prediction regression calculation based on the magnetic field temperature to be measured, and obtaining the error offset coefficient corresponding to the magnetic field temperature to be measured.

[0039] In some embodiments, the error prediction model can be a neural network model established by machine learning methods based on various temperatures, the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field. The error prediction model can predict the offset of the target magnetometer measurement value according to the temperature when the magnetic field is measured. In the actual measurement of the magnetic intensity of the magnetic field to be measured, the current temperature of the magnetic field to be measured is used as an input parameter and input into the error prediction model. After the error prediction model receives the temperature of the magnetic field to be measured, it performs corresponding calculation processing and outputs the error offset coefficient corresponding to the temperature of the magnetic field to be measured based on the built-in algorithm and the temperature-error relationship learned during the training process. The error offset coefficient corresponding to the temperature of the magnetic field to be measured represents the deviation ratio of the measured value of the target magnetometer relative to the actual magnetic intensity of the magnetic field to be measured at the temperature of the magnetic field to be measured. By determining the error offset coefficient corresponding to the temperature of the magnetic field to be measured, the magnetic intensity measurement value of the magnetic field to be measured directly measured by the target magnetometer can be corrected. Specifically, the error offset coefficient corresponding to the temperature of the magnetic field to be measured and the magnetic intensity measurement value of the magnetic field to be measured can be divided by the sum of the error offset coefficient corresponding to the temperature of the magnetic field to be measured and the number one, so as to obtain a measurement result closer to the true value, that is, the magnetic intensity correction value of the magnetic field to be measured, that is, the magnetic intensity correction value of the magnetic field to be measured=the magnetic intensity measurement value of the magnetic field to be measured / (the error offset coefficient corresponding to the temperature of the magnetic field to be measured+1), which is helpful to improve the accuracy and reliability of the measurement.

[0040] In some embodiments, multiple magnetic intensity measurements are performed on the magnetic field to be measured based on the target magnetometer measurement to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured, including: atoms in the gas chamber of the target magnetometer undergo corresponding Larmor precession under the action of the magnetic field to be measured; the frequency of the Larmor precession is measured multiple times to obtain corresponding multiple precession frequencies; and the corresponding initial magnetic intensity measurement values ​​of the magnetic field to be measured are determined based on each precession frequency.

[0041] In some embodiments, the target magnetometer is an atomic magnetometer, and the target magnetometer can be a micro laser pumped magnetometer. Each time the magnetic intensity of the magnetic field to be measured is measured, the initial measurement value of the magnetic intensity of the magnetic field to be measured is obtained. In the target magnetometer, there are atoms with clear magnetic moments, such as cesium. When the atoms in the gas chamber of the target magnetometer are in a uniform magnetic field, their magnetic moments will precess under the influence of the magnetic field, and their rotation frequency is directly related to the magnetic field strength. Correspondingly, the atoms in the gas chamber undergo corresponding Larmor precession under the action of the magnetic field to be measured, and the atoms in the gas chamber undergo energy level transitions. The frequency of Larmor precession can be measured by measuring the emission spectrum generated by the transition to obtain the precession frequency. The relationship between the precession frequency and the magnetic intensity of the magnetic field to be measured can be expressed by the Larmor equation. The Larmor equation is f=γB, where f is the precession frequency, γ is the known gyromagnetic ratio of the atom, and γ is a constant. Based on the precession frequency, the corresponding initial measurement value B of the magnetic intensity of the magnetic field to be measured can be determined.

[0042] All the above optional technical solutions can be arbitrarily combined to form optional embodiments of the present application, which will not be described one by one here.

[0043] The following are device embodiments of the present application, which can be used to execute the method embodiments of the present application. For details not disclosed in the device embodiments of the present application, please refer to the method embodiments of the present application.

[0044] Figure 5 Schematic diagram of an error correction device for a target magnetometer provided in an embodiment of the present application. Figure 5 As shown, the error correction device of the target magnetometer includes:

[0045] The training data acquisition module 501 is used to obtain the magnetic intensity of the calibration magnetic field, and measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures based on the target magnetometer in a temperature-controllable calibration magnetic field environment to obtain the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature;

[0046] A model training module 502 is used to establish an error prediction model between temperature and measurement error coefficient based on each temperature, the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature, and the magnetic intensity of the calibration magnetic field;

[0047] The prediction module 503 is used to obtain the temperature of the magnetic field to be measured, and determine the error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model;

[0048] A measurement module 504 is used to measure the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain a magnetic intensity measurement value of the magnetic field to be measured;

[0049] The correction module 505 is used to correct the measured value of the magnetic field intensity of the magnetic field to be measured based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured, so as to obtain a corrected value of the magnetic field intensity of the magnetic field to be measured.

[0050] According to the technical solution provided in the embodiment of the present application, by obtaining the magnetic intensity of the calibration magnetic field, a known and accurate magnetic intensity of the calibration magnetic field is determined, and the magnetic intensity of the calibration magnetic field will be used as a reference for subsequent measurement and correction. In a temperature-controllable calibration magnetic field environment, the ambient temperature is changed, and the target magnetometer is used to measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures, and the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each temperature are obtained, and the original data of the measurement value between the temperature and the target magnetometer are collected. A mathematical model is established using the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each temperature and each temperature, that is, an error prediction model between temperature and measurement error. The error prediction model can predict the error offset coefficient caused by temperature influence at a specific temperature. In the process of establishing the error prediction model, the relationship between temperature and measurement error is captured to facilitate the subsequent correction of the measurement results. The temperature of the magnetic field to be measured is obtained, and the error offset coefficient corresponding to the temperature of the magnetic field to be measured is determined according to the temperature of the magnetic field to be measured and the error prediction model. The error offset coefficient corresponding to the temperature of the magnetic field to be measured can represent the error ratio that may occur when the target magnetometer measures the magnetic field to be measured due to the influence of temperature. Without correction, the target magnetometer measures the magnetic intensity of the magnetic field to be measured to obtain the original measurement data, that is, the measured value of the magnetic intensity of the magnetic field to be measured. The measured value of the magnetic intensity of the magnetic field to be measured is adjusted using the error offset coefficient, so as to obtain the correction value of the magnetic intensity of the magnetic field to be measured. The correction value of the magnetic intensity of the magnetic field to be measured has taken into account and corrected the deviation caused by the temperature factor, and is closer to the real magnetic intensity of the magnetic field to be measured. The error correction method of the target magnetometer proposed in the present application predicts the error offset coefficient and corrects the measurement value based on the error prediction model, and systematically and scientifically compensates for the influence of temperature on the measurement of the target magnetometer, thereby solving the problem in the prior art that temperature affects the accuracy of the magnetic intensity measurement of the target magnetometer, and improving the measurement accuracy and reliability of the target magnetometer at different temperatures.

[0051] In some embodiments, the model training module 502 is configured to obtain the error offset coefficient corresponding to each temperature based on the magnetic intensity measurement value of the calibration magnetic field and the magnetic intensity of the calibration magnetic field corresponding to each temperature; establish an initial prediction model; input each temperature into the initial prediction model to obtain the error prediction coefficient corresponding to each temperature; obtain the loss value corresponding to the mean square error loss function based on the error prediction coefficient corresponding to each temperature and the error offset coefficient corresponding to each temperature; update the parameters of the initial prediction model based on the loss value until the loss value is less than or equal to the preset value, and obtain the error prediction model.

[0052] In some embodiments, the measurement module 504 is configured to perform multiple magnetic intensity measurements on the magnetic field to be measured based on the target magnetometer measurement when the temperature of the magnetic field to be measured remains unchanged within a preset time, so as to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured; and perform average calculation on the multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured.

[0053] In some embodiments, before obtaining the magnetic intensity measurement value of the magnetic field to be measured based on the target magnetometer measurement, the error correction device of the target magnetometer is configured to perform zero-point correction on the target magnetometer based on the zero-point correction command when receiving the zero-point correction command of the user to obtain the zeroed target magnetometer; and perform magnetic intensity measurement on the magnetic field to be measured based on the zeroed target magnetometer to obtain the magnetic intensity measurement value of the magnetic field to be measured.

[0054] In some embodiments, the training data acquisition module 501 is configured to determine the temperature of the magnetic field to be measured through temperature information detected by a temperature sensor installed in the target magnetometer.

[0055] In some embodiments, the prediction module 503 is configured to input the temperature of the magnetic field to be measured into the error prediction model, perform error prediction regression calculation based on the temperature of the magnetic field to be measured, and obtain the error offset coefficient corresponding to the temperature of the magnetic field to be measured.

[0056] In some embodiments, the measurement module 504 is configured such that atoms in the gas chamber of the target magnetometer undergo corresponding Larmor precession under the action of the magnetic field to be measured; the frequency of the Larmor precession is measured multiple times to obtain corresponding multiple precession frequencies; and the corresponding initial measurement values ​​of the magnetic intensity of the magnetic field to be measured are determined based on each precession frequency.

[0057] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0058] Figure 6 Schematic diagram of an electronic device 6 provided in an embodiment of the present application. Figure 6 As shown, the electronic device 6 of this embodiment includes: a processor 601, a memory 602, and a computer program 603 stored in the memory 602 and executable on the processor 601. When the processor 601 executes the computer program 603, the steps in the above-mentioned method embodiments are implemented. Alternatively, when the processor 601 executes the computer program 603, the functions of the modules / units in the above-mentioned device embodiments are implemented.

[0059] The electronic device 6 may be a desktop computer, a notebook, a PDA, a cloud server, or other electronic device. The electronic device 6 may include, but is not limited to, a processor 601 and a memory 602. Those skilled in the art will appreciate that Figure 6 The electronic device 6 is merely an example and does not limit the electronic device 6 . The electronic device 6 may include more or less components than those shown in the figure, or different components.

[0060] The processor 601 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.

[0061] The memory 602 may be an internal storage unit of the electronic device 6, for example, a hard disk or memory of the electronic device 6. The memory 602 may also be an external storage device of the electronic device 6, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 6. The memory 602 may also include both an internal storage unit of the electronic device 6 and an external storage device. The memory 602 is used to store computer programs and other programs and data required by the electronic device.

[0062] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units.

[0063] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium (e.g., a computer-readable storage medium). Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. The computer program may include computer program code, which may be in source code form, object code form, executable file or some intermediate form. Computer-readable storage media may include: any entity or device capable of carrying computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc.

[0064] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A method for error correction of a target magnetometer, characterized in that: include: Acquire the magnetic intensity of the calibration magnetic field, and measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures based on the target magnetometer in a temperature-controllable calibration magnetic field environment to obtain the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature; Establishing an error prediction model between temperature and measurement error coefficient based on each of the temperatures, the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each of the temperatures, and the magnetic intensity of the calibration magnetic field; Acquiring a temperature of a magnetic field to be measured, and determining an error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model; Performing magnetic intensity measurement on the magnetic field to be measured based on the target magnetometer measurement to obtain a magnetic intensity measurement value of the magnetic field to be measured; The measured value of the magnetic field intensity of the magnetic field to be measured is corrected based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured to obtain a corrected value of the magnetic field intensity of the magnetic field to be measured.

2. The method according to claim 1, characterized in that The error prediction model between the temperature and the measurement error coefficient is established based on each of the temperatures, the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each of the temperatures, and the magnetic intensity of the calibration magnetic field, including: Obtaining the error offset coefficient corresponding to each of the temperatures according to the magnetic intensity measurement value of the calibration magnetic field corresponding to each of the temperatures and the magnetic intensity of the calibration magnetic field; Establishing an initial prediction model; Inputting each of the temperatures into the initial prediction model to obtain an error prediction coefficient corresponding to each of the temperatures; Based on the error prediction coefficients corresponding to the temperatures and the error offset coefficients corresponding to the temperatures, a loss value corresponding to the mean square error loss function is obtained; The parameters of the initial prediction model are updated based on the loss value until the loss value is less than or equal to a preset value, thereby obtaining the error prediction model.

3. The method according to claim 1, characterized in that The method of measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain a magnetic intensity measurement value of the magnetic field to be measured includes: When the temperature of the magnetic field to be measured remains unchanged within a preset time, the magnetic field to be measured is measured multiple times based on the target magnetometer measurement to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured; An average calculation is performed on a plurality of initial magnetic intensity measurement values ​​of the magnetic field to be measured to obtain the magnetic intensity measurement value of the magnetic field to be measured.

4. The method according to claim 1, characterized in that: Before measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain the magnetic intensity measurement value of the magnetic field to be measured, the method further includes: When receiving the zero-point correction command from the user, performing zero-point correction on the target magnetometer based on the zero-point correction command to obtain a zeroed target magnetometer; The method of measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement to obtain a magnetic intensity measurement value of the magnetic field to be measured includes: The target magnetometer after zeroing measures the magnetic field to be measured, and obtains the magnetic intensity measurement value of the magnetic field to be measured.

5. The method according to claim 1, characterized in that The step of obtaining the temperature of the magnetic field to be measured comprises: The temperature of the magnetic field to be measured is determined by the temperature information detected by the temperature sensor installed in the target magnetometer.

6. The method according to claim 1, characterized in that The step of determining the error offset coefficient corresponding to the magnetic field temperature to be measured according to the magnetic field temperature to be measured and the error prediction model includes: The temperature of the magnetic field to be measured is input into the error prediction model, and an error prediction regression calculation is performed based on the temperature of the magnetic field to be measured to obtain an error offset coefficient corresponding to the temperature of the magnetic field to be measured.

7. The method according to claim 3, characterized in that The method of performing multiple magnetic intensity measurements on the magnetic field to be measured based on the target magnetometer measurement to obtain multiple initial magnetic intensity measurement values ​​of the magnetic field to be measured includes: The atoms in the gas chamber of the target magnetometer undergo corresponding Larmor precession under the action of the magnetic field to be measured; Measuring the frequency of the Larmor precession multiple times to obtain corresponding multiple precession frequencies; Based on each of the precession frequencies, the corresponding initial measurement values ​​of the magnetic field strength to be measured are determined.

8. An error correction device for a target magnetometer, characterized in that: include: A training data acquisition module is used to acquire the magnetic intensity of the calibration magnetic field, and to measure the magnetic intensity of the calibration magnetic field corresponding to multiple temperatures based on the target magnetometer in a temperature-controllable calibration magnetic field environment to obtain the magnetic intensity measurement value of the calibration magnetic field corresponding to each temperature; A model training module, for establishing an error prediction model between temperature and measurement error coefficient based on each of the temperatures, the magnetic intensity measurement values ​​of the calibration magnetic field corresponding to each of the temperatures, and the magnetic intensity of the calibration magnetic field; A prediction module, used to obtain the temperature of the magnetic field to be measured, and determine the error offset coefficient corresponding to the temperature of the magnetic field to be measured according to the temperature of the magnetic field to be measured and the error prediction model; A measuring module, used for measuring the magnetic intensity of the magnetic field to be measured based on the target magnetometer measurement, to obtain a magnetic intensity measurement value of the magnetic field to be measured; The correction module is used to correct the measured value of the magnetic field intensity of the magnetic field to be measured based on the error offset coefficient corresponding to the temperature of the magnetic field to be measured, so as to obtain a corrected value of the magnetic field intensity of the magnetic field to be measured.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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