Measuring device convenient for calibrating wire comprehensive tester

Abstract

The invention discloses a measuring device convenient to calibrate a wire rod comprehensive tester, and belongs to the field of wire rod comprehensive testers, the measuring device comprises a direct current resistance disc, the direct current resistance disc is a variable resistor, and the direct current resistance disc comprises a conduction resistance part and a circuit break resistance part; the capacitance disc is a variable capacitor, and the capacitance disc is used for measuring capacitance between lines; the high-voltage resistance disc is a variable resistor, and the high-voltage resistance disc comprises an alternating current leakage current load resistor part and an insulation resistor part; the voltmeter is an alternating current and direct current voltmeter; and the ampere meter is an alternating current ampere meter. Aiming at the calibration of the wire comprehensive tester, the wiring board of the wire tester is directly connected into the clamping groove of the general specification of the wire tester, all items can be tested at a time after the tester carries out learning setting, and replacement of various standard devices and repeated setting are not needed.

Description

Technical Field

[0001] The invention belongs to the field of wire material comprehensive testers, and in particular relates to a measuring device for conveniently calibrating a wire material comprehensive tester. Background Art

[0002] The full-project calibration of the wire comprehensive tester requires carrying multiple standard instruments (AC and DC high-voltage meters, digital multimeters, DC resistance boxes, high-voltage DC resistance boxes, load resistance boxes, and standard capacitance boxes), and different items (AC high voltage, AC high voltage leakage current, DC high voltage, insulation resistance measurement, on-resistance test, short-circuit resistance determination, and line capacitance) require repeated replacement of standard instruments when testing. The instrument also requires repeated learning and setting. The process is cumbersome, inefficient, and time-consuming. Summary of the invention

[0003] The present invention overcomes the deficiencies of the prior art and provides a measuring device for conveniently calibrating a wire material comprehensive tester, so as to solve the problems existing in the prior art.

[0004] To achieve the above object, the technical solution adopted by the present invention is: a measuring device for conveniently calibrating a wire comprehensive tester, comprising: A DC resistor disk, wherein the DC resistor disk is a variable resistor and includes an on-resistance part and an off-resistance part; A capacitor disk, the capacitor disk is a variable capacitor, and the capacitor disk is used to measure the line capacitance; A high-voltage resistor disk, wherein the high-voltage resistor disk is a variable resistor, and the high-voltage resistor disk comprises an AC leakage current load resistor part and an insulation resistor part; A voltmeter, which is an AC / DC voltmeter; The ammeter is an AC ammeter.

[0005] In a preferred embodiment of the present invention, the on-resistance portion is composed of 0.1Ω, 1Ω, and 10Ω, and the resistance range is 0.1Ω-100Ω.

[0006] In a preferred embodiment of the present invention, the circuit-breaking resistor part is composed of 100Ω, 1kΩ, and 10Ω, and the resistance range is 0.1kΩ-100kΩ.

[0007] In a preferred embodiment of the present invention, the capacitor disk is composed of 100pF, 1nF, 10nF, and 100nF, and the measurement range is 100pF-1μF.

[0008] In a preferred embodiment of the present invention, the AC leakage current load resistance portion is composed of 10kΩ, 20kΩ, 50kΩ, 100kΩ, and 200kΩ, which are integrated on a knob switch and correspond to 0.5mA-10mA.

[0009] In a preferred embodiment of the present invention, the insulation resistance part is composed of 1MΩ, 2MΩ, 5MΩ, 10MΩ, 20MΩ, 50MΩ, 100MΩ, 200MΩ, and 500MΩ, which are integrated into one gear knob switch.

[0010] In a preferred embodiment of the present invention, it further comprises a wiring board, wherein the wiring board is connected to the card slot of the wire tester.

[0011] In a preferred embodiment of the present invention, it also includes a first switch, wherein the first switch changes the positions of the connection contact and the normal contact when measuring the line capacitance; The second switch is used for switching between AC and DC voltage measurement, AC leakage current and insulation resistance measurement.

[0012] The present invention solves the defects existing in the background technology and has the following beneficial effects: The present invention aims at calibrating the wire material comprehensive tester. The wiring board of the wire material tester is directly connected to the card slot of the general specification of the wire material tester. After the tester is learned and set, all items can be tested at one time without replacing multiple standards and repeated settings. The use of variable resistors can conveniently adjust the measurement points of the resistance value. The use of switches can conveniently change the line structure without affecting the line network learned by the wire material comprehensive test end, and there is no need to repeat the learning and setting. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The present invention is further described below in conjunction with the accompanying drawings and embodiments; Figure 1 A circuit diagram of a preferred embodiment of the present invention; Figure 2 The schematic diagram of the circuit for conducting resistance and short circuit test of the preferred embodiment of the present invention; Figure 3 This is a schematic diagram of an AC / DC voltage test circuit according to a preferred embodiment of the present invention; Figure 4 This is a schematic diagram of the insulation resistance and leakage current test circuit of the preferred embodiment of the present invention; Figure 5 This is a schematic diagram of a line capacitance test circuit of a preferred embodiment of the present invention; Implementation

[0014] The following will disclose multiple embodiments of the present invention with drawings. For the purpose of clear description, many practical details will be described together in the following description. However, it should be understood that these practical details should not be used to limit the present invention. That is, in some embodiments of the present invention, these practical details are not necessary. In addition, for the purpose of simplifying the drawings, some conventional structures and components will be depicted in a simple schematic manner in the drawings.

[0015] In addition, in the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes, and do not specifically refer to the order or sequence, nor are they used to limit the present invention. They are only used to distinguish components or operations described with the same technical terms, and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in the field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0016] Combination Figures 1 to 5 As shown, this embodiment provides a measuring device for conveniently calibrating a wire comprehensive tester, including A DC resistor disk, which is a variable resistor and includes an on-resistance part and an off-resistance part; Capacitor plate, which is a variable capacitor, is used to measure the capacitance between lines; High-voltage resistor disc, the high-voltage resistor disc is a variable resistor, and the high-voltage resistor disc includes an AC leakage current load resistor part and an insulation resistor part; Voltmeter, the voltmeter is an AC and DC voltmeter; Ammeter, the ammeter is an AC ammeter.

[0017] The DC resistance disk consists of several groups of multi-position knob switches. The on-resistance part consists of ×0.1Ω, ×1Ω, and ×10Ω, with a resistance range of 0.1Ω-100Ω and a minimum zero position (short circuit position). The short-circuit resistance part consists of ×100Ω, ×1kΩ, and ×10Ω, with a resistance range of 0.1kΩ-100kΩ and a minimum zero position (short circuit position).

[0018] The capacitance disc is used to measure the line capacitance project, and is composed of ×100pF, ×1nF, ×10nF, and ×100nF, with a range of 100pF-1μF.

[0019] The high-voltage resistance disc is composed of several groups of multi-position knob switches. The AC leakage current load resistance part is composed of 10kΩ / 20kΩ / 50kΩ / 100kΩ / 200kΩ combined on a 6-position knob switch, corresponding to 0.5mA-10mA, the minimum zero position (short circuit position). The insulation resistance part is composed of 1MΩ / 2MΩ / 5MΩ / 10MΩ / 20MΩ / 50MΩ / 100MΩ / 200MΩ / 500MΩ combined on a 10-position knob switch, the minimum zero position (short circuit position).

[0020] The AC / DC voltmeter uses an AC / DC digital meter head to convert high voltage into a small voltage signal of 1 / 1000 through resistor voltage division, thereby achieving the effect of measuring AC / DC high voltage. The measurement range is set within 2kV.

[0021] The AC ammeter is used as a standard meter for measuring AC leakage current, with a range of less than 20mA.

[0022] The cable tester terminal block is directly connected to the cable tester card slot, the interface is universal and can adapt to 4-wire and 2-wire testers.

[0023] Switch 1 (i.e., the first switch) Switch 1 changes the connection contact to the "1" position only when measuring the line capacitance, and the normal contact is placed in the "2" position.

[0024] Switch 2 (i.e. the second switch) Switch 2 is used to switch between AC and DC voltage measurement & AC leakage current + insulation resistance measurement. When it is set to "1", leakage current and insulation resistance tests are performed. When it is set to "2", AC and DC high voltage can be measured.

[0025] All voltmeters and ammeters use meters with power supply isolated from input signals, directly powered by dry batteries, and have independent switches for the power supplies.

[0026] In actual use, for the calibration of the wire tester, the wiring board of the wire tester is directly connected to the card slot of the general specifications of the wire tester. After the tester is learned and set, all items can be tested at one time without replacing multiple standards and repeated settings. The use of variable resistors can conveniently adjust the measurement points of the resistance value. The use of switches can conveniently change the line structure without affecting the line network learned by the wire tester, and there is no need to repeat the learning and setting.

[0027] Although the present invention has been described above with reference to various embodiments, it should be understood that many changes and modifications may be made without departing from the scope of the present invention. That is, the methods, systems or devices discussed above are all examples. Various configurations may appropriately omit, replace or add various processes or components. For example, in alternative configurations, the method may be performed in an order different from the order described, and / or various stages may be added, omitted and / or combined. Moreover, the features described with respect to certain configurations may be combined in various other configurations. Different aspects and elements of the configurations may be combined in a similar manner. In addition, with the development of technology, many elements are merely examples and do not limit the scope of the present disclosure or claims.

[0028] Specific details are given in the specification to provide a thorough understanding of the exemplary configurations including implementations. However, the configurations can be practiced without these specific details. For example, well-known circuits, processes, algorithms, structures, and techniques have been shown without unnecessary details to avoid obscuring the configurations. This description provides only example configurations and does not limit the scope, applicability, or configurations of the claims. On the contrary, the foregoing description of the configurations will provide those skilled in the art with an enabling description for implementing the described techniques. Various changes may be made to the functions and arrangements of the elements without departing from the spirit or scope of the present disclosure.

[0029] In addition, although each operation may describe the operation as a sequential process, many operations may be performed in parallel or simultaneously. In addition, the order of the operations may be rearranged. A process may have additional steps. In addition, examples of methods may be implemented by hardware, software, firmware, middleware, code, hardware description language, or any combination thereof. When implemented in software, firmware, middleware, or code, program code or code segments for performing the necessary tasks may be stored in a non-transitory computer-readable medium such as a storage medium, and the described tasks are performed by a processor.

[0030] In summary, it is intended that the above detailed description is considered to be illustrative rather than restrictive, and it should be understood that the claims (including all equivalents) are intended to limit the spirit and scope of the present invention. The above embodiments should be understood to be only used to illustrate the present invention and not to limit the scope of protection of the present invention. After reading the content of the record of the present invention, the technician can make various changes or modifications to the present invention, and these equivalent changes and modifications also fall into the scope limited by the claims of the present invention.

Claims

1. A measuring device for convenient calibration of wire comprehensive tester, It is characterized in that include A DC resistor disk, wherein the DC resistor disk is a variable resistor and includes an on-resistance part and an off-resistance part; A capacitor disk, the capacitor disk is a variable capacitor, and the capacitor disk is used to measure the line capacitance; A high-voltage resistor disk, wherein the high-voltage resistor disk is a variable resistor, and the high-voltage resistor disk comprises an AC leakage current load resistor part and an insulation resistor part; A voltmeter, which is an AC / DC voltmeter; The ammeter is an AC ammeter.

2. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that The on-resistance part is composed of 0.1Ω, 1Ω, and 10Ω, and the resistance range is 0.1Ω-100Ω.

3. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that The circuit-breaking resistor part is composed of 100Ω, 1kΩ, and 10Ω, and the resistance range is 0.1kΩ-100kΩ.

4. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that The capacitor disc is composed of 100pF, 1nF, 10nF, and 100nF, and the measuring range is 100pF-1μF.

5. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that The AC leakage current load resistance part is composed of 10kΩ, 20kΩ, 50kΩ, 100kΩ, and 200kΩ, which are integrated on a knob switch and correspond to 0.5mA-10mA.

6. A measuring device for conveniently calibrating a wire material comprehensive tester according to claim 1, It is characterized in that The insulation resistance part is composed of 1MΩ, 2MΩ, 5MΩ, 10MΩ, 20MΩ, 50MΩ, 100MΩ, 200MΩ and 500MΩ, which are integrated on a gear knob switch.

7. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that It also includes a wiring board, which is connected to the card slot of the wire tester.

8. A measuring device for conveniently calibrating a wire comprehensive tester according to claim 1, It is characterized in that Also includes a first switch, wherein the first switch changes the positions of the connection contact and the normal contact when measuring the line capacitance; The second switch is used for switching between AC and DC voltage measurement, AC leakage current and insulation resistance measurement.

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